CN101957183B - Structured light projection-based high-speed three-dimensional measurement system - Google Patents
Structured light projection-based high-speed three-dimensional measurement system Download PDFInfo
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- CN101957183B CN101957183B CN2010102925422A CN201010292542A CN101957183B CN 101957183 B CN101957183 B CN 101957183B CN 2010102925422 A CN2010102925422 A CN 2010102925422A CN 201010292542 A CN201010292542 A CN 201010292542A CN 101957183 B CN101957183 B CN 101957183B
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Abstract
The invention is applied in the technical field of three-dimensional sensing, and provides a structured light projection-based high-speed three-dimensional measurement system, which comprises a set of phase shifting image projection unit and a high-speed camera, wherein the phase shifting image projection unit comprises a multi-color LED point light source array; and along the emergent direction of the multi-color LED point light source array, the phase shifting image projection unit further comprises a collimating lens, a grating, a pair of reflection gratins arranged in parallel or a pair of inversely-arranged triple prisms, and a projection lens which are sequentially arranged. The structured light projection-based three-dimensional measurement system further comprises a drive circuit for driving the multi-color LED point light source array. The high-speed camera is used for shooting a projection image of the grating on the surface of a measured object, and has shutter frequency synchronous with the frequency of stroboflash of the multi-color LED point light source array. The structured light projection-based high-speed three-dimensional measurement system realizes the high-speed phase shift of the grating image by utilizing the quick frequency response characteristics of LEDs and the dispersion effect of the triple prisms or the reflection gratings, and then performs synchronous shooting by using the high-speed camera to realize high-speed three-dimensional measurement.
Description
Technical field
The invention belongs to the three-dimensional sensing technical field, relate in particular to a kind of high speed three-dimensional measuring system of structured light projection.
Background technology
Real-time three-dimensional scanning is the direction of three-dimensional sensing technical development, realizes that at present the real-time three-dimensional method for scanning mainly contains two big types, and one type is to adopt Fourier transform three-dimensional measurement technology of profiling; This method is owing to only need a two field picture promptly can obtain the three-D profile information of object; Therefore measuring speed is very fast, but because its measuring accuracy extremely depends on the quality of striped, when body form is complicated; Its measuring accuracy sharply descends, so its field of measurement has considerable restraint.Another kind of is to adopt phase shift three-dimensional measurement technology of profiling, and this method advantage is that measuring accuracy is high, can be used for the measurement on face shape complex objects surface, but owing to need the accurate stripe pattern of the above phase shift of projection three width of cloth, so its measuring speed receives very big influence.Receive the restriction of optical projection system, adopt the measuring speed of these class methods can only reach 667 frame per seconds at the soonest at present, can not satisfy the high speed three-dimensional Testing requirement far away.
Summary of the invention
The object of the present invention is to provide a kind of structured light projection three-dimension measuring system, be intended to satisfy bullet armour-piercing, cracked, and phenomenons such as high velocity impact and vibration at high speed are carried out the demand of 3-D data collection with superfast measuring speed.
The present invention is achieved in that a kind of structured light projection three-dimension measuring system, comprises a cover phase shifted images projecting cell and a high-speed camera; Said phase shifted images projecting cell comprises multi-colored led pointolite array, is also comprising reflection grating that the collimation lens, grating, the pair of parallel that are arranged in order are placed or a pair of prism that is placed upside down, projecting lens along the above phase shifted images projecting cell of light direction of said multi-colored led pointolite array; The position on the position of said grating and said testee surface is with respect to the object-image relation of said projecting lens meeting geometric optics;
Said structured light projection three-dimension measuring system also comprises the driving circuit that is used to drive said multi-colored led pointolite array;
Said high-speed camera is used to take the projection image of said grating on the testee surface;
The Frequency Synchronization of said high-speed camera shutter frequency and said multi-colored led pointolite array stroboscopic.
Among the present invention, utilize LED fast the effect of dispersion of frequency response characteristic and prism or reflection grating realize re-using the high speed phase shift of grating picture high-speed camera and take synchronously, can realize three-dimensional measurement at a high speed.Because the frequency response time of LED is in the microsecond magnitude, so this three-dimension measuring system can be 10
-5Accomplish a 3-D scanning in second.In the embodiment of the invention, the projection frequency can reach 10
6Hz, per second can obtain 10
5The 3-D view that frame is above can satisfy bullet armour-piercing, cracked fully, and phenomenons such as high velocity impact and vibration at high speed is carried out the demand of 3-D data collection.
Description of drawings
Fig. 1 is the structure principle chart of the structured light projection three-dimension measuring system that provides of the embodiment of the invention;
Fig. 2 is the structure principle chart of the another kind of structured light projection three-dimension measuring system that provides of the embodiment of the invention.
Embodiment
In order to make the object of the invention, technical scheme and advantage clearer,, the present invention is further elaborated below in conjunction with accompanying drawing and embodiment.Should be appreciated that specific embodiment described herein only in order to explanation the present invention, and be not used in qualification the present invention.
In the embodiment of the invention; Use the light source of the LED pointolite array of different colours as the grating fringe optical projection system; And this array of source can be accomplished stroboscopic in the us magnitude; The reflection grating of in optical system, having used a pair of prism that is placed upside down or pair of parallel to place is because prism or reflection grating have the effect of chromatic dispersion to the light of different colours, therefore when the employing light sources of different colors is carried out projection lighting; The projection image of its grating can be along dispersion direction generation translation, thereby has obtained the phase shifted images of grating.We measure the frequency of led light source stroboscopic and the high-speed camera shutter Frequency Synchronization structural light three-dimensional of just having realized three phase shifts that gets up in addition.
Fig. 1, Fig. 2 show the structural principle of two kinds of structured light projection three-dimension measuring systems that the embodiment of the invention provides respectively, for the ease of describing, only show the part relevant with present embodiment.
With reference to Fig. 1, Fig. 2; The structured light projection three-dimension measuring system that the embodiment of the invention provides comprises the phase shifted images projecting cell of being made up of multi-colored led pointolite array 2, collimation lens 3, grating 4, prism 51 or reflection grating 52, prism 61 or reflection grating 62, projecting lens 7 and testee surface (being projection plane) 8, wherein is arranged in order on collimation lens 3, grating 4, prism 51 or reflection grating 52, prism 61 or reflection grating 62, projecting lens 7 and testee surface (being projection plane) the 8 edge light directions of multi-colored led pointolite array 2.The structured light projection three-dimension measuring system also comprises driving circuit 1 and high-speed camera 9; Wherein driving circuit 1 is used to drive multi-colored led pointolite array 2; High-speed camera 9 then is used to take the projection image of grating 4 testee surface (being projection plane) 8; Owing to receive the modulation on testee surface; Observe (or using video camera to take) from the direction that forms an angle with projecting light path, will find that striped can deform, through analyzing the three-dimensional data that the striped deformation extent just can obtain body surface.Wherein the Frequency Synchronization of the shutter frequency of high-speed camera 9 and multi-colored led pointolite array 2 stroboscopics is synchronous for guaranteeing the two in the present embodiment, recommends to use driving circuit 1 to control multi-colored led pointolite array 2 and high-speed camera 9 simultaneously.
In the embodiment of the invention, prism 51 is placed upside down with prism 61, reflection grating 52 and reflection grating 62 parallel placements, and prism 51 is identical with the size structure and the refractive index of prism 61, reflection grating 52 and reflection grating 62.The position of the position of grating 4 and testee surface (being projection plane) 8 is with respect to the object-image relation of projecting lens 7 meeting geometric optics.
The situation that hereinafter is a RGB three-color LED light source with multi-colored led pointolite array 2 is only described the realization principle of the embodiment of the invention.
At first carry out sequential control, make three-color LED luminous successively through 1 pair of RGB three-color LED of driving circuit light source (being multi-colored led pointolite array 2); The light that LED sends becomes parallel beam through collimation lens 3; Behind the grating 4 of treating projection; After the prism of placing through turning upside down again 51 and the reflection grating 52 of prism 61 or parallel placement and the reflection grating 62, be incident upon testee surface (being projection plane) 8 through projecting lens 7 at last.Wherein object-image relation is satisfied in the position of the position of grating 4 and testee surface (being projection plane) 8.Because prism or reflection grating have the effect of chromatic dispersion to light; When different colours light passes through it; The angle of chromatic dispersion is also different, and is identical through two size structures and refractive index continuously when light, be the reflection grating of the prism that turns upside down of a pair of position or the parallel placement of a pile after; Light can squint, and the emit beam distance of skew of the LED of different colours is also different.Therefore certainly the rayed of different colours was in 4 last times of grating, and the position of its imaging on imaging plane also can be different.Through the gap between two prisms or the reflection grating is set, and use the prism of different angles can be adjusted at the displacement of the projection of the grating 4 on the testee surface (being projection plane) 8, thereby can obtain the raster image of accurate phase shift.Because the frequency response speed of LED is very high, can reach 10 simultaneously
6Hz, therefore through the synchronizing signal of driving circuit 1 control LED and high-speed camera 9, we can obtain per second 10
6The phase shifted images of frame, per second can obtain 10 under the situation that adopts three step phase shift three-dimensional measurement technology of profiling
5The 3-D view that frame is above.
In the embodiment of the invention, utilize LED fast the effect of dispersion of frequency response characteristic and prism or reflection grating realize re-using the high speed phase shift of grating picture high-speed camera and take synchronously, can realize three-dimensional measurement at a high speed.Because the frequency response time of LED is in the microsecond magnitude, so this three-dimension measuring system can be 10
-5Accomplish a 3-D scanning in second.In the embodiment of the invention, the projection frequency can reach 10
6Hz, per second can obtain 10
5The 3-D view that frame is above can satisfy bullet armour-piercing, cracked fully, and phenomenons such as high velocity impact and vibration at high speed is carried out the demand of 3-D data collection.Compare with other high speed three-dimensional measurements, mainly have the following advantages: 1, with respect to present phase measuring profilometer, measuring accuracy is suitable, but survey frequency brings up to 10 then far above present method from 667hz
5Hz; 2, with respect to Fourier transform profilometry, measuring speed is suitable, but precision is far above Fourier transform profilometry; 3, simple in structure, it is convenient to implement.
The above is merely preferred embodiment of the present invention, not in order to restriction the present invention, all any modifications of within spirit of the present invention and principle, being done, is equal to and replaces and improvement etc., all should be included within protection scope of the present invention.
Claims (4)
1. a structured light projection three-dimension measuring system is characterized in that, comprises a cover phase shifted images projecting cell and a high-speed camera; Said phase shifted images projecting cell comprises multi-colored led pointolite array, is also comprising reflection grating that the collimation lens, grating, the pair of parallel that are arranged in order are placed or a pair of prism that is placed upside down, projecting lens along the above phase shifted images projecting cell of light direction of said multi-colored led pointolite array; The position on the position of said grating and said testee surface is with respect to the object-image relation of said projecting lens meeting geometric optics;
Said structured light projection three-dimension measuring system also comprises the driving circuit that is used to drive said multi-colored led pointolite array;
Said high-speed camera is used to take the projection image of said grating on the testee surface;
The Frequency Synchronization of said high-speed camera shutter frequency and said multi-colored led pointolite array stroboscopic.
2. structured light projection three-dimension measuring system as claimed in claim 1 is characterized in that, said multi-colored led pointolite array comprises RGB three-color LED light source.
3. structured light projection three-dimension measuring system as claimed in claim 1 is characterized in that, the size structure and the refractive index of the said a pair of prism that is placed upside down are identical.
4. structured light projection three-dimension measuring system as claimed in claim 1 is characterized in that said high-speed camera is controlled by said driving circuit, realizes the Frequency Synchronization of the stroboscopic of its shutter frequency and said multi-colored led pointolite array.
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| CN2010102925422A CN101957183B (en) | 2010-09-26 | 2010-09-26 | Structured light projection-based high-speed three-dimensional measurement system |
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| CN2010102925422A CN101957183B (en) | 2010-09-26 | 2010-09-26 | Structured light projection-based high-speed three-dimensional measurement system |
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| CN101957183B true CN101957183B (en) | 2012-03-21 |
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| CN102175182B (en) * | 2011-01-27 | 2012-10-10 | 浙江大学宁波理工学院 | Structured light three-dimensional measurement device and complete point cloud data acquisition method thereof |
| CN102192729B (en) * | 2011-02-01 | 2015-11-25 | 深圳市中钞科信金融科技有限公司 | Imaging system and formation method |
| CN102508402B (en) * | 2011-11-23 | 2014-05-21 | 苏州佳世达光电有限公司 | Projection device |
| AU2013338193A1 (en) | 2012-10-30 | 2015-05-21 | California Institute Of Technology | Fourier ptychographic imaging systems, devices, and methods |
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| US10652444B2 (en) | 2012-10-30 | 2020-05-12 | California Institute Of Technology | Multiplexed Fourier ptychography imaging systems and methods |
| DE112013006324T5 (en) * | 2012-12-31 | 2015-10-15 | Iee International Electronics & Engineering S.A. | An optical system for generating a structured light field from a series of light sources through a refractive or reflective light structuring element |
| WO2015017730A1 (en) | 2013-07-31 | 2015-02-05 | California Institute Of Technoloby | Aperture scanning fourier ptychographic imaging |
| WO2015027188A1 (en) | 2013-08-22 | 2015-02-26 | California Institute Of Technoloby | Variable-illumination fourier ptychographic imaging devices, systems, and methods |
| US11468557B2 (en) | 2014-03-13 | 2022-10-11 | California Institute Of Technology | Free orientation fourier camera |
| JP2018504627A (en) * | 2014-12-04 | 2018-02-15 | カリフォルニア インスティチュート オブ テクノロジー | Multiple Fourier typographic imaging system and method |
| CN104568963A (en) * | 2014-12-17 | 2015-04-29 | 华南理工大学 | Online three-dimensional detection device based on RGB structured light |
| CN107111118B (en) | 2014-12-22 | 2019-12-10 | 加州理工学院 | EPI illumination Fourier ptychographic imaging for thick samples |
| JP2018508741A (en) | 2015-01-21 | 2018-03-29 | カリフォルニア インスティチュート オブ テクノロジー | Fourier typography tomography |
| AU2016211634A1 (en) | 2015-01-26 | 2017-05-04 | California Institute Of Technology | Array level fourier ptychographic imaging |
| US10684458B2 (en) | 2015-03-13 | 2020-06-16 | California Institute Of Technology | Correcting for aberrations in incoherent imaging systems using fourier ptychographic techniques |
| CN105021138B (en) * | 2015-07-15 | 2017-11-07 | 沈阳派特模式识别技术有限公司 | 3-D scanning microscope and fringe projection 3-D scanning method |
| TWI567364B (en) | 2015-09-08 | 2017-01-21 | 財團法人工業技術研究院 | Structured light generating apparatus, measuring system and method thereof |
| CN105657403B (en) * | 2016-02-22 | 2018-08-28 | 易喜林 | The synchronization system of structured light projection and Image Acquisition based on FPGA |
| US11092795B2 (en) | 2016-06-10 | 2021-08-17 | California Institute Of Technology | Systems and methods for coded-aperture-based correction of aberration obtained from Fourier ptychography |
| US10568507B2 (en) | 2016-06-10 | 2020-02-25 | California Institute Of Technology | Pupil ptychography methods and systems |
| CN106123806A (en) * | 2016-06-20 | 2016-11-16 | 四川川大智胜软件股份有限公司 | A kind of based on micro electronmechanical structured light projection scheme |
| CN106979758A (en) * | 2017-06-08 | 2017-07-25 | 北京邮电大学 | A kind of three-dimensional measuring apparatus and method |
| CN107370952B (en) * | 2017-08-09 | 2020-02-21 | Oppo广东移动通信有限公司 | Image shooting method and device |
| WO2019090149A1 (en) | 2017-11-03 | 2019-05-09 | California Institute Of Technology | Parallel digital imaging acquisition and restoration methods and systems |
| CN108548489A (en) * | 2018-05-24 | 2018-09-18 | 郑州辰维科技股份有限公司 | A method of precision measure being carried out to solid surface antenna using optical markers |
| CN108548506A (en) * | 2018-05-24 | 2018-09-18 | 郑州辰维科技股份有限公司 | A method of the measurement of planeness being carried out to high precision plane using optical markers |
| CN109141287B (en) * | 2018-10-15 | 2020-08-04 | 中国科学院上海光学精密机械研究所 | Point light source array generator based on spatial light modulator and obtaining method thereof |
| CN111412796B (en) * | 2020-03-27 | 2022-04-01 | 西安工业大学 | Detection and calibration device and method for dynamic response performance of backdrop target |
| CN113551611B (en) * | 2021-06-15 | 2022-04-22 | 西安交通大学 | Stereo vision measuring method, system, equipment and storage medium for large-size moving object |
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| US5581352A (en) * | 1994-09-22 | 1996-12-03 | Zeien; Robert | Phase shifting device with selectively activated grating generator |
| TW580556B (en) * | 2002-11-22 | 2004-03-21 | Ind Tech Res Inst | Method and system for measuring the three-dimensional appearance of an object surface |
| CN101556143A (en) * | 2008-04-09 | 2009-10-14 | 通用电气公司 | Three-dimensional measurement and detection device and method |
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