CN102004311A - Tera-hertz wave scanning method and system - Google Patents

Abstract

The invention relates to tera-hertz wave scanning method and system. The system comprises a scanning reflection device, refraction devices I and II, a static reflection device and a detecting device, wherein reflection surfaces or refraction surfaces of the devices are vertical to a common plane, the scanning reflection device swings around a swing shaft which is arranged in the reflection surface and is vertical to the common plane and reflects tera-hertz waves to the refraction surface of the refraction device I, and the refraction devices I and II rotate around a rotating shaft which is the coincident median line of the refraction devices I and II from the same initial position at the same angular velocity in opposite directions, wherein the relation among wedge angles thet 1 and thet 2, refractive indexes n1 and n2, tera-hertz wave optical path lengths L1and L2 from an object point to the refraction devices I and II is described in the specification of the invention. The refraction devices I and II refract the tera-hertz waves onto the reflection surface of the static reflection device, and the static reflection device converges the tera-hertz waves on the detecting device arranged at the image point of the static reflection device. Based on the technical scheme, the invention can rapidly scan a target to be detected.

Description

A kind of THz wave scan method and system

Technical field

The present invention relates to the THz wave application, particularly relate to a kind of THz wave scan method and system.

Background technology

THz wave is called the T ray again, is a kind of special electromagnetic wave, and its frequency range is between 0.1-10THz, and wavelength is in the 30-3000 micrometer range.The Terahertz wave frequency is very high, thereby has very high spatial resolution, can be used for target to be detected is carried out imaging.And the photon energy of THz wave is very low, only be 1,000,000 of x-ray photon energy/, thereby THz wave is very little to the radiation damage of biosome, this is to utilize THz wave to carry out the remarkable advantage of imaging.

The existing technology of utilizing THz wave to carry out scanning imagery, it is the THz wave of utilizing object point self radiation on the THz wave detection target to be detected, perhaps survey the THz wave that object point reflected on the target to be detected, thereby obtain the THz wave intensity data of corresponding object point institute's radiation or reflection, like this, prior art is in order to obtain the THz wave intensity data of all object point radiation on the target to be detected or reflection, need utilize driven by motor THz wave sniffer line by line or by the row motion.

This shows, the existing technology of utilizing THz wave to carry out scanning imagery, realize scanning line by line or by the row athleticism owing to need utilize driven by motor THz wave sniffer to all object points on the target to be detected, and the translational speed of motor is slow, thereby finishes scanning and need expend long time.

Summary of the invention

Technical matters to be solved by this invention provides a kind of THz wave scan method and system, can scan target to be detected fast.

The technical scheme that the present invention solves the problems of the technologies described above is as follows: a kind of THz wave scanning system, this system comprises scanning reflection device, a refracting means, No. two refracting means, quiet reflection unit and sniffers, wherein, the plane of refraction of the reflecting surface of described scanning reflection device and quiet reflection unit and a described refracting means and No. two refracting means is all vertical with common plane;

Described scanning reflection device, around the axis of swing swing of self, the THz wave that is used for inciding self reflecting surface reflexes to the plane of refraction of a described refracting means; Wherein, described axis of swing is positioned at the reflecting surface of described scanning reflection device, and perpendicular to described common plane;

A described refracting means and No. two refracting means all around the turning axle of self, with the opposite angular velocity rotation of big or small equidirectional, and the reference position of the two rotation is identical; Wherein, the turning axle of a described refracting means and No. two refracting means overlaps, and is respectively the center line of a refracting means and No. two refracting means; The angle of wedge, refractive index and the THz wave of a described refracting means and No. two refracting means satisfies following relation from the optical path length that object point arrives the plane of refraction of a described refracting means and No. two refracting means:

${\mathrm{<figure-callout\; id="1"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_1\&CenterDot;\tan (\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1)={\mathrm{<figure-callout\; id="2"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_2\&CenterDot;\tan ({\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2\sin \left(\arcsin (\frac{\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1}{{\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2}+{\mathrm{\&theta;}}_2)\right)-{\mathrm{\&theta;}}_2)$

Wherein, θ ₁And θ ₂Be respectively the angle of wedge of a described refracting means and No. two refracting means, n ₁And n ₂Be respectively the refractive index of a described refracting means and No. two refracting means, L ₁And L ₂Be respectively THz wave and arrive the optical path length of the plane of refraction of a described refracting means and No. two refracting means from object point;

A described refracting means is used for, and will be refracted on the plane of refraction of described No. two refracting means through the THz wave of described scanning reflection device reflection;

Described No. two refracting means are used for, and will be refracted on the reflecting surface of described quiet reflection unit through the THz wave of described refracting means refraction;

Described quiet reflection unit is used for, and will converge to described sniffer place through the THz wave of described No. two refracting means refraction;

Described sniffer is positioned at the image point position of described quiet reflection unit, is used to receive the THz wave that described quiet reflection unit converges.

In addition, the present invention also provides a kind of THz wave scan method, and this method comprises:

The plane of refraction of the reflecting surface of scanning reflection device and quiet reflection unit and a refracting means and No. two refracting means all keeps vertical with common plane;

Described scanning reflection device is around the axis of swing swing time of self, and the THz wave that incides self reflecting surface is reflexed on the plane of refraction of a described refracting means; Wherein, the axis of swing of described scanning reflection device is positioned at the reflecting surface of described scanning reflection device, and perpendicular to described common plane;

A described refracting means will be refracted on the plane of refraction of described No. two refracting means through the THz wave of described scanning reflection device reflection; Described No. two refracting means will be refracted on the reflecting surface of described quiet reflection unit through the THz wave of described refracting means refraction; Simultaneously, a described refracting means and No. two refracting means all around the turning axle of self, with the opposite angular velocity rotation of big or small equidirectional, and the reference position of the two rotation is identical; The turning axle of a described refracting means and No. two refracting means overlaps, and is respectively the center line of a described refracting means and No. two refracting means; In addition, the angle of wedge of a described refracting means and No. two refracting means and THz wave satisfy following relation from the optical path length that object point arrives the plane of refraction of a described refracting means and No. two refracting means:

${\mathrm{<figure-callout\; id="1"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_1\&CenterDot;\tan (\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1)={\mathrm{<figure-callout\; id="2"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_2\&CenterDot;\tan ({\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2\sin \left(\arcsin (\frac{\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1}{{\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2}+{\mathrm{\&theta;}}_2)\right)-{\mathrm{\&theta;}}_2)$

Wherein, θ ₁And θ ₂Be respectively the angle of wedge of a described refracting means and No. two refracting means, n ₁And n ₂Be respectively the refractive index of a described refracting means and No. two refracting means, L ₁And L ₂Be respectively THz wave and arrive the optical path length of the plane of refraction of a described refracting means and No. two refracting means from object point;

Described quiet reflection unit will converge to sniffer through the THz wave of No. two refracting means refractions; Sniffer receives the THz wave that quiet reflection unit converges.

The invention has the beneficial effects as follows: among the present invention, owing to the axis of swing swing of the scanning reflection device on the plane of refraction that the incident THz wave is reflexed to a refracting means around self, and axis of swing is positioned at the reflecting surface of scanning reflection device, and perpendicular to common plane, simultaneously, to be refracted to a refracting means on the plane of refraction of No. two refracting means through the THz wave of scanning reflection device reflection, and will be refracted to No. two refracting means on the reflecting surface of quiet reflection unit through the THz wave of refracting means refraction all around the turning axle of coincidence, with the opposite angular velocity rotation of big or small equidirectional, and the reference position of the two rotation is identical, in addition, the angle of wedge of a refracting means and No. two refracting means, refractive index and THz wave satisfy following relation from the optical path length that object point arrives the plane of refraction of a refracting means and No. two refracting means:

${\mathrm{<figure-callout\; id="1"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_1\&CenterDot;\tan (\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1)={\mathrm{<figure-callout\; id="2"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_2\&CenterDot;\tan ({\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2\sin \left(\arcsin (\frac{\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1}{{\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2}+{\mathrm{\&theta;}}_2)\right)-{\mathrm{\&theta;}}_2)$

Like this, the refracting means that scanning reflection device and refracting means, No. two refracting means are formed is to just having realized scanning two orthogonal directionss time the on the target to be detected, therefore, with respect to prior art, the present invention can scan target to be detected fast.

On the basis of technique scheme, the present invention can also do following improvement:

Further, this system comprises imaging device, and described imaging device links to each other with described sniffer, is used for the THz wave that described sniffer receives is handled, and forms the picture point corresponding with described object point, and shows described picture point.

Further, this system comprises the Terahertz emitter, and described Terahertz emitter is used for, and launches described THz wave to target to be detected;

Described target to be detected reflexes to the THz wave of described Terahertz emitter emission on the reflecting surface of described scanning reflection device.

Further, described scanning reflection device is a level crossing.

Further, the scanning reflection device that described scanning reflection device is a boring, its reflecting surface are the reflecting surface of aluminum; Or described scanning reflection device is that the compound substance of aluminium honeycomb lead-covering is made, and its reflecting surface is the reflecting surface of aluminum.

Further, a described refracting means is single angle of wedge wedge shape Terahertz prism; And/or described No. two refracting means are single angle of wedge wedge shape Terahertz prism;

And/or,

A described refracting means is a preiodic type wedge shape Terahertz prism; And/or described No. two refracting means are preiodic type wedge shape Terahertz prism.

Further, a described refracting means is the refracting means that polytetrafluoroethylmaterial material is made; And/or described No. two refracting means are No. two refracting means that polytetrafluoroethylmaterial material is made;

And/or,

The refracting means that the polymkeric substance TPX material that a described refracting means is the 4-methylpentene is made; And/or, No. two refracting means that described No. two refracting means are made for the TPX material.

Further, described quiet reflection unit is a concave mirror, and its reflecting surface is a sphere;

Described sniffer be positioned at described quiet reflection unit reflecting surface the picture plane on;

Or,

Described quiet reflection unit is a concave mirror, and its reflecting surface is an ellipsoid;

Described object point is positioned at a focus place of the reflecting surface of described quiet reflection unit, and described sniffer is positioned at another focus place of the reflecting surface of described quiet reflection unit;

Or,

Described quiet reflection unit is a concave mirror, and its reflecting surface is a free form surface;

Described sniffer is positioned at the picture point place of the reflecting surface of described quiet reflection unit.

Further, described common plane is a surface level, or is vertical plane.

Description of drawings

Fig. 1 is the structural drawing of THz wave scanning system provided by the invention;

Fig. 2 among the present invention as the face of overlooking and the side-looking face figure of the right single angle of wedge wedge shape Terahertz prism of refracting means;

Fig. 3 among the present invention as the face of overlooking and the side-looking face figure of the right preiodic type wedge shape Terahertz prism of refracting means;

Fig. 4 is the structural drawing of an embodiment of THz wave scanning system provided by the invention;

Fig. 5 is the structural drawing of another embodiment of THz wave scanning system provided by the invention;

Fig. 6 is the process flow diagram of THz wave scan method provided by the invention.

Embodiment

Below in conjunction with accompanying drawing principle of the present invention and feature are described, institute gives an actual example and only is used to explain the present invention, is not to be used to limit scope of the present invention.

Fig. 1 is the structural drawing of THz wave scanning system provided by the invention.As shown in Figure 1, this system comprises scanning reflection device 3, refracting means 4, No. two refracting means 5, quiet reflection unit 6 and sniffers 7, wherein, the plane of refraction of the reflecting surface of scanning reflection device 3 and quiet reflection unit 6 and a refracting means 4 and No. two refracting means 5 is all vertical with common plane; Here, common plane is the paper shown in the figure.

Scanning reflection device 3 can be around axis of swing 101 swing of self, and the THz wave that is used for inciding self reflecting surface reflexes to the plane of refraction of a refracting means 4; Wherein, axis of swing 101 is positioned at the reflecting surface of scanning reflection device 3, and perpendicular to common plane;

Refracting means 4 and No. two refracting means 5 all around the turning axle of self, with the opposite angular velocity rotation of big or small equidirectional, and the reference position of the two rotation is identical; Wherein, the turning axle of a refracting means 4 and No. two refracting means 5 overlaps, and is respectively the center line of a refracting means 4 and No. two refracting means 5, and its common label is 102; The angle of wedge, refractive index and the THz wave of a refracting means 4 and No. two refracting means 5 satisfies following relation from the optical path length that object point arrives the plane of refraction of a refracting means 4 and No. two refracting means 5:

${\mathrm{<figure-callout\; id="1"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_1\&CenterDot;\tan (\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1)={\mathrm{<figure-callout\; id="2"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_2\&CenterDot;\tan ({\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2\sin \left(\arcsin (\frac{\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1}{{\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2}+{\mathrm{\&theta;}}_2)\right)-{\mathrm{\&theta;}}_2)$

Wherein, θ ₁And θ ₂Be respectively the angle of wedge of a refracting means 4 and No. two refracting means 5, n ₁And n ₂Be respectively the refractive index of a refracting means 4 and No. two refracting means 5, L ₁And L ₂Be respectively the optical path length of THz wave from the plane of refraction of an object point refracting means 4 of arrival and No. two refracting means 5;

No. one refracting means 4 is used for, and will be refracted on the plane of refraction of No. two refracting means 5 through the THz wave of scanning reflection device 3 reflections;

No. two refracting means 5 is used for, and will be refracted on the reflecting surface of quiet reflection unit 6 through the THz wave of refracting means 4 refractions;

Quiet reflection unit 6 is used for, and will converge to sniffer 7 places through the THz wave of No. two refracting means 5 refractions;

Sniffer 7 is positioned at the image point position of quiet reflection unit 6, is used to receive the THz wave that quiet reflection unit 6 converges.

Here; as shown in Figure 1; the axis of swing 101 of scanning reflection device 3 can be the center line of scanning reflection device 3; certainly; also can in the reflecting surface of scanning reflection device 3 perpendicular to other straight line of common plane; no matter the position of axis of swing 101 wherein, as long as scanning reflection device 3 swings and the whole object points of target 1 to be detected on common plane and target to be detected 1 intersection direction all can be scanned around it, just within protection scope of the present invention.

The THz wave of scanning reflection device 3 reflections is through the refraction of a refracting means 4, skew has taken place with respect to incident wave in an outgoing wave line of propagation of institute's outgoing, when refracting means 4 rotated with a fixed angular speed around self turning axle, the track of an outgoing wave was a circle; Outgoing wave through the angular velocity of rotation size equate with refracting means 4, sense of rotation is opposite and the refraction of rotating No. two identical refracting means 5 of initial position, simultaneously, because the angle of wedge, refractive index and the THz wave of a refracting means 4 and No. two refracting means 5 satisfy following relation from the optical path length that object point arrives the plane of refraction of a refracting means 4 and No. two refracting means 5:

${\mathrm{<figure-callout\; id="1"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_1\&CenterDot;\tan (\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1)={\mathrm{<figure-callout\; id="2"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_2\&CenterDot;\tan ({\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2\sin \left(\arcsin (\frac{\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1}{{\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2}+{\mathrm{\&theta;}}_2)\right)-{\mathrm{\&theta;}}_2)$

Therefore, the track of No. two outgoing waves of 5 outgoing of No. two refracting means has become straight line, this be because 5 pairs of outgoing waves of No. two refracting means with the perpendicular direction of track straight line of No. two outgoing waves on trajectory components compensate, and outgoing wave with the track straight line equidirectional of No. two outgoing waves on trajectory components do not compensate.

The turning axle of a refracting means 4 and No. two refracting means 5 overlaps, and can guarantee that a refracting means 4 and No. two refracting means 5 reflect the THz wave that is reflected separately under complementary fully situation.

The turning axle of a refracting means 4 and No. two refracting means 5 is respectively the center line of a refracting means 4 and No. two refracting means 5, this has guaranteed that a refracting means 4 and No. two refracting means 5 all do rightabout rotation in the plane perpendicular to common plane, thereby the refraction action of a refracting means 4 and 5 pairs of THz wave of No. two refracting means, with the reflex of scanning reflection device 3 for THz wave, scanning when being the mutually orthogonal direction of to target 1 to be detected two, thereby sweep velocity is very fast.

If scanning reflection device 3 remains static, and common plane is a perpendicular, then the THz wave of scanning reflection device 3 reflections all comes from the object point that is positioned on the target 1 to be detected on the same surface level, equally, if common plane is a horizontal plane, then the THz wave of scanning reflection device 3 reflections all comes from the object point that is positioned on the target 1 to be detected on the same vertical plane.Certainly, common plane also can be the plane in other orientation.

Object point described in the present invention, refer to the object point on the target to be detected, picture point among the present invention, after the THz wave that refers to object point institute's radiation on the target to be detected or reflection is handled through scanning system provided by the invention, formed picture point on sniffer 7.Be one to one between the object point of target to be detected and the picture point.

In actual applications, can be with scanning reflection device 3, a refracting means 4, No. two refracting means 5, quiet reflection unit 6 and sniffer 7 all are positioned in the seal cavity, the window 2 that only stays a THz wave to pass freely through, thereby prevent that dust in air from entering this confined space, the window 2 that THz wave can pass freely through is set, be used to THz wave that the object point place is launched, or the THz wave that object point reflected is passed this window 2, arrive the reflecting surface of scanning reflection device 3, simultaneously, it is opaque for THz wave that the sealing space can be set, be that THz wave can not be passed the sealing space and removed part outside the window 2, so just can filtering sunlight, parasitic lights such as light guarantee the accuracy of this scanning system result of detection.

In the practical application, target 1 to be detected can be the people, also can for other can be with the object of THz wave scanning.

In the system provided by the present invention, further comprise imaging device, imaging device links to each other with sniffer 7, is used for the THz wave that sniffer 7 receives is handled, and forms the picture point corresponding with object point, and the displayed map picture point.

Among the present invention, utilize imaging device that the THz wave that sniffer 7 is received is handled, can obtain the picture point corresponding,, can see this picture point intuitively through showing with object point.Because native system can scan a lot of object points of target 1 to be detected on two mutually orthogonal directions, therefore, imaging device just can obtain and the corresponding a plurality of picture point of these object points, these picture point are carried out image reconstruction according to the position of its corresponding object point on target 1 to be detected, just can obtain the image of target 1 to be detected.

Each picture point can adopt the mode of bright shadow to show, promptly for the bigger object point of THz wave strength ratio of launching or reflecting, adopt brightness value to show than higher picture point, for the less object point of THz wave strength ratio of emission or reflection, adopt the lower picture point of brightness value to show; This picture point also can adopt the mode of shadow to show, promptly for the bigger object point of THz wave strength ratio of launching or reflecting, adopt the lower picture point of brightness value to show, the less object point of THz wave strength ratio for emission or reflection, adopt brightness value to show, certainly, can also adopt bright shadow and shadow dual mode to show simultaneously than higher picture point, the image that at this moment, can on imaging device, show two targets 1 to be detected.In addition, in order further target 1 to be detected to be compared with its image, can also comprise camera in the native system, for example adopt the CCD camera, when target 1 to be detected is scanned, with camera this target to be detected is taken pictures, on imaging device, can show the photo that this camera photographed and scan resulting image.

This system further comprises the Terahertz emitter, and the Terahertz emitter is used for, to target 1 emission THz wave to be detected;

Target 1 to be detected reflexes to the THz wave of Terahertz emitter emission on the reflecting surface of scanning reflection device 3.

Among the present invention, the source of THz wave can be the THz wave of target to be detected 1 self radiation, also can be for the Terahertz reflection unit is transmitted on the target 1 to be detected, and the THz wave that is reflected by target 1 to be detected.

Among the present invention, scanning reflection device 3 can be level crossing, certainly, also can for other can reflected terahertz the device of ripple now.

Scanning reflection device 3 can be the scanning reflection device 3 of boring, and its reflecting surface is a metallic reflection face, for example, is the reflecting surface of aluminum.Because scanning reflection device 3 adopts the boring structure, only adopt metal material, thereby can make the quality of this device very little, thereby reduce the inertia of its swing at the reflecting surface place, improve sweep velocity.

Scanning reflection device 3 can also adopt the compound substance of aluminium honeycomb lead-covering to make, and its reflecting surface is the reflecting surface of aluminum.Here, the compound substance of aluminium honeycomb lead-covering is a kind of space flight and aviation compound substance, and its outstanding advantage is light firm, thereby can reduce the quality of this device further, thereby reduces the inertia of its swing, improves sweep velocity.

Among the present invention, it is right that refracting means 4 and No. two refracting means 5 have been formed refracting means.This refracting means is to adopting single angle of wedge wedge shape Terahertz prism.Fig. 2 among the present invention as the face of overlooking and the side-looking face figure of the right single angle of wedge wedge shape Terahertz prism of refracting means.As shown in Figure 2, the face of overlooking 201 of single angle of wedge wedge shape Terahertz prism can be circle, with respect to other shapes, single angle of wedge wedge shape Terahertz prism that circle is overlooked face when rotated, its moment of inertia is less.The side-looking face 202 of single angle of wedge wedge shape Terahertz prism is a triangle.

In addition, refracting means is to adopting preiodic type wedge shape Terahertz prism.Fig. 3 among the present invention as the face of overlooking and the side-looking face figure of the right preiodic type wedge shape Terahertz prism of refracting means.As shown in Figure 3, the face of overlooking 301 of preiodic type wedge shape Terahertz prism can be circle, with respect to other shapes, the preiodic type wedge shape Terahertz prism that circle is overlooked face when rotated, its moment of inertia is less.Simultaneously, overlook the edge that dotted line on the face 301 is represented several wedge surfaces on the preiodic type wedge shape Terahertz prism, these wedge surfaces are used for THz wave is reflected.A limit of the side-looking face 302 of single angle of wedge wedge shape Terahertz prism is a straight line, article one, the limit is a serrate, each sawtooth is represented a wedge surface, shown in side-looking face 302, two bottom surfaces of preiodic type wedge shape Terahertz prism are near parallel, and further reduced thickness with respect to single angle of wedge wedge shape Terahertz prism, thereby moment of inertia is littler, and rotates more balanced.

Certainly, among the present invention, No. one refracting means 4 can also adopt different refracting means with No. two refracting means 5, for example, No. one refracting means 4 adopts single angle of wedge wedge shape Terahertz prism, No. two refracting means 5 then adopts preiodic type wedge shape Terahertz prism, perhaps, No. one 4 of refracting means adopt preiodic type wedge shape Terahertz prism, and No. two refracting means 5 adopt single angle of wedge wedge shape Terahertz prism, certainly, the angle of wedge of the two, refractive index and THz wave still will satisfy following relation from the optical path length that object point arrives the plane of refraction of a refracting means 4 and No. two refracting means 5:

${\mathrm{<figure-callout\; id="1"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_1\&CenterDot;\tan (\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1)={\mathrm{<figure-callout\; id="2"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_2\&CenterDot;\tan ({\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2\sin \left(\arcsin (\frac{\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1}{{\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2}+{\mathrm{\&theta;}}_2)\right)-{\mathrm{\&theta;}}_2)$

Aspect the material that uses, refracting means is made adopting polytetrafluoroethylmaterial material, also can adopt polymkeric substance (TPX) material of 4-methylpentene to make, certainly, No. one refracting means 4 also can be different with No. two refracting means 5 employed materials, for example, No. one refracting means 4 adopts polytetrafluoroethylmaterial material to make, and No. two refracting means 5 adopt the TPX material to make, perhaps conversely, No. one refracting means 4 adopts the TPX material to make, and No. two refracting means 5 adopt polytetrafluoroethylmaterial material to make.

Here, the density of TPX is little more a lot of than teflon, thereby a refracting means 4 and No. two refracting means 5 made from TPX, the refracting means 4 that its moment of inertia is made than teflon and the moment of inertia of No. two refracting means 5 are much smaller, have also reduced the general assembly (TW) of this system simultaneously.

Among the present invention, quiet reflection unit 6 can adopt concave mirror, and the shape of its reflecting surface has multiple, for example, can be sphere, also can be ellipsoid, can also be free form surface.

If the reflecting surface of quiet reflection unit 6 is a sphere, then sniffer 7 be positioned at quiet reflection unit 6 reflecting surface the picture plane on the time, can detect the picture point that object point produces.The THz wave that reflects away when the THz wave that incides this reflecting surface and this spherical reflective surface is positioned at the both sides of reflecting surface center line, promptly this quiet reflection unit 6 works in when Spindle Status, owing to work in from the focusing power of the spherical reflective surface of Spindle Status poor, thereby the reflection after obtain astigmatism can appear as the plane, also reduced the image resolution ratio of native system.

If the reflecting surface of quiet reflection unit 6 is an ellipsoid, object point is positioned at a focus place of the reflecting surface of quiet reflection unit 6, sniffer 7 is positioned at another focus place of the reflecting surface of quiet reflection unit 6, such as, object point is positioned at two focus middle distances of ellipsoid reflecting surface reflecting surface focus place far away of quiet reflection unit 6, and sniffer 7 is positioned at the focus place nearer apart from reflecting surface, then the Effect on Detecting of 7 pairs of THz wave of sniffer reaches best, and issuable astigmatism when this can prevent also that reflecting surface from being sphere, with respect to spherical reflective surface, the image resolution ratio of the quiet reflection unit 6 of ellipsoid reflecting surface is higher.

If the reflecting surface of quiet reflection unit 6 is a free form surface, then this reflecting surface has such characteristic: when THz wave in any direction incides the free form surface reflecting surface, reflected terahertz ripple now all converges to same image point position, at this moment, if sniffer 7 is positioned at the image point position of this free form surface reflecting surface, the image resolution ratio of sniffer 7 is the highest.

As shown in Figure 1, the reflecting surface of quiet reflection unit 6 is a sphere.Fig. 4 is the structural drawing of an embodiment of THz wave scanning system provided by the invention.As shown in Figure 4, scanning reflection device 3 is the scanning reflection device 3 of boring, and its reflecting surface is the reflecting surface of aluminum.Quiet reflection unit 6 is a concave mirror, its reflecting surface is an ellipsoid, target 1 to be detected is positioned at this ellipsoid reflecting surface focus place far away apart from reflecting surface, sniffer 7 then is positioned at the focus place nearer apart from reflecting surface, a refracting means 4 and No. two refracting means 5 among Fig. 4 all adopt single angle of wedge wedge shape Terahertz prism, make by the TPX material.

Fig. 5 is the structural drawing of another embodiment of THz wave scanning system provided by the invention.As shown in Figure 5, the scanning reflection device that scanning reflection device 3 is made for the compound substance of aluminium honeycomb lead-covering, its reflecting surface are the reflecting surface of aluminum.Quiet reflection unit 6 is a concave mirror, and its reflecting surface is a free form surface, and sniffer 7 is positioned at the picture point place of this free form surface reflecting surface.A refracting means 4 and No. two refracting means 5 all adopt preiodic type wedge shape Terahertz prism, make by polytetrafluoroethylmaterial material.

Among the present invention, common plane can be surface level, also can be vertical plane, can also be the plane in other orientation.Common plane is the reference plane of native system, be used for the placement location and the direction of motion of all devices in the decision systems, have only common plane to determine, reflecting surface could determine perpendicular to a refracting means 4 of common plane and the placement location and the direction of motion of No. two refracting means 5 perpendicular to scanning reflection device 3 and quiet reflection unit 6, the plane of refraction of common plane, and then the position that receives the sniffer 7 of the THz wave that quiet reflection unit 6 reflected could be determined.

If common plane is a surface level, then the swing of scanning reflection device 3 can scan target 1 to be detected object point in the horizontal direction, and the rotation of a refracting means 4 and No. two refracting means 5 then can scan the object point of target 1 to be detected at vertical direction.If common plane is a vertical plane, then the swing of scanning reflection device 3 can scan the object point of target 1 to be detected at vertical direction, and the rotation of a refracting means 4 and No. two refracting means 5 then can scan target 1 to be detected object point in the horizontal direction.

The invention allows for a kind of THz wave scan method, Fig. 6 is the process flow diagram of THz wave scan method provided by the invention.As shown in Figure 6, this method comprises:

Step 601: the plane of refraction of the reflecting surface of scanning reflection device and quiet reflection unit and a refracting means and No. two refracting means all keeps vertical with common plane.

Here, common plane is a reference plane in this method, common plane has been determined, reflecting surface could determine perpendicular to a refracting means of common plane and the placement location and the direction of motion of No. two refracting means perpendicular to scanning reflection device and quiet reflection unit, the plane of refraction of common plane, and then the position that receives the sniffer of the THz wave that quiet reflection unit reflects could be determined.

Common plane can be surface level, also can be vertical plane, certainly, can also be the plane in other orientation.

Step 602: the scanning reflection device is around the axis of swing swing time of self, and the THz wave that incides self reflecting surface is reflexed on the plane of refraction of a refracting means; Wherein, the axis of swing of scanning reflection device is positioned at the reflecting surface of scanning reflection device, and perpendicular to common plane.

Here, the scanning reflection device can scan each object point on direction of target to be detected around the axis of swing swing of self.For example, when common plane was surface level, the scanning reflection device can scan target to be detected each object point in the horizontal direction, and when common plane was vertical plane, the scanning reflection device can scan each object point of target in the vertical direction to be detected.

Step 603: No. one refracting means will be refracted on the plane of refraction of No. two refracting means through the THz wave of scanning reflection device reflection; No. two refracting means will be refracted on the reflecting surface of quiet reflection unit through the THz wave of a refracting means refraction; Simultaneously, refracting means and No. two refracting means all around the turning axle of self, with the opposite angular velocity rotation of big or small equidirectional, and the reference position of the two rotation is identical; The turning axle of a refracting means and No. two refracting means overlaps, and is respectively the center line of a refracting means and No. two refracting means; In addition, the angle of wedge of a refracting means and No. two refracting means and THz wave satisfy some relations from the optical path length that object point arrives the plane of refraction of a refracting means and No. two refracting means.

Here, described quantitative relation is:

${\mathrm{<figure-callout\; id="1"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_1\&CenterDot;\tan (\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1)={\mathrm{<figure-callout\; id="2"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_2\&CenterDot;\tan ({\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2\sin \left(\arcsin (\frac{\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1}{{\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2}+{\mathrm{\&theta;}}_2)\right)-{\mathrm{\&theta;}}_2)$

Wherein, θ ₁And θ ₂Be respectively the angle of wedge of a refracting means and No. two refracting means, n ₁And n ₂Be respectively the refractive index of a refracting means and No. two refracting means, L ₁And L ₂Be respectively the optical path length of THz wave from the plane of refraction of an object point refracting means of arrival and No. two refracting means.

When the optical path length that arrives the plane of refraction of a refracting means and No. two refracting means from object point when the angle of wedge of a refracting means and No. two refracting means and THz wave has satisfied concerning shown in the above-mentioned formula, after the next refraction of THz wave through a refracting means and No. two refracting means of scanning reflection device reflection, the track of outgoing wave is a straight line.

A refracting means and No. two refracting means are reverse with the speed rotation round turning axle separately, can scan target to be detected on another direction of quadrature mutually with the direction of scanning of scanning reflection device, for example, when scanning reflection device scanning be in the horizontal direction each object point of target to be detected the time, a refracting means and No. two refracting means scannings be each object point of target in the vertical direction to be detected; Equally, when scanning reflection device scanning be each object point of target in the vertical direction to be detected the time, a refracting means and No. two refracting means scannings be target to be detected each object point in the horizontal direction.

Step 604: quiet reflection unit will converge to sniffer through the THz wave of No. two refracting means refractions; Sniffer receives the THz wave that quiet reflection unit converges.

The THz wave that sniffer receives can be through the processing of connected imaging device, form with target to be detected on the corresponding picture point of object point, and show this picture point.Because a scanning reflection device and a refracting means and No. two refracting means scan the object point on the target to be detected on two mutually orthogonal directions, thereby the track of the object point that is scanned is a W shape, after imaging device is handled the pairing THz wave of these object points, can the picture point that form is corresponding one by one with object point, if the position of these picture point is also corresponding one by one with the position of corresponding object point, just can obtain the image of this target to be detected.This image has multiple use, for example, can be used for the safety check that airport, harbour, subway etc. are located, perhaps diagnosis and treatment of hospital etc.

This shows that the present invention has the following advantages:

(1) among the present invention, owing to the axis of swing swing of the scanning reflection device on the plane of refraction that the incident THz wave is reflexed to a refracting means around self, and axis of swing is positioned at the reflecting surface of scanning reflection device, and perpendicular to common plane, simultaneously, to be refracted to a refracting means on the plane of refraction of No. two refracting means through the THz wave of scanning reflection device reflection, and will be refracted to No. two refracting means on the reflecting surface of quiet reflection unit through the THz wave of refracting means refraction all around the turning axle of coincidence, with the opposite angular velocity rotation of big or small equidirectional, and the reference position of the two rotation is identical, in addition, the angle of wedge of a refracting means and No. two refracting means, refractive index and THz wave satisfy following relation from the optical path length that object point arrives the plane of refraction of a refracting means and No. two refracting means:

${\mathrm{<figure-callout\; id="1"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_1\&CenterDot;\tan (\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1)={\mathrm{<figure-callout\; id="2"\; label="L"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">L</figure-callout>}}_2\&CenterDot;\tan ({\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2\sin \left(\arcsin (\frac{\arcsin \left({\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1}{{\mathrm{<figure-callout\; id="2"\; label="n"\; filenames="HSA00000293525400011.png,HSA00000293525400031.png"\; state="\{\{state\}\}">n</figure-callout>}}_2}+{\mathrm{\&theta;}}_2)\right)-{\mathrm{\&theta;}}_2)$

Like this, the refracting means that scanning reflection device and refracting means, No. two refracting means are formed is to just having realized scanning two orthogonal directionss time the on the target to be detected, therefore, with respect to prior art, the present invention can scan target to be detected fast.

(2) among the present invention, can realize scanning owing to only need utilize scanning reflection device and two refracting means to the object point on two mutually orthogonal directions of target to be detected, sweep velocity is also very fast, and the cost of these devices is all very low, therefore, utilize the cost of technical scheme provided by the present invention very low.

(3) among the present invention, because the scanning reflection device can be used as the form of boring, only make the scanning reflection device at the compound substance of reflecting surface configuration metallic or employing aluminium honeycomb lead-covering, thereby the mass ratio of scanning reflection device is less, inertia during swing also a little less than, thereby reduced the general assembly (TW) of system provided by the invention, also reduced the power consumption of system, improved the serviceable life of device.

(4) among the present invention, because a refracting means and No. two refracting means all can adopt preiodic type wedge shape Terahertz prism, its manufacturing materials also can be with the very little TPX material of density, therefore, and among the present invention, the quality of a refracting means and No. two refracting means is also very little, and mass distribution is also very balanced, and this has reduced the general assembly (TW) of system, has also reduced the moment of inertia of a refracting means and No. two refracting means, thereby reduced the power consumption of system, improved the serviceable life of device.

(5) among the present invention, because the reflecting surface of quiet reflection unit can be ellipsoid, target to be detected like this and sniffer can lay respectively on two focuses of this reflecting surface, in addition, the reflecting surface of quiet reflection unit can also be free form surface, and sniffer can be positioned on the picture point of this reflecting surface like this, and this all makes sniffer can detect the picture point corresponding with object point exactly, prevent astigmatism, also improved the image resolution ratio of sniffer.

The above only is preferred embodiment of the present invention, and is in order to restriction the present invention, within the spirit and principles in the present invention not all, any modification of being done, is equal to replacement, improvement etc., all should be included within protection scope of the present invention.

Claims (10)

1. THz wave scanning system, it is characterized in that, this system comprises scanning reflection device, a refracting means, No. two refracting means, quiet reflection unit and sniffers, wherein, the plane of refraction of the reflecting surface of described scanning reflection device and quiet reflection unit and a described refracting means and No. two refracting means is all vertical with common plane;

Described scanning reflection device, around the axis of swing swing of self, the THz wave that is used for inciding self reflecting surface reflexes to the plane of refraction of a described refracting means; Wherein, described axis of swing is positioned at the reflecting surface of described scanning reflection device, and perpendicular to described common plane;

A described refracting means and No. two refracting means all around the turning axle of self, with the opposite angular velocity rotation of big or small equidirectional, and the reference position of the two rotation is identical; Wherein, the turning axle of a described refracting means and No. two refracting means overlaps, and is respectively the center line of a refracting means and No. two refracting means; The angle of wedge, refractive index and the THz wave of a described refracting means and No. two refracting means satisfies following relation from the optical path length that object point arrives the plane of refraction of a described refracting means and No. two refracting means:

$L_1\&CenterDot;\tan (\arcsin \left(n_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1)=L_2\&CenterDot;\tan (n_2\sin \left(\arcsin (\frac{\arcsin \left(n_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1}{n_2}+{\mathrm{\&theta;}}_2)\right)-{\mathrm{\&theta;}}_2)$

Wherein, θ ₁And θ ₂Be respectively the angle of wedge of a described refracting means and No. two refracting means, n ₁And n ₂Be respectively the refractive index of a described refracting means and No. two refracting means, L ₁And L ₂Be respectively THz wave and arrive the optical path length of the plane of refraction of a described refracting means and No. two refracting means from object point;

A described refracting means is used for, and will be refracted on the plane of refraction of described No. two refracting means through the THz wave of described scanning reflection device reflection;

Described No. two refracting means are used for, and will be refracted on the reflecting surface of described quiet reflection unit through the THz wave of described refracting means refraction;

Described quiet reflection unit is used for, and will converge to described sniffer place through the THz wave of described No. two refracting means refraction;

Described sniffer is positioned at the image point position of described quiet reflection unit, is used to receive the THz wave that described quiet reflection unit converges.

2. system according to claim 1 is characterized in that this system further comprises imaging device, described imaging device links to each other with described sniffer, be used for the THz wave that described sniffer receives is handled, form the picture point corresponding, and show described picture point with described object point.

3. system according to claim 1 and 2 is characterized in that this system further comprises the Terahertz emitter, and described Terahertz emitter is used for, and launches described THz wave to target to be detected;

Described target to be detected reflexes to the THz wave of described Terahertz emitter emission on the reflecting surface of described scanning reflection device.

4. system according to claim 1 and 2 is characterized in that, described scanning reflection device is a level crossing.

5. system according to claim 1 and 2 is characterized in that,

The scanning reflection device that described scanning reflection device is a boring, its reflecting surface are the reflecting surface of aluminum;

Or,

Described scanning reflection device is that the compound substance of aluminium honeycomb lead-covering is made, and its reflecting surface is the reflecting surface of aluminum.

6. system according to claim 1 and 2 is characterized in that,

A described refracting means is single angle of wedge wedge shape Terahertz prism; And/or described No. two refracting means are single angle of wedge wedge shape Terahertz prism;

And/or,

A described refracting means is a preiodic type wedge shape Terahertz prism; And/or described No. two refracting means are preiodic type wedge shape Terahertz prism.

7. system according to claim 1 and 2 is characterized in that,

A described refracting means is the refracting means that polytetrafluoroethylmaterial material is made; And/or described No. two refracting means are No. two refracting means that polytetrafluoroethylmaterial material is made;

And/or,

The refracting means that the polymkeric substance TPX material that a described refracting means is the 4-methylpentene is made; And/or, No. two refracting means that described No. two refracting means are made for the TPX material.

8. system according to claim 1 and 2 is characterized in that,

Described quiet reflection unit is a concave mirror, and its reflecting surface is a sphere;

Described sniffer be positioned at described quiet reflection unit reflecting surface the picture plane on;

Or,

Described quiet reflection unit is a concave mirror, and its reflecting surface is an ellipsoid;

Described object point is positioned at a focus place of the reflecting surface of described quiet reflection unit, and described sniffer is positioned at another focus place of the reflecting surface of described quiet reflection unit;

Or,

Described quiet reflection unit is a concave mirror, and its reflecting surface is a free form surface;

Described sniffer is positioned at the picture point place of the reflecting surface of described quiet reflection unit.

9. system according to claim 1 and 2 is characterized in that, described common plane is a surface level, or is vertical plane.

10. a THz wave scan method is characterized in that, this method comprises:

The plane of refraction of the reflecting surface of scanning reflection device and quiet reflection unit and a refracting means and No. two refracting means all keeps vertical with common plane;

Described scanning reflection device is around the axis of swing swing time of self, and the THz wave that incides self reflecting surface is reflexed on the plane of refraction of a described refracting means; Wherein, the axis of swing of described scanning reflection device is positioned at the reflecting surface of described scanning reflection device, and perpendicular to described common plane;

A described refracting means will be refracted on the plane of refraction of described No. two refracting means through the THz wave of described scanning reflection device reflection; Described No. two refracting means will be refracted on the reflecting surface of described quiet reflection unit through the THz wave of described refracting means refraction; Simultaneously, a described refracting means and No. two refracting means all around the turning axle of self, with the opposite angular velocity rotation of big or small equidirectional, and the reference position of the two rotation is identical; The turning axle of a described refracting means and No. two refracting means overlaps, and is respectively the center line of a described refracting means and No. two refracting means; In addition, the angle of wedge of a described refracting means and No. two refracting means and THz wave satisfy following relation from the optical path length that object point arrives the plane of refraction of a described refracting means and No. two refracting means:

$L_1\&CenterDot;\tan (\arcsin \left(n_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1)=L_2\&CenterDot;\tan (n_2\sin \left(\arcsin (\frac{\arcsin \left(n_1\sin {\mathrm{\&theta;}}_1\right)-{\mathrm{\&theta;}}_1}{n_2}+{\mathrm{\&theta;}}_2)\right)-{\mathrm{\&theta;}}_2)$

Wherein, θ ₁And θ ₂Be respectively the angle of wedge of a described refracting means and No. two refracting means, n ₁And n ₂Be respectively the refractive index of a described refracting means and No. two refracting means, L ₁And L ₂Be respectively THz wave and arrive the optical path length of the plane of refraction of a described refracting means and No. two refracting means from object point;

Described quiet reflection unit will converge to sniffer through the THz wave of No. two refracting means refractions; Sniffer receives the THz wave that quiet reflection unit converges.

Images