CN102413289B - Smear phenomenon correcting method - Google Patents

Abstract

The invention relates to a smear phenomenon correcting method which comprises the following steps of: correcting at least one smear in a sensing image generated when a charge coupled device (CCD) senses an object; establishing an induced charge equation consisting of induced charge quantity, practical image charge quantity and smear charge quantity on each pixel of each CCD inducing column according to defined displacement reading time, displacement clearing time, exposure time, the exposure rate of the CCD, the light receiving strength of each CCD inducing cell and a light receiving quantity-induced charge quantity conversion constant of the CCD; and enabling the induced charge equation to form a simultaneous equation set; correcting the induced charge equation in the simultaneous equation set into a measurement calculating equation and calculating the practical image charge quantity of all pixels by utilizing an iterative method.

Description

Smear phenomenon correcting method

Technical field

The present invention relates to applied correction method in a kind of optical measurement, particularly the bright shadow of a kind of towing (smear) phenomenon correction method.

Background technology

In the technical field of optical measurement, due to Partial charge coupler (Charge Coupled Device; CCD), for example change charge-coupled device (Interline Transfer Charge Coupled Device in the ranks; And frame width formula conversion charge-coupled device (Frame Transfer Charge Coupled Device IT CCD); FTCCD), be to adopt the electronic type shutter and incorporeity tripper blocking-up light, when capture finished to carry out transfer of data, light still can continue to inject CCD and responded to by CCD, in sensing image, formed the bright shadow of at least one towing (smear).

Refer to Fig. 1 to Figure 1B, it is the logical schematic of CCD light sensing principle.As shown in the figure, the IT CCD of take is example, CCD comprises the individual CCD of one first quantity (w) induction hurdle 1 (take w=4 in this and be example), each CCD induction hurdle 1 comprises again the one second individual CCD induction born of the same parents of quantity (h) (Cell) 11 (take h=5 in this and be example), make CCD have w * h above-mentioned CCD induction born of the same parents 11, and make the sensing image of CCD can have w * h pixel that corresponds respectively to above-mentioned w * h CCD induction born of the same parents 11.

Each CCD induction born of the same parents 11 comprise a photosensitive cell 111 and the temporary born of the same parents (Charge Register) 112 of an electric charge.Photosensitive cell 111 is to respond to incident ray, and changes incident ray into a charge inducing amount 4.The temporary born of the same parents 112 of electric charge are electrically connected at photosensitive cell 111 to receive this charge inducing amount 4.In addition, the temporary born of the same parents 112 of h electric charge in CCD induction hurdle 1 are connected into a bit shift register (Shift Register) 2, and bit shift register 2 is electrically connected at one and reads buffer (Readout Register) 3.

When an exposure capture stroke finishes, h the photosensitive cell 111 in CCD induction hurdle 1 can be sent to the charge inducing amount 4 (doing representative with a black round dot in figure) had the temporary born of the same parents 112 of corresponding electric charge simultaneously.Then, as shown in Figure 1A, bit shift register 2 can be sent to sequentially displacement of charge inducing amount 4 to read buffer 3, for reading buffer 3, those charge inducing amounts 4 is read to (Readout) action, uses and is converted into numerical value.More than for CCD, respond to the basal conditions of light.

Wherein, bit shift register 2 is sent to sequentially displacement of charge inducing amount 4 to read buffer 3, refers to that the charge inducing amount 4 of synchronously all electric charges being kept in born of the same parents 112 is to reading pixel unit of buffer 3 displacement.Change to say it, the charge inducing amount 4 in the temporary born of the same parents 112 of the electric charge that will be the most close read buffer 3 of being is sent to reads buffer 3, charge inducing amount 4 in the temporary born of the same parents 112 of all the other electric charges is sequentially by the temporary born of the same parents 112 of originally affiliated electric charge, and the electric charge that is sent to the temporary born of the same parents of electric charge 112 belows under being arranged in is originally kept in born of the same parents 112.For example, the 5th the temporary born of the same parents 112 of electric charge are sent to the temporary born of the same parents 112 of temporary 112, the 4 electric charges of born of the same parents of the 4th electric charge by charge inducing amount 4 displacements that have charge inducing amount 4 displacements that have are sent to the temporary born of the same parents 112 of the 3rd electric charge, and the rest may be inferred.

Then, refer to Fig. 2 and Fig. 2 A, it is in one removes stroke, the logical schematic of CCD running.Before aforesaid exposure capture stroke started, photosensitive cell 111 likely produced a unexposed charge inducing amount 5 (round dot of being filled with a point-like hatching in figure is done representative) because sensing some veiling glares.Those unexposed charge inducing amounts 5 are unwanted unnecessary electric charge, therefore must first carry out removing (Reset) stroke it is removed.As shown in the figure, in removing stroke, this h photosensitive cell 111 can be sent to the unexposed charge inducing amount 5 had the temporary born of the same parents 112 of corresponding electric charge simultaneously, recycling bit shift register 2 is sent to the sequentially displacement of unexposed charge inducing amount 5 to read buffer 3, and by reading buffer 3, those unexposed charge inducing amounts 5 is disposed.

The start narration on CCD induction hurdle 1 after finishing compared to the shown exposure capture stroke of Fig. 1 to Figure 1B, in the removing stroke that Fig. 2 and Fig. 2 A narrate, different part is read buffer 3 and can't be read action to this unexposed charge inducing amount 5 after being that unexposed charge inducing amount 5 is moved to and reads buffer 3.The ground that replaces is by its direct removing.Therefore, the each sequentially displacement of bit shift register 2 transmits the unit interval that unexposed charge inducing amount 5 consumes, and can more sequentially displacement transmits the short of unit interval that charge inducing amount 4 consumes.

Refer to Fig. 3, it is in CCD optical measurement stroke, the schematic diagram of simple and easy time shaft.As shown in the figure, in removing stroke, bit shift register 2 is at each displacement checkout time Δ τ ₂Unexposed charge inducing amount 5 is transmitted to reading buffer 3 displacements, at the time for exposure τ capture stroke that exposes, and read time Δ τ in each displacement ₁ Charge inducing amount 4 is transmitted to reading buffer 3 displacements.Wherein, reading after buffer 3 to be taken time reads because unexposed charge inducing amount 5 is transferred into, and can carry out fast next round displacement transmission, so the displacement checkout time can read the short of time than displacement.

Next, refer to Fig. 4 to Fig. 4 E, it is the logical schematic that the bright shadow of towing produces principle, while be also the t0～t5 time point in the removing stroke, and the effect schematic diagram of bit shift register.Below will take h=5, j '=2 is example, and the CCD induction born of the same parents 11 sequentially sequence from the bottom to top that CCD is responded in hurdle 1 is the 1st～the h, and wherein the individual CCD induction of j ' born of the same parents 11 are the phenomenons that produce light leak.

As shown in Figure 4, this h photosensitive cell 111 will be responded to the unexposed charge inducing amount 5 that does not need veiling glare to produce, and be sent to respectively the temporary born of the same parents 112 of corresponding electric charge.As shown in Figure 4 A, when the t1 time point, in bit shift register 2, the temporary born of the same parents 112 of the electric charge of the 1st～the h are by the unexposed charge inducing amount 5 had, synchronous to pixel unit of the direction displacement of reading buffer 3.And the 1st the temporary born of the same parents 112 of electric charge can be sent to the unexposed charge inducing amount 5 had to read buffer 3.

When carrying out displacement action, still have part light to leak to incessantly the 2nd (j ' is individual) CCD induction born of the same parents 11, cause the charge inducing of part to leak to the temporary born of the same parents 112 of the 2nd (j ' is individual) electric charge.So, make the temporary born of the same parents 112 of the 2nd electric charge move checkout time Δ τ at this section ₂In (t0～t1), the removing charge leakage amount 42a (being to represent with the dot that an oblique line is filled in the drawings) that generation one is extra.

As shown in Figure 4 B, when the t2 time point, this removing charge leakage amount 42a can together be moved to next pixel unit with unexposed charge inducing amount 5 originally.Simultaneously, the 2nd the temporary born of the same parents 112 of electric charge regenerate once again another one and remove charge leakage amount 42a.As shown in Figure 4 C, when the t3 time point, remove charge leakage amount 42a and unexposed charge inducing amount 5 and together be transferred into and read in buffer 3 and be eliminated.

Yet, as shown in Fig. 4 D and Fig. 4 E, when t4 and t5 time point, because the temporary born of the same parents 112 of the 2nd electric charge continue to produce removing charge leakage amount 42a at each time point, make at the beginning 5 (h) unexposed charge inducing amounts 5 after removing, the 1st temporary born of the same parents 112 of the electric charge with the 2nd are a remaining removing charge leakage amount 42a separately still.

Refer to Fig. 5 to Fig. 5 E, it is the logical schematic that the bright shadow of towing produces principle, be also after the end of exposure capture stroke, the effect schematic diagram of the bit shift register during t6～t11 time point.Remove after stroke finishes and carry out the exposure capture stroke that the time for exposure is τ, after exposure capture stroke finishes, as shown in Fig. 5 and Fig. 5 A, when t6 and t7 time point, in bit shift register 2, the temporary born of the same parents 112 of the electric charge of the 1st～the h can receive the charge inducing amount 4 that respond in exposure capture strokes from corresponding photosensitive cell 111, and by the charge inducing amount 4 that has to pixel unit of the direction displacement of reading buffer 3.

In the same manner, when carrying out displacement action, the 2nd (j ' is individual) CCD induction born of the same parents 11 still can reveal electric charge partly incessantly to the temporary born of the same parents 112 of corresponding the 2nd (j ' is individual) electric charge, make the temporary born of the same parents 112 of the 2nd electric charge read time Δ τ in each displacement ₁In, produce once again the extra charge leakage amount that a reads 42b (being to represent with the large circle point that an oblique line is filled in the drawings).Now, the charge inducing amount 4 in the 3rd temporary born of the same parents 112 of electric charge in Fig. 5 originally, when the t7 time point, can change into by described and read charge leakage amount 42b and an actual image quantity of electric charge 41 forms.Wherein the actual image quantity of electric charge 41 is charge inducing amount 4 originally.

Change to say it, charge inducing amount 4 now is actually by the actual image quantity of electric charge 41 and adds and read that charge leakage amount 42b forms.So be apparent on sensing image, can produce the high situation of the truer image of brightness value.Above situation can occur in the 3rd (j '+1) to the 5th the temporary born of the same parents 112 of (h) electric charge, thus can be the bright shadow of the described towing of formation between (j '+1) individual～h pixel.

Simultaneously, please continue to consult Fig. 5 to Fig. 5 E.After the removing stroke at t1～t5 time point, the 1st the temporary born of the same parents 112 of the electric charge with the 2nd still distinguish residual one and remove charge leakage amount 42a, therefore the 1st and the 2nd the temporary born of the same parents' 112 of electric charge charge inducing amount 4, can change into by described removing charge leakage amount 42a and the actual image quantity of electric charge 41 and be formed.Similarly, also can cause the high situation of the truer image of brightness value in sensing image.Above situation can occur in the temporary born of the same parents 112 of the 1st～2nd (j ' is individual) electric charge, therefore can between the 1st～individual pixel of j ', form the bright shadow of described towing.

Wherein, when in fact the bright shadow of the towing of the 1st～the j ' pixel is observed, can be than the bright shadow dimness of towing of (j '+1) individual～h pixel.Tracing it to its cause, is that time Δ τ is read in displacement ₁Than displacement checkout time Δ τ ₂Long institute causes.Because time Δ τ is read in displacement ₁Comprise and read buffer 3 and spend in the time of reading charge inducing amount 4, so time Δ τ is read in displacement ₁Can be than displacement checkout time Δ τ ₂Length is during making the individual CCD induction of j ' born of the same parents 11 generations read the light leak of charge leakage amount 42b, long during the light leak of generation removing charge leakage amount 42a.Therefore, read charge leakage amount 42b and can, because of longer during light leak, remove and compare large that charge leakage amount 42a comes.Visually, read the charge inducing amount 4 that charge leakage amount 42b and actual image electric charge 41 form, naturally also just form the brighter bright shadow of towing.

In order to solve in above-mentioned sensing image, there will be the problem of pulling bright shadow, the present invention pulls the revisal of bright shadow on software by algorithm design.

Summary of the invention

Technical problem and purpose that institute of the present invention wish solves:

Because the sensing image of CCD can have the bright shadow phenomenon of above-mentioned towing in the prior art, technical problem to be solved by this invention is to provide a kind of correction method that pulls bright shadow, utilize the design of algorithm in software, calculate the charge inducing equation of a plurality of each pixels of correspondence in a Simultaneous Equations, in the charge inducing equation formed by a charge inducing amount, an actual image quantity of electric charge and the bright shadow quantity of electric charge of a towing, calculate the actual image quantity of electric charge, use the correction sensing image and make it no longer have the bright shadow of towing.

The technological means that the present invention deals with problems:

The present invention is for solving the problem of prior art, and the technological means adopted is to provide a kind of correction method that pulls bright shadow, with to a charge-coupled device (Charge Coupled Device; The bright shadow of at least one towing of the sensing image CCD) produced during sensing one object carries out revisal.CCD comprises the individual CCD induction of one first quantity (w) hurdle, each CCD induction hurdle comprises the individual CCD induction of one second quantity (h) born of the same parents (Cell), use and make CCD have w * h above-mentioned CCD induction born of the same parents, and make this sensing image have w * h pixel that corresponds respectively to above-mentioned w * h CCD induction born of the same parents.

Each CCD induction born of the same parents comprise the temporary born of the same parents (Charge Register) of electric charge that a photosensitive cell and is electrically connected at this photosensitive cell, and the temporary born of the same parents of each electric charge are connected into a bit shift register (Shift Register) and are electrically connected at one and read buffer (Readout Register).Wherein, j ' the individual CCD induction threatened abortion light of the bright shadow of towing in those CCD inductions born of the same parents is produced.

This correction method comprises the following step: at first, time Δ τ is read in definition one displacement ₁An and displacement checkout time Δ τ ₂, and each CCD induction born of the same parents's the luminous intensity that is subjected to is defined as to I; When each CCD induction born of the same parents's a time for exposure is τ, utilize displacement to read time Δ τ ₁, displacement checkout time Δ τ ₂, be subjected to the light leak rate η of luminous intensity I, CCD and the light income of CCD-charge inducing amount conversion constant k ₁, each pixel on each CCD induction hurdle is set up to a charge inducing equation.Wherein this charge inducing equation is comprised of with the bright shadow quantity of electric charge of towing charge inducing amount, the actual image quantity of electric charge.

H above-mentioned charge inducing equation is rewritten as to h metering computing (count calculation) equation, and forms a Simultaneous Equations.Simultaneously, a default stop condition, and calculate Simultaneous Equations with iteration technique.When meeting this stop condition, stop the actual image electric charge metering of the actual image quantity of electric charge corresponding a conversion value that iteration technique calculated and obtained each pixel on each CCD induction hurdle, use the bright shadow of towing in the revisal sensing image.

The present invention's effect against existing technologies:

CCD detection method compared to prior art provides, owing to for the bright image phenomenon of towing, not carrying out revisal, can make testing result produce error, and smear phenomenon correcting method of the present invention is owing to utilizing the definition displacement to read time Δ τ ₁, displacement checkout time Δ τ ₂With influencing factors such as being subjected to luminous intensity I, set up the charge inducing equation of corresponding each pixel, and be rewritten as the metering machine equation with the actual image electric charge metering of the actual image quantity of electric charge corresponding that calculates corresponding each pixel conversion value.Thus, can obtain the actual image electric charge metering conversion value of each pixel after revisal, the accuracy of promoting optical measurement, avoid pulling bright shadow interference detection results.

Below in conjunction with the drawings and specific embodiments, describe the present invention, but not as a limitation of the invention.

The accompanying drawing explanation

Fig. 1 to Figure 1B is the logical schematic of CCD light sensing principle;

Fig. 2 and Fig. 2 A are in one removes stroke, the logical schematic of CCD running;

Fig. 3 is the schematic diagram of simple and easy time shaft in CCD optical measurement stroke;

Fig. 4 to Fig. 4 E produces the logical schematic of principle for the bright shadow of towing;

Fig. 5 to Fig. 5 E produces the logical schematic of principle for the bright shadow of towing; And

Fig. 6 is the simple process figure of the bright shadow correction method of towing of the present invention.

Wherein, Reference numeral

CCD responds to hurdle 1

CCD responds to born of the same parents 11

Photosensitive cell 111

Electric charge is kept in born of the same parents 112

Bit shift register 2

Read buffer 3

Charge inducing amount 4

Unexposed charge inducing amount 5

The actual image quantity of electric charge 41

Remove charge leakage amount 42a

Read charge leakage amount 42b

Time for exposure τ

Time Δ τ is read in displacement ₁

Displacement checkout time Δ τ ₂

Be subjected to luminous intensity I

Light leak rate η

Light income-charge inducing amount conversion constant

Embodiment

Below in conjunction with accompanying drawing, structural principle of the present invention and operation principle are described in detail:

Please refer in prior art and to describe and to consult in the lump Fig. 3 to Fig. 4 E in detail to what pull that bright shadow (smear) generates reason.Smear phenomenon correcting method of the present invention is in order to a charge-coupled device (Charge Coupled Device; The bright shadow of at least one towing of the sensing image CCD) produced during sensing one object carries out revisal, and wherein object can be the LED luminescence component.The present invention is respectively for the 1st～the j ' pixel and the (j '+1)～h pixel, by one, removes charge leakage amount 42a and respectively and reads the bright shadow of the formed towing of charge leakage amount 42b and carry out revisal.Below enumerating a preferred embodiment of the present invention implements according to this for affiliated technical field person.

At first, time Δ τ is read in definition one displacement ₁An and displacement checkout time Δ τ ₂, and each CCD induction born of the same parents's 11 the luminous intensity that is subjected to is defined as to I.Those temporary electric charge born of the same parents 112 read time Δ τ in each above-mentioned displacement ₁One sequentially displacement of charge inducing amount 4 is sent to this and reads buffer 3, each charge inducing amount 4 comprises an actual image quantity of electric charge 41 and the bright shadow quantity of electric charge of a towing, and this charge inducing amount 4 obtains by sensing.

Then, when each CCD induction born of the same parents's 11 a time for exposure is τ, utilize this displacement to read time Δ τ ₁, this displacement checkout time Δ τ ₂, this is subjected to the light leak rate η of luminous intensity I, this CCD and one light income of this CCD-charge inducing amount conversion constant k ₁Each pixel on each CCD induction hurdle 1 is set up to one by charge inducing amount 4, the actual image quantity of electric charge 41 and the charge inducing equation that the bright shadow quantity of electric charge of towing forms, from each CCD, respond to the Simultaneous Equations that hurdle acquisition one is comprised of h above-mentioned charge inducing equation according to this.

Wherein, in above-mentioned this h charge inducing equation, j charge inducing equation is:

$N_j={\mathrm{<figure-callout\; id="1"\; label="k"\; filenames="HSA00000279669200092.png"\; state="\{\{state\}\}">k</figure-callout>}}_1\mathrm{\&tau;}{I}_j+\underset{j^{\&prime;}=1}{\overset{j-1}{\mathrm{\&Sigma;}}}{\mathrm{<figure-callout\; id="1"\; label="k"\; filenames="HSA00000279669200092.png"\; state="\{\{state\}\}">k</figure-callout>}}_1\mathrm{\&eta;\&Delta;}{\mathrm{\&tau;}}_1{I}_{j^{\&prime;}}+\underset{j^{\&prime;}=\mathrm{<figure-callout\; id="1"\; label="j\; h\; k"\; filenames="HSA00000279669200092.png"\; state="\{\{state\}\}">j</figure-callout>}}{\overset{h}{\mathrm{\&Sigma;}}}{k}_{}{}_1\mathrm{\&eta;\&Delta;}{\mathrm{\&tau;}}_2{I}_{j^{\&prime;}}$

N _jIn an above-mentioned h pixel, the charge inducing amount 4 of j pixel; k ₁τ I _jIn an above-mentioned h pixel, the actual image quantity of electric charge 41 of j pixel; In an above-mentioned h pixel, the bright shadow quantity of electric charge of the towing of j pixel.

In this j charge inducing equation,

For one of j pixel in an above-mentioned h pixel reads charge leakage amount 42b,

For one of j pixel in an above-mentioned h pixel removed charge leakage amount 42a.Read charge leakage amount 42b and all belong to the bright shadow quantity of electric charge of towing with removing charge leakage amount 42a.

From above-mentioned this h Simultaneous Equations that the charge inducing equation forms, can calculate the above-mentioned actual image quantity of electric charge 41 of each pixel on each CCD induction hurdle 1.At first, according to light leak rate η, time for exposure τ and displacement, read time Δ τ ₁, calculate one first light leak relevant parameter ε ₁.Simultaneously, according to light leak rate η, time for exposure τ and displacement checkout time Δ τ ₂, calculate one second light leak relevant parameter ε ₂.ε wherein ₁=η Δ τ ₁/ τ, and ε ₂=η Δ τ ₂/ τ.

According to this first light leak relevant parameter ε ₁With this second light leak relevant parameter ε ₂, by h in each Simultaneous Equations above-mentioned charge inducing equation, be rewritten as h metering computing (count calculation) equation.In this h metering machine equation, j metering machine equation is:

$S_j={\tilde{S}}_j+{\mathrm{\&epsiv;}}_1\underset{j^{\&prime;}=1}{\overset{j-1}{\mathrm{\&Sigma;}}}{\tilde{S}}_{j^{\&prime;}}+{\mathrm{\&epsiv;}}_2\underset{j^{\&prime;}=j}{\overset{h}{\mathrm{\&Sigma;}}}{\tilde{S}}_{j^{\&prime;}}$

S _jIn an above-mentioned h pixel, the corresponding charge inducing metering conversion value of the charge inducing amount 4 of j pixel.

In an above-mentioned h pixel, the actual image electric charge metering of the actual image quantity of electric charge 41 corresponding of j pixel conversion value. In an above-mentioned h pixel, the bright shadow electric charge metering of the corresponding towing of the bright shadow quantity of electric charge of the towing of j pixel conversion value.

In this metering machine equation, For the charge leakage amount that the reads 42b corresponding of j pixel in an above-mentioned h pixel reads charge leakage metering conversion value;

For the removing charge leakage amount 42a of j pixel in an above-mentioned h pixel corresponding removes charge leakage metering conversion value.

By this metering machine equation, can calculate this h the bright shadow electric charge metering of towing conversion value, and by the corresponding charge inducing of the charge inducing amount 4 of each pixel is measured to conversion value, the bright shadow electric charge metering of deduction towing conversion value, can make each pixel obtain the corresponding actual image electric charge metering conversion value of the actual image quantity of electric charge 41 after revisal, the bright shadow of the towing in sensing image is repaiied and removed.

In addition, on practice, can utilize iteration technique to calculate this h metering machine equation, an and default stop condition, when meeting this stop condition, stop utilizing the iteration technique computing, h of acquisition corresponds respectively to the actual image electric charge metering conversion value of h pixel in each CCD induction hurdle 1.Wherein, stop condition can be made as the circulation of a preset times, or for after repeatedly circulating The measures of dispersion of value is less than a constant.

Then, in order further to promote the disclosed technology of the present invention, below will further converge the disclosed technology of preferred embodiment of the present invention whole be a simple process figure, so that those of ordinary skill is more easily remembered in affiliated technical field.

Refer to Fig. 6, it is the simple process figure of the bright shadow correction method of towing of the present invention.At first, time Δ τ is read in definition one displacement ₁An and displacement checkout time Δ τ ₂, and each CCD induction born of the same parents's 11 the luminous intensity that is subjected to is defined as to I (S110).When each CCD induction born of the same parents's 11 a time for exposure is τ, utilize displacement to read time Δ τ ₁, displacement checkout time Δ τ ₂, be subjected to the light leak rate η of luminous intensity I, CCD and one light income of CCD-charge inducing amount conversion constant k ₁, each pixel on each CCD induction hurdle 1 is set up to a charge inducing equation, this charge inducing equation is formed (S120) by charge inducing amount 4, the actual image quantity of electric charge 41 with the bright shadow quantity of electric charge of towing.

H above-mentioned charge inducing equation is rewritten as to h metering computing (count calculation) equation, and forms a Simultaneous Equations (S130).Simultaneously, a default stop condition, and calculate Simultaneous Equations (S140) with iteration technique.When meeting this stop condition, stop the corresponding actual image electric charge metering conversion value (S150) of the actual image quantity of electric charge 41 that iteration technique calculated and obtained each pixel on each CCD induction hurdle 1, use the bright shadow of the towing in sensing image is carried out to revisal.

Certainly; the present invention also can have other various embodiments; in the situation that do not deviate from spirit of the present invention and essence thereof; those of ordinary skill in the art are when making according to the present invention various corresponding changes and distortion, but these corresponding changes and distortion all should belong to the protection range of the appended claim of the present invention.

Claims (8)

1. smear phenomenon correcting method, the bright shadow of at least one towing of the sensing image produced in order to charge-coupled device sensing one object time carries out revisal, it is characterized in that, this charge-coupled device comprises one first quantity w charge-coupled device induction hurdle, each charge-coupled device induction hurdle comprises one second quantity h charge-coupled device induction born of the same parents, use and make this charge-coupled device have w * h above-mentioned charge-coupled device induction born of the same parents, and make this sensing image have w * h pixel that corresponds respectively to above-mentioned w * h charge-coupled device induction born of the same parents, each charge-coupled device induction born of the same parents comprise the temporary born of the same parents of electric charge that a photosensitive cell and is electrically connected at this photosensitive cell, the temporary born of the same parents of those electric charges are connected into a bit shift register and are electrically connected at one and read buffer, j ' the individual charge-coupled device induction threatened abortion light of the bright shadow of this towing in those charge-coupled device inductions born of the same parents is produced, this smear phenomenon correcting method comprises the following step:

(a) time Δ τ is read in definition one displacement ₁An and displacement checkout time Δ τ ₂, and each charge-coupled device induction born of the same parents's the luminous intensity that is subjected to is defined as to I, wherein the temporary born of the same parents of those electric charges read time Δ τ in each above-mentioned displacement ₁One sequentially displacement of charge inducing amount is sent to this and reads buffer, each charge inducing amount comprises an actual image quantity of electric charge and the bright shadow quantity of electric charge of a towing, and this charge inducing amount obtains by sensing;

(b) when each charge-coupled device induction born of the same parents's a time for exposure is τ, utilize this displacement to read time Δ τ ₁, this displacement checkout time Δ τ ₂, this is subjected to a light leak rate η of luminous intensity I, this charge-coupled device and one light income of this charge-coupled device-charge inducing amount conversion constant k ₁Each pixel on each charge-coupled device induction hurdle is set up to a charge inducing equation be comprised of this charge inducing amount, this actual image quantity of electric charge and the bright shadow quantity of electric charge of this towing, the Simultaneous Equations be comprised of the individual above-mentioned charge inducing equation of h from each charge-coupled device induction hurdle acquisition one according to this; And

(c) certainly calculating the above-mentioned of each pixel on each charge-coupled device induction hurdle in this Simultaneous Equations should the actual image quantity of electric charge;

Wherein, j charge inducing equation in described h charge inducing equation is

$N_j=k_1\mathrm{\&tau;}{I}_j+\underset{j^{\&prime;}=1}{\overset{j-1}{\mathrm{\&Sigma;}}}{k}_1\mathrm{\&eta;\&Delta;}{\mathrm{\&tau;}}_1{I}_{j^{\&prime;}}+\underset{j^{\&prime;}=j}{\overset{h}{\mathrm{\&Sigma;}}}{k}_1\mathrm{\&eta;\&Delta;}{\mathrm{\&tau;}}_2{I}_{j^{\&prime;}}$

N _jFor this charge inducing amount of j pixel in an above-mentioned h pixel,

K ₁τ I _jFor this actual image quantity of electric charge of j pixel in a described h pixel,

The bright shadow quantity of electric charge of this towing for j pixel in a described h pixel.

2. smear phenomenon correcting method according to claim 1, is characterized in that, in this j charge inducing equation,

For one of j pixel in an above-mentioned h pixel reads the charge leakage amount,

For one of j pixel in an above-mentioned h pixel removed the charge leakage amount.

3. smear phenomenon correcting method according to claim 2, is characterized in that, this step (b) also comprises a step (b1), and it is to read time Δ τ according to this light leak rate η, this time for exposure τ, this displacement ₁With this displacement checkout time Δ τ ₂Calculate one first light leak relevant parameter ε ₁With one second light leak relevant parameter ε ₂, this first light leak relevant parameter ε ₁With this second light leak relevant parameter ε ₂Meet following relationship: ε ₁=η Δ τ ₁/ τ, ε ₂=η Δ τ ₂/ τ.

4. smear phenomenon correcting method according to claim 3, it is characterized in that, this step (b) also comprises a step (b2), it is that the h in each Simultaneous Equations above-mentioned charge inducing equation is rewritten as to h metering machine equation, and above-mentioned h j metering machine equation of measuring in machine equation is

S wherein _jFor the corresponding charge inducing metering conversion value of this charge inducing amount of j pixel in an above-mentioned h pixel,

For the actual image electric charge metering of this actual image quantity of electric charge corresponding of j pixel in an above-mentioned h pixel conversion value,

The bright shadow electric charge metering of the corresponding towing of the bright shadow quantity of electric charge of this towing conversion value for j pixel in an above-mentioned h pixel.

5. smear phenomenon correcting method according to claim 4, is characterized in that, in this metering machine equation,

For the charge leakage amount that reads corresponding of j pixel in an above-mentioned h pixel reads charge leakage metering conversion value, For the removing charge leakage amount of j pixel in an above-mentioned h pixel corresponding is removed charge leakage metering conversion value.

6. smear phenomenon correcting method according to claim 4, it is characterized in that, this step (c) also comprises a step (c1), be to utilize iteration technique to calculate this above-mentioned h metering machine equation, use and calculate above-mentioned h actual image electric charge metering conversion value that corresponds respectively to above-mentioned h the pixel on each charge-coupled device induction hurdle.

7. smear phenomenon correcting method according to claim 4, it is characterized in that, this step (c) also comprises a step (c2), to the default stop condition of iteration technique, and when meeting this stop condition, termination utilizes iteration technique to calculate above-mentioned h metering machine equation, and captures simultaneously above-mentioned h actual image electric charge metering conversion value that corresponds respectively to above-mentioned h the pixel on each charge-coupled device induction hurdle.

8. smear phenomenon correcting method according to claim 4, it is characterized in that, this step (c) also comprises a step (c3), be that the charge inducing of each pixel metering conversion value is deducted to the bright shadow electric charge metering of this towing conversion value, use and make each pixel obtain this actual image electric charge metering conversion value after revisal.

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