CN102455525A - Method and device for detecting thin film transistor liquid crystal display panel - Google Patents
Method and device for detecting thin film transistor liquid crystal display panel Download PDFInfo
- Publication number
- CN102455525A CN102455525A CN2010105178680A CN201010517868A CN102455525A CN 102455525 A CN102455525 A CN 102455525A CN 2010105178680 A CN2010105178680 A CN 2010105178680A CN 201010517868 A CN201010517868 A CN 201010517868A CN 102455525 A CN102455525 A CN 102455525A
- Authority
- CN
- China
- Prior art keywords
- pixel
- liquid crystal
- crystal display
- film transistor
- thin film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Liquid Crystal (AREA)
- Liquid Crystal Display Device Control (AREA)
Abstract
The invention provides a method and device for detecting a thin film transistor liquid crystal display panel, belonging to the technical field of liquid crystal display and being capable of solving the problems of difficulty in determining adverse types and low location speed of the adverse types of the traditional method for detecting the thin film transistor liquid crystal display panel. The method for detecting the thin film transistor liquid crystal display panel, provided by the invention, comprising the steps of: providing a first constant voltage for a pixel electrode of at least one subpixel of the thin film transistor liquid crystal display panel; and detecting a display state of the subpixel under the condition that the pixel electrode keeps the first constant voltage. The device for detecting the thin film transistor liquid crystal display panel, provided by the invention comprises a display control unit, wherein display control unit is used for providing the first constant voltage for the pixel electrode of the at least one subpixel of the thin film transistor liquid crystal display panel and at least maintaining for first time, and the first time is minimum time required for detecting the display state of the subpixel. The invention can be used for detecting the thin film transistor liquid crystal display panel.
Description
Technical field
The present invention relates to technical field of liquid crystal display, relate in particular to liquid crystal display panel of thin film transistor detection method and equipment.
Background technology
In the manufacture process of liquid crystal display panel of thin film transistor (TFT LCD), can produce inevitably that some are bad, these are bad, and can be divided into optics on the reason bad bad with electricity from producing.The bad finger of optics by the optics problem cause bad, bad like polaroid, orientation is bad etc.; And the bad finger of electricity is bad because circuit (like thin-film transistor circuit) problem causes, comprises that electric capacity is bad, raceway groove is bad etc.In order to guarantee the quality of liquid crystal display panel of thin film transistor, need detect it, as becoming the one-tenth box that carries out behind the box to detect and in the terminal detection of finally carrying out etc.In becoming box detection and terminal detection; Liquid crystal display panel of thin film transistor shows (is because some is bad obvious especially under specific gray scale with predetermined gray scale) under predetermined gray scale; Judge whether to have bad and bad kind through observing its show state, so that operation such as keep in repair.
In order to prevent that liquid crystal is aging and avoid direct current residual under the electric field of single direction, thus in existing testing process, take all normally show with liquid crystal display panel of thin film transistor the time the same " reversal of poles drives (or title alternating-current measurement) ".Reversal of poles is to instigate the direction that is added in the voltage on each sub-pixel with certain frequency reverse (this frequency equals to brush the screen rate usually, and promptly every two field picture voltage direction counter-rotating once).Because the voltage of public electrode remains unchanged; Therefore to realize that reversal of poles just need provide switched voltage to the pixel electrode of each sub-pixel; This switched voltage constantly switches with said frequencies between first switched voltage and second switched voltage, thereby on each sub-pixel, applies the voltage of direction counter-rotating; For example; When continuing display gray scale L 0; If public electrode voltages is 5V; Then tackle data line the switched voltage (being the reversal of poles voltage signal) of 0V and 10V alternately be provided, the voltage on the pixel electrode is also constantly switched between 0V and 10V, thus be applied on the sub-pixel voltage 5V and-switch (being reversal of poles) between 5V.Obviously, the many electrical properties performances of thin film transistor array circuit under constant voltage and time variant voltage state different, a lot of electricity are bad only to be applied on pixel electrode that (when being alternating-current measurement) just can show under the situation of switched voltage.
The inventor finds to exist at least in the prior art following problem: though existing liquid crystal display panel of thin film transistor detection method can be bad with electricity is bad all detects with whole optics; But can not distinguish it is that optics is bad or electricity is bad on earth; And because many optics are bad very approaching with the bad phenomenon that shows of electricity; Therefore must confirm that it specifically is which kind of is bad with electricity bad from a variety of possible optics are bad; Thereby cause bad kind to confirm difficulty, the location is slow.
Summary of the invention
Embodiments of the invention provide a kind of liquid crystal display panel of thin film transistor detection method, and it is easy to confirm bad kind, can locatees bad rapidly.
For achieving the above object, embodiments of the invention adopt following technical scheme:
A kind of liquid crystal display panel of thin film transistor detection method comprises:
For the pixel electrode of at least one sub-pixel of liquid crystal display panel of thin film transistor provides first constant voltage;
The show state that keeps the said sub-pixel of test under the situation of said first constant voltage at said pixel electrode.
Because in the liquid crystal display panel of thin film transistor detection method of embodiments of the invention; Be included in the step of measuring show state under the constant situation of pixel electrode voltage; Can not show and most in the case electricity is bad; So the time occur bad bigger maybe be bad for optics, that does not show this moment is bad bad for optics certainly; Therefore it is easy to confirm bad kind, can locate bad rapidly.
Embodiments of the invention also provide a kind of liquid crystal display panel of thin film transistor checkout equipment, and it is easy to confirm bad kind, can locatees bad rapidly.
For achieving the above object, embodiments of the invention adopt following technical scheme:
A kind of liquid crystal display panel of thin film transistor checkout equipment comprises:
Indicative control unit, the pixel electrode that is used at least one sub-pixel of liquid crystal display panel of thin film transistor provides first constant voltage also to keep the very first time at least, and the said very first time is the required minimum time of show state of the said sub-pixel of test.
Wherein, the said very first time is meant is enough to make the show state of said sub-pixel to stabilize to the state under the DC test, and is enough to accomplish the time required to the test of this show state.
Because the liquid crystal display panel of thin film transistor checkout equipment of embodiments of the invention has indicative control unit, this indicative control unit can provide constant voltage to pixel electrode, so available said method detects; Therefore it is easy to confirm bad kind, can locate bad rapidly.
Description of drawings
In order to be illustrated more clearly in the embodiment of the invention or technical scheme of the prior art; To do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art below; Obviously, the accompanying drawing in describing below only is some embodiments of the present invention, for those of ordinary skills; Under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the process flow diagram of the liquid crystal display panel of thin film transistor detection method of the embodiment of the invention one;
Fig. 2 is the structural representation of the liquid crystal display panel of thin film transistor checkout equipment of the embodiment of the invention three;
Fig. 3 is the structural representation of the liquid crystal display panel of thin film transistor checkout equipment of the embodiment of the invention four;
Wherein Reference numeral is: 1, liquid crystal display panel of thin film transistor checkout equipment; 2, link; 3, indicative control unit; 4, pixel electrode control module; 5, switch unit; 6, public electrode control module.
Embodiment
To combine the accompanying drawing in the embodiment of the invention below, the technical scheme of the embodiment of the invention is carried out clear, intactly description, obviously, described embodiment only is a part of embodiment of the present invention, rather than whole embodiment.Based on the embodiment among the present invention, all other embodiment that those of ordinary skills are obtained under the prerequisite of not making creative work belong to the scope that the present invention protects.
The embodiment of the invention aims to provide a kind of liquid crystal display panel of thin film transistor detection method, comprising:
For the pixel electrode of at least one sub-pixel of liquid crystal display panel of thin film transistor provides first constant voltage;
The show state that keeps the said sub-pixel of test under the situation of said first constant voltage at said pixel electrode.
Because in the liquid crystal display panel of thin film transistor detection method of embodiments of the invention; Be included in the step of measuring show state under the constant situation of pixel electrode voltage; Can not show and most in the case electricity is bad; So the time occur bad bigger maybe be bad for optics, that does not show this moment is bad bad for optics certainly; Therefore it is easy to confirm bad kind, can locate bad rapidly.
Embodiment one
The embodiment of the invention provides a kind of liquid crystal display panel of thin film transistor detection method, and this detection can be into the box detection or the terminal is detected.As shown in Figure 1, method comprises:
S11, liquid crystal display panel of thin film transistor is shown under predetermined gray scale (is example with the L0 gray scale) with the alternating-current measurement mode.It specifically is preferably: the constant voltage that 5V is provided to the public electrode of liquid crystal display panel of thin film transistor; (cut-in voltage of sweep signal is at 27V to send sweep signal to the gate line of each sub-pixel of liquid crystal display panel of thin film transistor; Close voltage-8V); And be emitted in the switched voltage that switches between 0V and 10V, thereby be created in the switched voltage that switches between 0V (i.e. first switched voltage) and 10V (i.e. second switched voltage) on the pixel electrode of each sub-pixel to each data line; The alternating voltage that then can be created on each sub-pixel-switch between 5V and 5V (promptly have first absolute value but direction with the continuous reversal of poles voltage of counter-rotating of first frequency).Obviously; The switching frequency of this switched voltage (being first frequency) should be not low excessively (frequency as switching once in 1 minute is obviously just low excessively); It should be able to produce enough interchange effects at least; This frequency is preferably conventional brush screen rate such as 60Hz, 65Hz, 70Hz, 75Hz, 80Hz, 85Hz usually at 30～120Hz.
The show state of S12, testing film transistor liquid crystal display (TFT-LCD) panel; If do not exist demonstration bad, then get into step S15, if exist demonstration bad, then continue next step.
S13, make liquid crystal display panel of thin film transistor show the L0 gray scale with the DC test mode.It is specially: cut off the signal that sends to gate line and/or data line, thereby stop data line to pixel electrode voltage to be provided, make the constant voltage (i.e. first constant voltage) that produces 0V on each pixel electrode; Though as long as of cutting off in gate line and the data line can achieve the above object,, preferably the two is cut off together theoretically in order to reduce the interference of gate line and the voltage of data line own.Simultaneously to public electrode apply 5V (or-5V) constant voltage (i.e. the 3rd constant voltage), thereby to each sub-pixel apply 5V (or-5V) DC voltage (i.e. the 4th constant voltage); Obviously, for the display gray scale that makes display panels remains unchanged, the absolute value of this DC voltage should equate by the absolute value (first absolute value) of the alternating voltage on the sub-pixel when under same grayscale, carrying out alternating-current measurement.
The show state of S14, testing film transistor liquid crystal display (TFT-LCD) panel is to judge bad kind; If observedly in step S12 badly in this step, disappear or change, it is bad to judge that then it belongs to electricity, otherwise it is bigger to assert that then it belongs to the bad possibility of optics.So judge because optics bad be to cause by optical device, irrelevant with electrical property, so no matter under DC test or alternating-current measurement, all can exist; Only under alternating-current measurement, just can show and many electricity are bad.For example; If the opening resistor of thin film transistor (TFT) is excessive or raceway groove to occur bad; Cause its channel current to reduce, then the charging of its corresponding pixel electrode is just slow, and it is also slow that the voltage of pixel electrode changes speed; Voltage because of data line when alternating-current measurement switches rapidly; So the change in voltage speed of pixel electrode does not catch up with the speed of switched voltage, make pixel electrode voltage in fact between the maximal value of switched voltage and minimum value the fluctuation formula change, thereby cause the absolute value of the voltage on the sub-pixel to diminish and cause bad; And under DC test, though speed is slow slightly, but the voltage of pixel electrode also reaches predetermined value within a short period of time, so bad disappearance.For another example, if the MM CAP of sub-pixel is unusual, under alternating-current measurement, the voltage when grid is closed on the pixel electrode is also unusual, also changes and causes bad thereby be added in voltage on the sub-pixel; And in above-mentioned DC test, the pixel electrode of sub-pixel is not charged, and the voltage of sub-pixel is only by the public electrode voltages decision, so bad disappearance.
S15, select another predetermined gray scale by the method for above-mentioned S11 to S14 proceed the test; As to gray scale L63, the voltage of public electrode is 5V during alternating-current measurement, and data line voltage switches between 3V and 7V; And the voltage of pixel electrode is the constant voltage (first constant voltage) of 0V during DC test, the voltage of public electrode become 2V or-2V.Under each predetermined gray scale, test successively as stated above, till predetermined gray scale all tests with all.
Because it is bad bad with electricity that the liquid crystal display panel of thin film transistor detection method of the embodiment of the invention can be distinguished optics; So it is just less in the possible bad kind of confirming the bad kind of required consideration of time-like; Can quicker, easierly confirm bad kind; Confirm the required workload of bad kind thereby reduce, and the work such as reparation after being are provided convenience.
Embodiment two
The embodiment of the invention provides a kind of liquid crystal display panel of thin film transistor detection method, and the detection method of itself and embodiment one is similar.Difference is; When carrying out DC test, the liquid crystal display panel of thin film transistor detection method of present embodiment is not cut off the signal of gate line and data line, but to gate line input cut-in voltage; And to the constant voltage (i.e. second constant voltage) of data line input; Thereby on pixel electrode, produce constant voltage (i.e. first constant voltage, this moment, it equaled second constant voltage), import constant voltage (i.e. the 3rd constant voltage) to public electrode simultaneously; On sub-pixel, will produce constant DC like this and press (i.e. the 4th constant voltage).For example, to above-mentioned L63 gray scale, when carrying out DC test, if public electrode on voltage be 5V, then the voltage on the data line should be 3V (or 7V), so the voltage on the pixel electrode also is 3V (or 7V), thereby the voltage on the sub-pixel be 2V (or-2V); And if the voltage on the public electrode is made as 0V, then should the voltage on the data line be set at 2V (or-2V), so the voltage on the pixel electrode also be 2V (or-2V), thereby the voltage on the sub-pixel is-2V (or 2V).The absolute value (first absolute value) of the alternating voltage on the sub-pixel in the time of in a word, should making the alternating-current measurement that the absolute value of the DC voltage on the sub-pixel equals under same grayscale, to carry out through the voltage on adjustment data line and the public electrode.
The cut-in voltage that wherein provides on the gate line can be conventional scanning voltage and (promptly to each gate line cut-in voltage is provided in turn; To the single gate line is that the cut-in voltage that is interrupted is provided), also can be lasting cut-in voltage signal (promptly to each gate line cut-in voltage being provided constantly).Because in the detection method of present embodiment (when especially using scanning voltage on the gate line); Thin film transistor (TFT) array is still charged during DC test; Therefore the electricity that has part in embodiment one, can disappear bad (as data line open circuit fully bad) in the present embodiment maybe not can disappear; Part electricity is bad can to disappear but still have, so it does not influence realization of the present invention.
Obviously, the liquid crystal display panel of thin film transistor detection method of above-mentioned each embodiment can be carried out many variations.For example: be applied to voltage on the sub-pixel can gradually change by identical mode (gray scale of whole liquid crystal display panel can gradually change) during with alternating-current measurement in DC test; Can apply constant voltage (promptly only the parton pixel being detected) by a pixel electrode to the parton pixel on the display panels; Pixel electrode to each sub-pixel can apply different constant voltage (gray scale that is the display panels different piece can be different); The test show state can carry out through operating personnel's observation, also can show state be taken the back and with software image analyzed; The switching of DC test and alternating-current measurement can be carried out also can carrying out automatically according to the setting of program through people's operation; The order of DC test and alternating-current measurement can change, and as carrying out DC test earlier, carries out alternating-current measurement afterwards, and through observing whether the emerging bad bad type of confirming is arranged in the alternating-current measurement; Can only carry out DC test (promptly a detection optical is bad); The order of testing under the different gray scales can change; As under all predetermined gray scale, carrying out alternating-current measurement one by one and writing down the bad of each gray scale correspondence; Under all predetermined gray scale, carry out DC test one by one again, and compare to confirm bad kind with corresponding alternating-current measurement result one by one.
The embodiment of the invention provides a kind of liquid crystal display panel of thin film transistor checkout equipment, comprising:
Indicative control unit, the pixel electrode that is used at least one sub-pixel of liquid crystal display panel of thin film transistor provides first constant voltage also to keep the very first time at least, and the said very first time is the required minimum time of show state of the said sub-pixel of test.
Specifically, the said very first time is meant is enough to make the show state of said sub-pixel to stabilize to the state under the DC test, and is enough to accomplish the time required to the test of this show state.
Because the liquid crystal display panel of thin film transistor checkout equipment of embodiments of the invention has indicative control unit, this indicative control unit can provide constant voltage to pixel electrode, so its available said method detects; Therefore it is easy to confirm bad kind, can locate bad rapidly.
Embodiment three
The embodiment of the invention provides a kind of liquid crystal display panel of thin film transistor checkout equipment 1, and it is used for the method for embodiment one liquid crystal display panel of thin film transistor being carried out to the box detection.
The liquid crystal display panel of thin film transistor checkout equipment 1 of present embodiment comprises indicative control unit 3, and it is used for sending display control signal to liquid crystal display panel of thin film transistor; Preferably, this indicative control unit 3 comprises:
Pixel electrode control module 4; Being used for gate line to each sub-pixel of liquid crystal display panel of thin film transistor sends the cut-in voltage signal and (can be the transmission of scan-type; Also can be simultaneously and send to each gate line constantly); And send switched voltage signal (being the reversal of poles voltage signal), thereby on each pixel electrode, produce switched voltage to each data line; This switched voltage constantly switches between first switched voltage and second switched voltage with first frequency, this first frequency its usually at 30～120Hz, be preferably conventional brush screen rate such as 60Hz, 65Hz, 70Hz, 75Hz, 80Hz, 85Hz.
Public electrode control module 6 is used to control the voltage on the public electrode.When alternating-current measurement, the voltage of public electrode should equal the average of this first switched voltage and second switched voltage so that the voltage on the sub-pixel to be absolute value constant but the continuous reversal of poles voltage of counter-rotating of direction; And when DC test; The difference of the public electrode voltages the when voltage of public electrode should equal first switched voltage or second switched voltage and DC test is so that the absolute value of the absolute value of the DC voltage on sub-pixel reversal of poles voltage on the sub-pixel when equaling alternating-current measurement.
As shown in Figure 2; Liquid crystal display panel of thin film transistor checkout equipment 1 preferably also can comprise link 2 etc.; Gate line, data line, public electrode lead-in wire that link 2 is used for stretching out with the liquid crystal display panel of thin film transistor edge link to each other, and this link 2 can be the connection termination of chip for driving.
Embodiment four
The embodiment of the invention provides a kind of liquid crystal display panel of thin film transistor checkout equipment 1, and it is used for the method for embodiment two liquid crystal display panel of thin film transistor being carried out the terminal and detects.
As shown in Figure 3; Liquid crystal display panel of thin film transistor checkout equipment 1 preferably also can comprise link 2; Because this moment, liquid crystal display panel of thin film transistor was assembled completion, this link 2 can be the video-frequency connector that directly links to each other with liquid crystal display panel of thin film transistor.
Liquid crystal display panel of thin film transistor checkout equipment 1 also comprises indicative control unit 3, and it is used for sending display control signal to liquid crystal display panel of thin film transistor, and preferably, this indicative control unit 3 comprises:
Pixel electrode control module 4 is used for first control mode or second control mode control pixel electrode.Under first control mode; Pixel electrode control module 4 sends the cut-in voltage signal to each gate line and (can be the transmission of scan-type; Also can be simultaneously and send to each gate line constantly), and send switched voltage signal (being the reversal of poles voltage signal) to data line, thus on each pixel electrode, produce switched voltage; And on each sub-pixel polarization reversal voltage (promptly have first absolute value but direction with the continuous voltage of counter-rotating of first frequency); To carry out above-mentioned alternating-current measurement, this first frequency is preferably conventional brush screen rate such as 60Hz, 65Hz, 70Hz, 75Hz, 80Hz, 85Hz usually at 30～120Hz.And under second control mode; Pixel electrode control module 4 sends the cut-in voltage signal to each gate line and (can be the transmission of scan-type; Also can be simultaneously and send to each gate line constantly); And send constant voltage signal (i.e. second constant voltage), thereby constant voltage (i.e. first constant voltage) is provided for each pixel electrode to each data line.
Switch unit 5 is used to make pixel electrode control module 4 between first control mode and second control mode, to switch.
Obviously; In above-mentioned each liquid crystal display panel of thin film transistor checkout equipment 1; When switching with switch unit 5, should let DC test and alternating-current measurement stage all continue the regular hour at least, this time should be enough to make the show state of liquid crystal display panel of thin film transistor to change and be enough to accomplish the test to show state.
Obviously, the liquid crystal display panel of thin film transistor checkout equipment of above-mentioned each embodiment can carry out many variations.For example, it also can comprise input block, is used for changing each parameter that test is used according to operator's order.
The above; Be merely embodiment of the present invention, but protection scope of the present invention is not limited thereto, any technician who is familiar with the present technique field is in the technical scope that the present invention discloses; The variation that can expect easily or replacement all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of said claim.
Claims (13)
1. a liquid crystal display panel of thin film transistor detection method is characterized in that, comprising:
For the pixel electrode of at least one sub-pixel of liquid crystal display panel of thin film transistor provides first constant voltage;
The show state that keeps the said sub-pixel of test under the situation of said first constant voltage at said pixel electrode.
2. liquid crystal display panel of thin film transistor detection method according to claim 1 is characterized in that, the pixel electrode of said at least one sub-pixel for liquid crystal display panel of thin film transistor provides first constant voltage to be specially:
Cut off gate line and/or the signal of data line of at least one sub-pixel of liquid crystal display panel of thin film transistor, thereby first constant voltage is provided for the pixel electrode of said sub-pixel.
3. liquid crystal display panel of thin film transistor detection method according to claim 1 is characterized in that, the pixel electrode of said at least one sub-pixel for liquid crystal display panel of thin film transistor provides first constant voltage to be specially:
For the data line of at least one sub-pixel of liquid crystal display panel of thin film transistor provides second constant voltage, and for the gate line of said sub-pixel provides cut-in voltage, thereby first constant voltage is provided for the pixel electrode of said sub-pixel.
4. liquid crystal display panel of thin film transistor detection method according to claim 3 is characterized in that, saidly is specially for the gate line of said sub-pixel provides cut-in voltage:
For the gate line of said sub-pixel provides lasting cut-in voltage or the cut-in voltage that is interrupted.
5. according to any described liquid crystal display panel of thin film transistor detection method in the claim 1 to 4; It is characterized in that; Before the pixel electrode of said at least one sub-pixel for liquid crystal display panel of thin film transistor provides first constant voltage, also comprise:
For the pixel electrode of the said sub-pixel of liquid crystal display panel of thin film transistor provides switched voltage; Said switched voltage constantly switches between first switched voltage and second switched voltage with first frequency, thus for said sub-pixel provide have first absolute value but direction with the continuous reversal of poles voltage of counter-rotating of first frequency;
The show state that keeps the said sub-pixel of test under the said reversal of poles voltage condition at said sub-pixel.
6. liquid crystal display panel of thin film transistor detection method according to claim 5 is characterized in that, said first frequency is between 30 hertz to 120 hertz.
7. liquid crystal display panel of thin film transistor detection method according to claim 5 is characterized in that, when the pixel electrode of said at least one sub-pixel for liquid crystal display panel of thin film transistor provides first constant voltage, also comprises:
For the public electrode of said liquid crystal display panel of thin film transistor provides the 3rd constant voltage, thereby the 4th constant voltage is provided for said sub-pixel; And the absolute value of said the 4th constant voltage equals said first absolute value.
8. according to any described liquid crystal display panel of thin film transistor detection method in the claim 1 to 4; It is characterized in that; When the pixel electrode of said at least one sub-pixel for liquid crystal display panel of thin film transistor provides first constant voltage, also comprise:
For the public electrode of said liquid crystal display panel of thin film transistor provides the 3rd constant voltage, thereby the 4th constant voltage is provided for said sub-pixel.
9. according to any described liquid crystal display panel of thin film transistor detection method in the claim 1 to 4, it is characterized in that,
The pixel electrode of said at least one sub-pixel for liquid crystal display panel of thin film transistor provides first constant voltage to be specially: for the pixel electrode of whole sub-pixels of liquid crystal display panel of thin film transistor provides first constant voltage;
The show state of the said sub-pixel of test is specially under the said situation that keeps said first constant voltage at said pixel electrode: the show state of all keeping the said liquid crystal display panel of thin film transistor of test under the situation of said first constant voltage at whole said pixel electrodes.
10. a liquid crystal display panel of thin film transistor checkout equipment is characterized in that, comprising:
Indicative control unit, the pixel electrode that is used at least one sub-pixel of liquid crystal display panel of thin film transistor provides first constant voltage also to keep the very first time at least, and the said very first time is the required minimum time of show state of the said sub-pixel of test.
11. liquid crystal display panel of thin film transistor checkout equipment according to claim 10 is characterized in that, said indicative control unit comprises:
The pixel electrode control module is used for sending the cut-in voltage signal to the gate line of said sub-pixel, and sends the switched voltage signal to the data line of said sub-pixel, and said switched voltage constantly switches between first switched voltage and second switched voltage with first frequency;
Switch unit is used to cut off or signal that conducting is sent to said gate line and/or data line, thereby said first constant voltage is provided for the pixel electrode of said sub-pixel;
The public electrode control module is used to control the voltage on the public electrode.
12. liquid crystal display panel of thin film transistor checkout equipment according to claim 10 is characterized in that, said indicative control unit comprises:
The pixel electrode control module is used for controlling with first control mode or second control mode pixel electrode of said sub-pixel; Under said first control mode; Said pixel electrode control module sends the cut-in voltage signal to the gate line of said sub-pixel; And send the switched voltage signal to the data line of said sub-pixel; Said switched voltage constantly switches between first switched voltage and second switched voltage with first frequency, thus for said sub-pixel provide have first absolute value but direction with the continuous reversal of poles voltage of counter-rotating of first frequency; Under said second control mode, said pixel electrode control module sends the cut-in voltage signal to the gate line of said sub-pixel, and sends the second constant voltage signal to the data line of said sub-pixel, thereby for said pixel electrode first constant voltage is provided;
Switch unit is used to make said pixel electrode control module between first control mode and second control mode, to switch.
13., it is characterized in that said first frequency is between 30 hertz to 120 hertz according to claim 11 or 12 described liquid crystal display panel of thin film transistor checkout equipments.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010105178680A CN102455525A (en) | 2010-10-18 | 2010-10-18 | Method and device for detecting thin film transistor liquid crystal display panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010105178680A CN102455525A (en) | 2010-10-18 | 2010-10-18 | Method and device for detecting thin film transistor liquid crystal display panel |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102455525A true CN102455525A (en) | 2012-05-16 |
Family
ID=46038894
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010105178680A Pending CN102455525A (en) | 2010-10-18 | 2010-10-18 | Method and device for detecting thin film transistor liquid crystal display panel |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102455525A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103309065A (en) * | 2013-06-06 | 2013-09-18 | 深圳市华星光电技术有限公司 | Test circuit of display panel and test method thereof |
| CN106293186A (en) * | 2015-06-08 | 2017-01-04 | 群创光电股份有限公司 | Touch-control display panel and method of testing thereof |
| CN109032409A (en) * | 2018-07-26 | 2018-12-18 | 京东方科技集团股份有限公司 | A kind of driving method of display panel, display panel and display device |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1949326A (en) * | 2005-10-12 | 2007-04-18 | 三星电子株式会社 | Display device and testing method for display device |
| JP2007316112A (en) * | 2006-05-23 | 2007-12-06 | Sharp Corp | Inspection method of display panel |
| CN101719352A (en) * | 2008-10-09 | 2010-06-02 | 北京京东方光电科技有限公司 | Switch control unit, device and method for detecting after forming liquid crystal box |
-
2010
- 2010-10-18 CN CN2010105178680A patent/CN102455525A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1949326A (en) * | 2005-10-12 | 2007-04-18 | 三星电子株式会社 | Display device and testing method for display device |
| JP2007316112A (en) * | 2006-05-23 | 2007-12-06 | Sharp Corp | Inspection method of display panel |
| CN101719352A (en) * | 2008-10-09 | 2010-06-02 | 北京京东方光电科技有限公司 | Switch control unit, device and method for detecting after forming liquid crystal box |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103309065A (en) * | 2013-06-06 | 2013-09-18 | 深圳市华星光电技术有限公司 | Test circuit of display panel and test method thereof |
| CN103309065B (en) * | 2013-06-06 | 2015-11-25 | 深圳市华星光电技术有限公司 | The measurement circuit of display panel and method of testing thereof |
| CN106293186A (en) * | 2015-06-08 | 2017-01-04 | 群创光电股份有限公司 | Touch-control display panel and method of testing thereof |
| CN109032409A (en) * | 2018-07-26 | 2018-12-18 | 京东方科技集团股份有限公司 | A kind of driving method of display panel, display panel and display device |
| CN109032409B (en) * | 2018-07-26 | 2021-11-02 | 京东方科技集团股份有限公司 | Display panel driving method, display panel and display device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8525540B2 (en) | Switch control unit, test apparatus and method for liquid crystal cell | |
| CN101369075B (en) | Liquid crystal display device and driving method thereof | |
| US10325535B2 (en) | Circuit for testing display panel, method for testing display panel, and display panel | |
| CN102749775A (en) | Array substrate, display device and method for driving array substrate | |
| CN101308271A (en) | Liquid crystal panel, LCD display device and its drive method | |
| KR102009892B1 (en) | Liquid Crystal Display Device | |
| CN105551413A (en) | Display module and detection method for display defect of display module | |
| GB2537955A (en) | Display device capable of low-speed driving and method of driving the same | |
| CN101908302A (en) | Liquid crystal indicator, control method and electronic equipment | |
| WO2020062336A1 (en) | Goa detection circuit and test method therefor | |
| JP2014228561A (en) | Liquid crystal display device, control method of liquid crystal display device, control program of liquid crystal display device, and recording medium for the same | |
| CN100573247C (en) | The driving circuit of vertical alignment liquid crystal display device and driving method | |
| CN105372890A (en) | Pixel structure and liquid crystal display panel | |
| CN101576692B (en) | Liquid crystal display device and driving method thereof | |
| CN102455525A (en) | Method and device for detecting thin film transistor liquid crystal display panel | |
| CN104505039A (en) | Method and module for reversing polarity, array substrate and liquid crystal display device | |
| CN101900893B (en) | Method for detecting foreign particles in LCD panel and LCD panel control circuit | |
| CN102467863B (en) | Thin film transistor-liquid crystal display (TFT-LCD) electrical problem testing circuit and testing method | |
| KR20110133201A (en) | Light emitting diode drive circuit and method for driving thereof | |
| CN103226932A (en) | Video processing circuit, video processing method, liquid crystal display device, and electronic apparatus | |
| CN101236737B (en) | Circuit for reducing gate driver circuit quantity and LCD device | |
| CN105225648A (en) | A kind of method and liquid crystal display reducing image residue | |
| CN201204027Y (en) | Circuit capable of reducing gate drive circuit quantity and liquid crystal display apparatus | |
| US20140139504A1 (en) | Method for displaying flicker pattern, method for adjusting common voltage, and lcd module | |
| KR20080071049A (en) | Liquid crystal display and driving method thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20120516 |