CN102435956A - Reuse test device for accelerating service life and degeneration of lighting device - Google Patents

Abstract

A lighting device accelerated life and accelerated degradation multiplex test device, including a test box, a data acquisition card and a computer. The test is set up through the computer control interface; the data acquisition card receives the control signal from the computer, converts it into digital and analog signals and sends them to the test chamber, and collects real-time data in the test chamber and sends them to the computer. The control program is graphically displayed and stored. The test stress application in this device adopts multiple independent constant current control structures, so that the stress conditions of each test piece do not affect each other. The invention can realize convenient operation control and intuitive data display through the computer control program, and supports multiple test schemes such as timing, fixed number, and sequence, and can be used to compare the accuracy of different accelerated degradation models and accelerated life models, and develop new The model has high research efficiency. It has good practical value and broad application prospect in the field of product testing technology.

Description

A lighting device accelerated life and accelerated degradation multiplexing test device

1. Technical field

The invention relates to an accelerated test device, in particular to a lighting device accelerated life and accelerated degradation multiplex test device. The invention belongs to the technical field of product testing.

2. Background technology

At present, the life of lighting devices is a key indicator of lamp quality, and it is necessary to test related parameters and inspect the service life. In the past, this work was mainly estimated based on the actual use process of the product, which is extremely inaccurate, and is quite different from the real use environment, and the detection accuracy of reliability and life is low.

Accelerated life test is a test method that increases the test stress and accelerates the failure process of the product without changing the failure mechanism of the product or adding new failure factors. According to the results of the accelerated life test, the life characteristics of the product under normal stress can be predicted. When using voltage as stress for constant stress accelerated life test, the inverse power law is often used as the model of the relationship between life and voltage, which not only makes it possible to test the life of long-lived lighting devices, but also speeds up the life test of ordinary lighting devices. Greatly save manpower and material resources, reduce verification costs and enterprise burden, and improve efficiency.

The Chinese invention patent application with the publication number CN102129048A has designed an automatic life test device for lighting devices, a general-purpose accelerated life and accelerated degradation multiplex test device for lighting devices. Using the accelerated life test technology, the test time is long, the cost is high, and there is no real-time data collection of the performance of the lighting device, only the life data of the lighting device is obtained. The Chinese invention patent application with the publication number CN201859199U has designed an accelerated life test device for LED chips. This design performs accelerated life tests on the chips with temperature as the accelerated stress. It is necessary to terminate the test and then use other equipment and methods to test the chip under test. Performance Testing. In a general multi-channel experimental device, a simple parallel structure is often used for the test, but the product status of a certain channel will affect the power supply status of other channels. In order to solve the above problems, the present invention proposes an accelerated life and accelerated degradation multiplexing test device that can perform performance testing and data collection on lighting devices in real time, and designs a multi-channel independent constant current control structure, so that each test The stress conditions of the parts do not affect each other.

3. Contents of the invention

1. Purpose: The purpose of the present invention is to provide a lighting device accelerated life and accelerated degradation multiplexing test device, which can perform real-time data testing and collection of lighting devices, and supports various test programs such as timing, fixed number, and sequence.

2. Technical solution

The technical solution adopted in the present invention is: see Fig. 1, a lighting device accelerated life and accelerated degradation multiplexing test device of the present invention, including a test box, a data acquisition card and a computer. The position connection relationship and signal direction between them are: set the test through the computer control interface; the data acquisition card receives the control signal from the computer, converts it into digital and analog signals and sends them to the test chamber, and collects the data in the test chamber. The real-time data is sent to the computer and displayed and stored graphically through the control program developed by Labview.

(1) First, set up the test through the computer control interface. The stress application time, stress application value and data collection point of the tested product can be set on the program interface. Different stress application methods are determined by different test programs such as timing, fixed number or sequential, and flexible test formulation makes it suitable for various accelerated life test and accelerated degradation test environments. The communication between the data acquisition card and the computer is via the USB interface, which is simple and convenient.

(2) The data acquisition card receives the control signal from the computer, converts it into digital and analog signals and sends them to the test chamber, collects real-time data in the test chamber, sends them to the computer, and displays them graphically through the control program developed by Labview and storage.

(3) In a general multi-channel experimental device, a simple parallel structure is often used for the test, but the product status of a certain channel will affect the power supply status of other channels. In order to solve this problem, the present invention designs multiple The circuit independent constant current control structure, so that the stress conditions of each test piece do not affect each other. The NI6521 data acquisition card selected by the present invention can output 4-way model semaphore and 16-way digital semaphore to input 16-way analog semaphore. It is designed here to accommodate 16 lighting devices as test products, which are divided into 4 groups at most for stress control, and 16 digital quantities are used to control the data sampling points of 16 test products.

(4) After the test box receives the 4-channel analog model from the data card, it is divided into 16-channel signals by the signal processing circuit on the signal control board, and the power is amplified, and sent to the circuit board equipped with the lighting device base , applied across the product under test and the current limiting resistor. At the same time, according to the 16-channel digital signal sent by the data card, the driving capability is improved through the driver chip, the control signal collection point is selected through the relay, and the 16-channel analog signal is sent to the data acquisition card after signal attenuation. The above-mentioned signal processing and attenuation circuits use integrated operational amplifier chips OP27 and LM741, the driver chip uses ULN2003, the relay selected for the selection control circuit is Omron GV-5V, and the 5V power supply chip uses LM2576.

(5) The signal collected by the data card is the voltage value applied to the lighting device and current-limiting resistor in the test box or the voltage value shared by the product under test, which can be switched and controlled by the computer; the test box is used to install the product , and exert a voltage-controllable working stress on the lighting device.

The test box is a box structure, which is composed of a chassis, a switching power supply box, a circuit board with a lighting device base, a test box control board, copper columns for fixing the circuit board, and a switch circuit; the position between them The relationship is: the switching power supply box is built in one side of the chassis, and the control board of the test box is set under the circuit board with the base of the lighting device. side of the power box. The chassis is a hollow six-sided box made of stainless steel plate; the switching power supply box is a six-sided box structure; the circuit board with the base of the lighting device is a rectangular plate on which the lighting device is placed and has Multiple current-limiting resistors and power and signal interfaces; the control board of the test box is a rectangular plate, on which there are multiple signal calculation and power amplification circuits, as well as power and signal input and output interfaces; the copper pillars of the fixed circuit board are Cylindrical structure. The switch line is located on the back side of the chassis, and is connected in series with the main power supply 220V of the test box and the 220V voltage input terminal of the switching power supply module, thereby controlling the on-off of the entire power supply of the chassis.

The data acquisition card is a 6251 data acquisition card produced by NI Company.

The computer is a general-purpose computer with a USB interface.

The switching power supply module is the JSJ55-A12S18 switching power supply of Jielida Company.

Among them, the external dimensions of the test box are: 35*25*15, unit: cm;

Among them, the external dimensions of the switching power supply box are: 20*10*4, unit: cm;

Wherein, the dimensions of the circuit board equipped with the base of the lighting device are: 25*20*0.15, unit: cm;

Among them, the external dimensions of the control board of the test box are: 25*20*0.15, unit: cm;

Wherein, the external dimensions of the copper pillars for fixing the circuit board are: diameter: 0.5cm, length 7cm; number is 4;

Wherein, the material of the circuit board equipped with the base of the lighting device is FR4 glass fiber;

Among them, the control panel of the test box is made of FR4 glass fiber.

3. Beneficial effects

Beneficial effects of the present invention: on the basis of collecting the resistance value data and degradation trend of the lighting device, the device can carry out accelerated life test and accelerated degradation test on the lighting device, and can realize convenient operation control and intuitive data through the computer control program show. It can be used to compare the accuracy of different accelerated degradation models and accelerated life models, and develop new models with high research efficiency.

4. Description of drawings

Fig. 1 is a structural block diagram of the device of the present invention.

Fig. 2 is a block diagram of the signal flow of the device of the present invention.

Figure 3 is a schematic diagram of a single circuit

Figure 4 is a functional block diagram of the control board in the test box

Fig. 5 is a structural diagram of the test box of the device of the present invention.

In the figure: 1. Chassis; 2. Switching power supply box; 3. Circuit board with lighting device base; 4. Test box control board; 5. Copper pillars for fixing the circuit board.

5. Specific implementation

The present invention will be further described below in conjunction with accompanying drawings and examples.

As shown in Figure 1, a general-purpose accelerated life and accelerated degradation multiplex test device for lighting devices consists of three parts: a test box, a data acquisition card and a computer. The signal flow between the three parts is shown in Figure 2: the test is set through the computer control interface; the data acquisition card receives the control signal from the computer, converts it into digital and analog signals and sends them to the test box, and collects the test box The real-time data in the computer is sent to the computer, and the control program developed by Labview is used for graphical display and storage. This device can test 16 lighting devices at the same time, and apply four sets of different stress values. For each unit circuit, the principle is shown in Figure 3: the signal collected by the data card is applied to the lighting device and current limiting The voltage value of the resistor or the voltage value obtained from the lighting device can be switched and controlled by a computer; the test box is used to install the lighting device and apply voltage-controllable working stress to the lighting device. The functional structure of the signal control board in the test box is shown in Figure 4: After the test box receives 4 channels of analog models from the data card, it divides them into 16 channels of signals through the signal processing circuit on the signal control board, and performs power Amplified, sent into the circuit board with the base of the lighting device, applied to both ends of the product under test and the current limiting resistor. At the same time, according to the 16-channel digital signal sent by the data card, the driving capability is improved through the driver chip, the control signal collection point is selected through the relay, and the 16-channel analog signal is sent to the data acquisition card after signal attenuation. The structure of the test box is shown in Figure 5.

Described test box is a box structure, and it is made up of cabinet 1, switching power supply box 2, the circuit board 3 that lighting device base is housed, test box control board 4 and the copper column 5 of fixed circuit board and switch circuit; The positional relationship between them is: the switching power supply box 2 is built in one side of the chassis 1, the control board 4 of the test box is arranged at the lower position of the circuit board 3 with the base of the lighting device, and the two are connected by the copper column 5 fixing the circuit board. After the person is firmly connected together, it is placed on one side of the switching power supply box 2. The chassis 1 is a hollow six-sided box made of stainless steel plate; the switching power supply box is a six-sided box structure; the circuit board 3 with the lighting device base is a rectangular sheet made of FR4 glass fiber, Lighting devices are placed on it and there are multiple current-limiting resistors, power supply and signal interfaces; the control board 4 of the test box is a rectangular plate made of FR4 glass fiber, and there are multiple signal calculation and power amplification circuits and power supply and signal interfaces on it. Signal input and output interface; the copper column 5 for fixing the circuit board is a cylindrical rod-shaped structure.

The data acquisition card is a 6251 data acquisition card produced by NI Company.

The computer is a general-purpose computer with a USB interface.

The switching power supply module is the JSJ55-A12S18 switching power supply of Jielida Company.

Among them, the external dimensions of the test box are: 35*25*15, unit: cm;

Wherein, the external dimension of the switching power supply box 2 is: 20*10*4, unit: cm;

Wherein, the external dimension of the circuit board 3 equipped with the base of the lighting device is: 25*20*0.15, unit: cm;

Wherein, the external dimension of the control board 4 of the test box is: 25*20*0.15, unit: cm;

Wherein, the external dimensions of the copper pillars 5 for fixing the circuit board are: diameter: 0.5 cm, length 7 cm; the number is 4.

In the present invention, open the cabinet 1 of the test box, install the tested lighting device on the circuit board 3 equipped with the lighting device base, install the cabinet 1, open the computer, data acquisition card and switching power supply box 2, according to the accelerated life test It is required to set the parameters such as time and stress of the test and the data collection points of each channel in the control program. When the test is started, the test box starts to apply stress to the lighting device, and the program also starts to collect data in real time, which is displayed in real time on the interface and displayed. Write to file for storage. In the present invention, the resistance of the lighting device gradually increases with the increase of the use time as its performance degradation parameter. In the test, as the resistance of the lighting device increases, the voltage value gradually increases, so the voltage value is used as the test value. Data collected and analyzed.

The device uses the resistance of the lighting device as the performance degradation data, conducts accelerated life test and accelerated degradation test on the lighting device, and collects and stores the data in real time. Through the computer control program, it can realize convenient operation control and intuitive data display.

Claims (8)

1. An illuminating device accelerated aging with quicken the multiplexing test unit of degenerating, it is characterized in that: it comprises chamber, data collecting card and computing machine, through the computer control interface test is provided with; Data collecting card is accepted the control signal that computing machine transmits, and convert thereof into digital and analog signaling and send into chamber, and the real time data in the acquisition test case, send into computing machine, the control program of developing through Labview carries out image conversion demonstration and storage;

   Described chamber is a body structure, and it is made up of the copper post and the switching circuit of cabinet, switch power module, the circuit board that the illuminating device base is housed, chamber control panel, fixing circuit board; The Switching Power Supply case is built in cabinet one side, and the chamber control panel is arranged on the lower position of the circuit board that the illuminating device base is housed, and after the copper post through fixing circuit board is fixed together the two, is placed on a side of Switching Power Supply case; This cabinet is six casings of interior sky, makes with the corrosion resistant plate material; This Switching Power Supply case is six body structures; This circuit board that illuminating device base is housed is a rectangle plate, places illuminating device on it and a plurality of current-limiting resistances is arranged and power supply and signaling interface; This chamber control panel is a rectangle plate, on it and multiple signals computing and power amplification circuit and power supply and signal input output interface arranged; The copper post of this fixing circuit board is the cylinder rod-like structure, and this switching circuit is to be positioned at the cabinet dorsal part, be connected in series with the 220V voltage input end of chamber primary power 220V and switch power module, thus the break-make of the whole power supply of control cabinet.
2. 2. according to the described a kind of universal illuminating device accelerated life test device of claim 1, it is characterized in that: the physical dimension of this chamber is: 35*25*15cm.
3. 3. according to the described a kind of universal illuminating device accelerated life test device of claim 1, it is characterized in that: the physical dimension of this Switching Power Supply case is: 20*10*4cm.
4. 4. according to the described a kind of universal illuminating device accelerated life test device of claim 1, it is characterized in that: this physical dimension that circuit board of illuminating device base is housed is: 25*20*0.15cm.
5. 5. according to the described a kind of universal illuminating device accelerated life test device of claim 1, it is characterized in that: the physical dimension of this chamber control panel is: 25*20*0.15cm.
6. 6. according to the described a kind of universal illuminating device accelerated life test device of claim 1, it is characterized in that: the physical dimension of the copper post of this fixing circuit board is: diameter: 0.5cm, long 7cm; Quantity is 4.
7. 7. according to the described a kind of universal illuminating device accelerated life test device of claim 1, it is characterized in that: this material that circuit board of illuminating device base is housed is the FR4 spun glass.
8. 8. according to the described a kind of universal illuminating device accelerated life test device of claim 1, it is characterized in that: the material of this chamber control panel is the FR4 spun glass.

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