CN102313869B - Method for settling and screening three-terminal fixed voltage regulation integrated circuit - Google Patents
Method for settling and screening three-terminal fixed voltage regulation integrated circuit Download PDFInfo
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- CN102313869B CN102313869B CN201110220586.9A CN201110220586A CN102313869B CN 102313869 B CN102313869 B CN 102313869B CN 201110220586 A CN201110220586 A CN 201110220586A CN 102313869 B CN102313869 B CN 102313869B
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Application Number | Priority Date | Filing Date | Title |
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CN201110220586.9A CN102313869B (en) | 2011-08-03 | 2011-08-03 | Method for settling and screening three-terminal fixed voltage regulation integrated circuit |
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CN201110220586.9A CN102313869B (en) | 2011-08-03 | 2011-08-03 | Method for settling and screening three-terminal fixed voltage regulation integrated circuit |
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CN102313869A CN102313869A (en) | 2012-01-11 |
CN102313869B true CN102313869B (en) | 2014-07-02 |
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CN201110220586.9A Active CN102313869B (en) | 2011-08-03 | 2011-08-03 | Method for settling and screening three-terminal fixed voltage regulation integrated circuit |
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Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN107238787A (en) * | 2017-05-16 | 2017-10-10 | 浦北县富通电子科技有限公司 | The Incoming Quality Control method of semiconductor |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2042205U (en) * | 1988-03-02 | 1989-08-02 | 济南市半导体元件实验所 | Dual-purpose automatic/manual transistor tester |
CN2303306Y (en) * | 1996-06-11 | 1999-01-06 | 崔本柱 | Instrument for testing comprehensive parameters of transistor |
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- 2011-08-03 CN CN201110220586.9A patent/CN102313869B/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2042205U (en) * | 1988-03-02 | 1989-08-02 | 济南市半导体元件实验所 | Dual-purpose automatic/manual transistor tester |
CN2303306Y (en) * | 1996-06-11 | 1999-01-06 | 崔本柱 | Instrument for testing comprehensive parameters of transistor |
Non-Patent Citations (1)
Title |
---|
孙忠献.XJ4810型半导体管特性图示仪主要性能与使用.《电子测量》.2007,167-171. * |
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CN102313869A (en) | 2012-01-11 |
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Legal Events
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CP03 | Change of name, title or address |
Address after: Room 201, Room 13, Tuanyi Village, Binhu District, Wuxi City, Jiangsu Province Co-patentee after: Jiangsu Donghai Semiconductor Technology Co., Ltd. Patentee after: Zhao Zhenhua Address before: 214002 Health Li 8 402, Chong'an District, Wuxi City, Jiangsu Province Co-patentee before: Wuxi Roum Semiconductor Technology Co., Ltd. Patentee before: Zhao Zhenhua |
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CP03 | Change of name, title or address | ||
CP01 | Change in the name or title of a patent holder |
Address after: Room 201, Room 13, Tuanyi Village, Binhu District, Wuxi City, Jiangsu Province Patentee after: Zhao Zhenhua Patentee after: Jiangsu Donghai Semiconductor Co., Ltd Address before: Room 201, Room 13, Tuanyi Village, Binhu District, Wuxi City, Jiangsu Province Patentee before: Zhao Zhenhua Patentee before: Jiangsu Donghai Semiconductor Technology Co., Ltd |
|
CP01 | Change in the name or title of a patent holder |