CN101738526B - Direct current output voltage test circuit for power factor correction control circuit - Google Patents
Direct current output voltage test circuit for power factor correction control circuit Download PDFInfo
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- CN101738526B CN101738526B CN2008102031846A CN200810203184A CN101738526B CN 101738526 B CN101738526 B CN 101738526B CN 2008102031846 A CN2008102031846 A CN 2008102031846A CN 200810203184 A CN200810203184 A CN 200810203184A CN 101738526 B CN101738526 B CN 101738526B
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E40/00—Technologies for an efficient electrical power generation, transmission or distribution
- Y02E40/30—Reactive power compensation
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Abstract
The invention discloses a direct current output voltage test circuit for a power factor correction control circuit. The power factor correction control circuit comprises a central processor. The direct current output voltage test circuit comprises a voltage transformer T, wherein the output circuit of the voltage transformer T is sequentially connected with a diode D1, a second resistor R2, a comparator D, a fifth resistor R5, an optocoupler, a first resistor R1, a first capacitor C1, a third resistor R3 and a fourth resistor R4; one output end of the optocoupler is connected with a sixth resistor R6 and a seventh resistor R7; the seventh resistor R7 and the other output end of the optocoupler are connected by a second capacitor C2 and are grounded; and the end, connected with the seventh resistor R7, of the second capacitor C2 is connected with the central processor. The direct current output voltage test circuit for the partially chopping power factor correction control circuit has the advantage of simple structure and can test the value of a direct current output voltage.
Description
Technical field
The present invention relates to a kind of voltage detecting circuit, relate in particular to a kind of VD testing circuit that is used for part chopper-type power factor correction control circuit.
Technical background
In recent years; Along with development of electronic technology, various electronic equipments, issuable current harmonics of household electrical appliance and reactive power also more and more cause people's attention to the pollution of electrical network; The existence of harmonic wave; Not only greatly reduce the power factor of input circuit, and can pollute the detonator circuit fault the public power system.At present; In order effectively to improve power factor; Reduction is to the requirement of components and parts and the loss of the components and parts that take effect, and the chopping way that can be employed in part copped wave in each voltage cycle is controlled, and this part chopper-type power factor correction control circuit must adopt a kind of simple VD testing circuit; Therefore, the application's applicant is devoted to study a kind of VD testing circuit that simply is applicable to part chopper-type power factor correction control circuit.
Summary of the invention
The object of the present invention is to provide a kind of VD testing circuit that is used for part chopper-type power factor correction control circuit, it has advantage of simple structure, can detect the VD value.
The technical scheme that realizes above-mentioned purpose is: a kind of VD testing circuit that is used for power factor correction control circuit; Described power factor correction control circuit includes a central processing unit; Wherein, It comprises a voltage transformer (VT) T, is connected with diode D1, second resistance R 2, comparer D, the 5th resistance R 5 and optocoupler on the output loop of this voltage transformer (VT) T in turn, is connected with the 6th resistance R 6 and the 7th resistance R 7 on the output terminal of optocoupler; The 7th resistance R 7 links to each other with another output terminal of optocoupler and ground connection through one second capacitor C 2; An end that links to each other with the 7th resistance R 7 of second capacitor C 2 links to each other with described central processing unit, also comprises first resistance R 1, first capacitor C 1, the 3rd resistance R 3 and the 4th resistance R 4, wherein:
One end of described first resistance R 1 links to each other with the output terminal of described diode D1, and the other end links to each other with the output terminal of described voltage transformer (VT) T and ground connection;
One end of described first capacitor C 1 links to each other with described comparer D, and the other end links to each other with the output terminal of described voltage transformer (VT) T;
One end of described the 4th resistance R 4 links to each other with the output terminal of described comparer D, and the other end links to each other with the output terminal of described voltage transformer (VT) T;
One end of described the 3rd resistance R 3 links to each other another termination power with the output terminal of described comparer D.
The above-mentioned VD testing circuit that is used for power factor correction control circuit wherein, connects the power supply of 5V on described the 6th resistance R 6, connect the power supply of 15V on described the 3rd resistance R 3.
The invention has the beneficial effects as follows: the present invention compares the alternating voltage half-wave voltage signal of taking out and the voltage division signal of output dc voltage through comparer; Handle through central processing unit; Can obtain the interchange and the dc voltage value of required measurement; This circuit has advantage simple in structure, practical.
Description of drawings
Fig. 1 is the circuit diagram of VD testing circuit of the present invention.
Embodiment
To combine accompanying drawing that the present invention is described further below.
See also Fig. 1; A kind of alternating current input voltage magnitude testing circuit that is used for power factor correction control circuit of the present invention has been shown among the figure; Power factor correction control circuit includes a central processing unit 2; The present invention includes a voltage transformer (VT) T, be connected with diode D1, second resistance R 2, comparer D, the 5th resistance R 5 and optocoupler 1 on the output loop of this voltage transformer (VT) T in turn, be connected with the 6th resistance R 6 and the 7th resistance R 7 on the output terminal of optocoupler 1; The 7th resistance R 7 links to each other with another output terminal of optocoupler 1 and ground connection through one second capacitor C 2; An end that links to each other with the 7th resistance R 7 of second capacitor C 2 links to each other with central processing unit 2, also comprises first resistance R 1, first capacitor C 1, the 3rd resistance R 3 and the 4th resistance R 4, wherein:
One end of first resistance R 1 links to each other with the output terminal of diode D1, and the other end links to each other with the output terminal of voltage transformer (VT) T and ground connection;
One end of first capacitor C 1 links to each other with comparer D, and the other end links to each other with the output terminal of voltage transformer (VT) T;
One end of the 4th resistance R 4 links to each other with the output terminal of comparer D, and the other end links to each other with the output terminal of voltage transformer (VT) T;
One end of the 3rd resistance R 3 links to each other with the output terminal of comparer D, the power supply of another termination 15V;
Connect the power supply of 5V on the 6th resistance R 6.
The principle of work of circuit is: the voltage division signal Uo that voltage transformer (VT) T takes out alternating voltage half-wave voltage signal and output dc voltage compares; When the instantaneous value of alternating voltage is slightly larger than the VD value; Export negative edge signal a to central processing unit 2; After central processing unit 2 captures this signal, the record current time of synchro timer, simultaneously the instantaneous voltage of AC-input voltage output element is sampled; Then this value is converted accordingly, can obtain the interchange and the dc voltage value of required measurement.
Need to prove: above only unrestricted technical scheme of the present invention in order to explanation; Although the present invention is specified with reference to the foregoing description; Those of ordinary skill in the art is to be understood that: still can make amendment or be equal to replacement the present invention; And replace any modification or the part that do not break away from the spirit and scope of the present invention, and it all should be encompassed in the middle of the claim scope of the present invention.
Claims (2)
1. VD testing circuit that is used for power factor correction control circuit; Described power factor correction control circuit includes a central processing unit; It is characterized in that; This VD testing circuit comprises a voltage transformer (VT) T, is connected with diode D1, second resistance R 2, comparer D, the 5th resistance R 5 and optocoupler on the output loop of this voltage transformer (VT) T in turn, is connected with the 6th resistance R 6 and the 7th resistance R 7 on the output terminal of optocoupler; The 7th resistance R 7 links to each other with another output terminal of optocoupler and ground connection through one second capacitor C 2; An end that links to each other with the 7th resistance R 7 of second capacitor C 2 links to each other with described central processing unit, and this VD testing circuit also comprises first resistance R 1, first capacitor C 1, the 3rd resistance R 3 and the 4th resistance R 4, wherein:
One end of described first resistance R 1 links to each other with the output terminal of described diode D1, and the other end links to each other with the output terminal of described voltage transformer (VT) T and ground connection;
One end of described first capacitor C 1 links to each other with described comparer D, and the other end links to each other with the output terminal of described voltage transformer (VT) T;
One end of described the 4th resistance R 4 links to each other with the output terminal of described comparer D, and the other end links to each other with the output terminal of described voltage transformer (VT) T;
One end of described the 3rd resistance R 3 links to each other another termination power with the output terminal of described comparer D.
2. the VD testing circuit that is used for power factor correction control circuit according to claim 1 is characterized in that, connects the power supply of 5V on described the 6th resistance R 6, connects the power supply of 15V on described the 3rd resistance R 3.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008102031846A CN101738526B (en) | 2008-11-21 | 2008-11-21 | Direct current output voltage test circuit for power factor correction control circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008102031846A CN101738526B (en) | 2008-11-21 | 2008-11-21 | Direct current output voltage test circuit for power factor correction control circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101738526A CN101738526A (en) | 2010-06-16 |
| CN101738526B true CN101738526B (en) | 2012-11-28 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2008102031846A Expired - Fee Related CN101738526B (en) | 2008-11-21 | 2008-11-21 | Direct current output voltage test circuit for power factor correction control circuit |
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| CN (1) | CN101738526B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102841241B (en) * | 2011-06-23 | 2016-03-09 | 神讯电脑(昆山)有限公司 | Voltage detecting circuit |
| PL233134B1 (en) * | 2017-10-12 | 2019-09-30 | Akademia Gorniczo Hutnicza Im Stanislawa Staszica W Krakowie | System for measuring voltage with galvanic separation |
| CN112798997B (en) * | 2020-12-30 | 2022-09-06 | 四川长虹空调有限公司 | Frequency converter direct-current voltage detection and correction method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5617305A (en) * | 1994-09-08 | 1997-04-01 | Sony Corporation | Current resonance type switching power supply circuit |
| CN2753056Y (en) * | 2004-12-03 | 2006-01-18 | 深圳市核达中远通电源技术有限公司 | Power factor correct circuit with sectional control function |
| CN101009432A (en) * | 2006-01-24 | 2007-08-01 | 艾默生网络能源系统有限公司 | Sampling circuit for three-level power factor correction circuit and voltage sampling method thereof |
-
2008
- 2008-11-21 CN CN2008102031846A patent/CN101738526B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5617305A (en) * | 1994-09-08 | 1997-04-01 | Sony Corporation | Current resonance type switching power supply circuit |
| CN2753056Y (en) * | 2004-12-03 | 2006-01-18 | 深圳市核达中远通电源技术有限公司 | Power factor correct circuit with sectional control function |
| CN101009432A (en) * | 2006-01-24 | 2007-08-01 | 艾默生网络能源系统有限公司 | Sampling circuit for three-level power factor correction circuit and voltage sampling method thereof |
Non-Patent Citations (1)
| Title |
|---|
| JP特开2008-64539A 2008.03.21 |
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| CN101738526A (en) | 2010-06-16 |
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