CN102779859A - Adjustable capacitor - Google Patents

Adjustable capacitor Download PDF

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Publication number
CN102779859A
CN102779859A CN2011101228384A CN201110122838A CN102779859A CN 102779859 A CN102779859 A CN 102779859A CN 2011101228384 A CN2011101228384 A CN 2011101228384A CN 201110122838 A CN201110122838 A CN 201110122838A CN 102779859 A CN102779859 A CN 102779859A
Authority
CN
China
Prior art keywords
shen
layer
pending
long
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2011101228384A
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Chinese (zh)
Inventor
费金华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wujiang Huacheng Composite Technology Co Ltd
Original Assignee
Wujiang Huacheng Composite Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wujiang Huacheng Composite Technology Co Ltd filed Critical Wujiang Huacheng Composite Technology Co Ltd
Priority to CN2011101228384A priority Critical patent/CN102779859A/en
Publication of CN102779859A publication Critical patent/CN102779859A/en
Pending legal-status Critical Current

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Abstract

The invention provides an adjustable capacitor required to be used for LC or RC matched network circuit of a micro circuit, and the goal is reached through forming a group of independent capacitors. The capacitors share one lower electrode in common use, and an upper electrode region of the capacitor is characterized in that an integration ratio is mutually selected so that any capacitors in the unit value range can be generated. For example, when four capacitors with the region ratio being 5:2:1:1, any capacitors with the range from 1 to 9 can be generated after the electrodes are connected. The connection in such a type can be a hard circuit in the last circuit layer, a factory adjustable capacitor can be provided, or the capacitors can be connected with and penetrated through field programmable elements to generate a field programmable capacitor.

Description

A kind of adjustable capacitor
Technical field
The present invention relates to a kind of capacitor, especially a kind of adjustable capacitor.
Background technology
The present invention provides a kind of LC or RC for microcircuit networking that matches need use the adjustable capacitor; It is to obtain this purpose by forming one group other capacitor; This capacitor is shared one shared bottom electrode; The polar region that powers on of those capacitors is mutual selection one integration ratio, so that they can produce any electric capacity in the cell value scope.For example, if provide those districts than being 5: 2: 1: during four capacitors of 1, how to connect according to top electrode and then can produce any electric capacity from scope 1 to 9.This type of connection can be the rigid line road in the line layer in the end, passes a programmed element to provide factory's adjustable capacitor or them to connect, to produce a field programmed capacitor.
Summary of the invention
To the problems referred to above, the present invention provides a kind of adjustable capacitor.
The present invention provides a kind of LC or RC for microcircuit networking that matches need use the adjustable capacitor; It is to obtain this purpose by forming one group other capacitor; This capacitor is shared one shared bottom electrode; The polar region that powers on of those capacitors is mutual selection one integration ratio, so that they can produce any electric capacity in the cell value scope.For example, if provide those districts than being 5: 2: 1: during four capacitors of 1, how to connect according to top electrode and then can produce any electric capacity from scope 1 to 9.This type of connection can be the rigid line road in the line layer in the end, passes a programmed element to provide factory's adjustable capacitor or them to connect, to produce a field programmed capacitor.
Embodiment
The present invention provides a kind of LC or RC for microcircuit networking that matches need use the adjustable capacitor; It is to obtain this purpose by forming one group other capacitor; This capacitor is shared one shared bottom electrode; The polar region that powers on of those capacitors is mutual selection one integration ratio, so that they can produce any electric capacity in the cell value scope.For example, if provide those districts than being 5: 2: 1: during four capacitors of 1, how to connect according to top electrode and then can produce any electric capacity from scope 1 to 9.This type of connection can be the rigid line road in the line layer in the end, passes a programmed element to provide factory's adjustable capacitor or them to connect, to produce a field programmed capacitor.
A kind of processing procedure of formation one adjustable capacitor includes: a silicium wafer is provided, and it has the superiors on it, and it is connected to the circuit in this wafer for contact mat; The long-pending base portion dielectric layer in Shen is in these the superiors, and it includes this contact mat; The long-pending etching barrier layer in Shen is on this base portion dielectric layer; Shen Jiyi supports dielectric layer on this etching barrier layer; Etching one through hole passes on this support dielectric layer, this etching barrier layer and this base portion dielectric layer, uses to expose this contact mat; The long-pending barrier layer in Shen is excessively filled tungsten with this through hole then in this through hole, and planarization then, so that remove all not tungsten in this through hole; Etching three grooves, it is to extend through this support dielectric layer up to this etching barrier layer; The long-pending ground floor metal in Shen supports on dielectric layer in this, and it is to include in this groove, and this ground floor metal of patterning then, and to form a shared electrode for capacitors, it is the through hole of this filling tungsten of contact; The long-pending one deck high dielectric constant material in Shen is on this shared electrode for capacitors, and this high dielectric constant layer of patterning then, uses this and fully covers this shared electrode for capacitors of envelope; The long-pending second layer metal in Shen is in this high dielectric constant layer, and this second layer metal of patterning then, and to form four top electrodes that do not connect, those are fold envelope by this electrode, and the regional ratio of this electrode (relative to each other) is 5: 2: 1: 1; The long-pending upper dielectric layer in Shen is on this top electrode and this high dielectric constant layer; Etching four through holes pass this upper dielectric layer, use a contact zone that exposes each this top electrode; The long-pending barrier layer in Shen is excessively filled this through hole with tungsten then in this through hole, planarization then so that remove all not in this through hole tungsten; And amass and patterning 1 the 3rd metal level in Shen then, is fixedly coupled so that between this top electrode, provide, and uses that this adjustable capacitor is produced a certain capacitance.

Claims (1)

1. processing procedure that forms an adjustable capacitor, include: a silicium wafer is provided, and it has the superiors on it, and it is connected to the circuit in this wafer for contact mat; The long-pending base portion dielectric layer in Shen is in these the superiors, and it includes this contact mat; The long-pending etching barrier layer in Shen is on this base portion dielectric layer; Shen Jiyi supports dielectric layer on this etching barrier layer; Etching one through hole passes on this support dielectric layer, this etching barrier layer and this base portion dielectric layer, uses to expose this contact mat; The long-pending barrier layer in Shen is excessively filled tungsten with this through hole then in this through hole, and planarization then, so that remove all not tungsten in this through hole; Etching three grooves, it is to extend through this support dielectric layer up to this etching barrier layer; The long-pending ground floor metal in Shen supports on dielectric layer in this, and it is to include in this groove, and this ground floor metal of patterning then, and to form a shared electrode for capacitors, it is the through hole of this filling tungsten of contact; The long-pending one deck high dielectric constant material in Shen is on this shared electrode for capacitors, and this high dielectric constant layer of patterning then, uses this and fully covers this shared electrode for capacitors of envelope; The long-pending second layer metal in Shen is in this high dielectric constant layer, and this second layer metal of patterning then, and to form four top electrodes that do not connect, those are fold envelope by this electrode, and the regional ratio of this electrode (relative to each other) is 5: 2: 1: 1; The long-pending upper dielectric layer in Shen is on this top electrode and this high dielectric constant layer; Etching four through holes pass this upper dielectric layer, use a contact zone that exposes each this top electrode; The long-pending barrier layer in Shen is excessively filled this through hole with tungsten then in this through hole, planarization then so that remove all not in this through hole tungsten; And amass and patterning 1 the 3rd metal level in Shen then, is fixedly coupled so that between this top electrode, provide, and uses that this adjustable capacitor is produced a certain capacitance.
CN2011101228384A 2011-05-13 2011-05-13 Adjustable capacitor Pending CN102779859A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011101228384A CN102779859A (en) 2011-05-13 2011-05-13 Adjustable capacitor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2011101228384A CN102779859A (en) 2011-05-13 2011-05-13 Adjustable capacitor

Publications (1)

Publication Number Publication Date
CN102779859A true CN102779859A (en) 2012-11-14

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011101228384A Pending CN102779859A (en) 2011-05-13 2011-05-13 Adjustable capacitor

Country Status (1)

Country Link
CN (1) CN102779859A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030201476A1 (en) * 2002-04-25 2003-10-30 Chartered Semiconductor Manufacturing Ltd. Adjustable 3D capacitor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030201476A1 (en) * 2002-04-25 2003-10-30 Chartered Semiconductor Manufacturing Ltd. Adjustable 3D capacitor

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C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
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Application publication date: 20121114