CN102054079B - Method and device for solving static working points with PN junction similar characteristics - Google Patents
Method and device for solving static working points with PN junction similar characteristics Download PDFInfo
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- CN102054079B CN102054079B CN200910211390.6A CN200910211390A CN102054079B CN 102054079 B CN102054079 B CN 102054079B CN 200910211390 A CN200910211390 A CN 200910211390A CN 102054079 B CN102054079 B CN 102054079B
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Abstract
The invention provides a method and a device for solving static working points with PN junction similar characteristics. The method comprises the following steps of: detecting an element with voltage current characteristics showing index movement in a non-linear circuit and marking the element as an element with PN junction similar characteristics; regulating the element marked as the element with the PN junction similar characteristics; and solving static working points of the non-linear circuit by using a non-linear equation.
Description
Technical field
The invention relates to a kind of method and apparatus solving non-linear circuit quiescent point, especially about the method and apparatus of non-linear circuit quiescent point solving tool class PN junction characteristic.
Background technology
Circuit simulation software (Simulation Program with Integrated Circuit Emphasis, HSPICE), before carrying out any form, first needs to carry out DC analysis, uses the direct current (DC) bias point setting up circuit.With this as the starting point, the simulation of other performances such as transient state, ac small signal, noise can just be carried out.The calculating of circuit static working point, its essence is exactly mathematically solution nonlinear Algebraic Equation set.In order to set up the DC analysis point of circuit, HSPICE must solve the one group of nonlinear equation describing circuit behavior, it can have by the method for conventional non-linear algebraic equation numerical solution: directly Newton iteration method (Newton-Raphson Algorithm, N-R algorithm), continuation method and pseudo-Transient Method.Although the ultimate principle of these methods as everyone knows, how for the feature of breadboardin, the algorithm realizing out having excellent properties and very Strong Convergence is but the problem that Integrated circuit designers perplexs the most always.Particularly, the convergence problem of circuit static working point is problem the most difficult in breadboardin.
In circuit simulation, quiescent point is the basis solving other circuit characteristics all.But the quiescent point of non-linear circuit is often difficult to try to achieve, the classical method solving nonlinear equation is N-R algorithm.The step of N-R algorithm is after a first given suitable initial value, substitutes into carry out iteration in equation, be less than the permissible error of a certain setting until the absolute value that the solution vector of adjacent twice is poor to each other till.N-R algorithm there will be the problem do not restrained in some cases, and such as, when this nonlinear equation is discontinuous, or the initial value adopted in computation process is inaccurate.When being difficult to convergence in computation process, HSPICE can increase the number of interative computation or re-start computing after minimizing step size (step size).But those steps add simulated time, and may remain unchanged not restrain at those step posterior nodal point voltages or electric current and make simulation interruption.Because N-R algorithm has the characteristic of local convergence, general circuit often because do not have enough close to true original state conjecture value of separating, and cannot utilize N-R algorithm to obtain stable quiescent point, and therefore convergence is the greatest problem that these methods run into.
Nonlinear device is the main cause causing HSPICE to restrain, and below lifts a PN junction element and is explained.If circuit comprises a PN junction element, its DC characteristic can by one and PN junction cross-pressure V
drelevant non-linear current source i
drepresent:
In solution procedure, HSPICE must set up the direct current (DC) bias point of circuit in specific iteration number, otherwise can produce non-convergent situation and break simulation.Because its I-V family curve of PN junction element is that index rises, therefore circuit in an iterative process, small size V
dvariation can cause a large amount of curent changes, makes circuit be difficult to convergence.In order to solve this problem, in HSPICE, all taking certain measure for nonlinear devices such as diode, triode and metal-oxide-semiconductors and carrying out this situation in place, as added shunt conductance (gmin), PN junction pressure limiting etc.
If HSPICE circuit comprises a PN junction element, then it comprises one against zero conductance region when partially operating.When circuit simulation, this region can cause one except the error situations of zero (divided-by-zero).In order to avoid this problem, each PN junction in each HSPICE semiconductor element has a gmin and transduces element in parallel in this PN junction, to avoid time voltage produced in iterative process away from last solution.
But present circuit design often adopts the device such as non-linear resistance, Voltage-controlled Current Source (Voltage-Controlled-Current-Source, VCCS) to go simulation PN junction characteristic, is referred to as class PN junction element.The nonlinear resistance property of this kind PN junction element can form obstruction to the convergence property of HSPICE, in order to detect that those elements are to adopt above-mentioned shunt conductance stepping or PN junction pressure limiting to add strong convergence, be necessary that a kind of method proposing detection type PN junction element is to identify those elements, and propose a kind of emulation mode for such PN junction element to improve the convergence of circuit.
Fig. 1 example one solves the schematic diagram of non-linear circuit quiescent operation point process, and wherein the longitudinal axis represents electric current, transverse axis representative voltage, and the index of class PN junction is incremental property.In the process solving quiescent point, suppose to enter next stepping point B after an initial value point A point, but because the exponential increasing characteristic of class PN junction, cause the gap between A point and B point excessive, be difficult to reach convergence.Can see out by Fig. 1, due to the existence of this strong nonlinear characteristic, the variation that node voltage is more small all can cause increasing substantially of output current, and this is very disadvantageous to ensuing N-R iterative process.In circuit, the nonlinear characteristic of nonlinear device causes the failure of N-R algorithm, and the nonlinear device therefore in prior first discovery circuit, is adjusted in advance, is a matter of great account feelings.
Summary of the invention
The present invention proposes a kind of method and apparatus solving the non-linear circuit quiescent point of tool class PN junction characteristic, and it is mainly divided into two benches, and the first stage is the element detecting tool class PN junction characteristic, and subordinate phase is the element of adjustment class PN junction characteristic.Element due to class PN junction characteristic is the main cause causing HSPICE to restrain, if therefore can detect in advance, and is adjusted, then can get rid of the obstacle of HSPICE convergence in advance, accelerates speed and the probability of HSPICE convergence.
The invention provides a kind of method solving the non-linear circuit quiescent point of tool class PN junction characteristic, comprise following steps: detect the element that the voltage-current characteristic in this non-linear circuit exponentially changes, and be labeled as tool class PN junction characteristic; The element being labeled as class PN junction characteristic is adjusted; And utilize the quiescent point of this non-linear circuit after Solving Nonlinear Equation adjustment.
The invention provides a kind of device solving the non-linear circuit quiescent point of tool class PN junction characteristic, comprise a detecting unit, an adjustment unit and a computing unit.This detecting unit detects the element that the voltage-current characteristic in this non-linear circuit exponentially changes, and is labeled as tool class PN junction characteristic.The element being labeled as class PN junction characteristic adjusts by this adjustment unit.The quiescent point of this non-linear circuit after this computing unit utilizes Solving Nonlinear Equation to adjust.
The detecting unit of one embodiment of the invention comprises a non-linear resistance detection module and a VCCS detection module.This non-linear resistance detection module adds test voltage to the two ends of possible non-linear resistance, and tries to achieve the electric conductivity value under each group of test voltage.If this group electric conductivity value has indicial response, then marking this non-linear resistance is tool class PN junction characteristic.This VCCS detection module adds test voltage to the two ends of possible Voltage-controlled Current Source, and tries to achieve the current value under each group of test voltage.If this group current value has indicial response, then marking this Voltage-controlled Current Source is tool class PN junction characteristic.
Accompanying drawing explanation
Fig. 1 example one solves the schematic diagram of non-linear circuit quiescent operation point process;
Fig. 2 is the process flow diagram solving the non-linear circuit quiescent point of tool class PN junction characteristic of one embodiment of the invention;
Fig. 3 is the process flow diagram of the detection tool class PN junction characteristic element of one embodiment of the invention;
Fig. 4 is the device schematic diagram solving the non-linear circuit quiescent point of tool class PN junction characteristic of one embodiment of the invention; And
Fig. 5 is the schematic diagram of the detecting unit of one embodiment of the invention.
Embodiment
For ease of better understanding spirit of the present invention, below in conjunction with the preferred embodiments of the present invention, it is described further.The present invention is a kind of method and apparatus solving the non-linear circuit quiescent point of class PN junction characteristic in the direction that this inquires into.In order to the present invention can be understood up hill and dale, detailed step and composition will be proposed in the following description.Obviously, enforcement of the present invention be not defined in the technician of circuit design the specific details be familiar with.On the other hand, well-known composition or step are not described in details, to avoid the restriction causing the present invention unnecessary.Preferred embodiment of the present invention can be described in detail as follows, but except these are described in detail, the present invention can also implement in other embodiments widely, and scope of the present invention not circumscribed, it is as the criterion with claims.
Fig. 2 is the process flow diagram solving the non-linear circuit quiescent point of tool class PN junction characteristic of one embodiment of the invention.In step 21, detect the element that the voltage-current characteristic in this non-linear circuit exponentially changes, and be labeled as tool class PN junction characteristic.The element of this tool class PN junction characteristic is the target that the present invention will detect, and therefore primary goal is detected.In step 22, the element being labeled as class PN junction characteristic is adjusted.This method of adjustment for doing suitable adjustment, such as, may do the pressure limiting of class PN junction, adds shunt conductance (gmin) etc.In step 23, utilize the quiescent point of this non-linear circuit of Solving Nonlinear Equation, such as, calculate the Jacobian matrix after pressure limiting, carry out NR iteration, until try to achieve the quiescent point of circuit.
Fig. 3 is the process flow diagram of the detection tool class PN junction characteristic element of one embodiment of the invention.First determine to occur that the device of class PN junction characteristic is non-linear resistance and Voltage-controlled Current Source (VCCS).Then test voltage is added, with the electric current of test component or resistance characteristic to its two ends.
In step 31, test voltage is added to the two ends of non-linear resistance, and tries to achieve the electric conductivity value under each group of test voltage.Do you in step 32, judge that this group electric conductivity value has indicial response? if answer is yes, then enter step 33, otherwise detection of end.For non-linear resistance, if test conductance is along with the rising exponentially type growth of test voltage, then can judge that this non-linear resistance has class PN junction characteristic.In step 33, marking this non-linear resistance is tool class PN junction characteristic.
In step 34, test voltage is added to the two ends of Voltage-controlled Current Source, and tries to achieve the current value under each group of test voltage.Do you in step 35, judge that this group current value has indicial response? if answer is yes, then enter step 36, otherwise detection of end.For VCCS, if measuring current is along with the rising exponentially type growth of test voltage, then can judge that this VCCS has class PN junction characteristic.In step 36, marking this Voltage-controlled Current Source is tool class PN junction characteristic.
Detect relevant there is the element of class PN junction characteristic after, we can do relevant process to it in ensuing N-R iterative process, as the pressure limiting of class PN junction, add shunt conductance (gmin) etc.These measures are conducive to limiting device electric current or resistance within the specific limits, and by shunt conductance to increase the linearization degree of this element.
Fig. 4 is the device schematic diagram solving the non-linear circuit quiescent point of tool class PN junction characteristic of one embodiment of the invention, and it comprises detecting unit 41, adjustment unit 42 and a computing unit 43.This detecting unit 41 detects the element that the voltage-current characteristic in this non-linear circuit exponentially changes, and is labeled as tool class PN junction characteristic.The element being labeled as class PN junction characteristic adjusts by this adjustment unit 42, such as, do as the pressure limiting of class PN junction, adds shunt conductance (gmin) etc.This computing unit 43 utilizes the quiescent point of this non-linear circuit of Solving Nonlinear Equation, such as, calculate the Jacobian matrix after pressure limiting, carry out NR iteration, until try to achieve the quiescent point of circuit.
Fig. 5 is the schematic diagram of the detecting unit 41 of one embodiment of the invention, and it comprises non-linear resistance detection module 51 and a VCCS detection module 52.This non-linear resistance detection module 51 adds test voltage to the two ends of possible non-linear resistance, and tries to achieve the electric conductivity value under each group of test voltage.If this group electric conductivity value has indicial response, such as test conductance along with test voltage rising exponentially type increase, then judge that this non-linear resistance has class PN junction characteristic, and to mark this non-linear resistance be tool class PN junction characteristic.This VCCS detection module 52 adds test voltage to the two ends of possible Voltage-controlled Current Source, and tries to achieve the current value under each group of test voltage.If this group current value has indicial response, such as measuring current along with test voltage rising exponentially type increase, then judge that this VCCS has class PN junction characteristic, and to mark this Voltage-controlled Current Source be tool class PN junction characteristic.
Step of the present invention is divided into two benches, and the first stage is the element detecting tool class PN junction characteristic, and subordinate phase is the element of adjustment class PN junction characteristic.
In the first stage, first utilize and test voltage is added to non-linear resistance two ends, try to achieve the electric conductivity value under each group of test voltage, then according to certain pattern recognition rule, judge whether this group test electric conductivity value has the characteristic of index curve.If have the characteristic of index curve, then judge that this non-linear resistance is as class PN junction characteristic resistance, is marked.Secondly, the present invention utilizes and adds test voltage to VCCS two ends, tries to achieve the current value under each group of test voltage.According to certain pattern recognition rule, judge whether this group measuring current value has the characteristic of index curve.If have the characteristic of index curve, then judge that this VCCS is as class PN junction VCCS, is marked.
In the adjustment process of subordinate phase, when NR iterative quiescent point, carrying out the pressure limiting of class PN junction to being labeled as the element with class PN characteristic, adding the measure of shunt conductance (gmin).Calculate the Jacobian matrix after pressure limiting afterwards, carry out NR iteration, until try to achieve the quiescent point of circuit.
Because the present invention will be unfavorable for that the element testing of tool class PN junction characteristic that HSPICE restrains goes out in advance, and adjusted in advance, therefore can be got rid of the obstacle of HSPICE convergence in advance, accelerated speed and the probability of HSPICE convergence.
Technology contents of the present invention and technical characterstic disclose as above, but those of ordinary skill in the art still may do all replacement and the modification that do not deviate from spirit of the present invention based on teaching of the present invention and announcement.Therefore, protection scope of the present invention should be not limited to the content that embodiment discloses, and should comprise various do not deviate from replacement of the present invention and modification, and is contained by present patent application claim.
Claims (16)
1. solve a method for the quiescent point of tool class PN junction characteristic, it is characterized in that comprising following steps:
Detect the element that the voltage-current characteristic in a non-linear circuit exponentially changes, and be labeled as tool class PN junction characteristic;
The element being labeled as class PN junction characteristic is adjusted; And
The quiescent point of this non-linear circuit after utilizing Solving Nonlinear Equation to adjust,
Wherein the element of this tool class PN junction characteristic comprises non-linear resistance and Voltage-controlled Current Source.
2. method according to claim 1, wherein this detection and markers step also comprise following steps:
Test voltage is added to the two ends of non-linear resistance, and tries to achieve the electric conductivity value under each group of test voltage; And
If this group electric conductivity value has indicial response, then marking this non-linear resistance is tool class PN junction characteristic.
3. method according to claim 1, wherein this detection and markers step also comprise following steps:
Test voltage is added to the two ends of Voltage-controlled Current Source, and tries to achieve the current value under each group of test voltage; And
If this group current value has indicial response, then marking this Voltage-controlled Current Source is tool class PN junction characteristic.
4. method according to claim 1, is characterized in that wherein this adjustment comprises PN junction pressure limiting or adds shunt conductance.
5. method according to claim 4, is characterized in that wherein this shunt conductance is the input and the output that are arranged at this PN junction.
6. method according to claim 1, is characterized in that wherein this non-linear resistance and Voltage-controlled Current Source are the elements as such PN junction characteristic of simulation.
7. method according to claim 1, is characterized in that it is used in the breadboardin environment of HSPICE.
8. method according to claim 1, is characterized in that wherein this nonlinear equation uses newton-Newton Raphson method.
9. solve a device for the quiescent point of tool class PN junction characteristic, it is characterized in that comprising:
One detecting unit, is configured to the element that the voltage-current characteristic in detection non-linear circuit exponentially changes, and is labeled as tool class PN junction characteristic;
One adjustment unit, is configured to the element being labeled as class PN junction characteristic to adjust; And
One computing unit, is configured to the quiescent point of this non-linear circuit after utilizing Solving Nonlinear Equation to adjust,
Wherein the element of this tool class PN junction characteristic comprises non-linear resistance and Voltage-controlled Current Source.
10. device according to claim 9, it is characterized in that wherein this detecting unit is configured to add test voltage to the two ends of non-linear resistance further, and the electric conductivity value of trying to achieve under each group of test voltage, if and this group electric conductivity value has indicial response, then marking this non-linear resistance is tool class PN junction characteristic.
11. devices according to claim 9, it is characterized in that wherein this detecting unit is configured to add test voltage to the two ends of Voltage-controlled Current Source further, and the current value of trying to achieve under each group of test voltage, if and this group current value has indicial response, then marking this Voltage-controlled Current Source is tool class PN junction characteristic.
12. devices according to claim 9, is characterized in that wherein this adjustment unit is by PN junction pressure limiting or interpolation shunt conductance.
13. devices according to claim 12, is characterized in that wherein this shunt conductance is the input and the output that are arranged at this PN junction.
14. devices according to claim 9, is characterized in that wherein this non-linear resistance and Voltage-controlled Current Source are the elements being used as such PN junction characteristic of simulation.
15. devices according to claim 9, is characterized in that it is used in the breadboardin environment of HSPICE.
16. devices according to claim 9, is characterized in that wherein this nonlinear equation uses newton-Newton Raphson method.
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Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2938404Y (en) * | 2006-03-16 | 2007-08-22 | 中芯国际集成电路制造(上海)有限公司 | Test device for measuring PN junction current |
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Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2938404Y (en) * | 2006-03-16 | 2007-08-22 | 中芯国际集成电路制造(上海)有限公司 | Test device for measuring PN junction current |
Non-Patent Citations (2)
| Title |
|---|
| 利用I-V正向特性提取PN二极管主要参数的研究;丁扣宝 等;《电子器件》;20020331;第25卷(第1期);第2节 * |
| 电路仿真过程中SPICE收敛性问题的分析;励晔;《中国电工技术学会电力电子学会第九届学术年会论文集》;20040901;摘要，第2节 * |
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