CN101988901A - Scanned type automatic optical detection system and method - Google Patents
Scanned type automatic optical detection system and method Download PDFInfo
- Publication number
- CN101988901A CN101988901A CN2010102881227A CN201010288122A CN101988901A CN 101988901 A CN101988901 A CN 101988901A CN 2010102881227 A CN2010102881227 A CN 2010102881227A CN 201010288122 A CN201010288122 A CN 201010288122A CN 101988901 A CN101988901 A CN 101988901A
- Authority
- CN
- China
- Prior art keywords
- ccd camera
- automatic testing
- linear array
- pcb
- automatic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The invention discloses scanned type automatic optical detection system and method. The system comprises an automatic testing workbench. The automatic testing workbench is provided with a multi-picture display screen and also provided with a plurality of CCD (Charged Coupled Device) cameras in a linear array way. A linear array scanning way is adopted, i.e. a PCB (Printed Circuit Board) substrate is fixed by a clapboard to be detected by the automatic testing workbench, integral scanning for once is carried out above the PCB substrate to be detected through a testing executer, a feedback optical signal is captured by the CCD camera and transmitted to a computer to acquire a complete PCB substrate figure. The scanning way can obviously increase the detection speed, because the image is captured for once by the CCD camera. Due to capturing the integral image for once, the to-be-detected time of the PCB in the automatic testing workbench is greatly shortened and the use ratio is greatly improved, so that the service life of the CCD camera is greatly prolonged, and the frequency and the period for changing the CCD camera are enlarged to the reasonable range to obviously save the maintenance cost of the machine.
Description
Technical field
The present invention relates to SMT (surface mounting technology) technical field, particularly a kind of scan-type automatic optical detecting system and method.
Background technology
SMT (surface mounting technology) be the popular application of present electronics package trade the most widely technology make, can make 40～60% weight reductions 60～80% of electronic product reduced volume with SM T technology.Wherein: the SMT production procedure as shown in Figure 1: by upper trigger, printing machine, chip mounter, reflow machine and lower plate machine the PCB substrate is handled, AOI position 1, AOI position 2 and AOI position 3 correspond respectively to printing machine, chip mounter and reflow machine.AOI (automatic optical detecting system) generally is positioned over above three positions in the SMT production line: AOI position 1, AOI position 2 and AOI position 3.
At present AOI (automatic optical detecting system) on the market is that clamping plate fix PCB to advance the testing platform then to be measured, the CCD camera lens of Electric Machine Control testing platform top, move the image of the PCB in the capture region by the position of CCD camera lens, a width of cloth width of cloth image construction of seizure the image of monoblock PCB substrate.
1. such scan mode is because be that CCD camera lens sectional type is caught image, and catch whole blocks PCB substrate image speed must be very slow.
2. and sweep velocity will cause the seizure image time of CCD camera lens to prolong greatly slowly, access times increase greatly.
3. owing to catch the prolongation of image time and the increase of access times, make that the frequency that the life-span of CCD camera lens significantly reduces, change increases, the cycle shortening, directly cause the maintenance cost of machine to significantly improve.
Summary of the invention
The invention provides a kind of scan-type automatic optical detecting system and method, with serviceable life to the detection speed of PCB substrate, utilization rate, prolongation CCD camera lens.
To achieve these goals, the invention provides following technical scheme:
A kind of scan-type automatic optical detecting system, described system comprises: test table, described automatic test table are provided with many pictures display screen automatically, and the mode of going back linear array on the described automatic testing platform is provided with a plurality of CCD camera lenses.
A kind of scan-type automatic optical detection method comprises that automatic test table, described automatic test table are provided with many pictures display screen, and the mode of going back linear array on the described automatic testing platform is provided with a plurality of CCD camera lenses, and this method comprises:
Described a plurality of CCD camera lens carries out linear array scanning to the PCB substrate.
Technique effect of the present invention is: system and method provided by the invention, what adopt is the linear array scanning formula, be clamping plate fix the PCB substrate enter automatic testing platform to be measured after, by test executing device from PCB substrate to be measured top disposable whole swept-volume, the CCD camera lens captures the light signal of feedback, be transferred in the computing machine, obtain a width of cloth complete PCB substrate figure.Such scan mode is because image is the disposable seizure of CCD camera lens, so detection speed is significantly improved.Because be disposable seizure general image, make the to be measured time of PCB in automatic testing platform shorten greatly, utilization rate improves greatly.Make increase greatly the serviceable life of CCD camera lens, change the frequency and the cycle of CCD camera lens and all expand in the zone of reasonableness, obviously saved the maintenance cost of machine.
Description of drawings
The sectional type that Fig. 1 provides for prior art is caught the process flow diagram of image;
The front view of the scan-type automatic optical detecting system that Fig. 2 provides for the embodiment of the invention;
The side view of the scan-type automatic optical detecting system that Fig. 3 provides for the embodiment of the invention.
Embodiment
Technical scheme is for a better understanding of the present invention described embodiment provided by the invention in detail below in conjunction with accompanying drawing.
The embodiment of the invention provides a kind of scan-type automatic optical detecting system, as shown in Figures 2 and 3, described system comprises: test table 100, described automatic test table are provided with many pictures display screen 110 automatically, and the mode of going back linear array on the described automatic testing platform is provided with a plurality of CCD camera lenses 111.
The embodiment of the invention also provides a kind of scan-type automatic optical detection method, as shown in Figures 2 and 3, comprise that automatic test table 100, described automatic test table 100 are provided with many pictures display screen 110, the mode of going back linear array on the described automatic testing platform is provided with a plurality of CCD camera lenses 111, and this method comprises:
111 pairs of PCB substrates of described a plurality of CCD camera lens carry out linear array scanning.CCD camera lens 111 is an image-taking device, clamping plate press from both sides PCB substrate 120 to be measured, and to enter automatic testing platform 100 to be measured, xenon lamp directly over this automatic testing platform starts, carry out disposable linear array formula scanning by 130 pairs of PCB substrates 120 to be measured of test executing device, the light of scanning reflexes to CCD camera lens 111 and camera through reflector, and light signal is transformed into the electric signal imaging, thereby on many pictures display screen, demonstrate the general image of PCB substrate 120 to be measured.
The system and method that the embodiment of the invention provides, what adopt is the linear array scanning formula, be clamping plate fix PCB substrate 120 enter automatic testing platform 100 to be measured after, test processes generator (being mechanical transmission mechanism) 140 parts drive PCB substrate 120 move (passing in and out this automatic testing platform), by test executing device 130 from PCB substrate 120 top disposable whole swept-volumes to be measured, CCD camera lens 111 captures the light signal of feedback, be transferred in the computing machine, obtain a width of cloth complete PCB substrate 120 figure, be presented on the display screen 110.Such scan mode is because image is the 111 disposable seizure of CCD camera lens, so detection speed is significantly improved.Because be disposable seizure general image, make PCB substrate 120 shorten greatly in the time to be measured of 100 li of automatic testing platforms, utilization rate improves greatly.Make increase greatly the serviceable life of CCD camera lens 111, change the frequency and the cycle of CCD camera lens 111 and all expand in the zone of reasonableness, obviously saved the maintenance cost of machine.
More than a kind of scan-type automatic optical detecting system and method that the embodiment of the invention provided are described in detail, for one of ordinary skill in the art, thought according to the embodiment of the invention, part in specific embodiments and applications all can change, in sum, this description should not be construed as limitation of the present invention.
Claims (2)
1. scan-type automatic optical detecting system, it is characterized in that, described system comprises: test table, described automatic test table are provided with many pictures display screen automatically, and the mode of going back linear array on the described automatic testing platform is provided with a plurality of CCD camera lenses.
2. scan-type automatic optical detection method, it is characterized in that, comprise that automatic test table, described automatic test table are provided with many pictures display screen, the mode of going back linear array on the described automatic testing platform is provided with a plurality of CCD camera lenses, and this method comprises:
Described a plurality of CCD camera lens carries out linear array scanning to the PCB substrate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102881227A CN101988901A (en) | 2010-09-20 | 2010-09-20 | Scanned type automatic optical detection system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010102881227A CN101988901A (en) | 2010-09-20 | 2010-09-20 | Scanned type automatic optical detection system and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101988901A true CN101988901A (en) | 2011-03-23 |
Family
ID=43745560
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010102881227A Pending CN101988901A (en) | 2010-09-20 | 2010-09-20 | Scanned type automatic optical detection system and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101988901A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107396538A (en) * | 2017-07-21 | 2017-11-24 | 泓辉电子（重庆）有限公司 | A kind of mainboard production line automation production management method |
| CN107396548A (en) * | 2017-07-25 | 2017-11-24 | 泓辉电子（重庆）有限公司 | A kind of mainboard production line automation manages remodeling method |
| CN107991712A (en) * | 2017-10-25 | 2018-05-04 | 深圳市日联科技有限公司 | A kind of people based on Internet of Things, car, the separated nanometer wave detecting system of cabinet |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101334266A (en) * | 2008-07-18 | 2008-12-31 | 北京优纳科技有限公司 | Circuit board defect off-line checking method based on large-capacity image storage technology |
| CN201218722Y (en) * | 2008-06-23 | 2009-04-08 | 游文圣 | Optical detector for printed circuit board |
-
2010
- 2010-09-20 CN CN2010102881227A patent/CN101988901A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201218722Y (en) * | 2008-06-23 | 2009-04-08 | 游文圣 | Optical detector for printed circuit board |
| CN101334266A (en) * | 2008-07-18 | 2008-12-31 | 北京优纳科技有限公司 | Circuit board defect off-line checking method based on large-capacity image storage technology |
Non-Patent Citations (3)
| Title |
|---|
| 乔闹生等: "印刷电路板光电图像获取与预处理研究", 《光学学报》, vol. 30, no. 4, 30 April 2010 (2010-04-30) * |
| 叶亭等: "一种基于线阵CCD技术印刷电路板胶片的尺寸及缺陷在线检测方法", 《光学与光电技术》, vol. 6, no. 2, 30 April 2008 (2008-04-30) * |
| 李响: "印刷电路板智能检测系统设计", 《中国优秀硕士学位论文全文数据库》, 31 December 2007 (2007-12-31) * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107396538A (en) * | 2017-07-21 | 2017-11-24 | 泓辉电子（重庆）有限公司 | A kind of mainboard production line automation production management method |
| CN107396548A (en) * | 2017-07-25 | 2017-11-24 | 泓辉电子（重庆）有限公司 | A kind of mainboard production line automation manages remodeling method |
| CN107991712A (en) * | 2017-10-25 | 2018-05-04 | 深圳市日联科技有限公司 | A kind of people based on Internet of Things, car, the separated nanometer wave detecting system of cabinet |
| CN107991712B (en) * | 2017-10-25 | 2024-03-19 | 深圳市日联科技有限公司 | Nanometer wave detecting system based on separation of people, vehicles and cabinets of Internet of things |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10356298B2 (en) | Board inspection apparatus | |
| US20170276617A1 (en) | Board inspection apparatus | |
| KR101240947B1 (en) | Vision inspection apparatus | |
| WO2012121558A1 (en) | Vision testing device with enhanced image clarity | |
| WO2020215820A1 (en) | Multifunctional automatic detection device for coating quality of pcb | |
| CN204359286U (en) | A kind of Mobile phone shielding case flatness continuous detection apparatus based on image recognition | |
| CN101988901A (en) | Scanned type automatic optical detection system and method | |
| CN104793126A (en) | Device and method for automatically detecting PCB (printed circuit boards) | |
| CN108672312A (en) | Optical detector, optical detecting method and computer readable storage medium | |
| CN202916212U (en) | Automatic grasping and detection equipment for circuit boards | |
| CN104470350A (en) | Multi-nozzle chip mounter adopting small-field-angle camera and provided with image collection auxiliary device | |
| CN212652211U (en) | Monitoring device for wave-soldering automatic optical inspection machine | |
| JPWO2019064609A1 (en) | Component mounting machine | |
| US20130269559A1 (en) | Screen printing device and an image recognizing method in the screen printing device | |
| CN209866709U (en) | Intelligent equipment system of automatic production line | |
| KR101381836B1 (en) | Vision inspection apparatus of improved image visibility | |
| CN211291501U (en) | Device for detecting in-place splicing of FPC (Flexible printed Circuit) connector | |
| CN115188685A (en) | Solar cell defect detection device | |
| CN211426325U (en) | Solar cell panel outward appearance visual detection device | |
| CN204631207U (en) | Pcb board automatic detection device | |
| CN204287061U (en) | A kind of surface-mounted devices comprising multi-camera image capture system | |
| CN206095172U (en) | Three-dimensional detection device with variable grating spacing and multiple projections | |
| CN202841838U (en) | Part mounting system | |
| CN202857226U (en) | Component installation system | |
| CN201628190U (en) | Light source |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20110323 |