CN101975866A - Device and method for measuring diffusion velocity of electronic wave packet - Google Patents
Device and method for measuring diffusion velocity of electronic wave packet Download PDFInfo
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Abstract
The invention discloses a device and a method for measuring the diffusion velocity of an electronic wave packet and aims at measuring a higher harmonic spectrum, screening the relationship between the elliptic polarization independence for exciting the wavelength of laser generated by the high harmonic spectrum and the wavelength of the laser and calculating the speed of the electronic wave packet and the sizes of the electric wave packets corresponding to different laser wavelengths according to the relationship between the sensitivity to the laser elliptic polarization degree and the electronic wave packet kinetic process. The measuring device and the measuring method have the characteristics of simpleness and effectiveness and important significance on understanding the evolution of the electronic wave packets in the strong-field physics and the electronic micro kinetics.
Description
Technical field
The present invention relates to the high field laser physics, particularly a kind of measurement mechanism and measuring method of electron waves bag rate of propagation, this micro kinetics for the evolution of understanding electron waves bag in the high field physics and electronics has great importance.
Background technology
Since nineteen sixty, first ruby laser came out, laser was as the light source of a kind of high brightness, high coherence, high collimation, for daily life and scientific research provide strong tool.Between decades after this, laser technology has obtained significant progress, the people that appear as of pulsed laser provide the LASER Light Source that intensity is higher, the time resolution yardstick is shorter, thereby have promoted the swift and violent progress in high field field, the ultrafast field of microcosmic, biological study field.The output pulse width of pulsed laser light source is more and more narrow, pulsewidth from initial microsecond to femtosecond, even Ah second till now, this makes scientific research can be deep into micro kinetics process faster, as inner-shell electron relaxation, the ionization of light tunnel or the like.Ah second's the reach of science makes people enter a brand-new stage to the research of ultrafast physical process.In addition, the shortening of laser pulse on time scale increased the power density of laser widely, for the research of high field physics provides strong instrument.Higher hamonic wave produces (hereinafter to be referred as HHG) (referring to document A.Scrinzi, M.Ivanov, R.Kienberger and D.M.Villeneuve, J.Phys.B Vol.39, R1,2006 and F.Krausz and M.Ivanov, Rev.Mod.Phys.Vol.81,163,2009), as emerging field in the laser physics, caused people's extensive interest.
Nearly all higher hamonic wave is tested resulting harmonic spectrum and is all shown same feature: along with the increase of harmonic number; low-order harmonic efficient is dull to descend fast; one so-called " platform " and then appearred; in platform area; the intensity of harmonic wave descends very slowly with the increase of harmonic number; near some level subharmonic of this platform area end, humorous intensity of wave descends rapidly, occurs ending.Thus, the higher hamonic wave spectrum is divided into platform area and cut-off region, referring to Fig. 3.
Half classical model (consulting document P.B.Corkum, Phys.Rev.Lett.Vol.71,1994,1993) that P.B.Corkum proposed in 1993 intuitively and has effectively been described the HHG process, and this process is divided into following three steps:
The first step, the constraint potential barrier deforms under the effect of Intense Laser Field, portions of electronics tunnel ionization (HHG mainly concentrates in this ionization mechanism scope);
In second step, the free electron (ignoring the atom potential field) after the ionization is quickened by laser field, obtains kinetic energy;
In the 3rd step, portions of electronics obtains can be retracted by electric field again after the energy in electric field, and is compound with parent ion, gives off the photon of corresponding energy.
Above-mentioned half three classical step models have foretold that on the one hand the cut-off energy of higher hamonic wave satisfies following relation: E
Cutoff=I
p+ 3.17U
p, U wherein
p=9.33 * 10
14I
0λ
2Be ponderomotive force potential energy, I
pBe the ionization potential of atom, unit is eV, I
0Be laser peak intensity, unit is W/cm
2, λ is an optical maser wavelength, the μ m of unit; Explained the high susceptibility of higher hamonic wave production process on the one hand to the laser polarization degree.Under the Intense Laser Field effect of elliptic polarization, the electronics that tunnel ionization takes place moves a period of time when returning in light field, relative parent ion generation lateral excursion, thus cause the recombination rate of electronics and ion to reduce, and humorous weave efficiency significantly descends and (consults document P.Dietrich, N.H.Burnett, M.Ivanov, and P.B.Corkum, Phys.Rev.A Vol.50, R3585,1994).According to quantum-mechanical theory, the electronics of ionization transmits in light field the diffusion of ripple bag can take place, and the size of electron waves bag depends on the speed of its diffusion and the working time in light field.The center of electron waves bag is a process of compensation mutually with respect to the lateral excursion and the diffusion of electron waves bag of parent ion, when electron waves bag center surpasses electron waves bag big or small with respect to the lateral excursion of parent ion, electronics and parent ion recombination probability sharply descend, and higher hamonic wave intensity weakens rapidly.As seen, HHG is closely related to the susceptibility and the electron waves bag dynamics of laser field elliptic polarization degree.In addition, the corresponding different electron waves bag in different wavelength of laser field develops, and HHG is closely related to the susceptibility and the optical maser wavelength of laser field elliptic polarization degree like this.Therefore, the relation that the polarization of Laser Measurement wavelength and HHG relies on is for the electron waves bag dynamics of surveying in the high field physics provides strong instrument.
Summary of the invention
The present invention aims to provide a kind of measurement mechanism and measuring method of electron waves bag rate of propagation, this measurement mechanism and measuring method have simple and more effective characteristics, and this micro kinetics for the evolution of understanding electron waves bag in the high field physics and electronics has great importance.
Core concept of the present invention is: higher hamonic wave produces relevant with electron waves bag dynamic process to the susceptibility of laser elliptic polarization degree, and the evolution of electron waves bag is relevant with optical maser wavelength, utilize and measure the higher hamonic wave frequency spectrum, the elliptic polarization dependence of the excitation laser wavelength that screening higher hamonic wave frequency spectrum produces and the relation of optical maser wavelength are with the speed of calculating electron waves bag diffusion and the electron waves bag size of different optical maser wavelength correspondences.
Technical solution of the present invention is as follows:
A kind of measurement mechanism of electron waves bag rate of propagation, characteristics are that its structure comprises chirped pulse laser system and photoparametric amplifier, on the femtosecond laser light path that the photoparametric amplifier of described chirped pulse laser system or its pumping is exported, set gradually quarter-wave plate, plano-convex lens, higher hamonic wave target chamber and soft x ray grating spectrograph, described chirped pulse structural system output wavelength is the femtosecond laser of 800nm, import to the input light path of described higher hamonic wave target chamber via the 800nm high reflective mirror, after removing described 800nm high reflective mirror, described photoparametric amplifier is under the pumping of described chirped pulse laser system, output wavelength enters the input light path of described higher hamonic wave target chamber at the continuously adjustable femtosecond laser of 1200～2400nm, described quarter-wave plate is selected according to the wavelength of measuring described femtosecond laser, and be fixed on the center of high-accuracy electronic rotating disc, described plano-convex lens is installed on the accurate translation stage that can move along beam direction, has gas box in the described higher hamonic wave target chamber, this gas box links to each other with the working gas bottle with gas circuit by micrometering valve, link to each other with push-pull valve between described higher hamonic wave target chamber and the soft x ray grating spectrograph, described higher hamonic wave target chamber and soft x ray grating spectrograph are connected to first vacuum pump and second vacuum pump respectively, and described soft x ray grating spectrograph is surveyed the higher hamonic wave frequency spectrum that the working gas effect in described femtosecond laser and the described gas box produces.
Described soft x ray grating spectrograph is made of aluminium foil, soft x ray catoptron, slit, flat field grating and soft x ray CCD.
Described quarter-wave plate and described high-accuracy electronic rotating disc are coaxial.
A kind of measurement mechanism of above-mentioned electron waves bag rate of propagation that utilizes carries out the method that electron waves bag rate of propagation is measured, and comprises the following steps:
1. close the push-pull valve between higher hamonic wave target chamber and the soft x ray grating spectrograph, open first vacuum pump that second vacuum pump that links to each other with the soft x ray grating spectrograph links to each other with the higher hamonic wave target chamber successively, after the vacuum tightness for the treatment of described higher hamonic wave target chamber and soft x ray grating spectrograph all reaches desired vacuum tightness, open described push-pull valve;
2. open described chirped pulse laser system, output wavelength is the femtosecond laser of 800nm, this laser imports to the input light path of higher hamonic wave target chamber via three 800nm high reflective mirrors, on this light path, plano-convex lens is set, and it is installed on the described accurate translation stage, adjust and move this precision translation stage, make through the light beam of plano-convex lens and gas box is punched and made focus be positioned at the center of described gas box;
3. open the working gas bottle, the rotary fine adjustment valve charges into working gas in gas box, soft x ray CCD by described soft x ray grating spectrograph surveys the higher hamonic wave frequency spectrum, simultaneously the operating air pressure of adjustments of gas box, laser spot are with respect to the power of the position of gas box and described femtosecond laser with warble, make that working gas interacts in the femtosecond laser of the 800nm with certain peak strength and the described gas box, to obtain highest time harmonic signal;
4. inserting operation wavelength before described plano-convex lens is the 800nm quarter-wave plate, this wave plate is fixed on the center of described high-accuracy electronic rotating disc, rotating this high-accuracy electronic rotating disc drives described quarter-wave plate and rotates around incident ray, with the optical axis of regulating this quarter-wave plate and the angle of laser polarization direction, thereby change the elliptic polarization degree of laser, on the principle, when the higher hamonic wave signal is the strongest, laser is linearly polarized light, be that the elliptic polarization degree is zero, at this moment, the fast axle or the slow axis of the optical axis of this quarter-wave plate overlap with the polarization direction of described femtosecond laser, described quarter-wave plate does not change the polarization state of laser beam, the corresponding angle of described high-accuracy electronic rotating disc this moment is designated as zero degree, again high-accuracy electronic rotating disc is rotated along clockwise or counter clockwise direction, up to the complete obiteration of described higher hamonic wave signal, at this moment the pairing angle of high-accuracy electronic rotating disc is designated as α, (0, α) between every certain angle by described soft x ray CCD survey described wavelength be 800nm be λ
0The higher hamonic wave frequency spectrum;
5. close described micrometering valve, treat that the air pressure in the described gas box reduces to zero, survey acquired signal as a setting, the higher hamonic wave frequency spectrum of above-mentioned steps collection is deducted background signal, obtain to go the λ of background by described soft x ray CCD
0The higher hamonic wave frequency spectrum;
6. remove the high reflective mirror of all 800nm, the laser of chirped pulse laser system output is directly imported to described photoparametric amplifier make pump light, open described photoparametric amplifier, obtain wavelength in the continuously adjustable femtosecond laser output of 1200～2400nm, in selected n the laser wavelength lambda to be measured of described 1200～2400nm
i, i=1 wherein, 2 ..., n; Described 800nm quarter-wave plate is replaced with the middle-infrared band wideband quarter wave plate;
7. selected femtosecond laser wavelength is λ
1, regulating described photoparametric amplifier output optical maser wavelength is λ
1Femtosecond laser, and make this λ
1The peak strength of femtosecond laser after described plano-convex lens focuses on is identical with the peak strength of described 800nm femtosecond laser, i.e. laser wavelength lambda
1The cut-off energy E of corresponding higher hamonic wave spectrum
CutoffSatisfy following relation: E
Cutoff=I
p+ 3.17U
p, wherein: U
p 
Be ponderomotive force potential energy, I
pBe the ionization potential of atom, the eV of unit, I
0Be laser peak intensity, unit is W/cm
2, λ
1Be optical maser wavelength, the μ m of unit; Repeating step is 4. 5. adjusting and test link 3., obtains λ
1The higher hamonic wave frequency spectrum;
8. selected successively femtosecond laser wavelength is λ
i, i=2 wherein ..., n, repeating step 7. n-1 time obtain corresponding λ successively
2, λ
3..., λ
i..., λ
nThe higher hamonic wave frequency spectrum;
9. to described laser wavelength lambda
iI=0 wherein, 1,2, the higher hamonic wave frequency spectrum of n, the inferior harmonic wave of certain one-level in the selected cut-off region, with the intensity addition of all pixels of this harmonic wave correspondence,, obtain the relative intensity I of selected harmonic wave and the relation of described high-accuracy electronic rotating disc rotational angle as the relative intensity I of this harmonic wave, the tangent value of this high-accuracy electronic rotating disc rotational angle is the elliptic polarization degree ε of pumping laser, obtain the relative intensity I of selected harmonic wave and the relation curve of elliptic polarization degree ε, i.e. I-ε relation curve, the relative intensity of finding out this harmonic wave from this curve drops to the value ε of the laser elliptic polarization degree of a half correspondence
1/2(λ
i), i=0 wherein, 1,2 ..., n relies on ε with the comprehensive elliptic polarization that obtains selected cut-off region harmonic wave afterwards of the result of gained
1/2(λ
i) and laser wavelength lambda
iRelation curve ε
1/2-λ is with function a λ
bThis curve of match is tried to achieve the value of a, is tried to achieve the peak swing E of laser by the cut-off region photon energy of higher hamonic wave spectrum
0, again by a=2.6 π
2m
eCV
s/ peE
0Calculate the speed of electron waves bag diffusion:
V
s＝apeE
0/2.6π
2m
ec
With the electron waves bag radius of different optical maser wavelength correspondences be:
Wherein: e, m
e, c is respectively electron charge, electron mass, the light velocity, p ≈ 5.7.
Ultimate principle of the present invention is as follows:
Intense Laser Field in elliptic polarization
E
0(t) be the temporal envelope of light field, ω is a laser frequency, and ε is the elliptic polarization degree of light field) act on down, with respect to parent ion generation lateral excursion, its side-play amount is p ε eE to the electronics of generation tunnel ionization when returning
0λ
2/ m
e(2 π c)
2(consulting document P.Dietrich, N.H.Burnett, M.Ivanov, and P.B.Corkum, Phys.Rev.A Vol.50, R3585,1994).For the impact velocity (being equivalent to the cut-off region harmonic wave) of maximum, p ≈ 5.7, therefore for the ease of contrasting the result of different optical maser wavelengths, we only consider that the elliptic polarization of the harmonic wave of cut-off region relies on, correspondingly, E
0Be the peak swing of light field, because the cut-off energy E of higher hamonic wave spectrum
Cutoff=I
p+ 3.17U
p, U
p=9.33 * 10
14I
0λ
2Be ponderomotive force potential energy, I
pBe the ionization potential of atom, the eV of unit, I
0Be laser peak intensity, unit is W/cm
2, λ is an optical maser wavelength, the μ m of unit.The anti-peak strength I that obtains to obtain laser that pushes away of cut-off energy by the higher hamonic wave spectrum
0, the peak swing of light field
λ is an optical maser wavelength, e, m
e, c is respectively electron charge, electron mass, the light velocity, and the three is constant.In addition, electron waves wrap in the process of laser field transmission the diffusion of ripple bag take place, and rate of propagation can be expressed as
(consulting document A.M.Perelomov, V.S.Popov, and M.V.Terent ' ev, Soy.Phys.JETP Vol.24,207,1967).Therefore, if the peak strength of different optical maser wavelength correspondences (is proportional to E
0 2) identical, to a kind of atom, electron waves bag rate of propagation will remain unchanged.Like this, the electron waves bag size of different optical maser wavelength correspondences be proportional to electronics from tunnel ionization to the compound time of experiencing of parent ion, for the cut-off region harmonic wave, this time is about 0.65 λ/c.As seen, the size of electron waves bag is directly proportional with optical maser wavelength.The center of electron waves bag is a process of compensation mutually with respect to the lateral excursion and the diffusion of electron waves bag of parent ion, and when electronics equals the size (radius) of electron waves bag with respect to the lateral excursion of parent ion, the intensity of harmonic wave will drop to peak strength I
0Half, at this moment, the elliptic polarization degree of laser is designated as ε
1/2, corresponding ripple bag size is designated as σ
1/2=V
s0.65 λ/c.Can get p ε thus
1/2EE
0λ
2/ m
e(2 π c)
2=V
s0.65 λ/c, i.e. ε
1/2=(2.6 π
2m
eCV
s/ peE
0) λ
-1Therefore, with function a λ
bThe elliptic polarization of match cut-off region harmonic wave relies on
With laser wavelength lambda
i(i=1,2 ... relation curve n), can try to achieve the value of a and b.As mentioned above, in theory, a=2.6 π
2m
eCV
s/ peE
0, b=-1.Therefore, a value that obtains by match and the E that obtains by higher hamonic wave spectrum cut-off energy
0Can instead release the speed V of electron waves bag diffusion
s=apeE
0/ 2.6 π
2m
eThe electron waves bag size (radius) of c and different optical maser wavelength correspondences
Technique effect of the present invention:
The present invention utilizes higher hamonic wave to produce the susceptibility of laser elliptic polarization degree and the relation of electron waves bag dynamic process, measure the higher hamonic wave frequency spectrum, the elliptic polarization dependence of the excitation laser wavelength that screening higher hamonic wave frequency spectrum produces and the relation of optical maser wavelength are calculated the speed of electron waves bag diffusion and the electron waves bag size of different optical maser wavelength correspondences.
Measurement mechanism of the present invention and measuring method have simple and effective characteristics, and this micro kinetics for the evolution of understanding electron waves bag in the high field physics and electronics has great importance.
Description of drawings
Fig. 1 is the light path synoptic diagram of the measurement mechanism specific embodiment of electron waves bag rate of propagation of the present invention;
Wherein: 1 is the chirped pulse laser system, 2 is photoparametric amplifier, 3 is the 800nm high reflective mirror, 4 is femtosecond laser, 5 is quarter-wave plate, and 6 is plano-convex lens, and 7 is the higher hamonic wave target chamber, 8 is the soft x ray grating spectrograph, 9 is high-accuracy electronic rotating disc, and 10 is accurate translation stage, and 11 is gas box, 12 is micrometering valve, 13 is the working gas bottle, and 14 is push-pull valve, and 15 is first vacuum pump, 16 is second vacuum pump, and soft x ray grating spectrograph 8 is made of aluminium foil 17, soft x ray catoptron 18, slit 19, flat field grating 20, soft x ray CCD21.
Fig. 2 is for measuring the concrete flow chart of data processing figure that implements of electron waves bag rate of propagation.
Fig. 3 is the synoptic diagram of the two-dimentional higher hamonic wave frequency spectrum of soft x ray CCD measurement.
Embodiment
The invention will be further described below in conjunction with embodiment and accompanying drawing, but should not limit protection scope of the present invention with this.
See also Fig. 1 earlier, Fig. 1 is the light path synoptic diagram of the measurement mechanism specific embodiment of electron waves bag rate of propagation of the present invention.As seen from the figure, the measurement mechanism of electron waves bag rate of propagation of the present invention, its structure comprises chirped pulse laser system 1 and photoparametric amplifier 2, on femtosecond laser 4 light paths that the photoparametric amplifier 2 of described chirped pulse laser system 1 or its pumping is exported, set gradually quarter-wave plate 5, plano-convex lens 6, higher hamonic wave target chamber 7 and soft x ray grating spectrograph 8, described chirped pulse structural system output wavelength is the femtosecond laser of 800nm, import to the input light path of described higher hamonic wave target chamber 7 via three 800nm high reflective mirrors 3, after removing described 800nm high reflective mirror 3, described photoparametric amplifier 2 is under the pumping of described chirped pulse laser system 1, output wavelength enters the input light path of described higher hamonic wave target chamber 7 at the continuously adjustable femtosecond laser of 1200-2400nm, described quarter-wave plate 5 is selected according to the wavelength of measuring described femtosecond laser, and being fixed on the center of high-accuracy electronic rotating disc 9, described quarter-wave plate 5 is coaxial with described high-accuracy electronic rotating disc 9.Described plano-convex lens 6 is installed on the accurate translation stage 10 that can move along beam direction, has gas box 11 in the described higher hamonic wave target chamber 7, this gas box 11 links to each other with working gas bottle 13 with gas circuit by micrometering valve 12, link to each other with push-pull valve 14 between described higher hamonic wave target chamber 7 and the soft x ray grating spectrograph 8, described higher hamonic wave target chamber 7 and soft x ray grating spectrograph 8 are connected to first vacuum pump 15 and second vacuum pump 16 respectively, and the higher hamonic wave frequency spectrum that the working gas effect in 8 pairs of described femtosecond lasers of described soft x ray grating spectrograph and the described gas box 11 produces is surveyed.
Described soft x ray grating spectrograph 8 is made of aluminium foil 17, soft x ray catoptron 18, slit 19, flat field grating 20 and soft x ray CCD21.
Described chirped pulse laser system 1 output wavelength is the femtosecond laser 4 of 800nm, described photoparametric amplifier 2 output wavelengths infrared femto-second laser pulse 4 in 1200-2400nm is continuously adjustable.800nm laser is horizontal polarization, and mid-infrared laser is vertical polarization.Regulate the optical axis (fast axle or slow axis) of quarter-wave plate 5 and the angle of laser polarization direction, can change the polarization state of laser, when both angle is 0 when spending, quarter-wave plate does not change the polarization state of laser, when both angle is 45 when spending, laser is circularly polarized light, when both angles are between 0 degree and 45 degree, laser is elliptically polarized light, the tangent value of this angle is defined as the elliptic polarization degree of laser, the i.e. ratio of the electric field amplitude of the electric field amplitude of Tuo Yuan short-axis direction and long axis direction.In order accurately to regulate the elliptic polarization degree of laser, quarter-wave plate is placed the center of high-accuracy electronic rotating disc 9, this rotating disc 9 is a hollow, can guarantee that laser passes through fully.It should be noted that in order to allow rotating disc 9 drive quarter-wave plate 5 and rotate, require both coaxial around incident ray.
Femto-second laser pulse 4 focuses in the gas box 11 in the higher hamonic wave target chamber 7 via plano-convex lens 6, produces higher hamonic wave.In order to regulate laser spot relatively and the position of gas, lens are installed on the accurate translation stage 10.Gas box 11 is made of two thick steel discs of 0.1-0.2mm, and after steel disc was punched by laser focusing, first vacuum pump 15 was taken out the air in the gas box 11.Open micrometering valve 12, charge into working gas in gas box 11, the gas that the gas that micrometering valve 12 injects and first vacuum pump 15 are extracted out can reach mobile equilibrium.By micrometering valve 12 can the adjustments of gas box air pressure in 11.
The signal that produces in the higher hamonic wave target chamber 7 can filter remaining first-harmonic and low order harmonics via aluminium foil 17.The frequency spectrum of higher hamonic wave is surveyed by soft x ray CCD in the soft x ray grating spectrograph 8 21.In order to reduce thermonoise, soft x ray CCD21 requires to be operated in low-temperature condition.This soft x ray CCD is two-dimensional array CCD, laterally shows higher hamonic wave spectrum, vertically shows the space distribution of higher hamonic wave, as shown in Figure 3.
In addition, higher hamonic wave target chamber 7 links to each other by push-pull valve 14 with soft x ray grating spectrograph 8.Be furnished with first vacuum pump 15 and second vacuum pump 16 respectively.It should be noted that the volume difference in two parts chamber especially, do not broken through, when vacuumizing, need close push-pull valve 14 in order to ensure aluminium foil 17.Wait to be extracted into the vacuum tightness of requirement, during acquired signal, just open push-pull valve 14.
Utilize the measurement mechanism of above-mentioned electron waves bag rate of propagation to carry out the method that electron waves bag rate of propagation is measured, comprise the following steps:
1. close the push-pull valve 14 between higher hamonic wave target chamber 7 and the soft x ray grating spectrograph 8, open first vacuum pump 15 that second vacuum pump (16) that links to each other with soft x ray grating spectrograph 8 links to each other with higher hamonic wave target chamber 7 successively, after treating that described higher hamonic wave target chamber 7 all reaches desired vacuum tightness with soft x ray grating spectrograph 8, open described push-pull valve 14;
2. open described chirped pulse laser system 1, output wavelength is the femtosecond laser 4 of 800nm, this laser imports to the input light path of higher hamonic wave target chamber 7 via three 800nm high reflective mirrors 3, plano-convex lens 6 is set on this light path, and it is installed on the described accurate translation stage 10, adjust and move this precision translation stage 10, make through the light beam of plano-convex lens 6 and punch and make focus to be positioned at the center of described gas box 11 gas box 11;
3. open working gas bottle 13, rotary fine adjustment valve 12 charges into working gas in gas box 11, soft x ray CCD21 by described soft x ray grating spectrograph 8 surveys the higher hamonic wave frequency spectrum, simultaneously the operating air pressure of adjustments of gas box 11, laser spot are with respect to the power of the position of gas box and described femtosecond laser 4 with warble, make that working gas interacts in the femtosecond laser of the 800nm with certain peak strength and the described gas box 11, to obtain highest time harmonic signal;
4. inserting operation wavelength before described plano-convex lens 6 is 800nm quarter-wave plate 5, this wave plate is fixed on the center of described high-accuracy electronic rotating disc 9, rotating the described quarter-wave plate 5 of these high-accuracy electronic rotating disc 9 drives rotates around incident ray, with the optical axis of regulating this quarter-wave plate and the angle of laser polarization direction, thereby change the elliptic polarization degree of laser, on the principle, when the higher hamonic wave signal is the strongest, laser is linearly polarized light, be that the elliptic polarization degree is zero, at this moment, the fast axle or the slow axis of the optical axis of this quarter-wave plate overlap with the polarization direction of described femtosecond laser 4, described quarter-wave plate does not change the polarization state of laser beam, with this moment described high-accuracy electronic rotating disc 9 corresponding angles be designated as zero degree, again high-accuracy electronic rotating disc 9 is rotated along clockwise or counter clockwise direction, up to the complete obiteration of described higher hamonic wave signal, at this moment high-accuracy electronic rotating disc 9 pairing angles are designated as α, (0, α) between every 0.5 the degree survey the λ that described wavelength is 800nm by described soft x ray CCD21
0The higher hamonic wave frequency spectrum;
5. close described micrometering valve 12, treat that the air pressure in the described gas box 11 reduces to zero, survey acquired signal as a setting by described soft x ray CCD21, the higher hamonic wave frequency spectrum subtracting background with 4. above-mentioned steps gathers obtains to go the λ of background
0The higher hamonic wave frequency spectrum;
6. remove the high reflective mirror of all 800nm, the laser of chirped pulse laser system 1 output is directly imported to described photoparametric amplifier 2 make pump light, open described photoparametric amplifier 2, obtain wavelength in continuously adjustable femtosecond laser 4 outputs of 1200～2400nm, in selected n the laser wavelength lambda to be measured of described 1200～2400nm
i, i=1 wherein, 2 ..., n; Described 800nm quarter-wave plate 5 is replaced with middle-infrared band wideband quarter wave plate 5, and this quarter-wave plate all is suitable for the optical maser wavelength of described middle-infrared band;
7. selected femtosecond laser wavelength is λ
1, regulating described photoparametric amplifier 2 output optical maser wavelengths is λ
1Femtosecond laser, and make this λ
1The peak strength of femtosecond laser after described plano-convex lens 6 focuses on is identical with the peak strength of described 800nm femtosecond laser, i.e. laser wavelength lambda
1The cut-off energy E of corresponding higher hamonic wave spectrum
CutoffSatisfy following relation: E
Cutoff=I
p+ 3.17U
p,
Wherein:
Be ponderomotive force potential energy, I
pBe the ionization potential of atom, the eV of unit, I
0Be laser peak intensity, unit is W/cm
2, λ
1Be optical maser wavelength, the μ m of unit; Repeating step is 4. 5. adjusting and test link 3., obtains λ
1The higher hamonic wave frequency spectrum;
8. selected successively femtosecond laser wavelength is λ
i, i=2 wherein ..., n, repeating step 7. n-1 time obtain corresponding λ successively
2, λ
3..., λ
i..., λ
nThe higher hamonic wave frequency spectrum;
9. data processing is referring to Fig. 2, to described laser wavelength lambda
iI=0 wherein, 1,2, the higher hamonic wave frequency spectrum of n, the harmonic wave of certain one-level time in the selected cut-off region is referring to Fig. 3, with the intensity addition of all pixels of this harmonic wave correspondence, relative intensity I as this harmonic wave, obtain the relative intensity I of selected harmonic wave and the relation of described high-accuracy electronic rotating disc 9 rotational angles, the tangent value of these high-accuracy electronic rotating disc 9 rotational angles is the elliptic polarization degree ε of pumping laser, obtains the relative intensity I of selected harmonic wave and the relation curve of elliptic polarization degree ε, be I-ε relation curve, the relative intensity of finding out this harmonic wave from this curve drops to the value ε of the laser elliptic polarization degree of a half correspondence
1/2(λ
i), i=0 wherein, 1,2 ..., n relies on ε with the comprehensive elliptic polarization that obtains selected cut-off region harmonic wave afterwards of the result of gained
1/2(λ
i) and laser wavelength lambda
iRelation curve ε
1/2-λ is with function a λ
bThis curve of match is tried to achieve the value of a, is tried to achieve the peak swing E of laser by the cut-off region photon energy of higher hamonic wave spectrum
0, again by a=2.6 π
2m
eCV
s/ peE
0Calculate the speed of electron waves bag diffusion:
V
s＝apeE
0/2.6π
2m
ec
With the electron waves bag radius of different optical maser wavelength correspondences be:
Wherein: e, m
e, c is respectively electron charge, electron mass, the light velocity, p ≈ 5.7.
What pay special attention to is that suitably the focal length of adjusting output power of laser and plano-convex lens 6 is identical with the peak strength of 800nm wavelength laser with the peak strength that guarantees different wave length laser.In addition, quarter-wave plate 5 should be selected according to optical maser wavelength.The details of data processing:
1. the above-mentioned a series of higher hamonic wave spectrums that measure are deducted corresponding background signal, remove noise, obtain clean higher hamonic wave spectrum, as shown in Figure 3, obtain a series of discrete two-dimension spectrums on the test surface of soft x ray CCD, being the spectrum distribution of harmonic wave laterally, vertically is the space distribution of harmonic wave.From left to right, harmonic number reduces successively.For each optical maser wavelength, the harmonic wave (near highest time, but in order to ensure sufficiently high signal to noise ratio (S/N ratio), selected harmonic wave can not be too weak) of certain one-level time in the selected cut-off region, with the intensity addition of all pixels of this harmonic wave correspondence, as the relative intensity I of this harmonic wave.
2. to each laser wavelength lambda
i(i=1,2 ... n), describe the relative intensity I of the cut-off region harmonic wave selected and the relation of rotating disc rotational angle θ.The tangent value of this universal stage rotational angle is the elliptic polarization degree ε (ε=tan θ) of laser.Thereby obtain each laser wavelength lambda
i(i=1,2 ... n) down the relative intensity I of selected cut-off region harmonic wave describes I-ε relation curve with the variation of laser elliptic polarization degree ε, and the relative intensity I that obtains this harmonic wave by this curve drops to the value of the laser elliptic polarization degree of a half correspondence
3. obtain the elliptic polarization dependence that the cut-off region higher hamonic wave produces
With laser wavelength lambda
i(i=1,2 ... n) relation curve between is with function a λ
bThis curve of match is tried to achieve the value of a and b.
4. described in summary of the invention, when electronics equals the size (radius) of electron waves bag with respect to the lateral excursion of parent ion, the intensity of harmonic wave will drop to original half, i.e. p ε
1/2EE
0λ
2/ m
e(2 π c)
2=V
s0.65 λ/c.Can get thus, the elliptic polarization of cut-off region harmonic wave relies on
With laser wavelength lambda
i(i=1,2 ... n) pass is: ε
1/2=(2.6 π
2m
eCV
s/ peE
0) λ
-1Therefore, in theory, a=2.6 π
2m
eCV
s/ peE
0, b=-1.What we considered is the cut-off region harmonic wave of different optical maser wavelength correspondences, so p ≈ 5.7.Correspondingly, E
0Be the peak swing of light field, counter the pushing away of cut-off energy of being composed by higher hamonic wave obtains.C is the light velocity, m
eBe the quality of electronics, e is the electric charge of electronics, and these are constant.Therefore, a value that obtains by match and the E that obtains by higher hamonic wave spectrum cut-off energy
0Can instead release the speed V of electron waves bag diffusion
s=apeE
0/ 2.6 π
2m
eThe electron waves bag size (radius) of c and different optical maser wavelength correspondences
Provide a specific embodiment below and come preliminary identification the present invention, be described in detail as follows:
We have chosen 800nm in the experiment, 1300nm, 1400nm, 1500nm, five wavelength of 1800nm, preceding four wavelength focus on 40cm plano-convex lens 6,1800nm is unused light, and optical quality is relatively poor, and peak power output is lower, (1.8 * 1014W/cm2) is identical, selects for use 15cm plano-convex lens 6 to focus on the peak strength of other optical maser wavelengths in order to make it.The length of gas box 11 is 2mm, and working gas is an argon gas.By a series of measurement, the elliptic polarization that obtains the higher hamonic wave generation of different optical maser wavelength correspondences relies on, by function a λ
bMatch obtains the value of a, the counter thus electron waves bag rate of propagation that obtains after the argon gas ionization that pushes away
Return electron ripple bag size (radius) σ of the electronics of the impact velocity maximum of 800nm Laser Driven
1/2=0.97 ± 0.13nm.The ripple bag rate of propagation that this measuring method obtains with rely on the result who obtains by the elliptic polarization of measuring argon gas double ioinization rate and consistently (consult document H.Niikura, F.Legare, R.Hasbani, M.Ivanov, A.D.Bandrauk, D.M.Villeneuve, and P.B.Corkum, Nature, Vol.417,917,2002), this suffices to show that the present invention measures the accuracy and the validity of electron waves bag rate of propagation.
Claims (4)
1. the measurement mechanism of an electron waves bag rate of propagation, be characterised in that its structure comprises chirped pulse laser system (1) and photoparametric amplifier (2), on femtosecond laser (4) light path that the photoparametric amplifier (2) of described chirped pulse laser system (1) or its pumping is exported, set gradually quarter-wave plate (5), plano-convex lens (6), higher hamonic wave target chamber (7) and soft x ray grating spectrograph (8), described chirped pulse structural system output wavelength is the femtosecond laser of 800nm, import to the input light path of described higher hamonic wave target chamber (7) via 800nm high reflective mirror (3), after removing described 800nm high reflective mirror (3), described photoparametric amplifier (2) is under the pumping of described chirped pulse laser system (1), output wavelength enters the input light path of described higher hamonic wave target chamber (7) at the continuously adjustable femtosecond laser of 1200-2400nm, described quarter-wave plate (5) is selected according to the wavelength of measuring described femtosecond laser, and be fixed on the center of high-accuracy electronic rotating disc (9), described plano-convex lens (6) is installed on the accurate translation stage (10) that can move along beam direction, has gas box (11) in the described higher hamonic wave target chamber (7), this gas box (11) links to each other with working gas bottle (13) with gas circuit by micrometering valve (12), link to each other with push-pull valve (14) between described higher hamonic wave target chamber (7) and the soft x ray grating spectrograph (8), described higher hamonic wave target chamber (7) and soft x ray grating spectrograph (8) are connected to first vacuum pump (15) and second vacuum pump (16) respectively, and described soft x ray grating spectrograph (8) is surveyed the higher hamonic wave frequency spectrum that the working gas effect in described femtosecond laser and the described gas box (11) produces.
2. the measurement mechanism of electron waves bag rate of propagation according to claim 1 is characterized in that described soft x ray grating spectrograph (8) is made of aluminium foil (17), soft x ray catoptron (18), slit (19), flat field grating (20) and soft x ray CCD (21).
3. the measurement mechanism of electron waves bag rate of propagation according to claim 1 is characterized in that described quarter-wave plate (5) and described high-accuracy electronic rotating disc (9) are coaxial.
4. one kind is utilized the measurement mechanism of claim 1 or 2 or 3 described electron waves bag rate of propagation to carry out the method that electron waves bag rate of propagation is measured, and is characterised in that to comprise the following steps:
1. close the push-pull valve (14) between higher hamonic wave target chamber (7) and the soft x ray grating spectrograph (8), open first vacuum pump (15) that second vacuum pump (16) link to each other with soft x ray grating spectrograph (8) links to each other with higher hamonic wave target chamber (7) successively, after treating that described higher hamonic wave target chamber (7) and soft x ray grating spectrograph (8) all reach desired vacuum tightness, open described push-pull valve (14);
2. open described chirped pulse laser system (1), output wavelength is the femtosecond laser (4) of 800nm, this laser imports to the input light path of higher hamonic wave target chamber (7) via three 800nm high reflective mirrors (3), plano-convex lens (6) is set on this light path, and it is installed on the described accurate translation stage (10), adjust and move this precision translation stage (10), make through the light beam of plano-convex lens (6) and punch and make focus to be positioned at the center of described gas box (11) gas box (11);
3. open working gas bottle (13), rotary fine adjustment valve (12) charges into working gas in gas box (11), soft x ray CCD (21) by described soft x ray grating spectrograph (8) surveys the higher hamonic wave frequency spectrum, simultaneously the operating air pressure of adjustments of gas box (11), laser spot are with respect to the power of the position of gas box and described femtosecond laser (4) with warble, femtosecond laser and the middle working gas of described gas box (11) of 800nm with certain peak strength are interacted, to obtain highest inferior harmonic signal;
4. be 800nm quarter-wave plate (5) in the preceding insertion operation wavelength of described plano-convex lens (6), this wave plate is fixed on the center of described high-accuracy electronic rotating disc (9), rotating this high-accuracy electronic rotating disc (9) drives described quarter-wave plate (5) and rotates around incident ray, with the optical axis of regulating this quarter-wave plate and the angle of laser polarization direction, thereby change the elliptic polarization degree of laser, on the principle, when the higher hamonic wave signal is the strongest, laser is linearly polarized light, be that the elliptic polarization degree is zero, at this moment, the fast axle or the slow axis of the optical axis of this quarter-wave plate overlap with the polarization direction of described femtosecond laser (4), described quarter-wave plate does not change the polarization state of laser beam, the corresponding angle of described high-accuracy electronic rotating disc (9) this moment is designated as zero degree, again high-accuracy electronic rotating disc (9) is rotated along clockwise or counter clockwise direction, up to the complete obiteration of described higher hamonic wave signal, at this moment the pairing angle of high-accuracy electronic rotating disc (9) is designated as α, in that (0, surveying described wavelength every certain angle by described soft x ray CCD (21) between α) is the λ of 800nm
0The higher hamonic wave frequency spectrum;
5. close described micrometering valve (12), treat that the air pressure in the described gas box (11) reduces to zero, survey acquired signal as a setting by described soft x ray CCD (21), the higher hamonic wave frequency spectrum that 4. above-mentioned steps is gathered deducts background signal, obtains to go the λ of background signal
0The higher hamonic wave spectrum;
6. remove the high reflective mirror of all 800nm, the laser of chirped pulse laser system (1) output is directly imported to described photoparametric amplifier (2) make pump light, open described photoparametric amplifier (2), obtain wavelength in the continuously adjustable femtosecond laser of 1200～2400nm (4) output, in selected n the laser wavelength lambda to be measured of described 1200～2400nm
i, i=1 wherein, 2 ..., n; Described 800nm quarter-wave plate (5) is replaced with middle-infrared band wideband quarter wave plate (5);
7. selected femtosecond laser wavelength is λ
1, regulating described photoparametric amplifier (2) output optical maser wavelength is λ
1Femtosecond laser, and make this λ
1The peak strength of femtosecond laser after described plano-convex lens (6) focuses on is identical with the peak strength of described 800nm femtosecond laser, i.e. laser wavelength lambda
1The cut-off energy E of corresponding higher hamonic wave spectrum
CutoffSatisfy following relation: E
Cutoff=I
p+ 3.17U
p,
Wherein:
Be ponderomotive force potential energy, I
pBe the ionization potential of atom, the eV of unit, I
0Be laser peak intensity, unit is W/cm
2, λ
1Be optical maser wavelength, the μ m of unit; Repeating step is 4. 5. adjusting and test link 3., obtains λ
1The higher hamonic wave frequency spectrum;
8. selected successively femtosecond laser wavelength is λ
i, i=2 wherein ..., n, repeating step 7. n-1 time obtain corresponding λ successively
2, λ
3..., λ
i..., λ
nThe higher hamonic wave frequency spectrum;
9. to described laser wavelength lambda
iI=0 wherein, 1,2, the higher hamonic wave frequency spectrum of n, the inferior harmonic wave of certain one-level in the selected cut-off region, with the intensity addition of all pixels of this harmonic wave correspondence,, obtain the relative intensity I of selected harmonic wave and the relation of described high-accuracy electronic rotating disc (9) rotational angle as the relative intensity I of this harmonic wave, the tangent value of this high-accuracy electronic rotating disc (9) rotational angle is the elliptic polarization degree ε of pumping laser, obtain the relative intensity I of selected harmonic wave and the relation curve of elliptic polarization degree ε, i.e. I-ε relation curve, the relative intensity of finding out this harmonic wave from this curve drops to the value ε of the laser elliptic polarization degree of a half correspondence
1/2(λ
i), i=0 wherein, 1,2 ..., n relies on ε with the comprehensive elliptic polarization that obtains selected cut-off region harmonic wave afterwards of the result of gained
1/2(λ
i) and laser wavelength lambda
iRelation curve ε
1/2-λ is with function a λ
bThis curve of match is tried to achieve the value of a, is tried to achieve the peak swing E of laser by the cut-off region photon energy of higher hamonic wave spectrum
0, again by a=2.6 π
2m
eCV
s/ peE
0Calculate the speed of electron waves bag diffusion:
V
s＝apeE
0/2.6π
2m
ec
With the electron waves bag radius of different optical maser wavelength correspondences be:
Wherein: e, m
e, c is respectively electron charge, electron mass, the light velocity, p ≈ 5.7.
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| CN103776894A (en) * | 2014-01-26 | 2014-05-07 | 河南理工大学 | Method for measuring ultrafast process |
| CN105222889A (en) * | 2015-10-12 | 2016-01-06 | 绍兴文理学院 | A kind of measurement mechanism of light laser power density and measuring method thereof |
| CN105427897A (en) * | 2015-10-29 | 2016-03-23 | 中国工程物理研究院激光聚变研究中心 | Miniature energy continuous adjustable non-harmonic soft X-ray non-harmonic light beam line system |
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| CN1431483A (en) * | 2003-01-27 | 2003-07-23 | 中国科学院上海光学精密机械研究所 | Detection device of super quick process |
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| CN1913260A (en) * | 2006-07-31 | 2007-02-14 | 华东师范大学 | High subharmonic generation method of non-collineation |
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| CN1391145A (en) * | 2002-07-30 | 2003-01-15 | 中国科学院长春光学精密机械与物理研究所 | Method and device for measuring altra-fast fs procedure |
| CN1431483A (en) * | 2003-01-27 | 2003-07-23 | 中国科学院上海光学精密机械研究所 | Detection device of super quick process |
| CN1587932A (en) * | 2004-07-13 | 2005-03-02 | 中国科学院上海光学精密机械研究所 | Double color fixed X-ray cross relation measuring instrument |
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| CN103776894A (en) * | 2014-01-26 | 2014-05-07 | 河南理工大学 | Method for measuring ultrafast process |
| CN103776894B (en) * | 2014-01-26 | 2016-04-13 | 河南理工大学 | A kind of method measuring ultrafast process |
| CN105222889A (en) * | 2015-10-12 | 2016-01-06 | 绍兴文理学院 | A kind of measurement mechanism of light laser power density and measuring method thereof |
| CN105427897A (en) * | 2015-10-29 | 2016-03-23 | 中国工程物理研究院激光聚变研究中心 | Miniature energy continuous adjustable non-harmonic soft X-ray non-harmonic light beam line system |
| CN107044885A (en) * | 2017-03-06 | 2017-08-15 | 温州大学 | A kind of device and application method for measuring Laser Focusing intensity |
| CN107044885B (en) * | 2017-03-06 | 2018-09-11 | 温州大学 | A kind of device and application method measuring laser focus strength |
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