CN101676736A - Test wiring platform containing multiple groups of wiring plates - Google Patents
Test wiring platform containing multiple groups of wiring plates Download PDFInfo
- Publication number
- CN101676736A CN101676736A CN200810200065A CN200810200065A CN101676736A CN 101676736 A CN101676736 A CN 101676736A CN 200810200065 A CN200810200065 A CN 200810200065A CN 200810200065 A CN200810200065 A CN 200810200065A CN 101676736 A CN101676736 A CN 101676736A
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- China
- Prior art keywords
- wiring
- groove
- test
- anchor clamps
- high frequency
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Multi-Conductor Connections (AREA)
Abstract
The invention discloses a test wiring platform comprising multiple groups of wiring plates, which comprises at least two groups of wiring plates. The invention can comprise two groups or multiple groups of test wiring plates. Each group of wiring plate can be applied with same structure, which can be convenient for testing and shortening testing time; each group of wiring plate also can be appliedwith various structure for adapting various testing conditions.
Description
Technical field
The present invention relates to a kind of modular fixture device that is used for the test cable performance parameter, but relate in particular to a kind of fast-wiring, also the wiring platform that can test the cable that higher frequency requires.
Background technology
The termination that is used for wireline test decides the test condition of cable according to anchor clamps self structure difference.Test frequency is high more, and cable wire stripping length must be short more, like this structure and the shield effectiveness of whole termination is all had higher requirement.
Notification number is that the Chinese utility model patent of CN2709992Y relates to a kind of like this Cable Test Platform.Realize wiring by the crimping mode.It comprises that one is installed in test bodies on the base, the test bodies cavity that is connected with the base circuit is arranged, and includes the wiring anchor clamps in the cavity, is communicated with the circuit board and the shielding material of base build-in test line.Wherein, circuit board is located at the cavity below, and the wiring anchor clamps also are provided with button and electric wire connecting junction on the anchor clamps on circuit board.Cable is worn between anchor clamps and the circuit board from the external world, and by the button down anchor clamps, the contact spring in the electric wire connecting junction opens, cable pair stretches into wiring hole, behind the release button, and the spring closure, make electric wire connecting junction reliably clamp cable pair, and be fixed on the circuit board, realized wiring thus.After test finishes, only need press the button once more, just can be with line to extracting out.Very easy to use.Described wiring anchor clamps can have a plurality of, arrange in fan-shaped mode.A plurality of lines in such cable are connected with p-wire by the wiring anchor clamps in the cavity just inserting cavity successively.Shielding material in cavity and the cavity plays shielding action.
In view of this, this test platform has quick connection and the right advantage of dismounting line, and certain shield effectiveness is also arranged.Can satisfy the demand of most of wireline test.But because this anchor clamps adopt line that the mode of inserting cavity is realized fixing, have only the per share line of working as, just calculate and finish clamping all having entered cavity.If it is too small to leave the space that is inserted into cable between anchor clamps for, it is right probably can to occur having operated first line, to all the other lines when operating, need carry out to operate smoothly after the bending to it, cause line easily to the change of structure (as change of screen layer etc.), thereby influence high-frequency test.Because this is determined that by this body structure of anchor clamps therefore whole test platform is difficult in and is further adjusted the length that shortens wire stripping on the structure, to adapt to higher frequency test and shielding requirements.
Summary of the invention
But the technical matters that the present invention will solve provides a kind of fast-wiring and carries out wireline test; The wireline test wiring platform that also can require cable to test to higher frequency simultaneously is to satisfy the demand of different wireline test conditions.
For solving the problems of the technologies described above, the present invention by the following technical solutions:
A kind of test wiring platform that contains many windings drum comprises two winding drums at least.
Preferably, described patching panel comprises fast-wiring dish and Wiring plate with high frequency, described Wiring plate with high frequency comprises the disk body and first anchor clamps, described first anchor clamps comprise first base, with the cover plate pivotally connected with first base, be provided with latch mechanism between described first base and the cover plate, first base is provided with the contact, and cover plate is provided with compression leg on the position corresponding to the contact.
Preferably, described first base comprises first groove, and the contact is located in first groove, and the compression leg on the described cover plate can embed in first groove.
Preferably, described first base and cover plate are terminal pivotally connected separately, and described first groove is located at the top of first base.
Further, the disk body of described Wiring plate with high frequency is provided with second groove, and described first anchor clamps are embedded in second groove.
Preferably, described first anchor clamps have a plurality of, along the circumferential direction are distributed on the Wiring plate with high frequency.
Further, the disk body center of described Wiring plate with high frequency is provided with the counterbore of perforation.
Preferably, Wiring plate with high frequency also comprises the first lead latch that cooperates with counterbore, and the described first lead latch is provided with the 3rd groove that communicates with first groove.
Preferably, Wiring plate with high frequency also comprises the second lead latch that cooperates with counterbore, and the described second lead latch is provided with the 4th groove that communicates with first groove, and the center is provided with through hole.
Further, also comprise second anchor clamps of clamping cable in vertical direction on the described Wiring plate with high frequency.
Preferably, also comprise first, second panel, described fast-wiring dish and Wiring plate with high frequency are located at respectively on first, second panel.
The present invention can comprise two or more sets test patching panels.Between each winding drum same structure can be arranged, can conveniently test like this, shorten the test duration; Also different structures can be arranged between each winding drum, to adapt to different test conditions.When using the wiring platform,, it is inserted the fast-wiring dish if during the wireline test that lower frequency is required; If need insert Wiring plate with high frequency to the wireline test of higher frequency requirement, can select different patching panels according to the different frequency test request.
Preferably, the present invention is equipped with the realization wiring by compression leg and contact: be provided with the contact in first groove, cable pair enters first groove, the first anchor clamps closure, compression leg just can with line under be pressed on the contact, realize to connect, latch mechanism can guarantee that line pair contacts with the good of contact.
Because first anchor clamps are the flip-shell anchor clamps, after cover plate is opened, reserved enough operating spaces for cable to be connect, as long as make each line to contacting with the contact, the cover plate that closes gets final product.Compare with plug-in type anchor clamps in the prior art, this anchor clamps can shorten wire stripping length greatly, and preferably, first anchor clamps layout along the circumferential direction reaches the design that first groove is positioned at the first anchor clamps front end, can both more effectively shorten cable wire stripping length.Therefore, the present invention can be used for the higher frequency test.
In addition, the present invention has fully taken into account shielding action: compression leg cooperates with the embedding of first groove; Whole first anchor clamps are embedded in second groove of Wiring plate with high frequency; And the cooperating of center counterbore and first, second lead latch, can both guarantee effective shielding.
Description of drawings
Fig. 1 is the three-dimensional effect diagram of the test wiring platform that contains many windings drum that the present invention relates to.
Fig. 2 is the structural representation of the Wiring plate with high frequency that the present invention relates to.
Fig. 3 is the structural representation of first anchor clamps and first groove in the Wiring plate with high frequency.
Fig. 4 removes vertical view behind second anchor clamps for Wiring plate with high frequency.
Fig. 5 is the synoptic diagram of explanation Wiring plate with high frequency and the assembling of first, second lead latch.
Fig. 6 is the structural representation of the first lead latch.
Fig. 7 is the structural representation of the second lead latch.
Wherein,
1. fast-wiring dish 37. second lead latches
2. first panel, 38. contacts
3. Wiring plate with high frequency 321. first grooves
4. second panel, 322. latch mechanisms
31. second base, 323. compression legs
32. first anchor clamps, 324. cover plates
33. second anchor clamps, 325. first bases
34. second groove 361. the 3rd groove
35. counterbore 371. the 4th groove
36. the first lead latch, 372. through holes
Embodiment
Shown in Fig. 1-7, shown in Fig. 1 is the test platform that the present invention relates to.It is made up of the panel of two different directions.Establish a pair of fast-wiring dish 1 on first panel 2, the base of fast-wiring dish 1 is provided with test bodies, one cavity is arranged in the test bodies, comprised the circuit board that is connected with p-wire in four plug-in type anchor clamps (the 3rd anchor clamps), the base in the cavity, and shielding material.Anchor clamps are arranged in fan-shaped mode, and it is right that cable splits into four strands, enter anchor clamps place cavity separately successively, realize establishing being connected of circuit board in line pair and the cavity by the mode of pressing down.Adopt this patching panel inlet wire and to take out line all very convenient, but because this anchor clamps adopt line that the mode of inserting cavity is realized fixing, have only when per share line to all having entered cavity, just clamping is finished in calculation.If it is too small to leave the space that is inserted into cable between anchor clamps for, it is right probably can to occur having operated first line, to all the other lines when operating, need carry out to operate smoothly after the bending to it, cause line easily to the change of structure (as change of screen layer etc.), thereby influence high-frequency test.Use this anchor clamps clamping wireline test, cable wire stripping length requirement is longer, and because body exposes and is located on the base, shield effectiveness is not best, so this kind patching panel is fit to the test of lower frequency cable.
Establish a pair of Wiring plate with high frequency 3 on second panel 4.Structural representation referring to Fig. 2.This patching panel comprises and along the circumferential direction uniformly-spaced is provided with four roads, second groove 34 on one second base, 31, the second bases 31, all is embedded with first anchor clamps 32 in the per pass groove.First anchor clamps 32 comprise one first base 325 and cover plate 324, and by pivotally connected, first base 325 is fixedlyed connected with second groove 34 at separately end for the cover plate 324 and first base 325.At the corresponding latch mechanism 322 that is provided with of the center section of first base 325 and cover plate 324, cover plate 324 is turned down, with first base, 325 closures, latch mechanism 322 can with above-mentioned both link closely.Cover plate 324 can be slightly longer than first base 325, is provided with in first groove, 321, the first grooves 321 at the top of first base 325 and is provided with contact 38, and interior circuit board or the test signal line of this contact 38 and second base 31 is connected.Be provided with compression leg 323 on the relevant position of cover plate 324, when cover plate 324 and first base 325 were closed, compression leg 323 can embed in first groove 321, and is wired when coming in, because the downforce of compression leg 323, line pair is connected with contact 38.
Compare with the fast-wiring dish, Wiring plate with high frequency adopts the wiring of flip-shell anchor clamps.First groove is provided with contact 38 for 321 li, as long as cable pair enters in first groove 321, first anchor clamps, 32 closures, compression leg 323 just can with line under be pressed on the contact 38, realize to connect, latch mechanism 322 can guarantee that line pair contacts with the good of contact 38.
Because first anchor clamps 32 are the flip-shell anchor clamps, after cover plate is opened, reserved enough operating spaces for cable to be connect, as long as make each line to contacting with the contact, the cover plate 32 that closes gets final product.Compare with plug-in type anchor clamps in the prior art, this anchor clamps can shorten wire stripping length greatly.Preferably, first anchor clamps 32 layout along the circumferential direction reaches the design that first groove 321 is positioned at first anchor clamps, 32 front ends, can shorten cable wire stripping length better.
In addition, compression leg 323 cooperates with the embedding of first groove 321, and whole first anchor clamps 32 are embedded in second groove 34 of Wiring plate with high frequency 3, can both play good shielding action.
Preferably, the center of Wiring plate with high frequency 3 is provided with the counterbore 35 of perforation, correspondingly, has the first lead latch 36 and the second lead latch 37 to cooperate with it respectively.Described first lead latch 36 and the second lead latch, 37 shapes are much at one, all be provided with four roads the 3rd grooves 361 (or the 4th groove 371), with four first anchor clamps, 32 corresponding communicating (i.e. while and first groove, 321 corresponding communicating), unique different be that the center of the second lead latch 37 also is provided with through hole 372.It is fixing with Wiring plate with high frequency 3 that above-mentioned two accessories are inserted counterbore 35, and the effect that groove is set is can not only static line right, played the effect of shielding simultaneously.Perforation enters cable cleat to line to selecting from different directions according to the actual needs in when test.When cable enters from the front of Wiring plate with high frequency 3 when implementing test, be used the first lead latch 36.Cable is by the 33 vertical clampings of second anchor clamps, and line begins to separate to the center at Wiring plate with high frequency 3, enter successively separately the 3rd groove 361 and first groove 321 under first anchor clamps 32.When cable during, change the second lead latch 37 and insert and get final product from reverse entering.
The wire stripping length of Wiring plate with high frequency is short, have only 19mm, and shield effectiveness is good, is more suitable for being used for high-frequency test.During test, same patching panel uses in pairs, and of cable is connected on the Wiring plate with high frequency, and the other end correspondence is connected on another Wiring plate with high frequency and gets final product.During the lower frequency test, the cable connected mode also is like this.
When survey frequency is relatively low, allow wire stripping length longer, adopt the fast-wiring dish can reach the purpose of rapid wiring, guarantee measuring accuracy simultaneously; When survey frequency is higher, allow wire stripping length shorter, the line that be stripped from this moment is stronger to rigidity, and wiring requires need corresponding anchor clamps, so the wiring cycle to be longer relatively than higher.The present invention can select suitable test patching panel according to different test requests by this combination on same equipment, reach the test request that adapts to various cables, improves test speed simultaneously.
Claims (11)
1. a test wiring platform that contains many windings drum is characterized in that: comprise two winding drums at least.
2. the test wiring platform that contains many windings drum according to claim 1, it is characterized in that: described patching panel comprises fast-wiring dish (1) and Wiring plate with high frequency (3), described Wiring plate with high frequency (3) comprises the disk body and first anchor clamps, described first anchor clamps (32) comprise first base (325), with the cover plate (324) pivotally connected with first base (325), be provided with latch mechanism (322) between described first base (325) and the cover plate (324), first base (325) is provided with contact (38), and cover plate (324) is provided with compression leg (323) on the position corresponding to contact (38).
3. the test wiring platform that contains many windings drum according to claim 2, it is characterized in that: described first base (325) comprises first groove (321), contact (38) is located in first groove (321), and the compression leg (323) on the described cover plate (324) can embed in first groove (321).
4. the test wiring platform that contains many windings drum according to claim 3 is characterized in that: described first base (325) and cover plate (324) are terminal pivotally connected separately, and described first groove (321) is located at the top of first base (325).
5. the test wiring platform that contains many windings drum according to claim 4, it is characterized in that: the disk body of described Wiring plate with high frequency (3) is provided with second groove (34), and described first anchor clamps (32) are embedded in second groove (34).
6. the test wiring platform that contains many windings drum according to claim 5, it is characterized in that: described first anchor clamps (32) have a plurality of, along the circumferential direction are distributed on the Wiring plate with high frequency (3).
7. the test wiring platform that contains many windings drum according to claim 6 is characterized in that: the disk body center of described Wiring plate with high frequency (3) is provided with the counterbore (35) of perforation.
8. the test wiring platform that contains many windings drum according to claim 7, it is characterized in that: Wiring plate with high frequency (3) also comprises the first lead latch (36) that cooperates with counterbore (35), and the described first lead latch (36) is provided with the 3rd groove (361) that communicates with first groove (321).
9. the test wiring platform that contains many windings drum according to claim 7, it is characterized in that: Wiring plate with high frequency (3) also comprises the second lead latch (37) that cooperates with counterbore (35), the described second lead latch (37) is provided with the 4th groove (371) that communicates with first groove (321), and the center is provided with through hole (372).
10. the test wiring platform that contains many windings drum according to claim 8 is characterized in that: also comprise second anchor clamps (33) of clamping cable in vertical direction on the described Wiring plate with high frequency (3).
11. according to each described test wiring platform that contains many windings drum among the claim 1-10, it is characterized in that: also comprise first, second panel (2,4), described fast-wiring dish (1) and Wiring plate with high frequency (3) are located at respectively on first, second panel (2,4).
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008102000655A CN101676736B (en) | 2008-09-18 | 2008-09-18 | Test wiring platform containing multiple groups of wiring plates |
| PCT/CN2008/072431 WO2010031220A1 (en) | 2008-09-18 | 2008-09-19 | A testing connector flat roof having multi-group connection trays |
| CH00466/11A CH702178B1 (en) | 2008-09-18 | 2008-09-19 | Test port platform with multiple Connections hlussplattengruppen. |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2008102000655A CN101676736B (en) | 2008-09-18 | 2008-09-18 | Test wiring platform containing multiple groups of wiring plates |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101676736A true CN101676736A (en) | 2010-03-24 |
| CN101676736B CN101676736B (en) | 2011-09-14 |
Family
ID=42029370
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2008102000655A Active CN101676736B (en) | 2008-09-18 | 2008-09-18 | Test wiring platform containing multiple groups of wiring plates |
Country Status (3)
| Country | Link |
|---|---|
| CN (1) | CN101676736B (en) |
| CH (1) | CH702178B1 (en) |
| WO (1) | WO2010031220A1 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105004361A (en) * | 2015-08-05 | 2015-10-28 | 四川永贵科技有限公司 | Multifunctional general wiring harness detection platform |
| CN105628981A (en) * | 2014-10-30 | 2016-06-01 | 上海电缆研究所 | High-frequency cable testing platform |
| CN112034223A (en) * | 2020-08-25 | 2020-12-04 | 杭州巨骐信息科技股份有限公司 | Isolation system between high-voltage circuit and data acquisition monitoring circuit |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102012111720A1 (en) * | 2012-12-03 | 2014-06-05 | Reichle & De-Massari Ag | Cable adapting device for determining quality of cable, has wire guide portions that are provided to guide different wires of sample in main directions, and are arranged at specific angle to each other |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5543718A (en) * | 1994-04-08 | 1996-08-06 | Dcm Industries, Inc. | Cable testing device |
| US6853205B1 (en) * | 2003-07-17 | 2005-02-08 | Chipmos Technologies (Bermuda) Ltd. | Probe card assembly |
| CN2709992Y (en) * | 2004-07-14 | 2005-07-13 | 上海电缆研究所 | Cable testing platform |
| CN2924548Y (en) * | 2006-06-15 | 2007-07-18 | 王祥贵 | Multifunctional cable testing instrument |
| CN201096845Y (en) * | 2007-09-11 | 2008-08-06 | 上海电缆研究所 | Shielding lead slot tray and testing device applicable to multiple different cable pairs |
-
2008
- 2008-09-18 CN CN2008102000655A patent/CN101676736B/en active Active
- 2008-09-19 CH CH00466/11A patent/CH702178B1/en unknown
- 2008-09-19 WO PCT/CN2008/072431 patent/WO2010031220A1/en active Application Filing
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105628981A (en) * | 2014-10-30 | 2016-06-01 | 上海电缆研究所 | High-frequency cable testing platform |
| CN105628981B (en) * | 2014-10-30 | 2018-09-25 | 上海电缆研究所有限公司 | High frequency cable test platform |
| CN105004361A (en) * | 2015-08-05 | 2015-10-28 | 四川永贵科技有限公司 | Multifunctional general wiring harness detection platform |
| CN112034223A (en) * | 2020-08-25 | 2020-12-04 | 杭州巨骐信息科技股份有限公司 | Isolation system between high-voltage circuit and data acquisition monitoring circuit |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2010031220A1 (en) | 2010-03-25 |
| CH702178B1 (en) | 2011-09-15 |
| CN101676736B (en) | 2011-09-14 |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 200093 No. 1000, military road, Shanghai, Yangpu District Patentee after: SHANGHAI ELECTRIC CABLE RESEARCH INSTITUTE Co.,Ltd. Patentee after: Shanghai Saikeli Photoelectric Technology Co.,Ltd. Address before: 200093 No. 1000, military road, Shanghai, Yangpu District Patentee before: SHANGHAI ELECTRIC CABLE Research Institute Patentee before: SHANGHAI SECRI OPTICAL&ELECTRIC CABLE Co.,Ltd. |
|
| CP01 | Change in the name or title of a patent holder |