CN101714150A - System and method for analyzing technical hotspots and blank spots in patent analysis - Google Patents
System and method for analyzing technical hotspots and blank spots in patent analysis Download PDFInfo
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- CN101714150A CN101714150A CN200910052265A CN200910052265A CN101714150A CN 101714150 A CN101714150 A CN 101714150A CN 200910052265 A CN200910052265 A CN 200910052265A CN 200910052265 A CN200910052265 A CN 200910052265A CN 101714150 A CN101714150 A CN 101714150A
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Abstract
The invention provides a system and a method for analyzing technical hotspots and blank spots in patent analysis, which can display the technical hotspots and blank spots of patent technologies in a certain technical field by a matrix intuitively. The horizontal axis of the matrix chart represents the patent functional effects to be achieved, the vertical axis represents the technical means adopted by the patent, and the intersections represents the number of the patents of the corresponding technical mean which can realize the functional effect. By the analysis system, enterprises can discover the hotspots and the blank spots of the patent technology from a great number of patent information as plain as daylight and rapidly grips the focused patent technical information, thus improving analysis efficiency.
Description
Technical field
The present invention relates to a kind of analytic system and method, the analytic system and the method for hot technology and blank spot in particularly a kind of patent analyses.
Background technology
Patent information is a kind of important strategic disposition newspaper resource.Statistics according to World Intellectual Property Organization: 95% technology is disclosed by patent information in the world, patent information can help us fully to understand competitive environment, uses for reference prior art, gets around patent barrier and patent trap, avoid patent dispute, objective formulation competitive strategy.In view of the importance of patent information, how patent information is fully used, for enterprise technology research and development innovation provides foundation, become the focal issue of enterprises pay attention.
At present, patent analyses has become the important means that enterprise utilizes patent information.Publication number be CN1828579A patent disclosure a kind of patent analytical system, require signal to export a patent icon according to one, this icon one coordinate axis indicate have with the relevant patentee of corresponding patent be listed as, another coordinate axis then indicate with the relevant approval age of corresponding patent, the point of crossing is pairing patent.It has just shown the relation between each patent under a certain technical field in real time, patent quote the number of times rank, and the patentee of each patent and approval age.Publication number be CN101008950A patent disclosure a kind of display packing of patent citation information.Yet, continuous development along with science and technology, very huge of patent information amount, patent documentation under a certain particular technology area may be thousands of, hundreds thousand of at most millions of, only show the relation between patent or the information of quoting as proof also can't satisfy the utilization demand of enterprise to patent information, and understand the technical information that how from a large amount of information, to find enterprise fast and paid close attention to, understand industry technology focus and technological gap point, be only the key subjects that enterprise faces.
Summary of the invention
Fundamental purpose of the present invention provides the analytic system of hot technology and blank spot in a kind of patent analyses, it shows the patented technology focus and the blank spot of patented technology in a certain particular technology area intuitively by matrix diagram, enterprise is come into plain view from a large amount of patent information find out patented technology focus and blank spot, catch the technical information of being paid close attention to fast, improve the efficient of analyzing.
In view of above-mentioned purpose, the present invention proposes the analytic system of hot technology and blank spot in a kind of patent analyses, comprises a patent database, the storage patent data; One patented technology analysis module comprises patent data and gathers submodule, is used for gathering relevant patent data according to the patented subject matter of required analysis at patent database; Data processing submodule is used for the data that collect are processed; The indexing data submodule is used for the data after the processing are carried out index by technological means and functional effect; The data computation submodule is used for calculating the quantity of index by technological means and functional effect; The image output module of one hot technology and blank spot, be used to export a matrix diagram, this matrix diagram transverse axis is the functional effect that patent reaches, the longitudinal axis is the technological means that patent adopted, the point of crossing represents that these relevant art means realize the patent quantity of this functional effect, and the area and the quantity of described point of crossing graphics shape are proportional.
Further, the analytic system of hot technology and blank spot in a kind of patent analyses that the present invention proposes, wherein the patent data that stores in the patent database comprises patent descriptive entry, abridgments of specifications and Patent right requirement.
Further, the analytic system of hot technology and blank spot in a kind of patent analyses that the present invention proposes, wherein patent database is installed on the webserver, carries out patent retrieval and inquiry as the technician of client with any IP address login patent database.
Further, the analytic system of hot technology and blank spot in a kind of patent analyses that the present invention proposes, the patented technology analysis module provides visual user interface.
Further, the analytic system of hot technology and blank spot in a kind of patent analyses that the present invention proposes, described user interface provides data updating unit, is used for upgrading the patent data of patent database.
Further, the analytic system of hot technology and blank spot in a kind of patent analyses that the present invention proposes, described data acquisition submodule is used for retrieving at patent database image data.
Further, the analytic system of hot technology and blank spot in a kind of patent analyses that the present invention proposes, described data processing submodule carries out deep processing by patent IPC, date or keyword to the patent data that collects.
Further, the analytic system of hot technology and blank spot in a kind of patent analyses that the present invention proposes, the indexing data submodule in the patented technology analysis module are that the patent data after the processing is carried out artificial or automatic indexing by technological means and two aspects of functional effect.
Further, the analytic system of hot technology and blank spot in a kind of patent analyses that the present invention proposes, described hot technology and blank spot output module comprise the data lead-out unit of hot technology and the relevant patent information of blank spot, the pairing patent in the point of crossing among the derivational matrix figure.
The present invention also proposes the analytical approach of hot technology and blank spot in a kind of patent analyses, and the method includes the steps of: (1) sets up patent database, is used to store the patent data relevant information; (2) finish the analysis data processing by the patented technology analysis module, it is the patent data that the data acquisition submodule is gathered from patent database needs analysis, the submodule of data processing is then processed the patent data that collects, then the indexing data submodule carries out index to the data after processing, the data volume of each technological means and functional effect after the final data calculating sub module calculating index; (3) image output module is exported a matrix diagram, and the size by the point of crossing figure shows patented technology focus and blank spot.
Analytic system and method by the technology of the present invention focus and blank spot, can find out focus and blank spot technology in the particular technology area at a glance, and derive the pairing patent of interested technology as required, and be convenient to analyze, improve analysis efficiency.
Description of drawings
The present invention will be further described in detail below in conjunction with accompanying drawing.
Fig. 1 is an analytic system module map of the present invention.
Fig. 2 is each submodule workflow diagram in the patented technology analysis module.
Fig. 3 is the functional effect matrix diagram of output.
Embodiment
Analytic system module map of the present invention referring to Fig. 1.As shown in the figure, system module comprises the image output module 300 of patent database 100, one patented technology analysis modules, 200, one hot technologies and blank spot.
Patented technology analysis module 200 in the analytic system of the present invention is presented to the user by visual user interface, and this interface also comprises a data updating unit, and the data in the patent database 100 are upgraded.Be illustrated in figure 2 as each submodule workflow diagram in the patented technology analysis module.Wherein, data acquisition submodule 2001 is finished data acquisition by the patent in the patent database is retrieved.Data processing submodule 2002 carries out deep processing by the patent data in patent IPC, date or the crucial word pair database, and deletion is with the incoherent patent of required analytical technology.Indexing data submodule 2003 in the patented technology analysis module carries out artificial or automatic indexing with patent data by technological means and two aspects of functional effect afterwards.After finishing, data computation submodule 2004 calculates the patent data amount of each technological means and functional effect according to the result of index.
The image output module 300 export technique means of hot technology and blank spot and the matrix diagram of functional effect, as shown in Figure 3.This figure transverse axis is that the functional effect that patent reaches (for example comprises effect 1, effect 2 ... effect 9), the longitudinal axis is that the technological means that patent adopted (for example comprises technological means 1, technological means 2 ... technological means 7), the point of crossing represents that these relevant art means realize the patent quantity of this functional effect, point of crossing area of graph and patent quantity are proportional, for example the point of crossing figure is represented with ball, be that ball is big more, the patent quantity that this point is corresponding is many more, it corresponds to the hot spot technology of patent, say it on the contrary, ball is more little, and the patent quantity that this point is corresponding is few more, and it corresponds to the blank spot technology of patent.In the matrix diagram shown in Figure 3, corresponding hot spot technology is a technological means 2, and technological means 3,4 etc. is the blank spot technology of patent.
In addition, but the corresponding patent information in place, point of crossing among this image output module derivational matrix figure makes things convenient for the user that the patent details at the technology point place of concern are studied, and promptly the user can derive the relevant patent of described ball correspondence by clicking corresponding ball.
Owing to adopt above technical scheme, make enterprise to come into plain view and find out patented technology focus and blank spot, catch the technical information of being paid close attention to fast, improve the efficient of analyzing.
The analytical approach of hot technology and blank spot comprises following steps at least in the patent analyses of the present invention:
(1) sets up patent database, be used to store patent data;
(2) finish the analysis data processing by the patented technology analysis module, it is the patent data that the data acquisition submodule is gathered from patent database needs analysis, the submodule of data processing is then processed the patent data that collects, then the indexing data submodule carries out index to the data after processing, the data volume of each technological means and functional effect after the final data calculating sub module calculating index;
(3) image output module is exported a matrix diagram, and the size by the point of crossing figure shows patented technology focus and blank spot.
Because the analytic system of hot technology and blank spot is corresponding in the analysis of described method and aforementioned patent, no longer is described in detail at this.
The foregoing description just lists expressivity principle of the present invention and effect is described, but not is used to limit the present invention.Any personnel that are familiar with this technology all can make amendment to the foregoing description under spirit of the present invention and scope.Therefore, the scope of the present invention should be listed as claims.
Claims (10)
1. the analytic system of hot technology and blank spot in the patent analyses is characterized in that: comprise a patent database, the storage patent data;
One patented technology analysis module comprises patent data and gathers submodule, is used for gathering relevant patent data according to the patented subject matter of required analysis at patent database; Data processing submodule is used for the data that collect are processed; The indexing data submodule is used for the data after the processing are carried out index by technological means and functional effect; The data computation submodule is used for calculating the quantity of index by technological means and functional effect;
The image output module of one hot technology and blank spot, be used to export a matrix diagram, this matrix diagram transverse axis is the functional effect that patent reaches, the longitudinal axis is the technological means that patent adopted, the point of crossing represents that these relevant art means realize the patent quantity of this functional effect, and the area and the quantity of described point of crossing graphics shape are proportional.
2. the analytic system of hot technology and blank spot in the patent analyses according to claim 1, it is characterized in that: the patent data that stores in the described patent database comprises patent descriptive entry, abridgments of specifications and Patent right requirement.
3. the analytic system of hot technology and blank spot in the patent analyses according to claim 1, it is characterized in that: described patent database is installed on the webserver, carries out patent retrieval and inquiry as the technician of client with any IP address login patent database.
4. the analytic system of hot technology and blank spot in the patent analyses according to claim 1, it is characterized in that: the patented technology analysis module provides visual user interface.
5. the analytic system of hot technology and blank spot in the patent analyses according to claim 4, it is characterized in that: described user interface provides data updating unit, is used for upgrading the patent data of patent database.
6. the analytic system of hot technology and blank spot in the patent analyses according to claim 1 is characterized in that: described data acquisition submodule is used for retrieving at patent database image data.
7. the analytic system of hot technology and blank spot in the patent analyses according to claim 1 is characterized in that: described data processing submodule carries out deep processing by patent IPC, date or keyword to the patent data that collects.
8. the analytic system of hot technology and blank spot in the patent analyses according to claim 1 is characterized in that: described indexing data submodule is that the patent data after the processing is carried out artificial or automatic indexing by technological means and two aspects of functional effect.
9. the analytic system of hot technology and blank spot in the patent analyses according to claim 1, it is characterized in that: described hot technology and blank spot output module comprise the data lead-out unit of hot technology and the relevant patent information of blank spot, the pairing patent in the point of crossing among the derivational matrix figure.
10. the analytical approach of hot technology and blank spot in the patent analyses is characterized in that comprising following steps:
(1) sets up patent database, be used to store patent data; (2) finish the analysis data processing by the patented technology analysis module, it is the patent data that the data acquisition submodule is gathered from patent database needs analysis, the submodule of data processing is then processed the patent data that collects, then the indexing data submodule carries out index to the data after processing, the data volume of each technological means and functional effect after the final data calculating sub module calculating index; (3) image output module is exported a matrix diagram, and the size by the point of crossing figure shows patented technology focus and blank spot.
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| Application Number | Priority Date | Filing Date | Title |
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| CN200910052265A CN101714150A (en) | 2009-05-31 | 2009-05-31 | System and method for analyzing technical hotspots and blank spots in patent analysis |
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| CN200910052265A CN101714150A (en) | 2009-05-31 | 2009-05-31 | System and method for analyzing technical hotspots and blank spots in patent analysis |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103164540A (en) * | 2013-04-15 | 2013-06-19 | 武汉大学 | Patent hotspot discovery and trend analysis method |
| CN103810242A (en) * | 2013-11-29 | 2014-05-21 | 北京知立方科技有限公司 | System and method for automatically recognizing innovative literature graticules and literature positions |
| CN103810243A (en) * | 2013-11-29 | 2014-05-21 | 北京知立方科技有限公司 | Innovative hotspot pre-warning recognition system and method |
| CN103824161A (en) * | 2014-02-28 | 2014-05-28 | 惠州学院 | Cloud computing patentability technology navigation system and method |
| CN108614867A (en) * | 2018-04-12 | 2018-10-02 | 科技部科技评估中心 | Frontline technology sex index computational methods based on scientific paper and system |
| CN108932351A (en) * | 2018-08-20 | 2018-12-04 | 北京理工大学 | A kind of capture of carbon and Plugging Technology Applied route drawing generating method and system |
-
2009
- 2009-05-31 CN CN200910052265A patent/CN101714150A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103164540A (en) * | 2013-04-15 | 2013-06-19 | 武汉大学 | Patent hotspot discovery and trend analysis method |
| CN103164540B (en) * | 2013-04-15 | 2016-08-17 | 武汉大学 | A kind of patent hotspot finds and trend analysis |
| CN103810242A (en) * | 2013-11-29 | 2014-05-21 | 北京知立方科技有限公司 | System and method for automatically recognizing innovative literature graticules and literature positions |
| CN103810243A (en) * | 2013-11-29 | 2014-05-21 | 北京知立方科技有限公司 | Innovative hotspot pre-warning recognition system and method |
| CN103824161A (en) * | 2014-02-28 | 2014-05-28 | 惠州学院 | Cloud computing patentability technology navigation system and method |
| CN108614867A (en) * | 2018-04-12 | 2018-10-02 | 科技部科技评估中心 | Frontline technology sex index computational methods based on scientific paper and system |
| CN108932351A (en) * | 2018-08-20 | 2018-12-04 | 北京理工大学 | A kind of capture of carbon and Plugging Technology Applied route drawing generating method and system |
| CN108932351B (en) * | 2018-08-20 | 2020-06-23 | 北京理工大学 | Method and system for generating route map of carbon capture and sequestration technology |
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Application publication date: 20100526 |