CN101758028A - Autorotation correcting method for chip angle based on machine vision - Google Patents

Abstract

The invention relates to an autorotation correcting method for chip angle based on machine vision, which comprises the following steps: acquiring the original position coordinates Xi and Yi and the deflection angle theta i of a chip i on a chip film; acquiring the rotating center position coordinates Ox and Oy of the chip film; back calculating the theory position coordinates X'i and Y'i after theory rotation of the chip i; selecting a chip m on the chip film and assuming m as 1; actually rotating the chip film for a deflection angle theta m of the chip m; acquiring deviations lambda mx and lambda my between the actual position coordinates after actual rotation of the chip and the theory position coordinates X'm and Y'm after theory rotation of the chip; judging whether the deviations lambda mx and lambda my are larger than a threshold; if the deviations lambda mx and lambda my are larger than the threshold, correcting the rotating center position coordinates O'x and O'y, back calculating the theory position coordinates X''m and Y''m after theory rotation of the chip after correction again, and moving to correct the chip position; if the deviations lambda mx and lambda my are not larger than the threshold, moving to correct the chip position according to the theory position coordinates X'm and Y'm after theory rotation of the chip; and carrying out angle correction of the next chip. The invention can combine the machine vision to accurately correct the chip, and the correcting result has high accuracy, thereby further improving the sorting velocity of the chips.

Description

A kind of autorotation correcting method for chip angle based on machine vision

Technical field

The present invention relates to led chip sorting technology field, particularly relate to a kind of autorotation correcting method for chip angle based on machine vision.

Background technology

Common, in the led chip assorting room since the chip film before the die grading when expanding sheet on the film cohesive force and chip chamber bonding force etc. can cause segment chip to produce deflection angle, this deflection angle is the angle with respect to the lathe conventional coordinates.Yet require after the led chip sorting chip according to type, on chip film, only allow low-angle deviation so that the encapsulation of led chip with the form proper alignment of square sheet.Deflection angle occurs as fruit chip, then need to realize aiming at, and carry out the position compensation of chip, so that carry out chip pickup by the angle rotation correction.Therefore, in the led chip assorting room, carry out the chip angle rotation correction, make that chip can proper alignment be a difficult problem in the led chip sorting process on chip film.

Therefore, needing badly provides a kind of and can make chip proofread and correct exactly in conjunction with machine vision, further improves the autorotation correcting method for chip angle based on machine vision of the separation velocity of chip.

Summary of the invention

Based on the deficiencies in the prior art, the problem that the present invention need solve is: providing a kind of can make chip proofread and correct exactly in conjunction with machine vision, further improves the autorotation correcting method for chip angle based on machine vision of the separation velocity of chip.

For addressing the above problem, the invention provides a kind of autorotation correcting method for chip angle based on machine vision, it may further comprise the steps:

A, driving image identification system are discerned chip film, obtain the home position coordinate X of chip i on the described chip film _i, Y _iAnd deflection angle θ _i, wherein, i=1,2,3...n, n are total number of chip on the described chip film;

B, obtain the position coordinates O of the pivot of described chip film _x, O _y

C, with the home position coordinate X of chip i on the described chip film _i, Y _i, deflection angle θ _iAnd the position coordinates O of the pivot of described chip film _x, O _y, the theoretical postrotational theoretical position coordinate X ' of the described chip i of inverse _i, Y ' _i

D, choose the chip m on the described chip film, establish m=1;

Wherein, chip m is the wherein chips in all chips on the described chip film;

E, with the deflection angle θ of described chip film with chip m _mCarry out actual rotation;

F, driving image identification system are discerned chip m, obtain the theoretical postrotational theoretical position coordinate X ' of the actual postrotational actual position coordinate of this chip and this chip _m, Y ' _mBetween deviation λ _m ^x, λ _m ^y

Deviation λ in G, the described step F of judgement _m ^x, λ _m ^yWhether greater than a certain threshold value, if, then according to described deviation λ _m ^x, λ _m ^yPosition coordinates O to the pivot of the chip film obtained among the described step B _x, O _yRevise, again according to the position coordinates O ' of revised pivot _x, O ' _y, the theoretical postrotational theoretical position coordinate X of revised this chip of inverse again " _m, Y " _m, and according to the theoretical postrotational theoretical position coordinate X of revised this chip " _m, Y " _mMove and carry out this chip position correction; Otherwise, according to the theoretical postrotational theoretical position coordinate X ' of this chip _m, T ' _mMove and carry out this chip position correction;

H, judge whether m equals n, if then finish the angle correct of all chips on this chip film; Otherwise, m=m+1, and with described chip film with deflection angle θ _m-θ _M-1Carry out actual rotation, directly return step F.

Wherein, above-mentioned steps B specifically comprises:

B1, a wherein chips of demarcating on the described chip film are certain chip;

B2, the described chip film of driving are rotated different angles, write down the position coordinates of described certain chip when at every turn rotating respectively, and described position coordinates is stored to sample set, and wherein, described sample set is with respect to coordinate on the circle of the pivot of described chip film;

B3, according to the sample set among the described step B2, utilize least square method to calculate the match equation of a circle of described chip film, thereby obtain the position coordinates O of the pivot of described chip film _x, O _y

Wherein, above-mentioned steps C specifically comprises:

Judge the deflection angle θ of described chip i _i

If θ _iFor just, further judge the position coordinates O of described chip i with respect to the pivot of described chip film _x, O _yThe quadrant at place;

If at first quartile, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)+{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of≤90 °, X ' _i=O _x+ R _i* cos (θ _k), Y _i'=O _y+ R _i* sin (θ _k);

Work as θ _kIn the time of＞90 °, X ' _i=O _x-R _i* sin (θ _k-90 °), Y _i'=O _y+ R _i* cos (θ _k-90 °);

If at second quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)-{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x-R _i* cos (θ _k), Y _i'=O _y+ R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X ' _i=O _x-R _i(0 °-θ of * cos _k), Y _i'=O _y-R _i(0 °-θ of * sin _k);

If at third quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)+{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of≤90 °, X ' _i=O _x-R _i* cos (θ _k), Y _i'=O _y-R _i* sin (θ _k);

Work as θ _kIn the time of＞90 °, X ' _i=O _x+ R _i* sin (θ _k-90 °), Y _i'=O _y-R _i* cos (θ _k-90 °);

If at four-quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)-{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x+ R _i* cos (θ _k), Y _i'=O _y-R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X ' _i=O _x+ R _i(0 °-θ of * cos _k), Y _i'=O _y+ R _i(0 °-θ of * sin _k);

If θ _iFor negative, further judge the position coordinates O of described chip i with respect to the pivot of described chip film _x, O _yThe quadrant at place;

If at first quartile, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)-{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x+ R _i* cos (θ _k), Y _i'=O _y+ R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X ' _i=O _x+ R _i* cos (0-θ _k), Y _i'=O _y-R _i(0 °-θ of * sin _k);

If at second quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)+{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of≤90 °, X ' _i=O _x-R _i* cos (θ _k), Y _i'=O _y+ R _i* sin (θ _k);

Work as θ _kIn the time of＞90 °, X ' _i=O _x+ R _i* sin (θ _k-90 °), Y _i'=O _y+ R _i* cos (θ _k-90 °);

If at third quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)-{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x-R _i* cos (θ _k), Y _i'=O _y-R _i* sin (θ _k)

Work as θ _kIn the time of＜0 °, X ' _i=O _x-R _i(0 °-θ of * cos _k), Y _i'=O _y+ R _i(0 °-θ of * sin _k);

If at four-quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)+{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x+ R _i* cos (θ _k), Y _i'=O _y-R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X ' _i=O _x-R _i* cos (θ _k-90 °), Y _i'=O _y-R _i* sin (θ _k-90 °);

If θ _iWhen being 0 °, the theoretical postrotational theoretical position coordinate X ' of described chip i _i, Y ' _iHome position coordinate X for this chip _i, Y _i

Continue step D;

Wherein, R _iBe the pivot O of described chip i to described chip film _x, O _yDistance, described chip i is to the pivot O of described chip film _x, O _yDistance R i by following formula

$R_i=\sqrt{{(X_i-O_x)}^2+{(Y_i-O_y)}^2}$ Calculate.

Wherein, among the above-mentioned steps G according to described deviation λ _m ^x, λ _m ^yPosition coordinates O to the pivot of the chip film obtained among the described step B _x, O _yThe step of revising is specially:

The home position coordinate of I01, the described chip m of setting is X _m, Y _m, the theoretical postrotational theoretical position coordinate of described chip m is X ' _m, Y ' _m;

I02, according to described deviation λ _m ^x, λ _m ^yWith the theoretical postrotational theoretical position coordinate X ' of chip m _m, Y ' _m, indicating the actual postrotational actual position coordinate of described chip m is X ' _m-λ _m ^x, Y ' _m-λ _m ^y

I03, utilize the position coordinates O of following formula to the pivot of described chip film _x, O _yRevise, the position coordinates of establishing the pivot of revised described chip film is O ' _x, O ' _y:

Wherein, R ' _mBe the pivot O ' of m chips to revised described chip film _x, O ' _yDistance, described m chips is to the pivot O ' of revised described chip film _x, O ' _yDistance R ' _mBy following formula

$R_m^{\′}=\frac{\sqrt{{(X_m-X_m^{\′}+{\mathrm{\λ}}_m^x)}^2+{(Y_m-Y_m^{\′}+{\mathrm{\λ}}_m^y)}^2}}{2\×\sin ({\mathrm{\θ}}_m/2)}$ Calculate.

Among the present invention, obtain the home position coordinate X of chip i on the chip film _i, Y _iAnd deflection angle θ _i, wherein, i=1,2,3...n, n are total number of chip on the described chip film; Obtain the position coordinates O of the pivot of chip film _x, O _yThe theoretical postrotational theoretical position coordinate X ' of inverse chip i _i, Y _i'; Choose the chip m on the chip film, establish m=1; With the deflection angle θ of chip film with chip m _mCarry out actual rotation; Drive image identification system chip m is discerned, obtain the theoretical postrotational theoretical position coordinate X ' of the actual postrotational actual position coordinate of this chip and this chip _m, Y ' _mBetween deviation λ _m ^x, λ _m ^yJudge deviation λ _m ^x, λ _m ^yWhether greater than a certain threshold value, if, then according to deviation λ _m ^x, λ _m ^yPosition coordinates O to the pivot of chip film _x, O _yRevise, again according to the position coordinates O ' of revised pivot _x, O ' _y, the theoretical postrotational theoretical position coordinate X of revised this chip of inverse again " _m, Y " _m, and according to the theoretical postrotational theoretical position coordinate X of revised this chip " _m, Y " _mMove and carry out this chip position correction; Otherwise, according to the theoretical postrotational theoretical position coordinate X ' of this chip _m, Y ' _mMove and carry out this chip position correction; Judge whether m equals n, if then finish the angle correct of all chips on this chip film; Otherwise, m=m+1, and with chip film with deflection angle θ _m-θ _M-1Carry out actual rotation, directly return step F.

The present invention is based on the pivot of the position match chip film of Machine Vision Recognition chip, and by the theoretical postrotational theoretical position coordinate of the pivot coordinate inverse chip of match, based on basic turntable, it is auxiliary to need not external device, calculate and the image processing according to algorithm, finish the automatic rotation correction of angle of chip, be convenient to next step pick-up process of chip; In addition, the present invention also utilizes the deviation between actual postrotational actual position coordinate of chip and the theoretical postrotational theoretical position coordinate of this chip, the pivot of chip film is revised, thereby improved the accuracy that chip angle is proofreaied and correct.Compared with prior art, the present invention can make chip proofread and correct exactly in conjunction with machine vision, and the accuracy of proofreading and correct the result is higher, thereby further improves the separation velocity of chip.

Description of drawings

The invention will be further described to utilize accompanying drawing, but the embodiment in the accompanying drawing does not constitute any limitation of the invention.

Fig. 1 is the method flow diagram of a kind of autorotation correcting method for chip angle based on machine vision of the present invention.

The specific embodiment

With the following Examples the present invention is further described:

The embodiment of a kind of autorotation correcting method for chip angle based on machine vision of the present invention may further comprise the steps as shown in Figure 1:

Step 101. drives image identification system chip film is discerned, and obtains the home position coordinate X of chip i on the described chip film _i, Y _iAnd deflection angle θ _i, wherein, i is the wherein chips on the described chip film, i=1, and 2,3...n, n are total number of chip on the described chip film.That obtain in this step is the home position coordinate X of all chips on the described chip film _i, Y _iAnd deflection angle θ _iThis chip i on chip film position coordinates and fix with respect to the deflection angle of lathe conventional coordinates.

Step 102. is obtained the position coordinates O of the pivot of described chip film _x, O _yChip i on the chip film is with respect to the deflection angle θ of lathe coordinate system _iFix, but since during the whole rotation of chip film around the position of pivot in lathe coordinate system be to measure, so the position that need utilize image recognition and binding data fitting method to ask for the pivot of this chip film.

Step 103. is with the home position coordinate X of chip i on the described chip film _i, Y _i, deflection angle θ _iAnd the position coordinates O of the pivot of described chip film _x, O _y, the theoretical postrotational theoretical position coordinate X ' of the described chip i of inverse _i, Y _i'.This step 103 is specially: by judging the deflection angle θ of chip i _iAnd the deflection angle θ of chip i _iPosition coordinates O with respect to the pivot of described chip film _x, O _yThe quadrant at place, the computing formula that utilization is scheduled to is to the theoretical postrotational theoretical position coordinate X ' of described chip i _i, Y _i' carry out inverse.The theoretical postrotational theoretical position coordinate X ' of this chip i _i, Y _i' be the coordinate data that calculates in advance of the automatic rotation correction of chip angle system but not the actual coordinate value of actual rotation.

