CN102654543B - Method for testing capacitive touch screens and testing equipment thereof - Google Patents
Method for testing capacitive touch screens and testing equipment thereof Download PDFInfo
- Publication number
- CN102654543B CN102654543B CN201210160423.0A CN201210160423A CN102654543B CN 102654543 B CN102654543 B CN 102654543B CN 201210160423 A CN201210160423 A CN 201210160423A CN 102654543 B CN102654543 B CN 102654543B
- Authority
- CN
- China
- Prior art keywords
- test
- screen
- capacitance
- ito
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The invention provides a method for testing capacitive touch screens, comprising a novel method for integrated circuit (IC) function test, power consumption test, short circuit test and open test. The invention also provides testing equipment for capacitive touch screens, comprising a screen testing plate and a circuit detecting plate. The screen testing plate comprises a metal cylinder and a screen positioning groove; the metal cylinder is closely pressed against the screen testing plate and two ends of the metal cylinder are respectively placed at two sides of the screen positioning groove; the circuit detecting plate comprises a power supply module, a liquid crystal display (LCD) display module, a power consumption detecting module, a testing plate connecting terminal, a microprogrammed control unit (MCU) control module and an IC chip module. The testing plate connecting terminal is connected with a testing interface of the screen testing plate. The method and the equipment which integrate the short circuit test, the open test, the IC function test and the power consumption test can be used for detection of multiple performances and lines of capacitive touch screens; and the metal cylinder is used for simultaneous one-time detection for a row of sensors, which greatly enhances detection efficiency.
Description
Technical field
The invention belongs to and show touch-screen field, be specifically related to a kind of method of testing and testing apparatus thereof that shows touch-screen.
Background technology
In present stage, ITO on touch-screen generally only can test out its conducting and impedance after etching, operation fluency by finger judges whether it is specification product, be that the main IC of dependence of present capacitive touch screen test manufacturer coordinates TP manufacturer to carry out the test in IC function, and the parameters such as short circuit, open circuit and power consumption and circuit connection there is no and gather in testing together.
At present, conventionally there are four kinds for handset touch panel method of testings such as open circuit, short circuits: 1. 2 simulation tests; 2. adopt circuit board and chip test; 3. installation test; 4. the linear test of product.
Adopt installation test, although its test effect is better, installation test is if any defective products, and the machine of need tearing open changes part, increases man-hour, affects manufacturing schedule; Adopt the method for circuit board and chip test to be not suitable for batch production; And adopting the method for 2 simulation tests, its test position can not cover whole touch scope, just carries out simulation test to crucial 2, can not ensure that intactly the pattern to all ITO films and silver-colored line carry out complete detection; Adopt the test speed of the linear test of product slower, bulk article is all tested as need, takes the testing efficiency of the method lower.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind ofly can shield multinomial data and the abnormal method of efficient detection circuit by testing capacitor, and the equipment of a kind of convenience, efficient testing capacitor screen line conditions and IC function is also provided.
The method of testing of a kind of capacitive touch screen of the present invention, comprises IC functional test, power consumption test, short-circuit test and open test.
Described IC functional test comprises the steps: to write firmware to drive IC, from the appointment storehouse of drive IC, reads the version number of firmware and checks.
Described open test comprises the steps:
A1. read the capacitance of each ITO sensor on touch-screen by drive IC, and to define the capacitance that each ITO sensor reads be the electric capacity reference value of corresponding ITO sensor;
A2., the round metal bars being close to and laterally crossing over touch screen surface is set, and described round metal bars is parallel with the line direction of touch-screen;
A3. the round metal bars of rolling to bottom from touch-screen top, the capacitance that round metal bars is every when reading respectively all ITO sensors and change through a line sensor;
Whether the capacitance that a4. judges each ITO sensor has from electric capacity reference value to higher than contacting reference capacitance value to not higher than the variation that falls reference capacitance value after rise, does not satisfy condition and judges that this ITO sensor line is for open circuit;
Whether the rolling that a5. detects round metal bars arrives the bottom of touch-screen, carries out next step if be rolled into bottom, otherwise continues to roll.
Wherein, whether in step a5, detect respectively the capacitance of the ITO sensor that the top and bottom of touch-screen is expert at successively higher than contact reference capacitance value, whether finish with the rolling of determining round metal bars.
Further, between the electric capacity reference value of each ITO sensor, between contact reference capacitance value and fall after rise between reference capacitance value identical or not identical, the contact reference capacitance value that each ITO sensor is corresponding is greater than falling reference capacitance value, falls reference capacitance value after rise and is greater than electric capacity reference value.
Described short-circuit test comprises the steps:
B1. drive IC internal register increases by a fixing capacitance to each ITO sensor successively;
B2. the capacitance that reads this ITO sensor while successively each ITO sensor being increased to capacitance reads the capacitance of other ITO sensors simultaneously;
B3. the charging difference of the capacitance by calculating electric leakage difference between capacitance and the first short circuit reference value of this ITO sensor, other ITO sensors respectively and between the second short circuit reference value;
B4. the each electric leakage difference that increases this ITO sensor after capacitance of judgement whether lower than the charging difference of electric leakage reference capacitance value, other ITO sensors whether higher than charging reference capacitance value, satisfy condition simultaneously and judge that this ITO sensor line is short circuit.
Described power consumption test comprises the steps: to measure the current value of the each power lead of drive IC and makes comparisons with the current reference value that each power lead is set, as exceedes a setting range and judge that drive IC is abnormal.
The present invention also provides a kind of testing apparatus of the method for testing that realizes above-mentioned capacitive touch screen, comprise screen test plate and electric circuit inspection plate, described screen test plate comprises round metal bars and screen locating slot, and the two ends that described round metal bars is close to screen test board and round metal bars lay respectively at screen locating slot both sides; Described electric circuit inspection plate comprises supply module, LCD display module, consumption detection module, test plate link, MCU control module and IC chip module, and described test plate link is connected with the test interface on screen test plate.
The invention has the beneficial effects as follows: set short-circuit test, open test, IC functional test and power consumption test, in one, can detect capacitance touch screen multinomial performance and circuit.And utilize round metal bars to carry out disposable detection to the sensor of same a line simultaneously, greatly improve detection efficiency.
Brief description of the drawings
Fig. 1 is screen test board block structural diagram of the present invention.
Fig. 2 is the module relationship structural drawing of electric circuit inspection plate.
Fig. 3 is the process flow diagram of test process.
Embodiment
The method of testing of a kind of capacitive touch screen of the present invention, comprises IC functional test, power consumption test, short-circuit test and open test.
Described IC functional test comprises the steps: to write firmware to drive IC, from the appointment storehouse of drive IC, reads the version number of firmware and checks.
Described open test comprises the steps:
A1. read the capacitance of each ITO sensor on touch-screen by drive IC, and to define the capacitance that each ITO sensor reads be the electric capacity reference value of corresponding ITO sensor;
A2., the round metal bars being close to and laterally crossing over touch screen surface is set, and described round metal bars is parallel with the line direction of touch-screen;
A3. the round metal bars of rolling to bottom from touch-screen top, the capacitance that round metal bars is every when reading respectively all ITO sensors and change through a line sensor;
Whether the capacitance that a4. judges each ITO sensor has from electric capacity reference value to the variation higher than contact reference capacitance value, then to not higher than the variation that falls reference capacitance value after rise, does not meet this condition judge that this ITO sensor line is for open circuit as changed;
Whether the rolling that a5. detects round metal bars arrives the bottom of touch-screen, carries out next step if be rolled into bottom, otherwise continues to roll.
Wherein, whether in step a5, detect respectively the capacitance of the ITO sensor that the top and bottom of touch-screen is expert at successively higher than contact reference capacitance value, whether finish with the rolling of determining round metal bars.
Normal sensor states should be while touch, and its capacitance has raise one in fixing the fluctuation range of added value, then falls after rise to the fluctuation range of initial capacitance value.
Further, due to the residing situation difference of each ITO sensor, in order to detect accurately, get its relative increase, reduce value, thereby between the electric capacity reference value of each sensor, between contact reference capacitance value and the numerical value falling after rise between reference capacitance value can be identical or not identical, as long as and the contact reference capacitance value of guaranteeing each ITO sensor is all greater than the falling reference capacitance value of its correspondence, falls reference capacitance value after rise and be greater than its corresponding electric capacity reference value.
Described short-circuit test comprises the steps:
B1. drive IC internal register increases by a fixing capacitance to each ITO sensor successively;
B2. the capacitance that reads this ITO sensor while successively each ITO sensor being increased to capacitance reads the capacitance of other ITO sensors simultaneously;
B3. the charging difference of the capacitance by calculating electric leakage difference between capacitance and the first short circuit reference value of this ITO sensor, other ITO sensors respectively and between the second short circuit reference value;
B4. the each electric leakage difference that increases this ITO sensor after capacitance of judgement whether lower than the charging difference of electric leakage reference capacitance value, other ITO sensors whether higher than charging reference capacitance value, satisfy condition simultaneously and judge that this ITO sensor line is short circuit.
Described power consumption test comprises the steps: to measure the current value of the each power lead of drive IC and makes comparisons with the current reference value that each power lead is set, as exceedes a setting range and judge that drive IC is abnormal.
The present invention also provides a kind of testing apparatus of the method for testing that realizes above-mentioned capacitive touch screen, as shown in Figure 1, comprise screen test plate 1 and electric circuit inspection plate 2, described screen test plate 1 comprises round metal bars 11, screen locating slot 12 and promotes handle 13, the two ends of described promotion handle connection metal pole, the two ends that described round metal bars 11 is close to screen test board and round metal bars lay respectively at screen locating slot both sides, can above screen locating slot, roll, screen locating slot is interior in order to place screen to be tested; As shown in Figure 2, described electric circuit inspection plate comprises supply module, LCD display module, consumption detection module, test plate link, MCU control module and IC chip module, and described test plate link is connected with the test interface on screen test plate.
The above not imposes any restrictions technical scope of the present invention, and all any amendment, equivalent variations and modifications of above embodiment being done according to the technology of the present invention essence, all still belong in the scope of technical solution of the present invention.
Claims (5)
1. the method for testing of a capacitive touch screen, comprise IC functional test, power consumption test, short-circuit test and open test, described IC functional test comprises the steps: to write firmware to drive IC, from the appointment storehouse of drive IC, read the version number of firmware and check, described power consumption test comprises the steps: to measure the current value of the each power lead of drive IC and makes comparisons with the current reference value that each power lead is set, as exceed a setting range and judge that drive IC is abnormal, it is characterized in that
Described open test comprises the steps:
A1. read the capacitance of each ITO sensor on touch-screen by drive IC, and to define the capacitance that each ITO sensor reads be the electric capacity reference value of corresponding ITO sensor;
A2., the round metal bars being close to and laterally crossing over touch screen surface is set, and described round metal bars is parallel with the line direction of touch-screen;
A3. the round metal bars of rolling to bottom from touch-screen top, the capacitance that round metal bars is every when reading respectively all ITO sensors and change through a line sensor;
Whether the capacitance that a4. judges each ITO sensor has from electric capacity reference value to higher than contacting reference capacitance value to not higher than the variation that falls reference capacitance value after rise, does not satisfy condition and judges that this ITO sensor line is for open circuit;
Whether the rolling that a5. detects round metal bars arrives the bottom of touch-screen, carries out next step if be rolled into bottom, otherwise continues to roll;
Described short-circuit test comprises the steps:
B1. drive IC internal register increases by a fixing capacitance to each ITO sensor successively;
B2. the capacitance that reads this ITO sensor while successively each ITO sensor being increased to capacitance reads the capacitance of other ITO sensors simultaneously;
B3. the charging difference of the capacitance by calculating electric leakage difference between capacitance and the first short circuit reference value of this ITO sensor, other ITO sensors respectively and between the second short circuit reference value;
B4. the each electric leakage difference that increases this ITO sensor after capacitance of judgement whether lower than the charging difference of electric leakage reference capacitance value, other ITO sensors whether higher than charging reference capacitance value, satisfy condition simultaneously and judge that this ITO sensor line is short circuit.
2. the method for testing of capacitive touch screen according to claim 1, it is characterized in that: between the electric capacity reference value of each ITO sensor, between contact reference capacitance value, fall after rise between reference capacitance value identical or not identical, the contact reference capacitance value that each ITO sensor is corresponding is greater than falling reference capacitance value, falls reference capacitance value after rise and is greater than electric capacity reference value.
3. the method for testing of capacitive touch screen according to claim 1, it is characterized in that: whether in step a5, detect respectively the capacitance of the ITO sensor that the top and bottom of touch-screen is expert at successively higher than contact reference capacitance value, whether finish with the rolling of determining round metal bars.
4. realize the testing apparatus of the capacitive touch screen of claim 1 for one kind, comprise screen test plate and electric circuit inspection plate, it is characterized in that: described screen test plate comprises round metal bars and screen locating slot, and the two ends that described round metal bars is close to screen test board and round metal bars lay respectively at screen locating slot both sides; Described electric circuit inspection plate comprises supply module, LCD display module, consumption detection module, test plate link, MCU control module and IC chip module, and described test plate link is connected with the test interface on screen test plate.
5. the testing apparatus of capacitive touch screen according to claim 4, is characterized in that: described screen test plate also comprises promotion handle, the two ends of described promotion handle connection metal pole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210160423.0A CN102654543B (en) | 2012-05-23 | 2012-05-23 | Method for testing capacitive touch screens and testing equipment thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210160423.0A CN102654543B (en) | 2012-05-23 | 2012-05-23 | Method for testing capacitive touch screens and testing equipment thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102654543A CN102654543A (en) | 2012-09-05 |
| CN102654543B true CN102654543B (en) | 2014-07-30 |
Family
ID=46730198
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210160423.0A Active CN102654543B (en) | 2012-05-23 | 2012-05-23 | Method for testing capacitive touch screens and testing equipment thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102654543B (en) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103675575B (en) * | 2012-09-18 | 2016-07-20 | 英业达科技有限公司 | Single short dot group is used to test system and the method thereof of tested board |
| CN102866317B (en) * | 2012-09-24 | 2014-12-10 | 广东欧珀移动通信有限公司 | Method and system for quick test of mobile terminal capacitive touch screen |
| CN103018594B (en) * | 2012-11-30 | 2015-08-19 | 深圳市汇顶科技股份有限公司 | A kind of method of testing of capacitive touch screen, system and electronic equipment |
| CN103018597B (en) * | 2012-11-30 | 2015-05-13 | 深圳市深越光电技术有限公司 | Multipoint touch testing platform |
| CN103197173A (en) * | 2013-03-11 | 2013-07-10 | 广东欧珀移动通信有限公司 | Test method of capacitance touch screen |
| CN104181410B (en) * | 2013-05-27 | 2017-02-22 | 深圳市海洋王照明工程有限公司 | Method for testing anti-static pressure performance of touch screen |
| CN103558468A (en) * | 2013-10-31 | 2014-02-05 | 中环高科（天津）股份有限公司 | Method for testing capacitance-type screen film material inductor with PCB |
| CN105223430A (en) * | 2014-07-04 | 2016-01-06 | 神讯电脑(昆山)有限公司 | Testing device for touch screens |
| CN104614621A (en) * | 2015-02-13 | 2015-05-13 | 浙江触捷光电科技有限公司 | Novel simulation testing device for touch screen |
| CN106847141A (en) * | 2016-12-29 | 2017-06-13 | 深圳市宇顺电子股份有限公司 | A kind of display screen test circuit |
| CN107943642B (en) * | 2017-11-15 | 2021-02-19 | 歌尔科技有限公司 | Performance test method of capacitive touch sensing device |
| CN109444650B (en) * | 2018-12-28 | 2021-07-30 | 深圳市欧珀达科技有限公司 | Open-short circuit testing method and device for single film of oversized capacitive screen |
| CN113495639A (en) * | 2020-04-01 | 2021-10-12 | 深圳市研测科技有限公司 | Detection method of touch screen of tablet computer |
| CN111522460B (en) * | 2020-04-07 | 2022-12-23 | Oppo（重庆）智能科技有限公司 | Capacitance data processing method and device, electronic equipment and storage medium |
| CN111537867B (en) * | 2020-06-03 | 2023-05-02 | 安徽方兴光电新材料科技有限公司 | Detection method for preventing disassembly winding short circuit and open circuit of touch screen |
| CN112558816B (en) * | 2020-12-25 | 2024-03-12 | 昆山龙腾光电股份有限公司 | Touch substrate testing device and touch substrate testing method |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007018226A (en) * | 2005-07-07 | 2007-01-25 | Three M Innovative Properties Co | Touch panel sensor |
| JP4710573B2 (en) * | 2005-11-30 | 2011-06-29 | ぺんてる株式会社 | Capacitive digital touch panel |
| JP2008026395A (en) * | 2006-07-18 | 2008-02-07 | Sony Corp | Power consumption detection device and method, power consumption controller, image processor, self-luminous light emitting display device, electronic equipment, power consumption control method, and computer program |
| CN101441544B (en) * | 2007-11-20 | 2011-04-13 | 义隆电子股份有限公司 | Detection method of capacitance type ITO touch panel |
| KR100940239B1 (en) * | 2009-08-11 | 2010-02-04 | (주)프로비전 | The etching method and device for making pattern of the electric capacity type touch screen using excimer laser |
| CN101776976B (en) * | 2010-01-28 | 2012-01-25 | 意力(广州)电子科技有限公司 | Linear test machine of capacitance touch screen |
| CN101819496B (en) * | 2010-03-22 | 2012-05-30 | 苏州瀚瑞微电子有限公司 | Detection method of capacitance-type touch screen |
| CN101846712B (en) * | 2010-04-01 | 2012-08-29 | 苏州崴展电子科技有限公司 | ITO (Indium Tin Oxide) electrical characteristic detecting method and detecting system of capacitance type touch screen |
| TW201137696A (en) * | 2010-04-28 | 2011-11-01 | Hon Hai Prec Ind Co Ltd | System and method for testing a touch panel |
| TW201142406A (en) * | 2010-05-21 | 2011-12-01 | Hon Hai Prec Ind Co Ltd | Device for testing abrasion resistance of a touch panel |
| CN101982783B (en) * | 2010-10-20 | 2012-07-04 | 天津市中环高科技有限公司 | Process for testing capacitance type touch screen |
| CN102033673B (en) * | 2011-01-04 | 2013-07-31 | 苏州瀚瑞微电子有限公司 | Capacitance test circuit and method for scanning line of capacitive touch screen and touch screen |
-
2012
- 2012-05-23 CN CN201210160423.0A patent/CN102654543B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN102654543A (en) | 2012-09-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102654543B (en) | Method for testing capacitive touch screens and testing equipment thereof | |
| CN102819476B (en) | Touchscreen controller, control device and testing method of touchscreen | |
| CN104685455B (en) | Input unit and the control method for having used the input unit | |
| KR100971220B1 (en) | The inspection method of the capacitive touch screen panel using lc resonance frequency shift | |
| CN102866322B (en) | A kind of touching device detection method | |
| CN102221951B (en) | Operation method of capacitive touch panel and touch type naked-eye stereoscopic display | |
| JP4889833B2 (en) | Capacitive touch panel inspection device and inspection method | |
| CN104459400A (en) | Detection circuit and detection method used for self-contained touch screen | |
| CN102023739A (en) | Touch-control apparatus | |
| CN107562227A (en) | Self-inductance measurement touch panel | |
| CN103488360A (en) | Baseline capacitance calibration | |
| CN102981686B (en) | A kind of method of capacitive touch screen architecture defects detection | |
| CN104516144B (en) | The capacitance detecting device and its detection method of a kind of touch sensing | |
| US10613695B2 (en) | Integrated touch sensing and force sensing in a touch detection device | |
| CN102508105B (en) | Method for detecting capacitive touch screen by using near field | |
| TW201407434A (en) | Testing system and testing method for touch-control apparatus | |
| CN104199579A (en) | Capacitive touch display device, touch detection method and integrated circuit IC | |
| CN102520819A (en) | Automatic calibration method of single-layer ITO (indium tin oxide) | |
| CN202815126U (en) | Equipment for testing capacitive touch screen | |
| CN104391616A (en) | Method and device for acquiring pixel point capacitance detecting range of touch screens | |
| CN102945648B (en) | Test device and test method for display apparatus | |
| CN104198921A (en) | Method for testing printed circuit boards | |
| CN102981059B (en) | A kind of capacitive touch screen architecture defect detecting method | |
| CN205484599U (en) | Testing arrangement of touch -sensitive screen | |
| KR101671835B1 (en) | Apparatus and method for non-touch testing touch screen module |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |