CN102386170A - 场效应晶体管器件 - Google Patents

场效应晶体管器件 Download PDF

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Publication number
CN102386170A
CN102386170A CN2010102720992A CN201010272099A CN102386170A CN 102386170 A CN102386170 A CN 102386170A CN 2010102720992 A CN2010102720992 A CN 2010102720992A CN 201010272099 A CN201010272099 A CN 201010272099A CN 102386170 A CN102386170 A CN 102386170A
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China
Prior art keywords
fet device
grid
source
drain
resistance
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Pending
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CN2010102720992A
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English (en)
Inventor
柳志达
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
Original Assignee
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Application filed by Hongfujin Precision Industry Shenzhen Co Ltd, Hon Hai Precision Industry Co Ltd filed Critical Hongfujin Precision Industry Shenzhen Co Ltd
Priority to CN2010102720992A priority Critical patent/CN102386170A/zh
Publication of CN102386170A publication Critical patent/CN102386170A/zh
Pending legal-status Critical Current

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Abstract

一种场效应晶体管器件,包括一晶体管本体、一栅极、一源极、一漏极、一电容及一电阻,该电容及电阻串联后连接在该栅极及源极之间,且该电容及电阻通过封装形式与该晶体管本体、栅极、源极及漏极整合在一起。该场效应晶体管器件具有自身保护机制。

Description

场效应晶体管器件
技术领域
本发明涉及一种场效应晶体管器件。
背景技术
在电子线路的设计上,例如电源线路部份通常会使用场效应晶体管器件来作为开关组件,如图1所示,为一现有场效应晶体管器件10的示意图,其包括一晶体管本体Q、一栅极G、一源极S及一漏极D,有时还会在源极S及漏极D之间串联一二极管DS。当该场效应晶体管器件10设于电路中时,其漏极D处的电压波形可能为图2所示,当该电压波形的峰值超过该场效应晶体管器件10的规格时,就有可能会导致该场效应晶体管器件10被击穿而烧毁的情况发生。
发明内容
鉴于上述内容,有必要提供一种具有自身保护机制的场效应晶体管器件。
一种场效应晶体管器件,包括一晶体管本体、一栅极、一源极、一漏极、一电容及一电阻,该电容及电阻串联后连接在该栅极及源极之间,且该电容及电阻通过封装形式与该晶体管本体、栅极、源极及漏极整合在一起。
上述的场效应晶体管器件通过在栅极及源极之间串接该电容及电阻组件,可有效避免被击穿而导致烧毁的情况发生,且由于该电容及电阻是封装于该场效应晶体管器件内部,故不会占用电路板的布线空间,并且成本上也较单独设置于电路板上的电阻及电容组件要低。
附图说明
下面参照附图结合较佳实施方式对本发明作进一步详细描述:
图1为现有场效应晶体管器件的示意图。
图2为图1场效应晶体管器件的漏极处的电压波形图。
图3为本发明场效应晶体管器件较佳实施方式的示意图。
图4为图3场效应晶体管器件在与图1场效应晶体管器件同等条件下时的漏极处的电压波形图。
主要元件符号说明
场效应晶体管器件        20
晶体管本体              Q1
栅极                    G1
源极                    S1
漏极                    D1
二极管                  DS1
电容                    C1
电阻                    R1
具体实施方式
请参考图3,本发明场效应晶体管器件20的较佳实施方式包括一晶体管本体Q1、一栅极G1、一源极S1、一漏极D1、一二极管DS1、一电容C1及一电阻R1,该二极管DS1串联在该源极S1及漏极D1之间,其中该晶体管本体Q1、栅极G1、源极S1、漏极D1、二极管DS1的内部具体结构均为现有技术,故这里不详细说明。
该电容C1及电阻R1串联后连接在该栅极G1及源极S1之间,且上述所有组件系通过封装形式整合在一起,作为该场效应晶体管器件20。
请参考图4,在与图2同等条件下该场效应晶体管器件20设于电路中时,其漏极D1处的电压波形的峰值要明显小于现有场效应晶体管器件10的漏极D处的电压波形的峰值,因此,本发明该场效应晶体管器件20通过自身在栅极G1及源极S1之间设置的电容C1与电阻R1串联的电路即可有效降低电压峰值,从而可避免被击穿而导致烧毁的情况发生。同时,由于该电容C1及电阻R1是通过封装形式整合该场效应晶体管器件20内部的,故相较于在外部设置单独的电容及电阻组件的成本要低很多,因此可节省成本。

Claims (2)

1.一种场效应晶体管器件,包括一晶体管本体、一栅极、一源极及一漏极,其特征在于:该场效应晶体管器件还包括一电容及一电阻,该电容及电阻串联后连接在该栅极及源极之间,且该电容及电阻通过封装形式与该晶体管本体、栅极、源极及漏极整合在一起。
2.如权利要求1所述的场效应晶体管器件,其特征在于:该源极及漏极之间还串联一二极管。
CN2010102720992A 2010-09-03 2010-09-03 场效应晶体管器件 Pending CN102386170A (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2010102720992A CN102386170A (zh) 2010-09-03 2010-09-03 场效应晶体管器件

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2010102720992A CN102386170A (zh) 2010-09-03 2010-09-03 场效应晶体管器件

Publications (1)

Publication Number Publication Date
CN102386170A true CN102386170A (zh) 2012-03-21

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6303950B1 (en) * 1999-07-29 2001-10-16 Mitsubishi Denki Kabushiki Kaisha Field effect transistor including stabilizing circuit
US6420762B1 (en) * 1996-04-11 2002-07-16 Vilmos Bankuti Integrated electrostatic protective resistor for metal oxide semiconductor field effect transistors (MOSFETs)
US20030147264A1 (en) * 2002-02-01 2003-08-07 Masahito Jinno Circuit configuration combining synchronous rectifier circuit for converter with LC snubber circuit
CN101069347A (zh) * 2004-07-29 2007-11-07 皇家飞利浦电子股份有限公司 Mosfet器件及其相关操作方法
US20080239601A1 (en) * 2007-03-30 2008-10-02 Eudyna Devices Inc. Semiconductor device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6420762B1 (en) * 1996-04-11 2002-07-16 Vilmos Bankuti Integrated electrostatic protective resistor for metal oxide semiconductor field effect transistors (MOSFETs)
US6303950B1 (en) * 1999-07-29 2001-10-16 Mitsubishi Denki Kabushiki Kaisha Field effect transistor including stabilizing circuit
US20030147264A1 (en) * 2002-02-01 2003-08-07 Masahito Jinno Circuit configuration combining synchronous rectifier circuit for converter with LC snubber circuit
CN101069347A (zh) * 2004-07-29 2007-11-07 皇家飞利浦电子股份有限公司 Mosfet器件及其相关操作方法
US20080239601A1 (en) * 2007-03-30 2008-10-02 Eudyna Devices Inc. Semiconductor device

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Application publication date: 20120321