CN102175965A - Automatic magnetic card decoding chip testing method - Google Patents
Automatic magnetic card decoding chip testing method Download PDFInfo
- Publication number
- CN102175965A CN102175965A CN201110006030XA CN201110006030A CN102175965A CN 102175965 A CN102175965 A CN 102175965A CN 201110006030X A CN201110006030X A CN 201110006030XA CN 201110006030 A CN201110006030 A CN 201110006030A CN 102175965 A CN102175965 A CN 102175965A
- Authority
- CN
- China
- Prior art keywords
- magnetic card
- test
- signal
- main control
- cpu
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Abstract
The invention provides an automatic magnetic card decoding chip testing method. The method comprises the following steps: transmitting a command through a PC (personal computer) main control unit to request an apparatus to be tested in the state that the magnetic card is idle for card swiping test; re-transmitting a command through the PC main control unit to inform the CPU (central processing unit) of a testing apparatus to simulate signal jump with an F2F coding format so as to generate testing signals; processing the testing signals by a signal converter of the testing apparatus; transmitting the processed signal to the magnetic card decoding circuit of the apparatus to be tested to amplify, filter, shape and decode the signals; transmitting the signals to the CPU of the apparatus to be tested; and transmitting the test result to the PC main control unit by the CPU of the apparatus to be tested to achieve the test.
Description
[technical field]
The present invention relates to the magnetic card field tests, relate in particular to a kind of automated testing method of magnetic card decoding circuit.
[background technology]
Magnetic card is widely used in bank card, identification card etc. at present.What write down on the magnetic stripe of magnetic card is a series of binary codes, and these binary codes are encoded by the mode of coded biphase (also claiming the F2F coding) and formed.So-called coded biphase: as shown in Figure 1: promptly data in the cycle, if the information that writes down on the magnetic stripe does not change, then representative herein the data of record be 0 (as (a) among Fig. 1); If information has the height of level to change in data the cycle, the data of representing this place's magnetic stripe recording are 1 (as (b) among Fig. 1); Situation when existing 0,1 to change as the data on (c) among Fig. 1 expression magnetic stripe.Be more prone in order to make CPU handle the magnetic card signal, generally the data message in the coding need be separated with clock information, the effect of magnetic card decoding chip is converted into data in synchronization and clock signal with bi-directional code exactly, handles for CPU.Xie Ma process wherein: be about to the F2F encoded signals among (c) among Fig. 1, the process of isolated synchronous CLK signal and DATA signal.
The magnetic card decoding circuit is a mimic channel, by magnetic head with the magnetic card signal of the F2F on magnetic stripe coding amplify, shaping, decoding, obtain the processing that digital signal is convenient to CPU.Its flow process is: reading head-amplification filtering circuit-shaping-decoding-cpu system is handled.Under normal circumstances, magnetic card reads small-signal by magnetic head, and normal at the amplification filtering circuit, shaping circuit is normal, under the normal situation of decoding circuit, after CPU loads normal driver, can normal read gets the data on the magnetic card and tests.Related data byte number on three magnetic tracks of program prompts.If the reading of data mistake, the signal on the magnetic card has to be lost, and then the system interaction interface reports the magnetic card read error, and points out concrete error message.
Because the singularity of magnetic card decoding circuit itself, for the integrated circuit board test of producing, traditional method of testing of using is by manually handing the magnetic card test of swiping the card and (afterwards is called: traditional scheme).There is following problem in the test of traditional scheme: 1, test card loss; 2, the success ratio of manually swiping the card is low; 3, need the artificial judgment result that swipes the card; 4, testing efficiency is low.
[summary of the invention]
The technical problem to be solved in the present invention is to provide a kind of automated testing method of magnetic card decoding circuit, has realized automatic test, test success ratio height, and test speed is fast.
The present invention is achieved in that a kind of automated testing method of magnetic card decoding circuit, sends the instruction request equipment under test by the PC main control equipment and is in the state that magnetic card is waited for the test of swiping the card; The CPU simulation F2F coded format signal saltus step that the PC main control equipment sends the instruction notification testing apparatus once more produces test signal, after described test signal is handled by the signal converter of testing apparatus, the magnetic card decoding circuit that sends to equipment under test carries out delivering to equipment under test CPU after amplification filtering, shaping, the magnetic card decoding, equipment under test CPU sends its test result to the PC main control equipment, thereby finishes test.
Wherein said equipment under test is in magnetic card and waits for that the state of the test of swiping the card is after equipment under test receives the instruction request of PC main control equipment transmission, enters execution and resolves the state that data on magnetic card is handled by the magnetic card standard.
The signal converter of wherein said test signal by testing apparatus handled and be specially: testing apparatus produces significantly analogue magnetic card signal with the impulse effect of test signal by signal converter electric capacity, obtain the analogue magnetic card signal that amplitude is 200mv by electric resistance partial pressure and diode step-down then, i.e. the function that realizes the analog magnetic head Card Reader by IO interface and the peripheral capacitance resistance ware of CPU.
Wherein equipment under test CPU sends its test result to the PC main control equipment by the communication serial ports.
The present invention has following advantage: the CPU simulation F2F coded format signal saltus step by testing apparatus produces test signal, after of the signal converter processing of its signal by testing apparatus, the magnetic card decoding circuit that sends to equipment under test carries out delivering to equipment under test CPU after amplification filtering, shaping, the magnetic card decoding, equipment under test CPU sends its test result to the PC main control equipment, thereby finishes test.The present invention tests the success ratio height, and test speed is fast, and testing cost is lower, has realized automatic test.
[description of drawings]
Fig. 1 is a coded biphase synoptic diagram of the prior art.
Fig. 2 is a testing hardware structural representation of the present invention.
Fig. 3 obtains the waveform signal principle schematic for after the impulse effect of test signal of the present invention by electric capacity.
Fig. 4 is the circuit diagram in the signal converter of testing apparatus of the present invention.
[embodiment]
With reference to shown in Figure 2, be testing hardware structural representation of the present invention, its ingredient is: the PC main control equipment 1 that is used to send test instruction and accept test result, in be provided with CPU21 and signal converter 22 testing apparatus 2 and in be provided with tested mainboard CPU31 and tested magnetic card decoding circuit 32 equipment under test 3 form; The present invention realizes in conjunction with this hardware configuration.
A kind of automated testing method of magnetic card decoding circuit sends instruction request equipment under test 3 by PC main control equipment 1 and is in the state that magnetic card is waited for the test of swiping the card; The CPU21 simulation F2F coded format signal saltus step that PC main control equipment 1 sends instruction notification testing apparatus 2 once more produces test signal, after described test signal is handled by the signal converter 22 of testing apparatus 2, the magnetic card decoding circuit 32 that sends to equipment under test 3 carries out delivering to equipment under test CPU31 after amplification filtering, shaping, the magnetic card decoding, equipment under test CPU31 sends its test result to PC main control equipment 1 by the communication serial ports, thereby finishes test.
Wherein said equipment under test 3 is in magnetic card and waits for that the state of the test of swiping the card is after equipment under test receives the instruction request of PC main control equipment transmission, enters execution and resolves the state that data on magnetic card is handled by the magnetic card standard.
The signal converter of wherein said test signal by testing apparatus handled and be specially: testing apparatus produces significantly analogue magnetic card signal with the impulse effect of test signal by signal converter electric capacity, obtain the analogue magnetic card signal that amplitude is 200mv by electric resistance partial pressure and diode step-down then, i.e. the function that realizes the analog magnetic head Card Reader by IO interface and the peripheral capacitance resistance ware of CPU.
As shown in Figure 3, for obtaining the waveform signal principle schematic after the impulse effect of test signal of the present invention by electric capacity.Its waveform signal that obtains is the magnetic card signal that produces when being similar to magnetic card and swiping the card; This waveform signal is the simulating signal of magnetic card signal.The principle of its realization is exactly to produce test signal by the CPU simulation F2F coded format signal saltus step with testing apparatus to carry out reverse transformation, by satisfying a series of square-wave signals of magnetic card coding, the rising edge of square wave and negative edge are changed into pulse signal, and (positive pulse appears when the square wave rising edge in this waveform, when negative edge negative pulse, opposite with the process of magnetic card decoding).
As shown in Figure 4, be the circuit diagram in the signal converter of testing apparatus of the present invention, wherein HA is input as the simulation F2F signal of 3.3V, and the A point is about the analogue magnetic card signal of 3.3V, the B point is the analogue magnetic card signal of about 0.98V, and the C point is about the analogue magnetic card signal less than 300mV.The effect of diode D6 is played step-down and is reduced the effect of digital noise, and capacitor C 5 is a coupling capacitance.The present invention produces significantly analogue magnetic card signal by the impulse effect of signal converter electric capacity, obtains the analogue magnetic card signal that amplitude is 200mv by resistance (as shown in Figure 4) dividing potential drop and diode step-down then.
Here be noted that: intensity of magnetic card signal and the speed of swiping the card, magnetic stripe etc. is relevant in the process of swiping the card of magnetic card.But whether purpose of the present invention exists Welding Problems for test magnetic card decoding circuit in welding process, therefore, can import decoding circuit to reach test purpose with fixing magnetic card signal period and amplitude in test process.
The above only is preferred embodiment of the present invention, and all equalizations of being done according to the present patent application claim change and modify, and all should belong to covering scope of the present invention.
Claims (4)
1. the automated testing method of a magnetic card decoding circuit is characterized in that: send the instruction request equipment under test by the PC main control equipment and be in the state that magnetic card is waited for the test of swiping the card; The CPU simulation F2F coded format signal saltus step that the PC main control equipment sends the instruction notification testing apparatus once more produces test signal, after described test signal is handled by the signal converter of testing apparatus, the magnetic card decoding circuit that sends to equipment under test carries out delivering to equipment under test CPU after amplification filtering, shaping, the magnetic card decoding, equipment under test CPU sends its test result to the PC main control equipment, thereby finishes test.
2. the automated testing method of a kind of magnetic card decoding circuit according to claim 1, it is characterized in that: described equipment under test is in magnetic card and waits for that the state of the test of swiping the card is after equipment under test receives the instruction request of PC main control equipment transmission, enters execution and resolves the state that data on magnetic card is handled by the magnetic card standard.
3. the automated testing method of a kind of magnetic card decoding circuit according to claim 1, it is characterized in that: the signal converter of described test signal by testing apparatus handled and be specially: testing apparatus produces significantly analogue magnetic card signal with the impulse effect of test signal by signal converter electric capacity, obtain the analogue magnetic card signal that amplitude is 200mv by electric resistance partial pressure and diode step-down then, i.e. the function that realizes the analog magnetic head Card Reader by IO interface and the peripheral capacitance resistance ware of CPU.
4. the automated testing method of a kind of magnetic card decoding circuit according to claim 1 is characterized in that: equipment under test CPU sends its test result to the PC main control equipment by the communication serial ports.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110006030 CN102175965B (en) | 2011-01-12 | 2011-01-12 | Automatic testing method for magnetic card decoding circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110006030 CN102175965B (en) | 2011-01-12 | 2011-01-12 | Automatic testing method for magnetic card decoding circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102175965A true CN102175965A (en) | 2011-09-07 |
| CN102175965B CN102175965B (en) | 2013-01-09 |
Family
ID=44519168
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201110006030 Active CN102175965B (en) | 2011-01-12 | 2011-01-12 | Automatic testing method for magnetic card decoding circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102175965B (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104134445A (en) * | 2014-08-07 | 2014-11-05 | 兆讯恒达微电子技术(北京)有限公司 | Method and system for testing magnetic head through magnetic coupling method |
| CN104198917A (en) * | 2014-08-07 | 2014-12-10 | 兆讯恒达微电子技术(北京)有限公司 | Automatic test system and automatic test method for magnetic card decoding chip |
| CN105139498A (en) * | 2015-08-31 | 2015-12-09 | 深圳市捷顺科技实业股份有限公司 | Automated testing system and method for parking lot |
| CN105738798A (en) * | 2016-04-15 | 2016-07-06 | 福建联迪商用设备有限公司 | Method, device and system for testing magnetic card circuits |
| CN105844192A (en) * | 2016-04-21 | 2016-08-10 | 天津维晟微科技有限公司 | Waveform debugging system and method thereof applied in F2F decoding system |
| CN106599749A (en) * | 2016-12-15 | 2017-04-26 | 上海爱信诺航芯电子科技有限公司 | Magnetic strip card signal processing circuit and method |
| CN107340465A (en) * | 2017-09-06 | 2017-11-10 | 福建升腾资讯有限公司 | Magnetic card Auto-Test System and method in a kind of POS production |
| CN112560515A (en) * | 2020-12-22 | 2021-03-26 | 福建新大陆支付技术有限公司 | Method and device for realizing automatic test based on magnetic card simulation and storage medium |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5168413A (en) * | 1990-11-30 | 1992-12-01 | Ibm Corporation | Transducer head flying height monitoring methods and apparatus for disk drive system |
| CN1066743A (en) * | 1991-05-10 | 1992-12-02 | 华中理工大学 | Magnetic card tester |
| CN101335017A (en) * | 2007-02-21 | 2008-12-31 | 日立高新技术有限公司 | Test method of a magnetic disk and magnectic disk tester |
-
2011
- 2011-01-12 CN CN 201110006030 patent/CN102175965B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5168413A (en) * | 1990-11-30 | 1992-12-01 | Ibm Corporation | Transducer head flying height monitoring methods and apparatus for disk drive system |
| CN1066743A (en) * | 1991-05-10 | 1992-12-02 | 华中理工大学 | Magnetic card tester |
| CN101335017A (en) * | 2007-02-21 | 2008-12-31 | 日立高新技术有限公司 | Test method of a magnetic disk and magnectic disk tester |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104134445A (en) * | 2014-08-07 | 2014-11-05 | 兆讯恒达微电子技术(北京)有限公司 | Method and system for testing magnetic head through magnetic coupling method |
| CN104198917A (en) * | 2014-08-07 | 2014-12-10 | 兆讯恒达微电子技术(北京)有限公司 | Automatic test system and automatic test method for magnetic card decoding chip |
| CN104198917B (en) * | 2014-08-07 | 2017-04-19 | 兆讯恒达微电子技术(北京)有限公司 | Automatic test system and automatic test method for magnetic card decoding chip |
| CN104134445B (en) * | 2014-08-07 | 2017-06-16 | 兆讯恒达微电子技术(北京)有限公司 | Magnetic coupling method tests the method and system of magnetic head product |
| CN105139498A (en) * | 2015-08-31 | 2015-12-09 | 深圳市捷顺科技实业股份有限公司 | Automated testing system and method for parking lot |
| CN105139498B (en) * | 2015-08-31 | 2018-05-01 | 深圳市捷顺科技实业股份有限公司 | A kind of parking lot automatization test system and method |
| CN105738798A (en) * | 2016-04-15 | 2016-07-06 | 福建联迪商用设备有限公司 | Method, device and system for testing magnetic card circuits |
| CN105844192A (en) * | 2016-04-21 | 2016-08-10 | 天津维晟微科技有限公司 | Waveform debugging system and method thereof applied in F2F decoding system |
| CN105844192B (en) * | 2016-04-21 | 2018-10-26 | 天津维晟微科技有限公司 | Applied to the waveform debugging system and its method in F2F decoding systems |
| CN106599749A (en) * | 2016-12-15 | 2017-04-26 | 上海爱信诺航芯电子科技有限公司 | Magnetic strip card signal processing circuit and method |
| CN107340465A (en) * | 2017-09-06 | 2017-11-10 | 福建升腾资讯有限公司 | Magnetic card Auto-Test System and method in a kind of POS production |
| CN112560515A (en) * | 2020-12-22 | 2021-03-26 | 福建新大陆支付技术有限公司 | Method and device for realizing automatic test based on magnetic card simulation and storage medium |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102175965B (en) | 2013-01-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102175965B (en) | Automatic testing method for magnetic card decoding circuit | |
| JP2008022917A5 (en) | ||
| CN101635864A (en) | Method and system for remotely testing electronic device | |
| CN101799321A (en) | Intelligent vibration monitor system | |
| CN103780738A (en) | Mobile terminal image processing method and mobile terminal | |
| CN104198917A (en) | Automatic test system and automatic test method for magnetic card decoding chip | |
| CN103869127A (en) | Digital oscilloscope with track display function | |
| CN201909831U (en) | Automatic test system for magnetic card decoding circuit | |
| CN102565683B (en) | Generation and verification method of test vector | |
| CN104134445A (en) | Method and system for testing magnetic head through magnetic coupling method | |
| CN101458653A (en) | Automatic test method for tax controller of cash register | |
| CN104112111A (en) | Magnetic stripe card decoding circuit and method | |
| CN105373392A (en) | DOS system based control method for digit number of character string of scanning sequence | |
| CN202916002U (en) | Underwater sound wave collecting system | |
| CN103530133A (en) | Custom operation method and device for terminal | |
| CN103677566A (en) | Picture editing method and picture editing device | |
| CN201435075Y (en) | Device for testing integrity of hard disc card signal based on SAS data bus | |
| CN102645978A (en) | Simulator capable of simulating keyboard output signals | |
| CN103198168A (en) | Off-line simulation method | |
| CN202631744U (en) | Ultrasonic source in seismic physical modeling experimental system | |
| CN204791600U (en) | Pen is read to external chinese teaching point | |
| CN103491366A (en) | Method, device and system for testing digital set-top box | |
| CN103617116A (en) | Interactive device driver debugging method and device based on input and output simulation | |
| CN102480746A (en) | Automatic AT-order testing method | |
| CN102254202B (en) | Memory stick (MS) card control system and read-write method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |