CN101907509A - Crystal oscillator oscillation test fixture - Google Patents

Crystal oscillator oscillation test fixture Download PDF

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Publication number
CN101907509A
CN101907509A CN 201010233955 CN201010233955A CN101907509A CN 101907509 A CN101907509 A CN 101907509A CN 201010233955 CN201010233955 CN 201010233955 CN 201010233955 A CN201010233955 A CN 201010233955A CN 101907509 A CN101907509 A CN 101907509A
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China
Prior art keywords
plate
crystal oscillator
location
test fixture
oscillation test
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Pending
Application number
CN 201010233955
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Chinese (zh)
Inventor
文胜云
肖攀
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Dfine Technology Co Ltd
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Dfine Technology Co Ltd
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Publication date
Application filed by Dfine Technology Co Ltd filed Critical Dfine Technology Co Ltd
Priority to CN 201010233955 priority Critical patent/CN101907509A/en
Publication of CN101907509A publication Critical patent/CN101907509A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a crystal oscillator oscillation test fixture, relates to the field of electronic communication, and aims to solve the current technical problems of extremely difficult oscillation test of crystal oscillators, low batch oscillation test efficiency, high cost and the like. The crystal oscillator oscillation test fixture consists of a positioning plate (1), a pressing plate (2), a base plate (3) and a connecting piece, wherein tested crystal oscillators (4) are arranged between the positioning plate (1) arranged on an upper part and the base plate (3) arranged on a lower part; the pressing plate (2) is arranged below the base plate (3); the positioning plate (1), the pressing plate (2) and the base plate (3) are fixedly connected by several groups of connecting pieces; each group of connecting piece consists of a screw (5) and a nut (6); the screw (5) passes through corresponding holes in the positioning plate (1), the pressing plate (2) and the base plate (3) to be connected with the nut (6) on the positioning plate (1); and the positioning plate (1) is provided with openings matched with an crystal oscillator pins (7) of the tested crystal oscillators (4). The fixture is suitable to be used in crystal oscillator oscillation tests.

Description

Crystal oscillator oscillation test fixture
Technical field
The present invention relates to electronic communication field, particularly a kind of crystal oscillator oscillation test fixture that is used for the crystal oscillator detection.
Background technology
Crystal oscillator (abbreviation crystal oscillator) kind is a lot, mostly is specialized factory and produces.Domestic production producer is few at present, and the crystal oscillator that electron trade is used mostly is import, therefore is worth expensive.At being worth expensive crystal oscillator, whether its quality satisfies product needed, need verify it.Many electronic products all will carry out vibration test, and can checking reliable and stable in transportation and production use.In working practice, the idle phenomenon of crystal oscillator after the product vibration test takes place in regular meeting.Product for complicated breaks down in case second-rate crystal oscillator is contained on the machine, and replacing is comparatively difficult.
At present, there be routine experiment chamber few of last scale in the enterprise that produces electronic product, and the product vibration table generally all is used for complete machine oscillation to be tested, and its anchor clamps all are to design voluntarily.General enterprise does not have the routine experiment chamber, and many tests all can only be carried out external coordination.One one carry out vibration test and will increase cost greatly, and external coordination producer also can not have suitable anchor clamps to use for enterprise.Independently will to carry out vibration test be very difficult to crystal oscillator, and reason is that it is very little, in light weight, do not have special-purpose anchor clamps to come clamping to operate, and has clamping device also can only clamping is several simultaneously to test.
At this problem, we are according to the size of shaking table, for save time, power saving, cost-saving, having designed can disposable vibration 30, safe and reliable crystal oscillator oscillation test fixture.
If but at present incompetent on market crystal oscillator is carried out the instrument of vibration experiment, and therefore can't before production, reject the fault crystal oscillator, also can't test it and can satisfy the product needed condition.
Summary of the invention
The present invention is intended to solve at present crystal oscillator is carried out vibration experiment very difficulty, low, the cost high-technology problem of vibration experiment efficient in batches, a kind of efficient height to be provided, once can to carry out tens of crystal oscillator vibration experiments, safe and reliable crystal oscillator oscillation test fixture.
The objective of the invention is to be achieved through the following technical solutions.
Crystal oscillator oscillation test fixture of the present invention is made of location-plate 1, pressing plate 2, backing plate 3 and web member, and tested crystal oscillator 4 is arranged between the location-plate 1 of being located at top and the backing plate 3 of being located at the bottom, and backing plate 3 belows are provided with pressing plate 2; Aforementioned location-plate 1, pressing plate 2, backing plate 3 are fixedly connected by the array web member, and every group of web member is made of screw 5 and nut 6, and screw 5 passes corresponding aperture on location-plate 1, pressing plate 2, the backing plate 3, is connected on location-plate 1 with nut 6; Location-plate 1 is provided with the perforate that matches with the crystal oscillator pin 7 of tested crystal oscillator 4.
Crystal oscillator oscillation test fixture of the present invention, wherein said tested crystal oscillator 4 is 30, be arranged between location-plate 1 and the backing plate 3 by horizontal 5, vertical 6 mode, every tested crystal oscillator 4 number of pins are 4, pass the corresponding aperture on the location-plate 1 respectively, the diameter in hole is than the big 0.2~0.4mm of leg diameter.
Crystal oscillator oscillation test fixture of the present invention, wherein said pressing plate 2 is a sheet metal, it is all identical with weight with location-plate 1 size.
Crystal oscillator oscillation test fixture of the present invention, wherein said backing plate 3 is the flexible material of electrostatic prevention.
Crystal oscillator oscillation test fixture of the present invention, wherein said web member are five groups, are located at four jiaos and center of location-plate 1 respectively.
Crystal oscillator oscillation test fixture of the present invention is provided with bullet pad and plain cushion between wherein said screw 5 and the pressing plate 2.
The beneficial effect of crystal oscillator oscillation test fixture of the present invention:
1. can disposablely carry out vibration experiment simultaneously to tens of crystal oscillators;
2. save time, power saving, cost-saving;
3. safe and reliable.
Description of drawings
Fig. 1 structure principle chart of the present invention
Fig. 2 location-plate synoptic diagram of the present invention
Fig. 3 pressing plate synoptic diagram of the present invention
Fig. 4 backing plate synoptic diagram of the present invention
The number in the figure explanation:
1 location-plate, 2 pressing plates, 3 backing plates, 4 tested crystal oscillators, 5 screws, 6 nuts, 7 crystal oscillator pins
Embodiment
Detailed structure of the present invention, application principle, effect and effect with reference to accompanying drawing 1-4, are illustrated by following embodiment.
Consult shown in Fig. 1-4, crystal oscillator oscillation test fixture of the present invention, constitute by location-plate 1, pressing plate 2, backing plate 3 and web member, 30 tested crystal oscillators 4 are arranged between the location-plate 1 of being located at top and the backing plate 3 of being located at the bottom by horizontal 5, vertical 6 mode, every tested crystal oscillator 4 number of pins are 4, pass the corresponding aperture on the location-plate 1 respectively.Backing plate 3 belows are provided with pressing plate 2; Aforementioned location-plate 1, pressing plate 2, backing plate 3 are fixedly connected by five groups of web members, web member is located at four jiaos and center of location-plate 1 respectively, every group of web member is made of screw 5 and nut 6, screw 5 passes corresponding aperture on location-plate 1, pressing plate 2, the backing plate 3, be connected on location-plate 1 with nut 6, be provided with bullet pad and plain cushion between screw 5 and the pressing plate 2; Location-plate 1 is provided with the perforate that matches with the crystal oscillator pin 7 of tested crystal oscillator 4.
The purpose of vibration is to observe tested crystal oscillator 4 inner structures, circuit and assembly quality, therefore according to the position of its structural design location pin, during vibration pin is penetrated in the location-plate 1 corresponding hole, and the diameter in hole is than the big 0.2~0.4mm of leg diameter.
Crystal oscillator pin 7 is positioned behind plate 1 location, for avoiding tested crystal oscillator 4 landings, promptly presses at tested crystal oscillator 4 backs and the location-plate 1 big or small metal platen 2 all identical with weight.
Crystal oscillator is a metal shell, and pressing plate 2 is a metal material also, and both combine closely, and vibrates to produce friction again, can cause the damage of crystal oscillator outward appearance or cause the crystal oscillator internal injury.Therefore select that certain thickness is arranged, certain elasticity and material (being backing plate 3) with anti-static effect be attached on the pressing plate.
Concrete implementation step of the present invention:
1. backing plate 3 is sticked on the pressing plate 2;
2. 30 tested crystal oscillator 4 corresponding pilot holes are contained on the location-plate 1;
3. push down the top of tested crystal oscillator 4 with pressing plate 2;
4. fix tested crystal oscillator 4 tight pressing plate 2, location-plate 1 with web member;
5. can directly go up shaking table after preliminary work is finished and carry out vibration test.
Checking by experiment, use crystal oscillator oscillation test fixture of the present invention to carry out vibration experiment after, the crystal oscillator that filters out no longer includes fault and occurs on product.Use anchor clamps of the present invention to avoid crystal oscillator is pursued the time of a vibration experiment, saved the experiment test cost greatly simultaneously, improved work efficiency.
Therefore, crystal oscillator oscillation test fixture of the present invention, have can be disposable to tens of crystal oscillators carry out simultaneously vibration experiment, save time, power saving, cost-saving and the plurality of advantages such as safe and reliable.

Claims (6)

1. crystal oscillator oscillation test fixture, it is characterized in that: constitute by location-plate (1), pressing plate (2), backing plate (3) and web member, tested crystal oscillator (4) is arranged between the location-plate (1) of being located at top and the backing plate (3) of being located at the bottom, and backing plate (3) below is provided with pressing plate (2); Aforementioned location-plate (1), pressing plate (2), backing plate (3) are fixedly connected by the array web member, every group of web member is made of screw (5) and nut (6), screw (5) passes upward corresponding aperture of location-plate (1), pressing plate (2), backing plate (3), is connected on location-plate (1) with nut (6); Location-plate (1) is provided with the perforate that matches with the crystal oscillator pin (7) of tested crystal oscillator (4).
2. crystal oscillator oscillation test fixture according to claim 1, it is characterized in that: described tested crystal oscillator (4) is 30, be arranged between location-plate (1) and the backing plate (3) by horizontal 5, vertical 6 mode, every tested crystal oscillator (4) number of pins is 4, pass the corresponding aperture on the location-plate (1) respectively, the diameter in hole is than the big 0.2~0.4mm of leg diameter.
3. crystal oscillator oscillation test fixture according to claim 1, it is characterized in that: described pressing plate (2) is a sheet metal, it is all identical with weight with location-plate (1) size.
4. crystal oscillator oscillation test fixture according to claim 1, it is characterized in that: described backing plate (3) is the flexible material of electrostatic prevention.
5. crystal oscillator oscillation test fixture according to claim 1, it is characterized in that: described web member is five groups, is located at four jiaos and center of location-plate (1) respectively.
6. crystal oscillator oscillation test fixture according to claim 1 is characterized in that: be provided with bullet pad and plain cushion between described screw (5) and the pressing plate (2).
CN 201010233955 2010-07-22 2010-07-22 Crystal oscillator oscillation test fixture Pending CN101907509A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201010233955 CN101907509A (en) 2010-07-22 2010-07-22 Crystal oscillator oscillation test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201010233955 CN101907509A (en) 2010-07-22 2010-07-22 Crystal oscillator oscillation test fixture

Publications (1)

Publication Number Publication Date
CN101907509A true CN101907509A (en) 2010-12-08

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CN 201010233955 Pending CN101907509A (en) 2010-07-22 2010-07-22 Crystal oscillator oscillation test fixture

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CN (1) CN101907509A (en)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102338687A (en) * 2011-08-03 2012-02-01 上海华碧检测技术有限公司 Vibration test auxiliary component and vibration test method using same
CN105269484A (en) * 2015-10-14 2016-01-27 华东光电集成器件研究所 Circuit mechanical shock test fixing device
CN105572429A (en) * 2015-12-22 2016-05-11 北京无线电计量测试研究所 Crystal oscillator fixing device and monitoring system
CN106383309A (en) * 2016-11-22 2017-02-08 天津航空机电有限公司 Endurance test clamp for thermostat relay
CN107121608A (en) * 2017-05-05 2017-09-01 航天恒星科技有限公司 Crystal oscillator testing device
CN108226673A (en) * 2017-12-18 2018-06-29 中国电子科技集团公司第四十七研究所 The test method of antistatic protection is carried out using antistatic nylon plate
WO2019080696A1 (en) * 2017-10-24 2019-05-02 Oppo广东移动通信有限公司 Mobile terminal
US10432763B2 (en) 2017-10-25 2019-10-01 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Ejection assembly, mobile terminal, and electronic device
US10498869B2 (en) 2017-10-24 2019-12-03 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Mobile terminal and electronic device
CN112027621A (en) * 2020-08-07 2020-12-04 北京无线电计量测试研究所 DIP14 crystal oscillator transfer clamp
CN112629790A (en) * 2020-12-29 2021-04-09 北京无线电计量测试研究所 Crystal oscillator vibration tool clamp

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5535637A (en) * 1994-11-14 1996-07-16 Screening Systems, Inc. Variable volume test chamber
US5594177A (en) * 1995-05-17 1997-01-14 Hanse; John K. Shaker table
US5744724A (en) * 1990-03-01 1998-04-28 Qualmark Corporation Random vibration generating table
US5969256A (en) * 1996-12-26 1999-10-19 Hobbs; Gregg K. Modular vibration system
JP2007155642A (en) * 2005-12-08 2007-06-21 Mitsubishi Electric Corp Fracture strength inspection device and method for sensor chip
CN201156008Y (en) * 2007-10-12 2008-11-26 英业达股份有限公司 Vibration test clamp

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5744724A (en) * 1990-03-01 1998-04-28 Qualmark Corporation Random vibration generating table
US5535637A (en) * 1994-11-14 1996-07-16 Screening Systems, Inc. Variable volume test chamber
US5594177A (en) * 1995-05-17 1997-01-14 Hanse; John K. Shaker table
US5969256A (en) * 1996-12-26 1999-10-19 Hobbs; Gregg K. Modular vibration system
JP2007155642A (en) * 2005-12-08 2007-06-21 Mitsubishi Electric Corp Fracture strength inspection device and method for sensor chip
CN201156008Y (en) * 2007-10-12 2008-11-26 英业达股份有限公司 Vibration test clamp

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102338687A (en) * 2011-08-03 2012-02-01 上海华碧检测技术有限公司 Vibration test auxiliary component and vibration test method using same
CN105269484A (en) * 2015-10-14 2016-01-27 华东光电集成器件研究所 Circuit mechanical shock test fixing device
CN105572429B (en) * 2015-12-22 2019-12-20 北京无线电计量测试研究所 Fixing device and monitoring system of crystal oscillator
CN105572429A (en) * 2015-12-22 2016-05-11 北京无线电计量测试研究所 Crystal oscillator fixing device and monitoring system
CN106383309A (en) * 2016-11-22 2017-02-08 天津航空机电有限公司 Endurance test clamp for thermostat relay
CN107121608A (en) * 2017-05-05 2017-09-01 航天恒星科技有限公司 Crystal oscillator testing device
WO2019080696A1 (en) * 2017-10-24 2019-05-02 Oppo广东移动通信有限公司 Mobile terminal
US10498869B2 (en) 2017-10-24 2019-12-03 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Mobile terminal and electronic device
US10432763B2 (en) 2017-10-25 2019-10-01 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Ejection assembly, mobile terminal, and electronic device
US10855820B2 (en) 2017-10-25 2020-12-01 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Ejection assembly and electronic device
CN108226673A (en) * 2017-12-18 2018-06-29 中国电子科技集团公司第四十七研究所 The test method of antistatic protection is carried out using antistatic nylon plate
CN112027621A (en) * 2020-08-07 2020-12-04 北京无线电计量测试研究所 DIP14 crystal oscillator transfer clamp
CN112629790A (en) * 2020-12-29 2021-04-09 北京无线电计量测试研究所 Crystal oscillator vibration tool clamp

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Open date: 20101208