CN101800287B - Manufacturing method of organic field effect transistor with plane structure - Google Patents

Manufacturing method of organic field effect transistor with plane structure Download PDF

Info

Publication number
CN101800287B
CN101800287B CN2009100776793A CN200910077679A CN101800287B CN 101800287 B CN101800287 B CN 101800287B CN 2009100776793 A CN2009100776793 A CN 2009100776793A CN 200910077679 A CN200910077679 A CN 200910077679A CN 101800287 B CN101800287 B CN 101800287B
Authority
CN
China
Prior art keywords
field effect
effect transistor
plane structure
organic field
organic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN2009100776793A
Other languages
Chinese (zh)
Other versions
CN101800287A (en
Inventor
刘舸
刘明
刘兴华
商立伟
王宏
柳江
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of Microelectronics of CAS
Original Assignee
Institute of Microelectronics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of Microelectronics of CAS filed Critical Institute of Microelectronics of CAS
Priority to CN2009100776793A priority Critical patent/CN101800287B/en
Publication of CN101800287A publication Critical patent/CN101800287A/en
Application granted granted Critical
Publication of CN101800287B publication Critical patent/CN101800287B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Thin Film Transistor (AREA)

Abstract

The invention discloses a manufacturing method of an organic field effect transistor with a plane structure, comprising the following steps: 1. coating photoresist on the surface of an insulated substrate; 2. Carrying out photoetching on the insulated substrate coated with the photoresist to obtain a gate dielectric graph; 3. growing a layer of gate dielectric film on the gate dielectric graph; 4. stripping to obtain the gate dielectric graph, then carrying out photoetching to obtain a resource electrode graph, a drain electrode graph and the gate dielectric graph; 5. stripping an electronic beam evaporation source, drain electrode metal and grating electrode meta to obtain an electrode graph; and 6. carrying out evaporation coating on an organic semiconductor material to finish manufacturing the device. The organic field effect transistor with the plane structure, which is obtained by utilizing the invention, reduces the process flow and improves the integration level of the device.

Description

A kind of manufacture method of organic field effect transistor with plane structure
Technical field
The present invention relates to the manufacture method in Micrometer-Nanometer Processing Technology field, particularly a kind of organic field effect transistor with plane structure in organic semiconductor.
Background technology
Along with deepening continuously of information technology, electronic product has entered each link of people's life and work; People are increasing to the demand of low cost, flexibility, low weight, portable electronic product in daily life.
Traditional device and circuit based on inorganic semiconductor material are difficult to satisfy these requirements, and the organic microelectric technique based on the organic polymer semi-conducting material that therefore can realize these characteristics has obtained people and more and more paid close attention under this trend.
The performance that improves organic field-effect tube is the target that pursue in this field always.Meanwhile, for organic field effect tube potential application in circuit, the integrated level that how to improve it also is a problem demanding prompt solution.
Because organic material has the higher Fermi level of lower mobility, makes it face some obstacles aspect device miniaturization.Because the fragility of organic semiconducting materials, complicated technological process can cause very big injury to device performance.
Therefore, how to realize under simple technical flow that the high integrated level of organic field effect tube is a very challenging job.But the current solution that does not have maturation in this respect.
Summary of the invention
(1) technical problem that will solve
In view of this, main purpose of the present invention is to provide a kind of manufacture method of organic field effect transistor with plane structure, to improve the integrated level of organic field effect tube.
(2) technical scheme
For achieving the above object, the invention provides a kind of manufacture method of organic field effect transistor with plane structure, this method comprises:
Step 1, coat photoresist on the dielectric base surface;
Step 2, the dielectric base of resist coating is carried out photoetching, obtain the gate medium figure;
Step 3, one deck gate dielectric membrane of on the gate medium figure, growing;
Step 4, peel off and obtain the gate medium figure, carry out photoetching once more and obtain source electrode pattern, drain electrode figure and gate electrode figure;
The electrode metal of step 5, electron beam evaporation source, leakage and grid is peeled off and is obtained electrode pattern;
Step 6, evaporation organic semiconducting materials are finished the making of device.
In the such scheme, dielectric base described in the step 1 is inorganic oxide or organic insulalive plastic.
In the such scheme, the gate dielectric membrane described in the step 3 obtains by electron beam evaporation.
In the such scheme, the electrode metal described in the step 5 is a gold.
In the such scheme, organic semiconducting materials described in the step 6 is the obtaining of method of adopting vacuum evaporation.
In the such scheme, organic semiconducting materials described in the step 6 is to adopt pentacene.
(3) beneficial effect
Characteristics of the present invention are to adopt device architecture to adopt planar structure, the parallel in the horizontal direction substrate surface that is distributed in of its gate electrode, gate medium, source-drain electrode.Entire device only needs Twi-lithography, and the interconnection between the device can directly realize by lead at substrate surface, and needn't consider traditional via hole technology.In addition, the organic field effect transistor with plane structure that utilizes the present invention to obtain has reduced the integrated level of the device that technological process improves.
Description of drawings
In order to illustrate further content of the present invention, below in conjunction with drawings and Examples, the present invention is done detailed description,
Fig. 1 is the method flow diagram of making organic field effect transistor with plane structure provided by the invention;
Fig. 2-1 is to Fig. 2-the 7th, the process chart of making organic field effect transistor with plane structure provided by the invention;
Fig. 3-1 is to Fig. 3-the 7th, the process chart of the making organic field effect transistor with plane structure that provides according to the embodiment of the invention.
Embodiment
For making the purpose, technical solutions and advantages of the present invention clearer, below in conjunction with specific embodiment, and with reference to accompanying drawing, the present invention is described in more detail.
The invention provides a kind of method of making organic field effect transistor with plane structure, the organic field effect transistor with plane structure that utilizes the present invention to make has been overturned traditional mos pipe layer structure.This structure with the source-drain electrode gate medium of device and gate electrode horizontal distribution to substrate.Interconnection between the device can be very easily directly needn't be considered the problem by gate medium by wire interconnects on substrate like this.And, because new construction is perpendicular to distributing on the substrate plane raceway groove of device, thereby can come the control device channel width by the thickness of dielectric layers of growth so that the size of control device easily.
As shown in Figure 1, Fig. 1 is the method flow diagram of making organic field effect transistor with plane structure provided by the invention, and this method comprises:
Step 1, coat photoresist on the dielectric base surface; Dielectric base is inorganic oxide or organic insulalive plastic.
Step 2, the dielectric base of resist coating is carried out photoetching, obtain the gate medium figure;
Step 3, one deck gate dielectric membrane of on the gate medium figure, growing; Gate dielectric membrane obtains by electron beam evaporation.
Step 4, peel off and obtain the gate medium figure, carry out photoetching once more and obtain source electrode pattern, drain electrode figure and gate electrode figure;
The electrode metal of step 5, electron beam evaporation source, leakage and grid is peeled off and is obtained electrode pattern; Electrode metal is a gold.
Step 6, evaporation organic semiconducting materials are finished the making of device; Organic semiconducting materials is the obtaining of method of adopting vacuum evaporation, employing be pentacene.
Fig. 2-1 specifically comprises to the process chart that Fig. 2-7 shows making organic field effect transistor with plane structure provided by the invention:
Shown in Fig. 2-1, coat photoresist on the dielectric surface.
Shown in Fig. 2-2, photoetching obtains device gate medium figure.
Shown in Fig. 2-3, by peeling off behind electron beam evaporation regrowth one deck gate dielectric membrane.
Shown in Fig. 2-4, obtaining behind the gate medium figure once more, photoetching obtains device source drain electrode and gate electrode figure.
Shown in Fig. 2-5, electron beam evaporation source-drain electrode and gate electrode are peeled off and are obtained electrode pattern.
Shown in Fig. 2-6, the vacuum evaporation organic semiconducting materials is finished the making of device.
Fig. 3-1 specifically comprises to the process chart that the making organic field effect transistor with plane structure that provides according to the embodiment of the invention is provided Fig. 3-7:
Shown in Fig. 3-1, coat photoresist AZ9918 on the dielectric surface.
Shown in Fig. 3-2, photoetching obtains device gate medium figure.
Shown in Fig. 3-3, by peeling off behind electron beam evaporation regrowth one deck gate silicon oxide dielectric film.
As shown in Figure 3-4, obtaining behind the gate medium figure once more, photoetching obtains device source drain electrode and gate electrode figure.
Shown in Fig. 3-5, electron beam evaporation one deck gold thin film forms device source drain electrode and gate electrode, peels off and obtains electrode pattern.
Shown in Fig. 3-6, vacuum evaporation organic semiconducting materials pentacene is finished the making of device.
Fig. 3-the 7th, the perspective view of the organic field effect transistor with plane structure of making.
Above-described specific embodiment; purpose of the present invention, technical scheme and beneficial effect are further described; institute is understood that; the above only is specific embodiments of the invention; be not limited to the present invention; within the spirit and principles in the present invention all, any modification of being made, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.

Claims (6)

1. the manufacture method of an organic field effect transistor with plane structure is characterized in that, this method comprises:
Step 1, coat photoresist on the dielectric base surface;
Step 2, the dielectric base of resist coating is carried out photoetching, obtain the gate medium figure;
Step 3, one deck gate dielectric membrane of on the gate medium figure, growing;
Step 4, peel off this gate dielectric membrane and obtain the gate medium figure, carry out photoetching once more and obtain source electrode pattern, drain electrode figure and gate electrode figure;
The electrode metal of step 5, electron beam evaporation source, leakage and grid is peeled off and is obtained electrode pattern;
Step 6, evaporation organic semiconducting materials are finished the making of device.
2. the manufacture method of organic field effect transistor with plane structure according to claim 1 is characterized in that, dielectric base described in the step 1 is inorganic oxide or organic insulalive plastic.
3. the manufacture method of organic field effect transistor with plane structure according to claim 1 is characterized in that, the gate dielectric membrane described in the step 3 obtains by electron beam evaporation.
4. the manufacture method of organic field effect transistor with plane structure according to claim 1 is characterized in that, the electrode metal described in the step 5 is a gold.
5. the manufacture method of organic field effect transistor with plane structure according to claim 1 is characterized in that, organic semiconducting materials described in the step 6 is the obtaining of method of adopting vacuum evaporation.
6. the manufacture method of organic field effect transistor with plane structure according to claim 1 is characterized in that, organic semiconducting materials described in the step 6 is to adopt pentacene.
CN2009100776793A 2009-02-11 2009-02-11 Manufacturing method of organic field effect transistor with plane structure Active CN101800287B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2009100776793A CN101800287B (en) 2009-02-11 2009-02-11 Manufacturing method of organic field effect transistor with plane structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2009100776793A CN101800287B (en) 2009-02-11 2009-02-11 Manufacturing method of organic field effect transistor with plane structure

Publications (2)

Publication Number Publication Date
CN101800287A CN101800287A (en) 2010-08-11
CN101800287B true CN101800287B (en) 2011-12-07

Family

ID=42595861

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2009100776793A Active CN101800287B (en) 2009-02-11 2009-02-11 Manufacturing method of organic field effect transistor with plane structure

Country Status (1)

Country Link
CN (1) CN101800287B (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1670598A (en) * 2005-04-08 2005-09-21 中国科学院长春应用化学研究所 Process for preparing active matrix LCD arrangement with pattern active layers

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1670598A (en) * 2005-04-08 2005-09-21 中国科学院长春应用化学研究所 Process for preparing active matrix LCD arrangement with pattern active layers

Also Published As

Publication number Publication date
CN101800287A (en) 2010-08-11

Similar Documents

Publication Publication Date Title
US6844579B2 (en) Organic device including semiconducting layer aligned according to microgrooves of photoresist layer
US20140183522A1 (en) Thin film transistor, thin film transistor array panel including the same and manufacturing method thereof
TW200616231A (en) Thin film transistor array panel and manufacturing method thereof
EP1933385A3 (en) Thin film transistor, thin film transistor substrate, and method of manufacturing the same
TW200734780A (en) Display device and manufacturing method therefor
WO2008136505A1 (en) Semiconductor device, thin film transistor and methods for manufacturing the semiconductor device and the thin film transistor
CN102651339B (en) TFT (Thin Film Transistor) array substrate and manufacturing method and display device of TFT array substrate
SG152247A1 (en) Method of manufacturing a semiconductor structure
TW200611440A (en) Organic thin film transistor array panel and manufacturing method thereof
Nag et al. Novel back‐channel‐etch process flow based a‐IGZO TFTs for circuit and display applications on PEN foil
CN107705704A (en) Display device and method of manufacturing the same
US20190051713A1 (en) Manufacturing method of tft substrate, tft substrate, and oled display panel
US9768324B2 (en) Co-planar oxide semiconductor TFT substrate structure and manufacture method thereof
Lin et al. 100-nm IGZO thin-film transistors with film profile engineering
CN101800287B (en) Manufacturing method of organic field effect transistor with plane structure
TW200713586A (en) Thin film transistor and method of manufacturing the same
US20220328593A1 (en) Organic light-emitting display substrate and manufacturing method thereof, and organic light-emitting display device
CN107735853A (en) Method for fabricating thin film transistor and array base palte
Liu et al. Understanding the dependence of performance on the dielectric-semiconductor interface in pentacene-based organic field-effect transistors
US9184187B2 (en) Thin film transistor array manufacturing method
CN101800284B (en) Method for manufacturing double-layer top electrode organic field effect transistor
US10651257B2 (en) Array substrate and manufacturing method thereof
TW202043511A (en) Oxide semiconductor thin film, thin film transistor and sputtering target having a relatively low manufacturing cost and high carrier mobility and light stress resistance upon forming a thin film transistor
CN101752501B (en) Method for preparing organic field-effect transistor with mixed-contact electrode
CN101752508B (en) Method for preparing organic field effect tube by using active layer graph

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant