CN102183682A - Micro test probe - Google Patents

Micro test probe Download PDF

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Publication number
CN102183682A
CN102183682A CN2011100514622A CN201110051462A CN102183682A CN 102183682 A CN102183682 A CN 102183682A CN 2011100514622 A CN2011100514622 A CN 2011100514622A CN 201110051462 A CN201110051462 A CN 201110051462A CN 102183682 A CN102183682 A CN 102183682A
Authority
CN
China
Prior art keywords
probe
test
rod
probe rod
spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2011100514622A
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Chinese (zh)
Inventor
李洪波
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jingshi Electromechanical Science & Technology Co Ltd Shenzhen City
Original Assignee
Jingshi Electromechanical Science & Technology Co Ltd Shenzhen City
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jingshi Electromechanical Science & Technology Co Ltd Shenzhen City filed Critical Jingshi Electromechanical Science & Technology Co Ltd Shenzhen City
Priority to CN2011100514622A priority Critical patent/CN102183682A/en
Publication of CN102183682A publication Critical patent/CN102183682A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a micro test probe, which aims at providing a convenient micro test probe which is higher in test precision, saves more energy and reduces consumption, and expands the adaptability range of the test probe. The micro test probe comprises a probe head which is sleeved in a circular cavity of the lower end of a probe rod and extruded from the circular cavity; the probe head has a wire harness structure; a spring is sleeved outside the probe rod; the spring is arranged between a stopping block arranged at the lower end of the probe rod and a guide sleeve; the guide sleeve is sleeved on the probe rod; and a clamping ring is arranged above the guide sleeve. The probe cannot emit heat, has high test precision and is applicable to the power battery test field.

Description

Miniature test probe
Technical field
The present invention relates to a kind of battery testing probe, in particular, relate to a kind of probe that can be applicable to the high-power drive pond test usefulness of little lug.
Background technology
Electrokinetic cell is the main force of new forms of energy, and electrokinetic cell not only is used for automobile industry, also is used for electric tool, model airplane, field such as electric bicycle and battery-operated motor cycle, the range of application of electrokinetic cell is more and more wider, the specifications and characteristics of electrokinetic cell is also improving constantly, the big little internal resistance of electric current, high-power little lug, requirement to the test parameter of battery is more and more higher, generally will finish test with many probe groups are incompatible, probe is rigid contact, and contact area is little, unstable, contact resistance is big, and test is unstable, and precision does not reach, and probe easily generates heat, complex structure, the cost height, and also volume is big, use inconvenience, brought many troubles to production.
Summary of the invention
Technical purpose of the present invention is to overcome the probe of battery testing in the prior art to exist test unstable and use inconvenient technical matters; A kind of flexible contact probe of minor diameter is provided, and simple in structure, volume is little, contact area is big, contact resistance is little, and the energy bearing great current, probe does not generate heat, and measuring accuracy is higher, more energy-saving and cost-reducing, make the more extensively miniature easily test probe of accommodation of detecting probe.
For realizing above technical purpose, the technical solution used in the present invention is:
Miniature test probe, it is characterized in that: described probe includes probe, described probe sheath is located in the cylindrical cavity of probe rod lower end and is protruded cylindrical cavity, described probe is a wiring harness structure, outside described probe rod, be arranged with spring, described spring is located between probe rod lower end dynamic resistance piece and the guide pin bushing, and guide pin bushing is sheathed on the probe rod, and described guide pin bushing top is provided with collar.
Useful technique effect of the present invention is: the contact performance and the electric conductivity that have improved probe, make that the internal resistance of miniature test probe is very little, because of probe is that wire harness is formed, be flexible contact, contact area is big, and contact resistance is little, probe does not generate heat, the measuring accuracy height, energy-saving and cost-reducing, thus realized on the minor diameter probe, passing through high-current test.
Description of drawings
Fig. 1 is the quick-fried structural representation of tearing open of the miniature test probe of the present invention;
Fig. 2 is the structural representation after the assembling of the miniature test probe of the present invention finishes;
Embodiment
In conjunction with Fig. 1 and Fig. 2, the miniature test probe that the little internal resistance secondary of a kind of big electric current electrokinetic cell is used is to be mobile jib with probe rod 102, the lower end of probe rod 102 is provided with cylindrical cavity, probe 101 will be pressed in the lower end cylindrical cavity of probe rod 102 and protrude cylindrical cavity, the center section of probe rod 102 is with spring 103 and guide pin bushing 104, and is spacing with collar 105 lockings in the upper end of probe rod 102.
The present invention in use, the probe 101 of two miniature test probes is contacted respectively on the positive and negative little lug of high-energy battery, the upper end of the probe rod 102 of two miniature test probes links to each other with the both positive and negative polarity of the signal wire of test instrumentation respectively, makes tested high-energy battery and test instrumentation form a loop.When mechanism for testing is depressed test probe, guide pin bushing 104 dead springs 103, spring 103 is depressed probe rod 102, and the probe 101 of probe rod 102 lower ends just contacts with the positive and negative little lug of high-energy battery closely.
The ingenious part of the miniature test probe of the present invention is the unique texture of probe 101, has improved the contact performance and the electric conductivity of probe, make that the internal resistance of miniature test probe is very little, because of probe is that wire harness is formed, be flexible contact, contact area is big, contact resistance is little, probe does not generate heat, and the measuring accuracy height is energy-saving and cost-reducing, thereby having realized passing through high-current test on the minor diameter probe, is that the probe of existing equal specification can be by 5~6 times of size of current.This miniature test probe design is ingenious, and little, the big electric current of volume, contact resistance are little, and the measuring accuracy height is simple and convenient, be easy to make, and cost is low, and quality is good.

Claims (1)

1. miniature test probe, it is characterized in that: described probe includes probe, described probe sheath is located in the cylindrical cavity of probe rod lower end and is protruded cylindrical cavity, described probe is a wiring harness structure, outside described probe rod, be arranged with spring, described spring is located between probe rod lower end dynamic resistance piece and the guide pin bushing, and guide pin bushing is sheathed on the probe rod, and described guide pin bushing top is provided with collar.
CN2011100514622A 2011-03-03 2011-03-03 Micro test probe Pending CN102183682A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011100514622A CN102183682A (en) 2011-03-03 2011-03-03 Micro test probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2011100514622A CN102183682A (en) 2011-03-03 2011-03-03 Micro test probe

Publications (1)

Publication Number Publication Date
CN102183682A true CN102183682A (en) 2011-09-14

Family

ID=44569889

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011100514622A Pending CN102183682A (en) 2011-03-03 2011-03-03 Micro test probe

Country Status (1)

Country Link
CN (1) CN102183682A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108226583A (en) * 2018-01-23 2018-06-29 京东方科技集团股份有限公司 Test probe
CN110208582A (en) * 2019-07-08 2019-09-06 深圳市美锐精密电子有限公司 A kind of PCB detection probe and its manufacturing method
CN110492257A (en) * 2019-07-22 2019-11-22 深圳市精实机电科技有限公司 The quick connecting device of signal wire in a kind of formation of Li-ion batteries partial volume equipment

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11142434A (en) * 1997-11-12 1999-05-28 Sony Corp Rotary contact probe
JPH11160404A (en) * 1997-11-26 1999-06-18 Sony Corp Contact probe for charging and discharging device
CN2589986Y (en) * 2002-12-24 2003-12-03 中台探针实业有限公司 Probe device for testing
TW201028695A (en) * 2009-01-22 2010-08-01 King Yuan Electronics Co Ltd Probe card
CN201615914U (en) * 2009-12-29 2010-10-27 广州擎天实业有限公司 Novel cylindrical probe for battery
CN201819929U (en) * 2010-08-20 2011-05-04 冯央春 Novel large-current probe
CN201984089U (en) * 2011-03-03 2011-09-21 深圳市精实机电科技有限公司 Mini-type test probe

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11142434A (en) * 1997-11-12 1999-05-28 Sony Corp Rotary contact probe
JPH11160404A (en) * 1997-11-26 1999-06-18 Sony Corp Contact probe for charging and discharging device
CN2589986Y (en) * 2002-12-24 2003-12-03 中台探针实业有限公司 Probe device for testing
TW201028695A (en) * 2009-01-22 2010-08-01 King Yuan Electronics Co Ltd Probe card
CN201615914U (en) * 2009-12-29 2010-10-27 广州擎天实业有限公司 Novel cylindrical probe for battery
CN201819929U (en) * 2010-08-20 2011-05-04 冯央春 Novel large-current probe
CN201984089U (en) * 2011-03-03 2011-09-21 深圳市精实机电科技有限公司 Mini-type test probe

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108226583A (en) * 2018-01-23 2018-06-29 京东方科技集团股份有限公司 Test probe
CN108226583B (en) * 2018-01-23 2021-01-19 京东方科技集团股份有限公司 Test probe
CN110208582A (en) * 2019-07-08 2019-09-06 深圳市美锐精密电子有限公司 A kind of PCB detection probe and its manufacturing method
CN110492257A (en) * 2019-07-22 2019-11-22 深圳市精实机电科技有限公司 The quick connecting device of signal wire in a kind of formation of Li-ion batteries partial volume equipment
CN110492257B (en) * 2019-07-22 2024-04-16 深圳市精实机电科技有限公司 Quick connection device of signal wire in lithium battery formation component equipment

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Application publication date: 20110914