CN102353700B - Nondestructive testing method for thermally grown oxide on thermal barrier coating based on piezoelectric impedance method - Google Patents
Nondestructive testing method for thermally grown oxide on thermal barrier coating based on piezoelectric impedance method Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 27
- 239000012720 thermal barrier coating Substances 0.000 title claims abstract description 16
- 238000009659 non-destructive testing Methods 0.000 title abstract description 5
- 239000011248 coating agent Substances 0.000 claims abstract description 47
- 238000000576 coating method Methods 0.000 claims abstract description 47
- 230000003647 oxidation Effects 0.000 claims abstract description 27
- 238000007254 oxidation reaction Methods 0.000 claims abstract description 27
- 238000001514 detection method Methods 0.000 claims abstract description 18
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- 230000004792 oxidative damage Effects 0.000 claims abstract description 4
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Abstract
The invention discloses a nondestructive testing method for a thermally grown oxide on a thermal barrier coating based on the piezoelectric impedance method, which belongs to the technical field of nondestructive testing and evaluation of materials. A system used in the method comprises an impedance analyzer, a piezoelectric wafer, a coating sample, a computer, etc. According to the invention, the piezoelectric wafer is fixed on a to-be-detected part of the coating sample by a strong glue, leads are welded, and the impedance analyzer is adjusted; the impedance analyzer is used to measure electrical impedance module signals of the piezoelectric wafer within a megahertz-grade frequency band, a frequency band in which resonance peaks are concentratedly distributed is selected as a detection frequency range according to the result of measuring, and the number of sampling points and sampling frequency are determined; electrical impedance module signals of a coating before and after oxidation are respectively measured within the selected frequency range; according to the results of measuring of electrical impedance module signals, the oxidative damage discrimination index RMSD is calculated, and determination of formation of the thermally grown oxide is carried out. The method has the advantages of completely nondestructive testing, low cost, high efficiency, convenient operation, easy practicability and great economic and social benefits.
Description
Technical field
The present invention relates to a kind of thermal barrier coating thermal growth oxide layer lossless detection method based on the Piezoelectric Impedance method, it belongs to material NDT and NDE technical field.
Background technology
Up to now, not yet see the practical Piezoelectric Impedance method that can be directly used in the detection of thermal barrier coating thermal growth oxide layer.Due to hole and the crackle that thermal barrier coating inside exists some to be in communication with the outside, make it easily cause under arms the intrusion of oxidizing atmosphere in process, can generate thermal growth oxide layer in coating and tie-layer interface after using after a while.The appearance of thermal growth oxide layer has seriously reduced the serviceable life of thermal barrier coating, and the thermal growth oxide layer that 8-10 μ m is thick namely is enough to cause coating shedding, and is therefore significant to the detection of thermal growth oxide layer.The characteristics of thermal growth oxide layer are: thinner thickness (several micron), and and coating and matrix between form the labyrinth of multilayer, these two characteristics have increased its detection difficulty.At present, two kinds of detection methods commonly used are photoluminescence fluorescent spectrometry and AC impedance spectrometry.As British scholar Selcuk etc. in " The evolution of residual stress in the thermally grown oxide on Pt diffusion bond coats in TBCs " literary composition, by measuring Cr in thermal growth oxide layer
3+The fluorescence spectrum of ion detects its extent of growth.American scholar Wu etc. are in " Failure detection of thermal barrier coatings using impedance spectroscopy " literary composition, by measuring the variation of thermal growth oxide layer forming process floating coat structure AC resistance antinoise signal, its generating state is detected.The deficiency that at present existing method exists shows as, sample preparation and follow-up data complex disposal process, and disturbing factor is many, and detection efficiency is low etc., thereby also is only limited at present laboratory study.
Summary of the invention
The purpose of this invention is to provide a kind of thermal growth oxide layer lossless detection method based on the Piezoelectric Impedance method, it is applicable to detect thermal barrier coating inside and whether forms thermal growth oxide layer.
Technical scheme of the present invention is: a kind of thermal barrier coating thermal growth oxide layer lossless detection method based on the Piezoelectric Impedance method, use seccotine that piezoelectric chip is pasted on coating sample upper surface position to be detected, at the connection wire of the upper and lower electrode of described piezoelectric chip upper surface welding, connect and adopt electrical connection between wire and electric impedance analyzer; The coating sample that is pasted with piezoelectric chip is positioned on cystosepiment; Computer is analyzed the electrical impedance signal of the piezoelectric chip that electric impedance analyzer records; The measuring process that adopts when detecting thermal growth oxide layer is as follows:
(1) set the measurement parameter of electric impedance analyzer;
(2) utilizing electric impedance analyzer in megahertz level frequency range, the coating sample before oxidation to be carried out electrical impedance mould value signal measures;
(3) according to electrical impedance mould value signal amplitude spectrum, choose in megahertz level frequency range the harmonic peak amplitude obviously, the frequency band concentrated of distributing is as detecting frequency range, determines sampling number and sample frequency;
(4) the detection frequency range of determining according to step is carried out electrical impedance mould value signal to the coating sample before and after oxidation respectively in the mode of fixed sampling frequency and is measured;
(5) measurement data with electrical impedance mould value signal before and after coating sample (4) oxidation is updated in formula 1,
In formula: n is that sampled data is counted, x
iAnd y
iBe respectively the measurement result of coating sample (4) electrical impedance mould value signal before and after oxidation, calculate the oxidative damage discrimination index RMSD value of coating sample, and the formation of thermal growth oxide layer is characterized.
Technique scheme first is pasted on coating sample upper surface before and after oxidation by seccotine with piezoelectric chip.Set the measurement parameter of electric impedance analyzer, the electrical impedance mould value signal to original coating sample in megahertz level frequency band is measured.Wherein " driving voltage " is set as " 1V ", and " signal type " is set as " impedance magnitude ", and " average time " is set as " 3 times ", and " sample coordinate " is set as " rectangular coordinate ".According to the original coating sample impedance magnitude signal amplitude spectrum that records, selected measurement bandwidth scope to the coating characteristic sensitivity.In the mode of fixed sampling frequency and sampling number, the coating sample before and after oxidation is carried out electrical impedance mould value signal measure.Utilize formula 1 to calculate the RMSD value of electrical impedance mould value signal before and after oxidation, as the evaluating of formation thermal growth oxide layer.
The invention has the beneficial effects as follows: this thermal barrier coating thermal growth oxide layer lossless detection method based on the Piezoelectric Impedance method, use the detection system that is comprised of electric impedance analyzer, piezoelectric chip, coating sample, computing machine, connection wire and cystosepiment.At first utilize electric impedance analyzer in megahertz level frequency range, the coating sample before oxidation to be carried out electrical impedance mould value signal and measure, select coating characteristic is changed than more sensitive frequency band as detecting frequency range.When thermal growth oxide layer forms, thermal barrier coating mechanical impedance signal will change, and due to the mechanical electric coupling between piezoelectric chip and coating sample, the variation of mechanical impedance will show as the variation of piezoelectric chip electrical impedance signal.In selected detection frequency range, with fixing sample frequency and sampling number, the coating sample before and after oxidation is carried out the electrical impedance signal measurement, and then calculate oxidative damage discrimination index RMSD the formation of thermal growth oxide layer is characterized.This method has advantages of 100% Non-Destructive Testing, and cost is low, and efficient is high, and is easy to operate, is easy to practically, has larger economic benefit and social benefit.
Description of drawings
The invention will be further described below in conjunction with drawings and Examples.
Fig. 1 is a kind of system schematic of the thermal barrier coating thermal growth oxide layer pick-up unit based on the Piezoelectric Impedance method.
Fig. 2 is oxidation Front-coating mirror sample cross stereoscan photograph.
Fig. 3 is coating sample cross stereoscan photograph after oxidation.
Fig. 4 is oxidation Front-coating mirror sample electrical impedance mould value test result in the 0-10MHz band limits.
Fig. 5 is coating sample electrical impedance mould value test result in the 5.55-6.55MHz frequency range before and after oxidation.
Fig. 6 is coating sample electrical impedance mould value RMSD value result of calculation before and after oxidation.
In figure: 1, electric impedance analyzer, 2, wire, 3, piezoelectric chip, 4, the coating sample, 5, cystosepiment, 6 computing machines.
Embodiment
Shown in Figure 1 is a kind of system schematic of thermal barrier coating thermal growth oxide layer the cannot-harm-detection device based on the Piezoelectric Impedance method.Adopt successively electrical connection between electric impedance analyzer 1 (WK 6500B), connection wire 2, piezoelectric chip 3 (PZT).2 Ni based high-temperature alloy GH33 matrixes that are of a size of φ 20mm * 4mm are ground and clean, then adopt electro beam physics vapour deposition (EB-PVD) method successively deposit thickness be NiCoCrAlY tack coat and the ZrO of 30 μ m and 150 μ m
2-7wt.%Y
2O
3Ceramic layer is prepared coating sample 4.With the 2nd coating sample 4 cyclic oxidation 15 times under 1050 ℃ * 1h condition.
Figure 2 shows that the stereoscan photograph of oxidation Front-coating mirror sample 4 xsects.Figure 3 shows that the stereoscan photograph of coating sample 4 xsects after oxidation.Observing Fig. 3 can find, after oxidation, ceramic coat and tie-layer interface place have formed the thermal growth oxide layer of thickness near 3 μ m.Use seccotine piezoelectric chip 3 to be pasted on the position to be detected of coating sample 4.The piezoelectric chip 3 that this method is selected directly extends to upper surface with bottom electrode during fabrication, welds the connection wire 2 of upper and lower electrode at the upper surface of piezoelectric chip 3.The coating sample 4 that is pasted with piezoelectric chip 3 is positioned on cystosepiment 5.By electric impedance analyzer 1, piezoelectric chip 3 is carried out voltage signal excitation and electrical impedance signal measurement.The diameter of circular piezoelectric wafer 3 is 14mm, and thickness is 0.2mm, and nominal frequency is 5MHz.At first utilize electric impedance analyzer in the 0-10MHz frequency band, the coating sample 4 before oxidation is carried out electrical impedance mould value signal measure, as shown in Figure 4.In Fig. 4, to count be 100,001 to sampled data, and the frequency interval between the consecutive number strong point is 0.1kHz.Observing measurement result shown in Figure 4 can find, in the 5.55-6.55MHz frequency range, obvious harmonic peak occurred, and the distribution of peak value is more concentrated simultaneously.Therefore, select in the method 5.55-6.55MHz as measurement bandwidth.Sampling number elects 10,001 as, and the frequency interval between the consecutive number strong point is elected 0.1kHz as.
Figure 5 shows that the test result of oxidation front and back coating sample electrical impedance mould value in the 5.55-6.55MHz frequency range.Observing Fig. 5 can find, after generating thermal growth oxide layer, the resonance peak of coating sample electrical impedance spectrum is to the skew of low frequency direction, and obvious increase has occured impedance amplitude simultaneously.Show and adopt the Piezoelectric Impedance method can effectively detect the thermal growth oxide layer that forms after coating sample 4 cyclic oxidations.Utilize RMSD value that formula 1 calculates coating sample 4 electrical impedance mould value signals before and after oxidation that the formation of thermal growth oxide layer is characterized, result of calculation as shown in Figure 6.By the result of calculation of Fig. 6 as can be known, thermal growth oxide layer forms rear RMSD value and increases to 68.1% by 0%, and its formation has been provided clear and definite indication.
Claims (1)
1. thermal barrier coating thermal growth oxide layer lossless detection method based on the Piezoelectric Impedance method, use seccotine that piezoelectric chip (3) is pasted on coating sample (4) upper surface position to be detected, it is characterized in that: at the connection wire (2) of the upper and lower electrode of described piezoelectric chip (3) upper surface welding, connect and adopt electrical connection between wire (2) and electric impedance analyzer (1); The coating sample (4) that will be pasted with piezoelectric chip (3) is positioned on cystosepiment (5); Computer (6) is analyzed the electrical impedance signal of the piezoelectric chip (3) that electric impedance analyzer (1) records; The measuring process that adopts when detecting thermal growth oxide layer is as follows:
(1) set the measurement parameter of electric impedance analyzer (1);
(2) utilizing electric impedance analyzer (1) in megahertz level frequency range, the coating sample (4) before oxidation to be carried out electrical impedance mould value signal measures;
(3) according to electrical impedance mould value signal amplitude spectrum, choose in megahertz level frequency range the harmonic peak amplitude obviously, the frequency band concentrated of distributing is as detecting frequency range, determines that sampled data is counted and sample frequency;
(4) the detection frequency range of determining according to step (3) is carried out electrical impedance mould value signal to the coating sample (4) before and after oxidation respectively in the mode of fixed sampling frequency and is measured;
(5) measurement data with electrical impedance mould value signal before and after coating sample (4) oxidation is updated in formula 1,
In formula: n is that sampled data is counted, x
iAnd y
iBe respectively the measurement result of coating sample (4) electrical impedance mould value signal before and after oxidation, calculate the oxidative damage discrimination index RMSD value of coating sample (4), and the formation of thermal growth oxide layer is characterized.
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| CN108226027B (en) * | 2017-12-13 | 2020-12-29 | 中国特种飞行器研究所 | Coating aging failure evaluation method under atmosphere thin liquid film environment |
| CN112881479B (en) * | 2021-01-08 | 2022-09-13 | 中车青岛四方机车车辆股份有限公司 | Coating monitoring device and monitoring method |
| CN114414631A (en) * | 2021-12-22 | 2022-04-29 | 重庆大学 | Welding layer sintering quality nondestructive evaluation method based on electric pulse signal time-frequency domain analysis |
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