CN102749580A - Test device - Google Patents
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- CN102749580A CN102749580A CN2012102624890A CN201210262489A CN102749580A CN 102749580 A CN102749580 A CN 102749580A CN 2012102624890 A CN2012102624890 A CN 2012102624890A CN 201210262489 A CN201210262489 A CN 201210262489A CN 102749580 A CN102749580 A CN 102749580A
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- 238000012360 testing method Methods 0.000 title claims abstract description 19
- 230000001105 regulatory effect Effects 0.000 claims abstract description 12
- 238000001514 detection method Methods 0.000 claims abstract description 9
- 239000003990 capacitor Substances 0.000 claims abstract description 7
- 230000000052 comparative effect Effects 0.000 claims description 3
- 238000007493 shaping process Methods 0.000 abstract 2
- 230000002457 bidirectional effect Effects 0.000 description 10
- 238000004088 simulation Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 230000005611 electricity Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000008092 positive effect Effects 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Breakers (AREA)
- Emergency Protection Circuit Devices (AREA)
- Measurement Of Current Or Voltage (AREA)
- Ac-Ac Conversion (AREA)
Abstract
The invention relates to a test device which comprises an alternating-current (AC) power supply circuit, a phase generation circuit, an AC leakage regulation circuit and a time detection circuit; the phase generation circuit comprises a third half-wave rectification circuit; the third half-wave rectification circuit comprises a sine wave shaping circuit, a charging circuit, an AND gate, resistors R9 and R10, a resistor R11 and a potentiometer WR1, wherein the sine wave shaping circuit consists of a transformer T2, a diode D5, resistors R3, R5, R6 and R7 and an operation amplifier IC1A, the charging circuit consists of a resistor R8 and a capacitor C5 and is connected with the output end of the operation amplifier IC1A, the AND gate consists of diodes D6 and D7, the resistors R9 and R10 are used for setting a setting voltage with respect to hysteresis-current voltage being 135 degrees and the resistor R11 and the potentiometer WR1 are used for regulating the comparison voltage at the inverse end of an operation amplifier IC1B, wherein the output end of the operation amplifier IC1B is used for outputting control signals for the hysteresis-current voltage being 135 degrees. The test device is relatively reasonable in structure and can meet special requirements of a user.
Description
Technical field
The present invention relates to a kind of testing apparatus.
Background technology
According to standard GB 14048.2-2001; GB16916.1-2003; Regulations such as GB16917.1-2003:, can guarantee that the RCCB of threading off at the appointed time is called A type RCCB to no matter being residue pulsating direct current with regulation or the residue simple sinusoidal alternating current that applies suddenly or slowly rise.To no matter being the residue simple sinusoidal alternating current that applies suddenly or slowly rise, can guarantee the RCCB of threading off at the appointed time to be called AC type RCCB with no DC component.By on can know that A type RCCB has covered the function of AC type RCCB.
Above-mentioned " the residue pulsating current of regulation " is following 4 kinds of situation: the half-wave rectified current that half-wave rectified current, the electric current lagging voltage that the half-wave rectified current that the electric current lagging voltage is 0 °, electric current lagging voltage are 90 ° is 135 °, contain the half-wave rectified current of 0 ° of the electric current lagging voltage of 6mA direct current.
There is not the device that A type RCCB is measured in the prior art.
Summary of the invention
Technical matters to be solved by this invention provides the wide and comparatively reliable and stable testing apparatus of performance of a kind of test specification.
For solving the problems of the technologies described above, the invention provides a kind of testing apparatus, comprise AC power circuit, phase generating circuit, ac leakage regulating circuit and time detection circuit; Phase generating circuit comprises the 3rd half-wave rectifying circuit of 135 ° of electric current lagging voltages; Said the 3rd half-wave rectifying circuit comprises: become circuit by transformer T2, diode D5, resistance R 3, R5, R6, R7 and the sine wave shaped that operational amplifier IC1A constitutes; The charging circuit that constitutes by resistance R 8, capacitor C 5 that links to each other with the output terminal of operational amplifier IC1A, constitute by diode D6, D7 with door; Be used for setting resistance R 9 and R10 with respect to the voltage of adjusting of 135 ° of electric current lagging voltages; Be used for regulating the resistance R 11 and potentiometer WR1 with respect to the comparative voltage of 135 ° of electric current lagging voltages of the backward end of operational amplifier IC1B, the output terminal of operational amplifier IC1B is used for the control signal of 135 ° of output current lagging voltages.
The present invention has positive effect: (1) the present invention makes its structure comparatively reasonable through improving the 3rd half-wave rectifying circuit, can effectively satisfy the testing requirement of special RCCB.
Description of drawings
To combine accompanying drawing that the present invention is done further explanation below, wherein accompanying drawing is following:
Fig. 1 is the contour structures synoptic diagram of the testing apparatus of embodiment 1;
Fig. 2 is the part electrical schematic diagram of the testing apparatus of embodiment 1;
Fig. 3 is another part electrical schematic diagram of the testing apparatus of embodiment 1.
Embodiment
(embodiment 1)
See Fig. 1-3; Present embodiment is to test comprising of RCCB a kind of being used to, and comprising: AC power circuit 1, DC power-supply circuit 7, phase generating circuit 2, ac leakage regulating circuit 3, phase place display circuit 6, indicator light circuit 5 and time detection circuit 4.
AC power circuit 1 has the first live wire end and the second live wire end that is used to constitute the simulation loop of electric leakage that is used to constitute load circuit; The first live wire end is used for linking to each other with the live wire input end of equipment under test 9 with the second live wire end, and the zero line side of said load circuit is used for linking to each other with the zero line side of equipment under test 9.Equipment under test 9 is A type RCCBs in the present embodiment.
Phase generating circuit 2 is used for linking to each other with the live wire output terminal L2 of equipment under test 9; Phase generating circuit 2 comprises the control knob circuit, the control knob circuit be used for control phase produce circuit 2 generate respectively at said simulation loop of electric leakage 0 ° of electric current lagging voltage 90 ° of half-wave rectified current, electric current lagging voltages 135 ° of half-wave rectified current, electric current lagging voltages half-wave rectified current and contain the half-wave rectified current of 0 ° of the electric current lagging voltage of 6mA direct current.
Ac leakage regulating circuit 3 is used to control the size of current of said simulation loop of electric leakage; Time detection circuit 4 is used to measure from said simulation loop of electric leakage conducting to A type RCCB threads off required time, i.e. actuation time.
Said phase generating circuit 2 comprises: first half-wave rectifying circuit that the electric current lagging voltage is 0 °; Second half-wave rectifying circuit that the electric current lagging voltage is 90 °; The 3rd half-wave rectifying circuit that the electric current lagging voltage is 135 °; 6mA direct current generative circuit; And be used for according to said first half-wave rectifying circuit; The control signal of second half-wave rectifying circuit and the output of the 3rd half-wave rectifying circuit generates the half-wave rectified current of 0 ° of electric current lagging voltage respectively in said simulation loop of electric leakage; The half-wave rectified current that the electric current lagging voltage is 90 °; The controllable silicon current control circuit of the half-wave rectified current that the electric current lagging voltage is 135 ° and the half-wave rectified current of 0 ° of the electric current lagging voltage that contains the 6mA direct current.
The 3rd half-wave rectifying circuit that said electric current lagging voltage is 135 ° comprises: become circuit by transformer T2, diode D5, resistance R 3, R4, R5, R6, R7 and the sine wave shaped that operational amplifier IC1A constitutes; The charging circuit that constitutes by resistance R 8, capacitor C 5 that links to each other with the output terminal of operational amplifier IC1A, constitute by diode D6, D7 with door; Be used for setting resistance R 9 and R10 with respect to the voltage of adjusting of 135 ° of electric current lagging voltages; Be used for regulating the resistance R 11 and potentiometer WR1 with respect to the comparative voltage of 135 ° of electric current lagging voltages of the backward end of operational amplifier IC1B, the output terminal of operational amplifier IC1B is used for the control signal of 135 ° of output current lagging voltages.
Resistance R 12 is current-limiting resistances of triode BG3 base stage; Triode BG3 and resistance R 13 constitute emitter follower; The control signal that electric current lagging voltage on the resistance R 13 is 135 ° is given triode BG18 through pushbutton switch SB1, resistance R 58; Triode BG18 drives opto-coupler chip IC4, and resistance R 59 is current-limiting resistances, guarantees that opto-coupler chip IC4 effectively works.Opto-coupler chip IC4 is in order to isolate alternating current 220V and phase generating circuit direct current component; Conducting and the shutoff of control bidirectional triode thyristor BG19; Resistance R 60, R61 are used to control the G utmost point input current of bidirectional triode thyristor BG19, make input signal enough trigger bidirectional triode thyristor BG19 conducting.The A of bidirectional triode thyristor BG19, K two utmost points are connected between load and the AC power, and the electric current that flows through load is exactly the half-wave rectified current that lags behind 135 ° of voltages.Control bidirectional triode thyristor BG19 gets final product the residue pulsating current through stipulating in the operation circuit, and regulator potentiometer WR3, WR4, WR5 are the may command leakage current.
When pushbutton switch SB10 was closed, two intermediate contacts of pushbutton switch SB10 were used for the detection of phase generating circuit output waveform.
Said controllable silicon current control circuit comprises: according to the control signal of said first half-wave rectifying circuit, second half-wave rectifying circuit and the output of the 3rd half-wave rectifying circuit and the triode BG18 of conducting, the opto-coupler chip IC4 that driven by triode BG18; By the bidirectional triode thyristor BG19 of opto-coupler chip IC4 control break-make, the A of bidirectional triode thyristor BG19, the K utmost point are connected in the said simulation loop of electric leakage.
Said time detection circuit 4 comprises: single-chip microcomputer IC6, being used to of linking to each other with the detection of electrical leakage end of single-chip microcomputer IC6 are detected said simulation the loop of electric leakage whether leakaging signal detecting circuit of conducting and the charactron that is used to show the time that links to each other with the temporal information output terminal of single-chip microcomputer IC6; Single-chip microcomputer IC6 threads off the required time according to the electric leakage signal measurement of leakaging signal detecting circuit output from said simulation loop of electric leakage conducting to A type RCCB also should the time through said charactron demonstration.
Said phase generating circuit 2 be connected be used to show said simulation loop of electric leakage exist 0 ° of electric current lagging voltage 90 ° of half-wave rectified current or electric current lagging voltages 135 ° of half-wave rectified current or electric current lagging voltages half-wave rectified current or contain the phase place display circuit 6 of half-wave rectified current of 0 ° of the electric current lagging voltage of 6mA direct current.
AC power circuit is given transformer T4 by 220V 50Hz ac power supply, and transformer T4 output 180V, 220V, 250V, 380V voltage are connected to through waver SA1 and exchange output wiring terminal L1, N is last.Through regulating the gear of waver SA1, can change the voltage that exchanges output wiring terminal L1 and N two ends.The load of transformer T4 is an ac leakage regulating circuit 3.
Ac leakage regulating circuit 3 is by transformer T4 output 26V alternating current; Be connected to after its output terminal one end and the waver SA2 series connection and exchange output wiring terminal L1; After the other end and reometer, electric leakage are regulated resistance, bidirectional triode thyristor BG19, waver SA3 and connect, be connected to interchange output wiring terminal L2.
Phase place display circuit 6 is made up of logical circuit, pushbutton switch that charactron LED1-LED4, diode D11-36, triode BG7-16 form.
When pressing the button switch S B4, current signal trigger triode BG20 conducting, triode BG20 output signal triggering triode BG7, BG8 conducting, charactron LED1 shows " A ", charactron LED2 shows " C ".When pressing the button switch S B3, charactron LED1, LED4 show " A0 "; Press the button switch S B2, charactron LED1, LED3, LED4 show " A90 "; Press the button switch S B5, charactron LED1, LED2, LED3, LED4 show " A0-6 ".
Indicator light circuit 5 is made up of transformer T4, commutation diode D42-45, three terminal regulator BG27, RC filtering circuit.DC power-supply circuit 7 comprises: by the 5V DC power-supply circuit of transformer T1 power supply, by 5V DC power-supply circuit, 12V DC power-supply circuit, the 6mA direct current generative circuit of transformer T3 power supply.
Time detection circuit 4 is made up of pushbutton switch, commutation diode D46-49, triode BG23-26, resistance, capacitor C 15, photoelectrical coupler IC5, single-chip microcomputer IC6, charactron LED11 etc.
6mA direct current generative circuit is made up of resistance R 67,9V dry cell Bt, pushbutton switch SB5, SB6.One end of resistance R 67 links to each other with the positive pole of 9V dry cell U; The other end of resistance R 67 links to each other with the intermediate contact of pushbutton switch SB5; The normally opened contact of pushbutton switch SB5 links to each other with normally opened contact, the normally closed contact of pushbutton switch SB6; Normally opened contact, normally opened contact that the 9V dry battery cathode meets pushbutton switch SB6 link to each other, and the intermediate contact of pushbutton switch SB6 links to each other with direct current output wiring terminal "+", and the intermediate contact SB6-21 of pushbutton switch SB6 links to each other with direct current output "-".
