CN102621086A - Optical system of large plain film spectrum tester - Google Patents
Optical system of large plain film spectrum tester Download PDFInfo
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- CN102621086A CN102621086A CN2012100812429A CN201210081242A CN102621086A CN 102621086 A CN102621086 A CN 102621086A CN 2012100812429 A CN2012100812429 A CN 2012100812429A CN 201210081242 A CN201210081242 A CN 201210081242A CN 102621086 A CN102621086 A CN 102621086A
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Abstract
The invention discloses an optical system of a large plain film spectrum tester. The optical system comprises a tungsten lamp light source, wherein light of the tungsten lamp light source is diverged onto a first spherical mirror; after being reflected by the first spherical mirror, light is reflected to a first reflecting mirror through an incident light slit; after being reflected by the first reflecting mirror, light is reflected to an optical grating through a second spherical mirror; light optically dispersed by the optical grating is reflected to a third spherical mirror, and is emitted from the third spherical mirror; monochromatic light emitted from an emitted light slit and an optical fiber in sequence is reflected to a first lens, and reaches a second reflecting mirror after being emitted from the first lens; monochromatic light emitted from the second reflecting mirror is reflected to a second lens after passing through a test sample stage; and monochromatic light emitted from the second lens reaches a receiver at last. The optical system is characterized in that: a 45-degree angle is formed between the second reflecting mirror and incident light. Direct arrangement of a sample on a workbench for testing is realized, positioning of a small-pore-diameter sample is ensured, and the test accuracy and correctness are ensured.
Description
Technical field
The present invention relates to the spectral instrument field that material composition is analyzed, specifically just relate to a kind of optical system that can carry out the big plain film spectral investigator of vertical checkout to the little light hole of large scale sample.
Background technology
The basic functional principle of big plain film spectral investigator is that the material in the solution excites down in the irradiation of light, has produced the absorption effect to light, and material is to have optionally to the absorption of light.Various material all has its absorption spectrum separately; Therefore when certain monochromatic light passes through solution; Its energy will be absorbed and weaken; The degree that luminous energy weakens and the concentration of material have certain proportionate relationship, big plain film spectral investigator utilize this principle come to by analytic sample and standard specimen light intensity to amalyzing substances composition recently.
Big plain film spectral investigator all has a wide range of applications in every field such as agricultural product, food, health, medicine, chemical industry, people's lives, is modern industry, agricultural, the indispensable analytical instrument of scientific research.Big plain film spectral investigator basic structure is made up of light source, monochromator, sample chamber, photoelectric detection system and signal indicating device five parts.
Big plain film spectral investigator sample chamber is the place of placing sample to be detected, and traditional testing tool sample chamber volume is less, in case when sample to be tested is the template sample; Sample can only be erected on the test platform; The location that is unfavorable for sample, influence seriously measuring accuracy and test accuracy, when test size is greater than the sample of 80mm * 100mm if desired; Also need bulk sample be destroyed; Be cut into the size aptitude test less than 80mm * 100mm, complicated operation can't test size allows the sample that destroys more greatly and not.
At present traditional simultaneously testing tool is in test process, and the test hot spot is bigger, is not suitable for the requirement of existing more and more science and technology field to the test hot spot.
Summary of the invention
The object of the invention provides a kind of optical system of big plain film spectral investigator; Through change to existing light path; Make that the optic path direction changes in the big plain film spectral investigator of tradition, dwindle the test hot spot, realized the little light hole test of large scale testing sample.Testing sample can be placed directly on the worktable test, guaranteed measuring accuracy and test accuracy, easy and simple to handle, again can not damage test sample, practiced thrift cost.
Technical scheme
In order to realize above-mentioned technical purpose, the present invention designs a kind of optical system of big plain film spectral investigator, comprises tungsten light source; The light of tungsten light source diffuses on first spherical mirror, and light is equipped with the incident light slit after reflecting from first spherical mirror on the reflected light path; Light is mapped to first catoptron through the incident light slit, light by first mirror reflects after, get into second spherical mirror on the reflected light path; Via being incident upon the 3rd spherical mirror after the grating dispersion on the second spherical mirror reflected light path; Light gets into after the 3rd spherical mirror penetrates and is contained in the emergent light slit that penetrates on the light path, and light is incident upon optical filter after the emergent light slit penetrates, from monochromatic light to the first lens of optical filter ejaculation; Monochromatic light arrives second catoptron after first lens penetrate; The monochromatic light that penetrates from second catoptron is incident upon second lens after penetrating the specimen platform on the light path, the monochromatic light that penetrates from second lens arrives receiver at last, it is characterized in that:
Said second catoptron becomes 45 with incident light.
Said incident light slit and emergent light slit all are variable extra small rounded slot.
Beneficial effect
The present invention has carried out new design on light path; Monochromatic light vertically penetrated sample through 45 ° catoptron with monochromatic light again through lens and was mapped on the photelectric receiver again; Thereby having realized that sample can directly lie on the worktable tests; Guarantee the location of small-bore sample, guaranteed measuring accuracy and accuracy.
Description of drawings
Accompanying drawing 1 is a structural representation of the present invention.
Embodiment
Below in conjunction with accompanying drawing and specific embodiment, the present invention is further specified.
Shown in accompanying drawing 1; A kind of optical system of big plain film spectral investigator; Comprise tungsten light source 1, the light of tungsten light source 1 diffuses on first spherical mirror 2, after light reflects from first spherical mirror 2; Incident light slit 3 through variable extra small rounded slot is mapped to first catoptron 4; Light by the reflection of first catoptron 4 after, after grating 6 chromatic dispersions, be incident upon the 3rd spherical mirror 7 by being mapped to grating 6 behind second spherical mirror 5, again after the 3rd spherical mirror 7 penetrates successively through the emergent light slit 8 of variable extra small rounded slot and monochromatic light to the first lens 10 of optical filter 9 ejaculations; Monochromatic light arrival after first lens 10 penetrate becomes 45 second catoptron 11 with incident light; The monochromatic light that penetrates from second catoptron 11 is incident upon second lens 13 after through the specimen platform 12 that is placed with sample, and the light that penetrates from second lens 13 arrives receiver 14 at last, and receiver 14 is analyzed and obtained material composition.
The present invention has carried out new design on light path; Monochromatic light vertically penetrated sample through 45 ° second catoptron 11 with monochromatic light again through lens and was mapped on the photelectric receiver 12 again; Thereby having realized that sample can directly lie on the worktable tests; Guarantee the location of small-bore sample, improved measuring accuracy and accuracy.
Claims (2)
1. the optical system of a big plain film spectral investigator; Comprise tungsten light source (1), the light of tungsten light source (1) diffuses on first spherical mirror (2), after light reflects from first spherical mirror (2); Incident light slit (3) is housed on the reflected light path; Light injects to first catoptron (4) through incident light slit (3), and light gets into second spherical mirror (5) on the reflected light path after being reflected by first catoptron (4); Via being incident upon the 3rd spherical mirror (7) after grating (6) chromatic dispersion on second spherical mirror (5) reflected light path; Light gets into after the 3rd spherical mirror (7) penetrates and is contained in the emergent light slit (8) that penetrates on the light path, and light is incident upon optical filter (9) after emergent light slit (8) penetrates, from monochromatic light to the first lens (10) of optical filter (9) ejaculation; Monochromatic light arrives second catoptron (11) after first lens (10) penetrate; The monochromatic light that penetrates from second catoptron (11) is incident upon second lens (13) after penetrating the specimen platform (12) on the light path, the monochromatic light that penetrates from second lens (13) arrives receiver (14) at last, it is characterized in that:
Said second catoptron (11) becomes 45 with incident light.
2. the optical system of a kind of big plain film spectral investigator as claimed in claim 1 is characterized in that: said incident light slit (3) and emergent light slit (8) all are variable extra small rounded slot.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100812429A CN102621086A (en) | 2012-03-23 | 2012-03-23 | Optical system of large plain film spectrum tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100812429A CN102621086A (en) | 2012-03-23 | 2012-03-23 | Optical system of large plain film spectrum tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102621086A true CN102621086A (en) | 2012-08-01 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012100812429A Pending CN102621086A (en) | 2012-03-23 | 2012-03-23 | Optical system of large plain film spectrum tester |
Country Status (1)
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| CN (1) | CN102621086A (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2482688Y (en) * | 2001-07-12 | 2002-03-20 | 中国科学院物理研究所 | Micro-area reflection transmission spectrometer |
| CN201255719Y (en) * | 2008-08-29 | 2009-06-10 | 上海欣茂仪器有限公司 | Novel near-infrared spectrophotometer |
| CN101788339A (en) * | 2010-01-27 | 2010-07-28 | 中国科学院上海技术物理研究所 | Spectral automatic calibration device and method of imaging spectrometer |
| CN202512053U (en) * | 2012-03-23 | 2012-10-31 | 上海欣茂仪器有限公司 | Optical system of large flat sheet spectrum tester |
-
2012
- 2012-03-23 CN CN2012100812429A patent/CN102621086A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2482688Y (en) * | 2001-07-12 | 2002-03-20 | 中国科学院物理研究所 | Micro-area reflection transmission spectrometer |
| CN201255719Y (en) * | 2008-08-29 | 2009-06-10 | 上海欣茂仪器有限公司 | Novel near-infrared spectrophotometer |
| CN101788339A (en) * | 2010-01-27 | 2010-07-28 | 中国科学院上海技术物理研究所 | Spectral automatic calibration device and method of imaging spectrometer |
| CN202512053U (en) * | 2012-03-23 | 2012-10-31 | 上海欣茂仪器有限公司 | Optical system of large flat sheet spectrum tester |
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Application publication date: 20120801 |