Summary of the invention
Deficiency in view of prior art the object of the present invention is to provide a kind of active assembly array base plate, and it can improve the problem of the degradation of display quality that causes because of scan line impedance rising in the known techniques; A kind of display floater also is provided, and it also can improve the problem of the degradation of display quality that causes because of scan line impedance rising in the known techniques.
To achieve these goals, technical scheme of the present invention is: a kind of active assembly array base plate comprises substrate, a plurality of image element structure and a plurality of impedance-compensated assembly; The scanning signal input area that substrate has the viewing area and is positioned at a side of viewing area; Image element structure is positioned at the viewing area of substrate; Each image element structure comprises scan line, data wire, driving component and pixel electrode; Data wire and scan line are interconnected; Driving component and scan line and data wire electrically connect; Pixel electrode and driving component electrically connect; The scan line parallel connection of each impedance-compensated assembly and a corresponding image element structure; The resistance of impedance-compensated assembly is from reduce away from scanning signal input area part near scanning signal input area part is past gradually.
The present invention also provides a kind of display floater, comprises above-mentioned active assembly array base plate, subtend substrate and display medium.The subtend substrate is with respect to active assembly array base plate.Display medium is between active assembly array base plate and subtend substrate.
In one embodiment of this invention, each above-mentioned impedance-compensated assembly comprises conduction line segment and a plurality of contact structures.A plurality of contact structures electrically connect the scan line of conduction line segments and a corresponding image element structure.
In one embodiment of this invention, above-mentioned impedance-compensated assembly is positioned at the top of scan line.
In one embodiment of this invention, above-mentioned impedance-compensated assembly and scan line overlap.
In one embodiment of this invention, the length of above-mentioned conduction line segment is from increase away from scanning signal input area part near scanning signal input area part is past gradually.
In one embodiment of this invention, each image element structure of the scan line of above-mentioned and corresponding image element structure parallel connection can further comprise insulating barrier and protective layer.Insulating barrier is between scan line and conduction line segment.Protective layer covers the conduction line segment.Protective layer has opening, to expose the conduction line segment.Contact structures run through insulating barrier and protective layer, and electrically contact with the scan line of corresponding image element structure.Contact structures see through opening and electrically contact with the conduction line segment.
In one embodiment of this invention, above-mentioned contact structures are identical with the material of pixel electrode.
In one embodiment of this invention, above-mentioned conduction line segment is identical with the material of data wire.
In one embodiment of this invention, above-mentioned image element structure is arranged in multirow and multiple row, and is positioned at the resistance of the impedance-compensated assembly of the image element structure of delegation identical in fact.
In one embodiment of this invention, near the image element structure of the delegation of above-mentioned scanning signal input area impedance-compensated assembly be not set.
Active assembly array base plate of the present invention and display floater by near scanning signal input area part toward the impedance-compensated assembly that reduces gradually away from scanning signal input area part resistance; Make the parallelly connected formed impedance of scan line of each image element structure along with reducing gradually, and then improved in known techniques scanning signal that the impedance because of scan line causes along with raising gradually away from the scanning signal input area problem of distortion gradually away from scanning signal input area with compensation assembly.Simultaneously, the problem of degradation of display quality also is improved.
Embodiment
For letting the above-mentioned feature and advantage of the present invention can be more obviously understandable, hereinafter is special lifts embodiment, and cooperates appended graphic elaborating as follows.
Fig. 1 is for looking sketch map on the active assembly array base plate of one embodiment of the invention.Please with reference to Fig. 1, the active assembly array base plate 100 of present embodiment comprises substrate 110, a plurality of image element structure 120 and a plurality of impedance-compensated assembly 130.The scanning signal input area 114 that the substrate 110 of present embodiment has viewing area 112 and is positioned at viewing area 112 1 sides.For example, viewing area 112 can be the rectangular area, and scanning signal input area 114 can be the less rectangular area of another area that is positioned at 112 left sides, viewing area.What need special instruction is that the scanning signal input area 114 of present embodiment is suitable for being provided with scanning signal source, for example scans the signal chip.The scan line 122 that this scanning signal source can see through each image element structure 120 gives image element structure 120 scanning signals.In the present embodiment, the material of substrate 110 can be glass, quartz, organic polymer, light tight/reflecting material (like electric conducting material, wafer, pottery etc.) or other suitable material.
The image element structure 120 of present embodiment is positioned at the viewing area 112 of substrate 110, and each image element structure 120 comprises scan line 122, data wire 124, driving component 126 and pixel electrode 128.In the present embodiment, scan line 122 is interconnected with data wire 124.For example, scan line 122 can prolong row (row) direction D1 and extend, and data wire 124 can prolong row (column) direction D2 extension.The scan line 122 of present embodiment is to belong to different retes with data wire 124.Saying further, the data line 124 of present embodiment can belong to the rete of scan line 122 tops.In the present embodiment, the material of the material of scan line 122 and data wire 124 generally is a metal material.But the invention is not restricted to this; In other embodiments; The material of the material of scan line 122 and data line 124 also can use other electric conducting material, like the nitride of alloy, metal material, the oxide of metal material, the nitrogen oxide of metal material or the stack layer of metal material and other electric conducting material.
The driving component 126 of present embodiment electrically connects with scan line 122 and data wire 124.For example, the driving component 126 of present embodiment can be thin-film transistor (Thin film transistor, TFT).Say that further the driving component 126 of present embodiment can be bottom gate (bottom gate) type thin-film transistor.In detail; The driving component 126 of present embodiment comprises gate G, be positioned at channel layer CH on the gate G, cover the source S and the drain D of the both sides of channel layer CH respectively; Wherein the gate G of driving component 126 electrically connects with the scan line that belongs to a rete 122, and the source S of driving component 126 electrically connects with the data wire that belongs to another rete 124.In other words, source S, drain D can and data line 124 belong to same rete.Yet the present invention is not exceeded with above-mentioned, and in other embodiments, driving component 126 also can be the driving component of top gate (top gate) type thin-film transistor or other suitable pattern.
The pixel electrode 128 of present embodiment electrically connects with driving component 126.In detail, the pixel electrode 128 of present embodiment electrically connects with the drain D of driving component 126.In the present embodiment; Pixel electrode 128 for example is a transparency conducting layer; It comprises metal oxide, for example is indium tin oxide, indium-zinc oxide, aluminium tin-oxide, aluminium zinc oxide, indium germanium zinc oxide or other suitable oxide or the above-mentioned stack layer of the two at least.
Fig. 2 is the generalized section that the hatching line AA ' of corresponding diagram 1 is painted.Please be simultaneously with reference to Fig. 1 and Fig. 2, scan line 122 parallel connections of the impedance-compensated assembly 130 of each of present embodiment and a corresponding image element structure 120.Further say; The impedance-compensated assembly 130 of present embodiment comprises conduction line segment 132 and a plurality of contact structures 134,134 '; Wherein contact structures 134,134 ' electrically connect conduction a line segment 132 and a corresponding scan line 122 respectively, and make impedance-compensated assembly 130 parallelly connected with scan line 122.In detail, each image element structure 120 can further comprise insulating barrier 123 and protective layer 125.Insulating barrier 123 is between scan line 122 and conduction line segment 132.Protective layer 125 covers conduction line segment 132 (having revised diagram), and wherein protective layer 125 has opening 125a, and opening 125a exposes conduction line segment 132.A wherein end of contact structures 134 and a wherein end of contact structures 134 ' run through insulating barrier 123 and protective layer 125 respectively, and electrically contact with a corresponding scan line 122.The other end of contact structures 134 sees through opening 125a respectively with the other end of contact structures 134 ' and electrically contacts with conduction line segment 132.In other words, the conduction line segment 132 of impedance-compensated assembly 130 is parallelly connected with scan line 122 through contact structures 134,134 '.
What deserves to be mentioned is that in the present embodiment, the conduction line segment 132 of impedance-compensated assembly 130 is identical with the material of data wire 124, and contact structures 134,134 ' are identical with the material of pixel electrode 128.In other words, the conduction line segment 132 of impedance-compensated assembly 130 can belong to a rete and can be in completing with data wire 124 in the processing procedure together with data wire 124, and contact structures 134,134 ' and pixel electrode 128 as the same.Anticipate promptly, the processing procedure of the impedance-compensated assembly 130 of present embodiment and existing processing procedure are compatible, and can not increase the cost of manufacture of active assembly array base plate 100.In the present embodiment, conduction line segment 132 comprises metal material with the material of data wire 124, yet, the invention is not restricted to this, according to other embodiment, conduction line segment 132 also can use other electric conducting material with data line 124.For example: the nitrogen oxide of the nitride of alloy, metal material, the oxide of metal material, metal material or the stack layer of metal material and other electric conducting material.The contact structures 134 of present embodiment, 134 ' and the material of pixel electrode 128 comprise metal oxide, for example be indium tin oxide, indium-zinc oxide, aluminium tin-oxide, aluminium zinc oxide, indium germanium zinc oxide or other suitable oxide or the above-mentioned stack layer of the two at least.
In addition, the impedance-compensated assembly 130 of present embodiment is to be positioned at scan line 122 tops, and overlaps with scan line 122.Thus, the impedance-compensated assembly 130 of present embodiment just can not cause the loss of the aperture opening ratio (aperture ratio) of extra driving component substrate 100, and then the display floater display characteristic of the driving component substrate 100 of feasible employing present embodiment is good.
What be worth paying special attention to is; The impedance-compensated assembly 130 of each of present embodiment except with scan line 122 parallel connections of a corresponding image element structure 120, the resistance of impedance-compensated assembly 130 also near scanning signal input area 114 parts toward reducing gradually away from scanning signal input area 114 parts.For example; In the present embodiment; The contact structures 134 of each impedance-compensated assembly 130,134 ' resistance all equate, and the length L of the conduction line segment 132 of impedance-compensated assembly 130 near scanning signal input area 114 parts toward increasing gradually away from scanning signal input area 114 parts.In other words; The driving component substrate 100 of present embodiment by will conduct electricity line segment 132 length L near scanning signal input area 114 parts toward elongating gradually away from scanning signal input area 114 parts, and the resistance that makes impedance-compensated assembly 130 near scanning signal input area 114 parts toward reducing gradually away from scanning signal input area 114 parts.Yet, the invention is not restricted to above-mentioned, the designer also can adopt other suitable design make impedance-compensated assembly 130 resistance near scanning signal input area 114 parts toward reducing gradually away from scanning signal input area 114 parts.The image element structure 120 of present embodiment can be arranged in multirow and multiple row, and the resistance that is positioned at the impedance-compensated assembly 130 of the image element structure 120 of delegation in fact can be identical.And in the present embodiment, being positioned at image element structure 120 near the delegation of scanning signal input area 114 can not have impedance-compensated assembly 130 is set.
What need special instruction is; When scan line 122 parallel connections of each impedance-compensated assembly 130 of present embodiment with a corresponding image element structure 120; And the resistance of impedance-compensated assembly 130 be near scanning signal input area 114 parts when reducing gradually away from scanning signal input area 114 parts, cause the problem of degradation of display quality just can be improved because of the scan line impedance excessively raises in the known techniques.In detail, the scan line 122 of each image element structure 120 can be parallelly connected with impedance-compensated assembly 130, and make scan line 122 and impedance-compensated assembly 130 formed impedances and little than the impedance of scan line 122 itself.And; Because of the resistance of impedance-compensated assembly 130 near scanning signal input area 114 parts toward reducing gradually away from scanning signal input area 114 parts, the scan line 122 of image element structure 120 and impedance-compensated assembly 130 parallelly connected formed impedances with also from reducing gradually away from scanning signal input area 114 parts near scanning signal input area 114 parts are past.Thus; Compared to known techniques; The impedance of total scan line (scan line 122 by the image element structure that is positioned at same row 120 links) is along with the trend that its end increases away from scanning signal input area 114 just can obviously be slowed down, and then makes in the known techniques impedance because of scan line (similar above-mentioned total scan line) excessively raise to cause the problem of degradation of display quality to be improved.
Fig. 3 is the generalized section of the display floater of one embodiment of the invention.Please refer to Fig. 3, the display floater 1000 of present embodiment comprises above-mentioned driving component substrate 100, with respect to the subtend substrate 200 and the display medium 300 between active assembly array base plate 100 and subtend substrate 200 of active assembly array base plate 100.In the present embodiment, subtend substrate 200 for example is colored filter (color filter) substrate, and display medium 300 can be liquid crystal, organic electro luminescent layer, electrophoretic display medium etc., but the present invention is not exceeded with above-mentioned.The display floater 1000 of present embodiment has and above-mentioned active assembly array base plate 100 similar effect and advantages, just no longer repeats in this.
In sum; Active assembly array base plate of the present invention and display floater by near scanning signal input area part toward the impedance-compensated assembly that reduces gradually away from scanning signal input area part resistance; Make the parallelly connected formed impedance of scan line of each image element structure along with reducing gradually, and then improve in the known techniques problem of the degradation of display quality that the impedance because of scan line causes along with excessively raising away from scanning signal input area away from scanning signal input area with compensation assembly.
Active assembly array base plate of the present invention and display floater form the conduction line segment of impedance-compensated assembly simultaneously when forming data line, and utilization is parallelly connected with the scan line of corresponding image element structure with the conduction line segment of each impedance-compensated assembly with a plurality of contact structures of the same rete of pixel electrode.Therefore, the design of active assembly array base plate of the present invention and display floater can be difficult for increasing the active assembly array base plate cost of manufacture with existing processing procedure compatibility.In addition, in active assembly array base plate of the present invention and display floater, the scanning that impedance-compensated assembly is arranged at corresponding image element structure is online, and makes the design of impedance-compensated assembly be difficult for causing the aperture opening ratio of active assembly array base plate to descend.
Though the present invention discloses as above with embodiment; Right its is not in order to limit the present invention, to have common knowledge the knowledgeable in any affiliated technical field, not break away from the spirit and scope of the present invention; When doing a little change and retouching, so protection scope of the present invention is as the criterion with claim.