CN101592812B - Display panel and pixel defect check method thereof - Google Patents
Display panel and pixel defect check method thereof Download PDFInfo
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- CN101592812B CN101592812B CN2009100536569A CN200910053656A CN101592812B CN 101592812 B CN101592812 B CN 101592812B CN 2009100536569 A CN2009100536569 A CN 2009100536569A CN 200910053656 A CN200910053656 A CN 200910053656A CN 101592812 B CN101592812 B CN 101592812B
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Abstract
The invention discloses a display panel and a pixel defect check method thereof. The display panel comprises a plurality of first pixels and a plurality of second pixels. The second pixels and the first pixels are mixed and arranged into an array. The first pixels and the second pixels have the same opening ratio or/and electric property, and the first pixels and the second pixels have different appearance and structure characteristics.
Description
Technical field
The present invention relates to a kind of electronic installation and defect detecting method thereof, the inspection method of particularly a kind of display panel and picture element flaw thereof.
Background technology
Please refer to shown in Figure 1ly, be a kind of schematic top plan view of pel array of conventional display panels.The pel array 100 of display panel 108 is made up of several pixels 102 with array format.In the pel array 100 of this conventional display panels 108, each pixel 102 has identical surface structure characteristic.
For example, in pel array 100, each pixel 102 all comprises storage capacitors 104.And each storage capacitors 104 all comprises through hole (Via) 106.Wherein, these storage capacitors 104 correspondences are arranged in the pixel 102, and through hole 106 correspondences are arranged in the storage capacitors 104.In this conventional pixel array 100, the position of storage capacitors 104 in pixel 102 that all pixels 102 are comprised is all identical, and the quantity of all 102 storage capacitors 104 of being comprised is all identical.In addition, the position of through hole 106 in storage capacitors 102 that comprised of all storage capacitors 104 is all identical.
Yet the design of the pel array 100 of traditional display panel 108 also is unfavorable for the abnormal factors analysis of defective.Please refer to shown in Figure 2ly, be a kind of process flow diagram of conventional pixel defect inspection.At present, for the defective in the display panel, for example the common test mode of point defect or line defect etc. is mostly of step 200, lights display panel 108 earlier, failure analysis this moment (Failure Mold Analysis; FMA) staff can check display panel 108, to find out the defect pixel in the display panel 108.
Then, of step 202, after the defective in finding display panel 108, the failure analysis staff generally waits marking tool with for example oil pen, and circle is remembered the zone that to comprise this defect pixel on display panel 108.This zone of being irised out comprises dozens of pixel 102 usually.
Next, of step 204, in the zone of being irised out, utilize optical microscope (Optical Microscope; OM), search defect pixel, and the abnormal factors of examination and this defect pixel of analysis.
Behind the completing steps 204, of step 206, the abnormal factors of the defect pixel that judgement is found.In step 206, when staff on the line can judge the abnormal cause of this defect pixel, promptly accomplish the failure analysis of the pixel 102 of display panel 108.On the other hand; When the staff can't judge the abnormal factors of this defect pixel on the line; Promptly of step 208, disassemble display panel 108, and with upper and lower base plate (not shown); For example membrane transistor (TFT) substrate and colored filter substrate, membrane transistor substrate and filter sheet base plate, colored filter membrane transistor (CF on TFT) substrate and transparency carrier, organic illuminating element substrate (OLED) and upper substrate decompose in display panel 108.
Then, of step 210, utilize optical microscope, the upper and lower base plate in display panel 108, disassembled out of inspection is to judge and the abnormal factors of analyzing defect pixel once more.After the judgement and analysis of the abnormal factors of completion defect pixel, promptly accomplish the failure analysis of the pixel 102 of display panel 108.
Yet in this conventional display panels 108, the surface structure characteristic of all pixels 102 is identical.Add, it is bigger in step 202, to enclose the regional extent of selecting.Therefore, when under optical microscope, seeking the defect pixel in the circle favored area, the staff confuses the position quite easily or is difficult to and in the pixel of tens quilt circles choosing, finds out abnormal factors apace.When particularly optical microscope being arranged to high-amplification-factor, the regional extent that microscope can show is significantly reduced, and be unfavorable for more that the staff searches defect pixel this moment.So the error rate of the defect analysis of conventional display panels 108 is high, efficient is low.
Summary of the invention
Therefore, an object of the present invention is to provide a kind of display panel, it can be divided into a plurality of groups with pixel, and the pixel of different groups has the different appearance architectural feature, but has identical aperture opening ratio or electrically.See through the differentiation design of the surface structure characteristic of pixel, but the failure analysis personnel on the boost line accurately and apace find out defect pixel, and then can accelerate the judgement of the abnormal factors of defect pixel.
Another object of the present invention provides a kind of pixel defect check method, and its failure analysis personnel that can significantly shorten on the line find out the time of defect pixel, and can promote the analysis efficiency of the abnormal factors of defect pixel.
Another purpose of the present invention provides a kind of pixel defect check method, can improve the examination success ratio of the abnormal factors of defect pixel, and helps the improvement of technology or element design, and then can reduce the required human resources of product failure analysis of display panel.
According to above-mentioned purpose, the present invention proposes a kind of display panel.This display panel comprises upper substrate, infrabasal plate and liquid crystal layer.Infrabasal plate is arranged at the offside of upper substrate.Liquid crystal layer is arranged between upper substrate and the infrabasal plate.Infrabasal plate comprises plurality of first pixels and plurality of second pixels.These second pixels are mixed with first pixel and are arranged in an array.These first pixels and second pixel have identical aperture opening ratio or electrically, and these first pixels and second pixel have the different appearance architectural feature.
In one embodiment of the invention, above-mentioned each first pixel and second pixel respectively comprise a storage capacitors.These storage capacitors correspondences are arranged in first pixel and second pixel.The position of storage capacitors in first pixel that described first pixel is comprised is different from the position of storage capacitors in second pixel that second pixel is comprised.
In another embodiment of the present invention, above-mentioned each first pixel and second pixel respectively comprise a storage capacitors, and each storage capacitors respectively comprises a through hole.These storage capacitors correspondences are arranged in first pixel and second pixel, and the through hole correspondence is arranged in the storage capacitors.Wherein, the position of through hole in storage capacitors that comprised of described first pixel is different from the position of through hole in storage capacitors that second pixel is comprised.
In the present invention's another embodiment, above-mentioned each first pixel and second pixel respectively comprise a repairing circuit.These repairing circuit correspondences are arranged in first pixel and second pixel.The position of repairing circuit in first pixel that described first pixel is comprised is different from the position of repairing circuit in second pixel that second pixel is comprised.
According to above-mentioned purpose, the present invention proposes a kind of pixel defect check method.This pixel defect check method provides a display panel earlier.Again display panel is carried out an inspection step.When obtaining a defect pixel, go out to comprise a zone of this defect pixel in the display panel marked.Then, judge the surface structure characteristic of this defect pixel, belong to the first surface structure characteristic or the second surface structure characteristic to confirm this outward appearance architectural feature, and obtain a judged result.Then, according to described judged result, the abnormal factors of this defect pixel is carried out the first examination step in a microscopically.
In one embodiment of this invention, when the first above-mentioned examination step can't be judged the abnormal factors of defect pixel, more comprise and carry out disassembling step, split out from display panel with transistor substrate with display panel.
For letting the content of the present invention can be more obviously understandable, hereinafter is special lifts preferred embodiment, and conjunction with figs. elaborates as follows:
Description of drawings
Fig. 1 is the schematic top plan view of the pel array of traditional display panels.
Fig. 2 is the process flow diagram of conventional pixel defect inspection.
Fig. 3 is a kind of display panels diagrammatic cross-section in the embodiment of the present invention.
Fig. 4 is the schematic top plan view of an a kind of part of pel array of display panels in the embodiment of the present invention.
Fig. 5 is the process flow diagram of a kind of pixel defect check in the embodiment of the present invention.
The Reference numeral and the ingredient that relate among the figure are as follows:
100: pel array 102: pixel
104: storage capacitors 106: through hole
108: display panel 200: step
202: step 204: step
206: step 208: step
210: step 300: display panels
304: the second rows of 302: the first rows
306a: pixel 306b: pixel
308a: pixel 308b: pixel
310a: pixel 310b: pixel
312a: storage capacitors 312b: storage capacitors
314a: storage capacitors 314b: storage capacitors
316a: storage capacitors 316b: storage capacitors
318a: through hole 318b: through hole
320a: through hole 320b: through hole
322a: through hole 322b: through hole
324a: repairing circuit 324b: repairing circuit
326a: repairing circuit 326b: repairing circuit
328a: repairing circuit 328b: repairing circuit
330: array 332: infrabasal plate
334: upper substrate 336: liquid crystal layer
400: step 402: step
404: step 406: step
408: step 410: step
412: step
Embodiment
Below in conjunction with accompanying drawing, specify embodiment of the present invention.
Please, be a kind of display panels diagrammatic cross-section in the embodiment of the present invention with reference to Fig. 3.In this embodiment, with the display panel of display panels as present embodiment, but the present invention is not as limit.Display panels 300 mainly comprises upper substrate 334, infrabasal plate 332 and liquid crystal layer 336.Infrabasal plate 332 is arranged on the offside of upper substrate 334, and liquid crystal layer 336 then is arranged between upper substrate 334 and the infrabasal plate 332.
In the present embodiment, the upper substrate of display panels 300 and infrabasal plate 332 can be respectively colored filter substrate and membrane transistor substrate, filter sheet base plate and membrane transistor substrate, transparency carrier and colored filter membrane transistor substrate.In another embodiment, display panel is not a display panels, and the upper and lower base plate of this display panel can be upper substrate and organic illuminating element substrate respectively.
Please, be the schematic top plan view of an a kind of part of pel array of display panels in the embodiment of the present invention with reference to Fig. 4.In this embodiment, the infrabasal plate 332 of display panels 300 comprises several pixels 306a, 306b, 308a, 308b, 310a and 310b.These pixels 306a, 306b, 308a, 308b, 310a mix with 310b and are arranged in an array 330.Wherein, pixel 306a, 308a and 310a are positioned at first row 302 of this array 330, and pixel 306b, 308b and 310b then are positioned at second row 304 of this array 330.
In another embodiment, pixel 306a, 306b, 308a, 308b, 310a and 310b can be arranged in the upper substrate 334 of display panels 300.
In one embodiment, first of array 330 row 302 comprises several pixels 306a, several pixels 308a and several pixels 310a.Wherein, these pixels 306a, 308a and 310a are staggered in regular turn.For example, the arrangement mode of first row, 302 pixel does, after pixel 308a is adjacent to pixel 306a, and after pixel 310a is in close proximity to pixel 308a, after then another pixel 306a then is adjacent to pixel 310a again, is staggered so in regular turn.
On the other hand, second of array 330 row 304 comprises several pixels 306b, several pixels 308b and several pixels 310b.These pixels 306b, 308b and 310b are staggered in regular turn.For example, the arrangement mode of second row, 304 pixel does, after pixel 308b is adjacent to pixel 306b, and after pixel 310b is in close proximity to pixel 308b, after then another pixel 306b then is adjacent to pixel 310b again, is staggered so in regular turn.
In one embodiment, pixel 306a and 306b can be red pixel, and pixel 308a and 308b can be green pixel, and pixel 310a and 310b can be blue pixel.In other embodiments, pixel 306a and 306b can be the pixel of different colours, and pixel 308a and 308b can be the pixel of different colours, and pixel 310a and 310b can be the pixel of different colours.In the present invention, the color of pixel 306a, 306b, 308a, 308b, 310a and 310b can be set according to the product design demand.
In this embodiment, all pixel 306a, 306b, 308a, 308b, 310a all have identical aperture opening ratio or electrical with 310b, to avoid influencing the display quality of display panels 300.But pixel 306a, 306b, 308a, 308b, 310a and 310b have the different appearance architectural feature, with the position reference foundation as the failure analysis personnel, and then can assist the failure analysis personnel to carry out the differentiation of defect pixel.Therefore; The purpose of this embodiment is: under the display parameter design that does not influence display panels 300; By differentiation design, assist the failure analysis personnel to find out the defect pixel of institute's mark smoothly to the surface structure characteristic of the pixel 306a in the display panels 300,306b, 308a, 308b, 310a and 310b.
For example, please refer again to Fig. 4, in first row 302 of pel array 330, pixel 306a comprises storage capacitors 312a, and pixel 308a comprises storage capacitors 314a, and pixel 310a comprises storage capacitors 316a.Wherein, storage capacitors 312a is arranged among the pixel 306a, and storage capacitors 314a is arranged among the pixel 308a, and storage capacitors 316a is arranged among the pixel 310a.
On the other hand, in second row 304 of pel array 330, pixel 306b comprises storage capacitors 312b, and pixel 308b comprises storage capacitors 314b, and pixel 310b comprises storage capacitors 316b.Wherein, storage capacitors 312b is arranged among the pixel 306b, and storage capacitors 314b is arranged among the pixel 308b, and storage capacitors 316b is arranged among the pixel 310b.
In one embodiment, first of array 330 row's 302 pixel 306a, 308a are identical with storage capacitors 312a, 314a and the 316a position essence in pixel 306a, 308a and 310a that 310a is comprised respectively.Second row's 304 of array 330 pixel 306b, 308b are identical with storage capacitors 312b, 314b and the 316b position essence in pixel 306b, 308b and 310b that 310b is comprised respectively.But; First row's 302 of array 330 pixel 306a, storage capacitors 312a, 314a and the 316a position in pixel 306a, 308a and 310a that 308a and 310a comprised respectively are different from second row's 304 pixel 306b, storage capacitors 312b, 314b and the 316b position in pixel 306b, 308b and 310b that 308b and 310b comprised respectively.Thus, what the failure analysis personnel can be according to first row 302 and second row, 304 the position of the storage capacitors that pixel comprised in pixel is different, and the pixel and second of distinguishing first row 302 is easily arranged 304 pixel.
Please refer again to Fig. 4, in first row 302 of array 330, the storage capacitors 312a of pixel 306a comprises through hole 318a, and the storage capacitors 314a of pixel 308a comprises through hole 320a, and the storage capacitors 316a of pixel 310a comprises through hole 322a.Wherein, through hole 318a is arranged among the storage capacitors 312a, and through hole 320a is arranged among the storage capacitors 314a, and through hole 322a is arranged among the storage capacitors 316a.
In addition, in second row 304 of array 330, the storage capacitors 312b of pixel 306b comprises through hole 318b, and the storage capacitors 314b of pixel 308b comprises through hole 320b, and the storage capacitors 316b of pixel 310b comprises through hole 322b.Wherein, through hole 318b is arranged among the storage capacitors 312b, and through hole 320b is arranged among the storage capacitors 314b, and through hole 322b is arranged among the storage capacitors 316b.
In this embodiment, through hole 318a, 318b, 320a, 320b, 322a and 322b can be the Connection Element with electric connection effect; Perhaps can be not electric property connection effect, and be merely as the illusory through hole (DummyVia) of appearance poor alienation design with auxiliary identification.
In one embodiment, pixel 306a and 306b can be the pixel of same color, and pixel 308a and 308b can be the pixel of same color, and pixel 310a and 310b can be the pixel of same color.At this moment, as shown in Figure 4, the through hole 318a of pixel 306a is positioned at the side of taking back of storage capacitors 312a, and the through hole 318b of pixel 306b also is positioned at the side of taking back of storage capacitors 312b.And the through hole 320a of pixel 308a is positioned at the central area of storage capacitors 314a, and the through hole 320b of pixel 308b also is positioned at the central area of storage capacitors 314b.The through hole 322a of pixel 310a is positioned at the side that takes over of storage capacitors 316a, and the through hole 322b of pixel 310b also is positioned at the side that takes over of storage capacitors 316b.
By changing the position of through hole in storage capacitors, the failure analysis personnel can distinguish the pixel of different groups easily.
In display panels 300, pixel 306a and 306b comprise repairing circuit 324a and 324b respectively, and pixel 308a and 308b comprise repairing circuit 326a and 326b respectively, and pixel 310a and 310b comprise repairing circuit 328a and 328b respectively.Wherein, repairing circuit 324a, 324b, 326a, 326b, 328a and 328b is corresponding respectively is arranged among pixel 306a, 306b, 308a, 308b, 310a and the 310b.
In one embodiment, repairing circuit 324a, 324b, 326a, 326b, 328a and the 328b position in pixel 306a, 306b, 308a, 308b, 310a and 310b can be inequality, in order to distinguishing pixel group.For example, as shown in Figure 4, repairing circuit 324a and the 324b position in pixel 306a and 306b can be different from repairing circuit 326a, 326b, 328a and the 328b position in pixel 308a, 308b, 310a and 310b; Repairing circuit 326a and the 326b position in pixel 308a and 308b can be different from repairing circuit 328a and the position of 328b in pixel 310a and 310b.
In another embodiment, the mode that the repairing circuit of varying number is set in pixel 306a, 306b, 308a, 308b, 310a and 310b capable of using is assisted failure analysis personnel distinguishing pixel.For example, pixel 306a and 306b can respectively comprise a repairing circuit, and pixel 308a and 308b can respectively comprise two repairing circuits, and pixel 310a and 310b can respectively comprise three repairing circuits.Thus, the failure analysis personnel can distinguish out this three pixel groups easily by this outward appearance architectural feature difference of pixel 306a and 306b, pixel 308a and 308b and pixel 310a and 310b on the line.
In display panels 300,, can carry out pixel location in order to failure analysis personnel on the boost line through differentiation design to the surface structure characteristic of pixel.Please, be the process flow diagram of a kind of pixel defect check in the embodiment of the present invention with reference to Fig. 5.In this embodiment, the failure analysis personnel promptly utilize the differentiation design of the pixel appearances of display panels 300, carry out the pixel defect check of display panels 300.
At first, of step 400, display panels is provided, for example Fig. 3 and display panels 300 shown in Figure 4.Next, of step 402, after earlier display panels 300 being lighted, the failure analysis personnel can check display panels 300 on the line, whether have defective with all pixels of checking display panels 300.Of step 404, when the failure analysis personnel discovered and seized the defect pixel of display panels 300 on the line, for example oil pen capable of using etc. went out this defect pixel in these display panels 300 marked.When this defect pixel of mark, can utilize circle to select mode to utilize the oil pen to enclose defect pixel to elect, little because the size of pixel is enclosed favored area, so the zone has also comprised other normal pixel simultaneously except comprising defect pixel.
Then; Of step 406; Failure analysis personnel for example high magnification capable of using eyepiece is judged the surface structure characteristic of the defect pixel found out, with the type of the surface structure characteristic of the defect pixel confirming to be found actually with pixel 306a, 306b, 308a, 308b, 310a and 310b in surface structure characteristic that how person was had identical.In following embodiment, the surface structure characteristic of the defect pixel of supposing to be found belongs to the surface structure characteristic that pixel 306a is had after judging.
Next, said as step 408, the failure analysis personnel can at microscopically, carry out the abnormal factors of primary examination with the examination defect pixel according to the judged result that step 406 obtained.The microscope that step 408 adopted can be optical microscope.In step 408, owing to know from step 406 that the type of the surface structure characteristic of defect pixel belongs to the surface structure characteristic of pixel 306a.Therefore; Under optical microscope; In step 404, enclose when seeking defect pixel in the zone of selecting, can earlier its storage capacitors 312b, 314b and the position of 316b in pixel be different from pixel 306b, 308b and the 310b eliminating in advance of the position of storage capacitors 312a in pixel 306a.Thus, can get rid of half the pixel in the circle favored area earlier.Then, can pixel 308a and the 310a that its through hole 320a and the position of 322a in pixel are different from the position of through hole 318a in pixel 306a be got rid of.So, can get rid of in the residual pixel 2/3rds pixel again.
Therefore,, can reduce the searching examination time of defect pixel widely, and can improve the efficient of failure analysis, and can improve the examination success ratio of the abnormal factors of defect pixel, more can significantly reduce the required manpower of failure analysis by the appearance poor alienation design of pixel.
If in step 408, the failure analysis personnel can judge the abnormal factors of this defect pixel, promptly accomplish the inspection of the picture element flaw of display panels 300.Then, can the reason that pixel produces defective be offered FEOL personnel or research and development designer as a reference, carry out the improvement of technology or design, to reduce or to eliminate the probability that defective forms.
On the other hand; If in step 408, when the failure analysis personnel can't judge the abnormal factors of this defect pixel, when being covered by black matrix" (Black Matrix) layer of the colored filter of display panels 300 like the defect part of pixel; Then must be said as step 410; Earlier display panels 300 is disassembled, and the upper and lower base plate of display panels 300 is disassembled, for further checking.
Then, of step 412, the failure analysis personnel can be in microscopically; Carry out second examination; With the upper and lower base plate of examination display panels 300, the failure analysis personnel check the upper and lower base plate of display panels 300 in the present embodiment, like a transistor substrate; With the abnormal factors of judgement defect pixel, and the inspection of the picture element flaw of completion display panels 300.In step 412, can get rid of the surface structure characteristic pixels with different of surface structure characteristic and defect pixel according to the judged result that is obtained in the step 406 equally in advance.Therefore, can significantly shorten searching the time of defect pixel equally.
Embodiment by the invention described above can know, an advantage of the present invention is exactly because in display panels, can pixel be divided into a plurality of groups, and the pixel of different groups has and see architectural feature outside the difference, but has identical aperture opening ratio or electrical.See through the differentiation design of such pixel appearances architectural feature, but the failure analysis personnel on the boost line accurately and apace find out defect pixel.Therefore, can accelerate the judgement of the abnormal factors of defect pixel.
Surface structure characteristic of the present invention can be in storage capacitors 312a, 312b, 314a, 314b, 316a, 316b, through hole 318a, 318b, 320a, 320b, 322a, 322b, repairing circuit 324a, 326a, 328a, 324b, 326b, 328b different shape, the quantity of design, be arranged on position or its combination in the pixel; As long as do not influencing under aperture ratio of pixels or the electrical prerequisite, those of ordinary skills can design the different appearance architectural feature according to the actual requirements.
Embodiment by the invention described above can know that another advantage of the present invention is that the failure analysis personnel that pixel defect check method of the present invention can significantly shorten on the line find out the time of defect pixel, and can promote the analysis efficiency of the abnormal factors of defect pixel.
Embodiment by the invention described above can be known; Another advantage of the present invention is; Pixel defect check method of the present invention can improve the examination success ratio of the abnormal factors of defect pixel; And help the improvement of technology or element design, and then can reduce the human resources that the product failure of display panels is analyzed.
Though the present invention discloses as above with preferred embodiment; Right its is not that those skilled in the art under the present invention are in spirit that does not break away from the present invention and scope in order to qualification the present invention; When can doing various changes and retouching, so the present invention's protection domain is when being as the criterion with claim.
Claims (13)
1. a display panel is characterized in that, comprises:
One upper substrate;
One infrabasal plate is arranged at the offside of said upper substrate; And
One liquid crystal layer is arranged between said upper substrate and the said infrabasal plate; Wherein, said infrabasal plate comprises:
Plurality of first pixels;
Plurality of second pixels;
Several the 3rd pixels; Said plurality of first pixels, said plurality of second pixels are mixed with said several the 3rd pixels and are arranged in an array; In each row of said array; Said first pixel, said second pixel and said the 3rd pixel are staggered in regular turn; And said plurality of first pixels, said plurality of second pixels have identical aperture opening ratio or electrical with said several the 3rd pixels, and said plurality of first pixels, said plurality of second pixels and said several the 3rd pixels have the different appearance architectural feature.
2. display panel according to claim 1; It is characterized in that; Wherein each said first pixel, said second pixel and said the 3rd pixel respectively comprise a storage capacitors; Said storage capacitors correspondence is arranged in said first pixel, said second pixel and said the 3rd pixel, and the position of said storage capacitors in said the 3rd pixel that the position of the said storage capacitors that comprised of said first pixel in said first pixel, said storage capacitors that said second pixel is comprised position and said the 3rd pixel in said second pixel comprised has nothing in common with each other.
3. display panel according to claim 1; It is characterized in that; Wherein each said first pixel, said second pixel and said the 3rd pixel respectively comprise a storage capacitors; And each said storage capacitors respectively comprises a through hole; Said storage capacitors correspondence is arranged in said first pixel, said second pixel and said the 3rd pixel; Those through hole correspondences are arranged in the said storage capacitors, and the position of said through hole in said storage capacitors that the position of the said through hole that wherein said first pixel is comprised in said storage capacitors, said through hole that said second pixel is comprised position and said the 3rd pixel in said storage capacitors comprised has nothing in common with each other.
4. display panel according to claim 1; It is characterized in that; Wherein each said first pixel, said second pixel and said the 3rd pixel respectively comprise a repairing circuit; Said repairing circuit correspondence is arranged in said first pixel, said second pixel and the 3rd pixel, and the position of said repairing circuit in said the 3rd pixel that the position of the said repairing circuit that comprised of said first pixel in said first pixel, said repairing circuit that said second pixel is comprised position and said the 3rd pixel in said second pixel comprised has nothing in common with each other.
5. display panel according to claim 1; It is characterized in that; Wherein each said first pixel, said second pixel and said the 3rd pixel respectively comprise at least one repairing circuit; Said repairing circuit correspondence is arranged in said first pixel, said second pixel and said the 3rd pixel, and the quantity of said at least one repairing circuit of being comprised of each said first pixel, the quantity of said at least one repairing circuit that each said second pixel is comprised and the quantity of said at least one repairing circuit that each said the 3rd pixel is comprised have nothing in common with each other.
6. display panel according to claim 1; It is characterized in that; Wherein each said first pixel, said second pixel and said the 3rd pixel respectively comprise a storage capacitors; Said storage capacitors correspondence is arranged in said first pixel, said second pixel and said the 3rd pixel; And in this array among adjacent one first row and one second row, the position that is positioned at the said storage capacitors that this first row's said first pixel, said second pixel and said the 3rd pixel comprised is different from the position that is positioned at the said storage capacitors that this second said first pixel, said second pixel and said the 3rd pixel of arranging comprised.
7. according to each described display panel in the claim 1 to 6, it is characterized in that wherein said first pixel is a red pixel, said second pixel is a green pixel, and said the 3rd pixel is a blue pixel.
8. a pixel defect check method is characterized in that, comprises:
One display panel is provided, and this display panel comprises:
One upper substrate;
One infrabasal plate is arranged at the offside of said upper substrate; And
One liquid crystal layer is arranged between said upper substrate and the said infrabasal plate; Wherein,
Said infrabasal plate comprises:
Plurality of first pixels;
Plurality of second pixels;
Several the 3rd pixels; Said first pixel, said second pixel are mixed with said the 3rd pixel and are arranged in an array; And said first pixel, said second pixel have identical aperture opening ratio or electrical with said the 3rd pixel, and said first pixel, said second pixel and said the 3rd pixel have the different appearance architectural feature;
Said display panel is carried out an inspection step, when obtaining a defect pixel, go out to comprise a zone of this defect pixel in said display panel marked;
Judge the surface structure characteristic of said defect pixel, belong to this first surface structure characteristic, this second surface structure characteristic or the 3rd surface structure characteristic to confirm this surface structure characteristic, and obtain a judged result; And
According to said judged result, one abnormal factors of said defect pixel is carried out one first examination step in a microscopically.
9. pixel defect check method according to claim 8 is characterized in that, wherein judges institute
State the surface structure characteristic use one high magnification eyepiece of defect pixel.
10. pixel defect check method according to claim 9 is characterized in that, the wherein said first examination step comprises: get rid of the surface structure characteristic pixels with different with said defect pixel.
11. pixel defect check method according to claim 8 is characterized in that, when the said first examination step can't be judged the abnormal factors of said defect pixel, more comprises and carries out disassembling step, to disassemble said upper substrate and said infrabasal plate.
12. pixel defect check method according to claim 11 is characterized in that, in said disassemble step after, more comprise according to said judged result, in said microscopically the abnormal factors of said defect pixel is carried out one second examination step.
13. pixel defect check method according to claim 11 is characterized in that, the wherein said second examination step comprises: get rid of the surface structure characteristic pixels with different with said defect pixel.
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| CN103258478B (en) * | 2013-05-09 | 2015-04-15 | 友达光电(厦门)有限公司 | Substrate for displayer and display panel |
| CN109613728B (en) * | 2019-01-21 | 2021-09-24 | Tcl华星光电技术有限公司 | Detection method of display panel |
| CN109597231A (en) * | 2019-01-29 | 2019-04-09 | 深圳市华星光电技术有限公司 | Liquid crystal display panel shows exception analysis method |
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| CN1880983A (en) * | 2005-06-17 | 2006-12-20 | 株式会社茉莉特斯 | Visual inspection lighting device based on reflective light and transmission light |
| CN1993608A (en) * | 2004-07-30 | 2007-07-04 | 夏普株式会社 | Method and apparatus for inspecting color filter |
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2009
- 2009-06-23 CN CN2009100536569A patent/CN101592812B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1648645A (en) * | 2004-01-30 | 2005-08-03 | 三星电子株式会社 | Apparatus and method to inspect display panels |
| CN1677097A (en) * | 2004-03-31 | 2005-10-05 | Hoya株式会社 | Method of inspecting an mura defect in a pattern and apparatus used for the same |
| CN1993608A (en) * | 2004-07-30 | 2007-07-04 | 夏普株式会社 | Method and apparatus for inspecting color filter |
| CN1880983A (en) * | 2005-06-17 | 2006-12-20 | 株式会社茉莉特斯 | Visual inspection lighting device based on reflective light and transmission light |
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| CN101592812A (en) | 2009-12-02 |
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