CN102360083B - Method for removing belt artifacts in images for line scanning X-ray security inspection equipment - Google Patents
Method for removing belt artifacts in images for line scanning X-ray security inspection equipment Download PDFInfo
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- CN102360083B CN102360083B CN 201110240462 CN201110240462A CN102360083B CN 102360083 B CN102360083 B CN 102360083B CN 201110240462 CN201110240462 CN 201110240462 CN 201110240462 A CN201110240462 A CN 201110240462A CN 102360083 B CN102360083 B CN 102360083B
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Abstract
The invention provides a method for removing belt artifacts in images for line scanning X-ray security inspection equipment, wherein a method for dynamically calibrating objects to be inspected one bag by one bag on basis of an optoelectronic switch trigger mode is adopted, that is to say, an optoelectronic switch is triggered when a bag enters a channel each time and then a time-based signal is produced to control the start of an X-ray and the motions such as collection of a detector. After the X-ray is started up, saturated data is immediately collected; and after the bag gets out of the channel and the X-ray is closed, background data is immediately collected and then a new calibration parameter is calculated through a calibration algorithm. Repeating in this way, any part of a belt can be calibrated so as to avoid belt artifacts in images, thereby solving the problem of image artifacts caused by incapability of correcting the state of the current belt through the calibration parameter when the belt of the X-ray security inspection equipment is deviated or the edge of the belt is irregular.
Description
Technical field
The present invention relates to a kind of image calibration technology of X-ray security inspection machine, particularly relate to and a kind ofly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow.
Background technology
The invention of X-ray security inspection machine and the safety precaution of using fields such as customs, aviation, communications and transportation play an important role.Shine the formula X-ray security inspection machine take the bottom as example.Radiographic source is assemblied in device bottom, and X-ray penetrates through belt (also claiming travelling belt or conveyer belt) from the below, then passes the finally imaging on the line sweep detector at equipment top of object that moves on belt.Because the each scanning of line sweep detector can only obtain object in a slice image data at current scanning position place, when belt drags object and at the uniform velocity moves, just can be by the complete image that is spliced to form to every row view data.
Because the line sweep detector of X-ray security inspection machine is connected in series by a lot of piece detector modules.Each module even photosensitive-member on each module can cause light sensitivity inconsistent due to the technique difference, that is to say the x-ray bombardment that receives with dosage, the output voltage that obtains is also inconsistent, thereby, it when starting shooting each time, described X-ray security inspection machine will carry out the primary calibration operation to image, so that can detect violated or dangerous goods accurately.
Traditional X-ray security inspection machine is because travelling belt long-term work meeting causes the wearing and tearing of belt periphery, even belt deviation.At this moment, in the time of scan image, screen is the pseudo-shadow that irregular belt edge causes to occur, and has affected the sharpness of detected parcel image.Trace it to its cause is because along with working time of system lengthens, for example the belt became uneven is even and burr occurs in the belt edge wearing and tearing, perhaps temperature causes the background data drift, and job insecurity causes the factors such as saturated data drift all can have influence on background data and saturated data, thereby causes gain parameter can not in time reflect the variation of system.
In the prior art, because traditional X-ray security inspection machine only carries out the primary calibration operation to image when starting shooting.Therefore, when belt deviation or edge irregularity, calibration parameter can not be revised current belt state automatically, has occurred pseudo-shadow in the image that causes showing, and then has influence on Security Officer's judgement, and the work of safety precaution has been brought hidden danger.
Summary of the invention
The shortcoming of prior art in view of the above, the object of the present invention is to provide and a kind ofly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, to solve X-ray security inspection machine of the prior art when belt deviation or the edge irregularity, calibration parameter can not be revised current belt state automatically, occurs the problem of pseudo-shadow in the image that causes showing.
reach for achieving the above object other relevant purposes, the invention provides and a kind ofly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, described X-ray-scanning images of object screening machine comprises at least, frame, be arranged at the detection darkroom on described frame, the described detection of approach darkroom is for delivery of the belt of article to be checked, be arranged on described detection darkroom and be positioned at the x-ray source of described belt one side, be arranged on described detection darkroom and be positioned at the scan detector of described belt opposite side, be arranged on porch, described detection darkroom in order to control the optoelectronic switch of described x-ray source, be arranged on display and central control unit on described frame, it is characterized in that, said method comprising the steps of: 1) start, gather initial background data and initial saturated data, and calculate one group of initial gain factor, to generate a current calibration rule, 2) when described optoelectronic switch is blocked by described article to be checked, open described x-ray source after time-delay the first Preset Time, then, open described scan detector after time-delay the second Preset Time, gather and upgrade saturated data, 3) judge whether described optoelectronic switch is still blocked by described article to be checked, if according to described current calibration rule, the view data of scanning is calibrated, and splicing is shown by column, if not, close described scan detector after the 3rd Preset Time of delaying time, then, close described x-ray source after time-delay the 4th Preset Time, again open described scan detector after time-delay the 5th Preset Time, gather and upgrade background data, and 4) calculate one group according to the saturated data of described renewal and described renewal background data and upgrade gain coefficient, and upgrade described current calibration rule according to described renewal gain coefficient, and be back to step 2), according to the current calibration rule after this renewal, view data is being calibrated in scanning operation next time.
In the method for the invention, described scan detector includes a plurality of detector modules, and respectively has a plurality of sensitivity specks in this detector module.In concrete embodiment, the sensitivity speck in described scan detector is n, and wherein a sensitivity speck is designated as i, and described renewal background data is designated as V
Off i(i=1,2,3 ... .n); The saturated data of described renewal are designated as V
On i(i=1,2,3 ... .n); Described renewal gain coefficient is G
i=2
x/ (V
On i-V
Off i), (i=1,2,3 ... n); And the current calibration rule after described renewal is V
Real i=(V
i-V
Off i) * G
i, (i=1,2,3 ... n); Wherein, x is the AD precision figure place of described scan detector, V
iActual voltage value for this sensitivity speck i.
In the method for the invention, the time of the described initial saturated data of collection or the saturated data of described renewal is not more than 20ms; The time that gathers described initial background data or described renewal background data is not more than 20ms.
In the method for the invention, the time-delay starting point of described the first Preset Time and the second Preset Time is the moment that described optoelectronic switch is blocked by described article to be checked, and described the second Preset Time is greater than described the first Preset Time.Described the 3rd Preset Time, the 4th Preset Time, and the time-delay starting point of the 5th Preset Time be to judge the moment that described optoelectronic switch is not blocked by described article to be checked, and described the 5th Preset Time greater than described the 4th Preset Time greater than described the 3rd Preset Time.
As mentioned above, of the present inventionly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, adopted the method that article to be checked are carried out packet-by-packet dynamic calibration based on the optoelectronic switch triggering mode, namely trigger optoelectronic switch after each parcel admission passage, and control the actions such as X ray switching and detector collection as time-base signal.Carry out the saturation degree collection after X ray is opened, carry out again the background data collection when parcel rolls the passage X ray away from and cuts out, and then calculate new calibration parameter by calibration algorithm.Go down and so forth and just can carry out calibration process to any position of belt, stopped to occur in the image phenomenon of the pseudo-shadow of belt, and then solved in prior art, when belt deviation or edge irregularity, calibration parameter can not automatically be revised current belt state but cause the problem of image artifacts.
Description of drawings
Fig. 1 is shown as the present invention and is applied to the peeling of image in the X-ray-scanning images of object screening machine with the method flow diagram of pseudo-shadow.
Fig. 2 is shown as the present invention and is applied to the peeling of image in the X-ray-scanning images of object screening machine with the particular flow sheet of step S10 in the method for pseudo-shadow.
Fig. 3 is shown as the present invention and is applied to the peeling of image in the X-ray-scanning images of object screening machine and implements sequential chart with the dynamic calibration of the method for pseudo-shadow.
Embodiment
Below by specific instantiation explanation embodiments of the present invention, those skilled in the art can understand other advantages of the present invention and effect easily by content disclosed in the present specification.The present invention can also be implemented or be used by other different embodiment, and the every details in this instructions also can be based on different viewpoints and application, carries out various modifications or change under spirit of the present invention not deviating from.
See also Fig. 1, be shown as and of the present inventionly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method flow diagram of pseudo-shadow.Need to prove, the diagram that provides in the present embodiment only illustrates basic conception of the present invention in a schematic way, satisfy only show in graphic with the present invention in relevant assembly but not component count, shape and size drafting when implementing according to reality, during its actual enforcement, kenel, quantity and the ratio of each assembly can be a kind of random change, and its assembly layout kenel also may be more complicated.
the invention provides and a kind ofly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, described X-ray-scanning images of object screening machine comprises at least, frame, be arranged at the detection darkroom on described frame, the described detection of approach darkroom is for delivery of the belt of article to be checked (such as parcel and luggage etc.), be arranged on described detection darkroom and be positioned at the x-ray source of described belt one side, be arranged on described detection darkroom and be positioned at the scan detector of described belt opposite side, be arranged on porch, described detection darkroom in order to control the optoelectronic switch of described x-ray source, be arranged on the display on described frame, and in order to control the central control unit of above-mentioned each module operation.
Need to prove, because said modules is the necessary assembly that X-ray security inspection machine is realized its function, and of the present inventionly focus on providing a kind of and be applied in the X-ray-scanning images of object screening machine image peeling with the method for pseudo-shadow, thereby in the present embodiment, each assembly in described X-ray-scanning images of object screening machine will no longer be drawn diagram, hereby state clearly.
In addition, the technology contents of putting down in writing below for easy to understand, still it should be noted that, in X-ray security inspection machine of the present invention, x-ray source on-off action and image display action and time-delay are controlled all and are controlled by described central control unit, the on-off action of described optoelectronic switch is to be triggered by the article to be checked through described detection darkroom entrance, thereby the signal after triggering is also to pass to described central control unit to cause corresponding operation.
In the present invention, described optoelectronic switch only describes with the example that act as of a trigger signal generator, but be not limited to this, other functions of described optoelectronic switch will not be given unnecessary details one by one such as the effect that article to be checked (such as parcel and luggage etc.) are counted etc.
Described scan detector includes a plurality of detector modules, and respectively has a plurality of sensitivity specks (also claiming pixel) in this detector module.In the present embodiment, the sensitivity speck in described scan detector is n, and wherein a sensitivity speck is designated as i, i=1,2,3 ... .n.For example take the detector of 12 AD precision as example, the sensitivity speck in described scan detector is 4096, is 4096 grades of gray scales.
See also Fig. 1 and Fig. 2, Fig. 1 is shown as the present invention and is applied to the peeling of image in the X-ray-scanning images of object screening machine with the method flow diagram of pseudo-shadow; Fig. 2 is shown as the present invention and is applied to the peeling of image in the X-ray-scanning images of object screening machine with the particular flow sheet of step S10 in the method for pseudo-shadow.As shown in the figure, the present invention is applied to the peeling of image in the X-ray-scanning images of object screening machine and comprises the following steps with the method for pseudo-shadow:
At first execution in step S10, start shooting, and gathers initial background data and initial saturated data, and calculate one group of initial gain factor, to generate a current calibration rule.In the present embodiment, described step S10 comprises the following steps:
At first execution in step S101, start shooting.Follow execution in step S102.
In step S102, open described scan detector, each sensitivity speck to each detector module in described scan detector carries out the primary voltage data acquisition, with the voltage data of each sensitivity speck of obtaining as initial background data, in concrete implementation process, the x-ray source of this moment is closed condition, described scan detector is once sampled to each sensitivity speck in modules (perhaps being pixel), be provided with n sensitivity speck, the voltage data that obtains is called initial background data, and namely scan detector is in the output that does not have under the X-ray irradiation.Described initial background data is designated as:
V
Off?i(i＝1，2，3….n)；
In concrete implementation process, the time that gathers described initial background data is not more than 20ms.What described initial background data reflected is that scan detector is at the components and parts noise data that does not receive under any irradiation.Follow execution in step S103.
In step S103, open described x-ray source, each sensitivity speck of each detector module in described scan detector is carried out the primary voltage data acquisition again, with the voltage data of each sensitivity speck of obtaining as initial saturated data.In concrete implementation process, open described x-ray source, modules is once sampled again, and the voltage data that obtains is called initial saturated data, and namely scan detector is opened under condition and the middle output voltage that obtains when blocking without any object at x-ray source.Described initial saturated data are designated as:
V
on?i(i＝1，2，3…n)
In concrete implementation process, the time that gathers described initial saturated data is not more than 20ms.What described initial saturated data reflected is the output response of each sensitivity speck maximum on detector.Follow execution in step S104.
In step S104, calculate one group of initial gain factor according to described initial background data and described initial saturated data, to generate a current calibration rule.Particularly, be for each the sensitivity speck calculated gains value on each module.Be designated as:
G
i=2
x/ (V
On i-V
Off i), (i=1,2,3 ... n), wherein, x is the AD precision figure place of described scan detector, and due in the present embodiment, for example take the detector of 12 AD precision as example, the sensitivity speck in described scan detector is 4096 (namely 2
12),
G
i＝4096/(V
on?i-V
Off?i)，(i＝1，2，3…n)；
That is to say, calculate under current environment, the amplitude that namely under temperature, belt, x-ray source state, each sensitivity speck need to be revised.
In the present embodiment, described current calibration rule converts by following formula and obtains:
V
Real i=(V
i-V
Off i) * G
i, (i=1,2,3 ... n); Wherein, V
iActual voltage value for this sensitivity speck i.
At this moment, described V
Real iBe exactly the magnitude of voltage that on image, each pixel correction is crossed, then be reflected to by image processing means and carry out gray scale on screen and show.
Follow execution in step S11.
Please coordinate and consult Fig. 3, be shown as the present invention and be applied to the peeling of image in the X-ray-scanning images of object screening machine and implement sequential chart with the dynamic calibration of the method for pseudo-shadow.In step S11, judge whether described optoelectronic switch is blocked by described article to be checked, in other words, namely judge and whether placed article to be checked on described belt (such as parcel and luggage etc.) and sheltered from the light that is transmitted into its receiving end of this optoelectronic switch, if proceed to step S12, if not, return to step S11, continue judgement.
In step S12, time-delay the first described x-ray source of the rear unlatching of preset time T 1, then execution in step S13.
In step S13, time-delay the second described scan detector of the rear unlatching of preset time T 2 gathers and upgrades saturated data, in concrete implementation process, when the described optoelectronic switch of described article to be checked forward position process, optoelectronic switch is namely for the state of being blocked, and it sends a high level signal.Delaying x-ray source through the first preset time T 1 opens.The setting of described the first preset time T 1 is will guarantee described article to be checked forward positions through after described optoelectronic switch, continues to drive to almost the scanning position of proximity test darkroom centre and opens x-ray source again.If article shading light electric switch to be checked is arranged always, x-ray source is just opened, and can waste like this life-span of x-ray source.Thereby, after opening, x-ray source upgrades saturated data through just beginning to open the scan detector collection after second preset time T 2 these time-delays again, continuously carry out scanning collection.In order to allow x-ray source can fully open and stable bright dipping before collection like this.Because opening, each x-ray source all needs to stablize hundreds of millisecond guarantee stabilized intensity.So in the step S12 and S13 of the present embodiment, the time-delay starting point of described the first Preset Time and the second Preset Time is the moment that described optoelectronic switch is blocked by described article to be checked, and described the second Preset Time is greater than described the first Preset Time.
Need to prove, in the present embodiment, do not provide the concrete time value of described the first Preset Time and the second Preset Time, because method of the present invention is applied to specification or detects the passage length in darkroom, or in the different X-ray security inspection machine of the travelling speed of belt the time, can preset according to the applicable cases of reality the concrete numerical value of described the first Preset Time and the second Preset Time.
In the present embodiment, the time of the saturated data of the described renewal of collection is not more than 20ms.The saturated data of described renewal are designated as: V
on i(i=1,2,3 ... n)
Follow execution in step S14.
In step S14, judge whether described optoelectronic switch is still blocked by described article to be checked, if, proceed to step S15, if not, proceed to step S16.
In step S15, according to described current calibration rule, the view data of scanning is calibrated, and splicing is shown by column, and return and continue judgement in step S14.
In step S16, close described scan detector after time-delay the 3rd preset time T 3, then execution in step S17.
In step S17, close described x-ray source after time-delay the 4th preset time T 4, then execution in step S18.
In step S18, again open described scan detector after time-delay the 5th preset time T 5, gather and upgrade background data.In the present embodiment, the time of the described renewal background data of collection is not more than 20ms.Described renewal background data is designated as: V
Off i(i=1,2,3 ... .n).
In concrete implementation process, when judging described optoelectronic switch and do not blocked by described article to be checked, illustrate namely after described article to be checked that along sailing out of optoelectronic switch, it is unimpeded that optoelectronic switch recovers, its output low level signal.After this, described article to be checked also will could thoroughly pass through to detect the scanning position of darkroom central authorities after motion a period of time on belt.Therefore, after the edge is left after described optoelectronic switch detects object, close described scan detector after time-delay the 3rd preset time T 3, then close described x-ray source after the 4th preset time T 4 of delaying time.Close again scan detector and can cause image acquisition close slow and collect the renewal background data if first close x-ray source, cause occurring on image the vertical striped of black.
In the present embodiment, as shown in Figure 3, described the 3rd Preset Time, the 4th Preset Time, and the time-delay starting point of the 5th Preset Time be to judge the moment that described optoelectronic switch is not blocked by described article to be checked, be along sailing out of optoelectronic switch after described article to be checked, it is unimpeded that optoelectronic switch recovers, the moment of its output low level signal.And described the 5th Preset Time greater than described the 4th Preset Time greater than described the 3rd Preset Time.Need to prove, in the present embodiment, do not provide described the 3rd Preset Time, the 4th Preset Time, and the concrete time value of the 5th Preset Time, because method of the present invention is applied to specification or detects the passage length in darkroom, or in the different X-ray security inspection machine of the travelling speed of belt the time, can preset described the 3rd Preset Time, the 4th Preset Time, and the concrete numerical value of the 5th Preset Time according to the applicable cases of reality.
Follow execution in step S19.
In step S19, calculate one group according to the saturated data of described renewal and described renewal background data and upgrade gain coefficient, and upgrade described current calibration rule according to described renewal gain coefficient, in the present embodiment, G
i=2
x/ (V
On i-V
Off i), (i=1,2,3 ... n), wherein, x is the AD precision figure place of described scan detector, and due in the present embodiment, for example take the detector of 12 AD precision as example, the sensitivity speck in described scan detector is 4096 (namely 2
12), the current calibration rule after described renewal is V
Real i, in the present embodiment, the regular V of current calibration after renewal
Real iConvert by following formula and obtain:
Be V
Real i=(V
i-V
Off i) * G
i, (i=1,2,3 ... n); Wherein, V
iActual voltage value for this sensitivity speck i.
At last, be back to step 2), the regular V of current calibration after upgrading according to this in scanning operation next time
Real iView data is calibrated.
As from the foregoing, of the present inventionly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, each article to be checked enter detect the darkroom but when also not arriving scanning position, due to this moment scan line position do not blocked by any object, open x-ray source upgrade fast the saturation degree collection this moment; Detect the darkroom when article to be checked roll away from, once upgrade fast again the collection of background data after x-ray source is closed; The renewal background data that utilization obtains and the saturated data of renewal are again upgraded the Gi gain parameter and are prepared to next article use to be checked.Go down and so forth and just can carry out calibration process to any position of belt, stopped to occur in the image of traditional X-ray security inspection machine the phenomenon of the pseudo-shadow of belt.
In sum, of the present inventionly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, adopted the method that article to be checked are carried out packet-by-packet dynamic calibration based on the optoelectronic switch triggering mode, namely trigger optoelectronic switch after each parcel admission passage, and control the actions such as X ray switching and detector collection as time-base signal.Carry out the saturation degree collection after X ray is opened, carry out again the background data collection when parcel rolls the passage X ray away from and cuts out, and then calculate new calibration parameter by calibration algorithm.Go down and so forth and just can carry out calibration process to any position of belt, stopped to occur in the image phenomenon of the pseudo-shadow of belt, and then solved in prior art, when belt deviation or edge irregularity, calibration parameter can not automatically be revised current belt state but cause the problem of image artifacts.So the present invention has effectively overcome various shortcoming of the prior art and the tool high industrial utilization.
Above-described embodiment is illustrative principle of the present invention and effect thereof only, but not is used for restriction the present invention.Any person skilled in the art scholar all can under spirit of the present invention and category, modify or change above-described embodiment.Therefore, have in technical field under such as and know that usually the knowledgeable modifies or changes not breaking away from all equivalences of completing under disclosed spirit and technological thought, must be contained by claim of the present invention.
Claims (9)
1. one kind is applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, described X-ray-scanning images of object screening machine comprises at least, frame, be arranged at the detection darkroom on described frame, the described detection of approach darkroom is for delivery of the belt of article to be checked, be arranged on described detection darkroom and be positioned at the x-ray source of described belt one side, be arranged on described detection darkroom and be positioned at the scan detector of described belt opposite side, be arranged on porch, described detection darkroom in order to control the optoelectronic switch of described x-ray source, be arranged on display and central control unit on described frame, it is characterized in that, said method comprising the steps of:
1) start, gather initial background data and initial saturated data, and calculate one group of initial gain factor, to generate a current calibration rule;
2) when described optoelectronic switch is blocked by described article to be checked, open described x-ray source after time-delay the first Preset Time, then, open described scan detector after time-delay the second Preset Time, gather and upgrade saturated data;
3) judge whether described optoelectronic switch is still blocked by described article to be checked, if according to described current calibration rule, the view data of scanning is calibrated, and splicing is shown by column; If not, close described scan detector after the 3rd Preset Time of delaying time, then, close described x-ray source after time-delay the 4th Preset Time, again open described scan detector after time-delay the 5th Preset Time, gather and upgrade background data; And
4) calculate one group according to the saturated data of described renewal and described renewal background data and upgrade gain coefficient, and upgrade described current calibration rule according to described renewal gain coefficient, and be back to step 2), according to the current calibration rule after this renewal, view data is being calibrated in scanning operation next time.
2. according to claim 1ly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, it is characterized in that: described scan detector includes a plurality of detector modules, and respectively has a plurality of sensitivity specks in this detector module.
3. according to claim 2ly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, it is characterized in that: the sensitivity speck in described scan detector is n, and wherein a sensitivity speck is designated as i,
Described renewal background data is designated as V
Offi(i=1,2,3 ... .n);
The saturated data of described renewal are designated as V
Oni(i=1,2,3 ... .n);
Described renewal gain coefficient is G
i=2
x/ (V
oni-V
Offi), (i=1,2,3 ... n); And
Current calibration rule after described renewal is V
Reali=(V
i-V
Offi) * G
i, (i=1,2,3 ... n); Wherein, x is described
The AD precision figure place of scan detector, V
iActual voltage value for this sensitivity speck i.
4. according to claim 2ly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, it is characterized in that: in described step 1), comprising:
1-1) start;
1-2) open described scan detector, each sensitivity speck of each detector module in described scan detector carried out the primary voltage data acquisition, with the voltage data of each sensitivity speck of obtaining as initial background data;
1-3) open described x-ray source, each sensitivity speck of each detector module in described scan detector carried out the primary voltage data acquisition again, with the voltage data of each sensitivity speck of obtaining as initial saturated data; And
1-4) calculate one group of initial gain factor according to described initial background data and described initial saturated data, to generate a current calibration rule.
5. according to claim 4ly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, it is characterized in that: the sensitivity speck in described scan detector is n, and wherein a sensitivity speck is designated as i,
Described initial background data is designated as V
Offi(i=1,2,3 ... .n);
Described initial saturated data are designated as V
Oni(i=1,2,3 ... .n);
Described initial gain factor is G
i=2
x/ (V
oni-V
0ffi), (i=1,2,3 ... n); And
Described current calibration rule is V
Reali=(V
i-V
0ffi) * G
i, (i=1,2,3 ... n); Wherein, x is the AD precision figure place of described scan detector, V
iActual voltage value for this sensitivity speck i.
6. according to claim 1ly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, it is characterized in that: the time that gathers described initial saturated data or gather the saturated data of described renewal is not more than 20ms.
7. according to claim 1ly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, it is characterized in that: the time that gathers described initial background data or gather described renewal background data is not more than 20ms.
8. according to claim 1ly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, it is characterized in that: the time-delay starting point of described the first Preset Time and the second Preset Time is the moment that described optoelectronic switch is blocked by described article to be checked, and described the second Preset Time is greater than described the first Preset Time.
9. according to claim 1ly be applied to the peeling of image in the X-ray-scanning images of object screening machine with the method for pseudo-shadow, it is characterized in that: described the 3rd Preset Time, the 4th Preset Time, and the time-delay starting point of the 5th Preset Time be to judge the moment that described optoelectronic switch is not blocked by described article to be checked, and, described the 5th Preset Time is greater than described the 4th Preset Time, and described the 4th Preset Time is greater than described the 3rd Preset Time.
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| CN103051872B (en) * | 2012-12-18 | 2015-08-12 | 青岛科技大学 | Based on the belt deflection detection method of Edge extraction |
| CN103487449B (en) * | 2013-05-27 | 2015-08-19 | 深圳市天和时代电子设备有限公司 | A kind of method of dynamic calibration |
| CN110274923B (en) * | 2019-07-22 | 2020-10-09 | 中国原子能科学研究院 | Synchronous data acquisition and calibration method and control system of high-energy X-ray CT equipment |
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| JP3765155B2 (en) * | 1997-03-28 | 2006-04-12 | コニカミノルタホールディングス株式会社 | Radiation image reader |
| CN1173169C (en) * | 2001-04-12 | 2004-10-27 | 清华大学 | Method for correcting data nonuniformity in radiation imaging system |
| CN2833569Y (en) * | 2005-09-22 | 2006-11-01 | 清华同方威视技术股份有限公司 | Apparatus for performing CT safety detection of liquid by using ray source |
| CN201199235Y (en) * | 2008-05-12 | 2009-02-25 | 丁青 | Novel X-ray channel type safety-check system structure |
| JP5102374B2 (en) * | 2008-06-19 | 2012-12-19 | パナソニック株式会社 | Method and apparatus for moving blur and ghost prevention in an imaging system |
| CN101937093B (en) * | 2009-06-30 | 2013-06-19 | 同方威视技术股份有限公司 | Method for correcting afterglow of scintillation detector |
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