Second half-wave rectifying circuit that the electric current lagging voltage is 90 ° is by resistance R 17, R18, R19, R20, R21, R22, R23, R24, R25, R26, R27, R57, R58, R59, R60, R61; Capacitor C 6, diode D8, D9, D10, triode B65, BG18; Bidirectional triode thyristor BG19; Operational amplifier IC2, opto-coupler chip IC4, potentiometer WR2 constitutes.
First half-wave rectifying circuit that the electric current lagging voltage is 0 ° is by resistance R 50, R51, R52, R53, R54, R55, R56, R57, R58, R59, R60, R61; Diode D37, triode BG17, BG18, bidirectional triode thyristor BG19; Operational amplifier IC3, opto-coupler chip IC4 constitutes.The e of triode BG22 in the positive terminal of diode D51 and the phase place display circuit extremely links to each other; The negative pole end of diode D51 links to each other with an end of resistance R 75; The other end of resistance R 75 extremely links to each other with the b of triode BG28; 2 pin of opto-coupler chip IC7 extremely link to each other with the c of triode BG28, and the e utmost point of triode BG28 links to each other with 2 pin of stabilivolt BG21.One end of resistance R 74 links to each other with 3 pin of stabilivolt BG21, and 4,6 pin of opto-coupler chip IC7 link to each other with pushbutton switch SB3 intermediate contact SB3-21, normally opened contact SB3-22 respectively.Because of the half-wave rectified current that contains the 6mA direct current of 0 ° of electric current lagging voltage is arranged in " the residue pulsating current of regulation ",, guarantee the output of the half-wave rectified current of 0 ° of electric current lagging voltage so this part is under the situation that is implemented in " A0-6 ".
Resistance R 73, R77 are the current-limiting resistance of opto-coupler chip IC5; Resistance R 78 is the current-limiting resistance of 1 pin of single-chip microcomputer IC6; Capacitor C 15, resistance R 79 are formed differentiating circuit; Resistance R 80, R81, R82, R83, R84, R85, R86, R87 are the current-limiting resistance of each pin of charactron LED11, and resistance R 88, R89, R90, R91 are the current-limiting resistance of the b utmost point of triode BG23, BG24, BG25, BG26.Pushbutton switch SB17 is a testing button, and pushbutton switch SB18 is a SR.
When pushbutton switch SB17 is closed, breaker electrifying, DC current forms a spike pulse through differentiating circuit, 1 pin of input single-chip microcomputer IC6, single-chip microcomputer IC6 picks up counting.When circuit breaker trip, opto-coupler chip IC5 dead electricity, 4,6 pin turn-off, and 3 pin of single-chip microcomputer IC6 have the high level input, and single-chip microcomputer IC6 stops timing and output data shows to charactron LED11.When pushbutton switch SB18 presses, single-chip microcomputer IC6, charactron LED11 zero clearing.
The foregoing description only be for clearly the present invention is described and is done for example, and be not to be qualification to embodiment of the present invention.For the those of ordinary skill in affiliated field, on the basis of above-mentioned explanation, can also make other multi-form variation or change.Here need not also can't give exhaustive to all embodiments.And these belong to conspicuous variation or the change that spirit of the present invention extended out and still are among protection scope of the present invention.
Claims (1)
1. a testing apparatus comprises AC power circuit (1), phase generating circuit (2), ac leakage regulating circuit (3) and time detection circuit (4); It is characterized in that: phase generating circuit (2) comprises the 3rd half-wave rectifying circuit of 135 ° of electric current lagging voltages;
Said the 3rd half-wave rectifying circuit comprises: become circuit by transformer T2, diode D5, resistance R 3, R5, R6, R7 and the sine wave shaped that operational amplifier IC1A constitutes; The charging circuit that constitutes by resistance R 8, capacitor C 5 that links to each other with the output terminal of operational amplifier IC1A, constitute by diode D6, D7 with door; Be used for setting resistance R 9 and R10 with respect to the voltage of adjusting of 135 ° of electric current lagging voltages; Be used for regulating the resistance R 11 and potentiometer WR1 with respect to the comparative voltage of 135 ° of electric current lagging voltages of the backward end of operational amplifier IC1B, the output terminal of operational amplifier IC1B is used for the control signal of 135 ° of output current lagging voltages.
Priority Applications (10)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510884112.2A CN105548869A (en) | 2012-07-27 | 2012-07-27 | Test equipment having phase generation circuit and used for testing electric leakage breaker |
| CN201510883690.4A CN106443424A (en) | 2012-07-27 | 2012-07-27 | Phase-generation-circuit-equipped test equipment for detecting electric leakage circuit breaker |
| CN201510881874.7A CN105589032A (en) | 2012-07-27 | 2012-07-27 | Test equipment provided with AC power supply circuit and used for testing residual-current circuit breaker (RCCB) |
| CN201510882812.8A CN105425146A (en) | 2012-07-27 | 2012-07-27 | Testing equipment provided with phase position generating circuit for testing residual current circuit breaker |
| CN201210262489.0A CN102749580B (en) | 2012-07-27 | 2012-07-27 | To the testing apparatus that residual current circuit breaker detects |
| CN201510881720.8A CN105589031A (en) | 2012-07-27 | 2012-07-27 | Test equipment provided with time detection circuit and used for testing residual-current circuit breaker (RCCB) |
| CN201510884972.6A CN105548870A (en) | 2012-07-27 | 2012-07-27 | Test equipment having phase generation circuit and used for testing electric leakage breaker |
| CN201510884056.2A CN106443425A (en) | 2012-07-27 | 2012-07-27 | Test device for detecting residual-current circuit breaker |
| CN201510882151.9A CN105510817A (en) | 2012-07-27 | 2012-07-27 | Test equipment for testing residual-current circuit breaker and provided with time detection circuit |
| CN201510882779.9A CN105301493A (en) | 2012-07-27 | 2012-07-27 | Detection device for detecting residual-current circuit breaker (RCCB) with AC power supply circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210262489.0A CN102749580B (en) | 2012-07-27 | 2012-07-27 | To the testing apparatus that residual current circuit breaker detects |
Related Child Applications (9)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510884112.2A Division CN105548869A (en) | 2012-07-27 | 2012-07-27 | Test equipment having phase generation circuit and used for testing electric leakage breaker |
| CN201510884972.6A Division CN105548870A (en) | 2012-07-27 | 2012-07-27 | Test equipment having phase generation circuit and used for testing electric leakage breaker |
| CN201510882779.9A Division CN105301493A (en) | 2012-07-27 | 2012-07-27 | Detection device for detecting residual-current circuit breaker (RCCB) with AC power supply circuit |
| CN201510883690.4A Division CN106443424A (en) | 2012-07-27 | 2012-07-27 | Phase-generation-circuit-equipped test equipment for detecting electric leakage circuit breaker |
| CN201510881874.7A Division CN105589032A (en) | 2012-07-27 | 2012-07-27 | Test equipment provided with AC power supply circuit and used for testing residual-current circuit breaker (RCCB) |
| CN201510882151.9A Division CN105510817A (en) | 2012-07-27 | 2012-07-27 | Test equipment for testing residual-current circuit breaker and provided with time detection circuit |
| CN201510884056.2A Division CN106443425A (en) | 2012-07-27 | 2012-07-27 | Test device for detecting residual-current circuit breaker |
| CN201510881720.8A Division CN105589031A (en) | 2012-07-27 | 2012-07-27 | Test equipment provided with time detection circuit and used for testing residual-current circuit breaker (RCCB) |
| CN201510882812.8A Division CN105425146A (en) | 2012-07-27 | 2012-07-27 | Testing equipment provided with phase position generating circuit for testing residual current circuit breaker |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102749580A true CN102749580A (en) | 2012-10-24 |
| CN102749580B CN102749580B (en) | 2016-01-20 |
Family
ID=47029930
Family Applications (10)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510881874.7A Withdrawn CN105589032A (en) | 2012-07-27 | 2012-07-27 | Test equipment provided with AC power supply circuit and used for testing residual-current circuit breaker (RCCB) |
| CN201510882812.8A Withdrawn CN105425146A (en) | 2012-07-27 | 2012-07-27 | Testing equipment provided with phase position generating circuit for testing residual current circuit breaker |
| CN201510883690.4A Withdrawn CN106443424A (en) | 2012-07-27 | 2012-07-27 | Phase-generation-circuit-equipped test equipment for detecting electric leakage circuit breaker |
| CN201510882779.9A Pending CN105301493A (en) | 2012-07-27 | 2012-07-27 | Detection device for detecting residual-current circuit breaker (RCCB) with AC power supply circuit |
| CN201510884112.2A Withdrawn CN105548869A (en) | 2012-07-27 | 2012-07-27 | Test equipment having phase generation circuit and used for testing electric leakage breaker |
| CN201510884056.2A Withdrawn CN106443425A (en) | 2012-07-27 | 2012-07-27 | Test device for detecting residual-current circuit breaker |
| CN201510881720.8A Withdrawn CN105589031A (en) | 2012-07-27 | 2012-07-27 | Test equipment provided with time detection circuit and used for testing residual-current circuit breaker (RCCB) |
| CN201510882151.9A Pending CN105510817A (en) | 2012-07-27 | 2012-07-27 | Test equipment for testing residual-current circuit breaker and provided with time detection circuit |
| CN201510884972.6A Withdrawn CN105548870A (en) | 2012-07-27 | 2012-07-27 | Test equipment having phase generation circuit and used for testing electric leakage breaker |
| CN201210262489.0A Active CN102749580B (en) | 2012-07-27 | 2012-07-27 | To the testing apparatus that residual current circuit breaker detects |
Family Applications Before (9)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510881874.7A Withdrawn CN105589032A (en) | 2012-07-27 | 2012-07-27 | Test equipment provided with AC power supply circuit and used for testing residual-current circuit breaker (RCCB) |
| CN201510882812.8A Withdrawn CN105425146A (en) | 2012-07-27 | 2012-07-27 | Testing equipment provided with phase position generating circuit for testing residual current circuit breaker |
| CN201510883690.4A Withdrawn CN106443424A (en) | 2012-07-27 | 2012-07-27 | Phase-generation-circuit-equipped test equipment for detecting electric leakage circuit breaker |
| CN201510882779.9A Pending CN105301493A (en) | 2012-07-27 | 2012-07-27 | Detection device for detecting residual-current circuit breaker (RCCB) with AC power supply circuit |
| CN201510884112.2A Withdrawn CN105548869A (en) | 2012-07-27 | 2012-07-27 | Test equipment having phase generation circuit and used for testing electric leakage breaker |
| CN201510884056.2A Withdrawn CN106443425A (en) | 2012-07-27 | 2012-07-27 | Test device for detecting residual-current circuit breaker |
| CN201510881720.8A Withdrawn CN105589031A (en) | 2012-07-27 | 2012-07-27 | Test equipment provided with time detection circuit and used for testing residual-current circuit breaker (RCCB) |
| CN201510882151.9A Pending CN105510817A (en) | 2012-07-27 | 2012-07-27 | Test equipment for testing residual-current circuit breaker and provided with time detection circuit |
| CN201510884972.6A Withdrawn CN105548870A (en) | 2012-07-27 | 2012-07-27 | Test equipment having phase generation circuit and used for testing electric leakage breaker |
Country Status (1)
| Country | Link |
|---|---|
| CN (10) | CN105589032A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104407305A (en) * | 2014-11-03 | 2015-03-11 | 广东威创视讯科技股份有限公司 | Power source integrity test device and method |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111551873B (en) * | 2020-06-15 | 2022-06-28 | 浙江中医药大学附属第三医院 | Open circuit detection method for electrical stimulation output of percutaneous/percutaneous needle |
| CN113483882B (en) * | 2021-06-29 | 2023-03-14 | 重庆长安新能源汽车科技有限公司 | Electric control sound generating device |
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- 2012-07-27 CN CN201510881874.7A patent/CN105589032A/en not_active Withdrawn
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| CN104407305B (en) * | 2014-11-03 | 2017-12-26 | 广东威创视讯科技股份有限公司 | A kind of Power Integrity test device and method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105510817A (en) | 2016-04-20 |
| CN105589032A (en) | 2016-05-18 |
| CN105548870A (en) | 2016-05-04 |
| CN106443424A (en) | 2017-02-22 |
| CN105589031A (en) | 2016-05-18 |
| CN102749580B (en) | 2016-01-20 |
| CN105548869A (en) | 2016-05-04 |
| CN106443425A (en) | 2017-02-22 |
| CN105425146A (en) | 2016-03-23 |
| CN105301493A (en) | 2016-02-03 |
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