CN101915619A - Infrared test platform based waveform processing method, system and infrared test platform - Google Patents
Infrared test platform based waveform processing method, system and infrared test platform Download PDFInfo
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- CN101915619A CN101915619A CN 201010253134 CN201010253134A CN101915619A CN 101915619 A CN101915619 A CN 101915619A CN 201010253134 CN201010253134 CN 201010253134 CN 201010253134 A CN201010253134 A CN 201010253134A CN 101915619 A CN101915619 A CN 101915619A
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Abstract
The invention is suitable for the field of security and provides a passive infrared detector test platform based waveform processing method, a system and an infrared test platform. The method comprises the following steps of: acquiring a storage waveform and the sampling rate of the waveform; setting the tempo of a timer according to the sampling rate and reading the data of the storage waveform according to the tempo; carrying out digital-to-analogue conversion on the read waveform data to obtain an analog signal and outputting the analog signal. The technical scheme of the invention has the advantage of reducing the storage waveform into the analog signal for outputting.
Description
Technical field
The invention belongs to safety-security area, relate in particular to a kind of waveform processing method, system and test platform based on the infrared test platform.
Background technology
The key concept of passive infrared detection is the difference signal of inducing moving objects and ambient temperature.In safety-security area, the application of infrared eye is very extensive, and, technical feature cheap because of it stablized, and is subjected to users' welcome deeply.At present, the infrared eye of market is of a great variety, and function is different, and fast to digitizing, modularization, intelligentized direction develops, and traditional simulation passive type is infrared, and (Passive Infra-Red, PIR) detection mode is then slowly withdrawn from the market.Existing waveform processing method based on the infrared test platform is specially, passive infrared detector sends to the infrared test platform with the infrared data simulating signal that collects, test platform becomes the infrared data digital signal with this analog signal conversion, then this infrared data is carried out analyzing and processing and obtains storing behind its corresponding waveform.
According to the technical scheme that prior art provided, find to exist in the prior art following technical matters:
Test platform in the technical scheme that prior art provides only limits to the data that will gather and obtains the waveform storage after through conversion and analyzing and processing, exports and the waveform of storage can't be reduced into analog data signal.
Summary of the invention
The purpose of the embodiment of the invention is to provide a kind of waveform processing method based on the infrared test platform, is intended to solve the problem that waveform processing method of the prior art can't be reduced into the waveform of storage analog data signal output.
The embodiment of the invention is achieved in that a kind of method of the waveform processing based on the infrared test platform, and described method comprises the steps:
Obtain the sampling rate of stored waveform and this waveform;
According to the beat of this sampling rate setting timer, the data of reading this stored waveform by this beat;
The Wave data of reading is carried out obtaining simulating signal after the digital-to-analog conversion, and with this simulating signal output.
The present invention also provides a kind of system of the waveform processing based on the infrared test platform, and described system comprises:
Acquiring unit is used to obtain the sampling rate of stored waveform and this waveform;
Sensing element is used for the beat according to this sampling rate setting timer, the data of reading this stored waveform by this beat;
The conversion output unit, the Wave data that is used for reading carries out obtaining simulating signal after the digital-to-analog conversion, and with this simulating signal output.
The present invention also provides a kind of infrared test platform, and described infrared test platform comprises the system of above-mentioned waveform processing based on the infrared test platform.
The embodiment of the invention compared with prior art, beneficial effect is: technical scheme provided by the invention obtains the sampling rate of the stored waveform that gets access to the beat of timer, and according to after this beat sense data, carry out digital-to-analog conversion and obtain simulating signal, with this simulating signal output, so this method has the advantage that stored waveform is reduced into simulating signal output.
Description of drawings
Fig. 1 is the process flow diagram of a kind of waveform processing method based on the infrared test platform of providing of invention;
Fig. 2 is the structural drawing of the infrared test platform that provides of the embodiment of the invention one;
Fig. 3 is the process flow diagram based on the waveform processing method of infrared test platform that the embodiment of the invention one provides;
Fig. 4 is the structural drawing based on the waveform processing system of infrared test platform that the embodiment of the invention provides.
Embodiment
In order to make purpose of the present invention, technical scheme and advantage clearer,, the present invention is further elaborated below in conjunction with drawings and Examples.Should be appreciated that specific embodiment described herein only in order to explanation the present invention, and be not used in qualification the present invention.
The invention provides a kind of waveform processing method based on the infrared test platform, this method is finished by the infrared test platform, this method as shown in Figure 1, dotted line is represented optional step among Fig. 1, specifically comprises:
S11, obtain the sampling rate of stored waveform and this waveform;
S12, set the beat of timer, the data of reading this stored waveform according to this beat according to this sampling rate;
S13, the Wave data of reading is carried out obtaining simulating signal after the digital-to-analog conversion, and with this simulating signal output.
Need to prove that said method can also comprise after S13:
S14, with output simulating signal carry out obtaining digital signal after the analog to digital conversion;
S15, obtain the waveform after the emulation after this digital signal handled, show simulation waveform, show stored waveform simultaneously.
Said method can also comprise: the operation of circulation S14 and S15.
The method that present embodiment provides obtains the sampling rate of the stored waveform that gets access to the beat of timer, and after reading waveform data according to this beat, carry out digital-to-analog conversion and obtain simulating signal, with this simulating signal output, so this method has the advantage that stored waveform is reduced into simulating signal output, and this method also carries out forming after the analog to digital conversion waveform after the emulation to the simulating signal of output, and show simulation waveform and stored waveform simultaneously, make the user to judge whether the reduction of this passive infrared detection equipment and acquisition process be correct by the difference of contrast simulation waveform and stored waveform.
Embodiment one:
Present embodiment provides a kind of waveform processing method based on the infrared test platform, the technology scene that present embodiment is realized is: the method that present embodiment provides is finished by the infrared test platform, the concrete structure of this infrared test platform as shown in Figure 2, the method that present embodiment provides specifically comprises the steps: as shown in Figure 3
S31, host computer send to slave computer with the sampling rate of stored waveform and this waveform;
S32, slave computer are provided with the beat of sample clock generator and the data of reading stored waveform according to the beat of timer according to this sampling rate;
Need to prove, be provided with according to this sampling rate sample clock generator beat concrete grammar can for: the beat of sample clock generator is arranged to the inverse of sampling rate, and for example sampling rate is 1000H
ZThe time, just the beat of sample clock generator is arranged to 1ms.
The digital-to-analog conversion card of S33, slave computer carries out obtaining output waveform after the digital-to-analog conversion to the Wave data of reading, and output waveform is sent to the analog-to-digital conversion card of slave computer;
Need to prove, above-mentioned output waveform can for, with the infrared data simulating signal after the stored waveform among the S31 reduction.
S34, digital-to-analog conversion card convert digital signal to after this output waveform is sampled by this sampling rate, and this digital signal is sent to host computer;
S35, host computer are handled the back to this digital signal and are shown simulation waveform, show stored waveform simultaneously.
Need to prove that above-mentioned analog-to-digital conversion card and digital-to-analog conversion are stuck in the actual conditions and also can be incorporated in the transition card.
After the Wave data digital-to-analog conversion that the method that present embodiment provides is received by the digital-to-analog conversion card docking in the slave computer, data after the conversion are sent in the analog-to-digital conversion card, analog-to-digital conversion card will be changed the back data and carry out forming simulation waveform by host computer after the analog to digital conversion, and this simulation waveform and stored waveform shown jointly, so this method can not only be reduced into original waveform analog data signal output, can also know whether the reduction of this passive infrared detection equipment and acquisition process be correct by the difference of contrast simulation waveform and stored waveform.
The invention provides a kind of system of the waveform processing based on the infrared test platform, this system specifically comprises as shown in Figure 4:
Acquiring unit 41 obtains the sampling rate of stored waveform and this waveform;
Sensing element 42 is according to the beat of this sampling rate setting timer, the data of reading this stored waveform by this beat;
Optionally, above-mentioned conversion output unit 43 also carries out the simulating signal of output to obtain digital signal after the analog to digital conversion; Described system also comprises:
Obtain the waveform after the emulation after emulation display unit 44 is handled this digital signal, show simulation waveform and stored waveform.
Optionally, sensing element 42 specifically can comprise:
Read module 422 and read the data of stored waveform by this beat.
Optionally, said system can also comprise:
The system that present embodiment provides carries out the stored waveform that gets access to obtain simulating signal after the digital-to-analog conversion, with this simulating signal output, so this system has the advantage that stored waveform is reduced into simulating signal output, and should hero also the simulating signal of output be carried out forming after the analog to digital conversion waveform after the emulation, and show simulation waveform and stored waveform simultaneously, make the user to judge whether the reduction of this passive infrared detection equipment and acquisition process be correct by the difference of contrast simulation waveform and stored waveform.
The present invention also provides a kind of infrared test platform, and this infrared test platform comprises the system of above-mentioned waveform processing based on the infrared test platform.
It should be noted that among the said system embodiment that each included unit is just divided according to function logic, but is not limited to above-mentioned division, as long as can realize function corresponding; In addition, the concrete title of each functional unit also just for the ease of mutual differentiation, is not limited to protection scope of the present invention.
In addition, one of ordinary skill in the art will appreciate that all or part of step that realizes in the foregoing description method is to instruct relevant hardware to finish by program, corresponding program can be stored in a kind of computer-readable recording medium, the above-mentioned storage medium of mentioning can be a ROM (read-only memory), disk or CD etc.
In sum, technical scheme provided by the invention has the advantage that stored waveform is reduced into simulating signal output.
The above only is preferred embodiment of the present invention, not in order to restriction the present invention, all any modifications of being done within the spirit and principles in the present invention, is equal to and replaces and improvement etc., all should be included within protection scope of the present invention.
Claims (9)
1. the method based on the waveform processing of infrared test platform is characterized in that, described method comprises the steps:
Obtain the sampling rate of stored waveform and this waveform;
According to the beat of this sampling rate setting timer, the data of reading this stored waveform by this beat;
The Wave data of reading is carried out obtaining simulating signal after the digital-to-analog conversion, and with this simulating signal output.
2. method according to claim 1 is characterized in that, described method also comprises the steps: after simulating signal is exported
The simulating signal of output is carried out obtaining digital signal after the analog to digital conversion;
Obtain the waveform after the emulation after this digital signal handled, show simulation waveform and stored waveform.
3. method according to claim 1 is characterized in that, the described step of setting the beat of timer according to this sampling rate specifically comprises:
The beat of timer is set for the inverse of this sampling rate.
4. method according to claim 2 is characterized in that, described method also comprises circulation execution digital-to-analogue switch process, analog to digital conversion step and simulation process.
5. the system based on the waveform processing of infrared test platform is characterized in that, described system comprises:
Acquiring unit is used to obtain the sampling rate of stored waveform and this waveform;
Sensing element is used for the beat according to this sampling rate setting timer, the data of reading this stored waveform by this beat;
The conversion output unit, the Wave data that is used for reading carries out obtaining simulating signal after the digital-to-analog conversion, and with this simulating signal output.
6. system according to claim 5 is characterized in that, described conversion output unit also is used for the simulating signal of output is carried out obtaining digital signal after the analog to digital conversion; Described system also comprises:
The emulation display unit obtains the waveform after the emulation after being used for this digital signal handled, show simulation waveform and stored waveform.
7. system according to claim 5 is characterized in that, described sensing element specifically comprises:
Setting module is used for the beat of timer is set for the inverse of this sampling rate;
Read module, be used for reading the data of stored waveform by this beat.
8. system according to claim 6 is characterized in that, described system also comprises:
Cycling element is used to trigger described conversion output unit and described emulation display unit carries out cycling.
9. an infrared test platform is characterized in that, described infrared test platform comprises the system as the arbitrary described waveform processing based on the infrared test platform of claim 5-8.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103196846A (en) * | 2013-03-18 | 2013-07-10 | 山东大学 | Standard signal source of gas absorption state in analog optical fiber gas sensing and detecting |
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| CN101241028A (en) * | 2007-02-07 | 2008-08-13 | 南京理工大学 | Infrared focal plane array image-forming demonstration system |
| CN101242495A (en) * | 2007-02-07 | 2008-08-13 | 南京理工大学 | Self-adapted digitalization method and its circuit for infrared plane array |
| CN101702035A (en) * | 2009-02-19 | 2010-05-05 | 黄程云 | Digital quasi-static passive human body detector |
| CN201535694U (en) * | 2009-08-10 | 2010-07-28 | 西安晨博光电科技有限责任公司 | Infrared on-line temperature monitor for high voltage switch cabinet |
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- 2010-08-13 CN CN2010102531346A patent/CN101915619B/en active Active
Patent Citations (4)
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| CN101241028A (en) * | 2007-02-07 | 2008-08-13 | 南京理工大学 | Infrared focal plane array image-forming demonstration system |
| CN101242495A (en) * | 2007-02-07 | 2008-08-13 | 南京理工大学 | Self-adapted digitalization method and its circuit for infrared plane array |
| CN101702035A (en) * | 2009-02-19 | 2010-05-05 | 黄程云 | Digital quasi-static passive human body detector |
| CN201535694U (en) * | 2009-08-10 | 2010-07-28 | 西安晨博光电科技有限责任公司 | Infrared on-line temperature monitor for high voltage switch cabinet |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103196846A (en) * | 2013-03-18 | 2013-07-10 | 山东大学 | Standard signal source of gas absorption state in analog optical fiber gas sensing and detecting |
| CN103196846B (en) * | 2013-03-18 | 2015-01-21 | 山东大学 | Standard signal source of gas absorption state in analog optical fiber gas sensing and detecting |
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| CN101915619B (en) | 2012-02-29 |
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Address after: Shenzhen City, Guangdong Province, Guangming New District 518000 000 Daiheng Guangming high tech Industrial Park, building fourth, building fifth, first floor Patentee after: Zhong An (Shenzhen) Co., Ltd. Address before: 518106, Guangdong Shenzhen Guangming New District Public Road (Shenzhen Village) security technology (China) Industrial Park 4 Patentee before: Shenzhen Haoen Safety Technology Co., Ltd. |
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Address after: 518000 fourth buildings and fifth first floor of Wan Dai Heng Guangming hi tech Industrial Park, Guangming New District, Shenzhen, Guangdong Patentee after: Shenzhen Haoen Safety Technology Co., Ltd. Address before: 518000 fourth buildings and fifth first floor of Wan Dai Heng Guangming hi tech Industrial Park, Guangming New District, Shenzhen, Guangdong Patentee before: Zhong An (Shenzhen) Co., Ltd. |