CN102053175B - Probe used for display electrical variable device - Google Patents
Probe used for display electrical variable device Download PDFInfo
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- CN102053175B CN102053175B CN200910237373.XA CN200910237373A CN102053175B CN 102053175 B CN102053175 B CN 102053175B CN 200910237373 A CN200910237373 A CN 200910237373A CN 102053175 B CN102053175 B CN 102053175B
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Abstract
The invention discloses a probe 2 used for a display electrical variable device, which comprises a first probe 200, a second probe 201, a first probe arm 202, a second probe arm 203, a regulating wheel 204 and a difference unit 205, wherein the front end and the tail end of the first probe arm 202 are respectively connected with the first probe 200 and the difference unit 205; the front end and the tail end of the second probe arm 203 are respectively connected with the second probe 201 and the difference unit 205; the regulating wheel 204 is arranged between the first probe arm 202 and the second probe arm 203; and a spring 206 is arranged between the first probe arm 202 and the second probe arm 203. Because of the supporting function of the spring 206, the thread pitch is effectively eliminated, and the probe is more stable for the operation. The invention has the characteristics of simple structure, flexible control, convenience of one-hand operation of a tester, and the like.
Description
Technical field
The present invention relates to a kind of probe, particularly a kind of for showing the probe of electric variable device.
Background technology
Probe is a kind of device that is used to measurement mechanism (as oscillograph, spectrum analyzer or the logic analyser etc.) collection signal that shows electric variable, and it is input to the signal collecting from circuit board instrument, instrument.
In order to obtain better input signal, high frequency probe often adopts active differential form.And how to regulate two sharp spacing of probe of difference detector to become a difficult problem, at present, most difference detector needs both hands to regulate two spacing that probe is sharp, do so not only very difficult space distance control size, and probe point is also unstable in the time of operation, spacing easily changes, thereby affects measurement effect.
In order to address the above problem, prior art US Patent No. 6276956 has proposed a kind of probe apparatus, and its structure is similar to adjustable compasses.
With reference to Fig. 1, this probe apparatus 1 mainly comprises visits point 100, visits point 101, probe arm 102, and probe arm 103, controls nut 104, controls nut 105, regulating wheel 106, double-screw bolt 107, double-screw bolt 108, wire 109, wire 110, constraint 111, cable 112.
Visit point 101 and visit point 102 front end that is separately fixed at probe arm 102 and probe arm 103, controlling nut 104 and controlling nut 105 is two abnormity nuts that thread rotary orientation is contrary.Double-screw bolt 107 and double-screw bolt 108 are stretched out in the both sides of regulating wheel 106, and their thread rotary orientation is contrary.Control nut 104 and control nut 105 and be contained in respectively on double-screw bolt 107 and double-screw bolt 108.Control nut 104 and control nut 105 hinged with probe arm 102 and probe arm 103 again.Wire 109 and wire 110 are two wires that separated by cable 112, and are fixed on respectively on probe arm 102 and probe arm 103.Together with the rear end restrained 111 of probe arm 102 and probe arm 103 constrains in.
In the time stirring regulating wheel 106, double-screw bolt 107 and double-screw bolt 108 can promote control nut 104 and control nut 105, make their axially-movables along double-screw bolt on double-screw bolt.Meanwhile, control nut 104 and control nut 105 meeting promotion probe arm 102 and probe arms 103, they are moved along with controlling the motion of nut 104 and control nut 105.Utilize leverage, visit point 100 and visit point 101 also along with motion, regulate thereby realize the object of visiting point 100 and visiting sharp 101 spacing.
Probe apparatus 1 of the prior art, regulates and visits the object of sharp spacing although can reach by one hand, and owing to controlling nut and probe arm hinged time, federation exists flight pitch.And tester is in operation probe, tend to firmly press down probe, at this moment will be because of the existence of flight pitch, make to visit sharp spacing and change, thereby produce probe point and touch the problems such as other devices or loose contact, impact is tested effect or circuit-under-test is caused to damage.
Summary of the invention
The object of the invention is to overcome the problem that has flight pitch in prior art, provide a kind of for showing the probe of electric variable device.
For achieving the above object, the present invention adopts following technical proposals:
For showing a probe for electric variable device, comprise one first probe, one second probe, one first probe arm, one second probe arm, an adjustment structure and a shell-like structure,
The front end of the first described probe arm is provided with the first described probe, tail end is arranged on described shell-like structure, the front end of the second described probe arm is provided with the second described probe, tail end is arranged on described shell-like structure, between the first probe arm described in described adjustment structure is arranged on and the second described probe arm, for regulating the distance between the first described probe and described the second probe, between the first described probe arm and the second described probe arm, an elastic construction is installed.
In probe apparatus of the present invention, described elastic construction can be a spring.
In probe apparatus of the present invention, described elastic construction can have a fixed sturcture, for playing position-limiting action.
In probe apparatus of the present invention, described spring can have a bending structure, for playing position-limiting action.
In probe apparatus of the present invention, between adjustment structure described in one end of described elastic construction can be fixedly mounted on and the first described probe, between the adjustment structure described in the described elastic construction other end can be fixedly mounted on and the second described probe.
In probe apparatus of the present invention, the tail end of the first described probe arm can have one first bulge-structure, the tail end of the second described probe arm can have one second bulge-structure, on described shell-like structure, can have two spacing holes, the first described bulge-structure and the second described bulge-structure can be arranged on respectively in two described spacing holes.
Probe apparatus of the present invention, not only has the features such as simple in structure, handled easily, and due to the supporting role of elastic construction between probe arm, has effectively eliminated the problem that has flight pitch in prior art, makes test job more reliable and more stable.
Brief description of the drawings
Fig. 1 is the structural representation of probe apparatus 1 in prior art.
Fig. 2 is the explosion type structural representation of probe apparatus 2 in the present invention.
Fig. 3 a, Fig. 3 b, Fig. 3 c is the structural representation of the first probe arm 202.
Fig. 4 a, Fig. 4 b, Fig. 4 c is the structural representation of the second probe arm 203.
Fig. 5 is the structural representation of regulating wheel 204.
Fig. 6 is the structural representation of difference unit 205.
Fig. 7 is the structural representation of upper casing 211.
Fig. 8 is the structural representation of lower casing 212.
Fig. 9 is the structural representation of spring 206.
Figure 10 is that probe front end 1000 completes the structural representation after assembling.
Figure 11 is that probe apparatus 2 completes the structural representation after assembling.
Embodiment
Below in conjunction with brief description of the drawings preferred forms of the present invention.
With reference to Fig. 2, probe apparatus 2 described in the present embodiment, comprises the first probe 200, the second probe 201, the first probe arm 202, the second probe arm 203, regulating wheel 204, difference unit 205, spring 206, the first control nut 207, the second control nut 208, the first double-screw bolt 209, the second double-screw bolt 210, upper casing 211 and lower casing 212.
In the present embodiment, the first probe 200 and the second probe 201 are made by copper product.
As other giving an example, the first probe 200 and the second probe 201 also can adopt the good metal material of other electric conductivity to make.
With reference to Fig. 3 a, Fig. 3 b, Fig. 3 c, the first probe arm 202 comprises groove 2021, via hole 2022, public mouthful 2023 of SMP and via hole 2024.
With reference to Fig. 4 a, Fig. 4 b, Fig. 4 c, the second probe arm 203 comprises groove 2031, via hole 2032, public mouthful 2033 of SMP and via hole 2034.
In the present embodiment, the first probe arm 202 and the second probe arm 203 are made by metal material.
As other giving an example, the first probe arm 202 and the second probe arm 203 also can adopt the plastics with certain degree of hardness to make.
With reference to Fig. 5, regulating wheel 204 both sides are stretched out the first double-screw bolt 209 and the second double-screw bolt 210, the first double-screw bolt 209 outsides and are connected with cylinder 2091, the second double-screw bolt 210 outsides and are connected with cylinder 2101.
In the present embodiment, regulating wheel 204 is made up of plastic material.
With reference to Fig. 6, difference unit 205 comprises difference unit upper casing 2051, difference unit radome 2052, calculus of differences circuit 2053, difference shielding box 2054, female mouthful 2055 of SMP, female mouthful 2056 of SMP, difference unit lower casing 2057 and cable 2058.
In the present embodiment, difference unit upper casing 2051, difference unit lower casing 2057, difference unit radome 2052, difference shielding box 2054 and difference unit lower casing 2057 are made by plastic material, and female mouthful 2055 of SMP and SMP are made up of conductive metallic material for female mouthful 2056.
In conjunction with reference to Fig. 2 and Fig. 6, in the present embodiment, probe is electrically connected with measurement mechanism by wire, pass through the front end conduit of the first probe arm 202 from the extended wire of the first probe 200, be connected for public mouthful 2023 with SMP by the groove 2021 of the first probe arm 202 again, pass through the front end conduit of the second probe arm 203 from the extended wire of the second probe 201, be connected for public mouthful 2033 with SMP by the groove 2031 of the second probe arm 203 again, male mouthful 2023 of SMP and SMP are fastened and connected for female mouthful 2055, male mouthful 2033 of SMP and SMP are fastened and connected for female mouthful 2056, realize the connection of probe front end 1000 and difference unit 205, SMP is connected with calculus of differences circuit 2053 for female mouthful 2056 with SMP for female mouthful 2055, calculus of differences circuit 2053 is connected with cable 2058, finally realize being connected of probe and instrument.
In the present embodiment, difference unit 205 mainly comprises calculus of differences circuit 2053, and then this circuit 2053 delivers to measurement mechanism by cable 2058 for two paths of differential signals is carried out to calculus of differences,
As other for example, calculus of differences circuit 2053 can be also other circuit form to meet different application needs, or do not comprise any circuit, only play the effect of signal to measurement mechanism that connect.
With reference to Fig. 7, upper casing 211 comprises groove 2110, groove 2111, groove 2112, groove 2113, groove 2114, groove 2115 and groove 2116.
With reference to Fig. 8, lower casing 212 comprises snap fit 2120, snap fit 2124 and snap fit 2128, post 2122 and post 2126, groove 2121, groove 2125, groove 2127 and groove 2129, and gap 2123.
In the present embodiment, upper casing 211 and lower casing 212 are made by plastic material.
With reference to Fig. 9, spring 206 has a bending 2061 in middle part.
In the present embodiment, the effect of bending 2061 is that spring 206 is fixed in the middle of the first probe arm 202 and the second probe arm 203, makes it can not produce the movement of position.
In the present embodiment, spring 206 is made up of metal material,
As other giving an example, the material that spring 206 also can reach elastic strength requirement by other is made.
The installation process of probe apparatus 2 is as follows:
1) the first probe 200 is arranged on to the front end of the first probe arm 202, the second probe 201 is arranged on the front end of the second probe arm 203.
2) via hole 2022 the first double-screw bolt 209 of regulating wheel 204 1 sides being passed on the first probe arm 202, the via hole 2032 that the second double-screw bolt 210 of opposite side is passed on the second probe arm 203, the thread rotary orientation of the first double-screw bolt 209 and the second double-screw bolt 210 is contrary, equally, the thread rotary orientation that the first control nut 207 and second is controlled nut 208 is also contrary, the first control nut 207 and second is controlled to nut 208 and be screwed in accordingly on the first double-screw bolt 209 and the second double-screw bolt 210, and embed respectively the groove 2021 of the first probe arm 202 and the groove 2031 of the second probe arm 203.
3) via hole 2034 on the via hole 2024 on the first probe arm 202 and the second probe arm 203 is enclosed within respectively on the post 2122 and post 2126 on lower casing 212.
4) cylinder 2091 of regulating wheel 204 both sides and cylinder 2101 are snapped in respectively to groove 2121 and the groove 2125 of lower casing 204.
5) SMP of public SMP of the first probe arm 202 mouth 2023 and the second probe arm 203 is stuck in the groove 2127 and groove 2129 of lower casing 204 for public mouthful 2033.
6) bending of spring 206 2061 is stuck in the gap 2123 of lower casing 204, and the first probe arm 202 and the second probe arm 203 are withstood respectively in the two ends of spring 206.
7) snap fit of lower casing 204 2120, snap fit 2124 and snap fit 2128 and groove 2110, groove 2112 and the groove 2115 of upper casing 211 are fastened.
8) groove of upper casing 211 2111 and groove 2113 are pushed down to cylinder 2091 and the cylinder 2101 of regulating wheel 204 both sides.
9) groove of upper casing 211 2114 and groove 2116 are pushed down respectively to public mouthful 2023 of the SMP of the first probe arm 202 and the public mouth 2033 of SMP of the second probe arm 23.
With reference to Figure 10, it is the structural representation of probe front end 1000 installations.
10) process of installation difference unit 205 is, first calculus of differences circuit 2053 is contained in difference shielding box 2054, the leg of female mouthful 2055 of SMP and the female mouth 2056 of SMP is welded on the pad of calculus of differences circuit 2053, then difference shielding box 2054 is packed in difference unit lower casing 2057, difference unit radome 2052 and difference unit upper casing 2051 are finally installed successively, are completed the assembling of difference unit 205.
11) male the SMP of male SMP of the first probe arm 202 mouth 2023 and the second probe arm 203 mouth 2033 and female mouthful 2055 of SMP and the SMP mother mouth 2056 of difference unit 205 are connected, complete the connection of probe front end 1000 and difference unit 205.
With reference to Figure 11, it is the structural representation of probe apparatus 2 installations.
In the time stirring regulating wheel 204, the first double-screw bolt 209 of regulating wheel 204 both sides and the second double-screw bolt 210 can drive first to control that nuts 207 and second are inwardly controlled nut 208 or outwards motion.In the time that the first control nut 207 and second is controlled nut 208 inside motion, can drive the first probe arm 202 and the second probe arm 203 within axially, to do fan shape moving taking post 2122 and post 2126, make the first probe 200 and the second probe 201 mutually close.Control nut 208 outwards when motion when the first control nut 207 and second, spring 206 can promote the first probe arms 202 and the second probe arm 203 outwards moves, make the first probe 200 and the second probe 201 mutually away from.
, because there has been the supporting role of spring 206, effectively eliminate owing to controlling nut and the hinged flight pitch producing of probe arm meanwhile, thereby avoided the unstable of the spy point that therefore causes, made to utilize and pop one's head in that to carry out test operation more reliable.
As an example, spring 206 can change metal clips or rubber blanket etc. into and have the structure of resiliency supported effect.
As an example, spring 206 can be placed in any position between the first probe arm 202 and the second probe arm 203, for example, can be placed on the position between regulating wheel 204 and difference unit 205.
Above embodiment is to illustrate the invention and not to limit the present invention.
Claims (4)
1. for showing a probe for electric variable device,
Comprise one first probe, one second probe, one first probe arm, one second probe arm, an adjustment structure and a shell-like structure,
The front end of the first described probe arm is provided with the first described probe, tail end is arranged on described shell-like structure, the front end of the second described probe arm is provided with the second described probe, tail end is arranged on described shell-like structure, between the first probe arm described in described adjustment structure is arranged on and the second described probe arm, for regulating the distance between the first described probe and described the second probe
It is characterized in that,
Between the first described probe arm and the second described probe arm, an elastic construction is installed,
Between adjustment structure described in one end of described elastic construction is fixedly mounted on and the first described probe, between the adjustment structure described in the described elastic construction other end is fixedly mounted on and the second described probe,
Described elastic construction has a fixed sturcture, for playing position-limiting action,
On described shell-like structure, have a gap, described fixed sturcture is stuck in described gap.
2. probe according to claim 1, is characterized in that, described elastic construction is a spring.
3. probe according to claim 2, is characterized in that, described spring has a bending structure, for playing position-limiting action.
4. probe according to claim 1 and 2, it is characterized in that, the tail end of the first described probe arm has one first bulge-structure, the tail end of the second described probe arm has one second bulge-structure, on described shell-like structure, have two spacing holes, the first described bulge-structure and the second described bulge-structure are arranged on respectively in two described spacing holes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200910237373.XA CN102053175B (en) | 2009-11-10 | 2009-11-10 | Probe used for display electrical variable device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200910237373.XA CN102053175B (en) | 2009-11-10 | 2009-11-10 | Probe used for display electrical variable device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102053175A CN102053175A (en) | 2011-05-11 |
| CN102053175B true CN102053175B (en) | 2014-12-10 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200910237373.XA Active CN102053175B (en) | 2009-11-10 | 2009-11-10 | Probe used for display electrical variable device |
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| CN (1) | CN102053175B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103163338B (en) * | 2011-12-14 | 2016-04-06 | 北京普源精电科技有限公司 | A kind of probe with radome |
| CN104502642B (en) * | 2014-11-25 | 2017-10-10 | 研华科技(中国)有限公司 | A kind of differential probe of replaceable test wire rod |
| CN107589301B (en) * | 2017-09-30 | 2024-03-12 | 南京协辰电子科技有限公司 | Impedance test probe and PCB impedance test machine |
| CN114371350A (en) * | 2020-10-15 | 2022-04-19 | 普源精电科技股份有限公司 | Differential probe and control method thereof |
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|---|---|---|---|---|
| US3917376A (en) * | 1974-10-23 | 1975-11-04 | Honeywell Inc | Vacuum actuated test clip |
| US4923407A (en) * | 1989-10-02 | 1990-05-08 | Tektronix, Inc. | Adjustable low inductance probe |
| US5234359A (en) * | 1991-08-28 | 1993-08-10 | Hewlett-Packard Company | Terminal device for electrical connection |
| US5928022A (en) * | 1997-10-28 | 1999-07-27 | Reliance Electric Industrial Company | Mechanically-assited clip device for use in testing electrical equipment |
| US6276956B1 (en) * | 1999-04-12 | 2001-08-21 | Sencore, Inc. | Dual point test probe for surface mount type circuit board connections |
| CN2591627Y (en) * | 2002-12-06 | 2003-12-10 | 王宁 | Clamp type probe of multimeter |
| US6704670B2 (en) * | 2002-04-16 | 2004-03-09 | Agilent Technologies, Inc. | Systems and methods for wideband active probing of devices and circuits in operation |
| CN1869713A (en) * | 2005-05-27 | 2006-11-29 | 特克特朗尼克公司 | Differential measurement probe having retractable double cushioned variable spacing probing tips with EOS/ESD protection capabilities |
| CN2872378Y (en) * | 2005-11-18 | 2007-02-21 | 淄博科汇电气有限公司 | Authentication probe for cable fault tester |
| CN1936597A (en) * | 2005-09-21 | 2007-03-28 | 安捷伦科技有限公司 | High bandwidth probe |
| US7592822B2 (en) * | 2007-12-17 | 2009-09-22 | Tektronix, Inc. | Probing adapter for a signal acquisition probe having pivoting, compliant, variable spacing probing tips |
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2009
- 2009-11-10 CN CN200910237373.XA patent/CN102053175B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3917376A (en) * | 1974-10-23 | 1975-11-04 | Honeywell Inc | Vacuum actuated test clip |
| US4923407A (en) * | 1989-10-02 | 1990-05-08 | Tektronix, Inc. | Adjustable low inductance probe |
| US5234359A (en) * | 1991-08-28 | 1993-08-10 | Hewlett-Packard Company | Terminal device for electrical connection |
| US5928022A (en) * | 1997-10-28 | 1999-07-27 | Reliance Electric Industrial Company | Mechanically-assited clip device for use in testing electrical equipment |
| US6276956B1 (en) * | 1999-04-12 | 2001-08-21 | Sencore, Inc. | Dual point test probe for surface mount type circuit board connections |
| US6704670B2 (en) * | 2002-04-16 | 2004-03-09 | Agilent Technologies, Inc. | Systems and methods for wideband active probing of devices and circuits in operation |
| CN2591627Y (en) * | 2002-12-06 | 2003-12-10 | 王宁 | Clamp type probe of multimeter |
| CN1869713A (en) * | 2005-05-27 | 2006-11-29 | 特克特朗尼克公司 | Differential measurement probe having retractable double cushioned variable spacing probing tips with EOS/ESD protection capabilities |
| CN1936597A (en) * | 2005-09-21 | 2007-03-28 | 安捷伦科技有限公司 | High bandwidth probe |
| CN2872378Y (en) * | 2005-11-18 | 2007-02-21 | 淄博科汇电气有限公司 | Authentication probe for cable fault tester |
| US7592822B2 (en) * | 2007-12-17 | 2009-09-22 | Tektronix, Inc. | Probing adapter for a signal acquisition probe having pivoting, compliant, variable spacing probing tips |
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