CN102339330A - Method for dividing physical layout of symmetric circuit - Google Patents
Method for dividing physical layout of symmetric circuit Download PDFInfo
- Publication number
- CN102339330A CN102339330A CN2010102301645A CN201010230164A CN102339330A CN 102339330 A CN102339330 A CN 102339330A CN 2010102301645 A CN2010102301645 A CN 2010102301645A CN 201010230164 A CN201010230164 A CN 201010230164A CN 102339330 A CN102339330 A CN 102339330A
- Authority
- CN
- China
- Prior art keywords
- physical layout
- circuit
- symmetrical
- symmetry
- symmetric
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Design And Manufacture Of Integrated Circuits (AREA)
Abstract
The invention is suitable for the field of integrated circuit design, and provides a method for dividing a physical layout of a symmetric circuit, which comprises the following steps: reading in a circuit network table and a physical layout; performing circuit analysis according to the circuit netlist to determine a symmetrical sub-circuit; determining the physical layout of the symmetrical sub-circuit by using a circuit and layout consistency checking technology; determining a symmetrical physical layout and an asymmetrical physical layout of the symmetrical sub-circuit; dividing half of the symmetrical physical layout; copying and dividing the other half of the symmetrical physical layout; carrying out secondary forming and dividing on the asymmetric physical layout; and outputting the physical layout after the secondary forming and dividing. According to the embodiment of the invention, after the circuit grid and the physical layout are read in, the symmetrical sub-circuit and the physical layout are determined, the symmetrical physical layout is determined, and is divided, copied and divided, and the asymmetrical physical layout is subjected to secondary forming and division, so that the problem that the actual pattern appearance of the symmetrical physical layout on a chip is asymmetrical and the actual electrical performance of the symmetrical circuit is mismatched due to the existing division technology is solved.
Description
Technical field
The invention belongs to the IC design field, relate in particular to the method that a kind of symmetric circuit physical layout is cut apart.
Background technology
The integrated circuit manufacturing begins from 45nm technology; Particularly at 32nm and 22nm and more under the small-feature-size technology; In order to strengthen characteristic density; Need to use the secondary forming photoetching process, be about to original mask graph and be divided on two masks, in ic manufacturing process, carry out the whole same layer pattern of photoetching making at twice with layer.Physical layout cutting procedure towards secondary light photoetching form technology can make symmetrical originally physical layout be assigned on the different masks; But because system's positioning error of IC etching board; The secondary forming photoetching technique can make the actual graphical pattern of physical layout on chip of symmetry also asymmetric; Increased the mismatch of the actual electric property of symmetric circuit, therefore needed a kind of symmetric circuit physical layout dividing method to guarantee that the figure on the different mask of being divided into of symmetrical physical layout also is symmetrical towards the secondary light photoetching form.
Summary of the invention
The method that the object of the present invention is to provide a kind of symmetric circuit physical layout to cut apart; Be intended to solve prior art and when cutting apart physical layout, can make the actual graphical pattern of physical layout on chip of symmetry asymmetric, increased the problem of the mismatch of the actual electric property of symmetric circuit.
The present invention is achieved in that the method that a kind of symmetric circuit physical layout is cut apart, and this method may further comprise the steps:
Read in circuit meshwork list and physical layout;
Carry out circuit analysis according to circuit meshwork list, confirm symmetrical electronic circuit;
Utilize circuit and domain consistency check technology to confirm the physical layout of symmetrical electronic circuit;
Search the axis of symmetry or the symcenter of symmetrical electronic circuit physical layout, confirm the symmetrical physical layout and the asymmetric physical layout of symmetrical electronic circuit;
Half of symmetrical physical layout cut apart;
Second half copy of symmetrical physical layout is cut apart;
Asymmetric physical layout is carried out secondary forming to be cut apart;
Physical layout after the output secondary forming is cut apart.
Another purpose of the embodiment of the invention is to provide a kind of dividing method of stratification multiaxis symmetric circuit physical layout, and this method may further comprise the steps:
Read in circuit meshwork list and physical layout;
Carry out circuit analysis according to said road network table, confirm stratification multiaxis symmetry electronic circuit;
Utilize circuit and domain consistency check technology to confirm the physical layout of symmetrical electronic circuit;
Search the axis of symmetry or the symcenter of said symmetrical electronic circuit physical layout, confirm the symmetrical physical layout and the asymmetric physical layout of stratification multiaxis symmetry electronic circuit;
Half of the bottom of said symmetrical physical layout symmetry physical layout cut apart;
The bottom of said symmetrical physical layout and second half copy of upper strata symmetry physical layout are cut apart;
Said asymmetric physical layout is carried out secondary forming to be cut apart;
Export said secondary forming and cut apart physical layout afterwards.
The present invention is after reading in circuit meshwork list and physical layout; Confirm symmetrical electronic circuit and symmetrical physical layout and asymmetric physical layout through circuit analysis; With half of symmetrical physical layout cut apart, second half copy cuts apart; Asymmetric physical layout secondary forming is cut apart, solved prior art and when cutting apart physical layout, can make the problem that the symmetrical actual graphical pattern of physical layout on chip is asymmetric and increased the mismatch of the actual electric property of symmetric circuit.
Description of drawings
Fig. 1 is the realization flow figure of the method cut apart of symmetric circuit physical layout that the embodiment of the invention provides;
Fig. 2 be the embodiment of the invention provide carry out the process flow diagram that the method for symmetrical electronic circuit is confirmed in circuit analysis according to circuit meshwork list;
Fig. 3 is the process flow diagram of method of symmetrical physical layout and the asymmetric physical layout of definite symmetrical electronic circuit of providing of the embodiment of the invention;
Fig. 4 is the realization flow figure of the method cut apart of stratification multiaxis symmetric circuit physical layout that the embodiment of the invention provides;
Fig. 5 be the embodiment of the invention provide pass through the process flow diagram that the method for stratification multiaxis symmetry electronic circuit is confirmed in circuit analysis;
Fig. 6 is the process flow diagram of method of symmetrical physical layout and the asymmetric physical layout of the definite stratification multiaxis symmetry electronic circuit that provides of the embodiment of the invention.
Embodiment
In order to make the object of the invention, technical scheme and advantage clearer,, the present invention is further elaborated below in conjunction with accompanying drawing and embodiment.Should be appreciated that specific embodiment described herein only in order to explanation the present invention, and be not used in qualification the present invention.
The embodiment of the invention is after reading in circuit meshwork list and physical layout; Confirm symmetrical electronic circuit and symmetrical physical layout and asymmetric physical layout through circuit analysis; Half is cut apart with symmetrical physical layout, second half copy cuts apart; Asymmetric physical layout is carried out secondary forming cut apart, and export the physical layout after secondary forming is cut apart.
The embodiment of the invention is achieved in that the method that a kind of symmetric circuit physical layout is cut apart, and said method comprising the steps of:
Read in circuit meshwork list and physical layout;
Carry out circuit analysis according to said circuit meshwork list, confirm symmetrical electronic circuit;
Utilize circuit and domain consistency check technology to confirm the physical layout of said symmetrical electronic circuit;
Search the axis of symmetry or the symcenter of said symmetrical electronic circuit physical layout, confirm the symmetrical physical layout and the asymmetric physical layout of symmetrical electronic circuit;
Half of said symmetrical physical layout cut apart;
Second half copy of said symmetrical physical layout is cut apart;
Said asymmetric physical layout is carried out secondary forming to be cut apart;
Export said secondary forming and cut apart physical layout afterwards.
Another purpose of the embodiment of the invention is to provide a kind of dividing method of stratification multiaxis symmetric circuit physical layout, said method comprising the steps of:
Read in circuit meshwork list and physical layout;
Carry out circuit analysis according to said road network table, confirm stratification multiaxis symmetry electronic circuit;
Utilize circuit and domain consistency check technology to confirm the physical layout of symmetrical electronic circuit;
Search the axis of symmetry or the symcenter of said symmetrical electronic circuit physical layout, confirm the symmetrical physical layout and the asymmetric physical layout of stratification multiaxis symmetry electronic circuit;
Half of the bottom of said symmetrical physical layout symmetry physical layout cut apart;
The bottom of said symmetrical physical layout and second half copy of last layer symmetry physical layout are cut apart;
Said asymmetric physical layout is carried out secondary forming to be cut apart;
Export said secondary forming and cut apart physical layout afterwards.
Below in conjunction with accompanying drawing and embodiment, the present invention done specifically details are as follows:
Embodiment:
The realization flow of the method that the symmetric circuit physical layout that Fig. 1 shows the embodiment of the invention to be provided is cut apart, details are as follows:
In step S101, read in circuit meshwork list and physical layout;
In step S102, carry out circuit analysis according to the circuit meshwork list that reads in and confirm symmetrical electronic circuit;
In step S103, utilize circuit and domain consistency check technology to confirm the physical layout of said symmetrical electronic circuit;
In step S104, search the axis of symmetry or the symcenter of symmetrical electronic circuit physical layout, confirm the symmetrical physical layout and the asymmetric physical layout of symmetrical electronic circuit;
In step S105, half of symmetrical physical layout cut apart;
In step S106, second half copy of symmetrical physical layout is cut apart;
In step S107, asymmetric physical layout is carried out secondary forming cut apart;
In step S108, the physical layout after the output secondary forming is cut apart.
Read in circuit meshwork list and physical layout;
The embodiment of the invention is through after confirming symmetric circuit to circuit analysis; Utilize circuit and domain consistency check technology to confirm the symmetrical physical layout and the asymmetric physical layout of symmetrical electronic circuit; Half of symmetrical physical layout cut apart; Second half copy is cut apart; And asymmetric physical layout is carried out secondary forming cut apart the physical layout of output secondary forming in back after cutting apart, thereby realized when cutting apart physical layout, can making the actual graphical pattern of physical layout on chip of symmetry symmetrical.
The circuit meshwork list of the embodiment of the invention is that automatic Synthesis goes out the circuit meshwork list that physical layout or hand-designed go out physical layout.
The physical layout of the embodiment of the invention is the physical layout that has all passed through through layout, wiring and follow-up DRC, PE, LVS and post-simulation.
Fig. 2 be the embodiment of the invention provide pass through the method flow that symmetrical electronic circuit is confirmed in circuit analysis, details are as follows:
In step S201, set up digraph according to the circuit meshwork list that reads in;
In step S202, utilize the subgraph isomorphism algorithm in digraph, to seek the coupling subgraph;
In step S203, the external interface that the coupling subgraph is corresponding is confirmed as symmetrical subgraph apart from equidistant two coupling subgraphs of father's circuit input end mouth or output port;
In step S204, it is symmetrical electronic circuit that two corresponding sub-circuit of symmetrical subgraph are set.
The embodiment of the invention utilizes circuit and domain consistency check technology to confirm the physical layout of symmetric circuit, and its concrete realization may further comprise the steps:
Utilize the physical layout extracting tool, from the geometric position that physical layout extracts circuit meshwork list and acquisition device and elementary cell, and the geometric position of the corresponding line of gauze;
The isomorphism algorithm of utilization figure is found out original circuit meshwork list and from the corresponding relation between the circuit meshwork list of physical layout extraction, promptly the corresponding relation of corresponding relation between the device and gauze is confirmed isomorphism electronic circuit device position and physical connection position separately.
As shown in Figure 3, in the embodiment of the invention, search the axis of symmetry or the symcenter of symmetrical electronic circuit physical layout, confirm the symmetrical physical layout and the asymmetric physical layout of symmetrical electronic circuit, specifically may further comprise the steps:
In step S301, calculate axis of symmetry or symcenter between the symmetrical device between symmetrical electronic circuit two parts;
In step S302, calculate axis of symmetry or symcenter between the symmetrical gauze between symmetrical electronic circuit two parts;
In step S303, seek symmetrical electronic circuit physical layout axis of symmetry or symcenter according to axis of symmetry or the symcenter calculated;
In step S304, setting with symmetrical electronic circuit physical layout axis of symmetry or symcenter is that the device (gauze) of symmetry be the symmetrical device (gauze) of physical geometry, and other device/gauzes are the symmetrical device (gauze) of non-physical geometry.
In the embodiment of the invention, with symmetrical physical layout wherein half is cut apart, adopt existing secondary forming to optimize partitioning algorithm.
Asymmetric physical layout is carried out secondary forming cut apart the existing secondary forming optimization of same employing partitioning algorithm.
In the embodiment of the invention; It is the axis of symmetry/symcenter around symmetrical electronic circuit physical layout that second half copy of symmetric circuit physical layout is cut apart; After half of the bottom of symmetrical physical layout symmetry physical layout being cut apart the figure mirror image of virtual level Layer-XXX-1 that the back forms and Layer-XXX-2, on the same virtual level of correspondence, produce the symmetrical figure in physical geometry position.
In the embodiment of the invention; Be divided into two different virtual level Layer-XXX-1 and Layer-XXX-2 after originally cutting apart with the figure of layer Layer-XXX; The physical layout of system level chip after output is cut apart; Application programming interfaces through the physical layout data storehouse deposit the graphical information on these two virtual levels in the physical layout data storehouse, so that follow-up plate-making the time utilizes virtual level Layer-XXX-1 to carry out the secondary forming photoetching with two different masks of graphical information making on the Layer-XXX-2.
The realization flow of the method that the stratification multiaxis symmetric circuit physical layout that Fig. 4 embodiment of the invention provides is cut apart, details are as follows:
In step S401, read in circuit meshwork list and physical layout;
In step S402, carry out circuit analysis according to the circuit meshwork list that reads in and confirm stratification multiaxis symmetry electronic circuit;
In step S403, utilize circuit and domain consistency check technology to confirm the physical layout of symmetrical electronic circuit;
In step S404, search the axis of symmetry or the symcenter of symmetrical electronic circuit physical layout, confirm the symmetrical physical layout and the asymmetric physical layout of stratification multiaxis symmetry electronic circuit;
In step S405, half of the bottom physical layout of symmetrical physical layout cut apart;
In step S406, the bottom of symmetrical physical layout and second half copy of last layer symmetry physical layout are cut apart;
In step S407, asymmetric physical layout is carried out secondary forming cut apart;
In step S408, the physical layout after the output secondary forming is cut apart.
The circuit meshwork list of the embodiment of the invention is that automatic Synthesis goes out the circuit meshwork list that physical layout or hand-designed go out physical layout, and physical layout is the physical layout that has all passed through through layout, wiring and follow-up DRC, PE, LVS and post-simulation.
In embodiments of the present invention, confirm stratification multiaxis symmetry electronic circuit through circuit analysis, its concrete performing step is following, as shown in Figure 5:
In step S501, set up digraph according to the circuit meshwork list that reads in;
In step S502, utilize the subgraph isomorphism algorithm in digraph, to seek the coupling subgraph;
In step S503, the external interface that the coupling subgraph is corresponding is confirmed as symmetrical subgraph apart from equidistant two coupling subgraphs of father's circuit input end mouth or output port;
In step S504, it is stratification multiaxis symmetry electronic circuit that two corresponding sub-circuit of symmetrical subgraph are set.
In embodiments of the present invention, as shown in Figure 6, the axis of symmetry or the symcenter of searching symmetrical electronic circuit physical layout are confirmed the symmetrical physical layout and the asymmetric physical layout of stratification multiaxis symmetry electronic circuit, and its concrete performing step is following:
In step S601, calculate axis of symmetry or symcenter between the symmetrical device between stratification multiaxis symmetry electronic circuit two parts;
In step S602, calculate axis of symmetry or symcenter between the symmetrical gauze between stratification multiaxis symmetry electronic circuit two parts;
In step S603, according to the axis of symmetry or the symcenter of axis of symmetry that calculates or symcenter searching stratification multiaxis symmetry electronic circuit physical layout;
In step S604, setting with said axis of symmetry or symcenter is that the device/gauze of symmetry is the device/gauze of physical geometry symmetry, and other device/gauzes are the symmetrical device/gauze of non-physical geometry.。
To the bottom of stratification multiaxis symmetric circuit physical layout symmetry physical layout wherein half is cut apart, or asymmetric physical layout is carried out secondary forming cut apart and adopt existing secondary forming to optimize partitioning algorithm.
For the bottom of stratification multiaxis symmetry electronic circuit symmetry physical layout is cut apart through the axis of symmetry/symcenter around the symmetrical electronic circuit physical layout of stratification multiaxis with second half copy of last layer symmetry physical layout; After half of the bottom of symmetrical physical layout symmetry physical layout being cut apart the figure mirror image of virtual level Layer-XXX-1 that the back forms and Layer-XXX-2; On the same virtual level of correspondence, produce the figure of physical geometry position symmetry; And from bottom to top; For second half copy of the symmetrical physical layout of each layer is cut apart, until the symmetric case of handling whole levels.
Behind the physical layout of the embodiment of the invention after the output secondary forming is cut apart; Application programming interfaces through the physical layout data storehouse deposit the graphical information on these two virtual levels in the physical layout data storehouse, so that follow-up plate-making the time utilizes virtual level Layer-XXX-1 to carry out the secondary forming photoetching with two different masks of graphical information making on the Layer-XXX-2.
The present invention is after reading in circuit meshwork list and physical layout; Confirm symmetrical electronic circuit and symmetrical physical layout and asymmetric physical layout through circuit analysis; With half of symmetrical physical layout cut apart, second half copy cuts apart; Asymmetric physical layout secondary forming is cut apart, solved prior art and when cutting apart physical layout, can make the problem that the symmetrical actual graphical pattern of physical layout on chip is asymmetric and increased the mismatch of the actual electric property of symmetric circuit.
The above is merely preferred embodiment of the present invention, not in order to restriction the present invention, all any modifications of within spirit of the present invention and principle, being done, is equal to and replaces and improvement etc., all should be included within protection scope of the present invention.
Claims (17)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 201010230164 CN102339330B (en) | 2010-07-19 | 2010-07-19 | Method for dividing physical layout of symmetric circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 201010230164 CN102339330B (en) | 2010-07-19 | 2010-07-19 | Method for dividing physical layout of symmetric circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102339330A true CN102339330A (en) | 2012-02-01 |
CN102339330B CN102339330B (en) | 2013-06-05 |
Family
ID=45515063
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN 201010230164 Active CN102339330B (en) | 2010-07-19 | 2010-07-19 | Method for dividing physical layout of symmetric circuit |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN102339330B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102542114A (en) * | 2012-01-06 | 2012-07-04 | 深圳市汉普电子技术开发有限公司 | PCB module mirroring method and device based on origin symmetry |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0668401A (en) * | 1992-08-17 | 1994-03-11 | Sony Corp | Self-diagnosing device for video deck |
CN1521829A (en) * | 2003-01-29 | 2004-08-18 | 上海芯华微电子有限公司 | Topology Verification Method for Integrated Circuits |
-
2010
- 2010-07-19 CN CN 201010230164 patent/CN102339330B/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0668401A (en) * | 1992-08-17 | 1994-03-11 | Sony Corp | Self-diagnosing device for video deck |
CN1521829A (en) * | 2003-01-29 | 2004-08-18 | 上海芯华微电子有限公司 | Topology Verification Method for Integrated Circuits |
Non-Patent Citations (3)
Title |
---|
吕江崴,张有光,孙泉: "《模拟集成电路版图中的对称检测与提取方法》", 《微电子学与计算机》 * |
姚芳,李秋利: "《浅谈CMOS模拟集成电路版图设计的器件匹配方法》", 《集成电路通讯》 * |
钟伟全等: "《一种PCB板元器件图像的分割方法》", 《电子科技》 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102542114A (en) * | 2012-01-06 | 2012-07-04 | 深圳市汉普电子技术开发有限公司 | PCB module mirroring method and device based on origin symmetry |
Also Published As
Publication number | Publication date |
---|---|
CN102339330B (en) | 2013-06-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US8458640B2 (en) | Routing using a dynamic grid | |
US8935639B1 (en) | Natively color-aware double patterning technology (DPT) compliant routing | |
CN100585604C (en) | Method of Changing Physical Layout Data Using Virtual Layer | |
US11392741B2 (en) | Computer implemented system and method for generating a layout of a cell defining a circuit component | |
US11334705B2 (en) | Electrical circuit design using cells with metal lines | |
US20120233575A1 (en) | Layout method for integrated circuit including vias | |
CN104050306A (en) | Layout Verification Method for Polysilicon Cell Edge Structure in FinFET Standard Cell | |
TWI845737B (en) | Methods and systems to perform automated integrated fan-out wafer level package routing, and non-transitory computer-readable medium thereof | |
Chen et al. | Routability-driven blockage-aware macro placement | |
Tian et al. | Triple patterning aware detailed placement with constrained pattern assignment | |
US8627247B1 (en) | Systems and methods for fixing pin mismatch in layout migration | |
CN108416077A (en) | For by considering back-end process come the method and computing system of integrated design circuit | |
US10558781B2 (en) | Support apparatus, design support method, and design support program | |
CN102339329B (en) | Physical layout segmentation method | |
US8694940B2 (en) | System and method for integrated circuit design and implementation using mixed cell libraries | |
CN102339330A (en) | Method for dividing physical layout of symmetric circuit | |
Ward et al. | Structure-aware placement techniques for designs with datapaths | |
US8762917B2 (en) | Automatically modifying a circuit layout to perform electromagnetic simulation | |
Kai et al. | Tofu: A two-step floorplan refinement framework for whitespace reduction | |
US8181143B2 (en) | Method and apparatus for generating a memory-efficient representation of routing data | |
US9293450B2 (en) | Synthesis of complex cells | |
US11144700B1 (en) | Grouping nets to facilitate repeater insertion | |
US20110041112A1 (en) | Method and apparatus for generating a centerline connectivity representation | |
Fang et al. | Obstacle-avoiding open-net connector with precise shortest distance estimation | |
Chi et al. | Achieving routing integrity in analog layout migration via Cartesian detection lines |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant |