CN101587172A - Secondary battery testing system - Google Patents
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- CN101587172A CN101587172A CNA2009100437154A CN200910043715A CN101587172A CN 101587172 A CN101587172 A CN 101587172A CN A2009100437154 A CNA2009100437154 A CN A2009100437154A CN 200910043715 A CN200910043715 A CN 200910043715A CN 101587172 A CN101587172 A CN 101587172A
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Abstract
A secondary battery testing system comprises a single chip control module, a testing state control module, a data collecting module, a reference voltage module, a charging-discharging module, an inner resistance testing module and an environment temperature testing module. An outputting end of the single chip control module is connected to an inputting end of the testing state control module; the single chip control module is connected to the data collecting module in bidirectional way via data lines and connected to the environment temperature testing module in bidirectional way; outputting ends of the reference voltage module are respectively connected to the inputting end of the testing state control module and the inputting end of the data collecting module; the outputting ends of the testing state control module are respectively connected to the inputting end of the charging-discharging module and the inputting end of the inner resistance testing module; the outputting end of the charging-discharging module and the outputting end of the inner resistance testing module are respectively connected with the inputting end of the data collecting module. The invention can significantly enhance the detctjion accuracy and precision of the battery; the work is stable and reliable with inner resistance testing function, monitoring the inner resistance change of the secondary battery in the discharging process and providing the inner resistance parameter for the selection and match of the secondary battery.
Description
Technical field
The present invention relates to a kind of secondary batteries testing system, particularly relate to a kind of test macro that is applicable to secondary cells such as lithium ion battery, Ni-MH battery, nickel-cadmium battery.
Background technology
Secondary cell, as lithium ion battery, Ni-MH battery, nickel-cadmium battery, especially lithium ion battery is used widely in every field.Yet, because technical matters and production technology restriction in the production run, some substandard products usually occur.There is potential safety hazard in the use of the use, particularly lithium ion battery of battery inferior, may cause overheated on fire, even blast.Recently 70,000 notebook lithium batteries are initiatively recalled because lithium battery is overheated by Hewlett-Packard.
In view of secondary cell safety problem and performance test need, the secondary cell tester is rapidly developed, and for example, adopt 16 analog-to-digital secondary cell testers that secondary cell is detected, but general precision is not high, and temperature to float influence bigger.Chinese patent 200710035047.1 discloses a kind of the utilization in 24 ADC raising charging/discharging of secondary cell processes the voltage and current signal monitoring accuracy of slow variation and the method for degree of accuracy, improved accuracy and the degree of accuracy measured, the employing that low temperature floats the coefficient components and parts still can guarantee higher accuracy and degree of accuracy when making temperature variation big.Yet, to high-resolution test macro, lower temperature is floated also can produce bigger influence, for example, assumed temperature is changed to 10 ℃, the temperature that adopts for No. 200710035047.1 patented claims is floated the reference voltage source for 7ppm/ ℃, and the drift that its reference source voltage produces: 7ppm/ ℃ * 2.5*10 ℃=175 μ V, the effect of 24 ADC will have been lost.
In addition, in order to obtain higher voltage, the frequent combo of secondary cell is used, and its property retention unanimity could be brought into play the effect of each cell better, so the coupling of secondary cell is an important link.Adopt the method for capacity sorting when mating usually, but this method can only guarantee the initial capacity unanimity.Reasonable method is that the charging/discharging voltage family curve according to battery carries out sorting in conjunction with the internal resistance change curve again, can make that cell keeps consistance preferably in the electric battery in whole use.Internal resistance is being brought into play important effect as an important indicator of secondary cell when judging secondary cell performance and sorting coupling.And existing secondary cell tester does not generally have the internal resistance test function simultaneously, perhaps have the internal resistance test function but can only carry out internal resistance test separately and can not in charge and discharge process, carry out simultaneously, can not satisfy the multiparameter and the parameter high-precision requirement of battery material research.
Summary of the invention
The objective of the invention is to overcome existing battery test system test accuracy and the bigger defective of degree of accuracy temperature influence, provide a kind of intelligent secondary batteries testing system that temperature is floated calibration function that has, with the accuracy and the degree of accuracy of further raising battery detecting.
Further aim of the present invention is to overcome existing battery test system and lacks the defective of carrying out the internal resistance test in charge and discharge process simultaneously, a kind of intelligent secondary batteries testing system that carries out the internal resistance test in the electric current and voltage high-acruracy survey that do not influence in charge and discharge process is provided, think that secondary cell sorting coupling provides the internal resistance parameter, improve the reliability of coupling sorting, further satisfy the multiparameter requirement of battery material research.
Purpose of the present invention is achieved by the following technical programs: it comprises single chip control module, test mode control module, data acquisition module, reference voltage module, charge-discharge modules and ambient temperature measurement module; Described single chip control module output terminal is connected with test mode control module input end, and single chip control module also is connected by data line is two-way with data acquisition module, also is connected with the ambient temperature measurement module is two-way; Described reference voltage module output terminal is connected with the data acquisition module input end with test mode control module input end respectively, test mode control module output terminal is connected with the charge-discharge modules input end, and the charge-discharge modules output terminal is connected with the data acquisition module input end.
Further aim of the present invention is achieved by the following technical programs: on the basis of technique scheme, set up the internal resistance test module, described internal resistance test module input end is connected with test mode control module output terminal, and internal resistance test module output terminal is connected with the data acquisition module input end.
Described single chip control module is made up of single chip circuit, watchdog circuit and serial communication circuit; Described test mode control module is made up of D/A converting circuit, buffer circuit, sampling hold circuit, open loop comparator circuit and logic with shift control circuit; Described data acquisition module is made up of analog to digital conversion circuit and multi-channel analog switch circuit; Described reference voltage module is made up of reference voltage source circuit; Described charge-discharge modules is made up of charge-discharge circuit, over-voltage over-current protection circuit and voltage and current measurement circuit; Described internal resistance test module is made up of RC oscillatory circuit, filtering circuit I, constant-current source circuit, ac amplifier circuit, filtering circuit II and true rms measurement circuit; Described ambient temperature measurement module is made up of temperature measurement circuit;
Described watchdog circuit, serial communication circuit, D/A converting circuit, logic with shift control circuit, analog to digital conversion circuit, multi-channel analog switch circuit, temperature measurement circuit all are connected with single chip circuit; Described buffer circuit is connected with sampling holder with D/A converting circuit; Sampling hold circuit is connected with the open loop comparator circuit; The open loop comparator circuit is connected with charge-discharge circuit; Described reference voltage source circuit is connected with D/A converting circuit with analog to digital conversion circuit; Described over-voltage over-current protection circuit is connected with charge-discharge circuit with the voltage and current measurement circuit; Described filtering circuit is connected with the RC oscillatory circuit, described constant-current source circuit is connected with filtering circuit I, described ac amplifier circuit is connected with filtering circuit II, described filtering circuit II is connected with the true rms measurement circuit, and described voltage and current measurement circuit, true rms measurement circuit are connected with multi-channel analog switch circuit.
When testing, described charge-discharge circuit, voltage and current measurement circuit, constant-current source circuit and ac amplifier circuit all are connected with mesuring battary.
Analog-digital conversion circuit as described comprises A/D conversion chip U1, and chip U1 selects the delta sigma pattern number converter ADS1211 of 24 high precision, wide dynamic perfromance for use; The AVDD pin of analog to digital converter ADS1211 connects+the 5V analog power, and the AGND pin connects simulation ground, and the AVDD pin is connected with the AGND pin by 10 μ F electric capacity and 104 electric capacity are in parallel; The DVDD pin of analog to digital converter ADS1211 connects+the 5V digital power, and the DGND pin connects digitally, and the DVDD pin is connected with the DGND pin by 104 electric capacity; The AIN1P of analog to digital converter ADS1211, AIN2P, AIN3P pin all are connected with the output of multi-channel analog beginning circuit, and AIN1N, AIN2N, AIN3N, AIN4P, AIN4N pin all connect simulation ground; XIN, XOUT pin insert the 10M crystal oscillator, connect digitally by 12pF electric capacity respectively; The DSYNC pin connects+the 5V digital power, and MODE, CS pin all connect digitally; DRDY, SDOUT, SDIN, SCLK pin connect I/O interface P2.3, P2.4, P2.5, the P2.7 pin of single-chip microcomputer respectively.
Described temperature measurement circuit comprises chip U3, and chip U3 selects single wire bus device digital thermometer DS18B20 for use.The U3 pin one meets VCC5V, pin 3 ground connection, and the DQ pin inserts the P0.7 pin of single-chip microcomputer and passes through 4.7K pull-up resistor connection+5V analog power.
