CN102214130A - Test device and test method - Google Patents
Test device and test method Download PDFInfo
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- CN102214130A CN102214130A CN2010101412918A CN201010141291A CN102214130A CN 102214130 A CN102214130 A CN 102214130A CN 2010101412918 A CN2010101412918 A CN 2010101412918A CN 201010141291 A CN201010141291 A CN 201010141291A CN 102214130 A CN102214130 A CN 102214130A
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Abstract
The invention provides a test device and a test method. The test device is used for detecting an embedded system and comprises an interface, a storage unit and a processor, wherein, the interface is coupled with the embedded system in a pluggable manner; the storage unit is used for storing data; and the processor is used for obtaining a test message of the embedded system corresponding to a test instruction through the interface according to a starting signal and then storing the test message in the storage unit when the interface is coupled with the embedded system.
Description
Technical field
The present invention relates to a kind of proving installation and method of testing, particularly relate to and a kind ofly be used for detecting an embedded system and can significantly reduce test required manpower and the proving installation of time and method of testing.
Background technology
Electronic product all can detect through complicated quality or fiduciary level before dispatching from the factory, and avoids defective products to flow into the market, to guarantee product competitiveness.Generally speaking, in order to promote testing efficiency, manufacturer normally tests a plurality of devices to be measured simultaneously.And testing process is to make each device to be measured carry out specific function (or running), and whether detecting it again, whether correctly to finish or operate the result correct.If have a device to be measured to represent that product has flaw, therefore need record problem origination point, with the improvement of being correlated with by test.In this case, the tester can not carry out identical test by the device of testing to be measured again, and passes through the important information of specific tool acquisition test process, with the decision problem point.Yet when testing again, identical result not necessarily repeats to take place, and causes and need expend many manpowers with the time is carried out debug, and influence is tested and production efficiency.
In view of this, the test mode of electronic product has improved necessity in fact.
Summary of the invention
Therefore, fundamental purpose of the present invention promptly is to provide a kind of proving installation and method of testing.
The present invention discloses a kind of proving installation, is used for detecting an embedded system, includes an interface, but is used for coupling this embedded system with pluggable mode; One storage element is used for storage data; And a processor, be used for when this interface is coupled to this embedded system, start signal according to one, obtain the test message of this embedded system by this interface, and should test message and be stored in this storage element corresponding to a test instruction.
The present invention also discloses a kind of method of testing, be used for detecting an embedded system, include when a proving installation is coupled to this embedded system, start signal according to one, this embedded system is tested message corresponding to one of a test instruction be sent to this proving installation, to be stored in this proving installation.
Description of drawings
Fig. 1 is the synoptic diagram of the embodiment of the invention one proving installation.
Fig. 2 is the synoptic diagram of the embodiment of the invention one testing process.
Fig. 3 is the running synoptic diagram of storage unit stores data among Fig. 1.
Fig. 4 is the alternate embodiment synoptic diagram of the proving installation of Fig. 1.
The reference numeral explanation
10 proving installations
100 embedded systems
102 interfaces
104 storage elements
106 processors
EN starts signal
The CMD_TST test instruction
MSG tests message
20 testing processs
200,202,204,206,208,210 steps
The up-to-date test message of MSG_new
The oldest test message of MSG_old
408 instruction storage elements
410 storeies
Embodiment
Please refer to Fig. 1, Fig. 1 is the synoptic diagram of the embodiment of the invention one proving installation 10.Proving installation 10 is used for detecting an embedded system 100, and it includes an interface 102, a storage element 104 and a processor 106.Embedded system 100 can be electronic products such as computer system, mobile phone, Game device, audio-visual devices, digital camera camera, information household appliances (Information Appliance), advanced medical equipment.But interface 102 is used for coupling embedded system 100 with pluggable mode, and it can be common signal transmission terminal such as USB (universal serial bus), VGA, IEEE 1394, can also be the splicing ear that is specific to embedded system 100.When interface 102 is coupled to embedded system 100, processor 106 can start signal EN according to one, obtain the test message MSG of embedded system 100 by interface 102, and will test message MSG and be stored in the storage element 104 corresponding to a test instruction CMD_TST.
In simple terms, in the time will detecting embedded system 100, the test operation personnel are as long as is connected proving installation 10 with embedded system 100, and suitable setting startup signal EN, and then the test message MSG that produced of embedded system 100 can be stored in the proving installation 10 automatically.Thus, in the time of can't passing through test even embedded system 100 has flaw, the test operation personnel do not need to carry out again same test can obtain relevant information by proving installation 10.Therefore, testing required manpower and time can significantly reduce, simultaneously can more accurate grasp problem origination point, effectively promote test and production efficiency.
Be noted that proving installation 10 shown in Figure 1 is in order to notion of the present invention to be described, those skilled in the art can do different variations according to this, and is not limited thereto.For instance, start signal EN and be used to refer to the memory function whether processor 106 starts test message MSG, it is produced by a switch or switch, in addition, also can whether start the read functions of testing message MSG by further instruction processorunit 106 according to system requirements.That is to say, proving installation 10 can operate in two kinds of patterns, when startup signal EN equals 1 (or a particular value), processor 106 is stored in the test message MSG that interface 102 is received in the storage element 104, and when startup signal EN equaled 0 (or another particular value), processor 106 was exported the data in the storage element 104 by interface 102.In other words, when starting signal EN and equal 1, proving installation 10 is used for storing automatically test message MSG, and when starting signal EN and equal 0,10 of proving installations as coil with oneself as, be used for exporting stored data.In this case, as long as start signal EN by switching, the test operation personnel can write down test message MSG in good time, or after test is finished, by the test message MSG in computing machine or other device read test device 10.
In addition, MSG can correctly store in order to ensure the test message, when interface 102 is coupled to embedded system 100, if start the memory function (as equaling 1) that signal EN represents to start test message MSG, then processor 106 can be advanced the initialization that links of row communication, to set up the communication link with embedded system 100 by interface 102.
Above-mentioned running can reduce a testing process 20, as shown in Figure 2.Testing process 20 comprises following steps:
Step 200: beginning.
Step 202: judge whether proving installation 10 is coupled to embedded system 100.If carry out step 204; If not, repeat to judge.
Step 204: judge to start the memory function whether signal EN represents to start test message MSG.If carry out step 206; If not, carry out step 210.
Step 206: processor 106 carries out the initialization of communication link, with the communication link by interface 102 foundation and embedded system 100.
Step 208: the test message MSG that processor 106 is exported embedded system 100 is stored in the storage element 104.
Step 210: processor 106 is by the stored data of interface 102 output storage elements 104.
By testing process 20 as can be known, proving installation 10 not only can store test message MSG, can be used as carry-on dish or reservoir simultaneously, in order to export stored data.Thus, the test operation personnel are embedded in a computer system or test result analysis device with proving installation 10 as long as after test is finished, and adjust and start signal EN, then can read the stored data of proving installation 10.In this case, if embedded system 100 can't be passed through test, even take place when the machine situation, the test operation personnel do not need to carry out again same test can obtain relevant information smoothly.
The aforementioned hardware structure that is relevant to proving installation 10 or operation workflow etc. are all in order to illustrate spirit of the present invention, and those skilled in the art can do suitable modification according to system requirements, and is not limited thereto.For instance, processor 106 will be tested the function mode that message MSG is stored in the storage element 104 and can decide according to the storage area of storage element 104 or test operation personnel's demand.For example, when the storage area of storage element 104 deficiency, then processor 106 can be stored in the storage element 104 with test message MSG in the mode of overriding, that is deletion legacy data (having stored message), and stores new.In addition, when the storage area of storage element 104 was enough to store the test message MSG that surpasses more than, then processor 106 sustainable writing were tested message MSG, and in storage element 104 full loads, just with the oldest data deletion, with stores new, promptly as shown in Figure 3.In Fig. 3, MSG_new represents that processor 106 exports the up-to-date test message of storage element 104 to, and MSG_old then represents the oldest test message in the storage element 104.As shown in Figure 3, when storage element 104 full loads, the oldest test message MSG_old can be deleted, to hold up-to-date test message MSG_new.In addition, processor 106 can promptly produce new test message MSG preferably when each proving installation 10 is coupled to embedded system 100, and it is stored in the storage element 104.
On the other hand, in Fig. 1, test instruction CMD_TST is used for controlling embedded system 100 and carries out the specific function exclusive disjunction, and it can be to be provided or be stored in advance in the proving installation 10 by external device (ED).To be stored in proving installation 10 in advance is example, as shown in Figure 4, can increase by an instruction storage element 408 and a storer 410 in proving installation 10.Instruction storage element 408 is used for storing test instruction CMD_TST, the then temporary test instruction CMD_TST that stores of storer 410.After proving installation 10 and embedded system 100 are set up binding, processor 106 is earlier by in the instruction storage element 408 stored test instruction CMD_TST taking-up being resent to storer 410, processor 106 can become embedded system 100 can discern form the test instruction CMD_TST computing of taking out simultaneously, by interface 102 test instruction CMD_TST is sent to embedded system 100 again, the message of opening entry test simultaneously MSG.In this case, the test operation personnel get final product start detection as long as proving installation 10 is chimeric to embedded system 100.Certainly, also can store more than one test instruction in advance in instruction storage element 408, again by the test instruction of the required execution of test operation personnel selection.
In the prior art, the test operation personnel need and will not carry out identical test again by the device of testing to be measured, and pass through the important information of specific tool acquisition test process, with the decision problem point.Yet when testing again, identical result not necessarily repeats to take place, and causes and need expend many manpowers with the time is carried out debug, and influence is tested and production efficiency.In comparison, in the present invention, the test operation personnel are as long as is connected proving installation 10 with embedded system 100, and suitable setting startup signal EN, and then the test message MSG that produced of embedded system 100 can be stored in the proving installation 10 automatically.Thus, in the time of can't passing through test even embedded system 100 has flaw, the test operation personnel do not need to carry out again same test can obtain relevant information by proving installation 10.Therefore, testing required manpower and time can significantly reduce, simultaneously can more accurate grasp problem origination point, effectively promote test and production efficiency.
In sum, the present invention can significantly reduce test required manpower and time, with effective lifting test and production efficiency.
The above only is preferred embodiment of the present invention, and all equalizations of doing according to claim of the present invention change and modify, and all should belong to covering scope of the present invention.
Claims (15)
1. a proving installation is used for detecting an embedded system, includes:
One interface, but be used for coupling this embedded system with pluggable mode;
One storage element is used for storage data; And
One processor is used for when this interface is coupled to this embedded system, starts signal according to one, obtains the test message of this embedded system corresponding to a test instruction by this interface, and should test message and be stored in this storage element.
2. proving installation as claimed in claim 1, wherein this interface meets the universal serial bus standard.
3. proving installation as claimed in claim 1, it also comprises a switch, is used for producing this startup signal.
4. proving installation as claimed in claim 1, wherein when this interface was coupled to this embedded system, this processor also was used for according to this startup signal, by the communication link of this interface foundation with this embedded system.
5. proving installation as claimed in claim 1, wherein in a storage area of this storage element when not enough, this processor also is used for deleting in this storage element one and has stored message, is stored to this storage element should test message.
6. proving installation as claimed in claim 1, it also comprises an instruction storage element, is used for storing this test instruction, and this processor also is used for exporting this test instruction to this embedded system according to this startup signal by this interface.
7. proving installation as claimed in claim 1, it also comprises a storer, is used for keeping in this test instruction.
8. proving installation as claimed in claim 1, wherein this processor also is used for when this interface is coupled to this embedded system, starts signal according to this, exports the stored data of this storage element to this embedded system by this interface.
9. proving installation as claimed in claim 1, wherein this embedded system is a computer system.
10. a method of testing is used for detecting an embedded system, includes:
When a proving installation is coupled to this embedded system,, this embedded system is tested message corresponding to one of a test instruction be sent to this proving installation, to be stored in this proving installation according to a startup signal.
11. method of testing as claimed in claim 10 wherein when this proving installation is coupled to this embedded system, also comprises according to this startup signal, sets up the communication link with this embedded system.
12. method of testing as claimed in claim 10 wherein in a storage area of this proving installation when not enough, also comprises in this proving installation of deletion one and has stored message, is stored in this proving installation should test message.
13. method of testing as claimed in claim 10, it also comprises by this proving installation storage and exports this test instruction to this embedded system.
14. method of testing as claimed in claim 10, it also is contained in this proving installation when being coupled to this embedded system, starts signal according to this, exports the stored data of this proving installation to this embedded system.
15. method of testing as claimed in claim 10, wherein this embedded system is a computer system.
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| CN2010101412918A CN102214130A (en) | 2010-04-08 | 2010-04-08 | Test device and test method |
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| CN2010101412918A CN102214130A (en) | 2010-04-08 | 2010-04-08 | Test device and test method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109388528A (en) * | 2017-08-04 | 2019-02-26 | 神讯电脑(昆山)有限公司 | The test fixture of USB test method and USB device |
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| CN2681220Y (en) * | 2004-01-19 | 2005-02-23 | 上海环达计算机科技有限公司 | System starting and testing board for embedded system |
| CN1940887A (en) * | 2005-09-28 | 2007-04-04 | 联想(北京)有限公司 | Method and apparatus for master-controlled applied programm of self-repairing built-in equipment |
| CN101149699A (en) * | 2006-09-21 | 2008-03-26 | 中兴通讯股份有限公司 | Method for reliably acquiring abnormal and repositioning information |
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- 2010-04-08 CN CN2010101412918A patent/CN102214130A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2681220Y (en) * | 2004-01-19 | 2005-02-23 | 上海环达计算机科技有限公司 | System starting and testing board for embedded system |
| CN1940887A (en) * | 2005-09-28 | 2007-04-04 | 联想(北京)有限公司 | Method and apparatus for master-controlled applied programm of self-repairing built-in equipment |
| CN101149699A (en) * | 2006-09-21 | 2008-03-26 | 中兴通讯股份有限公司 | Method for reliably acquiring abnormal and repositioning information |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109388528A (en) * | 2017-08-04 | 2019-02-26 | 神讯电脑(昆山)有限公司 | The test fixture of USB test method and USB device |
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Application publication date: 20111012 |