CN102467845A - Microwave diffraction system - Google Patents
Microwave diffraction system Download PDFInfo
- Publication number
- CN102467845A CN102467845A CN2010105444706A CN201010544470A CN102467845A CN 102467845 A CN102467845 A CN 102467845A CN 2010105444706 A CN2010105444706 A CN 2010105444706A CN 201010544470 A CN201010544470 A CN 201010544470A CN 102467845 A CN102467845 A CN 102467845A
- Authority
- CN
- China
- Prior art keywords
- microwave
- diffraction according
- crystal model
- cylinder
- detecting device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Abstract
The invention relates to a microwave diffraction system, which comprises two flat panels, a lattice model, a transmitter and a detector. The two flat panels have conductivity and are relatively arranged in parallel to form a planar waveguide. The lattice model comprises a plurality of cylinders which are arranged in order. The cylinders are arranged between the two flat panels. The transmitter is arranged on the outer edge of the planar waveguide and is used for providing a microwave towards the lattice model. The detector is arranged on the outer edge of the planar waveguide and is used for detecting the microwave reflected by the lattice model. A diffraction pattern obtained by using the microwave diffraction system is close to a theoretical value.
Description
Technical field
The relevant a kind of diffraction of the present invention system, particularly a kind of microwave diffraction system that utilizes microwave simulation Prague diffraction.
Background technology
Prague diffraction (Bragg diffraction) has been applied on the x-ray crystallography, to understand the arrangement mode of atom in crystal.With regard to teaching, utilize X-ray, electronics or neutron to verify that the diffraction phenomenon is not only too expensive, and be exposed in the x-ray harmful for a long time health.In addition, the crystalline network of crystal can't also be had a greatly reduced quality for teaching efficiency for the human eye finding.
Utilize the metal column of microwave irradiation simulation crystalline network can overcome the problems referred to above and with low cost.Yet existing microwave diffraction system still has volume to need the problem of the diffraction angle deviation theory value that 1～2 meter and experiment obtained greatly, approximately.
In sum, the less and microwave diffraction system that present the diffraction pattern close with theoretical value of a kind of volume being provided is the target that the present utmost point need be made great efforts.
Summary of the invention
The purpose of this invention is to provide a kind of microwave diffraction system, diffraction pattern and theoretical value that it appeared are close.
Microwave diffraction of the present invention system comprises two flat boards, a crystal model, a transmitter and a detecting device.Two flat boards have electric conductivity, and the opposing parallel setting is to constitute a slab guide.Crystal model comprises a plurality of regularly arranged cylinders, and cylinder is arranged between two flat boards.Transmitter is arranged at the outer rim of slab guide, in order to a microwave to be provided towards crystal model.Detecting device is arranged at the outer rim of slab guide, in order to detect the microwave that crystal model reflected.
Microwave diffraction of the present invention system can make the diffraction phenomenon appear with the mode of two dimension, and through the suitable crystal model of design, and diffraction pattern and theoretical value that microwave diffraction of the present invention system is appeared are close.In addition, microwave diffraction of the present invention system uses the microwave of shorter wavelength, and therefore, the size of whole diffraction system can significantly be dwindled.
Description of drawings
Below in conjunction with accompanying drawing specific embodiment of the present invention is explained in detail, when the effect that is easier to understand the object of the invention, technology contents, characteristics and is reached, wherein:
Fig. 1 is for showing the microwave diffraction system decomposition figure of one embodiment of the invention.
Fig. 2 is the constitutional diagram of the microwave diffraction system of demonstration one embodiment of the invention.
Fig. 3 a is a vertical view, shows the crystal model of the microwave diffraction system of one embodiment of the invention.
Fig. 3 b is the stereographic map of the crystal model of the microwave diffraction system of demonstration one embodiment of the invention.
Fig. 4 is the sectional view of the relative position of the crystal model of the microwave diffraction system that shows one embodiment of the invention and slab guide.
Fig. 5 and Fig. 6 show the incident angle θ of microwave
InAnd scattering angle θ
ScGraph of a relation.
Embodiment
Please referring to figs. 1 through Fig. 4, the microwave diffraction system of one embodiment of the invention comprises two dull and stereotyped 11a, 11b, a crystal model 12, a transmitter 13 and a detecting device 14.Dull and stereotyped 11a, 11b have electric conductivity, and the opposing parallel setting, to constitute a slab guide 10.Crystal model 12 comprises a plurality of regularly arranged cylinders 121.By suitable design, the cylinder 121 of crystal model 12 is arranged between dull and stereotyped 11a, the 11b.For example, cylinder 121 is arranged on the substrate, substrate is arranged in the perforate 111 of dull and stereotyped 11a, and cylinder 121 is protruded in the slab guide, and is as shown in Figure 4.In other words, the cylinder 121 of the atom in the simulation crystalline network promptly is arranged in the slab guide 10.Be noted that cylinder 121 also can directly be arranged at the inner surface of dull and stereotyped 11a or 11b.In an embodiment, the radius of cylinder is smaller or equal to λ/2 π, and wherein λ is the wavelength that is incident to the microwave of crystal model 12.
The above-mentioned explanation that continues, transmitter 13 (only illustrating front-end architecture) is arranged at the outer rim of slab guide 10, in order to towards crystal model 12 microwave to be provided.In an embodiment, the direction of an electric field of microwave that is incident to crystal model 12 is perpendicular to flat board.For example, the microwave that is incident to crystal model 12 can be a TEM mode wave.Detecting device 14 (only illustrating front-end architecture) also is arranged at the outer rim of slab guide 10, in order to detect the microwave that crystal model 12 is reflected.For example, detecting device 14 can become the energy conversion of microwave voltage signal to appear.
In an embodiment, transmitter 13 comprises one first mode converter 131, and it is arranged between dull and stereotyped 11a, the 11b, and the one of which end is connected with transmitter 13.First mode converter 131 is a bugle shape, that is the link internal diameter of first mode converter 131 is less than its open end internal diameter.The microwave that first mode converter 131 can convert the microwave of first pattern to second pattern reenters and is incident upon crystal model 12.For example, first mode converter 131 is with TE that microwave source provided
10The microwave of pattern converts the microwave of TEM pattern to.In an embodiment, the open end internal diameter width of first mode converter 131 approximates or is slightly larger than the width of crystal model 12, makes the microwave that is incident to crystal model 12 can concentrate and contain whole crystal model 12.
In an embodiment, detecting device 14 comprises one second mode converter 141, and it is arranged between dull and stereotyped 11a, the 11b, and the one of which end is connected with detecting device 14.Second mode converter 141 also is a bugle shape, that is the link internal diameter of second mode converter 141 is less than its open end internal diameter.Be noted that in order accurately to detect the angle of microwave reflection, second mode converter, 141 open end internal diameter width are less than the open end internal diameter width of first mode converter 131.
In an embodiment, detecting device 14 is connected with a rotary seat 15, and making detecting device 14 can be the central shaft rotation with crystal model 12, and a bearing 16a for example is set between the junction of rotary seat 15 and dull and stereotyped 11b.So, detecting device 14 can receive the microwave of various reflection angles and convert electrical signals into.
In an embodiment, microwave diffraction of the present invention system comprises a bearing 17, and it is in order to carry crystal model 12.The cylinder 121 of crystal model 12 is stretched on slab guide through the perforate 111 of dull and stereotyped 11a again.According to this structure, be the crystal model 12 of replaceable different crystalline lattice structure through dismounting bearing 17.The preferably, transmitter 13 is connected with the dull and stereotyped 11a with perforate 111, and bearing 17 can be with respect to dull and stereotyped 11a rotation, and for example, bearing 17 is provided with a bearing 16b with the junction of dull and stereotyped 11a.So, control transmitter 13 can be adjusted the angle that microwave is incident to crystal model 12 with respect to the rotation of bearing.In an embodiment, aforesaid element can be arranged on the pedestal 18, and can draw angle index on dull and stereotyped 11a or the pedestal 18, observes the anglec of rotation of crystal model 12 or detecting device 14 in order to the operator.
Satisfy equation 2dsin θ=n λ and can produce the diffraction phenomenon, wherein d is the spacing (shown in Fig. 3 a) of the cylinder 121 of crystal model 12, and λ is the wavelength of microwave.Therefore, shorten the size that the wavelength of microwave can dwindle crystal model 12.In an embodiment, the distance that detecting device 14 and crystal model are 12 approximates D
2/ 2 λ, wherein D is the width (shown in Fig. 3 a) of crystal model 12.In an embodiment, the width D scope of crystal model 12 can be 6 λ～10 λ.Therefore, the wavelength that shortens microwave also can dwindle the size of whole diffraction system.For example, the frequency range of microwave used in the present invention can be 30GHz～100GHz.
In order to make the microwave that is incident to crystal model 12 can pass through whole crystal model 12, therefore, should control the microwave energy that crystal model 12 is reflected, that is the amplitude of microwave.In an embodiment, the amplitude of the microwave that crystal model 12 is reflected satisfies following equation:
Wherein N is the quantity of cylinder 121, and D is the width of crystal model 12, and λ is the wavelength of microwave, and f is a scattering coefficient, that is incident wave is when being the plane wave of amplitude 1, and scattering amplitude is Hankel function (Hankelfunctions, H
0 (1)) with the absolute value of coefficient.In an embodiment, the quantitative range of cylinder 121 is 20 to 200.
In an embodiment, the material of the cylinder 121 of crystal model 12 can be dielectric material.So; Even the height H 1 of cylinder 121 equals the distance H 2 between dull and stereotyped 11a, 11b; The cylinder of dielectric material still can not cause the first row lattice plane in the crystal model 12 promptly to reflect away bigger microwave energy, makes the microwave energy that is not reflected can pass through whole crystal model 12.In an embodiment, the spacing range of the cylinder 121 of crystal model 12 can be λ/2 to 3 λ.
In an embodiment, the material of the cylinder 121 of crystal model 12 can be metal material.Because the cylinder of metal material can cause bigger reflection, therefore, passes through whole crystal model 12 in order to make microwave energy, the cylinder height H 1 of metal material should be less than the distance H between dull and stereotyped 11a, 11b 2.According to this structure, the part microwave energy can be detected for detecting device 14 by cylinder 121 reflections of metal material, and the part microwave energy can pass through whole crystal model 12 from the gap between cylinder 121 and dull and stereotyped 11b.The preferably can adjust cylinder height H 1 through pattern analysis, so that the amplitude of the microwave that crystal model 12 is reflected satisfies aforesaid equation.In an embodiment, the spacing range of the cylinder 121 of crystal model 12 can be λ/2 to 3 λ.
Fig. 5 and Fig. 6 show the incident angle θ of microwave
InAnd scattering angle θ
ScGraph of a relation, wherein Fig. 5 (a) is theoretical value, (b) of Fig. 5 is high-frequency structural simulation device (the High FrequencyStructure Simulator that Ansoft makes; HFSS) the analogue value, (c) of Fig. 5 is the cylinder of dielectric material, it is that (N is 76 to 10 * 10 matrixes that remove four corners; Shown in Fig. 3 a); Diameter is 0.4mm, highly is 1.0mm, and spacing is 2.25mm
Microwave frequency is the experiment value of 94GHz (below identical), and (d) of Fig. 5 is the cylinder of metal material, and it is the matrix shown in Fig. 3 a, and diameter is 0.4mm, highly is 0.2mm, and spacing is the experiment value of 2.25mm; (a) of Fig. 6 is theoretical value, and (b) of Fig. 6 is the cylinder of metal material, and it is 5 * 5 matrix, and diameter is 0.6mm, highly is 0.3mm, and spacing is the experiment value of 4.15mm (1.3 λ).Result by Fig. 5 and Fig. 6 can know that experiment value and theoretical value that foundation microwave diffraction of the present invention system is obtained are very close, almost do not depart from.
Comprehensively above-mentioned, microwave diffraction of the present invention system is limited in microwave energy in the slab guide, and the diffraction phenomenon can be appeared with the mode of two dimension.And through the crystal model (cylinder of dielectric material or short metal cylinder) of suitably design, diffraction pattern and theoretical value that microwave diffraction of the present invention system is appeared are close.In addition, microwave diffraction of the present invention system uses the microwave of shorter wavelength, and therefore, the size of whole diffraction system can significantly be dwindled about 30cm * 30cm.
Above-described embodiment only is for technological thought of the present invention and characteristics are described; Its purpose makes the personage who is familiar with this technology can understand content of the present invention and is implementing according to this; When not limiting claim of the present invention with it; Be that every equalization of doing according to disclosed spirit changes or modification, must be encompassed in the claim of the present invention.
Claims (19)
1. a microwave diffraction system is characterized in that, comprises:
Two flat boards, it has electric conductivity, relatively and laterally arrange, to constitute a slab guide;
One crystal model, it comprises a plurality of regularly arranged cylinders, and this cylinder is arranged between these two flat boards;
One transmitter, it is arranged at the outer rim of this slab guide, in order to towards this crystal model one microwave to be provided; And
One detecting device, it is arranged at the outer rim of this slab guide, in order to detect this microwave that this crystal model reflects.
2. microwave diffraction according to claim 1 system is characterized in that the direction of an electric field of this microwave is perpendicular to this flat board.
3. microwave diffraction according to claim 1 system is characterized in that this microwave is a TEM mode wave.
4. microwave diffraction according to claim 1 system is characterized in that the radius of this cylinder is smaller or equal to λ/2 π, and wherein λ is the wavelength of this microwave.
5. microwave diffraction according to claim 1 system is characterized in that, the spacing range of this cylinder be λ/2 to 3 λ, wherein λ is the wavelength of this microwave.
6. microwave diffraction according to claim 1 system is characterized in that the amplitude of this microwave that this crystal model reflected satisfies following equation:
Wherein, N is the quantity of this cylinder, and D is the width of this crystal model, and λ is the wavelength of this microwave, and f is a scattering coefficient.
7. microwave diffraction according to claim 1 system is characterized in that the quantitative range of this cylinder is 20 to 200.
8. microwave diffraction according to claim 1 system is characterized in that the width range of this crystal model is 6 λ to 10 λ, and wherein λ is the wavelength of this microwave.
9. microwave diffraction according to claim 1 system is characterized in that this cylinder is a dielectric material.
10. microwave diffraction according to claim 1 system is characterized in that this cylinder is a metal material.
11. microwave diffraction according to claim 10 system is characterized in that the height of this cylinder is less than the distance between these two flat boards.
12. microwave diffraction according to claim 1 system is characterized in that the distance between this detecting device and this crystal model equals D
2/ 2 λ, wherein D is the width of this crystal model, λ is the wavelength of this microwave.
13. microwave diffraction according to claim 1 system; It is characterized in that; This transmitter comprises one first mode converter, and it is arranged between these two flat boards and the one of which end is connected with this transmitter, and the link internal diameter of this first mode converter is less than its open end internal diameter.
14. microwave diffraction according to claim 1 system; It is characterized in that; This detecting device comprises one second mode converter, and it is arranged between these two flat boards and the one of which end is connected with this detecting device, and the link internal diameter of this second mode converter is less than its open end internal diameter.
15. microwave diffraction according to claim 1 system is characterized in that, also comprises:
One rotary seat, it is connected with this detecting device, and making this detecting device is the central shaft rotation with this crystal model.
16. microwave diffraction according to claim 1 system is characterized in that, also comprises:
One bearing, it is in order to carrying this crystal model, and at least one this flat board has a perforate, and this cylinder of this crystal model is stretched on this slab guide through this perforate.
17. microwave diffraction according to claim 16 system is characterized in that this transmitter is connected with this flat board with this perforate, and this bearing can be with respect to this flat board rotation with this perforate.
18. microwave diffraction according to claim 1 system is characterized in that the frequency of this microwave is 30GHz～100GHz.
