CN101882036A - Positioning device of touch device and positioning method thereof - Google Patents
Positioning device of touch device and positioning method thereof Download PDFInfo
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- CN101882036A CN101882036A CN2009101363158A CN200910136315A CN101882036A CN 101882036 A CN101882036 A CN 101882036A CN 2009101363158 A CN2009101363158 A CN 2009101363158A CN 200910136315 A CN200910136315 A CN 200910136315A CN 101882036 A CN101882036 A CN 101882036A
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Abstract
The invention relates to a positioning device of a touch device and a positioning method thereof, wherein the touch device is provided with a plurality of scanning lines. The positioning method comprises the following steps of: firstly, sensing the capacitance values of the scanning lines; then selecting the sensed capacitance values of the ith scanning line and a scanning line subset adjacent to the ith scanning line; when the capacitance value of the ith scanning line is larger than that of the scanning line subset, judging that the capacitance value of the ith scanning line is a wave crest capacitance value; and finally calculating a touch position according to the wave crest capacitance value and the capacitance value of the scanning line subset.
Description
Technical field
The present invention relates to a kind of locating device and localization method thereof, relate in particular to a kind of devices and methods therefor that improves the accuracy of contactor control device location touch position.
Background technology
Along with making rapid progress of technology, most electronic installation, for example: electronic installations such as mobile computer, mobile phone or portable multimedia player, dispose contact panel, usually to replace the input interface of conventional keyboard as a new generation.Contact panel roughly can be divided into resistance-type, condenser type, infrared-type and ultrasonic formula etc., is modal product with electric resistance touch-control panel and capacitance type touch-control panel wherein.Capacitance type touch-control panel is by finger or conductive material is close or the touching contact panel, and the capacitance of contact panel is changed.When touch panel detection arrives capacitance variation, just can judge the position that finger or conductive material are close or touch, and carry out the pairing feature operation of touch position.Capacitance type touch-control panel has the characteristic that refers to touch-control more, and the operation of hommization ground can be provided, thereby is subjected to the favor in market gradually.
United States Patent (USP) bulletin case number No. 5825352 a kind of many abutment method for sensing of proposition, it adopts crest and trough in the capacitance variation curve to judge the position of being touched.In this patent case, in order the capacitance of two adjacent sensor institute sensings is compared earlier, and seek the position of crest or trough for rising or descending according to the trend of capacitance variation.Behind the sensor that has scanned (for example X-axis or Y-axis) on the single axial, just store crest value and the position thereof that is detected.If crest value is during greater than the critical reference value, just can judge that the position of this crest is touched.And, just can learn the touch position that refers on contact panel with the capacitance and the crest value computing in addition of adjacent peaks more.
Yet contact panel can have small noise to change because of environmental factor makes the capacitance of sensor institute sensing under situation about being touched.The judgement that above-mentioned handling procedure is touched for earlier detecting crest and trough again, so the caused by noise capacitance is regarded as crest probably and stores, and judges further more whether the position of crest is touch position.At this moment, the caused by noise capacitance is carried out computing not only waste system's calculation resources, also cause meaningless system's power consumption.And the computing method of in the past locating touch position are for to try to achieve centroid position according to the capacitance of sensor institute sensing, with as touch position.For a certain sensor, be positioned at sensor central authorities and be positioned under the situation on border in touch position, the capacitance of sensor institute sensing can be different, and this also influences the accuracy of the touch position of being calculated.
Summary of the invention
The invention provides a kind of locating device and localization method thereof of contactor control device, it can be not affected by noise and whether the detecting sweep trace is in the state of touching, to reduce the operand of touching on judging.In addition, calculate length value and calculate touch position according to this, to improve the accurate positioning of contactor control device according to the capacitance of sweep trace institute sensing.
The present invention proposes a kind of localization method of contactor control device, and wherein contactor control device has the multi-strip scanning line.At first, the capacitance on the described sweep trace of sensing.Then, choose the i sweep trace with and adjacent scanning line subset on the capacitance of institute's sensing.Capacitance on the i sweep trace judges then that greater than the capacitance of scanning line subset the capacitance on the i sweep trace is the crest capacitance.Capacitance according to crest capacitance and scanning line subset calculates touch position.
In an embodiment of the present invention, the step that above-mentioned capacitance according to crest capacitance and scanning line subset calculates touch position more comprises: according to the i+1 capacitance and the i-1 capacitance of crest capacitance and scanning line subset, calculate i length value, i+1 length value and i-1 length value respectively; When the i length value less than inferior length value with reference to the weighted value of coefficient the time, calculate first weight of i length value and time length value and as touch position, wherein time length value is the maximal value of i-1 length value and i+1 length value.
In an embodiment of the present invention, the step that above-mentioned capacitance according to crest capacitance and scanning line subset calculates touch position more comprises: when the i length value more than or equal to inferior length value with reference to the weighted value of coefficient the time, calculate second weight of i-1 length value, i length value and i+1 length value and as touch position.
The present invention proposes a kind of locating device of contactor control device in addition, and wherein contactor control device has a plurality of sensors.This locating device comprises multiplexer and processing unit.Multiplexer couples contactor control device, in order to choose the i sweep trace with and the capacitance of adjacent sensing that scanning line subset is distinguished.Processing unit comprises peak detctor and position detector.Peak detctor couples multiplexer.Peak detctor judges that in the capacitance of i sweep trace greater than scanning line subset institute sensing the capacitance of i sweep trace institute sensing is the crest capacitance.Position detector couples multiplexer and peak detctor.When the capacitance of i sweep trace institute sensing was the crest capacitance, position detector calculated touch position according to the capacitance of crest capacitance and scanning line subset.
In an embodiment of the present invention, above-mentioned position detector calculates i length value, i+1 length value and i-1 length value respectively according to the i+1 capacitance and the i-1 capacitance of crest capacitance and scanning line subset.When the i length value less than inferior length value with reference to the weighted value of coefficient the time, position detector calculates first weight of i length value and time length value and as touch position, wherein time length value is the maximal value of i-1 length value and i+1 length value.
In an embodiment of the present invention, when the i length value more than or equal to inferior length value with reference to the weighted value of coefficient the time, position detector calculates second weight of i-1 length value, i length value and i+1 length value and as touch position.
Above-mentioned localization method and locating device are relevant to the area of touch-control instrument in an embodiment of the present invention with reference to coefficient.
The present invention with the capacitance of sweep trace institute sensing with touch critical value and compare, whether be in the state of touching to judge sweep trace.Thus, can influence the unnecessary computing of locating by the caused capacitance of preventing noise, and the consumption that reduces system's calculation resources.In addition, when the capacitance of the sweep trace institute sensing that is in the state of touching was the crest capacitance, just the capacitance according to sweep trace and adjacent scanning line subset institute sensing thereof calculated a plurality of length values, and calculates position of touch according to this.Thus, can improve the accuracy of touch position location.
For above-mentioned feature and advantage of the present invention can be become apparent, embodiment cited below particularly, and conjunction with figs. is described in detail below.
Description of drawings
Fig. 1 is the synoptic diagram of a contactor control device 1 of one embodiment of the invention;
Fig. 2 is the synoptic diagram of the capacitance of 120 sensings of converting unit among embodiment of the invention Fig. 1;
Fig. 3 is the process flow diagram of localization method of the contactor control device of one embodiment of the invention;
Fig. 4 is the process flow diagram that calculates touch position among embodiment of the invention Fig. 3;
Fig. 5 is another process flow diagram that calculates touch position among embodiment of the invention Fig. 3;
Description of reference numerals
The 1-contactor control device; The 50-contact panel; 10,20-diamond shaped electrode;
The 100-locating device; The 110-multiplexer; The 120-converting unit;
The 130-processing unit; 131-touches detecting device; The 132-peak detctor;
The 133-position detector; 210～213-moving window; A, B-touch position;
C
TH-touch critical value; D (x, y)-coordinate;
The step of the localization method of the contactor control device of S301～S304-one embodiment of the invention;
The step of the calculating touch position of S401～S403, S501～S503-one embodiment of the invention.
Embodiment
Fig. 1 is the synoptic diagram of a contactor control device 1 of one embodiment of the invention.Please refer to Fig. 1, contactor control device 1 comprises a contact panel 50 and a location device 100.Contact panel 50 is a capacitance type touch-control panel, and it is on X-axis and Y-axis, and (inter leaved) carries out the configuration of diamond shaped electrode matrix in shaft staggered mode.Wherein, the electrode system on the X-axis on each sweep trace CIN0～CIN7 electrically conducts, and the electrode on each sweep trace CIN8～CIN15 also electrically conducts on the Y-axis.Locating device 100 comprises multiplexer 110, converter unit 120 and processing unit 130.
CIN0 → CIN1... → CIN7 → CIN8 → CIN9... → CIN15 → CIN0..., via detecting the coordinate that touch position is positioned at X-axis and Y-axis, just can two-dimensional coordinate location touch position.
Converting unit 120 is an analog-digital converter (analog to digital converter, ADC), can (capacitance to digital converter, CDC), it couples between multiplexer 110 and the processing unit 130 for an electric capacity digital quantizer.Converting unit 120 is converted to the capacitance of digital format in order to the capacitance with analog format, so that processing unit 130 interpretations and processing.
Processing unit is a microcontroller (micro-controller), and it comprises and touches detecting device 131, peak detctor 132 and position detector 133.Touch detecting device 131 and couple converting unit 120, its capacitance and one according to 120 sensings of converting unit touches the comparative result of critical value, the touch-control instrument that is changed to of judging capacitance touches (or approaching) contact panel 50 to be caused or is caused by noise, carries out unnecessary computing with the capacitance variation of avoiding noise is caused.Peak detctor 132 couples converting unit 120 and touches detecting device 131.When the touch-control instrument touches or during near contact panel 50, converting unit 120 can form the curve with Wave crest and wave trough at the capacitance of each sweep trace institute sensing.Present embodiment adopt a moving window choose the one scan line with and adjacent scanning line subset on the capacitance of institute's sensing, judge to carry out crest, moving window displacement one scan seriatim line wherein, when the capacitance of the sweep trace of choosing capacitance, then be judged as crest greater than its scanning line subset.
For instance, Fig. 2 is the synoptic diagram of the capacitance of 120 sensings of converting unit among embodiment of the invention Fig. 1.Please refer to Fig. 1 and Fig. 2, when touching contact panel 50 on touch position A shown in Figure 1 and B, the capacitance of sweep trace CIN0～CIN7 institute sensing is respectively capacitance C0～C7 shown in Figure 2 when the user utilizes touch-control instrument (for example finger, pointer etc.).With reference to moving window 210, at first choose the capacitance C1 of institute's sensing on the capacitance C0 of institute's sensing on the sweep trace CIN0 and the adjacent sweep trace CIN1 thereof.Because capacitance C0 is less than touching critical value C
TH, therefore touch detecting device 131 and judge that sense capacitance value C0 is not in the state of touching.This means that also touch position is not positioned at capacitance C0 corresponding scanning beam CIN0 position, locatees touch position so need not that capacitance C0 and C1 are carried out computing.Then, with moving window 210 displacement one scan to the right line, with the capacitance of institute's sensing on the capacitance C1 that chooses institute's sensing on the sweep trace CI N1 and the adjacent scanning line subset thereof, for example the capacitance C0 and the C2 of institute's sensing on adjacent sweep trace CIN0 in both sides and the CIN2.Because capacitance C1 is also less than touching critical value C
THSo, touch detecting device 131 and judge that sense capacitance value C1 also are not in the state of touching, need not that capacitance C0, C1 and C2 are carried out computing and locate touch position.
Next, moving window 211 is chosen the capacitance C1 and the C3 of institute's sensing on adjacent sweep trace CIN1 in the capacitance C2 of institute's sensing on the sweep trace CIN2 and both sides thereof and the CIN3.At this moment, capacitance C2 is greater than touching critical value C
TH, expression capacitance C2 is that contact tool touches or caused near contact panel 50, can be in the state of touching by judgement sense capacitance value C2 so touch detecting device 131.Then, peak detctor 132 can detect capacitance C2 and be higher than adjacent capacitance C1 and C3 according to capacitance C1～C3, and then judges that capacitance C2 is the crest capacitance.That is to say that touch position is approaching or is positioned on the capacitance C2 corresponding scanning beam coordinate.Similarly, be positioned at Y-axis coordinate on the sweep trace CIN10 via calculating touch position A, just can two-dimensional coordinate D (x y) locatees touch position A, and related operation is in the back explanation.
Choose the capacitance C2 and the C4 of institute's sensing on adjacent sweep trace CIN2 in the capacitance C3 of institute's sensing on the sweep trace CIN3 and both sides thereof and the CIN4 with reference to moving window 212.Though capacitance C3 corresponding scanning beam CIN3 can because of capacitance C3 greater than touching critical value C
THAnd be judged as the state of touching, but according to the comparative result between capacitance C2～C4, can learn that capacitance C3 is not the crest capacitance, this also represent touch position near but be not positioned on the capacitance C3 corresponding scanning beam coordinate, thereby capacitance C2～C4 is not carried out computing and locatees touch position.Then, choose under the situation of capacitance C3, C4 and C5 at moving window 212 displacement one scan to the right line, and moving window 212 displacement one scan more to the right line and choosing under the situation of capacitance C4, C5 and C6, because being not more than, capacitance C4 and C5 touch critical value C
THSo processing mode such as capacitance C0 and C1 are identical, need not carry out computing to the capacitance that is captured and locate touch position.
Then, choose the capacitance C5 and the C7 of institute's sensing on adjacent sweep trace CIN5 in the capacitance C6 of institute's sensing on the sweep trace CIN6 and both sides thereof and the CIN7 with reference to moving window 213.Because capacitance C6 is greater than touching critical value C
TH, and capacitance C6 is the crest capacitance greater than adjacent capacitance C5 and C7, thus position detector 133 judge touch position near or be positioned on the capacitance C6 corresponding scanning beam coordinate, related operation is in the back explanation.In the present embodiment,, and analyze whether the capacitance that is captured is the mode of crest capacitance, can exempt computing unnecessary when locating touch position, can reduce operand effectively via capacitance that is relatively captured and the mode of touching critical value.
According to above-mentioned explanation, can reduce following method flow at this.Fig. 3 is the process flow diagram of localization method of the contactor control device of one embodiment of the invention.Please refer to Fig. 3, the capacitance (step S301) on sensing i sweep trace and the scanning line subset adjacent at first with the i sweep trace, wherein scanning line subset comprises adjacent i-1 sweep trace and i+1 sweep trace.Then, according to the capacitance of institute's sensing on the i sweep trace and touch critical value, judge whether the i sweep trace is in the state of touching (step S302), and when the i sweep trace is in when touching state, according to the capacitance of above-mentioned institute sensing, judge whether the capacitance of institute's sensing on the i sweep trace is crest capacitance (step S303) further.The capacitance of institute's sensing is the crest capacitance on the i sweep trace, and then the capacitance according to institute's sensing calculates touch position (step S304).On the contrary, when the i sweep trace is not in the state of touching, perhaps when the capacitance of institute's sensing on the i sweep trace is not the crest capacitance, need not carries out computing to the capacitance that is captured and locate touch position.Below be described in detail the computing of location touching device.
Fig. 4 is the process flow diagram of the calculating touch position of embodiment of the invention Fig. 3.Generally speaking, capacitance is proportional to diamond shaped electrode and the capacity coupled area of touch-control instrument.Because the length information that corresponding a certain axial coordinate position is an one dimension but not the area information of two dimension, therefore the computing of in the past directly adopting capacitance to carry out center-of-mass coordinate is used as the mode of touch position, and often the touch position with reality has bigger error.Therefore, position detector 133 is according to the capacitance C of i sweep trace institute sensing
iAnd the capacitance C of scanning line subset institute sensing
I+1And C
I-1, calculate capacitance C
i, C
I+1And C
I-1Length value, and locate touch position according to this.For instance, length value can be the square root of the capacitance of institute's sensing on the sweep trace.
In addition, because the touch-control instrument touches the sweep trace quantity that the area effect sensing of contact panel 50 has capacitance variation, in order to improve the accuracy of location touch position, position detector 133 is more according to the reference factor alpha that is relevant to touch-control instrument area, to position the computing of touch position, wherein be inversely proportional to and greater than 1 with reference to the area of factor alpha and touch-control instrument.This can be according to circuit structure and design with reference to factor alpha and different, for pointer, can be 1.4 with reference to coefficient, and for the finger of touching area greater than pointer, can be 1.15 with reference to coefficient.
211 selected capacitance C1～C3 are example with moving window, and position detector 133 calculates the length value of capacitance C1～C3 respectively according to capacitance C2 and adjacent capacitance C1 and C3 thereof
And
Wherein capacitance C2 is the crest capacitance, and capacitance C 3 is inferior to capacitance C2, and promptly capacitance C2 is greater than capacitance C1.Then, position detector 133 is with length value
With by length value
Calculate the weighted value get with the reference factor alpha and compare (step S401), wherein shown in Fig. 4
Expression may be a length value inferior to the capacitance institute computing acquisition length value of crest capacitance
Or length value
Need decide on actual conditions.
Work as length value
Be greater than or equal to length value
During with the weighted value of reference factor alpha, the scope that expression contact panel 50 is touched may contain capacitance C2 and C3 corresponding scanning beam, so position detector 133 computational length values
And length value
Weight and W1 as touch position (step S402), wherein P
iExpression capacitance C
iCorresponding scanning beam is positioned at the location index of contactor control device.On the contrary, work as length value
Less than length value
With the weighted value of reference factor alpha, the scope that expression contact panel 50 is touched may contain capacitance C1～C3 corresponding scanning beam, so position detector 133 computational length values
And
Weight and W2 as touch position (step S403).
In addition, the weight that can be calculated by capacitance and as touch position below is proposed an embodiment value explanation again.Fig. 5 is another process flow diagram of the calculating touch position of embodiment of the invention Fig. 3.Please refer to Fig. 4 and Fig. 5, its difference is step S502 and S503.Work as length value
Be greater than or equal to length value
During with the weighted value of reference factor alpha, position detector 133 calculates the weight of capacitance C2 and C3 and W1 as touch position (step S502), wherein P
iExpression capacitance C
iCorresponding scanning beam is positioned at the location index of contactor control device.On the contrary, work as length value
Less than length value
With the weighted value of reference factor alpha, the weight of position detector 133 calculating capacitance C1, C2 and C3 and W2 are as touch position (step S503).
In sum, locating device of the foregoing description and localization method thereof can with the capacitance of sweep trace institute sensing with touch critical value and compare, whether be in the state of touching to judge sweep trace.In addition, when the capacitance of the sweep trace institute sensing that is in the state of touching is the crest critical value, just according to the capacitance of sweep trace and adjacent scanning line subset institute sensing thereof, calculate the length value of these capacitances, and calculate position of touch according to this, perhaps the capacitance according to sweep trace and adjacent scanning line subset institute sensing thereof calculates position of touch.
It should be noted that at last: above embodiment only in order to technical scheme of the present invention to be described, is not intended to limit; Although with reference to previous embodiment the present invention is had been described in detail, those of ordinary skill in the art is to be understood that: it still can be made amendment to the technical scheme that aforementioned each embodiment put down in writing, and perhaps part technical characterictic wherein is equal to replacement; And these modifications or replacement do not make the essence of appropriate technical solution break away from the spirit and scope of various embodiments of the present invention technical scheme.
Claims (25)
1. the localization method of a contactor control device is characterized in that, wherein said contactor control device has the multi-strip scanning line, and described localization method may further comprise the steps:
Capacitance on the described sweep trace of sensing;
An i sweep trace of choosing described sweep trace with and adjacent one scan line subclass on the capacitance of institute's sensing;
Capacitance on described i sweep trace judges then that greater than the capacitance of described scanning line subset the capacitance on the described i sweep trace is a crest capacitance; And
Capacitance according to described crest capacitance and described scanning line subset calculates a touch position.
2. localization method according to claim 1 is characterized in that, the capacitance of described crest capacitance of wherein said foundation and described scanning line subset calculates the step of described touch position, more comprises:
An i+1 capacitance and an i-1 capacitance according to described crest capacitance and described scanning line subset calculate an i length value, an i+1 length value and an i-1 length value respectively; And
When described i length value less than length value and during with reference to a weighted value of coefficient, calculate one first weight of described i length value and described length value and as described touch position, wherein said length value is the maximal value of described i-1 length value and described i+1 length value.
3. localization method according to claim 2 is characterized in that, the wherein said area that is relevant to a touch-control instrument with reference to coefficient.
4. according to claim 3 a described localization method, it is characterized in that, wherein said with reference to coefficient greater than 1, and described area with reference to coefficient and described touch-control instrument is inversely proportional to.
5. localization method according to claim 2 is characterized in that, wherein said first weight and
Wherein
Be described length value,
And
Be respectively described i-1 length value, described i length value and described i+1 length value, and P
I-1, P
iAnd P
I+1Be respectively described i-1 capacitance C
I-1, described crest capacitance C
iAnd described i+1 capacitance C
I+1Pairing described sweep trace is positioned at the location index of described contactor control device.
6. localization method according to claim 2 is characterized in that, the capacitance of described crest capacitance of wherein said foundation and described scanning line subset calculates the step of described touch position, more comprises:
When described i length value during, calculate one second weight of described i-1 length value, described i length value and described i+1 length value and as described touch position more than or equal to described length value and described described weighted value with reference to coefficient.
7. localization method according to claim 6 is characterized in that, wherein said second weight and
Wherein
And
Be respectively described i-1 length value, described i length value and described i+1 length value, and P
I-1, P
iAnd P
I+1Be respectively described i-1 capacitance C
I-1, described crest capacitance C
iAnd described i+1 capacitance C
I+1Pairing described sweep trace is positioned at the location index of described contactor control device.
8. localization method according to claim 1 is characterized in that, the wherein said described i sweep trace of choosing described sweep trace with and adjacent described scanning line subset on the step of capacitance of institute's sensing, more comprise:
The capacitance and one of the described i sweep trace of foundation institute sensing touches critical value, judges whether described i sweep trace is in the state of touching; And
When described i sweep trace is in the described state that touches, carry out the capacitance of described capacitance on described i sweep trace greater than described scanning line subset, judge that then the capacitance on the described i sweep trace is the step of described crest capacitance.
9. localization method according to claim 1 is characterized in that, the capacitance of described crest capacitance of wherein said foundation and described scanning line subset calculates the step of described touch position, more comprises:
An i-1 capacitance and an i+1 capacitance according to described crest capacitance and described scanning line subset calculate an i length value, an i-1 length value and an i+1 length value respectively; And
When described i length value less than length value and during with reference to a weighted value of coefficient, calculate one first weight of a described crest capacitance and a capacitance and as described touch position, wherein said length value is the maximal value of described i-1 length value and described i+1 length value, and described capacitance maximal value that is described i-1 capacitance and described i+1 capacitance.
10. localization method according to claim 9 is characterized in that, wherein said first weight and W1=(C
I ± 1* P
I ± 1+ C
i* P
i)/(C
I ± 1+ C
i), C wherein
I ± 1Be described capacitance, P
I-1, P
iAnd P
I+1Be respectively described i-1 capacitance C
I-1, described crest capacitance C
iAnd described i+1 capacitance C
I+1Pairing described sweep trace is positioned at the location index of described contactor control device.
11. localization method according to claim 9 is characterized in that, the capacitance of described crest capacitance of wherein said foundation and described scanning line subset calculates the step of described touch position, more comprises:
When described i length value during, calculate one second weight of described crest capacitance, described i capacitance and described i+1 capacitance and as described touch position more than or equal to described length value and described described weighted value with reference to coefficient.
12. localization method according to claim 11 is characterized in that, wherein said second weight and W2=(C
I-1* P
I-1+ C
i* P
i+ C
I+1* P
I+1)/(C
I-1+ C
i+ C
I+1), P wherein
I-1, P
iAnd P
I+1Be respectively described i-1 capacitance C
I-1, described crest capacitance C
iAnd described i+1 capacitance C
I+1Pairing described sweep trace is positioned at the location index of described contactor control device.
13. the locating device of a contactor control device is characterized in that, wherein said contactor control device has the multi-strip scanning line, comprising:
One multiplexer couples described contactor control device, in order to choose an i sweep trace in the described sweep trace with and the capacitance of adjacent one scan line sensing that subclass is distinguished; And
One processing unit comprises:
One peak detctor couples described multiplexer, and the capacitance on described i sweep trace is greater than the capacitance of described scanning line subset institute sensing, judges that the capacitance of described i sweep trace institute sensing is a crest capacitance; And
One position detector couples described multiplexer and described peak detctor, when the capacitance of described i sweep trace institute sensing is described crest capacitance, calculates a touch position according to the capacitance of described crest capacitance and described scanning line subset.
14. locating device according to claim 13, it is characterized in that, wherein said position detector is according to an i+1 capacitance and an i-1 capacitance of described crest capacitance and described scanning line subset, calculate an i length value respectively, an one i+1 length value and an i-1 length value, when described i length value during less than a length value and during with reference to a weighted value of coefficient, described position detector calculates one first weight of described i length value and described length value and as described touch position, wherein said length value is the maximal value of described i-1 length value and described i+1 length value.
15. locating device according to claim 14 is characterized in that, the wherein said area that is relevant to a touch-control instrument with reference to coefficient.
16. locating device according to claim 15 is characterized in that, wherein said with reference to coefficient greater than 1, and be inversely proportional to the area of described touch-control instrument.
17. locating device according to claim 14 is characterized in that, wherein said first weight
Wherein
Be described length value,
And
Be respectively described i-1 length value, described i+1 length value and described i length value, and P
I-1, P
I+1And P
iBe respectively described i-1 capacitance C
I-1, described i+1 capacitance C
I+1And described crest capacitance C
iPairing described sweep trace is positioned at the allocation index of described contactor control device.
18. locating device according to claim 14, it is characterized in that, wherein when described i length value during more than or equal to the described weighted value of described length value and described reference value, described position detector calculates one second weight of described i-1 length value, described i length value and described i+1 length value and as described touch position.
19. locating device according to claim 18 is characterized in that, wherein said second weight and
Wherein
And
Be respectively described i-1 length value, described i length value and described i+1 length value, P
I-1, P
iAnd P
I+1Be respectively i-1 capacitance C
I-1, crest capacitance C
iAnd i+1 capacitance C
I+1Pairing described sweep trace is positioned at the allocation index of described contactor control device.
20. locating device according to claim 13, it is characterized in that, wherein said processing unit more comprises and touches detecting device, it is coupled between described multiplexer and the described peak detctor, described capacitance and in order to the described i sweep trace of foundation institute sensing touches critical value, judge whether described i sweep trace is in the state of touching, and when described i sweep trace is in describedly when touching state, described peak detctor judges then whether the capacitance of described i sweep trace institute sensing is described crest capacitance.
21. locating device according to claim 13, it is characterized in that, wherein said position detector is according to an i+1 capacitance and an i-1 capacitance of described crest capacitance and described scanning line subset, calculate an i length value respectively, an one i+1 length value and an i-1 length value, when described i length value during less than a length value and during with reference to a weighted value of coefficient, described position detector calculates one first weight of a described crest capacitance and a capacitance and as described touch position, wherein said length value is the maximal value of described i-1 length value and described i+1 length value, and described capacitance maximal value that is described i-1 capacitance and described i+1 capacitance.
22. locating device according to claim 21 is characterized in that, wherein said first weight and W1=(C
I ± 1* P
I ± 1+ C
i* P
i)/(C
I ± 1+ C
i), C wherein
I ± 1Be described capacitance, P
I-1, P
iAnd P
I+1Be respectively described i-1 capacitance C
I-1, described crest capacitance C
iAnd described i+1 capacitance C
I+1Pairing described sweep trace is positioned at the location index of described contactor control device.
23. according to claim 21 a described locating device, it is characterized in that, wherein when described i length value during more than or equal to the described weighted value of described length value and described reference value, described position detector calculates one second weight of described i-1 capacitance, described crest capacitance and described i+1 capacitance and as described touch position.
24. locating device according to claim 23 is characterized in that, wherein said second weight and W2=(C
I-1* P
I-1+ C
i* P
i+ C
I+1* P
I+1)/(C
I-1+ C
i+ C
I+1), P wherein
I-1, P
iAnd P
I+1Be respectively described i-1 capacitance C
I-1, described crest capacitance C
iAnd described i+1 capacitance C
I+1Pairing described sweep trace is positioned at the location index of described contactor control device.
25. locating device according to claim 13 is characterized in that, more comprises:
One converting unit is coupled between described multiplexer and the described processing unit, is converted to the described capacitance with a digital format in order to the described capacitance that will have an analog format.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101363158A CN101882036B (en) | 2009-05-07 | 2009-05-07 | Positioning device of touch device and positioning method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101363158A CN101882036B (en) | 2009-05-07 | 2009-05-07 | Positioning device of touch device and positioning method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101882036A true CN101882036A (en) | 2010-11-10 |
| CN101882036B CN101882036B (en) | 2012-08-22 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105739733A (en) * | 2014-12-01 | 2016-07-06 | 义隆电子股份有限公司 | Contact information acquisition method and touch module |
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| CN101359906B (en) * | 2007-07-31 | 2010-11-03 | 义隆电子股份有限公司 | Article locating detector of capacitance touching control panel, and article locating method |
| CN101393501B (en) * | 2007-09-17 | 2010-06-09 | 禾瑞亚科技股份有限公司 | Apparatus and method for judging contact position on touch control screen of capacitance touching control panel |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105739733A (en) * | 2014-12-01 | 2016-07-06 | 义隆电子股份有限公司 | Contact information acquisition method and touch module |
| CN105739733B (en) * | 2014-12-01 | 2019-04-12 | 义隆电子股份有限公司 | Contact information acquisition method and touch module |
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| CN101882036B (en) | 2012-08-22 |
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