CN101826289B - Testing apparatus - Google Patents

Testing apparatus Download PDF

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Publication number
CN101826289B
CN101826289B CN2010101776100A CN201010177610A CN101826289B CN 101826289 B CN101826289 B CN 101826289B CN 2010101776100 A CN2010101776100 A CN 2010101776100A CN 201010177610 A CN201010177610 A CN 201010177610A CN 101826289 B CN101826289 B CN 101826289B
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CN
China
Prior art keywords
probe card
switch piece
backlight module
state
probe
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2010101776100A
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Chinese (zh)
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CN101826289A (en
Inventor
叶建荣
许汉忠
洪彬哲
梁嘉杉
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AU Optronics Corp
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AU Optronics Corp
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Priority to CN2010101776100A priority Critical patent/CN101826289B/en
Publication of CN101826289A publication Critical patent/CN101826289A/en
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Publication of CN101826289B publication Critical patent/CN101826289B/en
Expired - Fee Related legal-status Critical Current
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Abstract

The embodiment of the invention provides a testing apparatus which comprises a backlight module, a carrying plate, a switching element, at least one probe mechanism and a control unit, wherein the carrying plate is configured on the backlight module, and the switching element is configured on the carrying plate; the carrying plate is provided with an opening, and the backlight module emits light from the opening to provide a surface light source; each probe mechanism comprises a probe plate; and the probe plate is connected with the carrying plate and is suitable for moving between the original position and the testing position. When the probe plate is located in the original position, the switching element is in a first state. When the probe plate is located in the testing position, the probe plate switches the switching element to the second state. The control unit is electrically connected to the backlight module, the switching element and the probe plate and is suitable for controlling the luminous brightness of the backlight module according to the state of the switching element. By the embodiment of the invention, the eyes of testers can be protected.

Description

Proving installation
Technical field
The present invention is about a kind of proving installation (TESTING APPARATUS), and particularly about a kind of proving installation that is used to test display panel.
Background technology
After display panel completed, the tester needed to carry out testing electrical property and visual detection to display panel, whether can normal operation to detect display panel, and whether the inspection display panel has flaw when showing.
Fig. 1 is the synoptic diagram of existing a kind of proving installation.Please with reference to Fig. 1, existing proving installation 100 comprises loading plate 110 and probe card 120, and wherein probe card 120 sees through pivot 130 and is articulated in loading plate 110.Probe card 120 can start or cover, and is in the state that covers and Fig. 1 illustrates probe card 120.In addition, loading plate 110 has in order to put the putting groove 112 of display panel 50.Probe card 120 has the probe 122 in order to test display panel 50, and the perforate 124 that exposes display panel 50.In addition, existing proving installation 100 also comprises the backlight module 140 that is disposed at loading plate 110 belows, and the bottom of putting groove 112 is provided with perforate 114, to expose backlight module 140.Backlight module 140 is in order to provide area source 142 to display panel 50.
The method of testing of existing proving installation 100 is to start probe card 120 earlier, so that display panel 50 is put to putting groove 112.Afterwards, cover probe card 120 again,, and then display panel 50 is carried out testing electrical property and visual detection so that the probe 122 of probe card 120 contacts the measurement circuit 52 of display panels 50.In test process, backlight module 140 sends the area source 142 of high brightness, carries out visual detection in order to the tester.Yet when changing display panel 50, backlight module 140 also continues to send the area source 142 of same brightness.So when taking off display panel 50, the area source 142 of high brightness directly is passed to eyes of testers via perforate 114,124 easily, causes the eyes of testers easy fatigue, even eyes of testers is damaged.In addition, when the tester changes display panel 50 under the situation of eye fatigue, the situation that display panel 50 collides other object taking place easily, causes display panel 50 impaired.
Summary of the invention
The present invention provides a kind of proving installation, with the protection eyes of testers.
For reaching above-mentioned advantage, the present invention proposes a kind of proving installation, and this proving installation comprises backlight module, loading plate, switch piece, at least one probe mechanism and control module.Loading plate is disposed at the backlight module top, and switch piece is disposed on the loading plate.Loading plate has perforate, and backlight module provides area source from the perforate bright dipping.Probe mechanism comprises probe card.Probe card is connected with loading plate, and is suitable between original position and test position, moving, and wherein when probe card was positioned at the original position, switch piece was in first state, and when probe card was positioned at test position, probe card switched to second state with switch piece.Control module is electrically connected to backlight module, switch piece and probe card, and control module is suitable for the luminosity according to the State Control backlight module of switch piece.
In one embodiment of this invention, when probe card was in test position, probe card compression switch piece was to switch to switch piece second state.When probe card was in the original position, switch piece returned first state.
In one embodiment of this invention, above-mentioned switch piece is a microswitch.
In one embodiment of this invention, above-mentioned backlight module comprises at least one light emitting diode.
In one embodiment of this invention, above-mentioned loading plate also has putting groove, and perforate is positioned at the putting groove bottom.
In one embodiment of this invention, when switch piece is in first state, the luminosity the when luminosity of backlight module is lower than switch piece and is in second state.
In one embodiment of this invention, when switch piece was in first state, the luminosity of backlight module was between 1100 candle lights (candela)/square metre (hereinafter to be referred as cd/m 2) to 1300cd/m 2When switch piece was in second state, the luminosity of backlight module was between 5900cd/m 2To 6100cd/m 2
In one embodiment of this invention, above-mentioned probe mechanism also comprises pedestal, and probe card is fixed in pedestal movably.
In one embodiment of this invention, above-mentioned pedestal is connected in the edge of loading plate.
In one embodiment of this invention, above-mentioned probe mechanism also comprises application of force assembly.This application of force assembly is mounted slidably in pedestal, and the linking probe plate.
In one embodiment of this invention, above-mentioned probe card is articulated in loading plate.
The beneficial effect of the embodiment of the invention is that in proving installation of the present invention, probe card can be used to switch the state of switch piece, and control module can be controlled the luminosity of backlight module according to the state of switch piece.So proving installation of the present invention can reduce the luminosity of backlight module when changing display panel, with the protection eyes of testers.
For let above and other objects of the present invention, feature and advantage can be more obviously understandable, hereinafter is special lifts preferred embodiment, and conjunction with figs., elaborates as follows.
Description of drawings
Fig. 1 is the synoptic diagram of existing a kind of proving installation.
Fig. 2 A and Fig. 2 B are the partial schematic diagram of a kind of proving installation of one embodiment of the invention when being in different conditions.
Fig. 3 A and Fig. 3 B are the partial schematic diagram of a kind of proving installation of another embodiment of the present invention when being in different conditions.
[primary clustering symbol description]
50: display panel
52: measurement circuit
100,200,300: proving installation
110,220,320: loading plate
112,224,324: putting groove
114,124,222,322,345: perforate
120,242,342: probe card
122,241,343: probe
130,344: pivot
140,210,310: backlight module
142: area source
212,312: exiting surface
230,330: switch piece
240,340: probe mechanism
243: break difference structure
244: pedestal
246: application of force assembly
247: the pushing part
D1: horizontal direction
D2: vertical direction
Embodiment
Fig. 2 A and Fig. 2 B are the partial schematic diagram of a kind of proving installation of one embodiment of the invention when being in different conditions.Please earlier with reference to Fig. 2 A, the proving installation 200 of present embodiment comprises backlight module 210, loading plate 220, switch piece 230, at least one probe mechanism 240 (present embodiment is an example with) and control module (not shown).Loading plate 220 is disposed at backlight module 210 tops, and switch piece 230 is disposed on the loading plate 220.Loading plate 220 has perforate 222, and this perforate 222 exposes the exiting surface 212 of backlight module 210.Backlight module 210 provides area source from perforate 222 bright dippings.Loading plate 220 can also have putting groove 224, and perforate 222 for example is to be positioned at putting groove 224 bottoms.In addition, probe mechanism 240 comprises probe card 242.Probe card 242 is connected with loading plate 220, and is suitable between original position (shown in Fig. 2 A) and test position (shown in Fig. 2 B), moving.When probe card 242 was positioned at the original position, switch piece 230 was in first state, and when probe card 242 was positioned at test position, probe card 242 switched to second state with switch piece 230.Control module is electrically connected to backlight module 210, switch piece 230 and probe card 242, and control module is suitable for the luminosity according to the State Control backlight module 210 of switch piece 230.
In more detail, the probe mechanism 240 of present embodiment for example also comprises pedestal 244 and application of force assembly 246.Pedestal 244 for example is the edge that is connected in loading plate 220, and probe card 242 is fixed in pedestal 244 movably, and application of force assembly 246 is mounted slidably in pedestal 244, and linking probe plate 242.That is probe card 242 sees through pedestal 244 and is connected with loading plate 220.
Shown in Fig. 2 A, when testing, the tester can force in application of force assembly 246, and application of force assembly 246 is moved horizontally along direction D1, moves horizontally one section predeterminable range to promote probe card 242 from the original position along direction D1.Shown in Fig. 2 B; Because probe card 242 has break difference structure 243; After probe card 242 has moved above-mentioned predeterminable range; The pushing part 247 of continuing the application of force assembly 246 of along continuous straight runs D1 can move to the upper strata of break difference structure 243 along break difference structure 243, moves down a segment distance and arrives at test position from D2 vertically to promote probe card 242.At this moment, the probe 241 of probe card 242 can electrically connect with display panel to be tested, and the test signal that control module provided can be passed to display panel via probe 241.
Holding above-mentioned, above-mentioned switch piece 230 for example is microswitch, and when probe card 242 was pressed down to test position, probe card 242 compression switch pieces 230 were to switch to second state with switch piece 230.In addition; When the tester promotes application of force assembly 246 along the direction in contrast to horizontal direction D1; The pushing part 247 of application of force assembly 246 can move to the lower floor of break difference structure 243 along break difference structure 243, so that probe card 242 is retracted the original position, and then makes switch piece 230 return first state.In the present embodiment, probe card 242 can be retracted the original position through the elastic restoring force of spring.That is to say that probe mechanism 240 can also comprise the spring (not shown), when probe card 242 moved to test position, the pushing part 247 of application of force assembly 246 propped up probe card 242, so probe card 242 can compression spring.When the tester made pushing part 247 move to the lower floor of break difference structure 243 along the direction promotion application of force assembly 246 in contrast to horizontal direction D1, the elastic restoring force of spring can be ordered about probe card 242 and retracted the original position.
When switch piece 230 is in first state, represent probe card 242 to be positioned at the original position, so the tester can change the action of display panel under this state.When switch piece 230 is in second state, represent probe card 242 to be positioned at test position, so the tester can carry out the action of testing electrical property and visual detection under this state.The influence that when changing display panel, receives high light for fear of the tester causes the eyes easy fatigue or suffers damage; When switch piece 230 is in first state, the luminosity the when luminosity of control module controlling back light module 210 is lower than switch piece 230 and is in second state.For instance, when switch piece 230 was in second state, the luminosity of backlight module 210 for example was between 5900cd/m 2To 6100cd/m 2, and when switch piece 230 is in first state, the luminosity of backlight module 210 is for example turned down between 1100cd/m 2To 1300cd/m 2Like this, can avoid tester's the influence that when changing display panel, receives high light to cause eye fatigue or suffer damage, and then reach the effect of protection eyes of testers.On the other hand, the low-brightness light source of backlight module can supply tester's surround lighting when changing sheet during first state, and it is tired to reduce eyes of testers, and the probability that makes the tester when changing display panel, collide display panel reduces.
What deserves to be mentioned is that because present embodiment is to utilize probe card 242 to switch the state of switch piece 230, the tester does not need to carry out in addition the state that change action switches switch piece 230, so can save time.In addition, in order to adjust the luminosity of backlight module 210 rapidly, can use the light emitting source of light emitting diode as backlight module 210.In addition, in one embodiment, when switch piece 230 was in first state, the luminosity of backlight module 210 can be turned down to zero, that is when switch piece 230 is in first state, closes backlight module 210.
Fig. 3 A and Fig. 3 B are the partial schematic diagram of a kind of proving installation of another embodiment of the present invention when being in different conditions.Please earlier with reference to Fig. 3 A, the proving installation 300 of present embodiment comprises backlight module 310, loading plate 320, switch piece 330, at least one probe mechanism 340 (present embodiment is an example with) and control module (not shown).Loading plate 320 is disposed at backlight module 310 tops, and switch piece 330 is disposed on the loading plate 320.Loading plate 320 has perforate 322, and this perforate 322 exposes the exiting surface 312 of backlight module 310.Loading plate 320 can also have putting groove 324, and perforate 322 for example is to be positioned at putting groove 324 bottoms.In addition, probe mechanism 340 comprises probe card 342.Probe card 342 is positioned at loading plate 320 tops, and is articulated in loading plate 320 through pivot 344.Probe card 342 has can be in order to the probe 343 of test display panel, and the perforate 345 that can expose display panel.
In the present embodiment, probe card 342 is suitable between original position (shown in Fig. 3 A) and test position (shown in Fig. 3 B), moving.When probe card 342 is positioned at the original position (when starting probe card 342), switch piece 330 is in not compressed first state.When probe card 342 is positioned at test position (when covering probe card 342), probe card 342 compression switch pieces 330 are to switch to second state with switch piece 330.This switch piece 330 for example is a microswitch.Control module is electrically connected to backlight module 310, switch piece 330 and probe card 342, and control module is suitable for the luminosity according to the State Control backlight module 310 of switch piece 330.
Mode relevant for the luminosity of control module control backlight module 310 is similar to the aforementioned embodiment, will no longer repeat at this.In addition, the advantage of the proving installation 300 of present embodiment is similar with above-mentioned proving installation 200, also no longer repeats at this.
Though the present invention discloses as above with preferred embodiment; Right its is not in order to limit the present invention; Has common knowledge the knowledgeable in the technical field under the present invention; Do not breaking away from the spirit and scope of the present invention, when can doing a little change and retouching, so protection scope of the present invention is as the criterion when looking the claim person of defining.

Claims (9)

1. a proving installation is characterized in that, said proving installation comprises:
One backlight module;
One loading plate is disposed at said backlight module top, and said loading plate has a perforate, and the light of said backlight module provides an area source from said perforate bright dipping;
One switch piece is disposed on the said loading plate;
At least one probe mechanism, said probe mechanism comprises:
One probe card; Be connected with said loading plate; Said probe card is suitable between an original position and a test position, moving, and wherein when said probe card was positioned at said original position, said switch piece was in one first state; When said probe card was positioned at said test position, said probe card switched to one second state with said switch piece; And
One control module; Be electrically connected to said backlight module, said switch piece and said probe card; Said control module is suitable for the luminosity according to the said backlight module of State Control of switch piece; And when said switch piece is in said first state, the luminosity the when luminosity of said backlight module is lower than said switch piece and is in said second state.
2. proving installation as claimed in claim 1; It is characterized in that; When said probe card was in said test position, said probe card compressed said switch piece, said switch piece is switched to said second state; When said probe card was in said original position, said switch piece returned said first state.
3. proving installation as claimed in claim 1 is characterized in that, when said switch piece was in said first state, the luminosity of said backlight module was between 1100cd/m 2To 1300cd/m 2, when said switch piece was in said second state, the luminosity of said backlight module was between 5900cd/m 2To 6100cd/m 2
4. proving installation as claimed in claim 1 is characterized in that, said switch piece is a microswitch.
5. proving installation as claimed in claim 1 is characterized in that said loading plate also has a putting groove, and said perforate is positioned at said putting groove bottom.
6. proving installation as claimed in claim 1 is characterized in that said probe mechanism also comprises a pedestal, and probe card is fixed in said pedestal movably.
7. proving installation as claimed in claim 6 is characterized in that said pedestal is connected in the edge of said loading plate.
8. proving installation as claimed in claim 7 is characterized in that, said probe mechanism also comprises an application of force assembly, is mounted slidably in said pedestal, and connects said probe card.
9. proving installation as claimed in claim 1 is characterized in that said probe card is articulated in said loading plate.
CN2010101776100A 2010-05-11 2010-05-11 Testing apparatus Expired - Fee Related CN101826289B (en)

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Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
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CN101826289B true CN101826289B (en) 2012-06-27

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CN106840605A (en) * 2017-01-17 2017-06-13 武汉华星光电技术有限公司 Detection means and monitor station

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DE69435333D1 (en) * 1993-04-21 2011-03-24 Omron Tateisi Electronics Co DEVICE FOR VISUAL CHECKING OF PLATINES AND THEIR USE FOR CONTROLLING AND CORRECTING SOLUTIONS
JP2006058170A (en) * 2004-08-20 2006-03-02 Dainippon Screen Mfg Co Ltd Visual confirmation device and inspection system
JP2007248292A (en) * 2006-03-16 2007-09-27 Olympus Corp Visual inspection device
JP2008051781A (en) * 2006-08-28 2008-03-06 I-Pulse Co Ltd Visual examination method of substrate and visual examination device of substrate

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Granted publication date: 20120627

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