CN102508149A - Method and device for determining time sequence parameter of device - Google Patents
Method and device for determining time sequence parameter of device Download PDFInfo
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- CN102508149A CN102508149A CN2011103459114A CN201110345911A CN102508149A CN 102508149 A CN102508149 A CN 102508149A CN 2011103459114 A CN2011103459114 A CN 2011103459114A CN 201110345911 A CN201110345911 A CN 201110345911A CN 102508149 A CN102508149 A CN 102508149A
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Abstract
The invention discloses a method and device for determining a time sequence parameter of a device. The method comprises the following steps: an upper computer writes a time sequence parameter to be tested into a time sequence module of a device to be tested, performs a pressure test on the device, judges whether an untested time sequence parameter exists after the test is finished, writes the next time sequence parameter into the time sequence module to continue the pressure test if the untested time sequence parameter exists, or calculates an average value of time sequence parameters which pass the pressure test and regards the average value of the time sequence parameters as the optimal time sequence parameter of the time sequence module of the device. According to the method and device for determining the time sequence parameter of the device, disclosed by the invention, the optimal time sequence parameter of the device can be determined rapidly, debugging time of an embedded system is shortened, and embedded products can run steadily in various environments.
Description
Technical field
The present invention relates to field of embedded technology, relate in particular to definite method and apparatus of a kind of device time sequence parameter in the embedded system.
Background technology
Propelling along with The development in society and economy and information industry; Embedded system is infiltrated all trades and professions gradually; Little of mobile phone, iPad (panel computer), STB, Smart Home; Big to communication base station, space satellite, modernization industry control etc., embedded system is just being played the part of more and more indispensable role in people's live and work.Embedded system is application-centered, is the basis with the computer technology, and software and hardware can be cut out the dedicated computer system of (able to programme, restructural).In a little embedded system, possibly include devices such as various types of hardware memory device, CPLD, ASIC and field programmable gate array; In order to ensure that embedded system can stable operation; Generally need be before starting embedded system, the time sequence parameter of some devices is configured or adjusts.
Prior art generally through searching device handbook and CPU handbook, is configured according to the time sequence parameter of the parameter recommendation value in the handbook to device.Yet actual conditions are; Even dispose according to the parameter recommendation value of handbook time sequence parameter to some devices; System maybe be still can't stable operation, for example for some sequential Sensitive Apparatuses, such as internal memory; Even satisfied the handbook requirement, the situation of high low temperature fluctuation of service still can appear.And when system need change parts; Also can't find the time sequence parameter of these devices through handbook, therefore how under the situation of unknown device time sequence parameter, the best time sequence parameter of quick positioner spare; And device is carried out time sequence parameter dispose, be that this area has technical matters to be solved.
Summary of the invention
The objective of the invention is to, provide a kind of device time sequence parameter to confirm method and apparatus,, can't keep the problem of system stable operation to solve the best time sequence parameter that prior art can't quick positioner spare.
The present invention solves the problems of the technologies described above through following method:
A kind of device time sequence parameter is confirmed method, and said method may further comprise the steps:
Host computer writes a tfi module of device under test with time sequence parameter to be tested, and above-mentioned device is carried out pressure test, behind the EOT, judges whether the not time sequence parameter of mistake to be tested;
If, then next time sequence parameter is write in the above-mentioned tfi module, proceed pressure test; Otherwise calculate mean value through the time sequence parameter of pressure test, and with above-mentioned mean value as the best time sequence parameter of above-mentioned device at above-mentioned tfi module.
Said method also comprises following initialization step:
Above-mentioned host computer obtains the address information of the register of device under test, and according to above-mentioned address information above-mentioned device is divided into a plurality of tfi modules.
The address information of above-mentioned register comprises the start address and the bit wide of above-mentioned register.
Above-mentioned host computer is divided into above-mentioned device after a plurality of tfi modules, and is further comprising the steps of:
Write down the start address and the bit wide of each tfi module, and be the number of times that each tfi module is provided with time sequence parameter to be tested respectively and carries out above-mentioned pressure test.
Before above-mentioned device was carried out pressure test, above-mentioned host computer judged that can above-mentioned device run well, and if not, then skips the step of pressure test.
Behind the EOT, above-mentioned host computer also writes down time sequence parameter to be tested and corresponding test result thereof.
Above-mentioned pressure test is the read-write pressure test, and above-mentioned device comprises internal memory or flash memory.
