CN101654780A - Preparation method of Bi3.2Nd0.8Ti3O12 ferroelectric film - Google Patents

Preparation method of Bi3.2Nd0.8Ti3O12 ferroelectric film Download PDF

Info

Publication number
CN101654780A
CN101654780A CN200910023722A CN200910023722A CN101654780A CN 101654780 A CN101654780 A CN 101654780A CN 200910023722 A CN200910023722 A CN 200910023722A CN 200910023722 A CN200910023722 A CN 200910023722A CN 101654780 A CN101654780 A CN 101654780A
Authority
CN
China
Prior art keywords
solution
film
substrate
bismuth
precursor solution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN200910023722A
Other languages
Chinese (zh)
Inventor
贺海燕
曹丽云
黄剑锋
吴建鹏
于慧阳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shaanxi University of Science and Technology
Original Assignee
Shaanxi University of Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shaanxi University of Science and Technology filed Critical Shaanxi University of Science and Technology
Priority to CN200910023722A priority Critical patent/CN101654780A/en
Publication of CN101654780A publication Critical patent/CN101654780A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Formation Of Insulating Films (AREA)
  • Semiconductor Memories (AREA)
  • Inorganic Compounds Of Heavy Metals (AREA)

Abstract

A preparation method of a Bi3.2Nd0.8Ti3O12 ferroelectric film comprises the following steps: respectively dissolving bismuth nitrate or bismuth acetate and neodymium nitrate into glacial acetic acid according to the Bi3.2Nd0.8Ti3O12 chemical formula to obtain solution A and then regulating the solution A until the pH value is less than 3 to obtain solution B; dissolving butyl titanate or tetrabutyl titanate into the glacial acetic acid to obtain solution C and then adding acetylacetone into the solution C to obtain solution D; mixing the solution B and the solution D to obtain precursor solution, coating the precursor solution on a substrate by the technology of dip coating or spin coating and cooling the coated substrate at different annealing temperatures to obtain a c-oriented film or an a-oriented film. In the method, the Bi3.2Nd0.8Ti3O12 film is deposited on the single crystal silicon substrate by a chemical solution deposition method and a metal organic solution method. The singly c-oriented Bi3.2Nd0.8Ti3O12 ferroelectric film is obtained by quick temperature rise between 650 DEG C and 1000 DEG C, and the a-oriented Bi3.2Nd0.8Ti3O12 ferroelectric film is obtained by preheating treatment at 350-400 DEG C and further annealing at 650-750 DEG C.

Description

A kind of Bi 3.2Nd 0.8Ti 3O 12The preparation method of ferroelectric membranc
Technical field
The invention belongs to field of material preparation, be specifically related to a kind of Bi 3.2La 0.8Ti 3O 12The preparation method of ferroelectric membranc.
Background technology
Bi 3.2Nd 0.8Ti 3O 12Ferroelectric membranc has the characteristics of the big and antifatigue of polarization.It is very important electron material of the class with potential using value of permanent random access memory (NVRAM) and dynamic randon access memory in (DRAM).In these are used, require film that low coercive field, high residual polarization, low leakage current and low polarization fatigue are arranged.Big residual polarization is arranged Pb-based lanthanumdoped zirconate titanates (PZT) film but anti-fatigue performance is poor.Barium titanate, barium strontium titanate ferroelectric film have preferably anti-fatigue performance but poor-performings such as residual polarization.(Wang H., Ren M.F., Effects ofOrientated Growthon Properties of Ag/Bi such as Smolenskii 4Ti 3O 12/ p-Si Heterostructure Prepared by Sol-gel Methodwith Rapid Thermal Annealing Techniques, J.Mat.Sci.:Mat.In Eletronics, 2005,16,209-213) find bismuth layer perovskite structure pottery (SrB i 2Ta 2O 9, SrBi 2NbTaO 9, SrB i 4Ta 4O 15And Bi 4Ti 3O 12Deng) have ferroelectricity and high Curie temperature and big anti-fatigue performance are arranged.But the remnant polarization of their thin-film material is then relatively low.In order to utilize Bi 4Ti 3O 12The advantage of the high-curie temperature of ferroelectric material and big residual polarization overcomes the fatiguability characteristics, discovers lanthanum, neodymium, samarium] and ruthenium ion partly replace bismuth ion and enter the electropolarization performance that the bismuth layer can improve film, significantly improve anti-fatigue performance.Just ion Bi is thought in some researchs 4Ti 3O 12The electropolarization direction of film is the a-axle, then thinks ion doping Bi in other researchs 4Ti 3O 12The electropolarization direction of film is at the c-axle.But a large amount of data in literature shows that so-called orientation is actually indirect or several orientations and exists the orientation degree on certain orientation just bigger simultaneously.On the electropolarization direction, increase orientation degree and mean the increase polarization.Therefore, for the electropolarization discovery of studying such film and the film that obtains large electrode intensity, be necessary to prepare the high-orientation film of two kinds of orientations, research obtains the processing condition of various oriented films.
Summary of the invention
The object of the present invention is to provide the simple Bi of a kind of preparation technology 3.2Nd 0.8Ti 3O 12The preparation method of ferroelectric membranc can prepare single oriented film that high a-is orientated and high c-is orientated by preparation method of the present invention.
For achieving the above object, the technical solution used in the present invention is:
1) preparation precursor solution:
At first, press Bi 3.2Nd 0.8Ti 3O 12Chemical formula is got Bismuth trinitrate or bismuth acetate respectively, neodymium nitrate and butyl (tetra) titanate or tetrabutyl titanate, then Bismuth trinitrate or bismuth acetate and neodymium nitrate are dissolved in and obtain solution A in the glacial acetic acid, in solution A, add again after the Bismuth trinitrate of Bismuth trinitrate in the solution A or bismuth acetate quality 5~10% or the bismuth acetate with hydrochloric acid regulate pH<3 solution B;
Secondly, butyl (tetra) titanate or tetrabutyl titanate be dissolved in obtain solution C in the glacial acetic acid, in solution C, add methyl ethyl diketone again and obtain solution D;
At last, solution B and solution D are mixed, in mixing solutions, regulate the concentration of mixing solutions to metal ion Ti with glacial acetic acid behind adding ethylene glycol and the citric acid again 4+Volumetric molar concentration to metal ion Ti 4+Volumetric molar concentration be that 0.01mol/l obtains precursor solution, metal ion in the precursor solution: ethylene glycol: citric acid: methyl ethyl diketone=1: (1~4): (1~2): 0.1;
2) film: adopt dip-coating or spin coating proceeding that precursor solution is coated on the substrate, after each coating with it 120-150 ℃ of drying, above-mentioned repeatedly coating and drying process are until the film that obtains required thickness;
3) annealing:
The substrate of substrate after filming from room temperature is warming up to 650~1000 ℃ of annealing 3min or directly will films with the temperature rise rate of 200~300 ℃/min after put into take out cooling from stove immediately behind 650-1000 ℃ the High Temperature Furnaces Heating Apparatus annealing 3min and obtain c-orientation Bi 3.2Nd 0.8Ti 3O 12Film;
Substrate after maybe will filming is warming up to 650-750 ℃ of annealing 3-60min with the temperature rise rate greater than 200~300 ℃/min and obtains a-orientation Bi behind 350-400 ℃ of thermal pretreatment 10min 3.2Nd 0.8Ti 3O 12Film.
The present invention is in order to reduce the viscosity of precursor solution, with precursor solution at 60-80 ℃ of gelation 30-60min; Said substrate adopts monocrystalline silicon substrate, uses dehydrated alcohol and acetone respectively to the monocrystalline silicon substrate drying in air after ultrasonic cleaning before filming.
Applied chemistry solution-deposition method of the present invention and organic metal solution method deposit Bi on monocrystalline silicon substrate 3.2Nd 0.8Ti 3O 12Film.At 650-1000 ℃ of list orientation Bi that is rapidly heated and obtains the c-orientation 3.2Nd 0.8Ti 3O 12Film.Obtain a-orientation Bi in 350-400 ℃ of thermal pretreatment and 650-750 ℃ of further annealing 3.2Nd 0.8Ti 3O 12Film.
Description of drawings
Fig. 1 (a) is 700 ℃ and 800 ℃ of Bi with c-orientation that short annealing 3min obtains 3.2Nd 0.8Ti 3O 12The XRD figure of film, Fig. 1 (b) is 400 ℃ of Bi with a-orientation that anneal 10min and obtain behind 700 ℃ of annealing 3min and 10min 3.2Nd 0.8Ti 3O 12The XRD figure of film.
Embodiment
Below in conjunction with drawings and Examples the present invention is described in further detail.
Embodiment 1:
1) preparation precursor solution:
At first, press Bi 3.2Nd 0.8Ti 3O 12Chemical formula is got Bismuth trinitrate respectively, and neodymium nitrate and butyl (tetra) titanate are dissolved in Bismuth trinitrate and neodymium nitrate then and obtain solution A in the glacial acetic acid, in solution A, add again after the Bismuth trinitrate of Bismuth trinitrate quality 5% in the solution A with hydrochloric acid regulate pH<3 solution B;
Secondly, butyl (tetra) titanate is dissolved in obtains solution C in the glacial acetic acid, in solution C, add methyl ethyl diketone again and obtain solution D;
At last, solution B and solution D are mixed, in mixing solutions, regulate the concentration of mixing solutions to metal ion Ti with glacial acetic acid behind adding ethylene glycol and the citric acid again 4+Volumetric molar concentration to metal ion Ti 4+Volumetric molar concentration be that 0.01mol/l obtains precursor solution, metal ion in the precursor solution: ethylene glycol: citric acid: methyl ethyl diketone=1: 1: 1: 0.1, in order to reduce the viscosity of precursor solution, with precursor solution at 60 ℃ of gelation 60min;
2) film: get monocrystalline silicon substrate, use dehydrated alcohol and acetone respectively to the monocrystalline silicon substrate drying in air after ultrasonic cleaning before filming, adopt dip-coating or spin coating proceeding that precursor solution is coated on the substrate, after each coating with it 120 ℃ of dryings, above-mentioned repeatedly coating and drying process are until the film that obtains required thickness;
3) annealing:
The substrate of substrate after filming from room temperature is warming up to 650 ℃ of annealing 3min or directly will films with the temperature rise rate of 200 ℃/min after put into take out cooling from stove immediately behind 650 ℃ the High Temperature Furnaces Heating Apparatus annealing 3min and obtain c-orientation Bi 3.2Nd 0.8Ti 3O 12Film (is seen Fig. 1 a);
Substrate after maybe will filming is warming up to 650 ℃ of annealing 60min with the temperature rise rate greater than 200 ℃/min and obtains a-orientation Bi behind 400 ℃ of thermal pretreatment 10min 3.2Nd 0.8Ti 3O 12Film (seeing Fig. 1 b).
Embodiment 2:
1) preparation precursor solution:
At first, press Bi 3.2Nd 0.8Ti 3O 12Chemical formula is got bismuth acetate respectively, and neodymium nitrate and tetrabutyl titanate are dissolved in bismuth acetate and neodymium nitrate then and obtain solution A in the glacial acetic acid, in solution A, add again after the bismuth acetate of bismuth acetate quality 5% in the solution A with hydrochloric acid regulate pH<3 solution B;
Secondly, tetrabutyl titanate is dissolved in obtains solution C in the glacial acetic acid, in solution C, add methyl ethyl diketone again and obtain solution D;
At last, solution B and solution D are mixed, in mixing solutions, regulate the concentration of mixing solutions to metal ion Ti with glacial acetic acid behind adding ethylene glycol and the citric acid again 4+Volumetric molar concentration to metal ion Ti 4+Volumetric molar concentration be that 0.01mol/l obtains precursor solution, metal ion in the precursor solution: ethylene glycol: citric acid: methyl ethyl diketone=1: 2: 1.5: 0.1, in order to reduce the viscosity of precursor solution, with precursor solution at 70 ℃ of gelation 45min;
2) film: get monocrystalline silicon substrate, use dehydrated alcohol and acetone respectively to the monocrystalline silicon substrate drying in air after ultrasonic cleaning before filming, adopt dip-coating or spin coating proceeding that precursor solution is coated on the substrate, after each coating with it 135 ℃ of dryings, above-mentioned repeatedly coating and drying process are until the film that obtains required thickness;
3) annealing:
The substrate of substrate after filming from room temperature is warming up to 800 ℃ of annealing 3min or directly will films with the temperature rise rate of 240 ℃/min after put into take out cooling from stove immediately behind 800 ℃ the High Temperature Furnaces Heating Apparatus annealing 3min and obtain c-orientation Bi 3.2Nd 0.8Ti 3O 12Film;
Substrate after maybe will filming is warming up to 700 ℃ of annealing 30min with the temperature rise rate greater than 260 ℃/min and obtains a-orientation Bi behind 380 ℃ of thermal pretreatment 10min 3.2Nd 0.8Ti 3O 12Film.
Embodiment 3:
1) preparation precursor solution:
At first, press Bi 3.2Nd 0.8Ti 3O 12Chemical formula is got Bismuth trinitrate respectively, and neodymium nitrate and tetrabutyl titanate are dissolved in Bismuth trinitrate and neodymium nitrate then and obtain solution A in the glacial acetic acid, in solution A, add again after the Bismuth trinitrate of Bismuth trinitrate quality 10% in the solution A with hydrochloric acid regulate pH<3 solution B;
Secondly, tetrabutyl titanate is dissolved in obtains solution C in the glacial acetic acid, in solution C, add methyl ethyl diketone again and obtain solution D;
At last, solution B and solution D are mixed, in mixing solutions, regulate the concentration of mixing solutions to metal ion Ti with glacial acetic acid behind adding ethylene glycol and the citric acid again 4+Volumetric molar concentration to metal ion Ti 4+Volumetric molar concentration be that 0.01mol/l obtains precursor solution, metal ion in the precursor solution: ethylene glycol: citric acid: methyl ethyl diketone=1: 4: 2: 0.1, in order to reduce the viscosity of precursor solution, with precursor solution at 80 ℃ of gelation 30min;
2) film: get monocrystalline silicon substrate, use dehydrated alcohol and acetone respectively to the monocrystalline silicon substrate drying in air after ultrasonic cleaning before filming, adopt dip-coating or spin coating proceeding that precursor solution is coated on the substrate, after each coating with it 150 ℃ of dryings, above-mentioned repeatedly coating and drying process are until the film that obtains required thickness;
3) annealing:
The substrate of substrate after filming from room temperature is warming up to 1000 ℃ of annealing 3min or directly will films with the temperature rise rate of 300 ℃/min after put into take out cooling from stove immediately behind 1000 ℃ the High Temperature Furnaces Heating Apparatus annealing 3min and obtain c-orientation Bi 3.2Nd 0.8Ti 3O 12Film;
Substrate after maybe will filming is warming up to 750 ℃ of annealing 3min with the temperature rise rate greater than 300 ℃/min and obtains a-orientation Bi behind 350 ℃ of thermal pretreatment 10min 3.2Nd 0.8Ti 3O 12Film.

Claims (3)

1, a kind of Bi 3.2Nd 0.8Ti 3O 12The preparation method of ferroelectric membranc is characterized in that, may further comprise the steps:
1) preparation precursor solution:
At first, press Bi 3.2Nd 0.8Ti 3O 12Chemical formula is got Bismuth trinitrate or bismuth acetate respectively, neodymium nitrate and butyl (tetra) titanate or tetrabutyl titanate, then Bismuth trinitrate or bismuth acetate and neodymium nitrate are dissolved in and obtain solution A in the glacial acetic acid, in solution A, add again after the Bismuth trinitrate of Bismuth trinitrate in the solution A or bismuth acetate quality 5~10% or the bismuth acetate with hydrochloric acid regulate pH<3 solution B;
Secondly, butyl (tetra) titanate or tetrabutyl titanate be dissolved in obtain solution C in the glacial acetic acid, in solution C, add methyl ethyl diketone again and obtain solution D;
At last, solution B and solution D are mixed, adding behind ethylene glycol and the citric acid concentration of regulating mixing solutions with the glacial acetic acid volumetric molar concentration to the volumetric molar concentration of metal ion Ti4+ to metal ion Ti4+ again in mixing solutions is that 0.01mol/l obtains precursor solution, metal ion in the precursor solution: ethylene glycol: citric acid: methyl ethyl diketone=1: (1~4): (1~2): 0.1;
2) film: adopt dip-coating or spin coating proceeding that precursor solution is coated on the substrate, after each coating with it 120-150 ℃ of drying, above-mentioned repeatedly coating and drying process are until the film that obtains required thickness;
3) annealing:
The substrate of substrate after filming from room temperature is warming up to 650~1000 ℃ of annealing 3min or directly will films with the temperature rise rate of 200~300 ℃/min after put into take out cooling from stove immediately behind 650-1000 ℃ the High Temperature Furnaces Heating Apparatus annealing 3min and obtain the c-oriented film;
Substrate after maybe will filming is warming up to 650-750 ℃ of annealing 3-60min with the temperature rise rate greater than 200~300 ℃/min and obtains the a-oriented film behind 350-400 ℃ of thermal pretreatment 10min.
2, Bi according to claim 1 3.2Nd 0.8Ti 3O 12The preparation method of ferroelectric membranc is characterized in that: in order to reduce the viscosity of precursor solution, with precursor solution at 60-80 ℃ of gelation 30-60min.
3, Bi according to claim 1 3.2Nd 0.8Ti 3O 12The preparation method of ferroelectric membranc is characterized in that: said substrate adopts monocrystalline silicon substrate, uses dehydrated alcohol and acetone respectively to the monocrystalline silicon substrate drying in air after ultrasonic cleaning before filming.
CN200910023722A 2009-08-28 2009-08-28 Preparation method of Bi3.2Nd0.8Ti3O12 ferroelectric film Pending CN101654780A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN200910023722A CN101654780A (en) 2009-08-28 2009-08-28 Preparation method of Bi3.2Nd0.8Ti3O12 ferroelectric film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN200910023722A CN101654780A (en) 2009-08-28 2009-08-28 Preparation method of Bi3.2Nd0.8Ti3O12 ferroelectric film

Publications (1)

Publication Number Publication Date
CN101654780A true CN101654780A (en) 2010-02-24

Family

ID=41709227

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200910023722A Pending CN101654780A (en) 2009-08-28 2009-08-28 Preparation method of Bi3.2Nd0.8Ti3O12 ferroelectric film

Country Status (1)

Country Link
CN (1) CN101654780A (en)

Similar Documents

Publication Publication Date Title
CN102790169B (en) The manufacture method of ferroelectric thin film
EP2436661B1 (en) Composition for ferroelectric thin film formation and method for forming ferroelectric thin film
EP2525393B1 (en) Method for producing ferroelectric thin film
KR101460489B1 (en) Method for manufacturing oxide semiconductor layer using sol-gel process including oxygen plasma treatment and oxide semiconductor layer manufactured thereby
CN1850722A (en) Optimized-oriented-growth preparing method for BndT ferro-electric film
CN101717272B (en) Preparation method of lead zirconate titanate thick film with preferable grain orientation (100)
CN100586582C (en) Method for preparing barium stan-titanate ferroelectric film
JP6887770B2 (en) Method of forming PZT ferroelectric film
CN101654779A (en) Preparation method of Bi3.2Nd0.8Ti3O12 ferroelectric film
CN1103328C (en) Preparation of strontium-barium titanate film material
EP3125316B1 (en) Mn AND Nb CO-DOPED PZT-BASED PIEZOELECTRIC FILM
CN101070617A (en) Method for preparing briented growth dielectric-constant adjustable strontium lead titanate film
CN103979962B (en) The preparation method of the unleaded gradient thick film of a kind of barium calcium zirconate titanate
CN106810238A (en) A kind of rear-earth-doped different-shape bismuth titanates nano-crystal film and preparation method thereof
CN114883480A (en) Preparation method of bismuth titanate series ferroelectric film
CN109721353A (en) A kind of preparation method of huge dielectric constant CCTO based film material
CN101654780A (en) Preparation method of Bi3.2Nd0.8Ti3O12 ferroelectric film
JP2000154008A (en) Producing method of ferroelectric thin film by using solgel method
CN100558939C (en) The low temperature preparation method of alcohol heat assistant ferro-electricity film
CN114671680A (en) Bismuth scandate-barium titanate-based core-shell structure ferroelectric film and preparation method thereof
CN114551582A (en) Lanthanum strontium manganese oxygen/aluminum-doped zinc oxide flexible thin film heterojunction and preparation method thereof
CN104030680B (en) The preparation method of barium strontium titanate medium film
CN100457292C (en) (Ba,Zr)TiO3 ferroelectric film with optimized performance and its preparing method
CN106531442B (en) A kind of capacitor dielectric and preparation method thereof of antiferroelectric-para-electric coupling
CN112259374A (en) BST-based multilayer dielectric enhanced film and preparation method thereof

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Open date: 20100224