CN102735924B - Frequency transient characteristic detector in superheterodyne microwave analyzer and frequency transient characteristic detection method - Google Patents
Frequency transient characteristic detector in superheterodyne microwave analyzer and frequency transient characteristic detection method Download PDFInfo
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- 230000001052 transient effect Effects 0.000 title claims abstract description 57
- 238000001514 detection method Methods 0.000 title claims abstract description 19
- 238000004364 calculation method Methods 0.000 claims abstract description 19
- 238000004458 analytical method Methods 0.000 claims abstract description 18
- 238000000034 method Methods 0.000 claims abstract description 14
- 238000013500 data storage Methods 0.000 claims description 8
- 238000001914 filtration Methods 0.000 claims description 8
- 210000000352 storage cell Anatomy 0.000 claims description 8
- 238000000605 extraction Methods 0.000 claims description 5
- 230000000052 comparative effect Effects 0.000 claims description 3
- 238000000926 separation method Methods 0.000 claims description 3
- 238000012360 testing method Methods 0.000 abstract description 9
- 238000001228 spectrum Methods 0.000 description 23
- 238000011897 real-time detection Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 230000000875 corresponding effect Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 230000036962 time dependent Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
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CN201210195556.1A CN102735924B (en) | 2012-06-14 | 2012-06-14 | Frequency transient characteristic detector in superheterodyne microwave analyzer and frequency transient characteristic detection method |
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CN201210195556.1A CN102735924B (en) | 2012-06-14 | 2012-06-14 | Frequency transient characteristic detector in superheterodyne microwave analyzer and frequency transient characteristic detection method |
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CN102735924B true CN102735924B (en) | 2015-05-20 |
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CN105515694A (en) * | 2015-11-06 | 2016-04-20 | 中国电子科技集团公司第四十一研究所 | Method for implementing real-time FFT frame averaging of digital signal processing |
CN114062719A (en) * | 2021-10-20 | 2022-02-18 | 深圳市圣格特电子有限公司 | Signal analysis meter signal anti-interference processing method and signal analysis meter |
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US6674401B2 (en) * | 2002-02-19 | 2004-01-06 | Eride, Inc. | High sensitivity GPS receiver and reception |
US7734464B2 (en) * | 2005-05-20 | 2010-06-08 | Tektronix, Inc. | RF autocorrelation signal trigger generator |
US8233569B2 (en) * | 2006-09-28 | 2012-07-31 | Tektronix, Inc. | Realtime spectrum trigger system on realtime oscilloscope |
US7816904B2 (en) * | 2007-10-09 | 2010-10-19 | Tektronix, Inc. | Modulation signature trigger |
CN102165324A (en) * | 2008-09-26 | 2011-08-24 | 株式会社艾德温特斯特 | Frequency characteristic measurement device |
US8180586B2 (en) * | 2009-02-11 | 2012-05-15 | Tektronix, Inc. | Amplitude discrimination using the frequency mask trigger |
JP5037598B2 (en) * | 2009-12-18 | 2012-09-26 | テクトロニクス・インターナショナル・セールス・ゲーエムベーハー | Trigger generation apparatus and method for signal analyzer |
US8649989B2 (en) * | 2010-08-13 | 2014-02-11 | Tektronix, Inc. | Time-domain triggering in a test and measurement instrument |
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Address after: No. 726, Huaguang Avenue, Bengbu, Anhui Province, Anhui Patentee after: The 41st Institute of CETC Address before: 266000 Qingdao economic and Technological Development Zone, Shandong Xiangjiang Road, No. 98 Patentee before: The 41st Institute of CETC |
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Address after: No. 726 Changzheng Road, Bengbu, Anhui Province Patentee after: The 41st Institute of CETC Address before: No. 726, Huaguang Avenue, Bengbu, Anhui Province, Anhui Patentee before: The 41st Institute of CETC |
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Effective date of registration: 20190315 Address after: 266000 No. 98 Xiangjiang Road, Huangdao District, Qingdao City, Shandong Province Patentee after: China Electronics Technology Instrument and Meter Co., Ltd. Address before: No. 726 Changzheng Road, Bengbu, Anhui Province Patentee before: The 41st Institute of CETC |
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Address after: 266555 No. 98 Xiangjiang Road, Huangdao District, Qingdao City, Shandong Province Patentee after: CLP kesiyi Technology Co.,Ltd. Address before: 266000 No. 98 Xiangjiang Road, Huangdao District, Qingdao City, Shandong Province Patentee before: CHINA ELECTRONIC TECHNOLOGY INSTRUMENTS Co.,Ltd. |
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