CN101762894B - Laser repairing method and structure thereof - Google Patents
Laser repairing method and structure thereof Download PDFInfo
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- CN101762894B CN101762894B CN 200910036562 CN200910036562A CN101762894B CN 101762894 B CN101762894 B CN 101762894B CN 200910036562 CN200910036562 CN 200910036562 CN 200910036562 A CN200910036562 A CN 200910036562A CN 101762894 B CN101762894 B CN 101762894B
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- glass substrate
- laser repair
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Abstract
The invention provides a laser repairing method and a structure thereof. The structure comprises a first glass substrate and a second glass substrate, wherein a plurality of first light spacers are arranged between the first glass substrate and the second glass substrate; at least one specific region is provided with a plurality of second light spacers; and a liquid crystal layer is sandwiched between the first glass substrate and the second glass substrate so as to form a liquid crystal display panel. When at least one defect is detected on the liquid crystal display panel, laser repairing is carried out on the display panel; and a repaired picture cell unit is formed on a position, which is corresponding laser repairing position, on the first glass substrate. The technique can avoid the Vcom open circuit between the thin film transistor substrate and the color filter substrate caused by fusion and splashing of metal layers of scan lines or data lines and the like, thereby reducing the failure rate during laser repairing.
Description
[technical field]
The present invention is a kind of radium-shine mould, particularly about a kind of laser repair method and structure thereof of utilizing light spacer to serve as the insulation between thin film transistor base plate and the colored filter substrate.
[background technology]
Prior art may produce open defect when making thin film transistor base plate, as point defect or line defect, handle with laser repair mostly.The zone that can produce open defect is the position of sweep trace (GE) or data line (SD), and the defect area of prior art when laser repair comprises:
1. please refer to Fig. 1, first glass substrate, 58 upper surfaces are provided with one scan line (GE) 60, an insulation course (GI) 62, a dielectric layer 64 (BP), one first conductive film 66 and one first alignment film 68 from the bottom to top in regular turn.
2. please refer to Fig. 2, first glass substrate, 58 upper surfaces are provided with one scan line (GE) 60, an insulation course (GI) 62, a signal line (SD) 82, a dielectric layer (BP) 64, one first conductive film 66 and one first alignment film 68 from the bottom to top in regular turn.
3. please refer to Fig. 3, first glass substrate, 58 upper surfaces are provided with one scan line (GE) 60, an insulation course (GI) 62, a signal line (SD) 82, a dielectric layer (BP) 64 and one first alignment film 68 from the bottom to top in regular turn.
4. please refer to Fig. 4, the first glass substrate upper surface is provided with an insulation course (GI) 62, a signal line (SD) 82, a dielectric layer (BP) 64, one first conductive film 66 and one first alignment film 68 from the bottom to top in regular turn.
Above-mentioned 4 kinds of structures often cause common electrode (Vcom) short circuit of thin film transistor base plate and colored filter substrate when implementing laser repair, and defect area presents bright spot or bright line, cause the not good and yield decline of production reliability.
For this reason, the present invention proposes a kind of laser repair method and structure thereof, to improve above-mentioned defective.
[summary of the invention]
Fundamental purpose of the present invention is providing a kind of laser repair method and structure thereof, and it makes thin film transistor base plate and colored filter substrate insulation, the mortality when reducing laser repair with a plurality of light spacers.
Another object of the present invention is providing a kind of laser repair method and structure thereof, it is in needs laser repair regional extent, produce nonconducting light spacer, utilize light spacer to serve as megohmite insulant between thin film transistor base plate and the colored filter substrate, just can avoid because of metal level generation meltings such as sweep trace or data lines, the situation of the Vcom short circuit of the splash thin film transistor base plate that causes and colored filter substrate produces.
The invention provides a kind of laser repair method and structure thereof, it provides one first glass substrate and one second glass substrate, between first glass substrate and this second glass substrate, be provided with a plurality of first light spacers, and arrange a plurality of second light spacers at least one specific region, between first glass substrate and this second glass substrate, clamp one deck liquid crystal to become a display panels.When this display panels of detection has at least one defective, position according to defective, one laser beam is squeezed into by the front of first glass substrate, by this second light spacer that laser beam and this second glass substrate is isolated, be convenient to carry out the action of laser repair, in through the display panels after the above-mentioned repairing, on first glass substrate, can be formed with and repair the picture element unit corresponding to the position of laser repair.Wherein, the specific region at these second light spacer places is positioned at the zone between picture element unit and picture element unit.The present invention is in needs laser repair regional extent, produce nonconducting light spacer, utilize light spacer to serve as megohmite insulant between thin film transistor base plate and the colored filter substrate, can avoid because of metal level generation meltings such as sweep trace or data lines, the situation of the Vcom short circuit of the splash thin film transistor base plate that causes and colored filter substrate produces the mortality when reducing laser repair.
