CN102707712A - Electronic equipment fault diagnosis method and system - Google Patents
Electronic equipment fault diagnosis method and system Download PDFInfo
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Abstract
The invention provides an electronic equipment fault diagnosis method, which comprises the following steps of: reading a fault tree input by a user, wherein the fault tree comprises relevant information of a test point; encapsulating the fault tree into four objects including a test point, a standard parameter, a fault rule and logical interconnection; establishing a test model in an in-situ state according to the encapsulated objects; acquiring test data from the test point of a tested object according to the test model; and diagnosing the test data by using the test model to obtain a fault position. The invention further provides an electronic equipment fault diagnosis system. Fault localization of the tested object is completed in situ through a technology disclosed by the invention, so that a simulation environment is not required to be established, a test flow is simplified, the diagnosis efficiency is increased, a test program and software programming are partitioned into two parallel development processes, the developing difficulty of the test program is lowered, and the developing efficiency of the test model is increased.
Description
Technical field
The present invention relates to the fault diagnosis technology of electronic equipment, particularly relate to a kind of electronics method for diagnosing faults and system.
Background technology
Continuous development along with modern electronic technology; The function of various electronics is more and more perfect; The test of equipment and maintenance support aspect have also produced testing process complicacy, problems such as the test duration is long, maintenance support is difficult, expense height, and also test and the fault diagnosis work to electronics has proposed new requirement.(Fault Tree Analysis FTA), sets up the fault tree diagnostic model to utilize fault tree analysis; It is a kind of important means of fault diagnosis; It adopts the method for logic, and a certain phenomenon or interpretation of result are derived a predictable event of failure, can do qualitative analysis; Also can do quantitative test, be one of main analytical approach of safety system engineering.
At present, most electronics all adopt emulation technology to realize fault diagnosis, are about to exist the object to be tested of fault to be placed on the working environment test down of emulation, come the failure judgement position according to the fault tree diagnostic model again.Owing to be not under actual working environment, to carry out; Test vector can not reflect the real work situation of object to be tested faithfully; Test result exists than mistake with actual abort situation; Can not find and the association of associated circuit board, be difficult to realize the isolation of fault, cause many common maintenance failures to be difficult for reproduction and diagnosis.Simulated environment is set up comparatively complicacy in addition, and simulated test device need be equipped with emulation I/O module, matrix switch, hardware interface etc., causes failure diagnostic process complicated, and efficient is low.
Summary of the invention
Based on this, be necessary to cause the electronics failure diagnostic process complicated based on emulation technology to above-mentioned, inefficient problem provides a kind of electronics method for diagnosing faults and system.
A kind of electronics method for diagnosing faults comprises the steps:
Read the fault tree of user's input; Wherein, said fault tree comprises the relevant information of test point;
Said fault tree is packaged into test point, canonical parameter, diagnosis rule and four objects of logic association;
Set up the test model under the original position state according to the object of said encapsulation;
According to the test point collecting test data of said test model from measurand;
Utilize said test model to diagnose said test data to obtain abort situation.
A kind of electronics fault diagnosis system comprises:
Information typing unit is used to read the fault tree that the user imports; Wherein, said fault tree comprises the relevant information of test point;
The object encapsulation unit is used for said fault tree is packaged into test point, canonical parameter, diagnosis rule and four objects of logic association;
The modelling unit is used for setting up the test model under the original position state according to the object of said encapsulation;
Data acquisition unit is used for according to the test point collecting test data of said test model from measurand;
Failure diagnosis unit is used to utilize said test model to diagnose said test data to obtain abort situation.
Above-mentioned electronics method for diagnosing faults and system through fault tree being detached out test point, canonical parameter, diagnosis rule and logic association information, and are encapsulated as the object of the test model under the original position state; When fault diagnosis is tested, directly call test model and carry out fault diagnosis, accomplish localization of fault based on original position to measurand; Need not to set up simulated environment; Simplified the flow process of test, improved diagnosis efficiency, test procedure and software programming have been divided into two parallel performance historyes; Reduce the development difficulty of test procedure, improved the development efficiency of test model.
Description of drawings
Fig. 1 is the electronics method for diagnosing faults process flow diagram of an embodiment;
Fig. 2 is the synoptic diagram of the encapsulation process of an embodiment;
Fig. 3 is the test model structural drawing of an embodiment;
Fig. 4 is the synoptic diagram of the diagnosis rule attributes match of an embodiment;
Fig. 5 is the electronics fault diagnosis system structural representation of an embodiment;
Fig. 6 is the electronics fault diagnosis system structural representation of a preferred embodiment.
Embodiment
Electronics method for diagnosing faults of the present invention; Through fault tree being detached out the information of test point, canonical parameter, diagnosis rule and logic association; Be the basis with test point and logic association; Set up test model, through calling test model, accomplish localization of fault during diagnostic test measurand.
Below in conjunction with accompanying drawing the embodiment of electronics method for diagnosing faults of the present invention is described in detail.
Fig. 1 shows the electronics method for diagnosing faults process flow diagram of an embodiment; Mainly comprise the steps:
Step S1 reads the fault tree that the user imports; Wherein, Fault tree mainly is made up of cognizable structures such as behavior, judgement, localization of fault and connecting lines; The fault tree of this input has comprised the relevant information of the test point of electronics; The state of the unique demarcation measurand of test point wherein, relevant information comprises magnitude of voltage, current value, frequency values and/or level value etc.
Step S2 is packaged into test point, canonical parameter, diagnosis rule and four objects of logic association with said fault tree.
In one embodiment, the process of step S2 specifically comprises the steps:
Step S201 carries out the structuring pre-service to fault tree, is split as test point, canonical parameter, diagnosis rule and four characteristic elements of logic association; Particularly, comprise the steps:
Each test point is demarcated in a, extraction behavioral agent and behavior from the behavior node of fault tree; Promptly realize the demarcation of test point through extraction behavioral agent and behavior in the behavior node from fault tree.
Under the binding occurrence and Different Results state of b, retrieval decision node, guide to the connecting line of other behavior or localization of fault, obtain canonical parameter and logic association; Promptly guide to the connecting line of other behavior or localization of fault under binding occurrence and the Different Results state through the retrieval decision node, obtain canonical parameter and logic association.
C, extract failure message, and obtain the behavioral agent of the decision node before the diagnosis rule node, confirm the diagnosis rule of fault tree from the diagnosis rule node of fault tree; Promptly, obtain the behavioral agent of diagnosis rule node decision node before, obtain diagnosis rule through from fault tree, extracting failure message in the diagnosis rule node.
Carry out structural pre-service based on above-mentioned fault tree, convert fault tree into system discernible structure input.
Step S202 is packaged into test point, canonical parameter, diagnosis rule and four objects of logic association with said characteristic element.
Particularly, can resolve and be encapsulated as again above-mentioned four kinds of objects through four kinds of corresponding object parser of chaining search device control being set to carrying out chaining search through the pretreated fault tree of structuring.
The chaining search device is searching object with the test point; Differentiate the performance of parsing work through the information content of inspection in the fault tree and the number of objects that has encapsulated, the fault tree node of not resolving is scanned, extracts and encapsulates through calling corresponding object parser.
Through fault tree is resolved, realized the process of intelligence learning, be the original position fault knowledge that is used to set up test procedure with resulting object encapsulation, can set up the test model under the original position state according to this original position fault knowledge.
Fig. 2 shows the synoptic diagram of the encapsulation process of an embodiment; Suppose the pretreated fault tree of process structure of an input chaining search device, comprise in this fault tree: behavioral agent 1, behavior 1, constraint 1, the 1 time corresponding fault 1 of state and the localization of fault 1 of constraint 1 retrain the corresponding behavioral agent of 1 state 2 times 2, behavior 2; Chaining search device control testing attribute resolver, logic association resolver, canonical parameter resolver, diagnosis rule resolver; Parse behavioral agent 1, the behavior 1 of test point 1 respectively; The behavioral agent 2 of test point 2, behavior 2 etc.; And the corresponding state 1 of the logic association of this test point 1, fault 1, other behavioral agent 2 of connecting; The constraint 1 that the canonical parameter of this test point 1 is corresponding, the localization of fault of diagnosis rule 1 correspondence of this test point 1 etc.
Step S3 sets up the test model under the original position state according to four objects such as test point, canonical parameter, diagnosis rule, logic associations.
In one embodiment, the process of setting up test model mainly comprises the preference pattern entrance and sets up internal logic two parts, specifically comprises the steps:
Step S301 is that main body is set up test model with the test point.
Step S302 chooses the inlet test point of test model, and it is the model inlet that this inlet test point is set.
Step S303 sets up the internal logic attribute of each test point in the test model according to canonical parameter, diagnosis rule, the logic association of said encapsulation; Particularly, promptly after having chosen the model entrance, set up logic association tabulation, impact point and the corresponding states thereof of each test point of test model according to the internal object that has encapsulated, and diagnosis rule etc.
Further, can carry out the secondary editor to test model as required.
Fig. 3 shows the test model structural drawing of an embodiment; The inlet test point enters the mouth the 1st layer of next test point (being impact point) A, B that comprises the test point that enters the mouth of test model as model; The 2nd layer of next test point D and goal rule thereof that comprises test point A, the next test point E of test point B, F; The 3rd layer of next test point I, J and goal rule thereof that comprises test point D, next test point K and the goal rule thereof of test point E, the next test point L of test point E, M, N.
Step S4 is according to the test point collecting test data of said test model from measurand; In one embodiment; With the inlet test point is the initial testing position; And find out the test point position of next layer diagnosis test according to said internal logic attribute; Data to the corresponding test point in said position are gathered, and obtain the test data of all test points, and pass test data is confirmed the duty of measurand.
Through the internal logic attribute of each test point in the test model, confirm the test point position of the required test of diagnosis, gather the data of the corresponding test point in this position, accomplish each item test job to test point, can obtain required test data.
Step S5 utilizes said test model to diagnose said test data to obtain abort situation; In one embodiment, the above-mentioned process of obtaining abort situation mainly comprises the steps:
Step S501 compares the canonical parameter in test data of being gathered and the test model, obtains underproof test data; Particularly, the test of corresponding test point obtained corresponding canonical parameter compares in test data and the test model, for quantitative criteria, mainly relatively be embodied in three kinds of situation:
If canonical parameter has higher limit, lower limit, it is qualified to judge when then test result is between this higher limit and lower limit, otherwise defective.
If canonical parameter only has lower limit, it is qualified to judge when then test result is greater than this lower limit, otherwise defective.
If canonical parameter only has higher limit, it is qualified to judge when then test result is less than this higher limit, otherwise defective.
For graphical standard, mainly outside deviation range, belong to defective through being the figure difference of compare test result and standard value, it is qualified within scope, to belong to.
Step S502 matees definite abort situation with the diagnosis rule in underproof test data and the test model; Particularly; To comprise the corresponding test data of the test point of ERST and the coupling of diagnosis rule and carry out localization of fault; Because the attribute that is used to mate when comprising diagnosis in the structure of diagnosis rule; And the guiding attribute that is used to locate, so the community set that is used to mate in the community set of test result and the diagnosis rule is mated entirely, mate the localization of fault of successfully then carrying out rule.
Fig. 4 shows the synoptic diagram of the electronics diagnosis rule attributes match of an embodiment; Coupling fault object (like X model, X circuit board, X test point), content measurement (like voltage, waveform, level), duty (emission, reception), ERST (state 1, state 2, state 3); If mate successfully, then carry out localization of fault, return the coupling of next test point diagnosis rule attribute then, if the coupling failure then is judged to be unknown failure, return the coupling of next test point diagnosis rule attribute.
Below in conjunction with accompanying drawing the embodiment of electronics method for diagnosing faults corresponding intrument of the present invention is described in detail.
Fig. 5 shows the structural representation of the electronics fault diagnosis system of an embodiment; Mainly comprise: information typing unit 100, object encapsulation unit 200, modelling unit 300, data acquisition unit 400 and failure diagnosis unit 500.
Wherein:
In one embodiment; Fault tree mainly is made up of cognizable structures such as behavior, judgement, localization of fault and connecting lines; The rule tree fault tree comprises the relevant information of test point; The relevant information that has comprised test point, the state of the unique demarcation measurand of test point, relevant information comprises magnitude of voltage, current value, frequency values and/or level value etc.
Fig. 6 shows the structural representation of the electronics fault diagnosis system of a preferred embodiment.
In one embodiment, object encapsulation unit 200 comprises pre-processing module 201 and package module 202; Wherein, pre-processing module 201 is used to utilize the function of setting that said fault tree is split as test point, canonical parameter, diagnosis rule and four characteristic elements of logic association; Package module 202 is used for said characteristic element is packaged into test point, canonical parameter, diagnosis rule and four objects of logic association.