The present invention also adopts following technical scheme:
A kind of device time sequence parameter is confirmed device, comprises host computer, and above-mentioned host computer comprises: parameter writing module, pressure test module, test judge module, parameter determination module;
The above-mentioned parameter writing module is used for time sequence parameter to be tested is write a tfi module of device under test;
Above-mentioned pressure test module is used for device under test is carried out pressure test;
Above-mentioned test judge module is used to judge whether the not time sequence parameter of mistake to be tested;
The above-mentioned parameter determination module is used to calculate the mean value through the time sequence parameter of pressure test, and with above-mentioned mean value as the best time sequence parameter of device under test in the corresponding time sequence module.
Said apparatus also comprises initialization module, and parameter is provided with module;
Above-mentioned initialization module is used to obtain the address information of the register of device under test, and according to above-mentioned address information above-mentioned device under test is divided into a plurality of tfi modules.
Above-mentioned parameter is provided with module, is used to the number of times that each tfi module of device under test is provided with time sequence parameter to be tested respectively and carries out pressure test.
The address information of above-mentioned register comprises the start address and the bit wide of above-mentioned register.
Above-mentioned pressure test is the read-write pressure test, and above-mentioned device under test comprises internal memory or flash memory.
Compare with prior art; The present invention has following useful technique effect: the time sequence parameter allocation problem that the present invention can effectively solve device (comprises internal memory; FLASH), shortened the debug time of embedded system, made the embedded product can both stable operation under various environment.The present invention has strong innovation, and expansion is good, the characteristics that applicability is wide.
Description of drawings
Accompanying drawing described herein is used to provide further understanding of the present invention, constitutes a part of the present invention, and illustrative examples of the present invention and explanation thereof are used to explain the present invention, does not constitute improper qualification of the present invention.In the accompanying drawings:
Fig. 1 is the process flow diagram that the device time sequence parameter is confirmed method in the preferred embodiment of the present invention;
Fig. 2 is the module frame chart that the device time sequence parameter is confirmed device in the preferred embodiment of the present invention.
Embodiment
In order to make technical matters to be solved by this invention, technical scheme and beneficial effect clearer, clear,, the present invention is further elaborated below in conjunction with accompanying drawing and embodiment.Should be appreciated that specific embodiment described herein only in order to explanation the present invention, and be not used in qualification the present invention.
Fig. 1 is the process flow diagram that the device time sequence parameter is confirmed method in the preferred embodiment of the present invention.Above-mentioned like Fig. 1, the method for the preferred embodiment of the present invention may further comprise the steps:
Step S101: host computer obtains the address information of the register of device under test, and according to above-mentioned address information above-mentioned device is divided into a plurality of tfi modules;
When the time sequence parameter of device under test was unknown, host computer obtained the address information of the register of device under test through the host computer configuration software, comprised the start address and the bit wide of register.The bit wide of above-mentioned register possibly be 8,16 or 32.Different according to bit wide, host computer can be divided into a plurality of tfi modules with device, to satisfy the operation needs of embedded system.For example, can 8 register be divided into three tfi modules of type such as 2/3/3,2/4/2, or be divided into four tfi modules of 2/2/2/2 type.
Step S102: write down the start address and the bit wide of each tfi module, and time sequence parameter to be tested and pressure test number of times are set respectively for each tfi module;
After host computer is divided into a plurality of tfi modules with above-mentioned device; Can obtain and write down the address information such as start address and bit wide of each tfi module through the host computer configuration software; Thereby host computer can be according to the address information of each tfi module in the subsequent step; Preset time sequence parameter to be tested is write each tfi module, respectively each tfi module is tested, and judge the best time sequence parameter of each tfi module through test.
Step S103 a: tfi module that time sequence parameter to be tested is write device under test;
In the embodiment of the invention, can each tfi module of the unknown device under test of time sequence parameter be configured separately.Because host computer has write down the address information of each tfi module, so host computer can write time sequence parameter to be tested in the specific time sequence module that needs the configuration time sequence parameter according to the address information of tfi module.
Step S104: judge that can above-mentioned device run well,, otherwise change step S106 over to if then change step S105 over to;
In step S104; Host computer at first judge write time sequence parameter to be tested after; Whether device can run well, if then further device is read and write pressure test; Have only when device and passed through pressure test, think that just this time sequence parameter is above-mentioned device at one of optional time order parameter of above-mentioned tfi module.
Step S105: the pressure test number of times according to preset, carry out pressure test to above-mentioned device;
Wherein, the pressure test among the step S105 is meant the read-write pressure test.Because the read-write pressure test is a prior art, the Therefore, omited further specifies its.
Step S106: behind the EOT, host computer writes down the corresponding test result of above-mentioned time sequence parameter;
Behind the EOT, time sequence parameter that host computer can be to be tested with each and corresponding test result thereof are preserved, and perhaps test result are plotted as eye pattern.The horizontal ordinate of eye pattern can be time sequence parameter to be tested, and ordinate can be test result.Wherein test result comprise that device can not run well, device can run well but can not be through pressure test, device can be through pressure test.
Step S107: judge whether the not time sequence parameter of mistake to be tested,, otherwise change step S108 over to if then change step S103 over to;
Because among the step S102; Host computer is a plurality of time sequence parameters to be tested for each tfi module is provided with; Therefore when a time sequence parameter to be tested write tfi module and test finish after; Host computer also will judge whether to also have the not time sequence parameter of mistake to be tested, has only after all preset time sequence parameter to be tested mistake all to be tested, could select best time sequence parameter.Select best time sequence parameter method such as step S108.
Step S108: host computer is according to the test result of local record, calculates the mean value through the time sequence parameter of pressure test, and with above-mentioned mean value as the best time sequence parameter of above-mentioned device at above-mentioned tfi module.
Fig. 2 is the module frame chart that the device time sequence parameter is confirmed device in the preferred embodiment of the present invention.As shown in Figure 2, the device of the preferred embodiment of the present invention comprises host computer, and above-mentioned host computer comprises parameter writing module 3, pressure test module 4, test judge module 5, parameter determination module 6;
Above-mentioned parameter writing module 3 is used for time sequence parameter to be tested is write a tfi module of device under test;
Above-mentioned pressure test module 4 is used for device under test is carried out pressure test;
Above-mentioned test judge module 5 is used to judge whether the not time sequence parameter of mistake to be tested;
Above-mentioned parameter determination module 6 is used to calculate the mean value through the time sequence parameter of pressure test, and with above-mentioned mean value as the best time sequence parameter of device under test in the corresponding time sequence module.
Said apparatus also comprises initialization module 1, and parameter is provided with module 2;
Above-mentioned initialization module 1 is used to obtain the address information of the register of device under test, and according to above-mentioned address information above-mentioned device under test is divided into a plurality of tfi modules.The address information of above-mentioned register comprises the start address and the bit wide of above-mentioned register.
Above-mentioned parameter is provided with module 2, is used to the number of times that each tfi module of device under test is provided with time sequence parameter to be tested respectively and carries out pressure test.
Above-mentioned pressure test is the read-write pressure test, and above-mentioned device under test comprises internal memory or flash memory.
Said explanation illustrates and has described the preferred embodiments of the present invention; But as previously mentioned; Be to be understood that the present invention is not limited to the form that this paper discloses, should do not regard eliminating as, and can be used for various other combinations, modification and environment other embodiment; And can in invention contemplated scope described herein, change through the technology or the knowledge of said instruction or association area.And change that those skilled in the art carried out and variation do not break away from the spirit and scope of the present invention, then all should be in the protection domain of accompanying claims of the present invention.
Claims (11)
1. a device time sequence parameter is confirmed method, it is characterized in that, said method comprising the steps of:
Host computer writes a tfi module of device under test with time sequence parameter to be tested, and said device is carried out pressure test, behind the EOT, judges whether the not time sequence parameter of mistake to be tested;
If, then next time sequence parameter is write in the said tfi module, proceed pressure test; Otherwise calculate mean value through the time sequence parameter of pressure test, and with said mean value as the best time sequence parameter of said device at said tfi module.
2. method according to claim 1 is characterized in that, said method also comprises following initialization step:
Said host computer obtains the address information of the register of device under test, and according to said address information said device is divided into a plurality of tfi modules.
3. method according to claim 2 is characterized in that: the address information of said register comprises the start address and the bit wide of said register.
4. method according to claim 3 is characterized in that: said host computer is divided into said device after a plurality of tfi modules, and is further comprising the steps of:
Write down the start address and the bit wide of each tfi module, and be the number of times that each tfi module is provided with time sequence parameter to be tested respectively and carries out said pressure test.
5. method according to claim 4 is characterized in that: before said device was carried out pressure test, said host computer judged that can said device run well, and if not, then skips the step of pressure test.
