CN102043694A - Method for managing test problems - Google Patents

Method for managing test problems Download PDF

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Publication number
CN102043694A
CN102043694A CN2009103086412A CN200910308641A CN102043694A CN 102043694 A CN102043694 A CN 102043694A CN 2009103086412 A CN2009103086412 A CN 2009103086412A CN 200910308641 A CN200910308641 A CN 200910308641A CN 102043694 A CN102043694 A CN 102043694A
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CN
China
Prior art keywords
test
test problem
solution
current appearance
testing apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2009103086412A
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Chinese (zh)
Inventor
黄永兆
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
Original Assignee
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hongfujin Precision Industry Shenzhen Co Ltd, Hon Hai Precision Industry Co Ltd filed Critical Hongfujin Precision Industry Shenzhen Co Ltd
Priority to CN2009103086412A priority Critical patent/CN102043694A/en
Publication of CN102043694A publication Critical patent/CN102043694A/en
Pending legal-status Critical Current

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Abstract

The invention provides a method for managing test problems, comprising the following steps of: acquiring test equipment; testing the test equipment; when the test equipment generates test problems in a testing process, storing the currently generated test problems in a problem list, wherein all the test problems generated by each of tested test equipment and corresponding solutions thereof are stored in the problem list; when test problems same as or similar to the currently generated test problems exist in the problem list, acquiring the solutions of the same or similar test problems from the problem list; and processing the currently generated test problems by using the acquired solutions. The method can be used for effectively managing various test problems generated in the testing process of the equipment.

Description

The test problem management method
Technical field
The present invention relates to the testing of equipment field, relate in particular to a kind of method that the test problem that produces in the testing of equipment process is managed.
Background technology
Along with being showing improvement or progress day by day and develop of science and technology, people are more and more stricter to the functional requirement of computer system, and therefore, the hardware device of the required outfit of computer system that a cover is complete is more and more abundanter.For example, in order to satisfy needs such as Video chat, handwriting input, the complete computer system of one cover not only needs to comprise basic configuration such as cabinet, power supply, mainboard, central processing unit, memory bar and various memory devices, may also will be equipped with camera and handwriting pad etc.
For a cover computer system, its configuration, i.e. its included various hardware devices, whether compatibility is a vital factor that influences this computer system performance.Current, a lot of users dislike the configuration that manufacturer provides usually, but freely select each hardware device as required when purchasing computer system, and then are combined into the complete computer system of a cover.For the configuration that makes user's arbitrary combination can normally move, manufacturer need test all possible configuration of computer system.Therefore, need the hardware device (abbreviation testing apparatus) of test more and more.Thereupon, the test problem that produces in test process is also just more and more.How to manage these test problems effectively and become each manufacturer's problem demanding prompt solution.
Summary of the invention
In view of above content, be necessary to propose a kind of test problem management method, it can manage the various test problems that produce effectively in the testing of equipment process.
A kind of test problem management method.This method comprises: obtain a testing apparatus; This testing apparatus is tested; When this testing apparatus test problem occurs in test process, the test problem of current appearance is stored in the problem list, store each all test problem that testing apparatus occurred tested and corresponding solution thereof in the described problem list; When having the test problem identical or similar in the problems referred to above tabulation, from this problem list, obtain this solution identical or similar test problem with the test problem of current appearance; And utilize the solution of being obtained to handle the test problem of current appearance.
Compared to prior art, test problem management method provided by the present invention is stored in all test problems and the corresponding solution thereof that each testing apparatus produces in the problem list in test process, realized sharing of test problem.During the test problem that in test process, occurred once occurring, the Test Engineer can find corresponding solution in time from above-mentioned test tabulation, the tracking that has made things convenient for test problem with duplicate, therefore, all test problems that occur in the management testing process effectively, and improved efficient.
Description of drawings
Fig. 1 is the applied environment figure of test problem management method of the present invention preferred embodiment.
Fig. 2 is the management flow chart of test problem management method of the present invention preferred embodiment.
Embodiment
Consulting shown in Figure 1ly, is the applied environment figure of test problem management method of the present invention preferred embodiment.Test problem management method of the present invention is applied in and comprises testing of equipment client 1, test and management server 2, and in the system that formed of issue management server 3.Described test and management server 2 is equipped with device test system, is used for testing apparatus, as central processing unit, mainboard, storer etc., tests.Described testing of equipment client 1 links to each other with test and management server 2, offers the user interface that the testing of equipment personnel login device test system in the test and management server 2.Described testing of equipment personnel sign in in the said equipment test macro by testing of equipment client 1, to carry out the test to testing apparatus.Described issue management server 3 links to each other with testing of equipment client 1 and test and management server 2.This issue management server 3 comprises a problem list, is used to store each all test problem that testing apparatus occurred tested and corresponding solution thereof.Test and management server 2 when if the identical or similar test problem of the test problem stored in the problem list with issue management server 3 having occurred, can be sought the solution of correspondence from this issue management server 3 when testing apparatus is tested.
Consulting shown in Figure 2ly, is the management flow chart of test problem management method of the present invention preferred embodiment.
Step S10, testing of equipment personnel obtain the testing apparatus of a needs test.Described testing apparatus can comprise display, storer, central processing unit, hard disk, camera, handwriting pad etc.
Step S11, testing of equipment personnel sign in in the device test system of test and management server 2 by testing of equipment client 1, and under this device test system a newly-built test assignment.
Step S12, device test system one of them test event to above-mentioned testing apparatus under this newly-built test assignment is tested.For example, if testing apparatus is a storer, then described test event refers to read data test or write data test etc.
Step S13, device test system judge whether above-mentioned testing apparatus test problem occurred in the test process of this test event.If test problem occurred, then flow process enters step S14.Otherwise if test problem do not occur in the test process of this test event, then flow process enters step S22.
In step S14, device test system stores the test problem of current appearance in the problem list of issue management server 3 into.As mentioned above, store each all test problem that testing apparatus occurred tested and corresponding solution thereof in this test tabulation.
Step S15, issue management server 3 judge whether there be the test problem identical or similar with the test problem of current appearance in its problem list.If do not exist, then flow process enters step S17.Otherwise if there be the test problem identical or similar with the test problem of current appearance in the problem list, then flow process enters step S16.
In step S16, issue management server 3 should feed back to device test system by identical or similar test problem, so that device test system obtains this solution identical or similar test problem from the problem list of issue management server 3.
In step S17, there is not identical or similar test problem in issue management server 3 its problem lists of announcement apparatus test macro, so that sending to the research staff with the test problem of current appearance, device test system solves.
Step S18, device test system obtain the solution that the research staff sends.
Step S19, the solution that the device test system utilization is obtained is handled the test problem of current appearance.The described solution of obtaining can be the solution of or similar test problem identical with test problem current appearance that obtain from issue management server 3, also can be the solution that the research staff sends.
Step S20, device test system judge whether the solution of being obtained has overcome the test problem of current appearance.If do not solve, then flow process is returned step S17.Otherwise if solved the test problem of current appearance, then flow process enters step S21.
In step S21, device test system writes down the solution of the test problem that solves this current appearance in the problem list of issue management server 3, so that test problem that will this current appearance and solution thereof and other testing of equipment personnel are shared.
All test events that step S22, device test system judge this testing apparatus whether all test finish.If any one test event is test not, then flow process is returned step S12.Otherwise, if all test events the time all test finish process ends then.
Test problem management method provided by the present invention is stored in various test problems and the corresponding solution thereof that each testing apparatus produces in the problem list of issue management server 3 in test process, realized sharing of test problem.During the test problem that in test process, occurred once occurring, the Test Engineer can find corresponding solution in time from the problem list of issue management server 3, the tracking that has made things convenient for test problem with duplicate, therefore, all test problems that occur in the management testing process effectively, and improved efficient.

Claims (4)

1. a test problem management method is characterized in that, this method comprises:
Obtain a testing apparatus;
This testing apparatus is tested;
When this testing apparatus test problem occurs in test process when, the test problem of current appearance is stored in the problem list, store each all test problem that testing apparatus occurred tested and corresponding solution thereof in the described problem list;
When having the test problem identical or similar in the problems referred to above tabulation, from this problem list, obtain this solution identical or similar test problem with the test problem of current appearance; And
Utilize the solution of being obtained to handle the test problem of current appearance.
2. the method for test problem management as claimed in claim 1 is characterized in that described problem list is stored in the issue management server.
3. the method for test problem management as claimed in claim 1 is characterized in that this method also comprises:
When not having the test problem identical or similar in the described problem list, the test problem of current appearance is sent to the research staff with the test problem of current appearance;
Obtain the solution that the research staff sends; And
Utilize the solution of being obtained to handle the test problem of current appearance.
4. the method for test problem management as claimed in claim 3 is characterized in that this method also comprises:
Record solves the solution of the test problem of this current appearance in the problems referred to above tabulation.
CN2009103086412A 2009-10-22 2009-10-22 Method for managing test problems Pending CN102043694A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2009103086412A CN102043694A (en) 2009-10-22 2009-10-22 Method for managing test problems

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2009103086412A CN102043694A (en) 2009-10-22 2009-10-22 Method for managing test problems

Publications (1)

Publication Number Publication Date
CN102043694A true CN102043694A (en) 2011-05-04

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CN2009103086412A Pending CN102043694A (en) 2009-10-22 2009-10-22 Method for managing test problems

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CN (1) CN102043694A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109460328A (en) * 2018-10-11 2019-03-12 联宝(合肥)电子科技有限公司 A kind of management system of test equipment, method and electronic equipment

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101060436A (en) * 2007-06-05 2007-10-24 杭州华三通信技术有限公司 A fault analyzing method and device for communication equipment
CN101093239A (en) * 2007-04-05 2007-12-26 泰豪科技股份有限公司 Online detection and remote diagnosis system for automated power station

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101093239A (en) * 2007-04-05 2007-12-26 泰豪科技股份有限公司 Online detection and remote diagnosis system for automated power station
CN101060436A (en) * 2007-06-05 2007-10-24 杭州华三通信技术有限公司 A fault analyzing method and device for communication equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109460328A (en) * 2018-10-11 2019-03-12 联宝(合肥)电子科技有限公司 A kind of management system of test equipment, method and electronic equipment

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Application publication date: 20110504