[description of drawings]
The present invention is further described below in conjunction with drawings and Examples.
Fig. 1 is the laser repair structural representation of an embodiment of prior art;
Fig. 2 is the laser repair structural representation of another embodiment of prior art;
Fig. 3 is the laser repair structural representation of the another embodiment of prior art;
Fig. 4 is the laser repair structural representation of an embodiment again of prior art;
Fig. 5 is a laser repair structural representation of the present invention;
Fig. 6 is the laser repair structural representation of one embodiment of the invention;
Fig. 7 is the laser repair structural representation of another embodiment of the present invention;
Fig. 8 is the laser repair structural representation of another embodiment of the present invention;
Fig. 9 is the laser repair structural representation of an embodiment more of the present invention;
Figure 10 is the implementation step synoptic diagram of laser repair method of the present invention.
[embodiment]
The invention provides a kind of laser repair method and structure thereof.Laser repair structure of the present invention comprises one first glass substrate and one second glass substrate, between first glass substrate and second glass substrate, be provided with one deck liquid crystal, a plurality of first light spacer and a plurality of second light spacer, first light spacer and second light spacer with the fixed distance between first glass substrate and second glass substrate in case liquid crystal be located between first glass substrate and second glass substrate.In the present embodiment, on first glass substrate thin film transistor (TFT) is arranged, have colored filter on second glass substrate, in addition, the material of first light spacer and second light spacer identical or different all can, first light spacer and second light spacer all have nonconducting characteristic.
Wherein, second light spacer is located at least one specific region, and this specific region is with reference to the oblique line part among Fig. 5.What the S1 among Fig. 5～S3 represented is data line, and what G1～G3 represented is sweep trace.Oblique line part 50 (specific region) mainly is to have scanning linear (GE), data line (SD) on ARRAY first glass substrate, the perhaps zone that all has of GE and SD, and oblique line partly is the zone between picture element unit and picture element unit.
The present invention utilizes these second light spacers, position according to defective, one laser beam is squeezed into by the front of first glass substrate, by these second light spacers that this laser beam and this second glass substrate is isolated, be convenient to carry out the action of laser repair, in through the display panels after the above-mentioned repairing, on this first glass substrate, can be formed with and repair the picture element unit corresponding to the position of laser repair.Wherein, laser beam provides a specific wavelength laser beam by a radium-shine head (comprising a radium-shine system and an optical system).
Defective about first board structure may occur is a kind of open defect, and as point defect or line defect, these defectives come across GE layer or SD layer.The applicable scope of the present invention comprises having GE, SD on first glass substrate, perhaps the zone that all has of GE and SD.
When therefore the present invention carried out laser repair, first board structure of patch area can roughly be divided into four kinds:
1. please refer to Fig. 6, first glass substrate, 58 upper surfaces are provided with one scan line (GE) 60, an insulation course (GI) 62, a dielectric layer 64 (BP), one first conductive film 66 and one first alignment film 68 from the bottom to top in regular turn.
When laser beam 70 is squeezed into by the front of first glass substrate 58, by these second light spacers 72 that the laser beam 70 and second glass substrate 74 is isolated, be convenient to carry out the action of laser repair.In through the display panels after the above-mentioned repairing, on first glass substrate 58, can be formed with and repair the picture element unit corresponding to the position of laser repair.Wherein, second glass substrate 74 has a plurality of black matrix"s 76, utilize one second conductive film 78 that these black matrix"s 76 are coated on second glass substrate 74 after, in this first conductive film 78 coatings one second alignment film 80.Laser beam 70 is to provide a specific wavelength laser beam by a radium-shine head (comprising a radium-shine system and an optical system).
2. please refer to Fig. 7, first glass substrate, 58 upper surfaces are provided with one scan line (GE) 60, an insulation course (GI) 62, a signal line (SD) 82, a dielectric layer (BP) 64, one first conductive film 66 and one first alignment film 68 from the bottom to top in regular turn.
When laser beam 70 is squeezed into by the front of first glass substrate 58, by these second light spacers 72 that the laser beam 70 and second glass substrate 74 is isolated, be convenient to carry out the action of laser repair.In through the display panels after the above-mentioned repairing, on first glass substrate 58, can be formed with and repair the picture element unit corresponding to the position of laser repair.Wherein, second glass substrate 74 has a plurality of black matrix"s 76, utilize one second conductive film 78 that these black matrix"s 76 are coated on second glass substrate 74 after, in this first conductive film 78 coatings one second alignment film 80.Laser beam 70 provides a specific wavelength laser beam by a radium-shine head (comprising a radium-shine system and an optical system).
3. please refer to Fig. 8, first glass substrate, 58 upper surfaces are provided with one scan line (GE) 60, an insulation course (GI) 62, a signal line (SD) 82, a dielectric layer (BP) 64 and one first alignment film 68 from the bottom to top in regular turn.
Squeeze into by the front of first glass substrate 58 when laser beam 70, utilize these second light spacers 72 that the laser beam 70 and second glass substrate 74 is isolated, be convenient to carry out the action of laser repair.In through the display panels after the above-mentioned repairing, on first glass substrate 58, can be formed with and repair the picture element unit corresponding to the position of laser repair.Wherein, second glass substrate 74 has a plurality of black matrix"s 76, utilize one second conductive film 78 that these black matrix"s 76 are coated on second glass substrate 74 after, in this first conductive film 78 coatings one second alignment film 80.Laser beam 70 is to provide a specific wavelength laser beam by a radium-shine head (comprising a radium-shine system and an optical system).
4. please refer to Fig. 9, the first glass substrate upper surface is provided with an insulation course (GI) 62, a signal line (SD) 82, a dielectric layer (BP) 64, one first conductive film 66 and one first alignment film 68 from the bottom to top in regular turn.
When laser beam 70 is squeezed into by the front of first glass substrate 58, by these second light spacers 72 that the laser beam 70 and second glass substrate 74 is isolated, be convenient to carry out the action of laser repair.In through the display panels after the above-mentioned repairing, on first glass substrate 58, can be formed with and repair the picture element unit corresponding to the position of laser repair.Wherein, second glass substrate 74 has a plurality of black matrix"s 76, utilize one second conductive film 78 that these black matrix"s 76 are coated on second glass substrate 74 after, in this first conductive film 78 coatings one second alignment film 80.Laser beam 70 provides a specific wavelength laser beam by a radium-shine head (comprising a radium-shine system and an optical system).
See also Figure 10 so that laser repair method of the present invention is described.When implementing laser repair method of the present invention, at first carry out step S12, one first glass substrate and one second glass substrate are provided, between this first glass substrate and this second glass substrate, be provided with a plurality of first light spacers, and arrange a plurality of second light spacers at least one specific region, between this first glass substrate and second glass substrate, clamp one deck liquid crystal to become a display panels.This first glass substrate is provided with thin film transistor (TFT), and has colored filter on this second glass substrate.Wherein, the material of these first light spacers and these second light spacers can be identical or different.
Carry out step S14, the display panels among the step S12 is detected.If when the display panels among the step S12 has at least one defective, then carry out step S16, carry out laser repair; If during the display panels zero defect among the step S12, then carry out step S18, finish.The position of these defectives wherein takes place, be positioned at GE layer or SD layer mostly, these defectives are a kind of open defect, as point defect or line defect.
When carrying out step S16 (laser repair), position according to defective, one laser beam is squeezed into by the front of first glass substrate, by these second light spacers that the laser beam and second glass substrate is isolated, be convenient to carry out the action of laser repair, in through the display panels after the above-mentioned repairing, on first glass substrate, can be formed with and repair the picture element unit corresponding to the position of laser repair.Wherein, the specific region at these second light spacer places is the zones that are positioned between picture element unit and picture element unit.The laser beam of present embodiment is to provide a specific wavelength laser beam by a radium-shine head (comprising radium-shine system and optical system).The present invention is in needs laser repair regional extent, produce nonconducting light spacer, utilize light spacer to serve as megohmite insulant between thin film transistor base plate and the colored filter substrate, can avoid because of metal level generation meltings such as sweep trace or data lines, the situation of the Vcom short circuit of the splash thin film transistor base plate that causes and colored filter substrate produces the mortality when reducing laser repair.
Embodiment in sum only is a preferred optimum implementation of the present invention; unintelligible is qualification to protection scope of the present invention; for adjustment that does not exceed technical solution of the present invention and the change that the engineering personnel in this field do according to present embodiment, should think and drop in protection scope of the present invention.
Claims (16)
1. laser repair method is characterized in that: comprises the following steps,
(A) provide one first glass substrate and one second glass substrate, between this first glass substrate and this second glass substrate, be provided with a plurality of first light spacers, multi-strip scanning line and many data lines are set on this first glass substrate, laser repair district on this sweep trace and data line is provided with a plurality of specific regions respectively, and arrange a plurality of second light spacers at least one specific region, between this first glass substrate and this second glass substrate, clamp one deck liquid crystal to become a display panels; And
(B) when this display panels of detection has at least one defective, carry out laser repair, position according to this defective, one laser beam is squeezed into by the front of this first glass substrate, by this second light spacer that this laser beam and this second glass substrate is isolated, be convenient to carry out the action of laser repair;
(C) on this first glass substrate, can be formed with behind the laser repair and repaired the picture element unit corresponding to the position of laser repair.
2. laser repair method according to claim 1 is characterized in that: have thin film transistor (TFT) on this first glass substrate, have colored filter on this second glass substrate.
3. laser repair method according to claim 1 is characterized in that: this defective is an open defect.
4. laser repair method according to claim 3 is characterized in that: this open defect is point defect or line defect.
5. laser repair method according to claim 1 is characterized in that: this first light spacer and this second light spacer are identical or different.
6. laser repair method according to claim 1 is characterized in that: this specific region is the zone between picture element unit and picture element unit.
7. laser repair structure is characterized in that: comprises,
One first glass substrate and one second glass substrate are provided with multi-strip scanning line and many data lines on this first glass substrate, the laser repair district on this sweep trace and data line is provided with a plurality of specific regions respectively;
One deck liquid crystal is between this first glass substrate and this second glass substrate;
A plurality of first light spacers and a plurality of second light spacer, between this first glass substrate and this second glass substrate, and these second light spacers are located at least one specific region; And
Utilize these second light spacers to finish laser repair, on this first glass substrate, can be formed with behind the laser repair and repair the picture element unit corresponding to the position of laser repair.
8. laser repair structure according to claim 7 is characterized in that: have thin film transistor (TFT) on this first glass substrate, have colored filter on this second glass substrate.
9. laser repair structure according to claim 7 is characterized in that: be provided with one scan line, an insulation course, a dielectric layer, one first conductive film and one first alignment film from the bottom to top in regular turn in this first glass substrate upper surface.
10. laser repair structure according to claim 7 is characterized in that: be provided with one scan line, an insulation course, a signal line, a dielectric layer, one first conductive film and one first alignment film from the bottom to top in regular turn in this first glass substrate upper surface.
11. laser repair structure according to claim 7 is characterized in that: be provided with one scan line, an insulation course, a signal line, a dielectric layer and one first alignment film from the bottom to top in regular turn in this first glass substrate upper surface.
12. laser repair structure according to claim 7 is characterized in that: be provided with an insulation course, a signal line, a dielectric layer, one first conductive film and one first alignment film from the bottom to top in regular turn in this first glass substrate upper surface.
13. according to claim 9 or 10 or 11 described laser repair structures, it is characterized in that: the position of this defective is positioned at this sweep trace.
14. according to claim 10 or 11 or 12 described laser repair structures, it is characterized in that: the position of this defective is positioned at this signal line.
15. laser repair structure according to claim 7 is characterized in that: these first light spacers and these second light spacers are identical or different.
16. laser repair structure according to claim 7 is characterized in that: this specific region is the zone between picture element unit and picture element unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200910036562 CN101762894B (en) | 2009-01-09 | 2009-01-09 | Laser repairing method and structure thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200910036562 CN101762894B (en) | 2009-01-09 | 2009-01-09 | Laser repairing method and structure thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101762894A CN101762894A (en) | 2010-06-30 |
| CN101762894B true CN101762894B (en) | 2011-10-26 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN 200910036562 Expired - Fee Related CN101762894B (en) | 2009-01-09 | 2009-01-09 | Laser repairing method and structure thereof |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6515720B1 (en) * | 1998-07-14 | 2003-02-04 | Kabushiki Kaisha Toshiba | Active matrix liquid crystal display device |
| CN1567035A (en) * | 2003-06-24 | 2005-01-19 | 统宝光电股份有限公司 | LCD laser repairing method and structure |
| CN1614466A (en) * | 2004-12-03 | 2005-05-11 | 友达光电股份有限公司 | Method for repairing circuit in external lead area of display panel |
-
2009
- 2009-01-09 CN CN 200910036562 patent/CN101762894B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6515720B1 (en) * | 1998-07-14 | 2003-02-04 | Kabushiki Kaisha Toshiba | Active matrix liquid crystal display device |
| CN1567035A (en) * | 2003-06-24 | 2005-01-19 | 统宝光电股份有限公司 | LCD laser repairing method and structure |
| CN1614466A (en) * | 2004-12-03 | 2005-05-11 | 友达光电股份有限公司 | Method for repairing circuit in external lead area of display panel |
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| Publication number | Publication date |
|---|---|
| CN101762894A (en) | 2010-06-30 |
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