CN102654657A - Method for reducing reject ratio of level black-white line of liquid crystal panel - Google Patents

Method for reducing reject ratio of level black-white line of liquid crystal panel Download PDF

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Publication number
CN102654657A
CN102654657A CN2011101959356A CN201110195935A CN102654657A CN 102654657 A CN102654657 A CN 102654657A CN 2011101959356 A CN2011101959356 A CN 2011101959356A CN 201110195935 A CN201110195935 A CN 201110195935A CN 102654657 A CN102654657 A CN 102654657A
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CN
China
Prior art keywords
liquid crystal
crystal panel
white line
horizontal black
rubbing
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2011101959356A
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Chinese (zh)
Inventor
杨端
郭红光
汪剑成
张龙
胡勇
王彪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOE Technology Group Co Ltd
Hefei BOE Optoelectronics Technology Co Ltd
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BOE Technology Group Co Ltd
Hefei BOE Optoelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by BOE Technology Group Co Ltd, Hefei BOE Optoelectronics Technology Co Ltd filed Critical BOE Technology Group Co Ltd
Priority to CN2011101959356A priority Critical patent/CN102654657A/en
Publication of CN102654657A publication Critical patent/CN102654657A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a method for reducing a reject ratio of a level black-white line of a liquid crystal panel, relating to the technical field of production of the liquid crystal panel. According to the method, ageing treatment is conducted on the liquid crystal panel after a detecting or cutting process. The method provided by the invention not only can reduce the reject ratio of the level black-white line and improve product quality, but also is convenient to implement; and the process control is easy to carry out. Furthermore, the method further can sufficiently use equipment limited at present, so that the process cost is reduced, and the configuration optimization is realized.

Description

Reduce the method for the bad incidence of the horizontal black and white line of liquid crystal panel
Technical field
The present invention relates to the liquid crystal panel production technical field, relate in particular to a kind of method that reduces the bad incidence of the horizontal black and white line of liquid crystal panel.
Background technology
In the production of liquid crystal panel, (Polyimide, PI) operation is divided into PI coating (Coating) and friction (Rubbing) two procedures to polyimide.Wherein, Rubbing technology is meant in order to form certain tilt angle (Pretilt Angle); And arrange liquid crystal molecule according to certain orientation, with friction cloth (Rubbing Cloth) the PI film that has printed on the substrate is rubbed, formation has the technology of certain orientation gender gap trace on the PI film.The size of the Pretilt angle that produces with Rubbing changes with the difference of the condition of Rubbing (rotating speed of Roller, use the pressure of cloth, cloth etc.) and aligning film material to some extent.So Rubbing very important part in the manufacturing engineering of liquid crystal panel.
Present in the production of liquid crystal panel, the bad quality that has a strong impact on product of horizontal black and white line.Horizontal black line and horizontal white line are with a kind of bad in essence; Bad with horizontal black line is example; Shown in Fig. 1 (a), for horizontal black line is edge friction microscope carrier (Rubbing Stage) working direction black line (direction shown in the arrow), that run through whole glass substrate.Cause to demonstrate inhomogeneous (dotted line is depicted as and has the Rubbing hair on the line inhomogeneous on the Rubbing Cloth among Fig. 1 (b)) that the bad main cause of horizontal black and white line is Rubbing Cloth on the liquid crystal panel, the reason of this inhomogeneous generation mainly comprises:
1.Rubbing the defective of Cloth own causes the Rubbing effect inhomogeneous like crinosity, few hair, few line etc.Crinosity, few hair can be regarded the point defect on the Cloth as; Few line is equivalent to the few hair of a whole circle, because friction rotating shaft (Rubbing Roller) 45 ° tilts, few line can form the wave about wave height 10cm in the effect of substrate, shown in Fig. 1 (a) center line I.
2.Pad various end differences such as (array terminals) are high because of the aspect ratio active zone to the influence of cloth: pad etc.; The hair that long term possibly make Cloth go up respective regions produces memory; Can not return to the degree of normal region, thereby cause the Rubbing effect inhomogeneous, the consequence that ends such as Pad difference causes should be straight line on substrate; Shown in Fig. 1 (a) center line II, non-wave; Produce a large amount of static in addition in the Rubbing process, possibly also possibly have influence on the state of corresponding cloth hair in the pad regional centralized.
3.Rubbing hair is gone up the power of adsorbing and also possibly caused Rubbing effect inhomogeneous (this factor has randomness) in the process.
The unevenness of Rubbing Cloth causes that oriented layer can't be orientated or be orientated in a jumble liquid crystal molecule normally in this zone.And the interaction of liquid crystal molecule between compares with the intermolecular interaction of liquid crystal molecule and oriented layer and is much smaller, and the interaction of liquid crystal molecule and oriented layer molecule is a principal element.Normally deflection of liquid crystal molecule in should the zone when powering up, the transmitance of light will be on the low side or higher, and then it is bad to demonstrate horizontal black and white line.
Rubbing intensity is also influential to oriented layer surface liquid crystal aligning degree; The liquid crystal molecular orientation degree on oriented layer surface increases with the increase of frictional strength; Because the inhomogeneous meeting of Rubbing Cloth causes the Rubbing intensity meeting of non-uniform areas bigger than normal or less than normal, the liquid crystal molecular orientation degree on oriented layer surface will change because of the homogeneous degree of Cloth.
Through measurement, the position angle (Azimuth angle/deg) in horizontal black line zone can be different with respect to the normal region, and Pretilt Angle does not occur unusually.Azimuthangle/deg is exactly the major axis of liquid crystal molecule and the angle of Rubbing direction.From the microcosmic angle analysis, when the liquid crystal major axis rotated in a circular conical surface, PretiltAngle can not become and the position angle can change always.
For the PI film; The Rubbing homogeneity is good more; The normal distribution that Azimuth angle/deg distribution is demonstrated will concentrate near 0 degree more; And mainly be distributed in zone away from 0 degree for the position angle in the horizontal black line zone on the panel, make that the normal distribution of Azimuth angle/deg is no longer precipitous.And that Azimuth angle/deg can cause this regional liquid crystal deflection to occur unusually is unusual, and light transmission rate is bigger than normal or less than normal, thereby it is bad to show Mura.
Though existing Rubbing technology has reduced to 0.8% through the modes of strengthening Rubbing Cloth such as letter sorting dynamics, process improving with horizontal black and white line undesirable level, but still can't eliminate fully.
Under the existing processes condition, nuclear detects and directly carries out the module input after (Cell Test) finishes, and horizontal black and white line is bad as a kind of Mura property.Be judged as the bad panel of horizontal black and white line and all be judged to secondary products at Cell Test and module detection (Module Test), seriously restricting the raising of the display screen quantity of high-quality magnitude, the raising to the entire product yield simultaneously has great influence.
Summary of the invention
The technical matters that (one) will solve
The technical matters that the present invention will solve is: provide a kind of and reduce the bad incidence of the horizontal black and white line of liquid crystal panel, improve product quality.
(2) technical scheme
For addressing the above problem, the invention provides a kind of method that reduces the bad incidence of the horizontal black and white line of liquid crystal panel, behind nuclear detection or cutting action, liquid crystal panel is carried out burin-in process.
Wherein, this method uses weatherometer that said liquid crystal panel is carried out burin-in process.
Wherein, use infrared or the laser mode that heats is carried out burin-in process to said liquid crystal panel.
Wherein, said burin-in process is for to carry out the heating of setting-up time and design temperature to said liquid crystal panel.
Wherein, said setting-up time is 16 hours, and design temperature is 60 ℃.
(3) beneficial effect
Method of the present invention can either reduce the bad incidence of horizontal black and white line, improves product quality, and conveniently implements, is easy to technology controlling and process; In addition, can also make full use of existing limiting device, reduce the technology cost, realize distributing rationally.
Description of drawings
Fig. 1 (a) is installed to the preceding view of Rubbing Roller for uneven Rubbing Cloth;
Fig. 1 (b) influences synoptic diagram for uneven Rubbing Cloth is installed to behind the Rubbing Roller to what glass substrate caused;
Fig. 2 (a)-2 (b) is respectively and uses Oven Aging liquid crystal panel to be carried out the Liquid Crystal Molecules Alignment synoptic diagram of burin-in process front and back.
Embodiment
The method of the bad incidence of the horizontal black and white line of reduction liquid crystal panel that the present invention proposes specifies as follows in conjunction with accompanying drawing and embodiment.
The method of the bad incidence of the horizontal black and white line of reduction liquid crystal panel proposed by the invention is behind nuclear detection or cutting action, and liquid crystal panel is carried out burin-in process.
Embodiment 1
In the production run of liquid crystal panel, weatherometer (Aging Oven) equipment that Cell produces in the line only is used for new product is carried out just can using when the high temperature bubble is tested, and utilization factor is lower.Therefore, in the present embodiment, use Aging Oven that liquid crystal panel is carried out burin-in process.
The interaction of liquid crystal molecule between is compared with the intermolecular interaction of liquid crystal molecule and oriented layer and is much smaller, and the interaction of liquid crystal molecule and oriented layer molecule is a principal element.In the operating temperature range of liquid crystal molecule; When liquid crystal molecule returned to normality after heating, the interaction force between liquid crystal molecule can be recovered fully, and when Aging Oven equipment be provided with heating-up temperature be 60 the degree; Time is when being 16 hours; Heating back PI film can carry out reorientation to liquid crystal molecule, and variation has taken place original acting force between PI membrane molecule and liquid crystal molecule, makes the liquid crystal molecular orientation of the friction non-uniform areas that causes because of the Cloth rule more that becomes; The position angle of liquid crystal molecule returns to normal condition in this zone, obeys strict normal distribution.When liquid crystal molecule was powered up, rule was tending towards normally this regional light transmission rate to abnormal area because of orientation has become more, makes some abnormal area demonstrate the display effect identical with the normal region.
Particularly; Increase this Aging Oven equipment at Cell Test; The liquid crystal panel (it is bad to contain horizontal black and white line) that Cell Test is detected after finishing carries out burin-in process, treats fully again this panel to be delivered to module after the cooling, like this; Horizontal black and white line not intuitive ability is reduced to a certain extent, has reduced the bad incidence of horizontal black and white line on the whole.
As shown in Figure 2, be respectively the arrangement situation synoptic diagram (along sectional view) of liquid crystal molecule before and after the Aging Oven burin-in process perpendicular to horizontal black and white line direction, among the figure, arrow is depicted as frictional direction, and Reference numeral 1 is depicted as substrate, and angle θ is a tilt angle.Wherein, in Fig. 2 (a), horizontal black and white line zone (secondary series) liquid crystal can not normal orientation, and the position angle is unusual; The 3rd classifies the liquid crystal molecule of normal orientation as.In Fig. 2 (b), after the burin-in process, the PI film is to the liquid crystal molecule reorientation, horizontal black and white line zone (secondary series) liquid crystal reorientation, and it is normal that recover at the position angle.
Embodiment 2
This enforcement is basic identical with embodiment 1, all uses Aging Oven that liquid crystal panel is carried out burin-in process.Difference is:
Under the existing processes condition; Increase above-mentioned aging process in cutting (Cutting) back; All panels that cut are sent into Aging Oven equipment wear out, configure aging temperature and time, aging end is treated to carry out Cell Test detection again after the fully cooling; Contain the bad panel quantity of horizontal black and white line like this and can obtain to a certain extent reducing, improve product quality on the whole.
Embodiment 3
In this embodiment, adopt Aging Oven infrared or that the laser mode of heating replaces among embodiment 1 and the embodiment 2 that liquid crystal panel is carried out burin-in process.
Above embodiment only is used to explain the present invention; And be not limitation of the present invention; The those of ordinary skill in relevant technologies field under the situation that does not break away from the spirit and scope of the present invention, can also be made various variations and modification; Therefore all technical schemes that are equal to also belong to category of the present invention, and scope of patent protection of the present invention should be defined by the claims.

Claims (5)

1. a method that reduces the bad incidence of the horizontal black and white line of liquid crystal panel is characterized in that, behind nuclear detection or cutting action, liquid crystal panel is carried out burin-in process.
2. the method for the bad incidence of the horizontal black and white line of reduction liquid crystal panel as claimed in claim 1 is characterized in that, this method uses weatherometer that said liquid crystal panel is carried out burin-in process.
3. the method for the bad incidence of the horizontal black and white line of reduction liquid crystal panel as claimed in claim 1 is characterized in that, the mode of using infrared light or laser to heat is carried out burin-in process to said liquid crystal panel.
4. like the method for the bad incidence of each horizontal black and white line of described reduction liquid crystal panel of claim 1-3, it is characterized in that said burin-in process is for to carry out the heating of setting-up time and design temperature to said liquid crystal panel.
5. the method for the bad incidence of the horizontal black and white line of reduction liquid crystal panel as claimed in claim 4 is characterized in that said setting-up time is 16 hours, and design temperature is 60 ℃.
CN2011101959356A 2011-07-13 2011-07-13 Method for reducing reject ratio of level black-white line of liquid crystal panel Pending CN102654657A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011101959356A CN102654657A (en) 2011-07-13 2011-07-13 Method for reducing reject ratio of level black-white line of liquid crystal panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2011101959356A CN102654657A (en) 2011-07-13 2011-07-13 Method for reducing reject ratio of level black-white line of liquid crystal panel

Publications (1)

Publication Number Publication Date
CN102654657A true CN102654657A (en) 2012-09-05

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0676661A2 (en) * 1994-04-04 1995-10-11 International Business Machines Corporation Liquid crystal display device and method for manufacturing the same
JP2008158408A (en) * 2006-12-26 2008-07-10 Optrex Corp Method of manufacturing liquid crystal display panel

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0676661A2 (en) * 1994-04-04 1995-10-11 International Business Machines Corporation Liquid crystal display device and method for manufacturing the same
JP2008158408A (en) * 2006-12-26 2008-07-10 Optrex Corp Method of manufacturing liquid crystal display panel

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Application publication date: 20120905