CN102385807A - Electronic detection system and method - Google Patents
Electronic detection system and method Download PDFInfo
- Publication number
- CN102385807A CN102385807A CN2010102748979A CN201010274897A CN102385807A CN 102385807 A CN102385807 A CN 102385807A CN 2010102748979 A CN2010102748979 A CN 2010102748979A CN 201010274897 A CN201010274897 A CN 201010274897A CN 102385807 A CN102385807 A CN 102385807A
- Authority
- CN
- China
- Prior art keywords
- answer
- questions
- unit
- time
- question
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Electrically Operated Instructional Devices (AREA)
Abstract
The invention relates to an electronic detection system and method. The electronic detection system comprises a question setting unit, a computing unit, a recording unit and a scoring unit. The question setting unit is used for providing a plurality of questions for a testee to respond; the computing unit comprises a first timer and a second timer, wherein the first timer is used for starting timing at the very start of setting the questions, and the second timer is used for timing each question response time; the recording unit is used for recording total question response time according to the timing of the first timer; when the response of each question is received, the timing is performed on each question response time according to the second timer, and when all questions are finished, the answers of all the questions are recorded; and the scoring unit is used for comparing the answers of all the questions with correct answers so as to decide the number of correctly responded questions, and deciding a test score for representing the question response trend of the testee according to the relational expression for the ratio of each question response time and the total question response time and the number of the correctly responded questions, and thereby, the test reliability is improved.
Description
Technical field
The present invention relates to a kind of electronics test system and method, particularly relate to a kind of electronics test system and method that can improve electronics test result confidence level.
Background technology
Group's Hidden Figure Test (Group Embedded Figures Test; Be called for short GEFT) be to be used for the detection mode of the cognitive kenel of the amount of commenting individual, mainly be to utilize people to integrate the mode of vision message and the learner is divided into independent (the Field Independent in place; Be called for short FI) rely on (Field Dependent with the place; Be called for short FD) two types, be that tendency person then is called " place self " to rely on internal reference, be that tendency person then is called " place dependent form " to external reference.
Yet, the point system of existing Hidden Figure Test recreation be an inscription of the cover to getting a point, inscription of the cover mistake is drawn a blank; Distinguish experimenter's cognitive kenel always to assign to, in theory, cognitive kenel is the interference of situation arround the people of " place dependent form " is subject to; Therefore be not easy to do to Hidden Figure Test, so there is the tendency that has a guess at the answer and constantly do change in regular meeting, yet; Can't get rid of whether to guess questions by the answer result merely and answer questions, also have no way of learning whether revising answer in the answer process repeatedly.
This shows that above-mentioned existing electronics test system obviously still has inconvenience and defective, and demands urgently further improving in product structure, method and use.In order to solve the problem of above-mentioned existence; Relevant manufacturer there's no one who doesn't or isn't seeks solution painstakingly; But do not see always that for a long time suitable design is developed completion; And common product and method do not have appropriate structure and method to address the above problem, and this obviously is the problem that the anxious desire of relevant dealer solves.Therefore how to found a kind of new electronics test system and method, real one of the current important research and development problem that belongs to, also becoming the current industry utmost point needs improved target.
Summary of the invention
The objective of the invention is to; Overcome the defective that existing electronics test system exists; And provide a kind of novel electronic test system and method, technical matters to be solved to provide a kind of electronics test system and method that improves electronics test result confidence level, be very suitable for practicality.
The object of the invention and solve its technical matters and adopt following technical scheme to realize.According to a kind of electronics test system that the present invention proposes, comprise one provide several exercise questions to answer to a testee the unit of setting a question; Said electronics test system also comprises:
One computing unit comprises:
One first timer, the unit of setting a question begin to set a question and just pick up counting; And
One second timer is to each time answer time timing;
One record cell, according to the timing of first timer be recorded as the total answer time, when the answer that receives each topic according to second timer to each time answer time timing, and when all exercise questions of completion, write down each inscription of the cover case; And
One score unit determines one to represent testee's the test score that guesses questions tendency according to the ratio of each time answer time and total answer time with the relational expression of answering questions the topic number.
The object of the invention and solve its technical matters and also can adopt following technical measures further to realize.
Preferably; According to a preferred embodiment of the present invention; Aforesaid electronics test system; The wherein said unit of setting a question provides several exercise questions of Hidden Figure Test recreation, and the Hidden Figure Test recreation supplies to determine whether a testee belongs to place dependent form, and the score unit judges is tending towards guessing questions tendency Gao Zhewei and belongs to place dependent form.
The object of the invention and solve its technical matters and also adopt following technical scheme to realize.According to a kind of electronics test system that the present invention proposes, comprise one provide several exercise questions to answer to a testee the unit of setting a question; It is characterized in that: said electronics test system also comprises:
One computing unit comprises:
One timer, the unit of setting a question begin to set a question and just pick up counting, and
One counter is to the answer number of times metering of each topic;
One record cell, the counts of recording counter, and write down each inscription of the cover case when accomplishing all exercise questions; And
Each inscription of the cover case and correct option are compared determining one to answer questions the topic number in one score unit, and comprise that according to one answer number of times and the relational expression of answering questions the topic number determine one to represent testee's the test score that guesses questions tendency.
The object of the invention and solve its technical matters and also can adopt following technical measures further to realize.
Preferably; According to a preferred embodiment of the present invention; Aforesaid electronics test system; The wherein said unit of setting a question provides several exercise questions of Hidden Figure Test recreation, and the Hidden Figure Test recreation supplies to determine whether a testee belongs to place dependent form, and the score unit judges is tending towards guessing questions tendency Gao Zhewei and belongs to place dependent form.
The object of the invention and solve its technical matters and adopt following technical scheme to realize in addition again.According to a kind of electronics test system that the present invention proposes, comprise one provide several exercise questions to answer to a testee the unit of setting a question; It is characterized in that: said electronics test system also comprises:
One computing unit comprises once the unit of setting a question begin to set a question first timer that picks up counting, second timer of a pair of each time answer time timing, and the counter of the answer number of times metering of a pair of each topic;
One record cell, according to the timing of first timer be recorded as the total answer time, when receiving a testee to the answer of each topic according to second timer to each time answer time timing, and when all exercise questions of completion, write down each inscription of the cover case; And
Each inscription of the cover case and correct option are compared determining one to answer questions the topic number in one score unit, and determine one to represent testee's the test score that guesses questions tendency according to ratio, the answer number of times of each time answer time and total answer time with the relational expression of answering questions the topic number.
The object of the invention and solve its technical matters and also can adopt following technical measures further to realize.
Preferably, according to a preferred embodiment of the present invention, when aforesaid electronics test system, the wherein said unit of setting a question provided n road exercise question, the relational expression of said score unit foundation equaled for calculating a discrete value
1-[[(n ∑ (di/D)
2)-1]/n-1], D wherein is that total answer time and di are each time answer time; And said score unit calculates and answers questions topic number=PTS, test score=a+b1 * (PTS)+b2 * (answer number of times)+b3 * (discrete value), and a wherein, b1, b2, b3 are constants.
The object of the invention and solve its technical matters and also adopt following technical scheme to realize in addition.A kind of electronics testing method that proposes according to the present invention, one comprise the unit of setting a question, a computing unit, a record cell and a score unit electronic system carry out;
It is characterized in that: said electronics testing method comprises following step:
(A) unit of setting a question provides several exercise questions to answer to a testee;
(B) computing unit begins to set a question in the unit of setting a question and just picks up counting, and to each time answer time timing;
(C) when accomplishing all exercise questions, write down each inscription of the cover case, record cell is recorded as the total answer time according to the timing of first timer, and is recorded as each time answer time according to the timing of second timer;
(D) each inscription of the cover case of score unit comparison and correct option to be determining one to answer questions the topic number, and according to the ratio of each time answer time and total answer time and answer questions the relational expression of inscribing number and determine one to represent testee's the test score that guesses questions tendency.
The object of the invention and solve its technical matters and also can adopt following technical measures further to realize.
Preferably, according to a preferred embodiment of the present invention, aforesaid electronics testing method, the relational expression of wherein said step (D) foundation is a 1-[[(n ∑ (di/D)
2)-1]/n-1],
D wherein is that total answer time, di are each time answer time, and n is an exercise question quantity.
The object of the invention and solve its technical matters and also adopt following technical scheme to realize in addition.A kind of electronics testing method that proposes according to the present invention, one comprise the unit of setting a question, a computing unit, a record cell and a score unit electronic system carry out;
It is characterized in that: said electronics testing method comprises following step:
(A) unit of setting a question provides several exercise questions to answer to a testee;
(B) computing unit in test beginning just to the answer number of times metering of each topic;
(C) recording unit records counts and write down each inscription of the cover case when accomplishing all exercise questions; And
(D) the score unit determines one to represent testee's the test score that guesses questions tendency according to the relational expression of answer number of times.
The object of the invention and solve its technical matters and also can adopt following technical measures further to realize.
Preferably; According to a preferred embodiment of the present invention; Aforesaid electronics testing method; The unit of setting a question of wherein said step (A) provides several exercise questions of Hidden Figure Test recreation, and the Hidden Figure Test recreation supplies to determine whether a testee belongs to place dependent form, and step (D) is tending towards guessing questions tendency Gao Zhewei and belongs to place dependent form.
The present invention compared with prior art has tangible advantage and beneficial effect.Know by above,, the invention provides a kind of electronics test system and method that improves electronics test result confidence level for achieving the above object.
First kind of kenel of electronics test system of the present invention comprises the unit of setting a question, a computing unit, a record cell and a score unit.The unit of setting a question provides several exercise questions to answer to a testee; Computing unit comprises that first timer that just picks up counting and that begins to set a question is in order to second timer of testee to each time answer time timing; Record cell is recorded as the total answer time according to the timing of first timer, when receiving a testee to the answer of each topic according to second timer to each time answer time timing, and when all exercise questions of completion, write down each inscription of the cover case.Each inscription of the cover case of score unit comparison and correct option to be determining one to answer questions the topic number, and according to the ratio of each time answer time and total answer time and answer questions the relational expression of inscribing number and determine one to represent testee's the test score that guesses questions tendency.
Corresponding to aforementioned first kind of electronics test system, electronics testing method of the present invention comprises following step: the unit of (A) setting a question provides several exercise questions to answer to a testee; (B) computing unit begins to set a question in the unit of setting a question and just picks up counting and to each time answer time timing; When (C) when accomplishing all exercise questions, writing down each inscription of the cover case, record cell is recorded as the total answer time according to the timing of first timer, and is recorded as each time answer time according to the timing of second timer; (D) each inscription of the cover case of score unit comparison and correct option to be determining one to answer questions the topic number, and according to the ratio of each time answer time and total answer time and answer questions the relational expression of inscribing number and determine one to represent testee's the test score that guesses questions tendency.
The characteristics that second kind of kenel of electronics test system of the present invention is different from first kind of kenel are: computing unit comprises the timer that begins to set a question and pick up counting a unit of setting a question, and one in order to the counter of testee to the answer number of times metering of each topic; The counts of recording unit records counter, and write down each inscription of the cover case when accomplishing all exercise questions; The score unit determines one to represent testee's the test score that guesses questions tendency according to the relational expression of answer number of times.
Corresponding to the electronics test system of aforementioned second kind of kenel, electronics testing method of the present invention comprises following step: the unit of (A) setting a question provides several exercise questions to answer to a testee; (B) computing unit begins just to the answer number of times metering of testee to each topic in test; (C) recording unit records counts and write down each inscription of the cover case when accomplishing all exercise questions; And (D) the score unit determines one to represent testee's the test score that guesses questions tendency according to the relational expression of answer number of times.
The characteristics that the third kenel of electronics test system of the present invention is different from first kind of kenel and second kind of kenel are: computing unit comprises once the unit of setting a question begin to set a question first timer that picks up counting, second timer of a pair of each time answer time timing, and the counter of the answer number of times metering of a pair of each topic; Record cell according to the timing of first timer be recorded as the total answer time, when receiving a testee to the answer of each topic according to second timer to each time answer time timing, and when all exercise questions of completion, write down each inscription of the cover case; Each inscription of the cover case of score unit comparison and correct option to be determining one to answer questions the topic number, and according to ratio, the answer number of times of each time answer time and total answer time and answer questions the relational expression of inscribing number and determine one to represent testee's the test score that guesses questions tendency.
By technique scheme, electronics test system of the present invention and method have advantage at least:
The beneficial effect of electronics test system of the present invention and method is; Not merely distinguish experimenter's cognitive kenel always to assign to; But whether accurate, also can avoid testee's wheel and deal if doping test result with the relational expression between answer number of times or each time answer time and total answer time or the total points.
In sum, the invention relates to a kind of electronics test system and method, this electronics test system comprises the unit of setting a question, a computing unit, a record cell and a score unit; The unit of setting a question provides several exercise questions to answer to a testee; Computing unit comprises set a question at the beginning first timer that just picks up counting and second timer of a pair of each time answer time timing; Record cell is recorded as the total answer time according to the timing of first timer, when the answer that receives each topic according to second timer to each time answer time timing, and when all exercise questions of completion, write down each inscription of the cover case; Score unit each inscription of the cover case of comparison and correct option are to determine one to answer questions the topic number; And determine one represent testee's the test score that guesses questions tendency with the relational expression of answering questions the topic number according to the ratio of each time answer time and total answer time, improve the confidence level of testting by this.
The present invention has obvious improvement technically, and has tangible good effect, really is the new design of a novelty, progress, practicality.
Above-mentioned explanation only is the general introduction of technical scheme of the present invention; Understand technological means of the present invention in order can more to know; And can implement according to the content of instructions, and for let of the present invention above-mentioned with other purposes, feature and advantage can be more obviously understandable, below special act preferred embodiment; And conjunction with figs., specify as follows.
Description of drawings
Fig. 1 is the system block diagrams of the preferred embodiment of electronics test system of the present invention and method.
Fig. 2 is the synoptic diagram of the game picture of Hidden Figure Test on the line.
Fig. 3 is the synoptic diagram of exercise picture of Fig. 2 " simple and easy version " " exercise ".
Fig. 4 is the synoptic diagram of exercise question picture of Fig. 2 " simple and easy version " " test topic ".
Fig. 5 is the synoptic diagram of test result picture of Fig. 2 " simple and easy version " " test topic ".
Fig. 6 is the synoptic diagram of the test result picture of Fig. 2 " exercise " of " advancing the rank version ".
Fig. 7 is the process flow diagram of the preferred embodiment of electronics testing method of the present invention.
Fig. 8 is the process flow diagram of the substep of the electronics test system of Fig. 7 when carrying out answer.
Embodiment
Reach technological means and the effect that predetermined goal of the invention is taked for further setting forth the present invention; Below in conjunction with accompanying drawing and preferred embodiment; To electronics test system and its embodiment of method, structure, method, step, characteristic and the effect thereof that proposes according to the present invention, specify as after.
Relevant aforementioned and other technology contents, characteristics and effect of the present invention can clearly appear in the following detailed description that cooperates with reference to graphic preferred embodiment.Explanation for ease, in following embodiment, components identical is represented with identical numbering.
Below in conjunction with accompanying drawing and embodiment the present invention is elaborated:
What need explanation in advance is; The following electronics testing method of carrying adopts each time answer time and the ratio of total answer time and the relational expression decision testee's who answers questions the topic number the tendency that guesses questions; Reach according to the answer number of times and answer questions the tendency that guesses questions that the relational expression of inscribing number determines the testee; The relationship of the two formula is out of the ordinary the use or comprehensive the use, all belongs to the category of institute of the present invention desire protection.
Consult Fig. 1, preferred embodiment of the present invention is to carry out the line subtest method that powers at an electronics test system 1, and electronics test system 1 comprises a control module 2, a storage module 3 and a communication device 4; Electronics test system 1 is a servomechanism; Communication device 4 is networking interface cards; In order to transmit data each other by a communication network 7 with a use side 5 (desktop or portable computer); Control module 2 is in order to control each element coordinate operation, and storage module 3 is in order to the code name that stores at least one testee 6, the related data of playing number of times, test result.
Control module 2 comprises the unit 21 of setting a question, a computing unit 22, a record cell 23 and a score unit 24.
The unit 21 of setting a question can be processed into one with test item and selects picture 52 (like Fig. 2) on the screen 51 of use side 5, to appear, and mainly provides several exercise questions and supplies testee 6 to answer.
There are two kinds of point systems score unit 24; The first each inscription of the cover case of comparison and correct option are to determine one to answer questions the topic number; And determine a test score according to the relational expression of " each time answer time with total answer time ratio " and " answer questions and inscribe number ", and fraction representation testee 6 guess questions tendency; It two also is that comparison each inscription of the cover case and correct option are answered questions the topic number with decision, but determines a test score according to the relational expression of " answer number of times " and " answer questions and inscribe number ", and mark can be represented testee 6 the tendency that guesses questions equally.
This preferred embodiment provides several exercise questions of Hidden Figure Test recreation; The Hidden Figure Test recreation supplies testee's 6 test back decisions whether to belong to place dependent form; It is selected picture 52 (like Fig. 2) to divide into " simple and easy version " according to different complexities and reach " advancing the rank version ", and " simple and easy version " reach " advancing the rank version " and all provide " exercise " to reach " test topic " confession testee 6 to drill.
Consult Fig. 2 and Fig. 3, and cooperate Fig. 1, when testee 6 practises picture 54a in selecting picture 52 to select " exercise " just to produce one, practise picture 54a and have a timing reminding 541, timing reminding 541 supplies to show and countdowns; The diagram that the option A-E of upper area 542 is corresponding different respectively; Testee 6 needs the drawing of inherent at the fixed time lower zone 543 to find out the diagram option of ensconcing the inside; When arriving the schedule time; The time of test just, the timing reminding 541 of exercise picture 54b can show " time end " when finishing, and the diagram 544 of demonstration correct option option is given user's reference.
Consult Fig. 4; And cooperate Fig. 1 and Fig. 2, when testee 6 when selecting picture 52 to select " the test topic " of " simple and easy version ", just produce the test picture 55 of " simple and easy edition "; Test picture 55 has a timing reminding 551, and timing reminding 551 supplies to show countdowning between total test period; The diagram that the option A-E of upper area 552 is corresponding different respectively, the diagram option that testee 6 needs the drawing of inherent at the fixed time lower zone 553 to find out to ensconce the inside be the person why.Similarly, when testee 6 when selecting picture 52 to select " the test topic " of " advancing the rank version ", also can produce the picture that is similar to test picture 55, the difference just drawing of " advancing the rank version " can be comparatively complicated and be difficult for finding out the diagram inside ensconcing.
Consult Fig. 5; When the test arrival schedule time of " simple and easy version "; When the time of test just finished, test picture 55 tops showed a record material 554, comprise testee 6 account number, playtime, recreation number of times, answer questions/answer wrong topic number and version; The below then shows a test result 555, comprises exercise question, correct option, player's answer originally and whether answers questions and give testee's 6 references.
Consult Fig. 6; After the test of accomplishing " advancing the rank version "; Test picture 56 tops also can displayed record data 561; Comprise testee 6 account number, playtime, recreation number of times, answer questions/answer wrong topic number and version, the below also shows test result 562, comprises exercise question, correct option, player's answer originally and whether answers questions and give testee's 6 references.
Consult Fig. 7, after testee 6 selects to get into the test of " simple and easy version " or " advancing the rank version ", first timer 221 pick up counting (step 201); Then, testee 6 carries out answer (step 202), does continuing judge whether to arrive the schedule time (step 203)? If arrive the schedule time, then export score result's (step 204).
The process that aforementioned testee 6 carries out answer (step 202), the substep explanation that system carries out as follows.
Consult Fig. 8, the substep of step 202 comprises: n road exercise question is provided, and n=1 to k (step 501) supplies the input answer; Second timer 221 picks up counting (step 502), judge whether answer (step 503)? If each time answer time and number of times (step 504) are then write down in answer; If n=k; Represent answer to accomplish, judge and answer questions topic number (step 505), and with the ratio (t/T) and the relational expression decision mark (step 506) of answering questions topic number of each time answer time t with total answer time T; Or according to answer number of times and the relational expression decision mark (step 507) of answering questions the topic number; Record score result's (step 508), and the score result just representes testee 6 the tendency that guesses questions.
In the step 506, each time answer time t is the calculating formula of a discrete value in this than embodiment with the relational expression of answering questions the topic number with the ratio (t/T) of total answer time T, and the calculating formula of discrete value is: 1-[[(n ∑ (di/D)
2)-1]/n-1]; Total answer time of D=wherein; Di=answer at every turn the institute take time (each time answer time); To totally 2 groups of mistakes, so n=topic number * 2.
Discrete value is a numeral between 0-1; Discrete value has different influences according to the time of the number of times of answering, each cost; Because cognitive kenel for the people of " place dependence " be subject to arround the interference of situation, so there is the tendency that has a guess at the answer and constantly do change in regular meeting, this behavior pattern will cause discrete values bigger; Therefore discrete values also can be as a parameter of distinguishing the cognitive kenel of experimenter except learning testee's the tendency that guesses questions.
In this preferred embodiment, answer questions topic number=PTS, and be comprehensively to calculate a test score with PTS, answer number of times, discrete value; Its computing formula is: test score=a+b1 * (PTS)+b2 * (answer number of times)+b3 * (discrete value), a, b1; B2, b 3 all are constants, mainly are that data from a plurality of testees' statistical data storehouse converts and obtains having a; B1, b2, b3 parameter relationship.Just only need to collect the data of representing colony, just can estimate out a, b1, b2, these constants of b3.
For instance: if the data of total a plurality of users' (representing a colony) PTS, answer number of times and discrete value in the data bank; If represent the relation of these user's test scores and PTS, answer number of times and discrete value with an equation; Can known PTS, answer number of times and discrete value substitution equation be obtained unknown a; B1, b2, b3 parameter; As long as know the arbitrary user's of colony PTS, answer number of times and discrete value afterwards, just can estimate user's test score with this equation.
In sum; Electronics test system of the present invention and method mainly are to answer number of times (because of a topic may be done the action of repeatedly changing answer; So not only answer once), the relational expression of the ratio (discrete value) of each time answer time and total answer time and total points makes the whether classification of place dependent form, therefore, the beneficial effect of electronics test system of the present invention and method is; Not merely distinguish experimenter's cognitive kenel always to assign to; But whether accurate, also can avoid testee's wheel and deal, so can reach the object of the invention really if doping test result with the relational expression between answer number of times or each time answer time and total answer time or the total points.
The above only is preferred embodiment of the present invention, is not the present invention is done any pro forma restriction; Though the present invention discloses as above with preferred embodiment; Yet be not in order to limiting the present invention, anyly be familiar with the professional and technical personnel, in not breaking away from technical scheme scope of the present invention; When the method for above-mentioned announcement capable of using and technology contents are made a little change or be modified to the equivalent embodiment of equivalent variations; In every case be the content that does not break away from technical scheme of the present invention, to any simple modification, equivalent variations and modification that above embodiment did, all still belong in the scope of technical scheme of the present invention according to technical spirit of the present invention.
Claims (10)
1. electronics test system, comprise one provide several exercise questions to answer to a testee the unit of setting a question; It is characterized in that: said electronics test system also comprises:
One computing unit comprises:
One first timer, the unit of setting a question begin to set a question and just pick up counting; And
One second timer is to each time answer time timing;
One record cell, according to the timing of first timer be recorded as the total answer time, when the answer that receives each topic according to second timer to each time answer time timing, and when all exercise questions of completion, write down each inscription of the cover case; And
One score unit determines one to represent testee's the test score that guesses questions tendency according to the ratio of each time answer time and total answer time with the relational expression of answering questions the topic number.
2. electronics test system as claimed in claim 1; It is characterized in that the wherein said unit of setting a question provides several exercise questions of Hidden Figure Test recreation; Hidden Figure Test recreation supplies to determine whether a testee belongs to place dependent form, and the score unit judges is tending towards guessing questions tendency Gao Zhewei and belongs to place dependent form.
3. electronics test system, comprise one provide several exercise questions to answer to a testee the unit of setting a question; It is characterized in that: said electronics test system also comprises:
One computing unit comprises:
One timer, the unit of setting a question begin to set a question and just pick up counting, and
One counter is to the answer number of times metering of each topic;
One record cell, the counts of recording counter, and write down each inscription of the cover case when accomplishing all exercise questions; And
Each inscription of the cover case and correct option are compared determining one to answer questions the topic number in one score unit, and comprise that according to one answer number of times and the relational expression of answering questions the topic number determine one to represent testee's the test score that guesses questions tendency.
4. electronics test system as claimed in claim 3; It is characterized in that the wherein said unit of setting a question provides several exercise questions of Hidden Figure Test recreation; Hidden Figure Test recreation supplies to determine whether a testee belongs to place dependent form, and the score unit judges is tending towards guessing questions tendency Gao Zhewei and belongs to place dependent form.
5. electronics test system, comprise one provide several exercise questions to answer to a testee the unit of setting a question; It is characterized in that: said electronics test system also comprises:
One computing unit comprises once the unit of setting a question begin to set a question first timer that picks up counting, second timer of a pair of each time answer time timing, and the counter of the answer number of times metering of a pair of each topic;
One record cell, according to the timing of first timer be recorded as the total answer time, when receiving a testee to the answer of each topic according to second timer to each time answer time timing, and when all exercise questions of completion, write down each inscription of the cover case; And
Each inscription of the cover case and correct option are compared determining one to answer questions the topic number in one score unit, and determine one to represent testee's the test score that guesses questions tendency according to ratio, the answer number of times of each time answer time and total answer time with the relational expression of answering questions the topic number.
6. electronics test system as claimed in claim 5, when it is characterized in that the wherein said unit of setting a question provides n road exercise question, the relational expression of said score unit foundation equals for calculating a discrete value
1-[[(n ∑ (di/D)
2)-1]/n-1], D wherein is that total answer time and di are each time answer time; And said score unit calculates and answers questions topic number=PTS, test score=a+b1 * (PTS)+b2 * (answer number of times)+b3 * (discrete value), and a wherein, b1, b2, b3 are constants.
7. electronics testing method, one comprise the unit of setting a question, a computing unit, a record cell and a score unit electronic system carry out;
It is characterized in that: said electronics testing method comprises following step:
(A) unit of setting a question provides several exercise questions to answer to a testee;
(B) computing unit begins to set a question in the unit of setting a question and just picks up counting, and to each time answer time timing;
(C) when accomplishing all exercise questions, write down each inscription of the cover case, record cell is recorded as the total answer time according to the timing of first timer, and is recorded as each time answer time according to the timing of second timer;
(D) each inscription of the cover case of score unit comparison and correct option to be determining one to answer questions the topic number, and according to the ratio of each time answer time and total answer time and answer questions the relational expression of inscribing number and determine one to represent testee's the test score that guesses questions tendency.
8. electronics testing method as claimed in claim 7, the relational expression that it is characterized in that wherein said step (D) foundation are 1-[[(n ∑ (di/D)
2)-1]/n-1],
D wherein is that total answer time, di are each time answer time, and n is an exercise question quantity.
9. electronics testing method, one comprise the unit of setting a question, a computing unit, a record cell and a score unit electronic system carry out;
It is characterized in that: said electronics testing method comprises following step:
(A) unit of setting a question provides several exercise questions to answer to a testee;
(B) computing unit in test beginning just to the answer number of times metering of each topic;
(C) recording unit records counts and write down each inscription of the cover case when accomplishing all exercise questions; And
(D) the score unit determines one to represent testee's the test score that guesses questions tendency according to the relational expression of answer number of times.
10. electronics testing method as claimed in claim 9; The unit of setting a question that it is characterized in that wherein said step (A) provides several exercise questions of Hidden Figure Test recreation; Hidden Figure Test recreation supplies to determine whether a testee belongs to place dependent form, and step (D) is tending towards guessing questions tendency Gao Zhewei and belongs to place dependent form.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010274897.9A CN102385807B (en) | 2010-09-06 | 2010-09-06 | Electronic detection system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010274897.9A CN102385807B (en) | 2010-09-06 | 2010-09-06 | Electronic detection system and method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102385807A true CN102385807A (en) | 2012-03-21 |
| CN102385807B CN102385807B (en) | 2015-03-25 |
Family
ID=45825187
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010274897.9A Expired - Fee Related CN102385807B (en) | 2010-09-06 | 2010-09-06 | Electronic detection system and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102385807B (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103440792A (en) * | 2013-09-13 | 2013-12-11 | 大连联达科技有限公司 | System for helping teacher to evaluate mastering level of students on knowledge points |
| CN104462122A (en) * | 2013-09-18 | 2015-03-25 | 国家电网公司 | Test question data processing method and device |
| CN105336234A (en) * | 2014-08-15 | 2016-02-17 | 王昊 | Electronic question choosing method |
| CN106558258A (en) * | 2015-09-24 | 2017-04-05 | 财团法人资讯工业策进会 | System and method for truly reflecting ability of testee through online test |
| CN106560874A (en) * | 2015-10-02 | 2017-04-12 | 洪荣昭 | Electronic test system and answering device |
| CN107910059A (en) * | 2017-10-18 | 2018-04-13 | 中山大学 | A kind of language ability obstacle hierarchy system and its implementation |
| CN108829839A (en) * | 2018-06-19 | 2018-11-16 | 精硕科技（北京）股份有限公司 | Verification method, device, storage medium and the processor of credibility of sample's |
| CN109299859A (en) * | 2018-08-31 | 2019-02-01 | 深圳市天英联合教育股份有限公司 | Evaluating method, device, equipment and the storage medium of data |
| CN110400030A (en) * | 2018-04-24 | 2019-11-01 | 中国移动通信集团有限公司 | A kind of assessment method and system, storage medium handling dynamic problem ability |
| TWI789234B (en) * | 2022-02-08 | 2023-01-01 | 十八豆教育科技有限公司 | System for evaluating learning effect |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060029920A1 (en) * | 2002-04-03 | 2006-02-09 | Bruno James E | Method and system for knowledge assessment using confidence-based measurement |
| CN101515410A (en) * | 2009-03-27 | 2009-08-26 | 重庆市第四十二中学校 | Examination system |
-
2010
- 2010-09-06 CN CN201010274897.9A patent/CN102385807B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060029920A1 (en) * | 2002-04-03 | 2006-02-09 | Bruno James E | Method and system for knowledge assessment using confidence-based measurement |
| CN101515410A (en) * | 2009-03-27 | 2009-08-26 | 重庆市第四十二中学校 | Examination system |
Non-Patent Citations (1)
| Title |
|---|
| 吴斌新: "基于决策树的CAI测试软件的设计与实现", 《中国远程教育》 * |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103440792A (en) * | 2013-09-13 | 2013-12-11 | 大连联达科技有限公司 | System for helping teacher to evaluate mastering level of students on knowledge points |
| CN104462122A (en) * | 2013-09-18 | 2015-03-25 | 国家电网公司 | Test question data processing method and device |
| CN105336234A (en) * | 2014-08-15 | 2016-02-17 | 王昊 | Electronic question choosing method |
| CN106558258A (en) * | 2015-09-24 | 2017-04-05 | 财团法人资讯工业策进会 | System and method for truly reflecting ability of testee through online test |
| CN106560874A (en) * | 2015-10-02 | 2017-04-12 | 洪荣昭 | Electronic test system and answering device |
| CN107910059A (en) * | 2017-10-18 | 2018-04-13 | 中山大学 | A kind of language ability obstacle hierarchy system and its implementation |
| CN110400030A (en) * | 2018-04-24 | 2019-11-01 | 中国移动通信集团有限公司 | A kind of assessment method and system, storage medium handling dynamic problem ability |
| CN108829839A (en) * | 2018-06-19 | 2018-11-16 | 精硕科技（北京）股份有限公司 | Verification method, device, storage medium and the processor of credibility of sample's |
| CN109299859A (en) * | 2018-08-31 | 2019-02-01 | 深圳市天英联合教育股份有限公司 | Evaluating method, device, equipment and the storage medium of data |
| TWI789234B (en) * | 2022-02-08 | 2023-01-01 | 十八豆教育科技有限公司 | System for evaluating learning effect |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102385807B (en) | 2015-03-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102385807A (en) | Electronic detection system and method | |
| CN109801525B (en) | Teacher-student multidimensional matching method and system for network teaching | |
| CN106210836B (en) | Interactive learning method and device, terminal device in a kind of video display process | |
| Lan et al. | Behavior-Based Latent Variable Model for Learner Engagement. | |
| US20150310019A1 (en) | Providing an energy target for high energy users | |
| CN108009754A (en) | Method of Teaching Quality Evaluation | |
| US10600018B2 (en) | Data processing systems for processing and analyzing data regarding self-awareness and executive function | |
| CN111444391B (en) | Video learning achievement evaluation method based on artificial intelligence | |
| CN109410675A (en) | A kind of exercise recommended method and private tutor's equipment based on student's portrait | |
| CN107025614A (en) | Teaching efficiency detection method, system and device in a kind of live video | |
| CN107067853A (en) | A kind of network online interaction langue leaning system | |
| CN110059978B (en) | Teacher evaluation system based on cloud computing auxiliary teaching evaluation | |
| CN109656465A (en) | A kind of content acquisition method and private tutor's equipment applied to private tutor's equipment | |
| CN106297459A (en) | A kind of man-machine interaction method based on the content of courses and device, subscriber equipment | |
| CN108876123A (en) | A kind of teaching interference method and device | |
| CN107862024A (en) | The learning method and electronic equipment of a kind of Chinese character | |
| JP5825340B2 (en) | Test execution support device, test execution support method, and test execution support program | |
| Bevan | Is there an optimum speed for presenting text on a VDU? | |
| JP2016148800A (en) | Learning support system, learning support server, learning support program, and learning support method | |
| CN109830282A (en) | Scene training data processing method and processing device | |
| CN108664842B (en) | Lip movement recognition model construction method and system | |
| Çisar et al. | Computer adaptive testing for student's knowledge in C++ exam | |
| JP5283059B2 (en) | Friendship guessing system | |
| CN111612659B (en) | Automatic scoring system and scoring method for online financial examination | |
| CN109146737B (en) | Intelligent interaction method and device based on examination platform |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150325 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |