CN102507207A - Automobile travel performance test system with multiple CCD (Charge Coupled Device) or CMOS (Complementary Metal-Oxide-Semiconductor Transistor) image sensors and control method of automobile travel performance test system - Google Patents
Automobile travel performance test system with multiple CCD (Charge Coupled Device) or CMOS (Complementary Metal-Oxide-Semiconductor Transistor) image sensors and control method of automobile travel performance test system Download PDFInfo
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- CN102507207A CN102507207A CN2011103131824A CN201110313182A CN102507207A CN 102507207 A CN102507207 A CN 102507207A CN 2011103131824 A CN2011103131824 A CN 2011103131824A CN 201110313182 A CN201110313182 A CN 201110313182A CN 102507207 A CN102507207 A CN 102507207A
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Abstract
The invention provides an automobile travel performance test system with multiple CCD (Charge Coupled Device) or CMOS (Complementary Metal-Oxide-Semiconductor Transistor) image sensors and a control method of the automatic travel performance test system, in particular to a non-contact automobile road travel performance test system provided with 2-10 fixed measuring points on a trial run road for automobile delivery inspection and provided with 2-3 CCD or CMOS image sensors at each measured point, and a control method for controlling the multiple CCD or CMOS image sensors to work cooperatively. The automobile travel performance test system with the multiple CCD or CMOS image sensors and the control method of the automobile travel performance test system overcome the multiple defects of manual subjective judgment in an outdoor road travel performance test loop in the process of performance test of finished automobiles before leaving a factory, avoid the phenomenon that automobiles with quality problems enter the market caused by influences from multiple factors, such as quality, mood, metal state and the like of detection personnel existing in manual subjective judgment and poor accuracy of detection results, and meets the requirements of automobile production beat (mostly one automobile/1-2min) as for the performance test of the finished automobiles before leaving the factory.
Description
Technical field
The present invention relates to a kind of a plurality of CCD (Charge Coupled Device; The CCD imageing sensor) imageing sensor or CMOS (Complementary Metal Oxide Semiconductor; Complementary metal oxide semiconductor (CMOS), voltage-controlled a kind of amplifying device.Be the elementary cell of forming the cmos digital integrated circuit) imageing sensor.The test macro of collaborative work and control method, system and the control method of utilizing a plurality of CCD or cmos image sensor that high-speed moving object is tested automatically under particularly a kind of environment of natural lighting out of doors.
Background technology
In order to ensure vehicle product quality, avoid defective in quality vehicle to flow to market, automobile product all will carry out comprehensive vehicle performance test before dispatching from the factory, and its content comprises indoor stand and outdoor roadworthiness two major parts.No matter be indoor stand or the test of outdoor roadworthiness, for the test of the vehicle performance before automobile dispatches from the factory, all must satisfy the requirement of automobile production beat (being 1～2 minute car mostly).
The at present existing equipment that is used for the outdoor roadworthiness test of automobile all is " vehicular " testing apparatus that need install onboard, is that vehicle to be tested is accomplished the test event of all dispatching from the factory and allowed 3～5 times of shared time at least on outdoor proving road and will " vehicular " testing apparatus be installed on the car and uncart the needed time.Because the outdoor roadworthiness test link of vehicle performance test can not provide " vehicular " time that testing apparatus is installed onboard and uncarted before automobile dispatched from the factory; And big (automobile is accomplished whole projects on outdoor proving road the test need 5～10 minutes approximately of the number of devices that needs; The auto-producing pitch time is 1～2 minute mostly, and the number of devices that need dispose in view of the above should be 5～10 covers).Therefore, up to the present, the outdoor roadworthiness test link that vehicle performance detected before automobile dispatched from the factory seldom adopts instrument and equipment to test, and mainly adopts the backward method of testing of ten minutes of artificial subjective judgement.Because there are multifactorial influences such as examined peopleware, mood, the state of mind in artificial subjective judgement, and the shortcomings such as poor accuracy of testing result, therefore, exists the vehicle of quality problems to come into the market just to become an inevitable phenomenon.
Summary of the invention
For many deficiencies of artificial subjective judgement in the outdoor roadworthiness test link in the vehicle performance test process before overcoming automobile and dispatching from the factory, the invention provides and a kind of 2～10 fixing measuring points are set on the proving road of automobile factory inspection, the noncontact trap for automobile rideability test macro of 2～3 CCD or cmos image sensor be installed and controlled many CCD or the control method of cmos image sensor collaborative work at each measuring point place.
Specific as follows; A kind of many CCD or cmos image sensor running car Performance Test System; It comprises 2～10 CCD or cmos image sensor test cell, CCD or cmos image sensor controller, image recognition and signal Processing computing machine; Each CCD or cmos image sensor test cell comprise at least two CCD or cmos image sensor; CCD or cmos image sensor link to each other with CCD or cmos image sensor controller, and CCD or cmos image sensor controller and CCD or cmos image sensor link to each other with the signal Processing computing machine with image recognition respectively.
As further improvement of the present invention, said CCD or cmos image sensor test cell also comprise the sensor protection case, and said CCD or cmos image sensor are arranged in the said sensor protection case.
As further improvement of the present invention, said test macro also comprises the erecting frame that CCD or cmos image sensor test cell are installed, and CCD or cmos image sensor test cell are fixed on the erecting frame.Like CCD or cmos image sensor test cell by the middle part that is bolted to erecting frame.
As further improvement of the present invention, each erecting frame is at a distance of 10～50m.
As further improvement of the present invention, CCD or cmos image sensor link to each other with CCD or cmos image sensor controller through shielded signal wire.Shielded signal wire is the outer wrap one deck screen layer at signal conductor; Play jamproof effect; General screen layer is braiding copper mesh or copper pool (aluminium); Screen layer needs ground connection in use, thereby external undesired signal is imported the earth by this layer, avoids interference the loss that reduces transmission signals when signal gets into the inner conductor interference.
As further improvement of the present invention, CCD or cmos image sensor controller and CCD or cmos image sensor all link to each other with the signal Processing computing machine with image recognition with optical cable.
As further improvement of the present invention, each CCD or cmos image sensor test cell comprise 2～3 CCD or cmos image sensor.
The principle of work of many CCD or cmos image sensor running car Performance Test System is: when by the examination vehicle when the test segment of CCD or cmos image sensor test cell is installed; The CCD at CCD or each measuring point place of cmos image sensor controller control or cmos image sensor are taken continuously successively by the vehicle image of each test cell visual range of examination vehicle arrival and (are tried in the process of vehicle through each CCD of measuring point place or cmos image sensor visual range; CCD or cmos image sensor are taken the image about 10 successively continuously); Image recognition and signal Processing computing machine can obtain being tried vehicle through reaching the coordinate (x of 20～100 points on the test segment driving trace through to the analyzing and processing by the next image information of optical cable transmission
i, y
i) (i=1,2,3, Λ, 100), the vertical right side of pointing to the driver of center line of x coordinate and test segment, the consistent the place ahead of pointing to automobile of y coordinate with the center line of test segment; Image recognition and signal Processing computing machine can provide CCD synchronously through custom-designed software or cmos image sensor is exported the correct time t that each opens image information
i(i=1,2,3, Λ, 100).
Aforementioned by the coordinate (x of examination vehicle through each point on the test segment driving trace
i, y
i) in (i=1,2,3, Λ, 100): x
iTried the lateral shift of vehicle when test segment goes, promptly the running deviation value of vehicle traveling process is the important indicator of directional stability when studying garage stability and automobile brake; y
iTried the length travel of vehicle when test segment goes, i.e. the operating range of automobile, the difference of the ordinate of adjacent two width of cloth images promptly is travel speed (instantaneous velocity) v of this small period with the ratio of the mistiming of taking this two width of cloth image
iThat is:
In the formula: y
i, y
I+1---the ordinate when trying vehicle and arrive i point and i+1 point respectively;
t
i, t
I+1---time when trying vehicle and arrive i point and i+1 point respectively;
Being tried the average velocity
of vehicle through test segment is:
Speed of operation is the necessary important indicator of research automobile each item performance (dynamic property, economy, braking, ride performance, control stability).Automobile instantaneous velocity v has been arranged
i, average velocity
With automobile at the time at each coordinate points place t
iJust can obtain the max speed in the vehicle dynamic quality evaluation index
(maximal rate the distance y through stipulate of automobile reaching
i-y
1With used time t
i-t
1Ratio) and acceleration time t
j=t
i-t
1(automobile accelerates to the used time of test segment terminal point from the test segment starting point); Had by the lateral shift x of examination vehicle when test segment goes
iJust can obtain automobile brake estimation of stability index brake side-slipping amount (beginning to the whole braking procedure that stops, the direction finding side-play amount of automobile) L from braking
z=x
t-x
q(x
t---automobile brake is to the pairing x coordinate of stop, x
qAutomobile begins the pairing x coordinate in braking point), running car estimation of stability index---driving running deviation amount (the motor turning dish is in free state to set the laterally offset amount of the speed of a motor vehicle through test segment) L
x=x
i-x
1(x
i---automobile arrives the x coordinate of test segment destination county, x
1---automobile arrives test segment and plays the x coordinate at place), the snakelike track consistance of manoeuvereability of automobile evaluation index
(x
i---the x coordinate of each point on the snakelike track of automobile that records, x
Li---the x coordinate of each point on the snakelike theory locus of automobile).
The measured picture signal of CCD or cmos image sensor receives the influence of intensity of illumination big, and illumination is crossed and can be caused in CCD or the cmos image sensor quantity of electric charge in each pixel to reach capacity by force and diffusion towards periphery, makes image blurring difficult identification; A little less than the illumination too, the quantity of electric charge that tested object is produced in each pixel can be flooded by the dark current in CCD or the cmos image sensor, and can't export identifiable image.Just because of this; When the digital photogrammetry technology is applied to the engineering test field; Usually to carry out some special processings to photoenvironment and the surface of measurand of test, be used for photogrammetric special darkroom and carry out luminous intensity distribution and at measured surface spraying developer etc. according to the actual needs of test like construction.Yet; Test environment not only of the present invention is open-air natural lighting environment; Under different seasonal and weather condition; Intensity of illumination differ more than thousands of times (summer fine the meridian hour the about 200000Lux of intensity of illumination, the intensity of illumination that the common overcast and rainy about 2000Lux of intensity of illumination, thunderstorm rain is preceding when Black clouds presse down overhead is about 100Lux), and car surface can not carry out any special processing (as spraying developer etc.).Although can take to regulate the luminous flux (regulating the size of aperture) that gets into CCD or cmos image sensor and time shutter to reach the effect of raising picture quality; But because measurand is the automobile of running at high speed; Its time shutter at least should be less than 1/10000 second; Otherwise smear can be brought very big influence (as if the speed of automobile with 100km/h, formed smear of 1/10000 second time shutter is 2.8mm) to test result, promptly can only in less than 1/10000 second time range, regulate; In addition, for the outdoor road performance test of the automobile of test frequency very high (testing the vehicle more than 1000 every day),, therefore can not carry out the adjusting of aperture if having time in real time because the adjusting of CCD or cmos image sensor aperture is the mechanical adjustment mode.This shows that traditional method can not satisfy outdoor all-weather car road performance test.In order to overcome many shortcomings of classic method; The present invention adopts the basic thought of 2～3 ccd image sensors to be: the aperture of 3 ccd image sensors at same measuring point place is set to different numerical value; As the CD-ROM drive of CCD1 be set to 8, the CD-ROM drive of CCD2 is set to 4, the CD-ROM drive of CCD3 is set to 2, corresponds respectively to the test of high light environment, medium photoenvironment and low light environment with it.So combine to reach very good test effect to the in real time automatic adjusting of time shutter.According to the method described above; We have carried out continuous 500 hours simulation test at the roof of Wuhan University of Technology automobile experiment chamber, only need mix the daylight lamp of two 40w at night, no matter are the direct projections of high light at high noon; Still at moonless pitch-dark night, can obtain respond well test pattern.
The present invention also provides the control method of a kind of many CCD or cmos image sensor running car Performance Test System, starts test macro, and test macro gets into self check automatically; Find that like self check system equipment is unusual, then the removal system fault is all in proper working order as if the test macro armamentarium; Image recognition and signal Processing computing machine compose the initial value of time shutter for whole CCD or cmos image sensor; Each CCD of each measuring point or cmos image sensor are respectively taken an image simultaneously, and relatively each image is found out that best image of effect, and that CCD that the output image effect is best or cmos image sensor promptly are chosen to be test and use sensor; Image recognition and signal Processing computing machine are analyzed the brightness of this image immediately; The time shutter of proofreading and correct this ccd image sensor according to brightness of image, if brightness of image is darker, prolonging exposure time then; Otherwise, then shorten the time shutter.
Image recognition and signal Processing computing machine are analyzed the brightness of image immediately, can obtain better to test effect.
As further improvement of the present invention, said image recognition and signal Processing computing machine whenever carry out once based on selected CCD or the test of cmos image sensor and definite time shutter at a distance from the time of one section setting again.Every carry out again once can avoiding the Thunderstorm Weather surround lighting significantly to jump variation to testing the influence of effect based on selected CCD or the test of cmos image sensor and definite time shutter at a distance from the time (as 5 minutes) of one section setting.
As further improvement of the present invention, find that like self check system equipment is unusual, the method for removal system fault is following: image recognition and signal Processing computing machine send audio alert, and on display screen, demonstrate the title of faulty equipment.
A kind of many CCD of the present invention or cmos image sensor running car Performance Test System and control method overcome automobile dispatch from the factory before many deficiencies of artificial subjective judgement in the outdoor roadworthiness test link in the vehicle performance test process; Avoided because there are multifactorial influences such as examined peopleware, mood, the state of mind in artificial subjective judgement; And the poor accuracy of testing result, the phenomenon that exists the vehicle of quality problems to come into the market.And for the test of the vehicle performance before automobile dispatches from the factory, satisfied the requirement of automobile production beat (being 1～2 minute car mostly).
Description of drawings
Fig. 1 is many CCD of the present invention or cmos image sensor running car Performance Test System structural representation;
Fig. 2 is the process flow diagram of the control method of many CCD of the present invention or cmos image sensor running car Performance Test System.
Each component names is following among the figure:
The one CCD or cmos image sensor test cell 1, the 2nd CCD or cmos image sensor test cell 2, image recognition and signal Processing computing machine 3, the 3rd CCD or cmos image sensor test cell 4, CCD or cmos image sensor controller 5, guard box 6, CCD or cmos image sensor 7, first erecting frame 8, second erecting frame 9, the 3rd erecting frame 10.
Embodiment
Below in conjunction with description of drawings and embodiment the present invention is further specified.
As shown in Figure 1; Many CCD or cmos image sensor running car Performance Test System comprise 2～10 CCD or cmos image sensor test cell, CCD or cmos image sensor 7, sensor protection case 6, CCD or cmos image sensor controller 5, image recognition and a signal Processing computing machine 3 and the parts such as erecting frame that CCD or cmos image sensor test cell are installed; Each CCD or cmos image sensor test cell comprise that 2～3 (but are not limited to 2-3; Can be for a plurality of; Perhaps also can be one) CCD or cmos image sensor; CCD or cmos image sensor test cell are with the middle part of bolt to erecting frame, and each erecting frame is at a distance of 10～50m, and the visual range of CCD or cmos image sensor is 10m * 8m.CCD or cmos image sensor 7 link to each other with CCD or cmos image sensor controller 5 through shielded signal wire, and CCD or cmos image sensor controller 5 and CCD or cmos image sensor 7 all link to each other with the signal Processing computing machine with image recognition with optical cable.
The control flow and the method for many CCD or cmos image sensor running car Performance Test System are as shown in Figure 2.After starting test macro, test macro gets into self check automatically.Find that like self check system equipment is unusual, then image recognition and signal Processing computing machine send audio alert, and on display screen, demonstrate the title of faulty equipment, like " CCD5 fault " or " CCD controller failure " etc.; If the test macro armamentarium is all in proper working order; Image recognition and signal Processing computing machine compose the initial value (as 1/20000 second) of time shutter for whole CCD or cmos image sensor; (this sentences 3 for example for 3 CCD of each measuring point or cmos image sensor; Can be other numerical value) respectively take an image simultaneously, relatively 3 images are found out that best image of effect, and that CCD that the output image effect is best or cmos image sensor promptly are chosen to be test and use sensor.In order to obtain better to test effect, image recognition and signal Processing computing machine are analyzed the brightness of this image immediately, according to brightness of image proofread and correct this CCD or cmos image sensor time shutter (if brightness of image is darker, prolonging exposure time then; Otherwise, then shorten the time shutter).Significantly jump variation to testing the influence of effect for fear of the Thunderstorm Weather surround lighting, whenever carried out again once based on selected CCD or the test of cmos image sensor and definite time shutter at a distance from 5 minutes.
Above content is to combine concrete preferred implementation to the further explain that the present invention did, and can not assert that practical implementation of the present invention is confined to these explanations.For the those of ordinary skill of technical field under the present invention, under the prerequisite that does not break away from the present invention's design, can also make some simple deduction or replace, all should be regarded as belonging to protection scope of the present invention.
Claims (10)
1. CCD more than a kind or cmos image sensor running car Performance Test System; It is characterized in that: it comprises 2～10 CCD or cmos image sensor test cell, CCD or cmos image sensor controller (5), image recognition and signal Processing computing machine (3); Each CCD or cmos image sensor test cell comprise at least two CCD or cmos image sensor (7); CCD or cmos image sensor (7) link to each other with CCD or cmos image sensor controller (5), and CCD or cmos image sensor controller (5) and CCD or cmos image sensor (7) link to each other with signal Processing computing machine (3) with image recognition respectively.
2. many CCD according to claim 1 or cmos image sensor running car Performance Test System; It is characterized in that: said CCD or cmos image sensor test cell also comprise sensor protection case (6), and said CCD or cmos image sensor (7) are arranged in the said sensor protection case (6).
3. many CCD according to claim 1 or cmos image sensor running car Performance Test System; It is characterized in that: said test macro also comprises the erecting frame that CCD or cmos image sensor test cell are installed, and CCD or cmos image sensor test cell are fixed on the erecting frame.
4. many CCD according to claim 1 or cmos image sensor running car Performance Test System is characterized in that: each erecting frame is at a distance of 10～50m.
5. many CCD according to claim 1 or cmos image sensor running car Performance Test System is characterized in that: CCD or cmos image sensor (7) link to each other with CCD or cmos image sensor controller (5) through shielded signal wire.
6. many CCD according to claim 1 or cmos image sensor running car Performance Test System is characterized in that: CCD or cmos image sensor controller (5) and CCD or cmos image sensor (7) all link to each other with the signal Processing computing machine with image recognition with optical cable.
7. many CCD according to claim 1 or cmos image sensor running car Performance Test System is characterized in that: each CCD or cmos image sensor test cell comprise 2～3 CCD or cmos image sensor (7).
8. the control method of CCD more than a kind or cmos image sensor running car Performance Test System is characterized in that: start test macro, test macro gets into self check automatically; Find that like self check system equipment is unusual, then the removal system fault is all in proper working order as if the test macro armamentarium; Image recognition and signal Processing computing machine compose the initial value of time shutter for whole CCD or cmos image sensor; Each CCD of each measuring point or cmos image sensor are respectively taken an image simultaneously, and relatively each image is found out that best image of effect, and that CCD that the output image effect is best or cmos image sensor promptly are chosen to be test and use sensor; Image recognition and signal Processing computing machine are analyzed the brightness of this image immediately; The time shutter of proofreading and correct this CCD or cmos image sensor according to brightness of image, if brightness of image is darker, prolonging exposure time then; Otherwise, then shorten the time shutter.
9. the control method of many CCD according to claim 8 or cmos image sensor running car Performance Test System is characterized in that: said image recognition and signal Processing computing machine whenever carry out once based on selected CCD or the test of cmos image sensor and definite time shutter at a distance from the time of one section setting again.
10. the control method of many CCD according to claim 8 or cmos image sensor running car Performance Test System; It is characterized in that: find that like self check system equipment is unusual; The method of removal system fault is following: image recognition and signal Processing computing machine send audio alert, and on display screen, demonstrate the title of faulty equipment.
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| CN201110313182.4A CN102507207B (en) | 2011-10-14 | Many CCD or cmos image sensor running car Performance Test System and control method thereof |
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| CN201110313182.4A CN102507207B (en) | 2011-10-14 | Many CCD or cmos image sensor running car Performance Test System and control method thereof |
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