19. microwave diffraction according to claim 1 system is characterized in that the frequency of this microwave is 94GHz.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010105444706A CN102467845B (en) | 2010-11-04 | 2010-11-04 | Microwave diffraction system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010105444706A CN102467845B (en) | 2010-11-04 | 2010-11-04 | Microwave diffraction system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102467845A true CN102467845A (en) | 2012-05-23 |
| CN102467845B CN102467845B (en) | 2013-12-04 |
Family
ID=46071436
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010105444706A Expired - Fee Related CN102467845B (en) | 2010-11-04 | 2010-11-04 | Microwave diffraction system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102467845B (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3133246A (en) * | 1962-01-16 | 1964-05-12 | Polarad Electronics Corp | Microwave frequency x-ray diffraction simulator |
| CN1542400A (en) * | 2003-11-07 | 2004-11-03 | 中国科学院上海光学精密机械研究所 | X-ray double frequency holographic interferometer |
| WO2006124962A2 (en) * | 2005-05-16 | 2006-11-23 | Northeastern University | Photonic crystal devices using negative refraction |
| CN101403714A (en) * | 2008-11-14 | 2009-04-08 | 清华大学 | Ultrafast electron diffraction system based on X waveband photocathode microwave electronic gun |
| CN101750424A (en) * | 2008-12-15 | 2010-06-23 | 中国科学院上海技术物理研究所 | Portable low-radiation hollow glass heat transmission coefficient discriminator |
-
2010
- 2010-11-04 CN CN2010105444706A patent/CN102467845B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3133246A (en) * | 1962-01-16 | 1964-05-12 | Polarad Electronics Corp | Microwave frequency x-ray diffraction simulator |
| CN1542400A (en) * | 2003-11-07 | 2004-11-03 | 中国科学院上海光学精密机械研究所 | X-ray double frequency holographic interferometer |
| WO2006124962A2 (en) * | 2005-05-16 | 2006-11-23 | Northeastern University | Photonic crystal devices using negative refraction |
| CN101403714A (en) * | 2008-11-14 | 2009-04-08 | 清华大学 | Ultrafast electron diffraction system based on X waveband photocathode microwave electronic gun |
| CN101750424A (en) * | 2008-12-15 | 2010-06-23 | 中国科学院上海技术物理研究所 | Portable low-radiation hollow glass heat transmission coefficient discriminator |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102467845B (en) | 2013-12-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US11437729B2 (en) | Terahertz leaky-wave antenna measuring system | |
| DE102012016120B4 (en) | Microwave windows and radar-based level measurement system | |
| Liu et al. | Study on miniaturized UHF antennas for partial discharge detection in high-voltage electrical equipment | |
| US20070069940A1 (en) | Method and arrangement for reducing the radar cross section of integrated antennas | |
| US7782262B2 (en) | Device for controlling the specific absorption rate of mass-produced radiant objects | |
| EP3264073B1 (en) | Measuring device | |
| CN106848555B (en) | Random irradiation aperture antenna for compressed sensing radar and application thereof | |
| US20130176047A1 (en) | Test device for wireless electronic devices | |
| CN105609965A (en) | Antenna for producing Bessel wave beam | |
| CN105492937B (en) | Wiregrating device | |
| US20150219704A1 (en) | Electromagnetic Wave Visualization Device | |
| US5585808A (en) | Test apparatus for testing the susceptibility of electronic equipment to electromagnetic radiation and for measuring electromagnetic radiation emitted by electronic equipment | |
| CN102467845B (en) | Microwave diffraction system | |
| CN107942276A (en) | A kind of waveguide calibrating device and method for calibration vector Network Analyzer | |
| Yang et al. | Performance comparison with different antenna properties in time reversal ultra-wideband communications for sensor system applications | |
| Liu et al. | Design and test of a 0.3 THz compact antenna test range | |
| Yuan et al. | Modal analysis of metal-stub photonic band gap structures in a parallel-plate waveguide | |
| EP2442096B1 (en) | Determination of electromagnetic properties of samples | |
| CN103955008A (en) | Amplitude calibrating method used for multi-probe near-field scattering imaging | |
| TWI420099B (en) | Microwave diffraction system | |
| Thiele et al. | Electro-optical-sensor for near-field measurements of large antennas | |
| CN205691646U (en) | A kind of picosecond high voltage pulse measurement device | |
| CN113609669B (en) | Sea echo simulation method for broadband radar | |
| CN102290637A (en) | Double-frequency absorber based on metamaterial theory | |
| Koser et al. | Initial measurements on a new 108 MHz 4-rod CW RFQ prototype for the HLI at GSI |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20131204 Termination date: 20191104 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |