CN101754551B - Fluorescent lamp abnormal condition protection and sampling circuit - Google Patents

Fluorescent lamp abnormal condition protection and sampling circuit Download PDF

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Publication number
CN101754551B
CN101754551B CN201010105895.7A CN201010105895A CN101754551B CN 101754551 B CN101754551 B CN 101754551B CN 201010105895 A CN201010105895 A CN 201010105895A CN 101754551 B CN101754551 B CN 101754551B
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voltage
sampling
circuit
lamp
winding
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CN101754551A (en
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葛葆璋
孙海林
武洁霞
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SHANGHAI ARCATA ELECTRONIC Inc
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SHANGHAI ARCATA ELECTRONIC Inc
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Abstract

The invention provides a fluorescent lamp abnormal condition protection and sampling circuit, which is characterized in that a sampling choking winding L0 is connected in a ballast series resonant circuit in series, secondary windings n21 and n22 of the sampling choking winding L0 are connected with rectifier diodes D1, D2 to form full-wave rectification, rectified voltage forms a RC filter circuit through a filter capacitor C and a filter resistance R, and the full-wave rectified output voltage abnormally protects actuating voltage through a bidirectional trigger diode D output tube. The invention has the advantages that the circuit can acquire protection signal through the symmetrical sampling lamp voltage rise when pins have poor contact, the lamp tube is not accessed and is not activated, and the non-activated lamp tube or gas-leaked lamp tube is under abnormal state, can extract protection voltage from the risen non-symmetrical voltage wave form when the lamp tube is on the end of the service life (the emitting capacity of one end decreases or the emitting capacities of two ends simultaneously decrease), and is an ideal circuit capable of realizing fully protection of lamp abnormal condition in a half-bridge inverting electronic ballast.

Description

Fluorescent lamp abnormal condition protection and sampling circuit
Technical field
The present invention relates to the protection sample circuit of electronic ballast fluorescent lamp abnormality in a kind of electric lighting, particularly a kind of fluorescent lamp abnormal condition protection and sampling circuit.
Background technology
Fluorescent lamp, because luminous efficiency is high, energy-conservation and colour temperature can control, has become current main lighting source.Particularly to have color rendering better for thin-diameter fluorescent tube, and light efficiency is advantages of higher more, and caliber is the T5 of 16mm and caliber is that the thin-diameter fluorescent tubes such as the T4 of 12mm have started to be widely adopted in public with in domestic lighting.Electronic ballast for fluoresent lamp substitutes traditional inductance type ballast gradually because having the advantages such as energy-efficient, comfortable, safety, environmental protection.
For the semi-bridge inversion formula electric ballast that lamp activating is lighted by the high pressure utilizing the series resonance of choke and lamp electric capacity to produce, occur as bad in pins contact when being connected to the fluorescent tube in the normal electric ballast opened, fluorescent tube does not access, fluorescent tube un-activation, during the abnormalities such as inactive fluorescent tube (gas leakage fluorescent tube), the exception of light tube electric voltage can be caused to raise, thus cause the adverse consequences damaging electric ballast.
When fluorescent lamp is aging, not only the luminous efficiency of fluorescent tube can decay gradually; Also because of an electrode damage or electron emission deficiency, cause the effect that arc current is often inconsistent in the continuous half period, i.e. so-called rectifying effect.An electrode damage of in running order fluorescent tube or electron emission are not enough, will the electrode temperature of fluorescent tube one end be caused to rise rapidly, and extra power loss to concentrate on before negative electrode in a very little scope.Be the T5 of 16 millimeters and the fluorescent tube of more slim pipe diameter for caliber, because radiating condition is poorer than extra heavy pipe footpath fluorescent tube, fluorescent tube one end overheated may cause the light fixture connector at lamp holder place to burn and the glass tube walls fusing of electrode tip, thus causes security incident.In addition, the light tube electric voltage be operated under rectifying effect state can raise, if ballast continues the discharging current maintaining fluorescent tube, then the power of fluorescent tube corresponding rising by the rising along with light tube electric voltage, exacerbates fluorescent tube overheated.In the last few years; in the safety standard of electric ballast; clear stipulaties is for the fluorescent lamp ballast of T5 or more slim pipe diameter; fluorescent tube end-of-life protection characteristic must be had; namely when fluorescent tube end-of-life phenomenon occurs; the secondary power of fluorescent tube should be able to control within the scope limited by ballast, and therefore lamp tube life end protection has become the abnormal condition of lamp tube state that must consider.In addition, according to domestic electric ballast standard regulation, all electric ballasts all need the test by rectifying effect, and also should have corresponding detection and protective circuit for this abnormality.
Fluorescent lamp abnormal condition protection and sampling circuit is the indispensable part of electric ballast.
In semi-bridge inversion formula electric ballast; according to sampling method, the choke sampling shown in drawings attached 1, the modulating voltage dividing potential drop sampling shown in accompanying drawing 2; oscillating tube source electrode sampling shown in accompanying drawing 3, and the form of the multiple protection sample circuit such as the modulating voltage integration sampling shown in accompanying drawing 4.
Choke sampling shown in Fig. 1 and the modulating voltage dividing potential drop sampling method shown in Fig. 2 are all that when directly utilizing abnormal condition of lamp tube state, resonance potential raises, and are extracted the signal of half cycle of fluorescent tube high frequency voltage by a diode.For inactive fluorescent tube, because occur that the light tube electric voltage raised is symmetrical, protection sample circuit can provide enough protection act voltage.When lamp tube life end, modulating voltage presents asymmetric rectifying effect, then likely get less than signal; Even if or get, sensitivity is also lower.So they are unsuitable for the protection of dying of old age making fluorescent tube.
The source electrode of oscillating tube shown in Fig. 3 sampling protective circuit, when abnormal condition of lamp tube state, the forward and reverse resonance current of initiation all increases, and only when larger by the electric current increase of oscillating tube, sample circuit just has enough output.Therefore usually also can only be used in the protection to inactive fluorescent tube, lamp tube life end protection can not be used as.In addition, in order to reduce excess loss, the source electrode sample resistance of field effect transistor switch pipe can not be used very large, and the amplitude of the protection act voltage obtained above it also can not be very large, so also just adds the difficulty of complete machine adjustment.Therefore, it can only use usually in the electric ballast doing to drive with integrated circuit.
Modulating voltage integration sample circuit shown in Fig. 4, extraction be the integrated value of the positive half cycle of modulating voltage and negative half period difference.When fluorescent tube normally works, the electron emissivity of lamp tube ends filament is identical, and the positive half cycle of light tube electric voltage is identical with the voltage of negative half period, and difference is zero, and integrated value is on the capacitor zero.When the electron emissivity of filament one end weakens, cause the asymmetric of lamp current, thus make the asymmetrical voltage of the positive half cycle of modulating voltage and negative half period, integration goes out this continuous asymmetric difference of positive and negative half period on the capacitor.This difference just may be, also may be negative.Through an absolute value amplifier, convert suitable protection act voltage to and export.But, when the emissivities of the two ends filament of lamp all decline, although lamp current declines; modulating voltage raises; because the asymmetric degree of continuous print positive and negative half period is not aggravated, on capacitor, likely integration, less than enough difference voltage, can not play a protective role in time.As a same reason, this method also can not be protected the inactive lamp tube status that light tube electric voltage presents rising, positive half cycle and negative half period waveform symmetry.
Existing semi-bridge inversion formula electric ballast fluorescent tube abnormal protection sample circuit; especially after the requirement proposing lamp tube life end protection; how to take into account with fairly simple a kind of abnormality sample circuit the available protecting realized various abnormality, become field for this reason to fall over each other in the industry the problem discussed.
Summary of the invention
Technical problem to be solved by this invention be to provide a kind of overcome in prior art be difficult to take into account available protecting to various abnormal condition of lamp tube state with a kind of circuit to half-bridge contravariant electronic ballast for fluoresent lamp, the protection sample circuit tackling various abnormal condition of lamp tube state of a kind of choke all-wave sampling is proposed.This circuit not only can in luminous tube pin loose contact, fluorescent tube does not access, fluorescent tube un-activation or when connecting the abnormalities such as inactive fluorescent tube (gas leakage fluorescent tube), light tube electric voltage is than high during fluorescent tube normal condition, and positive and negative half cycle waveform is when being symmetrical, protection sample circuit can export enough protection act voltage; And at lamp tube life end, when light tube electric voltage presents random positive and negative half cycle asymmetric rectifying effect, can obtain equally and export enough protection act voltage.
In order to solve above technical problem; the invention provides a kind of fluorescent lamp abnormal condition protection and sampling circuit; a sampling choking-winding L0 is connected in series in ballast series resonant circuit; sampling choking-winding L0 comprises two secondary winding n21 and n22; secondary winding n21 and n22 and rectifier diode D1, D2 of sampling choking-winding L0 connect and compose full-wave rectification; rectified voltage forms RC filter circuit through filter capacitor C, filter resistance R, and the voltage that full-wave rectification exports exports abnormal condition of lamp tube protection act voltage through bidirectional trigger diode D.
The armature winding n1 of described sampling choking-winding L0 is the part of the resonant inductance in ballast series resonant circuit.
Secondary winding n21 and n22 of described sampling choking-winding L0 samples sampling choking-winding L0 under certain condition of resonance.When fluorescent tube normally works, fluorescent tube is that parallel connection is linked in resonant circuit C0 two ends as load; When fluorescent tube is in abnormality, the load resistance be connected in parallel on electric capacity C0 becomes large, and the Q value on resonant tank increases, and the voltage on sampling choking-winding L0 and C0 will occur significantly to change, and secondary winding n21 and n22 has also just reacted the state of abnormal condition of lamp tube.At the negative pole of above-mentioned two diode D1 and D2 and the common node of resistance R and capacitor C on the direct voltage Ua that obtains be required sampling voltage.When abnormal condition of lamp tube state, sampling voltage Ua, through bidirectional trigger diode D output protection operation voltage, controls the interlock circuit of ballast, ballast is quit work.
The changing voltage of described bidirectional trigger diode D is set as threshold voltage Ut; when the magnitude of voltage Ua of sampling choking-winding L0 secondary winding full-wave rectifying circuit output is higher than threshold voltage Ut, bidirectional trigger diode D conducting also exports abnormal condition of lamp tube protection act voltage.
When fluorescent tube normal operating conditions, sampling voltage Ua waveform as shown in Figure 6 a, can draw, light tube electric voltage keeps normal value, and waveform is close to sinusoidal wave, full-wave rectification output voltage Ua (n) is lower than the threshold voltage Ut with described bidirectional trigger diode D, and setting full-wave rectification output voltage Ua (n) is 2/3rds of threshold voltage Ut.Now bidirectional trigger diode cut-off, unprotect operation voltage exports.
In fluorescent tube un-activation or when connecting inactive fluorescent tube or gas leakage fluorescent tube, the resonance potential amplitude at ballast resonant capacitor C0 two ends can increase instantaneously two to three times even larger.The voltage U a (a) of sampled signal after described diode D1 and D2 full-wave rectification obtained from two secondary winding n21 and n22 of described sampling choking-winding L0 will exceed the threshold voltage Ut of setting; the i.e. changing voltage of described bidirectional trigger diode D; described bidirectional trigger diode D conducting, output protection operation voltage.Now in protective circuit, sampling voltage waveform is as shown in Figure 6 b.
When there is the abnormality of lamp tube life end of rectifying effect, the resonance potential amplitude of half period increases with the reduction of the emissivities of one end filament, and the resonance potential of another half period does not change, and the resonance potential of these two half period constitutes jointly point current potential.Thus be no matter that the emissivities of a filament reduce, or the emissivities of two filaments at two ends all reduce, in described full-wave rectifier circuit, the rising that abnormality commutating voltage Ua (a) all will have than commutating voltage Ua (n) during fluorescent tube normal condition by a relatively large margin.As long as commutating voltage Ua exceedes the threshold voltage Ut of setting, described bidirectional trigger diode D conducting, just has protection act voltage and exports.
Superior effect of the present invention is: sample circuit of the present invention not only can be bad at pins contact, fluorescent tube does not access, fluorescent tube un-activation, during the abnormalities such as inactive fluorescent tube or gas leakage fluorescent tube, relies on the symmetrical modulating voltage of sampling raise and obtain protection act signal; Can also when lamp tube life end; no matter which end emissivities of fluorescent tube reduce or two ends filament emission ability reduces simultaneously; can reliable extraction to protection act voltage, be a kind of ideal circuit realizing abnormal condition of lamp tube state full guard in semi-bridge inversion formula electric ballast from the asymmetrical voltage waveform raised.
Number in the figure explanation
Accompanying drawing 1 is choking-winding sample circuit figure;
Accompanying drawing 2 is modulating voltage pressure sampling circuit figure;
Accompanying drawing 3 is oscillating tube source electrode sample circuit figure;
Accompanying drawing 4 is modulating voltage integration sample circuit figure;
Accompanying drawing 5 is choking-winding all-wave sample circuit figure of the present invention;
Accompanying drawing 6 (comprising Fig. 6 a and Fig. 6 b) is choke all-wave sampling voltage oscillogram of the present invention;
Number in the figure explanation
1-semi-bridge inversion drive circuit; D1, D2-rectifier diode;
2-abnormal protection sample circuit; D-diac;
Lamp-fluorescent tube; C1, C2-series resonant tank electric capacity
L-resonant inductance; C0-resonant capacitance;
L0-samples choke; C-filter capacitor;
N1-samples choking-winding armature winding; Ca-partiting dc capacitor
N21, n22-sample choking-winding secondary winding;
R1, R2-switching tube emitter-base bandgap grading/source resistance;
Q1, Q2-half-bridge inverter switching tube;
Ra, Rb-divider resistance; R-filter resistance.
Embodiment
Refer to shown in accompanying drawing, the invention will be further described.
As shown in Figure 5; the invention provides a kind of fluorescent lamp abnormal condition protection and sampling circuit, this sample circuit comprises the sampling choking-winding L0 be connected in series in series resonant circuit, full-wave rectification diode D1 and D2; filter capacitor C, filter resistance R and bidirectional trigger diode D.The armature winding n1 of described sampling choking-winding L0 is connected in series between resonant inductance L and the fluorescent tube Lamp in parallel with resonant capacitance C0, obtains light tube electric voltage signal from secondary winding n21 and n22 of described sampling choking-winding L0.The anode of described rectifier diode D1 and D2 connects secondary winding n21 and n22 one end of described sampling choking-winding L0 respectively, the public electronegative potential point Gnd of the other end connection circuit of secondary winding n21 and n22 of described sampling choking-winding L0, the negative electrode of described rectifier diode D1 and D2 and each one end of described filter capacitor C, filter resistance R are at common point on be mutually connected together.Common point also be connected with one end of bidirectional trigger diode D.The changing voltage of selected described bidirectional trigger diode D is threshold voltage Ut.At common point on, by described full-wave rectifying circuit, full-wave rectification is carried out to the ballast fluorescent tube high-frequency voltage signal obtained and obtain voltage U a.Commutating voltage Ua (n) when arranging fluorescent tube normal condition is set threshold voltage Ut about 2/3rds, as shown in Figure 6 a.Therefore, when fluorescent tube normal condition, Ua (n) is less than Ut, and described bidirectional trigger diode D ends, and protection act voltage without exception exports through described bidirectional trigger diode D.When abnormal condition of lamp tube state, no matter occur that the positive and negative half cycle of high-frequency lamp voltage is symmetrical or asymmetricly increase, at common point the sampling voltage Ua (a) that upper rectification obtains all can far above the threshold voltage Ut of setting; as shown in Figure 6 b, described bidirectional trigger diode D conducting, output protection operation voltage; control the interlock circuit of ballast, when abnormal condition of lamp tube state, ballast is quit work.

Claims (2)

1. a fluorescent lamp abnormal condition protection and sampling circuit, it is characterized in that: in ballast series resonant circuit, be connected in series a sampling choking-winding L0, sampling choking-winding L0 comprises two secondary winding n21 and n22, secondary winding n21 and n22 and rectifier diode D1, D2 of sampling choking-winding L0 connect and compose full-wave rectification, rectified voltage forms RC filter circuit through filter capacitor C, filter resistance R, and the voltage that full-wave rectification exports exports abnormal condition of lamp tube protection act voltage through bidirectional trigger diode D;
The armature winding n1 of described sampling choking-winding L0 is the part of the resonant inductance in ballast series resonant circuit.
2., by fluorescent lamp abnormal condition protection and sampling circuit according to claim 1, it is characterized in that:
The changing voltage of described bidirectional trigger diode D is set as threshold voltage Ut, and the magnitude of voltage Ua that sampling choking-winding L0 secondary winding full-wave rectifying circuit exports is higher than threshold voltage Ut, and bidirectional trigger diode D conducting also exports abnormal condition of lamp tube protection act voltage.
CN201010105895.7A 2010-02-04 2010-02-04 Fluorescent lamp abnormal condition protection and sampling circuit Active CN101754551B (en)

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Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
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CN101754551B true CN101754551B (en) 2014-12-24

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101848586B (en) * 2010-06-24 2013-09-18 上海阿卡得电子有限公司 Arc suppressing circuit of electronic ballast output end
US8704481B2 (en) * 2011-01-26 2014-04-22 Rockwell Automation Technologies, Inc. Choke with current sensor
CN108594100B (en) * 2018-02-08 2020-08-11 福建睿能科技股份有限公司 Lamp tube life detection circuit of electric lamp and electric lamp

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2609318Y (en) * 2003-03-26 2004-03-31 上海日升电业有限公司 Electronic transformer for low voltage lamp
CN2712044Y (en) * 2004-06-10 2005-07-20 陈钢 Electronic ballast for fluorescent
CN201039565Y (en) * 2007-04-24 2008-03-19 樊贤信 Electronic rectifier for non electrolysis capacitance and long life fluorescent lamp
CN201601884U (en) * 2010-02-04 2010-10-06 上海阿卡得电子有限公司 Novel protection sample circuit for fluorescent lamp abnormal condition

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2609318Y (en) * 2003-03-26 2004-03-31 上海日升电业有限公司 Electronic transformer for low voltage lamp
CN2712044Y (en) * 2004-06-10 2005-07-20 陈钢 Electronic ballast for fluorescent
CN201039565Y (en) * 2007-04-24 2008-03-19 樊贤信 Electronic rectifier for non electrolysis capacitance and long life fluorescent lamp
CN201601884U (en) * 2010-02-04 2010-10-06 上海阿卡得电子有限公司 Novel protection sample circuit for fluorescent lamp abnormal condition

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