6. method according to claim 5 is characterized in that: behind the EOT, said host computer also writes down time sequence parameter to be tested and corresponding test result thereof.
7. method according to claim 1 is characterized in that: said pressure test is the read-write pressure test, and said device comprises internal memory or flash memory.
8. a device time sequence parameter is confirmed device, comprises host computer, it is characterized in that, said host computer comprises: parameter writing module, pressure test module, test judge module, parameter determination module;
Said parameter writing module is used for time sequence parameter to be tested is write a tfi module of device under test;
Said pressure test module is used for device under test is carried out pressure test;
Said test judge module is used to judge whether the not time sequence parameter of mistake to be tested;
Said parameter determination module is used to calculate the mean value through the time sequence parameter of pressure test, and with said mean value as the best time sequence parameter of device under test in the corresponding time sequence module.
9. device according to claim 8 is characterized in that said device also comprises initialization module, and parameter is provided with module;
Said initialization module is used to obtain the address information of the register of device under test, and according to said address information said device under test is divided into a plurality of tfi modules.
Said parameter is provided with module, is used to the number of times that each tfi module of device under test is provided with time sequence parameter to be tested respectively and carries out pressure test.
10. device according to claim 9 is characterized in that: the address information of said register comprises the start address and the bit wide of said register.
11. device according to claim 10 is characterized in that: said pressure test is the read-write pressure test, and said device under test comprises internal memory or flash memory.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103412807A (en) * | 2013-08-12 | 2013-11-27 | 浪潮电子信息产业股份有限公司 | Memory inspection testing system |
| CN113806151A (en) * | 2021-09-07 | 2021-12-17 | 深圳宝新创科技股份有限公司 | Time sequence parameter determination method, device, electronic equipment and system |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1185848A (en) * | 1996-01-08 | 1998-06-24 | 松下电器产业株式会社 | Time-series signal predicting apparatus |
| CN1458532A (en) * | 2002-05-14 | 2003-11-26 | 华为技术有限公司 | Automatic detecting method and device fr signal quality and time sequence |
| CN101038602A (en) * | 2007-04-19 | 2007-09-19 | 复旦大学 | Clock deviation arrangement method driven by production yield under technique parametric variation |
| US20110054640A1 (en) * | 2009-08-31 | 2011-03-03 | Gary Keith Law | Methods and apparatus to adjust control loop timing in a process control system |
| CN102074181A (en) * | 2010-09-07 | 2011-05-25 | 福建华映显示科技有限公司 | Time sequence control method of display panel |
| CN102141967A (en) * | 2010-11-02 | 2011-08-03 | 华为技术有限公司 | Bus time sequence parameter configuration method and device |
-
2011
- 2011-11-04 CN CN2011103459114A patent/CN102508149A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1185848A (en) * | 1996-01-08 | 1998-06-24 | 松下电器产业株式会社 | Time-series signal predicting apparatus |
| CN1458532A (en) * | 2002-05-14 | 2003-11-26 | 华为技术有限公司 | Automatic detecting method and device fr signal quality and time sequence |
| CN101038602A (en) * | 2007-04-19 | 2007-09-19 | 复旦大学 | Clock deviation arrangement method driven by production yield under technique parametric variation |
| US20110054640A1 (en) * | 2009-08-31 | 2011-03-03 | Gary Keith Law | Methods and apparatus to adjust control loop timing in a process control system |
| CN102004472A (en) * | 2009-08-31 | 2011-04-06 | 费希尔-罗斯蒙特系统公司 | Method and apparatus to adjust control loop timing in a process control system |
| CN102074181A (en) * | 2010-09-07 | 2011-05-25 | 福建华映显示科技有限公司 | Time sequence control method of display panel |
| CN102141967A (en) * | 2010-11-02 | 2011-08-03 | 华为技术有限公司 | Bus time sequence parameter configuration method and device |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103412807A (en) * | 2013-08-12 | 2013-11-27 | 浪潮电子信息产业股份有限公司 | Memory inspection testing system |
| CN113806151A (en) * | 2021-09-07 | 2021-12-17 | 深圳宝新创科技股份有限公司 | Time sequence parameter determination method, device, electronic equipment and system |
| CN113806151B (en) * | 2021-09-07 | 2024-01-02 | 深圳宝新创信息技术有限公司 | Time sequence parameter determining method, device, electronic equipment and system |
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Application publication date: 20120620 |