Step 104. is chosen the chip m on the described chip film, establishes m=1; Wherein, chip m is the wherein chips in all chips on the described chip film.

Step 105. is with the deflection angle θ of described chip film with chip m _mCarry out actual rotation.The deflection angle θ of chip m _mBe the deflection angle θ of the chip i in the step 101 _iIn, the angle during i=m.The rotation of chip film is to be rotated by the rotating shaft that drives in the automatic rotation correction of the chip angle system.

Step 106. drives image identification system chip m is discerned, and obtains the theoretical postrotational theoretical position coordinate X ' of the actual postrotational actual position coordinate of this chip and this chip _m, Y ' _mBetween deviation λ _m ^x, λ ^MyThe theoretical postrotational theoretical position coordinate X ' of this chip _m, Y ' _mBe the theoretical postrotational theoretical position coordinate X ' of the i of chip described in the step 103 _i, Y _i' in, the expression when i=m.

Step 107. is judged the deviation λ in the described step 106 _m ^x, λ _m ^yWhether greater than a certain threshold value, if, then according to described deviation λ _m ^x, λ _m ^yPosition coordinates O to the pivot of the chip film obtained in the described step 102 _x, O _yRevise, again according to the position coordinates O ' of revised pivot _x, O ' _y, the theoretical postrotational theoretical position coordinate X of revised this chip of inverse again " _m, Y " _m, and according to the theoretical postrotational theoretical position coordinate X of revised this chip " _m, Y " _mMove and carry out this chip position correction; Otherwise, according to the theoretical postrotational theoretical position coordinate X ' of this chip ^m, Y ' ^mMove and carry out this chip position correction.Carry out to carry out picking up of chip after chip position is proofreaied and correct.

Step 108. judges whether m equals n, if then finish the angle correct of all chips on this chip film; Otherwise, m=m+1, and with described chip film with deflection angle θ _m-θ _M-1Carry out actual rotation, directly return step 106.

In addition, because the deflection angle value of the chip that image recognition obtains all is based on the absolute coordinate of lathe coordinate system, so the angle that the required reality of chip film is rotated during the angle correct that the current absolute anglec of rotation of chip film of record can be by current next chips of angle calculation.As: when the angle of first chips is 5 °, the angle of second crystal grain is 10 °, but because the position of the initial scanning of chip all is the absolute position with respect to lathe coordinate system.After first chips carried out angle correct, the formula of the second chips rotation correction stood good, calculated second chips counter ask the theoretical position coordinate after, the rotating shaft of chip film only need continue to rotate the 5 ° of angle corrects that can finish chip.

In the present embodiment, above-mentioned steps 102 specifically comprises:

B1, a wherein chips of demarcating on the described chip film are certain chip.

B2, the described chip film of driving are rotated different angles, write down the position coordinates of described certain chip when at every turn rotating respectively, and described position coordinates is stored to sample set, and wherein, described sample set is with respect to coordinate on the circle of the pivot of described chip film.

B3, according to the sample set among the described step B2, utilize least square method to calculate the match equation of a circle of described chip film, thereby obtain the position coordinates O of the pivot of described chip film _x, O _yThe method that this pivot of asking for chip film adopts image vision identification to combine with motion is rotated the method in the extraction of different rotary angle position and the approximate center of circle of match to same chip.Utilize the position coordinates O of the pivot of the chip film that said method tries to achieve _x, O _yAfter, the parameter of this coordinate as the automatic rotation correction of chip angle system can be stored.

The position coordinates that needs match chip film pivot, the coordinate on the circle that at first will to obtain one group of position coordinates with the chip film pivot be the center of circle.Method proposes to utilize the method for chip image identification that same chip is carried out the position record, whenever position of record, chip film rotation fixed angle, simultaneously in conjunction with motion control real-time ensuring chip in identified region.Obtain one group with respect to coordinate on the circle of chip pivot, utilize these group data to carry out the least square fitting circular curve at last: concrete computational process is as follows:

Suppose sample set (X _i, Y _i), (1,2,3.....30) totally 30 points are d to the distance in the center of circle to i ∈ _i:

$d_i^2={(X_i-O_x)}^2+{(Y_i-O_y)}^2$

Point set to distance of center circle from the difference of two squares with radius of circle is:

${\mathrm{\δ}}_i=d_i^2-R^2={(X_i-O_x)}^2+{(Y_i-O_y)}^2-R^2=X_i^2+Y_i^2+{\mathrm{aX}}_i+b{Y}_i+c,$ Then object function Q (a, b, c) for point set to distance of center circle from the quadratic sum of the difference of two squares of radius of circle:

$Q(a,b,c)=\mathrm{\Σ}{\mathrm{\δ}}_i^2=\mathrm{\Σ}{(X_i^2+Y_i^2+{\mathrm{aX}}_i+{\mathrm{bY}}_i+c)}^2$

With object function Q (c) minimum is a target, asks parameter a for a, b, b, c make object function Q (a, b, value minimum c), thus try to achieve the match equation of a circle of chip film, thereby obtain central coordinate of circle.

In the present embodiment, above-mentioned steps 103 specifically comprises:

Judge the deflection angle θ of described chip i _i

If θ _iBe timing, need be rotated counterclockwise; Further judge the position coordinates O of described chip i with respect to the pivot of described chip film _x, O _yThe quadrant at place;

If at first quartile, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)+{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of≤90 °, X ' _i=O _x+ R _i* cos (θ _k), Y _i'=O _y+ R _i* sin (θ _k);

Work as θ _kIn the time of＞90 °, X ' _i=O _x-R _i* sin (θ _k-90 °), Y _i'=O _y+ R _i* cos (θ _k-90 °);

If at second quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)-{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x-R _i* cos (θ _k), Y _i'=O _y+ R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X ' _i=O _x-R _i(0 °-θ of * cos _k), Y _i'=O _y-R _i(0 °-θ of * sin _k);

If at third quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)+{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of≤90 °, X ' _i=O _x-R _i* cos (θ _k), Y _i'=O _y-R _i* sin (θ _k);

Work as θ _kIn the time of＞90 °, X ' _i=Ox+R _i* sin (θ _k-90 °), Y _i'=O _y-R _i* cos (θ _k-90 °);

If at four-quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)-{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x+ R _i* cos (θ _k), Y _i'=O _y-R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X ' _i=O _x+ R _i(0 °-θ of * cos _k), Y _i'=O _y+ R _i(0 °-θ of * sin _k);

If θ _iFor negative, need turn clockwise; Further judge the position coordinates O of described chip i with respect to the pivot of described chip film _x, O _yThe quadrant at place;

If at first quartile, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)-{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x+ R _i* cos (θ _k), Y _i'=O _y+ R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X ' _i=O _x+ R _i(0 °-θ of * cos _k), Y _i'=O _y-R _i(0 °-θ of * sin _k);

If at second quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)+{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of≤90 °, X ' _i=O _x-R _i* cos (θ _k), Y _i'=O _y+ R _i* sin (θ _k);

Work as θ _kIn the time of＞90 °, X ' _i=O _x+ R _i* sin (θ _k-90 °), Y _i'=O _y+ R _i* cos (θ _k-90 °);

If at third quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)-{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x-R _i* cos (θ _k), Y _i'=O _y-R _i* sin (θ _k)

Work as θ _kIn the time of＜0 °, X ' _i=O _x-R _i(0 °-θ of * cos _k), Y _i'=O _y+ R _i(0 °-θ of * sin _k);

If at four-quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)+{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x+ R _i* cos (θ _k), Y _i'=O _y-R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X ' _i=O _x-R _i* cos (θ _k-90 °), Y _i'=O _y-R _i* sin (θ _k-90 °);

If θ _iWhen being 0 °, the theoretical postrotational theoretical position coordinate X ' of described chip i _i, Y _i' be the home position coordinate X of this chip _i, Y _i

Continue step 104;

Wherein, R _iBe the pivot O of described chip i to described chip film _x, O _yDistance, described chip i is to the pivot O of described chip film _x, O _yDistance R _iBy following formula

$R_i=\sqrt{{(X_i-O_x)}^2+{(Y_i-O_y)}^2}$ Calculate.

In the present embodiment, because in the identification of image identification system to chip, and can there be identification error and error of fitting in the The Fitting Calculation of the pivot of chip film, but also include rounding error when calculating etc., feasible pivot with the chip film that numerical computation method was obtained is an approximation, proposes thus pivot is revised.So in the above-mentioned steps 107 according to described deviation λ _x, λ _yPosition coordinates O to the pivot of the chip film obtained in the described step 102 _x, O _yThe step of revising is specially:

The home position coordinate of I01, the described chip m of setting is X _m, Y _m, the theoretical postrotational theoretical position coordinate of described chip m is X ' _m, Y ' _m

I02, according to described deviation λ _m ^x, λ _m ^yWith the theoretical postrotational theoretical position coordinate X ' of chip m _m, Y ' _m, indicating the actual postrotational actual position coordinate of described chip m is X ' _m-λ _m ^x, Y ' _m-λ _m ^y

I03, utilize the position coordinates O of following formula to the pivot of described chip film _x, O _yRevise, the position coordinates of establishing the pivot of revised described chip film is O ' _x, O ' _y:

Wherein, R ' _mBe the pivot O ' of m chips to revised described chip film _x, O ' _yDistance, described m chips is to the pivot O ' of revised described chip film _x, O ' _yDistance R ' m by following formula

$R_m^{\′}=\frac{\sqrt{{(X_m-X_m^{\′}+{\mathrm{\λ}}_m^x)}^2+{(Y_m-Y_m^{\′}+{\mathrm{\λ}}_m^y)}^2}}{2\×\sin ({\mathrm{\θ}}_m/2)}$ Calculate.Utilize said method to try to achieve the position coordinates O ' of the pivot of revised chip film _x, O ' _yAfter, the parameter of this coordinate as the automatic rotation correction of chip angle system can be stored.

In the present embodiment, in the step 107 again according to the position coordinates O ' of revised pivot _x, O ' _y, the theoretical postrotational theoretical position coordinate X of revised this chip of inverse again " _i, Y " _iStep and step 103 in the principle of inverse process identical, with the home position coordinate X of this chip on the described chip film _m, Y _m, deflection angle θ _mAnd the position coordinates O of described revised pivot _x', O _y', the theoretical postrotational theoretical position coordinate X of the revised chip m of inverse " _m, Y " _mThis step is specially: by judging the deflection angle θ of chip m _mAnd the deflection angle θ of chip m _mWith respect to the position coordinates Ox ' of the pivot of described revised chip film, O _yThe quadrant at ' place, the computing formula that utilization is scheduled to is to the theoretical postrotational theoretical position coordinate X of described revised chip m " _m, Y " _mCarry out inverse.Concrete steps are as follows:

Judge the deflection angle θ of described chip m _m

If θ _mFor just, further judge the position coordinates O ' of described chip m with respect to described revised pivot _x, O ' _yThe quadrant at place;

If at first quartile, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_m-O_y^{\′}}{X_m-O_x^{\′}}\right)+{\mathrm{\θ}}_m,$

Then work as θ _kIn the time of≤90 °, X " _m=O _x'+R _i* cos (θ _k), Y " _m=O _y'+R _i* sin (θ _k);

Work as θ _kIn the time of＞90 °, X " _m=O _x'-R _i* sin (θ _k-90 °), Y " _m=O _y'+R _i* cos (θ _k-90 °);

If at second quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_m-O_y^{\′}}{X_m-O_x^{\′}}\right)-{\mathrm{\θ}}_m,$

Then work as θ _kIn the time of 〉=0 °, X " _m=O _x'-R _i* cos (θ _k), Y " _m=O _y'+R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X " _m=O _x'-R _i(0 °-θ of * cos _k), Y " _m=O _y'-R _i(0 °-θ of * sin _k);

If at third quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_m-O_y^{\′}}{X_m-O_x^{\′}}\right)+{\mathrm{\θ}}_m,$

Then work as θ _kIn the time of≤90 °, X " _m=O _x'-R _i* cos (θ _k), Y " _m=O _y'-R _i* sin (θ _k);

Work as θ _kIn the time of＞90 °, X " _m=O _x'+R _m' * sin (θ _K-90 °), Y " _m=O _y'-R _m' * cos (θ _k-90 °);

If at four-quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_m-O_y^{\′}}{X_m-O_x^{\′}}\right)-{\mathrm{\θ}}_m,$

Then work as θ _kIn the time of 〉=0 °, X " _m=O _x'+R _m' * cos (θ _k), Y " _m=O _y'-R _m' * sin (θ _k);

Work as θ _kIn the time of＜0 °, X " _m=O _x'+R _m(0 °-θ of ' * cos _k), Y " _m=O _y'+R _m(0 °-θ of ' * sin _k);

If θ _mFor negative, further judge the position coordinates O ' of described chip m with respect to described revised pivot _x, O ' _yThe quadrant at place;

If at first quartile, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_m-O_y^{\′}}{X_m-O_x^{\′}}\right)-{\mathrm{\θ}}_m,$

Then work as θ _kIn the time of 〉=0 °, X " _m=O _x'+R _m' * cos (θ _k), Y " _m=O _y'+R _m' * sin (θ _k);

Work as θ _kIn the time of＜0 °, X " _m=O _x'+R _m(0 °-θ of ' * cos _k), Y " _m=O _y'-R _m(0 °-θ of ' * sin _k);

If at second quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_m-O_y^{\′}}{X_m-O_x^{\′}}\right)+{\mathrm{\θ}}_m,$

Then work as θ _kIn the time of≤90 °, X " _m=O _x'-R _m' * cos (θ _k), Y " _m=O _y'+R _m' * sin (θ _k);

Work as θ _kIn the time of＞90 °, X " _m=O _x'+R _m' * sin (θ _k-90 °), Y " _m=O _y'+R _m' * cos (θ _k-90 °);

If at third quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_m-O_y^{\′}}{X_m-O_x^{\′}}\right)-{\mathrm{\θ}}_m,$

Then work as θ _kIn the time of 〉=0 °, X " _m=O _x'-R _m' * cos (θ _k), Y " _m=O _y'-R _m' * sin (θ _k)

Work as θ _kIn the time of＜0 °, X " _m=O _x'-R _m(0 °-θ of ' * cos _k), Y " _m=O _y'+R _m' * sin (0-θ _k);

If at four-quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_m-O_y^{\′}}{X_m-O_x^{\′}}\right)+{\mathrm{\θ}}_m,$

Then work as θ _kIn the time of 〉=0 °, X " _m=O _x'+R _m' * cos (θ _k), Y " _m=O _y'-R _m' * sin (θ _k);

Work as θ _kIn the time of＜0 °, X " _m=O _x'-R _m' * cos (θ _k-90 °), Y " _m=O _y'-R _m' * sin (θ _k-90 °);

If θ _kWhen being 0 °, the theoretical postrotational theoretical position coordinate X of described chip m " _m, Y " _mHome position coordinate X for this chip _m, Y _m

Wherein, R _m' be that described chip m is to described revised pivot O ' _x, O ' _yDistance, described chip m is to described revised pivot O ' _x, O ' _yDistance R _m' by following formula

$R_m^{\′}=\sqrt{{(X_m-O_x^{\′})}^2+{(Y_m-O_y^{\′})}^2}$ Calculate.

Should be noted that at last; above embodiment is only in order to illustrate technical scheme of the present invention; but not limiting the scope of the invention; although the present invention has been done to explain with reference to preferred embodiment; those of ordinary skill in the art is to be understood that; can make amendment or be equal to replacement technical scheme of the present invention, and not break away from the essence and the scope of technical solution of the present invention.

Claims (4)

1. the autorotation correcting method for chip angle based on machine vision is characterized in that, may further comprise the steps:

A, driving image identification system are discerned chip film, obtain the home position coordinate X of chip i on the described chip film _i, Y _iAnd deflection angle θ _i, wherein, i=1,2,3...n, n are total number of chip on the described chip film;

B, obtain the position coordinates O of the pivot of described chip film _x, O _y

C, with the home position coordinate X of chip i on the described chip film _i, Y _i, deflection angle θ _iAnd the position coordinates O of the pivot of described chip film _x, O _y, the theoretical postrotational theoretical position coordinate X ' of the described chip i of inverse _i, Y ' _i

D, choose the chip m on the described chip film, establish m=1;

Wherein, chip m is the wherein chips in all chips on the described chip film;

E, with the deflection angle θ of described chip film with chip m _mCarry out actual rotation;

F, driving image identification system are discerned chip m, obtain the theoretical postrotational theoretical position coordinate X ' of the actual postrotational actual position coordinate of this chip and this chip _m, Y ' _mBetween deviation λ _m ^x, λ _m ^y

Deviation λ in G, the described step F of judgement _m ^x, λ _m ^yWhether greater than a certain threshold value, if, then according to described deviation λ _m ^x, λ _m ^yPosition coordinates O to the pivot of the chip film obtained among the described step B _x, O _yRevise, again according to the position coordinates O ' of revised pivot _x, O ' _y, the theoretical postrotational theoretical position coordinate X of revised this chip of inverse again " _m, Y " _m, and according to the theoretical postrotational theoretical position coordinate X of revised this chip " _m, Y " _mMove and carry out this chip position correction; Otherwise, according to the theoretical postrotational theoretical position coordinate X ' of this chip _m, Y ' _mMove and carry out this chip position correction;

H, judge whether m equals n, if then finish the angle correct of all chips on this chip film; Otherwise, m=m+1, and with described chip film with deflection angle θ _m-θ _M-1Carry out actual rotation, directly return step F.

2. the autorotation correcting method for chip angle based on machine vision according to claim 1 is characterized in that, described step B specifically comprises:

B1, a wherein chips of demarcating on the described chip film are certain chip;

B2, the described chip film of driving are rotated different angles, write down the position coordinates of described certain chip when at every turn rotating respectively, and described position coordinates is stored to sample set, and wherein, described sample set is with respect to coordinate on the circle of the pivot of described chip film;

B3, according to the sample set among the described step B2, utilize least square method to calculate the match equation of a circle of described chip film, thereby obtain the position coordinates O of the pivot of described chip film _x, O _y

3. the autorotation correcting method for chip angle based on machine vision according to claim 2 is characterized in that, described step C specifically comprises:

Judge the deflection angle θ of described chip i _i

If θ _iFor just, further judge the position coordinates O of described chip i with respect to the pivot of described chip film _x, O _yThe quadrant at place;

If at first quartile, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)+{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of≤90 °, X ' _i=O _x+ R _i* cos (θ _k), Y ' _i=O _y+ R _i* sin (θ _k);

Work as θ _kIn the time of＞90 °, X ' _i=O _x-R _i* sin (θ _k-90 °), Y ' _i=O _y+ R _i* cos (θ _k-90 °);

If at second quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)-{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x-R _i* cos (θ _k), Y ' _i=O _y+ R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X ' _i=O _x-R _i(0 °-θ of * cos _k), Y ' _i=O _y-R _i* sin (0 '-θ _k);

If at third quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)+{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of≤90 °, X ' _i=O _x-R _i* cos (θ _k), Y ' _i=O _y-R _i* sin (θ _k);

Work as θ _kIn the time of＞90 °, X ' _i=O _x+ R _i* sin (θ _k-90 °), Y ' _i=O _y-R _i* cos (θ _k-90 °);

If at four-quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)-{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x+ R _i* cos (θ _k), Y ' _i=O _y-R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X ' _i=O _x+ R _i(0 °-θ of * cos _k), Y ' _i=O _y+ R _i(0 °-θ of * sin _k);

If θ _iFor negative, further judge the position coordinates O of described chip i with respect to the pivot of described chip film _x, O _yThe quadrant at place;

If at first quartile, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)-{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x+ R _i* cos (θ _k), Y ' _i=O _y+ R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X ' _i=O _x+ R _i(0 °-θ of * cos _k), Y ' _i=O _y-R _i(0 °-θ of * sin _k);

If at second quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)+{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of≤90 °, X ' _i=O _x-R _i* cos (θ _k), Y ' _i=O _y+ R _i* sin (θ _k);

Work as θ _kIn the time of＞90 °, X ' _i=O _x+ R _i* sin (θ _k-90 °), Y ' _i=O _y+ R _i* cos (θ _k-90 °);

If at third quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)-{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x-R _i* cos (θ _k), Y ' _i=O _y-R _i* sin (θ _k)

Work as θ _kIn the time of＜0 °, X ' _i=O _x-R _i(0 °-θ of * cos _k), Y ' _i=O _y+ R _i(0 °-θ of * sin _k);

If at four-quadrant, establish ${\mathrm{\θ}}_k=\arctan \left(\frac{Y_i-O_y}{X_i-O_x}\right)+{\mathrm{\θ}}_i,$

Then work as θ _kIn the time of 〉=0 °, X ' _i=O _x+ R _i* cos (θ _k), Y ' _i=O _y-R _i* sin (θ _k);

Work as θ _kIn the time of＜0 °, X ' _i=O _x-R _i* cos (θ _k-90 °), Y ' _i=O _y-R _i* sin (θ _k-90 °);

If θ _iWhen being 0 °, the theoretical postrotational theoretical position coordinate X ' of described chip i _i, Y ' _iHome position coordinate X for this chip _i, Y _i

Continue step D;

Wherein, R _iBe the pivot O of described chip i to described chip film _x, O _yDistance, described chip i is to the pivot O of described chip film _x, O _yDistance R _iBy following formula

$R_i=\sqrt{{(X_i-O_x)}^2+{(Y_i-O_y)}^2}$ Calculate.

4. the autorotation correcting method for chip angle based on machine vision according to claim 3 is characterized in that, among the described step G according to described deviation λ _m ^x, λ _m ^yPosition coordinates O to the pivot of the chip film obtained among the described step B _x, O _yThe step of revising is specially:

The home position coordinate of I01, the described chip m of setting is X _m, Y _m, the theoretical postrotational theoretical position coordinate of described chip m is X ' _m, Y ' _m

I02, according to described deviation λ _m ^x, λ _m ^yWith the theoretical postrotational theoretical position coordinate X ' of chip m _m, Y ' _m, indicating the actual postrotational actual position coordinate of described chip m is X ' _m-λ _m ^x, Y ' _m-λ _m ^y

I03, utilize the position coordinates O of following formula to the pivot of described chip film _x, O _yRevise, the position coordinates of establishing the pivot of revised described chip film is O ' _x, O ' _y:

Wherein, R ' _mBe the pivot O ' of m chips to revised described chip film _x, O ' _yDistance, described m chips is to the pivot O ' of revised described chip film _x, O ' _yDistance R ' _mBy following formula

$R_m^{\′}=\frac{\sqrt{{(X_m-X_m^{\′}+{\mathrm{\λ}}_m^x)}^2+{(Y_m-Y_m^{\′}+{\mathrm{\λ}}_m^y)}^2}}{2\×\sin ({\mathrm{\θ}}_m/2)}$ Calculate.

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