Further, pre-processing module 201 realizes the demarcation of test point through extraction behavioral agent and behavior in the behavior node from fault tree; Guide to the connecting line of other behavior or localization of fault under binding occurrence and the Different Results state through the retrieval decision node, obtain canonical parameter and logic association; Through from fault tree, extracting failure message in the diagnosis rule node, obtain the behavioral agent of diagnosis rule node decision node before, obtain diagnosis rule.
Carry out structural pre-service based on above-mentioned fault tree, convert fault tree into system discernible structure input.
Further, above-mentioned four kinds of internal objects are resolved and be encapsulated as again to package module 202 through four kinds of corresponding object parser of chaining search device control being set to carrying out chaining search through the pretreated fault tree of structuring.
The chaining search device is searching object with the test point; Differentiate the performance of parsing work through the information content of inspection in the fault tree and the number of objects that has encapsulated, the fault tree node of not resolving is scanned, extracts and encapsulates through calling corresponding object parser.
Through fault tree is resolved, realized the process of intelligence learning, resulting internal object is encapsulated as the original position fault knowledge that is used to set up test procedure, can set up the test model under the original position state according to this original position fault knowledge.
In one embodiment, modelling unit 300 is set up test model under the original position state and is mainly comprised the preference pattern entrance and set up internal logic two parts; Particularly; With the test point is that main body is set up test model, chooses the inlet test point of test model, and it is the model inlet that this inlet test point is set; Set up logic association tabulation, impact point and the corresponding states thereof of each test point of test model according to the internal object that has encapsulated, and diagnosis rule etc.
In one embodiment; Data acquisition unit 400 further, is the initial testing position with the inlet test point in the collecting test data procedures; And find out the test point position of next layer diagnosis test according to said internal logic attribute; Data to the corresponding test point in said position are gathered, and obtain the test data of all test points, and pass test data is confirmed the measurand duty.
In one embodiment, failure diagnosis unit 500 comprises data analysis module 501 and localization of fault module 502; Wherein, data analysis module 501 is used for the canonical parameter of test data of being gathered and said test model is compared, and obtains underproof test data; Localization of fault module 502 is used for the diagnosis rule of said underproof test data and said test model is mated definite abort situation.
Further, data analysis module 501 obtains the test of corresponding test point that corresponding canonical parameter compares in test data and the test model, for quantitative criteria, mainly relatively be embodied in three kinds of situation:
If canonical parameter has higher limit, lower limit, it is qualified to judge when then test result is between this higher limit and lower limit, otherwise defective.
If canonical parameter only has lower limit, it is qualified to judge when then test result is greater than this lower limit, otherwise defective.
If canonical parameter only has higher limit, it is qualified to judge when then test result is less than this higher limit, otherwise defective.
For graphical standard, mainly outside deviation range, belong to defective through being the figure difference of compare test result and standard value, it is qualified within scope, to belong to.
Further; Localization of fault module 502 will comprise the corresponding test data of the test point of ERST and the coupling of diagnosis rule is carried out localization of fault; Because the attribute that is used to mate when comprising diagnosis in the structure of diagnosis rule; And the guiding attribute that is used to locate, so the community set that is used to mate in the community set of test result and the diagnosis rule is mated entirely, mate the localization of fault of successfully then carrying out rule.
Comprehensive the foregoing description, based on electronics method for diagnosing faults and system, only need be through eigenwert is set up fault model; Realize intelligent diagnostics, test environment is based on original position, and electronics need not to move away from test site; Can under true environment, reduce the troubleshooting time; In time find to lose efficacy and rapid fault location, improve the test program set diagnosis efficiency, be convenient to on-call maintenance.
In addition, be directed to existing fault diagnosis system, in the development technique of fault model based on the fault tree model; What on engineering, adopt is the technology of whole development, and the developer of test procedure must be proficient in circuit knowledge and software programming knowledge, if the developer is from different field; Because it is not enough to the knowledge understanding degree in the other side field; Tend to cause the deviation of conceptual understanding, thereby increased the development difficulty of test procedure, reduced fault removal efficiency.
Electronics method for diagnosing faults of the present invention and system; Be encapsulated as internal system object and handling function storehouse through process, original development technique is divided into two parts from the engineering field, let software developer and test program development person need not understand the knowledge in the other side field software programming; Avoided the conceptual understanding deviation; Simultaneously performance history is divided for two performance historyes that can walk abreast, greatly reduce the development difficulty of test procedure, improved development efficiency.
The above embodiment has only expressed several kinds of embodiments of the present invention, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to claim of the present invention.Should be pointed out that for the person of ordinary skill of the art under the prerequisite that does not break away from the present invention's design, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with accompanying claims.
Claims (10)
1. an electronics method for diagnosing faults is characterized in that, comprises the steps:
Read the fault tree of user's input; Wherein, said fault tree comprises the relevant information of test point;
Said fault tree is packaged into test point, canonical parameter, diagnosis rule and four objects of logic association;
Set up the test model under the original position state according to the object of said encapsulation;
According to the test point collecting test data of said test model from measurand;
Utilize said test model to diagnose said test data to obtain abort situation.
2. electronics method for diagnosing faults according to claim 1 is characterized in that, the relevant information of said test point comprises: magnitude of voltage, current value, frequency values and/or level value.
3. electronics method for diagnosing faults according to claim 1 is characterized in that, the said process that said fault tree is packaged into test point, canonical parameter, diagnosis rule and four objects of logic association comprises:
Utilize the function of setting that said fault tree is split as test point, canonical parameter, diagnosis rule and four characteristic elements of logic association;
Said characteristic element is packaged into test point, canonical parameter, diagnosis rule and four objects of logic association.
4. electronics method for diagnosing faults according to claim 1 is characterized in that, the function that said utilization is set comprises the process that said fault tree is split as test point, canonical parameter, diagnosis rule and four characteristic elements of logic association:
From the behavior node of fault tree, extract behavioral agent and behavior, demarcate each test point;
Under the binding occurrence and Different Results state of retrieval decision node, guide to the connecting line of other behavior or localization of fault, obtain canonical parameter and logic association;
Extract failure message from the diagnosis rule node of fault tree, and obtain the behavioral agent of the decision node before the diagnosis rule node, confirm the diagnosis rule of fault tree.
5. electronics method for diagnosing faults according to claim 1 is characterized in that, the process that said object according to said encapsulation is set up the test model under the original position state comprises:
With the test point is that main body is set up test model;
Choose the inlet test point of test model, said inlet test point is made as the model inlet;
According to canonical parameter, diagnosis rule and the logic association internal object of said encapsulation, set up the internal logic attribute of each test point in the test model.
6. electronics method for diagnosing faults according to claim 5 is characterized in that, comprises according to the process of said test model from the test point collecting test data of measurand:
With said inlet test point is the initial testing position, and finds out the test point position that next layer diagnosis is tested according to said internal logic, and the data of the corresponding test point in said position are gathered, and obtains the test data of all test points.
7. electronics method for diagnosing faults according to claim 6 is characterized in that, the process of utilizing said test model to diagnose said test data to obtain abort situation comprises:
Canonical parameter in test data of being gathered and the said test model is compared, obtain underproof test data;
Diagnosis rule in said underproof test data and the said test model is mated definite abort situation.
8. an electronics fault diagnosis system is characterized in that, comprising:
Information typing unit is used to read the fault tree that the user imports; Wherein, said fault tree comprises the relevant information of test point;
The object encapsulation unit is used for said fault tree is packaged into test point, canonical parameter, diagnosis rule and four objects of logic association;
The modelling unit is used for setting up the test model under the original position state according to the object of said encapsulation;
Data acquisition unit is used for according to the test point collecting test data of said test model from measurand;
Failure diagnosis unit is used to utilize said test model to diagnose said test data to obtain abort situation.
9. electronics fault diagnosis system according to claim 8 is characterized in that, said object encapsulation unit comprises:
Pre-processing module is used to utilize the function of setting that said fault tree is split as test point, canonical parameter, diagnosis rule and four characteristic elements of logic association;
Package module is used for said characteristic element is packaged into test point, canonical parameter, diagnosis rule and four objects of logic association.
10. electronics fault diagnosis system according to claim 8 is characterized in that, said failure diagnosis unit comprises:
Data analysis module is used for the canonical parameter of test data of being gathered and said test model is compared, and obtains underproof test data;
The localization of fault module is used for the diagnosis rule of said underproof test data and said test model is mated definite abort situation.
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