CN102306238A - Product test method based on adjacent unit double faults - Google Patents

Abstract

The invention discloses a product test method based on adjacent unit double faults. The product test method comprises the following specific steps: (1) establishing an adjacent unit double fault set of a system according to a correlation model of the system; (2) establishing and simplifying the adjacent unit double fault correlation matrix of the system to obtain a simplified matrix; (3) evaluating the adjacent unit double fault diagnosis capability of the system; (4) optimizing a test for fault detection and establishing the detection policy of the adjacent unit double faults; (5) optimizing a test for fault isolation and establishing the isolation policy of the adjacent unit double faults; and (6) carrying out a product test. According to the invention, a system fault diagnosis theory of single fault is expanded to the multi-fault mode of the adjacent unit double faults on the basis of correlation model of the system; and by establishing the adjacent unit double faults, the identification method of the adjacent unit double fault of the system is provided, and the correlation matrix of the adjacent unit double faults of the system is established.

Description

A kind of product test method based on the two faults of adjacent cells

Technical field

The inventive method relates to a kind of product test method based on the two faults of adjacent cells, belongs to the testability technical field.

Background technology

Correlation Theory is the important method that is widely used in the testability design field at present.Correlation Theory supposes based on single fault, on the basis of the correlation figure representation model of system, sets up the correlation models of system failure unit and test, through the correlativity reasoning, optimizes cycle tests, the diagnosis policy that is optimized.Can formulate diagnosis policy quickly and efficiently through this theoretical method, realize quick diagnosis the system failure.

In engineering reality, system often has a plurality of faults to take place, and diagnoses relative complex, the diagnostic method and the inapplicable multiple faults field based on the single fault hypothesis of original maturation.Situation about often breaking down simultaneously during the system real work, the i.e. two faults of adjacent cells with two adjacent cells.At present, the multiple faults pattern to the two faults of adjacent cells does not also have effective diagnosis capability evaluation and diagnosis policy method for building up.

Summary of the invention

The purpose of the inventive method is in order to address the above problem; A kind of product test method based on the two faults of adjacent cells has been proposed; On correlation figure representation model and system correlation matrix basis; Adopt the two Fault Identification of adjacent cells to go out the two failure collection of the whole adjacent cells of system; Obtain the two failure dependency matrixes of adjacent cells according to the two failure collection of adjacent cells and system's correlation matrix; Diagnosis capability according to the two failure dependency matrix evaluating systems of the adjacent cells of setting up; Optimize fault detect and isolate with test; And set up the detection and the isolation diagnostic strategy of the two faults of adjacent cells; Use diagnosis policy then, carry out product test.

The present invention is a kind of product test method based on the two faults of adjacent cells, comprises following concrete steps:

Step 1:, set up the two failure collection of adjacent cells of system according to the correlation models of system;

Step 2: set up the two failure dependency matrixes of adjacent cells of system and simplify, obtain simplifying matrix;

Step 3: the two trouble diagnosibilities of the adjacent cells of evaluating system;

Step 4: preferred fault detect is set up the detection strategy of the two faults of adjacent cells with test;

Step 5: preferred fault isolation is set up the isolation strategy of the two faults of adjacent cells with test;

Step 6: carry out product test.

The invention has the advantages that:

(1) the present invention is on the correlation models basis of system; The system fault diagnosis theory of single fault is expanded in the multiple faults pattern of the two faults of adjacent cells; Through setting up the two faults of adjacent cells; Provide the recognition methods of the two faults of system's adjacent cells, set up the two failure dependency matrixes of system's adjacent cells;

(2) the present invention has provided the assessment models of the two faults of system's adjacent cells, can be on the basis of the two fault tests of preferred adjacent cells two Fault Diagnosis strategies of formulation system adjacent cells fast;

(3) the present invention has filled up the blank of two Fault Diagnosis capability evaluations of adjacent cells in system's multiple faults pattern and diagnosis policy method for building up.

Description of drawings

The flow process of Fig. 1 the inventive method;

Fig. 2 embodiment of the invention is set up the flow process of the two failure dependency matrixes of adjacent cells of system;

The two fault detects of the preferred adjacent cells of Fig. 3 embodiment of the invention are with the flow process of test;

The two fault isolation of the preferred adjacent cells of Fig. 4 embodiment of the invention are with the flow process of test;

The correlation figure representation model of Fig. 5 embodiment of the invention Automobile Detection device.

Embodiment

To combine accompanying drawing and embodiment that the present invention is done further detailed description below.

Prerequisite of the present invention is: the correlation figure representation model of known system (product) and based on system's correlation matrix of single fault hypothesis, in addition, the present invention does not consider reliability and the influence of testing expense to preferred test and formulation diagnosis policy.

The present invention is a kind of product test method based on the two faults of adjacent cells, and flow process comprises following concrete steps as shown in Figure 1:

Step 1:, set up the two failure collection of adjacent cells of system according to the correlation models of system;

The two failure collection of the adjacent cells of system are:

CF＝{cf _r|r＝1～t} (1)

In the formula, CF representes the two failure collection of the adjacent cells of system; Cf _rRepresent the two faults of r group adjacent cells, the two faults of adjacent cells are one group of situation that adjacent cells breaks down simultaneously, and one group of two fault of adjacent cells is corresponding to one group of adjacent cells cf, cf=(f _g, f _h), f wherein _g, f _hRepresent any two adjacent trouble units, if f _g, f _h∈ F, F represent the trouble unit collection of system, and f _gAnd f _hInput and output be respectively

When satisfying

Or

The time, claim that cf is one group of adjacent cells; T representes the sum of the two faults of adjacent cells.

Wherein, system only considers two states under the two faults of adjacent cells: 1. normal condition, and system's component units is all normal, non-fault; 2. malfunction, system has and has only one group of adjacent cells to break down simultaneously.

The concrete steps of the two failure collection of adjacent cells of setting up system are following:

(1), finds the directed line segment of a band arrow according to the correlation figure representation model of system;

(2) connect directed line segment two trouble units from beginning to end and constitute the two faults of an adjacent cells, it is added in the two failure collection in adjacent unit;

(3) repeating step (1) and (2) are till all directed line segments of traversal are found out the two faults of adjacent cells to some extent;

(4) the two faults of adjacent cells identical in the two failure collection of adjacent cells are merged into the two faults of an adjacent cells, obtain the two failure collection of final adjacent cells.

Wherein, form is described shown in the two failure collection employing tables 1 of the system's adjacent cells that identifies, and comprises sequence number, the two faults of adjacent cells, three contents of reduced representation.

The two faults of the adjacent cells of table 1 system

Sequence number	The two failure-descriptions of adjacent cells	Reduced representation

Step 2: set up the two failure dependency matrixes of adjacent cells of system and simplify, obtain simplifying matrix;

(1) sets up the two failure dependency matrixes of adjacent cells of system;

The two failure dependency matrixes of adjacent cells are:

D _c＝R(CF，T) (2)

In the formula, D _cThe two failure dependency matrixes of expression adjacent cells; CF representes the two failure collection of the adjacent cells of the two failure dependency matrixes of adjacent cells; T representes the test set of the two failure dependency matrixes of adjacent cells, T={t _j| j=1～n}, t _jRepresent j test, n representes the sum tested; R representes the two faults of adjacent cells and the set of testing correlative relationship, R={d _Rj| r=1～t, j=1～n}, d _RjThe two fault cf of expression adjacent cells _rWith test t _jCorrelative relationship, if satisfy following condition:

${\∀t}_j\∈T,$ $\∃(d_{\mathrm{rj}}=1)\⇒(d_{\mathrm{gj}}+d_{\mathrm{hj}}=1)---\left(3\right)$

With

$\∀t_j\∈T,$ $\∃(d_{\mathrm{gj}}+d_{\mathrm{hj}}=1)\⇒(d_{\mathrm{rj}}=1)---\left(4\right)$

Cf then _rWith t _jBe correlated with, i.e. d _Rj=d _Gj+ d _HjThereby, obtain the correlative relationship of adjacent cells and test.Wherein, "+" presentation logic exclusive disjunction, d _GjExpression f _gWith t _jCorrelative relationship, d _HjExpression f _hWith t _jCorrelative relationship.

According to the two failure collection of the adjacent cells that obtains in known system's correlation matrix and the step 1, set up the two failure dependency matrixes of adjacent cells of system, flow process as shown in Figure 2, concrete steps are following:

(a), set up the two failure dependency matrixes of adjacent cells of a blank according to two failure collection of adjacent cells and test;

(b) from the two ffault matrix of adjacent cells, select delegation's blank line;

(c) two trouble units finding out the two faults of adjacent cells in the selected blank line corresponding row vector in system's correlation matrix;

(d) element with two row vectors carries out exclusive disjunction successively, obtains new row vector;

(e) new capable vector is inserted selected blank line;

(f) if there is blank line in the two ffault matrix of adjacent cells, then forward step (b) to, till all blank lines dispose in the two ffault matrix of adjacent cells, obtain the two failure dependency matrixes of adjacent cells of system at last.

(2) the two failure dependency matrixes of the adjacent cells of simplified system obtain simplifying matrix;

The two failure dependency matrixes of adjacent cells to a last step obtains are simplified, the two failure dependency matrixes of the adjacent cells that obtains simplifying, and it is following specifically to simplify step:

(i) the two fault ambiguity group of identification adjacent cells; Wherein, The two fault ambiguity group of adjacent cells are corresponding to the two failed row of two or more sets identical in correlation matrix adjacent cells, with the merging becoming of the element in ambiguity group delegation, till all ambiguity group merge completion;

Wherein, in the same ambiguity group, different adjacent cells separate with " | ".

(ii) the redundant testing group of identification is promptly discerned two identical in correlation matrix row or multiple rows, and the element in the redundancy testing group is merged becomes row, till all redundancy testing combinations and accomplishing.

Wherein, in the same redundancy testing group, different tests separate with " | ".

Step 3: the two trouble diagnosibilities of the adjacent cells of evaluating system;

The evaluate parameter of the two trouble diagnosibilities of system's adjacent cells is following:

(a) the two fault detect rates of adjacent cells

The two fault detect rates of adjacent cells are meant the ratio of two fault (being adjacent cells) numbers of the detected adjacent cells of ability and the two fault total numbers of adjacent cells, represent with percentage, for:

$\mathrm{AFDR}=\frac{U_{\mathrm{AFD}}}{U_{\mathrm{AF}}}\×100\%---\left(5\right)$

In the formula: AFDR representes the two fault detect rates of adjacent cells; U _AFThe total number of the two faults of adjacent cells in the expression system; U _AFDThe number of the adjacent cells pair faults that test can detect is selected in expression for use.

(b) the two Percent Isolateds of adjacent cells

The two Percent Isolateds of adjacent cells are meant the two number of defects of adjacent cells of the unique isolation of ability and the ratio of the two number of defects of detected adjacent cells, represent with percentage, for:

$\mathrm{AFIR}=\frac{U_{\mathrm{AFI}}}{U_{\mathrm{AFD}}}\×100\%---\left(6\right)$

In the formula: AFIR representes the two Percent Isolateds of adjacent cells; U _AFDSee formula (5); U _AFIThe number of the two faults of adjacent cells of the unique isolation of test ability is selected in expression for use.

According to above-mentioned parameter, the appraisal procedure of the two trouble diagnosibilities of system's adjacent cells is following:

1. the line number of the two failure dependency matrixes of the adjacent cells of statistical system promptly obtains the total number U of the two faults of system's adjacent cells _AF

2. the non-full zero line number of the two failure dependency matrixes of the adjacent cells of statistical system promptly obtains to test the number U of the two faults of adjacent cells that can detect _AFD

3. acquire the verification and measurement ratio of the two faults of adjacent cells through formula (5);

4. to simplify blur level in the matrix be 1 and the line number of non-full zero to statistics, promptly obtains the number U of the two faults of adjacent cells that test can unique isolation _AFI

5. acquire the isolation rate of the two faults of adjacent cells through formula (6).

Step 4: preferred fault detect is set up the detection strategy of the two faults of adjacent cells with test;

Concrete steps are following:

(a) test used of the two fault detects of preferred adjacent cells;

The two fault detects of preferred adjacent cells are with the flow process of testing as shown in Figure 3, and are specific as follows:

1. reject complete zero row of simplifying in the matrix;

2. regard the two faults of adjacent cells in the matrix as single fault, adopt existing single fault preferred test method, the test that preferred fault detect is used, key step is following:

1) calculates the fault detect weights W that detects with each test in the matrix according to formula (7) _FDj

$W_{\mathrm{FDj}}=\underset{i=1}{\overset{m}{\mathrm{\Σ}}}{d}_{\mathrm{ij}}---\left(7\right)$

In the formula, W _FDjThe detection weights of representing j test; M representes to detect the total line number with matrix.

2) each fault detect weights are relatively selected the maximum test of fault detect weights, the test of using as fault detect; If there are a plurality of satisfactory tests, can choose the test that one of them is used as fault detect wantonly;

3) if there is 0 element in these test place row, then 0 element being expert at constitutes new submatrix, repeating step 1), 2), continue to select follow-up fault detect with test, in the place of new selection test is listed as, do not have 0 element till.

(b) set up the detection strategy of the two faults of adjacent cells;

With test, set up the detection strategy of the two faults of adjacent cells according to the detection that optimizes, this strategy adopts form to describe, and pattern is as shown in table 4.

The two fault detect tables of table 4 adjacent cells

In the table 4, comprise 6 hurdles altogether, the description of contents on each hurdle is following:

1. hurdle: the numbering of the test sequence of system for filling fault detect;

2. hurdle: the title of filling in test;

3. hurdle: fill in output branch, comprise normal branch and undesired branch, divide two row to fill in;

4. hurdle: fill in the sequence number of next step test, fill in normal branch corresponding sequence number earlier, fill in the corresponding sequence number of undesired branch again, do not fill in " nothing " when having next step;

5. hurdle: fill in testing result, detect when not finishing, fill in " continuation " when Pretesting; Detect when finishing, the title or the system of filling in the two faults of detected adjacent cells are normal; Have complete zero row in the matrix if simplify, two faults of the undetectable adjacent cells that then will reject and system normally are considered as an ambiguity group, are filled up to testing result.

Step 5: preferred fault isolation is set up the isolation strategy of the two faults of adjacent cells with test;

Concrete steps are following:

(a) the two fault isolation of preferred adjacent cells are with test;

The two fault isolation of preferred adjacent cells are with the flow process of testing as shown in Figure 4, and are specific as follows:

1. reject complete zero row of simplifying matrix;

2. regard the two faults of adjacent cells in the matrix as single fault, adopt existing single fault preferred test method, the test that preferred fault isolation is used, key step is following:

1) calculates each fault isolation weights W that tests in the current correlation matrix according to formula (8) _FIj

$W_{\mathrm{FIj}}=N_j^1{N}_j^0---\left(8\right)$

In the formula, W _FIjThe isolation weights of representing j test;

Element was 1 number during the test place was listed as in the representing matrix;

Element was 0 number during the test place was listed as in the representing matrix.

2) fault isolation weights are relatively selected the maximum test of fault isolation weights, the test of using as fault detect; If there are a plurality of satisfactory tests, can choose the test that one of them is used as fault isolation wantonly;

3) according to 0 element and 1 element in these test place row; Matrix is divided into 2 sub-matrices; If submatrix is not a row vector; Then need continue preferred the isolation according to submatrix with test; Be repeating step 1), 2); And continue to cut apart matrix, till all submatrixs that obtain all are row vector.

(b) set up the two The Fault Isolation Strategy of adjacent cells;

With test, confirm the isolation strategy of the two faults of adjacent cells according to the isolation that optimizes.This strategy adopts form to describe, and pattern is as shown in table 5.

The two fault isolation tables of table 5 adjacent cells

In the table 5, comprise 6 hurdles altogether, the description of contents on each hurdle is following:

1. hurdle: the numbering of the test sequence of system for filling fault isolation;

2. hurdle: the title of filling in test;

3. hurdle: fill in output branch, comprise normal branch and undesired branch, divide two row to fill in;

4. hurdle: fill in the sequence number of next step test, fill in normal branch corresponding sequence number earlier, fill in the corresponding sequence number of undesired branch again, do not fill in " nothing " when having next step;

5. hurdle: fill in the isolation result who deserves system behind the Pretesting, isolate when not finishing, fill in " continuation "; Isolate when finishing, fill in the title of isolating two trouble units of the adjacent cells that or the two fault ambiguity group of adjacent cells.

Step 6: carry out product test;

The isolation strategy of the detection strategy of the two faults of the adjacent cells that obtains according to step 4, step 5, the two faults of adjacent cells is tested product, and concrete steps are following:

(1) with the two fault detect application of policies of the adjacent cells of product in product, obtain the testing result of product;

(2) if testing result is normal, and product does not exist the two faults of undetectable adjacent cells, then no longer continuation;

(3) if testing result is normal, and there are the two faults of undetectable adjacent cells in product, and then the products for further analysis put on record in record;

(4) if testing result is undesired, then start the two fault isolation routines of adjacent cells of product, the two The Fault Isolation Strategy of the adjacent cells of product are applied in the product, obtain the isolation result of product.

Embodiment:

It is that example is illustrated that the inventive method is selected certain Automobile Detection device for use, and this device comprises 9 trouble units and 7 tests, and its composition and description are shown in table 6 and table 7.

The trouble unit of certain Automobile Detection device of table 6 is formed and is described

Sequence number	The trouble unit title	Simplify title
			1	The CB513 socket	F1
2	WP7 electrical branch line	F2
			3	The CA-panel	F3
4	WP9 electrical branch line	F4
			5	WP8 electrical branch line	F5
6	Engine wiring harness	F6
			7	Engine bearing	F7
8	Green-ticket	F8
			9	Chip detector	F9

The test of certain Automobile Detection device of table 7 is formed and is described

Sequence number	Test name	Simplify title	Test description
					1	WP9 electrical branch line _ Tp1	T1	WP9 electrical branch line output test
2	CB513 socket _ Tp2	T2	CB513 socket output test
				3	Engine wiring harness _ Tp3	T3	Engine wiring harness output test
4	WP7 electrical branch line _ Tp4	T4	WP7 electrical branch line output test
				5	Green-ticket _ Tp5	T5	Green-ticket output test
6	Chip detector _ Tp6	T6	Chip detector output test
				7	Engine bearing _ Tp7	T7	Engine bearing output test

The present embodiment dissecting needle is set up adjacent pair of Fault Diagnosis Strategy to not considering the two trouble diagnosibilities of assessment adjacent cells under the influence factor situation.

The testability configuration of present case, promptly the correlation figure representation model of case as shown in Figure 5.Wherein, Ip1, Ip2 represent input port 1,2 respectively; Op1, Op2 represent output port 1,2 respectively; A unit module has one or more inputs, output port.

According to the correlation figure representation model, set up system's correlation matrix based on the single fault hypothesis, as shown in table 8.

The correlation matrix of table 8 case system

	T1	T2	T3	T4	T5	T6	T7
								F1
	1	1	0	0	0	0	0
								F2	0	0	1	1	1	1	0
F3	0	0	0	0	0	0	0
								F4	1	0	0	0	0	0	0
F5	0	0	0	0	0	0	0
								F6	0	0	1	0	1	1	0
F7	0	0	1	0	1	1	1
								F8	0	0	1	0	1	1	0
F9	0	0	1	0	1	1	0

Step 1: according to the correlation models of system, the two failure collection of the adjacent cells of recognition system;

According to the correlation figure representation model of system, the correlation matrix of system, and formula (1) is to the definition of the two faults of adjacent cells, discerns and two failure collection of adjacent cells that the system that obtains is whole, obtains the two faults of 8 groups of adjacent cells, and is as shown in table 9.

The two faults of adjacent cells that table 9 system is whole

Step 2: set up the two failure dependency matrixes of adjacent cells of system and simplify, obtain simplifying matrix;

(1) sets up the two failure dependency matrixes of adjacent cells of system

The two failure collection of adjacent cells that obtain according to step 1, and known system's correlation matrix are set up the two failure dependency matrixes of adjacent cells of system by formula (2), (3), (4), and are as shown in table 10.

The two failure dependency matrixes of the adjacent cells of table 10 case system

(2) the two failure dependency matrixes of the adjacent cells of simplified system obtain simplifying matrix

According to the two failure dependency matrixes of the adjacent cells of system shown in the table 10, it is simplified: system exist the two failed row of the identical adjacent cells of 3 row (F6, F5), (F6, F8) with (F9, F8), with its be merged into an ambiguity group (F6, F5) | (F6, F8) | (F9, F8).

Merge after the ambiguity group, there is the identical test T5 of 3 row in system, and T7 and T8 are merged into one group of T5|T7|T8, two failure dependency matrixes of the adjacent cells after the simplification such as table 11 with the test of redundancy.

Matrix is simplified in expression 11

Step 3: the two trouble diagnosibilities of the adjacent cells of evaluating system;

(a) the two fault detect rates of adjacent cells

Can know that by table 10 the two failure dependency matrix line numbers of the adjacent cells of system are 8, so the total number U of the two faults of adjacent cells _TFEqual 8; The non-full zero line number of the two failure dependency matrixes of the adjacent cells of system is 7, so through testing the number U of the two faults of adjacent cells that can detect _TFDBe 7, the two fault detect rates of adjacent cells that obtain system according to formula (5) are:

$\mathrm{TFDR}=\frac{U_{\mathrm{TFD}}}{U_{\mathrm{TF}}}\×100\%=\frac{7}{8}\×100\%=87.5\%.$

(b) the two Percent Isolateds of adjacent cells

Can know according to table 11, simplify blur level in the matrix and be 1 and the line number of non-full zero be 5, so through test can unique isolation the number U of the two faults of adjacent cells _TFIBe 5, the two Percent Isolateds of adjacent cells that obtain system according to formula (6) are:

$\mathrm{TFIR}=\frac{U_{\mathrm{TFI}}}{U_{\mathrm{TFD}}}\×100\%=\frac{5}{7}\×100\%=71.43\%.$

Step 4: preferred fault detect is set up the detection strategy of the two faults of adjacent cells with test

(a) test used of the two fault detects of preferred adjacent cells

From table 11, (F5 F3) can not detect the two faults of adjacent cells, and promptly (zero row matrix afterwards is as shown in table 13 entirely to reject this for F5, F3) the complete zero row of Suo Zai behavior.

Table 13 is rejected the matrix after this complete zero row

According to the matrix shown in the table 13, regard the two faults of adjacent cells in the matrix as single fault, adopt to have the single fault preferred detection now with the test in the preferred matrix of method of test, it is as shown in table 14 to utilize formula (7) to calculate each detection weights of testing.

The table 14 preferred detection detection weights of test

Can know W in the detection weights of first round calculating by table 14 _FD3,5,6Maximum is first test so select T3|T5|T6.Because have neutral element in the row at T3|T5|T6 place, constitute new submatrix so 0 element is expert at, continue to calculate detection weights, clearly W _FD1This moment is maximum, thus select T1 just can accomplish the detection that remains trouble unit, so the two fault detects of the adjacent cells that finally optimizes use test to be: { T3|T5|T6, T1}.

(b) set up the detection strategy of the two faults of adjacent cells

According to preferred detection test { T3|T5|T6; T1}; Confirm the detection strategy of the two faults of adjacent cells; Because there is complete zero row in the simplification matrix; Must be with the two fault (F5 of the undetectable adjacent cells of rejecting; F3) normally be considered as an ambiguity group with system, be filled up to testing result, the detection strategy of the two faults of final adjacent cells is as shown in Tble 15.

The detection strategy of the two faults of table 15 adjacent cells

Step 5: preferred fault isolation is set up the isolation strategy of the two faults of adjacent cells with test

(a) the two fault isolation of preferred adjacent cells are with test

According to the matrix shown in the table 13, regard the two faults of adjacent cells in the matrix as single fault, employing has single fault now preferably to be isolated with the test in the preferred matrix of method of test, and it is shown in table 16 to utilize formula (8) to calculate detection weights of respectively testing.

The preferred isolation weights of isolating of table 16 with test

Can know W by table 16 _FI1With W _FI5,7,8Be 6 maximums, the test of preferentially adopting fault detect to select for use is first test so select T3|T5|T6 for use; According to 0 element and 1 element in the row of test T3|T5|T6 place; Matrix is divided into 2 sub-matrices; The isolation weights of two sub-matrices correspond respectively to the isolation weights that sequence number in the table 16 2 and sequence number 3,4 are expert at; So the two fault isolation of the adjacent cells that finally optimizes use test to be: { T3|T5|T6; T2} and { T3|T5|T6; T4, T7}.

(b) set up the two The Fault Isolation Strategy of adjacent cells

{ T3|T5|T6, T2} is with { T7} confirms the isolation strategy of the two faults of adjacent cells, and is as shown in Tble 15 for T3|T5|T6, T4 with test according to preferred isolation.

The detection strategy of the two faults of table 15 adjacent cells

Step 6: carry out product test;

The isolation strategy of the detection strategy of the two faults of the adjacent cells that obtains according to step 4, step 5, the two faults of adjacent cells is tested product.

Claims (8)

1. the product test method based on the two faults of adjacent cells is characterized in that, comprises following concrete steps:

Step 1:, set up the two failure collection of adjacent cells of system according to the correlation models of system;

The two failure collection of the adjacent cells of system are:

CF＝{cf _r|r＝1～t} (1)

In the formula, CF representes the two failure collection of the adjacent cells of system; Cf _rRepresent the two faults of r group adjacent cells, the two faults of adjacent cells are one group of situation that adjacent cells breaks down simultaneously, and one group of two fault of adjacent cells is corresponding to one group of adjacent cells cf, cf=(f _g, f _h), f wherein _g, f _hRepresent any two adjacent trouble units, if f _g, f _h∈ F, F represent the trouble unit collection of system, and f _gAnd f _hInput and output be respectively

When satisfying

Or

The time, cf is one group of adjacent cells; T representes the sum of the two faults of adjacent cells;

Wherein, system only considers two states under the two faults of adjacent cells: 1. normal condition, and system's component units is all normal, non-fault; 2. malfunction, system has and has only one group of adjacent cells to break down simultaneously;

Step 2: set up the two failure dependency matrixes of adjacent cells of system and simplify, obtain simplifying matrix;

(1) sets up the two failure dependency matrixes of adjacent cells of system

The two failure dependency matrixes of adjacent cells are:

D _c＝R(CF，T) (2)

In the formula, D _cThe two failure dependency matrixes of expression adjacent cells; CF representes the two failure collection of the adjacent cells of the two failure dependency matrixes of adjacent cells; T representes the test set of the two failure dependency matrixes of adjacent cells, T={t _j| j=1～n}, t _jRepresent j test, n representes the sum tested; R representes the two faults of adjacent cells and the set of testing correlative relationship, R={d _Rj| r=1～t, j=1～n}, d _RjThe two fault cf of expression adjacent cells _rWith test t _jCorrelative relationship, if satisfy following condition:

$\∀t_j\∈T,$ $\∃(d_{\mathrm{rj}}=1)\⇒(d_{\mathrm{gj}}+d_{\mathrm{hj}}=1)---\left(3\right)$

With

$\∀t_j\∈T,$ $\∃(d_{\mathrm{gj}}+d_{\mathrm{hj}}=1)\⇒(d_{\mathrm{rj}}=1)---\left(4\right)$

Cf then _rWith t _jBe correlated with, i.e. d _Rj=d _Gj+ d _HjThereby, obtain the correlative relationship of adjacent cells and test; Wherein, "+" presentation logic exclusive disjunction, d _GjExpression f _gWith t _jCorrelative relationship, d _HjExpression f _hWith t _jCorrelative relationship;

(2) the two failure dependency matrixes of the adjacent cells of simplified system obtain simplifying matrix;

The two failure dependency matrixes of adjacent cells to a last step obtains are simplified, the two failure dependency matrixes of the adjacent cells that obtains simplifying;

Step 3: the two trouble diagnosibilities of the adjacent cells of evaluating system;

The evaluate parameter of the two trouble diagnosibilities of system's adjacent cells is:

(a) the two fault detect rates of adjacent cells;

The two fault detect rates of adjacent cells are meant the two faults of the detected adjacent cells of ability; The ratio of the two fault total numbers of number and adjacent cells is represented with percentage, for:

$\mathrm{AFDR}=\frac{U_{\mathrm{AFD}}}{U_{\mathrm{AF}}}\×100\%---\left(5\right)$

In the formula: AFDR representes the two fault detect rates of adjacent cells; U _AFThe total number of the two faults of adjacent cells in the expression system; U _AFDThe number of the adjacent cells pair faults that test can detect is selected in expression for use;

(b) the two Percent Isolateds of adjacent cells;

The two Percent Isolateds of adjacent cells are meant the two number of defects of adjacent cells of the unique isolation of ability and the ratio of the two number of defects of detected adjacent cells, represent with percentage, for:

$\mathrm{AFIR}=\frac{U_{\mathrm{AFI}}}{U_{\mathrm{AFD}}}\×100\%---\left(6\right)$

In the formula: AFIR representes the two Percent Isolateds of adjacent cells; U _AFIThe number of the two faults of adjacent cells of the unique isolation of test ability is selected in expression for use;

Step 4: preferred fault detect is set up the detection strategy of the two faults of adjacent cells with test;

Concrete steps are following:

(a) test used of the two fault detects of preferred adjacent cells;

Specific as follows:

1. reject complete zero row of simplifying in the matrix;

2. regard the two faults of adjacent cells in the matrix as single fault, adopt the single fault preferred test method, the test that preferred fault detect is used, key step is following:

1) obtains the fault detect weights W that detects with each test in the matrix according to formula (7) _FDj

$W_{\mathrm{FDj}}=\underset{i=1}{\overset{m}{\mathrm{\Σ}}}{d}_{\mathrm{ij}}---\left(7\right)$

In the formula, W _FDjThe detection weights of representing j test; M representes to detect the total line number with matrix;

2) each fault detect weights are relatively selected the maximum test of fault detect weights, the test of using as fault detect; If there are a plurality of satisfactory tests, optional one of them test of using as fault detect;

3) if there is 0 element in these test place row, then 0 element being expert at constitutes new submatrix, repeating step 1), 2), continue to select follow-up fault detect with test, in the place of new selection test is listed as, do not have 0 element till;

(b) set up the detection strategy of the two faults of adjacent cells

With test, set up the detection strategy of the two faults of adjacent cells according to the detection that optimizes;

Step 5: preferred fault isolation is set up the isolation strategy of the two faults of adjacent cells with test;

Concrete steps are following:

(a) the two fault isolation of preferred adjacent cells are with test;

Be specially:

1. reject complete zero row of simplifying matrix;

2. regard the two faults of adjacent cells in the matrix as single fault, adopt the single fault preferred test method, the test that preferred fault isolation is used, key step is following:

1) obtains each fault isolation weights W that tests in the current correlation matrix according to formula (8) _FIj

$W_{\mathrm{FIj}}=N_j^1{N}_j^0---\left(8\right)$

In the formula, W _FIjThe isolation weights of representing j test; Element was 1 number during the test place was listed as in the representing matrix;

Element was 0 number during the test place was listed as in the representing matrix;

2) fault isolation weights are relatively selected the maximum test of fault isolation weights, the test of using as fault detect; If there are a plurality of satisfactory tests, optional one of them test of using as fault isolation;

3) according to 0 element and 1 element in these test place row; Matrix is divided into 2 sub-matrices; If submatrix is not a row vector; Then need continue preferred the isolation according to submatrix with test; Repeating step 1), 2); And continue to cut apart matrix, till all submatrixs that obtain all are row vector;

(b) set up the two The Fault Isolation Strategy of adjacent cells;

With test, confirm the isolation strategy of the two faults of adjacent cells according to the isolation that optimizes;

Step 6: carry out product test;

The isolation strategy of the detection strategy of the two faults of the adjacent cells that obtains according to step 4, step 5, the two faults of adjacent cells is tested product.

2. a kind of product test method based on the two faults of adjacent cells according to claim 1 is characterized in that described step 1 is specially:

(1), finds the directed line segment of a band arrow according to the correlation figure representation model of system;

(2) connect directed line segment two trouble units from beginning to end and constitute the two faults of an adjacent cells, it is added in the two failure collection in adjacent unit;

(3) repeating step (1) and (2) are till all directed line segments of traversal are found out the two faults of adjacent cells to some extent;

(4) the two faults of adjacent cells identical in the two failure collection of adjacent cells are merged into the two faults of an adjacent cells, obtain the two failure collection of final adjacent cells.

3. a kind of product test method based on the two faults of adjacent cells according to claim 1 is characterized in that described step 2 (1) is specially:

(a), set up the two failure dependency matrixes of adjacent cells of a blank according to two failure collection of adjacent cells and test;

(b) from the two ffault matrix of adjacent cells, select delegation's blank line;

(c) two trouble units finding out the two faults of adjacent cells in the selected blank line corresponding row vector in system's correlation matrix;

(d) element with two row vectors carries out exclusive disjunction successively, obtains new row vector;

(e) new capable vector is inserted selected blank line;

(f) if there is blank line in the two ffault matrix of adjacent cells, then forward step (b) to, till all blank lines dispose in the two ffault matrix of adjacent cells, obtain the two failure dependency matrixes of adjacent cells of system at last.

4. a kind of product test method based on the two faults of adjacent cells according to claim 1 is characterized in that described step 2 (2) is specially:

(i) the two fault ambiguity group of identification adjacent cells; Wherein, The two fault ambiguity group of adjacent cells are corresponding to the two failed row of two or more sets identical in correlation matrix adjacent cells, with the merging becoming of the element in ambiguity group delegation, till all ambiguity group merge completion;

Wherein, in the same ambiguity group, different adjacent cells separate with " | ";

(ii) the redundant testing group of identification is promptly discerned two identical in correlation matrix row or multiple rows, and the element in the redundancy testing group is merged becomes row, till all redundancy testing combinations and accomplishing;

Wherein, in the same redundancy testing group, different tests separate with " | ".

5. a kind of product test method based on the two faults of adjacent cells according to claim 1 is characterized in that described step 3 is specially:

1. the line number of the two failure dependency matrixes of the adjacent cells of statistical system promptly obtains the total number U of the two faults of system's adjacent cells _AF

2. the non-full zero line number of the two failure dependency matrixes of the adjacent cells of statistical system promptly obtains to test the number U of the two faults of adjacent cells that can detect _AFD

3. acquire the verification and measurement ratio of the two faults of adjacent cells through formula (5);

4. to simplify blur level in the matrix be 1 and the line number of non-full zero to statistics, promptly obtains the number U of the two faults of adjacent cells that test can unique isolation _AFI

5. acquire the isolation rate of the two faults of adjacent cells through formula (6).

6. a kind of product test method based on the two faults of adjacent cells according to claim 1 is characterized in that the detection strategy of described step 4 (b) is described through form 1, is specially:

The two fault detect tables of table 1 adjacent cells

In the table, comprise 6 hurdles altogether, the content on each hurdle is:

1. hurdle: the numbering of the test sequence of system for filling fault detect;

2. hurdle: the title of filling in test;

3. hurdle: fill in output branch, comprise normal branch and undesired branch, divide two row to fill in;

4. hurdle: fill in the sequence number of next step test, fill in normal branch corresponding sequence number earlier, fill in the corresponding sequence number of undesired branch again, do not fill in " nothing " when having next step;

5. hurdle: fill in testing result, detect when not finishing, fill in " continuation " when Pretesting; Detect when finishing, the title or the system of filling in the two faults of detected adjacent cells are normal; Have complete zero row in the matrix if simplify, two faults of the undetectable adjacent cells that then will reject and system normally are considered as an ambiguity group, are filled up to testing result.

7. a kind of product test method based on the two faults of adjacent cells according to claim 1 is characterized in that the isolation strategy of described step 5 (b) is described through form 2, is specially:

The two fault isolation tables of table 2 adjacent cells

In the table, comprise 6 hurdles altogether, the description of contents on each hurdle is following:

1. hurdle: the numbering of the test sequence of system for filling fault isolation;

2. hurdle: the title of filling in test;

3. hurdle: fill in output branch, comprise normal branch and undesired branch, divide two row to fill in;

4. hurdle: fill in the sequence number of next step test, fill in normal branch corresponding sequence number earlier, fill in the corresponding sequence number of undesired branch again, do not fill in " nothing " when having next step;

5. hurdle: fill in the isolation result who deserves system behind the Pretesting, isolate when not finishing, fill in " continuation "; Isolate when finishing, fill in the title of isolating two trouble units of the adjacent cells that or the two fault ambiguity group of adjacent cells.

8. a kind of product test method based on the two faults of adjacent cells according to claim 1 is characterized in that described step 6 is specially:

(1) with the two fault detect application of policies of the adjacent cells of product in product, obtain the testing result of product;

(2) if testing result is normal, and product does not exist the two faults of undetectable adjacent cells, then no longer continuation;

(3) if testing result is normal, and there are the two faults of undetectable adjacent cells in product, and then the products for further analysis put on record in record;

(4) if testing result is undesired, then start the two fault isolation routines of adjacent cells of product, the two The Fault Isolation Strategy of the adjacent cells of product are applied in the product, obtain the isolation result of product.

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