CN102109914B - For scanning passive type integrated circuit architecture and the control method thereof of contact panel - Google Patents
For scanning passive type integrated circuit architecture and the control method thereof of contact panel Download PDFInfo
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- CN102109914B CN102109914B CN200910215412.6A CN200910215412A CN102109914B CN 102109914 B CN102109914 B CN 102109914B CN 200910215412 A CN200910215412 A CN 200910215412A CN 102109914 B CN102109914 B CN 102109914B
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Abstract
For scanning a passive type integrated circuit architecture for contact panel, it is characterized in that comprising: a master integrated circuit; And at least one secondary integrated circuit, couple a contact panel and described master integrated circuit, in order to scan described contact panel; Wherein, the parameter that scans that described at least one secondary integrated circuit scans described contact panel is provided by described master integrated circuit.Passive type integrated circuit architecture and control method thereof for scanning contact panel of the present invention has the application elasticity and effective utilization that significantly increase secondary IC, hardware must not be changed, can not manufacturing cost be increased, effectively improve capture speed and solve the advantage that ghost puts phenomenon.
Description
Technical field
The present invention relates to a kind of contact panel, specifically, is a kind of passive type integrated circuit architecture and control method thereof of scanning contact panel.
Background technology
Utilize active integrated circuit (IntegratedCircuit; IC) framework scans contact panel is a kind of known technology, described active IC framework is that in secondary (Slave) IC, configuration scans parameter in advance, the stitching (Trace) such as scanned, pattern, opportunity and analog parameter etc., scan parameter described in described secondary IC basis and scan described contact panel, scan data is sent to main (Master) IC to judge.When the size of contact panel increases, in order to reduce scan time, the zones of different of the secondary IC of more than two to contact panel can be used to scan simultaneously.Because the parameter that scans of every secondary IC is predefined, and write different firmwares respectively because the stitching scanned is different and sets different analog parameters, therefore every secondary IC is standard specification, only can scan fixing stitching, cannot exchange with other secondary IC and use, also cannot scan result according to it to reconfigure the new parameter that scans and again scan specific region, except the elasticity lacking application, more cannot solve ghost point phenomenon (Ghostphenomenon).
Therefore known active integrated circuit (IntegratedCircuit; IC) framework scans contact panel and there is above-mentioned all inconvenience and problem.
Summary of the invention
Object of the present invention, is to propose a kind of passive type integrated circuit architecture for scanning contact panel and control method thereof.
Another object of the present invention, is that proposing a kind of increasing applies flexible passive type integrated circuit architecture and control method thereof.
Another object of the present invention, be to propose a kind of solve ghost point phenomenon passive type integrated circuit architecture and control method with.
For achieving the above object, technical solution of the present invention is:
For scanning a passive type integrated circuit architecture for contact panel, it is characterized in that comprising:
One master integrated circuit; And
At least one secondary integrated circuit, couples a contact panel and described master integrated circuit, in order to scan described contact panel;
Wherein, the parameter that scans that described at least one secondary integrated circuit scans described contact panel is provided by described master integrated circuit.
Passive type integrated circuit architecture for scanning contact panel of the present invention can also be further achieved by the following technical measures.
Aforesaid passive type integrated circuit architecture, wherein said scan parameter comprise scan stitching, scan pattern and scan analog parameter.
Aforesaid passive type integrated circuit architecture, the wherein said pattern that scans comprises scanning in proper order or specifying and scans.
Aforesaid passive type integrated circuit architecture, the wherein said analog parameter that scans comprises gain, scan time and displacement level.
Aforesaid passive type integrated circuit architecture, wherein said at least one secondary integrated circuit is idle armed state during scanning parameter described in not obtaining.
Aforesaid passive type integrated circuit architecture, wherein said master integrated circuit receives the scan data from described at least one secondary integrated circuit and judges, scan parameter with what determine whether to reset described at least one secondary integrated circuit, make described at least one secondary integrated circuit again scan described contact panel.
Aforesaid passive type integrated circuit architecture, the wherein said parameter that scans reset comprises the subregion scanning described contact panel.
Aforesaid passive type integrated circuit architecture, wherein said subregion comprises the region that ghost point phenomenon may occur.
Aforesaid passive type integrated circuit architecture, wherein said at least one secondary integrated circuit comprises array capacitance touching control integrated circuit.
Aforesaid passive type integrated circuit architecture, wherein said at least one secondary integrated circuit has identical firmware.
Aforesaid passive type integrated circuit architecture, wherein more comprises a universal transport interface and is connected between described master integrated circuit and described at least one secondary integrated circuit.
Aforesaid passive type integrated circuit architecture, wherein said universal transport interface comprises I
2c or SPI.
For scanning a control method for the passive type integrated circuit architecture of contact panel, it is characterized in that comprising the following steps:
Mat one master integrated circuit produces an instruction;
What scan a contact panel according at least one secondary integrated circuit of described instruction setting scans parameter; And
Described at least one secondary integrated circuit scans described contact panel in response to described instruction with the described parameter that scans.
The control method of the passive type integrated circuit architecture for scanning contact panel of the present invention can also be further achieved by the following technical measures.
Aforesaid method, the wherein said step scanning parameter according to described instruction setting comprise set scan stitching, scan pattern and scan analog parameter.
Aforesaid method, wherein more comprises the following steps:
Scan data is sent to described master integrated circuit by described at least one secondary integrated circuit; And
Described master integrated circuit judges described scan data, determining whether produce one second instruction with what reset described at least one secondary integrated circuit scans parameter, makes described at least one secondary integrated circuit again scan described contact panel according to described second instruction.
Aforesaid method, the wherein said step again scanning described contact panel comprises the region scanning in described contact panel and ghost point phenomenon may occur.
Aforesaid method, wherein more comprises and transmits described instruction to described at least one secondary integrated circuit through a universal transport interface.
Aforesaid method, wherein more comprises and transmits described scan data to described master integrated circuit through a universal transport interface.
After adopting technique scheme, the passive type integrated circuit architecture and control method thereof for scanning contact panel of the present invention has the following advantages:
1. significantly increase application elasticity and the effective utilization of secondary IC.
2. must not change hardware, can not manufacturing cost be increased.
3. effectively improve capture speed.
4. solve ghost point phenomenon.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of the first embodiment of the present invention;
Fig. 2 is the schematic diagram that main IC sets secondary IC and scans stitching and scan analog parameter;
Fig. 3 is the schematic diagram that main IC sets that secondary IC scans the combination of stitching;
Fig. 4 is the schematic diagram of stitching combination;
Fig. 5 is the schematic diagram that main IC sets that secondary IC scans pattern;
Fig. 6 is the schematic diagram that main IC sets that secondary IC scans pattern;
Fig. 7 is the schematic diagram of the second embodiment of the present invention; And
Fig. 8 is the schematic diagram of the third embodiment of the present invention.
In figure, 10, passive type IC framework 12, main IC13, universal transport interface 14, secondary IC16, contact panel 18, possible ghost point position 20, possible ghost point position 22, passive type IC framework 24, secondary IC26, secondary IC30, secondary IC32, secondary IC34, secondary IC36, secondary IC38, region 40, region 42, region 44, region.
Embodiment
Below in conjunction with embodiment and accompanying drawing thereof, the present invention is illustrated further.
Now refer to Fig. 1, Fig. 1 is the schematic diagram of the first embodiment of the present invention.As shown in the figure, described passive type (Passive) IC framework 10 is in order to scan contact panel 16.Described contact panel 16 has the stitching TR0 to TRm as the line of induction, and passive type IC framework 10 comprises an a main IC12 and secondary IC14 and connects contact panel 16, such as, connects stitching TR0 to TRm.Main IC12 controls secondary IC14 by universal transport interface 13 and scans the action of contact panel 16 and provide required and scan parameter.In one embodiment, main IC12 produces instruction and sends secondary IC14 to what set that it scans contact panel 16 by universal transport interface 13 and scan parameter, and secondary IC14 scans contact panel 16 in response to described instruction with the described parameter that scans.Such as, main IC12 sets secondary IC14 via described instruction and scans stitching TR0 to TRm, and secondary IC14 scans stitching TR0 to TRm in response to described instruction.Secondary IC14 sends by universal transport interface 13 scan data obtained after scanning to main IC12, and main IC12 judges the scan data from secondary IC14, scans parameter, make secondary IC14 again scan contact panel 16 with what determine whether to reset secondary IC14.Such as, when the data that scans from secondary IC14 judges through main IC12, during point phenomenon of thinking that there's something fishy, main IC12 produces new instruction and sets the subregion that secondary IC14 scans contact panel 16, such as may there is the region of ghost point phenomenon, therefore secondary IC14 scans stitching TRk, TRi, TRh and the TRj on possible ghost point position 18 and 20 in response to described new instruction, then judges the actual position of object on contact panel 16 by main IC12 according to scan data, solves ghost point phenomenon.In one embodiment, when the scan data that main IC12 thinks from secondary IC14 occurs abnormal, such as Analog-digital Converter (AnalogyDigitalConvert; ADC), when value is too high or too low, main IC12 scans parameter by what reset secondary IC14, makes secondary IC14 again scan contact panel 16.
In the present embodiment, secondary IC14 adopts existing touch-control (TouchPad) IC, and such as array condenser type (ProjectedCapacitance) touch-control IC, therefore must not change hardware, can not increase manufacturing cost.Universal transport interface 13 comprises inter-integrated circuit (Inter-IntegratedCircuit; I
2or Serial Peripheral Interface (SerialPeripheralInterface C); SPI).Secondary IC14 scan contact panel 16 scan parameter comprise scan stitching, scan pattern and scan analog parameter etc., main IC12 can scan parameter and adjusts and set described etc.As shown in Figure 2, main IC12 sets scanning stitching and scanning analog parameter of secondary IC14 by universal transport interface 13, such as, the scope that scans that main IC12 sets secondary IC14 is stitching TR0 to TR7, and scan stitching TR0TR7 use scan analog parameter, as gain, scan time and displacement level etc., secondary IC14 scans stitching TR0 to TR7 with the analog parameter that scans of setting.As shown in Figure 3, main IC12 sets the combination of the stitching that secondary IC14 scans by universal transport interface 13, such as, under the condition that main IC12 allows at the internal memory of secondary IC14, the combination of stitching (TR0, TR1, TR2, TR3) as shown in Figure 4 with stitching (TR4, TR5, TR6, TR7) is set in secondary IC14.When there is ghost point phenomenon, main IC12 assigns the instruction of combining and scanning, and secondary IC14 scans according to the stitching combination of described instruction to possible ghost point position, correctly to judge the position of object on contact panel 16.As shown in Figure 5, main IC12 sets the pattern that scans of secondary IC14 as scanning in proper order by universal transport interface 13, and secondary IC14 sequentially scans stitching TR0, TR1, TR2 ...As shown in Figure 6, the pattern that scans that main IC12 sets secondary IC14 by universal transport interface 13 is that appointment scans, and secondary IC14 only scans the stitching that main IC12 specifies, such as stitching TR1 and TR6.
Fig. 7 shows the second embodiment of the present invention, and passive type IC framework 22 is in order to scan contact panel 16.Contact panel 16 has the stitching TR0 to TRm as the line of induction, and passive type IC framework 22 comprises a main IC12 and secondary IC24 and 26, secondary IC24 and 26 and connects stitching TR0 to TRn and stitching TRn+I to TRm respectively.Main IC12 by universal transport interface 13 control respectively secondary IC24 and 26 scan stitching TR0 to TRn and stitching TRn+1 to TRm action and provide must scan parameter.In the present embodiment, secondary IC24 and 26 adopts existing touch-control IC, such as array capacitance touching control IC, therefore must not change hardware, can not increase manufacturing cost.Universal transport interface 13 comprises I
2c or SPI.Main IC12 controls the operation embodiment as the aforementioned of secondary IC24 and 26, no longer repeats.Due to secondary IC24 and 26 can carry out scanning simultaneously and also each be responsible for scanning part stitching, suppose m=40 and n=20, as long as therefore spend the time scanning 20 stitchings just the contact panel 16 with 40 stitchings can be scanned one time, effectively improve capture speed.
Fig. 8 shows the third embodiment of the present invention, contact panel 16 is divided into four regions 38,40,42 and 44, passive type IC framework comprises a main IC12 and four secondary IC30,32,34 and 36, secondary IC30,32,34 and 36 join domain 38,40,42 and 44 respectively.Main IC12 by universal transport interface 13 control respectively secondary IC30,32,34 and 36 scan region 38,40,42 and 44 action and provide must scan parameter.In the present embodiment, secondary IC30,32,34 and 36 adopts existing touch-control IC, such as array capacitance touching control IC, therefore must not change hardware, can not increase manufacturing cost.Universal transport interface 13 comprises I
2c or SPI.Main IC12 control secondary IC30,32, the operation embodiment as the aforementioned of 34 and 36, no longer repeat.Due to the subregion that secondary IC30,32,34 and 36 can carry out scanning and each is responsible for scanning contact panel 16 simultaneously, therefore can effectively improve capture speed.
In addition, according to the requirement of time, the quantity of secondary IC can be changed, control the secondary IC of varying number by a main IC.
The present invention adopts the design concept of entirely passive type, the motion flow of secondary IC is controlled by a main IC, secondary IC only just does corresponding action when main IC assigns instruction, such as scan contact panel with the parameter that scans of correspondence, secondary IC is not during obtaining main IC instruction, such as during not obtaining and scanning parameter, it is idle armed state.The parameter that scans scanning contact panel due to secondary IC is provided by main IC, secondary IC must not write different firmwares in advance and set different analog parameters with correspondence different scan stitching, identical firmware can be used, the motion flow of described firmware is controlled by main IC, therefore the secondary IC scanning contact panel zones of different can exchange each other, also again can scan via the new subregion of parameter to contact panel that scan of main IC setting according to the result that scans of reality, secondary IC can not by standard, thus can reuse, significantly increase application elasticity and the effective utilization of secondary IC.
Above embodiment is used for illustrative purposes only, but not limitation of the present invention, person skilled in the relevant technique, without departing from the spirit and scope of the present invention, can also make various conversion or change.Therefore, all equivalent technical schemes also should belong to category of the present invention, should be limited by each claim.
Claims (16)
1., for scanning a passive type integrated circuit architecture for contact panel, it is characterized in that comprising:
One master integrated circuit; And
At least second mate's integrated circuit, couples a contact panel and described master integrated circuit, in order to scan described contact panel;
Wherein, described at least second mate integrated circuit scans described contact panel according to each self-corresponding sweep parameter simultaneously, and the sweep parameter of described correspondence is provided by described master integrated circuit;
Wherein, described master integrated circuit be supplied to described at least in second mate's integrated circuit the sweep parameter of the described correspondence of each be included in the different stitching combination that a first direction will scan;
Wherein, the stitching that described in the sweep parameter of described correspondence makes, at least corresponding secondary IC scanning is specified in second mate's integrated circuit, the quantity of described stitching of specifying is less than the total quantity of the stitching on the described first direction of described contact panel.
2. passive type integrated circuit architecture as claimed in claim 1, it is characterized in that, described sweep parameter comprises scan pattern, and described scan pattern comprises P-SCAN or invisible scanning.
3. passive type integrated circuit architecture as claimed in claim 1, it is characterized in that, described sweep parameter comprises gain, sweep time and displacement level.
4. passive type integrated circuit architecture as claimed in claim 1, is characterized in that, described at least second mate integrated circuit is idle armed state during the sweep parameter not obtaining described correspondence.
5. passive type integrated circuit architecture as claimed in claim 1, it is characterized in that, described master integrated circuit receives the scan-data from described at least second mate integrated circuit and judges, with the sweep parameter of at least second mate's integrated circuit described in determining whether to reset, described in making, at least second mate's integrated circuit scans described contact panel again.
6. passive type integrated circuit architecture as claimed in claim 5, is characterized in that, described in the sweep parameter that resets comprise the subregion scanning described contact panel.
7. passive type integrated circuit architecture as claimed in claim 6, is characterized in that, described subregion comprises the region that ghost point phenomenon may occur.
8. passive type integrated circuit architecture as claimed in claim 1, it is characterized in that, described at least second mate integrated circuit comprises array capacitance touching control integrated circuit.
9. passive type integrated circuit architecture as claimed in claim 1, it is characterized in that, described at least second mate integrated circuit has identical firmware.
10. passive type integrated circuit architecture as claimed in claim 1, is characterized in that, more comprise a universal transport interface and be connected between described master integrated circuit and described at least second mate integrated circuit.
11. passive type integrated circuit architectures as claimed in claim 10, it is characterized in that, described universal transport interface comprises I
2c or SPI.
12. 1 kinds, for scanning the control method of the passive type integrated circuit architecture of contact panel, is characterized in that comprising the following steps:
Mat one master integrated circuit produces an instruction;
The sweep parameter of the correspondence of each at least second mate's integrated circuit is set according to described instruction; And
Each in described at least second mate integrated circuit scans described contact panel in response to described instruction with the sweep parameter of set described correspondence simultaneously;
Wherein, described master integrated circuit be supplied to described at least in second mate's integrated circuit the sweep parameter of the described correspondence of each be included in the different stitching combination that a first direction will scan;
Wherein, the stitching that described in the sweep parameter of described correspondence makes, at least corresponding secondary IC scanning is specified in second mate's integrated circuit, the quantity of described stitching of specifying is less than the total quantity of the stitching on the described first direction of described contact panel.
13. control methods as claimed in claim 12, is characterized in that, more comprise the following steps:
Scan-data is sent to described master integrated circuit by described at least second mate integrated circuit; And
Described master integrated circuit judges described scan-data, determine whether to produce one second instruction with the sweep parameter of at least second mate's integrated circuit described in resetting, described in making, at least second mate's integrated circuit scans described contact panel again according to described second instruction.
14. control methods as claimed in claim 13, is characterized in that, the described step again scanning described contact panel comprises in the described contact panel of scanning the region that ghost point phenomenon may occur.
15. control methods as claimed in claim 12, is characterized in that, more comprise and transmit described instruction to described at least second mate integrated circuit through a universal transport interface.
16. control methods as claimed in claim 13, is characterized in that, more comprise and transmit described scan-data to described master integrated circuit through a universal transport interface.
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| CN200910215412.6A CN102109914B (en) | 2009-12-25 | 2009-12-25 | For scanning passive type integrated circuit architecture and the control method thereof of contact panel |
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| CN200910215412.6A CN102109914B (en) | 2009-12-25 | 2009-12-25 | For scanning passive type integrated circuit architecture and the control method thereof of contact panel |
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| CN104156126A (en) * | 2013-05-15 | 2014-11-19 | 源贸科技股份有限公司 | Touch panel with auxiliary judgment function |
| TWM475635U (en) * | 2013-09-10 | 2014-04-01 | Ite Tech Inc | Touch display device |
| CN109752618A (en) | 2019-03-22 | 2019-05-14 | 敦泰电子有限公司 | A kind of combination of touch screen detection chip and terminal device |
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| CN101561731A (en) * | 2008-04-16 | 2009-10-21 | 义隆电子股份有限公司 | Capacitance touch control device and control method thereof |
| CN101593065A (en) * | 2008-05-27 | 2009-12-02 | 宸鸿光电科技股份有限公司 | Capacitive touch device and method thereof |
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| TWI469017B (en) * | 2008-04-02 | 2015-01-11 | Elan Microelectronics Corp | Capacitive touch device and its method for saving power consumption |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101561731A (en) * | 2008-04-16 | 2009-10-21 | 义隆电子股份有限公司 | Capacitance touch control device and control method thereof |
| CN101593065A (en) * | 2008-05-27 | 2009-12-02 | 宸鸿光电科技股份有限公司 | Capacitive touch device and method thereof |
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