CN102495783A

CN102495783A - Single particle error injection simulation testing system

Info

Publication number: CN102495783A
Application number: CN2011104048379A
Authority: CN
Inventors: 王巍; 王宁; 徐飞; 殷骏; 刘慧芳; 郑国平
Original assignee: Tianjin Polytechnic University
Current assignee: Tianjin Polytechnic University
Priority date: 2011-12-08
Filing date: 2011-12-08
Publication date: 2012-06-13

Abstract

The invention discloses a single particle error injection simulation testing system which comprises a computer control module, a testing main board and an FPGA (Field Programmable Gate Array) module to be tested. For the single particle error injection simulation testing system, the irradiation condition of radiating particles is simulated by using numerical values, error parameters and injection dosage are set in the computer control module, errors are transmitted to the testing main board, then the injection of the errors and the comparison and counting of overturn bits are carried out, and finally test results are fed back to a master control computer for carrying out error result analysis. The single particle error injection simulation testing system can be used for checking the reliability of FPGA devices reinforced by anti-single particle radiation.

Description

A kind of single-particle error is injected emulation test system

Technical field

The present invention relates to a kind of single-particle error and inject emulation test system, relate in particular to the reliability demonstration of a kind of FPGA through the anti-single particle Design of Reinforcement.

Technical background

FPGA device based on the SRAM basis has been widely used in the control system of all kinds of spacecrafts and satellite; But under the more abominable outer space environment of some electromagnetism, radiation, large scale integrated circuit and all kinds of SRAM type FPGA device usually can be interfered, when for example single high energy particle is injected the sensitive volume of semiconductor devices in the universe; The device logic state is overturn: originally bank bit " 0 " becomes " 1 "; Perhaps " 1 " becomes " 0 ", thereby causes systemic-function disorderly, and single particle effect promptly takes place; This effect can cause the Circuits System function to be made mistakes; Or even permanent inefficacy, it is about 70% that the satellite accident proportion that in all kinds of satellite accidents, is caused by single particle effect has accounted for, and along with its possibility that single particle effect takes place of increase of chip integration is also increasing.

In the last few years; Fast development along with China's aerospace industry; The storer of SRAM type has become the main carrier in the Spacecraft Electronic system, and therefore designing the complete anti-single particle overturn test macro of a cover has very strong practical value for the reliability of studying SRAM type FPGA device.

Summary of the invention

The objective of the invention is to; Provide a kind of error to inject analogue system based on FPGA; The single particle effect that this system can the virtual space radiation be produced; Through at the various error parameters of control layout setting, FPGA device to be measured is carried out error inject, to verify its reliability under the irradiation situation.

Technical scheme of the present invention is: a kind of single-particle error is injected emulation test system, comprises computer control module, serial ports control module, system data control module, RAM memory module, functional test output comparison module, FPGA module to be measured; Computer control module comprises a personal-machine interface, has functions such as setting, test result demonstration and analytic statistics such as sum of errors test parameter; The system data control module is made up of a Spartan-3E Series FPGA chip, and the injection of departure information is carried out anti-single particle overturn to FPGA to be measured and reinforced; The RAM memory module is made up of a CY7C026 high speed twoport static RAM (SRAM), is used to store proper configuration position information and error and injects bidding protocol; Functional test output comparison module is made up of a Spartan-3E Series FPGA chip, and the data that master control FPGA is read compare, and judge whether it bit flipping has taken place; FPGA to be measured can be the fpga chip that needs test arbitrarily, accepts various reinforcing circuit and accepts the error injection.

The present invention has positive effect: (1) the present invention is imported the error injection information that sets into FPGA to be measured through computing machine; On FPGA to be measured and testing host, carry out the injection of error and the comparison of flip bit again; At last test result is fed back to main control computer and carry out error injection interpretation of result, with the reliability of the FPGA device of checking after the anti-single particle radiation hardened.(2) the present invention uses comparatively cheap Spartan-3E Series FPGA chip, and cost is lower, is convenient to improve integrated level and large-scale production.

Description of drawings

Fig. 1 is the overall construction drawing that a kind of single-particle error provided by the invention is injected emulation test system.

Fig. 2 is the test flow chart that a kind of single-particle error provided by the invention is injected emulation test system.

Embodiment

See also Fig. 1, the present invention includes computer control module, serial ports control module, system data control module, RAM memory module, functional test output comparison module, FPGA module to be measured.The computer control interface module is carried out error setting, test parameter etc. and is provided with and test result is shown and analytic statistics; The serial ports control module is a RS-232 serial ports, can accomplish the information interchange between computer control part and the testing host; The system data control module is used the fpga chip of Spartan-3E series 250,000 gate leves, the injection of departure information and FPGA to be measured is carried out anti-single particle overturn reinforce; The RAM memory module is used a CY7C026 high speed twoport static RAM (SRAM), and the correct configuration information and the error that are used for FPGA in memory system data control mould FPGA and the functional test output comparison module are injected bidding protocol; The same fpga chip that uses Spartan-3E series 250,000 gate leves of functional test output comparison module under the control of system data control module is comparing proper configuration bit data and the data after the test of anti-single particle radiation hardened is read; FPGA module to be measured provides an interface, and this interface can insert the FPGA to be measured of different model.

See also Fig. 2; The error that main control computer will compile, set is injected information and is become the scale-of-two text through JTAG or SelectMAP command conversion; At this, use RS-232 interface to realize the communication between the system data control module FPGA on main control computer and the test board.After system data control module FPGA receives the effective instruction that main frame sends; Its type is judged that earlier (the director data type can be complete " 0 "; " 1 " entirely, or " 0 " " 1 " is alternate, or " 1 " " 0 " is alternate); System data control module FPGA just writes identical initialization data in the RAM on the SRAM in FPGA to be measured and the test board then; After error was injected emulated data initialization completion, main control computer carried out from detecting, to confirm the data initialization completion the data in the RAM on FPGA to be measured and the test board through instruction again.Inject test when carrying out in error, after master control FPGA receives the instruction of reading data in the FPGA to be measured, will be according to sequence of addresses reading of data in the FPGA to be measured, and the data that SRAM on these data and the test board is interior send to data comparison circuit and compare.If data consistent explains that then bit flipping does not take place the data of sram memory storage unit, if data are inconsistent; Explain that then upset has taken place the data in the SRAM, the address that system data control module FPGA will write down error unit this moment, the error data content and the quantity of makeing mistakes; And it is passed back in the main control computer, simultaneously, the address counter in the RAM is from increasing 1; Data to carry out the next address unit compare, and this process circulates always and carries out finishing up to error testing.

The present invention can not need the very high outer space radiation environment of testing cost and single particle effect that is virtually reality like reality under the situation of the radiating particle bombardment that the ground high-energy particle accelerator produces; Adopt the method for numerical simulation single particle effect that the bank bit of FPGA bit memory is overturn; Radiation resistance to the FPGA device is tested; The system testing cost is low, and the test effect is obvious, has very strong practicality.

In sum, above embodiment is only in order to technical scheme of the present invention to be described but not to its restriction; All based on above-mentioned basic ideas, do not break away from various changes and the modification done in this creation spirit and the scope, all should belong to the disclosed scope of the present invention.

Claims

1. a single-particle error is injected emulation test system; It is characterized in that this error is injected emulation test system and comprised computer control module, serial ports control module, system data control module, RAM memory module, functional test output comparison module, FPGA module to be measured.Computer control module is connected with testing host through a serial ports control module; The system data control module is exported between the comparison module with functional test and is connected, and carries out the control of data and relatively output; The RAM memory module is connected in the system data control module, carries out the storage of output data.FPGA module to be measured is connected on the testing host through standard interface.

2. a kind of single-particle error according to claim 1 is injected emulation test system, it is characterized in that computer control module comprises a personal-machine interface, has functions such as setting, test result demonstration and analytic statistics such as sum of errors test parameter.

3. a kind of single-particle error according to claim 1 is injected emulation test system; It is characterized in that; The system data control module is made up of a Spartan-3E Series FPGA chip, and the injection of departure information is carried out anti-single particle overturn to FPGA to be measured and reinforced.

4. a kind of single-particle error according to claim 1 is injected emulation test system, it is characterized in that the RAM memory module is made up of a CY7C026 high speed twoport static RAM (SRAM), is used to store proper configuration position information and error and injects bidding protocol.

5. a kind of single-particle error according to claim 1 is injected emulation test system; It is characterized in that; Functional test output comparison module is made up of a Spartan-3E Series FPGA chip, and the data that master control FPGA is read compare, and judge whether it bit flipping has taken place.

6. a kind of single-particle error according to claim 1 is injected emulation test system, it is characterized in that, FPGA to be measured can be the fpga chip that needs test arbitrarily, receives various reinforcing circuit and accepts the error injection.