CN102090917A - Dual-plane probe for puncture location - Google Patents

Dual-plane probe for puncture location Download PDF

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Publication number
CN102090917A
CN102090917A CN2011100578111A CN201110057811A CN102090917A CN 102090917 A CN102090917 A CN 102090917A CN 2011100578111 A CN2011100578111 A CN 2011100578111A CN 201110057811 A CN201110057811 A CN 201110057811A CN 102090917 A CN102090917 A CN 102090917A
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CN
China
Prior art keywords
probe
detection
head end
test surface
station
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2011100578111A
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Chinese (zh)
Inventor
周正帮
沈忠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUZHOU ZHONGJIA MEDICAL TECHNOLOGY Co Ltd
Original Assignee
SUZHOU ZHONGJIA MEDICAL TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SUZHOU ZHONGJIA MEDICAL TECHNOLOGY Co Ltd filed Critical SUZHOU ZHONGJIA MEDICAL TECHNOLOGY Co Ltd
Priority to CN2011100578111A priority Critical patent/CN102090917A/en
Publication of CN102090917A publication Critical patent/CN102090917A/en
Pending legal-status Critical Current

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Abstract

The invention provides a dual-plane probe for puncture location. The dual-plane probe comprises a puncture needle, a first detection surface, a second detection surface, a probe head end, a first detection station and a second detection station, and the dual-plane probe is characterized in that the first detection surface is positioned on the first detection station; the second detection surface is positioned on the second detection station; the first detection station is positioned on the front end of the probe head end; the second detection station is positioned in the middle part of the probe head end; the puncture needle is positioned on the second detection station; a detection signal and control signal transmission channel for the first detection surface, the second detection surface and the puncture needle are positioned in the probe head end; and the second detection surface and the first detection surface are perpendicular to each other on a curved surface of the probe head end. When in operation, ultrasonic detection is carried out in two directions through the first detection surface and the second detection surface, location is carried out in combination with ultrasonic images, and then the puncture needle stretches out for puncture operation. The dual-plane probe has the advantages of precise location and less possibility of misplacement.

Description

A kind of localized biplane probe that is used to puncture
Technical field
The present invention relates to a kind of ultrasonic diagnostic equipment, specifically is a kind of localized biplane probe that is used to puncture.
Background technology
In the medical science, puncture needle is thrust body cavity extraction secretions do chemical examination, or do contrast examination, or a kind of diagnosis and treatment technology of injection medicine is known as puncture in body cavity to body cavity injecting gas, contrast agent.In the application of puncturing, often need to carry out assist location by ultrasound wave.But the localized ultrasound wave assist location equipment that is used in traditional puncture just adopts fixed puncture line guiding on single plane, and this method location is a plane, and is inaccurate, easily scurries the position.
Summary of the invention
The present invention provides a kind of localized biplane probe that punctures that is used to that is difficult for scurrying position, accurate positioning just in order to solve the problems of the technologies described above.
The present invention is achieved through the following technical solutions:
A kind of localized biplane probe that is used to puncture, comprise puncture needle, first test surface, second test surface, probe head end, first probe station, second probe station, it is characterized in that first test surface is positioned on first probe station, second test surface is positioned on second probe station, first probe station is positioned at the front end of probe head end, second probe station is positioned at probe head end middle part, puncture needle is positioned on second probe station, and the detectable signal of first test surface, second test surface and puncture needle and control signal transmission channel are positioned at the probe head end.Second test surface is vertical on probe head end curved surface with test surface.
Description of drawings
In the accompanying drawing, Fig. 1 is a sketch map of the present invention, and Fig. 2 is a front elevation of the present invention, wherein:
1-puncture needle, 2-first test surface, 3-second test surface, the 4-head end of popping one's head in, 5-first probe station, 6-second probe station.
The specific embodiment
The present invention is described further below in conjunction with accompanying drawing:
A kind of localized biplane probe that is used to puncture, comprise puncture needle 1, first test surface 2, second test surface 3, probe head end 4, first probe station 5, second probe station 6, it is characterized in that first test surface 2 is positioned on first probe station 5, second test surface 3 is positioned on second probe station 6, first probe station 5 is positioned at the front end of probe head end 4, second probe station 6 is positioned at probe head end 4 middle parts, puncture needle 1 is positioned on second probe station 6, and the detectable signal of first test surface 2, second test surface 3 and puncture needle 1 and control signal transmission channel are positioned at probe head end 4.Second test surface 3 is vertical on probe head end 4 curved surfaces with first test surface 2.In the operation, carry out ultrasonic listening from both direction respectively by first test surface 2 and second test surface 3, position in conjunction with ultrasonic image, puncture needle 1 stretches out and carries out puncture procedure then.Use this probe precisely to locate, and be difficult for scurrying the position.

Claims (2)

1. the localized biplane that is used to puncture is popped one's head in, comprise puncture needle, first test surface, second test surface, probe head end, first probe station, second probe station, it is characterized in that first test surface is positioned on first probe station, second test surface is positioned on second probe station, first probe station is positioned at the front end of probe head end, second probe station is positioned at probe head end middle part, puncture needle is positioned on second probe station, and the detectable signal of first test surface, second test surface and puncture needle and control signal transmission channel are positioned at the probe head end.
2. according to the described a kind of localized biplane probe that is used to puncture of claim 1, it is characterized in that described second test surface is vertical on probe head end curved surface with first test surface.
CN2011100578111A 2011-03-10 2011-03-10 Dual-plane probe for puncture location Pending CN102090917A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011100578111A CN102090917A (en) 2011-03-10 2011-03-10 Dual-plane probe for puncture location

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2011100578111A CN102090917A (en) 2011-03-10 2011-03-10 Dual-plane probe for puncture location

Publications (1)

Publication Number Publication Date
CN102090917A true CN102090917A (en) 2011-06-15

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CN2011100578111A Pending CN102090917A (en) 2011-03-10 2011-03-10 Dual-plane probe for puncture location

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CN (1) CN102090917A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113768538A (en) * 2021-09-15 2021-12-10 上海益超医疗器械有限公司 Detection control method, device and system for biplane ultrasonic probe device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10118072A (en) * 1996-10-17 1998-05-12 Olympus Optical Co Ltd Intra-celom ultrasonic probe apparatus
JP2006204465A (en) * 2005-01-27 2006-08-10 Pentax Corp Distal end portion of ultrasonic endoscope for treatment
CN101390760A (en) * 2007-09-21 2009-03-25 奥林巴斯医疗株式会社 Ultrasound diagnostic apparatus
CN201609378U (en) * 2009-12-31 2010-10-20 童宏华 B-ultrasonic probe with puncture channel
CN202015250U (en) * 2011-03-10 2011-10-26 苏州中加医疗科技有限公司 Double-plane probe for puncture location

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10118072A (en) * 1996-10-17 1998-05-12 Olympus Optical Co Ltd Intra-celom ultrasonic probe apparatus
JP2006204465A (en) * 2005-01-27 2006-08-10 Pentax Corp Distal end portion of ultrasonic endoscope for treatment
CN101390760A (en) * 2007-09-21 2009-03-25 奥林巴斯医疗株式会社 Ultrasound diagnostic apparatus
CN201609378U (en) * 2009-12-31 2010-10-20 童宏华 B-ultrasonic probe with puncture channel
CN202015250U (en) * 2011-03-10 2011-10-26 苏州中加医疗科技有限公司 Double-plane probe for puncture location

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113768538A (en) * 2021-09-15 2021-12-10 上海益超医疗器械有限公司 Detection control method, device and system for biplane ultrasonic probe device

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C10 Entry into substantive examination
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C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20110615