CN102323486B - I-V second-order differential measurement method and device - Google Patents
I-V second-order differential measurement method and device Download PDFInfo
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- CN102323486B CN102323486B CN 201110232212 CN201110232212A CN102323486B CN 102323486 B CN102323486 B CN 102323486B CN 201110232212 CN201110232212 CN 201110232212 CN 201110232212 A CN201110232212 A CN 201110232212A CN 102323486 B CN102323486 B CN 102323486B
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Abstract
The invention discloses a kind of I-V second-order differential measurement method and devices. The device includes DC signal source, function generator, with the alternating current-direct current adder of partial pressure effect, preamplifier, lock-in amplifier and environmental condition control system; This method is: by selected frequency
Ac small signal be superimposed with Dc bias by alternating current-direct current adder, for collective effect in test sample, the signal containing test sample information amplifies through preamplifier is converted into voltage signal, by locking phase measurement frequency-doubled signal voltage. Advantages of the present invention at least that: (1) contain divider in alternating current-direct current adder alternating current path; (2) AC signal is provided by function generator, and precision is higher, and by partial pressure amplitude very little, is reduced its influence to DC bias signal, improved signal-to-noise ratio; (3) for directly measurement I-V second-order differential with the change curve of external condition, method is simple, as a result accurate intuitive and not high to tester's circuit design level requirement.
Description
Technical field
The present invention relates to a kind of method for detecting weak signals and installation method, relate in particular to a kind of I-V and measure second-order differential with the device and method of external environment change curve.
Background technology
Electricity is led and is defined as conductive capability, allows electric current by its measuring of easiness for a certain conductor, becomes reciprocal relation with resistance, is the major parameter of evaluation and analysis device and material fundamental characteristics.The measuring technology of leading about electricity is widely used in the fields such as electronics, biology and fundamental research.For example, the electric conductivity of semiconductor devices is not constant usually, only depends on I-V to measure the analysis that can not realize the device electric conductivity.For these devices, need to carry out detailed measurements producing effective I-V curve at many points, and obtain electricity and lead (G=dI/dV, i.e. I-V first order derivative) with the change curve of external condition.
At present, along with the size of modern electronic devices is constantly dwindled, people rely on the micro-nano technology to seek the breakthrough of device size and other gordian technique more.For the micro/nano level device, its fundamental characteristics (as physics, chemistry) is subjected to the impact of Quantum Properties or external condition.The electricity that not only needs to know device is led, and will need also to know that electricity leads the derivative of the voltage variation relation with external condition, and namely electric current is to the second derivative of the voltage variation relation with external condition.The patent of invention of publication number CN101666828 adopts the fourier spectra analyser to measure differential conductance, but this method is not directly perceived, need to carry out the Fourier variation and just can obtain fundamental frequency and second harmonic coefficient, then can obtain the differential that electricity is led after calculating.The derivative that the patent of invention employing lock-in amplifier measurement sample electricity of publication number CN101446620B is led is with the variation relation of bias voltage, the method is supplied with AC signal by lock-in amplifier, the signal amplitude of supplying with and precision be subjected to the restriction (4mVrms-5Vrms) of lock-in amplifier.
Summary of the invention
The object of the invention is to for the deficiencies in the prior art, a kind of measurement mechanism and method of I-V second-order differential are provided, it can directly measure the second derivative of I-V with the change curve of external condition, method than common G-V differentiate has higher precision, and Billy has convenient characteristic with the fourier spectra analysis.
For achieving the above object, the present invention has adopted following technical scheme:
a kind of I-V second-order differential measurement mechanism method, it is characterized in that, the method is: the AC signal that will have a selected frequency by alternating current-direct current totalizer (bias-tee) dividing potential drop with dividing potential drop effect after, superpose with Dc bias again, and acting in conjunction is in specimen, acquisition contains the signal of specimen information, this signal that contains specimen information converts voltage signal to through the prime amplifier amplification, and change the frequency of reference channel by lock-in amplifier, measure this voltage signal by lock-in amplifier, thereby obtain the useful signal voltage of second harmonic, the useful signal of I-V second-order differential namely.
Further, be to adopt function generator to produce AC signal in the method, and change the frequency of reference channel by lock-in amplifier, thereby obtain the voltage signal of second harmonic, that is, and the useful signal of I-V second-order differential.
Further, also comprise in the method and adopt the environmental baseline control system to change environmental baseline (as temperature, grid-control voltage processed, illumination etc.), and measure the operation of I-V second-order differential, thereby obtain the I-V second-order differential with the change curve of external environmental condition.
A kind of I-V second-order differential measurement mechanism, it is characterized in that, it comprises that one has the bias-tee of dividing potential drop effect, the AC signal input port of this bias-tee is connected the function generator with the direct current signal input port and is connected with dc signal source, its output port is connected in series successively with sample, prime amplifier and lock-in amplifier, and described lock-in amplifier connects through reference channel function generator.
Described bias-tee comprises inductance, the first resistance, the second resistance and electric capacity, described inductance one end is connected with the direct current signal input port, the other end is connected with output port with electric capacity one end, the electric capacity other end respectively with the first resistance be connected resistance one end and be connected, the first resistance other end is connected with the AC signal input port, the second resistance other end ground connection.
Further, also being provided with the environmental baseline control system at the sample place controls the external condition of sample.
The sample input voltage is V
in, principle of the present invention is as follows:
Signal carries the output current after sample message
, with dc offset voltage
Centered by, with
The Taylor expansion of perturbation:
Order:
Wherein a,
,
Be respectively amplitude and the frequency of ac input signal, and the DC input voitage value.
As seen from the above equation, the existing direct current signal part of marking current has again each harmonic wave part of signal frequency, and wherein the amplitude of fundamental frequency is A
1, the amplitude of second harmonic is A
2Marking current is converted to through after prime amplifier the voltage signal that multiplies each other with feedback resistance, and then gathers A by lock-in amplifier
1Or A
2Be worth, just can directly obtain the useful signal of I-V second-order differential.
Advantage of the present invention is at least: contain voltage divider in (1) bias-tee alternating current path, AC signal is provided by function generator, and very little through amplitude after dividing potential drop, has reduced its impact on the direct current biasing signal, has improved signal to noise ratio (S/N ratio); (2) directly measure the I-V second-order differential, directly measure the I-V second-order differential with the change curve of external condition, method is simple, visual result.Utilize the present invention can judge intuitively, easily electronics main mechanism in transport process.
Description of drawings
Fig. 1 is the structural representation of I-V second-order differential measurement mechanism in the specific embodiment of the invention;
Fig. 2 is the structural representation of Bias-tee in the specific embodiment of the invention;
In figure, the implication of each Reference numeral is as follows: 1-function generator, 2-bias-tee, 3-dc signal source, 4-specimen, 5-prime amplifier, 6-lock-in amplifier, 7-reference channel, 8-environmental baseline control system, 9-AC signal input port, 10-resistance, 11-resistance, 12-direct current signal input port, 13-inductance, 14-electric capacity, 15-output port.
Embodiment
Below in conjunction with accompanying drawing 1 and a preferred embodiment, technical scheme of the present invention is further described.
Consult Fig. 1 and Fig. 2, the present embodiment course of work is as follows: function generator 1 provides selected frequency
AC signal, enter bias-tee 2 by ac input end mouth 9, through arriving output port 15 after resistance 10, resistance 11 dividing potential drop effects and electric capacity 14 stopping direct current effects, the Dc bias that dc signal source 3 provides enters bias-tee 2 by direct-flow input end mouth 12, superpose with AC signal through after the obstruct alternating current function of inductance 13, through output port 15 actings in conjunction in specimen 4, the signal that contains specimen information converts voltage signal to through prime amplifier 5 amplifications, change the frequency multiplication frequency of reference channel 7 by lock-in amplifier 6, as
, just can directly obtain the useful signal of I-V second-order differential.
Further, also can adopt the environmental baseline control system to change environmental baseline (as temperature, grid-control voltage processed, illumination etc.) in the present embodiment, and measure the operation of I-V second-order differential, thereby obtain the I-V second-order differential with the change curve of external environmental condition.
Design of the present invention has significant advantage,, utilizes the method that is, not only can measure easily and efficiently the I-V second-order differential of sample with the change curve of external condition, and has very high precision by the I-V second-order differential that said method is measured.
Be only below concrete exemplary applications of the present invention, the protection domain of inventing is not constituted any limitation.All employing equivalents or equivalence are replaced and the technical scheme of formation, all drop in rights protection scope of the present invention.
Claims (3)
1. I-V second-order differential measurement method, it is characterized in that, the method is: will adopt function generator to produce, AC signal with selected frequency by the alternating current-direct current totalizer dividing potential drop with dividing potential drop effect after, superpose with Dc bias again, and acting in conjunction is in specimen, acquisition contains the signal of specimen information, this signal that contains specimen information converts voltage signal to through the prime amplifier amplification, and change the frequency of reference channel by lock-in amplifier, measure this voltage signal by lock-in amplifier, thereby obtain the voltage signal of second harmonic, the useful signal of I-V second-order differential namely,
Described alternating current-direct current totalizer comprises inductance (13), the first resistance (10), the second resistance (11) and electric capacity (14), described inductance (13) one ends are connected with direct current signal input port (12), the other end is connected 15 with electric capacity (14) one ends with output port) be connected, electric capacity (14) other end respectively with the first resistance (10) be connected resistance (11) one ends and be connected, the first resistance (10) other end is connected with AC signal input port (9), the second resistance (11) other end ground connection.
2. I-V second-order differential measurement method as claimed in claim 1, is characterized in that: also change environmental baseline by the environmental baseline control system in the method, and measure the I-V second-order differential, thereby obtain the I-V second-order differential with the change curve of external environmental condition.
3. I-V second-order differential measurement mechanism, it is characterized in that, it comprises that one has the alternating current-direct current totalizer (2) of dividing potential drop effect and the environmental baseline control system that is used for changing sample environmental baseline of living in, the AC signal input port of this alternating current-direct current totalizer (2) is connected function generator (1) and is connected 3 with dc signal source with the direct current signal input port) connect, its output port is connected in series successively with sample (4), prime amplifier (5) and lock-in amplifier (6), and described lock-in amplifier (6) connects through reference channel (7) function generator (1); Described alternating current-direct current totalizer comprises inductance (13), the first resistance (10), the second resistance (11) and electric capacity (14), described inductance (13) one ends are connected with direct current signal input port (12), the other end is connected 15 with electric capacity (14) one ends with output port) be connected, electric capacity (14) other end respectively with the first resistance (10) be connected resistance (11) one ends and be connected, the first resistance (10) other end is connected with AC signal input port (9), the second resistance (11) other end ground connection.
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| CN 201110232212 CN102323486B (en) | 2011-08-15 | 2011-08-15 | I-V second-order differential measurement method and device |
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| CN 201110232212 CN102323486B (en) | 2011-08-15 | 2011-08-15 | I-V second-order differential measurement method and device |
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| CN102323486A CN102323486A (en) | 2012-01-18 |
| CN102323486B true CN102323486B (en) | 2013-06-26 |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101446620A (en) * | 2007-11-28 | 2009-06-03 | 中国科学院半导体研究所 | Battery-based semiconductor AC differential conductive scanning measurement system |
| CN101666828A (en) * | 2009-09-25 | 2010-03-10 | 南昌航空大学 | Conductance and differential conductance synchronous measuring device and method |
| CN101726274A (en) * | 2009-12-01 | 2010-06-09 | 中国科学院上海微系统与信息技术研究所 | Method for determining width offset |
-
2011
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101446620A (en) * | 2007-11-28 | 2009-06-03 | 中国科学院半导体研究所 | Battery-based semiconductor AC differential conductive scanning measurement system |
| CN101666828A (en) * | 2009-09-25 | 2010-03-10 | 南昌航空大学 | Conductance and differential conductance synchronous measuring device and method |
| CN101726274A (en) * | 2009-12-01 | 2010-06-09 | 中国科学院上海微系统与信息技术研究所 | Method for determining width offset |
Non-Patent Citations (5)
| Title |
|---|
| 单壁碳纳米管微分电导在高压和强磁场下的实验研究;蔡建臻等;《物理学报》;20061231;第55卷(第12期);第6586页 * |
| 梁涛等.基于虚拟仪器的纳米器件电学性能测量系统的实现.《北京大学学报(自然科学版)》.2008,第44卷(第6期),第877-880页. * |
| 电导及微分电导测量方法的研究;肖文波等;《电测与仪表》;20090930;第46卷(第9期);第10-13页及图1 * |
| 肖文波等.电导及微分电导测量方法的研究.《电测与仪表》.2009,第46卷(第9期),第10-13页及图1. |
| 蔡建臻等.单壁碳纳米管微分电导在高压和强磁场下的实验研究.《物理学报》.2006,第55卷(第12期),第6586页. |
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