CN102212794B - Copper plating substrate-based method for preparing large-area graphene film - Google Patents

Copper plating substrate-based method for preparing large-area graphene film Download PDF

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CN102212794B
CN102212794B CN201110092763A CN201110092763A CN102212794B CN 102212794 B CN102212794 B CN 102212794B CN 201110092763 A CN201110092763 A CN 201110092763A CN 201110092763 A CN201110092763 A CN 201110092763A CN 102212794 B CN102212794 B CN 102212794B
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seed layer
substrate
graphene
coppering
electro
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CN102212794A (en
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李铁
王文荣
周玉修
王跃林
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Shanghai Institute of Microsystem and Information Technology of CAS
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Abstract

The invention relates to a method for preparing graphene on a copper plating substrate. The method is characterized by comprising the following steps of: preparing the graphical copper plating substrate on a silicon chip; and growing the graphene on the copper plating substrate for 2 to 5 minutes at the temperature of between 800 and 1,000 DEG C by using a normal pressure chemical vapor deposition method, using methane as a carbon source and using argon and hydrogen as carrier gases. A graphical graphene film can be directly prepared by the method, and the substrate can be compatible with an integrated circuit (IC) process; and the manufacturing method is simple and low in cost, and can be used for large-scale manufacture.

Description

A kind of method based on electro-coppering substrate preparation big area graphene film
Technical field
The present invention relates to a kind of method that can make graphene film on a large scale, relate to a kind of method or rather, belong to the preparation field of graphene film based on electro-coppering substrate preparation big area graphene film.
Background technology
Graphene is the graphite of individual layer, is that carbon atom in one plane is the material that honey-combed is arranged, and once once is being considered to rationalistic material, because think that it can not stable existence.But after people such as Geim had found self-existent Graphene in 2004, there are some cut-and-try works to verify that the current carrier in the Graphene is the dirac fermion that does not have rest mass in succession, from then on begun the research boom of Graphene.
At present, Graphene be proved to be nano electron device, single-electronic transistor, thermoelectric aspect, there is good prospects for application aspect such as conductive film.But how preparing the large-area graphene film of high quality on a large scale still is a difficult problem, and the method for the Graphene of growing at present mainly contains: the mechanically peel method, and the Graphene quality that obtains is high but area is little, and efficient is also very low; Oxidation reduction process, simple to operate and cost is low, but Graphene can cause the disappearance of some physical and chemical performances in redox processes, and resulting Graphene area is also very little; The silit cracking process can obtain large-area Graphene, but the quality of Graphene receives substrate effects very big, and the growth cost is also higher, needs the high-temperature vacuum environment; Chemical Vapor deposition process is fit to the mass preparation Graphene, but receives the constraint of metal substrate bigger.
Metal substrate commonly used has Cu, Ni, Ru or the like in the chemical Vapor deposition process at present; For the Cu substrate; Be mainly two kinds of sputter copper or Copper Foils on the silicon chip; But these two kinds of Cu substrates all have certain defective in the preparation process: sputter copper at high temperature condenses into the island particle easily, the preparation and the Graphene area too little; The Copper Foil generation gauffer that in operating process, bends easily, thus the planarization of substrate influenced.
The present invention intend propose a kind of based on the electro-coppering substrate, can with the IC process compatible, and the high Graphene growth method of preparation efficiency has solved in the past Graphene and has prepared problems such as graphical difficulty in the process, substrate rapid wear, area are little.
Summary of the invention
The present invention relates to a kind of method based on electro-coppering substrate preparation big area Graphene.The method that is provided comprises that at first a kind of graphical plating of the Graphene that can be used for growing makes.Method based on electro-coppering substrate preparation big area Graphene specifically provided by the invention comprises following two modes:
Method A: step is
1. the preparation of electro-coppering Seed Layer: at SiO 2Substrate or the direct metal seed layer of sputter 50-250nm on silicon base, the material of Seed Layer can be Cu, Ni/Cu, Au, Cr/Au, TiW/Cu etc.;
2. the image conversion of Seed Layer: the thickness according to required electro-coppering is coated with thick glue with Seed Layer, and the thickness of roaring is 4-12 μ m, and then required figure when it is photo-etched into the subsequent growth Graphene;
3. electro-coppering:, select different electroplating currents (0.5-2.5A) and electroplating time (10-100min) according to the thickness (2-10 μ m) of required electro-coppering;
4. remove photoresist, the burn into scribing: with the SiO that has electroplated copper in the step 3 2Substrate or silicon base are removed photoresist material, erode Seed Layer again, just stay the required electro-coppering figure of growth Graphene, again it are divided into suitable size as substrate;
5. the preparation of Graphene: adopt the atmospheric pressure cvd method to use quartz boat to load above-mentioned steps 4 described substrates and put into the silica tube flat-temperature zone of caliber as 60mm; Normal pressure is heated to 800-1000 ℃ under argon gas atmosphere, and argon flow amount is 50-500sccm (mL/min); Feeding carbon-source gas methane and volume ratio are 10 when reaching target temperature in waiting to manage: 1-1: 4 argon gas and hydrogen gas mixture; Behind the growth 3-15min, close heating, methane and argon gas, furnace cooling under argon gas atmosphere, argon flow amount are 50-500sccm.
Method B: it is graphical just to omit step 2 Seed Layer, and all the other are with method A.
Advantage of the present invention is following:
1. the present invention can electroplate out corresponding copper substrate pattern according to the pattern of required Graphene, and the Graphene of directly growing in the above then is with respect to the image conversion method after the film forming, more simple and convenient by method provided by the invention;
2. the present invention is with respect to growth Graphene on Copper Foil, and this method does not receive the influence of extraneous power, and electro-coppering is attached to SiO 2On substrate or the monocrystal silicon substrate, taking of substrate can not have influence on the quality of electro-coppering in the whole process, and Copper Foil just is easy to be damaged;
3. the present invention has avoided the sputter copper film in high-temperature annealing process, can be condensed into the problem of island with respect to growth Graphene on sputter copper, utilizes the Graphene of the inventive method growth, and surface finish height and area are bigger;
4. in technology realizes, electro-coppering cost with respect to the thick copper film of sputter is low, and realization property is high.
5. the present invention can directly prepare patterned graphene film, and substrate can with the IC process compatible, have that method is simple, cost is low, and a characteristic that can mass preparation.
Description of drawings
Fig. 1 (a) is that embodiment 1 electroplates the Cu optical picture behind the Graphene of having grown; (b) be the Raman spectrogram of the Graphene of embodiment 1 growth.
Fig. 2 (a) is that embodiment 2 electroplates the Cu optical picture behind the Graphene of having grown; (b) be the Raman spectrogram of the Graphene of embodiment 2 growths.
Fig. 3 (a) is photoetching section and the striate region of embodiment 3; (b) be the substrate synoptic diagram that image is divided into corresponding size shown in the embodiment 3.
Among the figure:
Figure BSA00000472979300031
Embodiment
Embodiment 1: based on electro-coppering substrate preparation big area graphene film
The manufacture craft process is following:
1. with the SiO of silicon single crystal oxidation 200nm 2Zone of oxidation, the Seed Layer of sputter 50nmNi/200nmCu on zone of oxidation again;
2. on above-mentioned silicon chip Seed Layer, electroplate the thick copper of 4 μ m, electroplating current 2A, electroplating time 18min;
3. silicon chip is divided into the size of required substrate, is written into quartz boat, put into the flat-temperature zone of silica tube, under the atmosphere of 300sccm argon gas, be warming up to 1000 ℃;
4. when arriving 1000 ℃ of target temperatures, feed 10sccm methane, 200sccm hydrogen and 800sccm argon gas, behind the growth 3min, under the atmosphere of 200sccm argon gas,, just can make large-area graphene film with furnace annealing.Experimental result is shown in the following figure: wherein Fig. 1 (a) is the optical imagery after growing; Fig. 1 (b) clearlys show that from Raman spectrum Graphene is an individual layer for Raman spectrum.
Embodiment 2: based on electro-coppering substrate preparation multi-layer graphene film
Step 1,2,3 with embodiment 1 step 1,2,3 identical, be warming up to 800 ℃;
4. when arriving 800 ℃ of target temperatures, feed 15sccm methane, 100sccm hydrogen and 400sccm argon gas, behind the growth 5min, under the atmosphere of 200sccm argon gas,, just can make the multiwalled Graphene with furnace annealing.Experimental result is shown in the following figure: wherein Fig. 2 (a) is the optical imagery after growing; Fig. 2 (b) is a Raman spectrum, and Raman spectrum shows that Graphene is a multilayer.
Embodiment 3: based on the high striated graphene film of electro-coppering substrate preparation
Step 1 is identical with embodiment 1 step 1;
2. Seed Layer is graphical: reticle is illustrated in fig. 1 shown below, and fringe area is the zone (2 μ m * 10 μ m) of electro-coppering, is coated with photoetching behind the thick glue of 5 μ m, develops;
3. electro-coppering: electroplating current 1.8A, electroplating time 15min, electro-coppering thickness 3.5um;
4. remove photoresist material after electroplating, in the mixing solutions of dilute sulphuric acid and ydrogen peroxide 50, soaked tens of seconds again after the cleaning, remove Seed Layer Ni/Cu, clean the back is divided into corresponding size according to image substrate (substrat structure is illustrated in fig. 5 shown below);
Embodiment 3: based on the high striated graphene film of electro-coppering substrate preparation
Step 1 is identical with embodiment 1 step 1;
2. Seed Layer is graphical: shown in following Fig. 3 of reticle (a), fringe area is the zone (2 μ m * 10 μ m) of electro-coppering, is coated with photoetching behind the thick glue of 5 μ m, develops;
3. electro-coppering: electroplating current 1.8A, electroplating time 15min, electro-coppering thickness 3.5um;
4. remove photoresist material after electroplating, in the mixing solutions of dilute sulphuric acid and ydrogen peroxide 50, soaked tens of seconds again after the cleaning, remove Seed Layer Ni/Cu, clean the back is divided into corresponding size according to image substrate (substrat structure is illustrated in fig. 5 shown below);
5. will be written into quartz boat, put into the flat-temperature zone of silica tube, under the atmosphere of 300sccm argon gas; Be warming up to 1000 ℃; When reaching 1000 ℃ of target temperatures, feed 10sccm methane, 200sccm hydrogen and 600sccm argon gas, behind the growth 3min; Under the atmosphere of 200sccm argon gas,, just can make the graphene film of striated with furnace annealing.

Claims (4)

1. method based on electro-coppering substrate preparation big area Graphene is characterized in that adopting in two kinds of methods of A or B any:
Method A:
(a) electro-coppering Seed Layer is at SiO 2Splash-proofing sputtering metal Seed Layer on substrate or the silicon base, seed layer materials are Cu, Ni/Cu, Au, Cr/Au or TiW/Cu;
(b) copper electroplating layer on Seed Layer selects the electroplating current of 0.5-2.5A and the electroplating time of 10-100min to electroplate copper electroplating layer, and the thickness of copper electroplating layer is 2-10 μ m;
(c) substrate that remove photoresist, burn into is diced into suitable size is written into quartz boat; Under nitrogen atmosphere, adopt the atmospheric pressure cvd method; Be heated to 800-1000 ℃; After after reaching target temperature, feeding the mixed gas growth 3-15min of carbon-source gas methane and Ar gas and hydrogen, stop heating and close methane and hydrogen;
(d) furnace cooling under argon atmospher;
Method B:
(a) electro-coppering Seed Layer is at SiO 2Splash-proofing sputtering metal Seed Layer on substrate or the silicon base, seed layer materials are Cu, Ni/Cu, Au, Cr/Au or TiW/Cu;
(b) Seed Layer image conversion: the thickness according to required electro-coppering is coated with one deck photoresist material with Seed Layer, and the thickness of photoresist material is 4-12 μ m, and then it is photo-etched into the required figure of subsequent growth Graphene;
(c) copper electroplating layer on Seed Layer selects the electroplating current of 0.5-2.5A and the electroplating time of 10-100min to electroplate copper electroplating layer, and the thickness of copper electroplating layer is 2-10 μ m;
(d) substrate that remove photoresist, burn into is diced into suitable size is written into quartz boat; Under nitrogen atmosphere, adopt the atmospheric pressure cvd method; Be heated to 800-1000 ℃; After reaching the mixed gas growth 3-15min that feeds carbon-source gas methane and Ar gas and hydrogen under the target temperature, stop heating and close methane and hydrogen;
(e) furnace cooling under argon atmospher;
Wherein, the carbon-source gas that feeds when reaching 800-1000 ℃ of target temperature is a methane, and the flow of methane is 5-20mL/min; The Ar and the H that feed when reaching 800-1000 ℃ of target temperature 2The volume ratio of mixed gas is 10: 1-1: 4.
2. by the described method of claim 1, it is characterized in that:
(1) the seed metallization layer thickness of step (a) sputter is 50-250nm among method A and the B;
(2) among the method A among step (c) and the method B step (d) flow of hydrogen when reaching target temperature be 50-500mL/min;
(3) flow of argon gas is 50-500mL/min during the described furnace cooling of method A step (d) and method B step (e).
3. by claim 1 or 2 described methods, it is characterized in that the graphene film for preparing is a single or multiple lift.
4. by claim 1 or 2 described methods, it is characterized in that the graphene film for preparing is a striated.
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