In the described charge-discharge circuit, 3, the 4 ends lead-in wire that is used for connecting four pin connection terminals of mesuring battary is received 2,3 pins of the single-pole single-throw (SPST) type relay that is used to control constant current source electric current access point when discharging and recharging, and 1, the 2 ends lead-in wire of four pin connection terminals is used for measuring the battery both end voltage and exchanges pressure drop; 7.5V charge power supply by capacitor C 103 ground connection, is connected to inductance between the drain electrode of voltage dependent resistor (VDR) and field effect transistor in the charging and discharging circuit.
During the work of the present invention's secondary batteries testing system, single chip circuit receives the control command or the data acquisition command of host computer, by the control variable of each passage of D/A converting circuit conversion output, and keeps by the sampling holder sampling of respective channel; The logic with shift control circuit is realized the control to each channel charge-discharge work state, feedback states and internal resistance test mode; RC oscillatory circuit, filtering circuit I and constant-current source circuit produce accurate AC constant-current source; The internal damping of true rms measurement circuit falls to be changed; The voltage and current measurement circuit amplifies the voltage and current signal; Analog to digital conversion circuit exchanges pressure drop conversion to what the cell voltage of each passage, charging and discharging currents and internal resistance produced; Temperature measurement circuit is measured under the control of single-chip microcomputer; Single-chip microcomputer reads in temperature according to the measurement temperature from watchdog circuit and floats calibration system, and the A/D transformation result is calibrated; Single-chip microcomputer is sent to host computer with calibration result and measurement temperature value, by host computer data is handled and is analyzed.
The present invention has the following advantages: the application of floating components and parts in conjunction with low temperature, pass through measures ambient temperature, the temperature that variation of ambient temperature is caused is floated and is proofreaied and correct, reduced greatly to have significantly improved accuracy, the accuracy and reliability of secondary batteries testing system because temperature is floated the influence that test macro is brought; Has the internal resistance test function, can test internal resistance of rechargeable battery separately, also can be in the test charge-discharge performance, carry out the internal resistance test, and to not influence of charge-discharge performance test, provide more parameter to the performance of analyzing secondary cell, improve the accuracy of performance evaluation and the reliability of coupling sorting.The present invention is fit to the research of secondary cell all-round property testing and battery material very much.
Description of drawings
Fig. 1 is the block scheme of secondary batteries testing system one embodiment of the present invention;
Fig. 2 is a structured flowchart embodiment illustrated in fig. 1;
Fig. 3 is the reference voltage source circuit structural drawing among Fig. 2;
Fig. 4 is the temperature measurement circuit structural drawing among Fig. 2;
Fig. 5 is the analog to digital conversion circuit structural drawing among Fig. 2;
Fig. 6 is the internal resistance test module circuit structure diagram among Fig. 2;
Fig. 7 is the single-chip microcomputer workflow block diagram among Fig. 2.
Embodiment
The present invention will be further described below in conjunction with the drawings and the specific embodiments.
With reference to Fig. 1, present embodiment comprises single chip control module 1, test mode control module 2, data acquisition module 3, reference voltage module 4, charge-discharge modules 5, internal resistance test module 6 and ambient temperature measurement module 7; Described single chip control module 1 output terminal is connected with test mode control module 2 input ends, and single chip control module 1 also is connected by data line is two-way with data acquisition module 3, also with 7 two-way connections of ambient temperature measurement module; Described reference voltage module 4 output terminals are connected with data acquisition module 3 input ends with test mode control module 2 input ends respectively, test mode control module 2 output terminals are connected with internal resistance test module 6 input ends with charge-discharge modules 5 input ends respectively, and charge-discharge modules 5 output terminals are connected with data acquisition module 3 input ends respectively with internal resistance test module 6 output terminals.
With reference to Fig. 2, present embodiment monolithic control module 1 comprises single chip circuit 1-1, watchdog circuit 1-2 and serial communication circuit 1-3; Test mode control module 2 comprise D/A converting circuit 2-1, buffer circuit 2-2, corresponding eight passages sampling hold circuit (2-3-1 ..., 2-3-8), the open loop comparator circuit of corresponding eight passages (2-4-1 ..., 2-4-8) and logic with shift control circuit 2-5; Data acquisition module 3 comprises analog to digital conversion circuit 3-1 and multi-channel analog switch circuit 3-2; Reference voltage module 4 comprises reference voltage source circuit 4-1; Charge-discharge circuit module 5 is provided with eight passages, comprise charge-discharge circuit (5-1-1 ..., 5-1-8), over-voltage over-current protection circuit (5-2-1 ..., 5-2-8) and the voltage and current measurement circuit (5-3-1 ..., 5-3-8); Internal resistance test module 6 also is provided with eight passages, comprise the RC oscillatory circuit (6-1-1 ..., 6-1-8), filtering circuit I (6-2-1 ..., 6-2-8), constant-current source circuit (6-3-1 ..., 6-3-8), ac amplifier circuit (6-4-1 ..., 6-4-8), filtering circuit II (6-5-1 ..., 6-5-8) and the true rms measurement circuit (6-6-1 ..., 6-6-8); Ambient temperature measurement module 7 comprises temperature measurement circuit 7-1.
Described watchdog circuit 1-2, serial communication circuit 1-3, D/A converting circuit 2-1, logic with shift control circuit 2-4, analog to digital conversion circuit 3-1, multi-channel analog switch circuit 3-2, temperature measurement circuit 7-1 all are connected with single chip circuit 1-1; Described buffer circuit 2-2 and D/A converting circuit 2-1 and sampling hold circuit (2-3-1 ..., 2-3-8) connect; Sampling hold circuit (2-3-1 ..., 2-3-8) with the open loop comparator circuit of respective channel (2-4-1 ..., 2-4-8) connect; The open loop comparator circuit (2-4-1 ..., 2-4-8) with the charge-discharge circuit of respective channel (5-1-1 ... 5-1-8) connect; Described reference voltage source circuit 4-1 is connected with D/A converting circuit 2-1 with analog to digital conversion circuit 3-1; Described over-voltage over-current protection circuit (5-2-1 ... 5-2-8) and the voltage and current measurement circuit (5-3-1 ..., 5-3-8) with the charge-discharge circuit of respective channel (5-1-1 ... 5-1-8) connect; Described filtering circuit I (6-2-1,6-2-8) and the RC oscillatory circuit (6-1-1 of respective channel, 6-1-8) connect, described constant-current source circuit (6-3-1,6-3-8) with the filtering circuit I (6-2-1 of respective channel, 6-2-8) connect, described ac amplifier circuit (6-4-1,6-4-8) with filtering circuit II (6-5-1,6-5-8) connect, described filtering circuit II (6-5-1,6-5-8) with the true rms measurement circuit (6-6-1 of respective channel, 6-6-8) connect described true rms measurement circuit (6-6-1,6-6-8) with voltage and current measurement circuit (5-3-1,5-3-8) all be connected with multi-channel analog switch circuit (3-2);
When detecting, described charge-discharge circuit (5-1-1 ... 5-1-8), the voltage and current measurement circuit (5-3-1 ..., 5-3-8), constant-current source circuit (6-3-1 ..., 6-3-8) and ac amplifier circuit (6-4-1 ..., 6-4-8) all be connected with the mesuring battary of respective channel.
The single chip circuit 1-1 of present embodiment, watchdog circuit 1-2, serial communication circuit 1-3, D/A converting circuit 2-1, buffer circuit 2-2, sampling hold circuit (2-3-1 ..., 2-3-8), the open loop comparator circuit (2-4-1 ..., 2-4-8), logic with shift control circuit 2-5, over-voltage over-current protection circuit (5-2-1 ... 5-2-8) and the voltage and current measurement circuit (5-3-1 ... 5-3-8) all can from existing homogeneous circuit, select for use.
With reference to Fig. 3, the reference voltage source circuit 4-1 of present embodiment comprises reference voltage source chip U2, chip U2 selects superhigh precision bandgap reference voltage source AD780 for use, AD780 adopts laser trimming and precision thin-film resistor technology, have the initial precision (± 0.04% max) of low error and the characteristics of ultra-low temperature drift (3ppm/ ℃ of max), be used to produce the reference voltage of high precision 2.5V; Input end+Vin of chip U2 is connected with power supply VCC5V, and by 1 μ F shunt capacitance ground connection, earth terminal 4 ground connection; The TEMP end of chip U2 is by building-out capacitor 104 ground connection, output end vo ut is by one 100 μ F load capacitance ground connection, the use of building-out capacitor 104 and load capacitance 100 μ F can significantly improve the noiseproof feature of superhigh precision bandgap reference voltage source AD780 chip U2.
With reference to Fig. 4, the temperature measurement circuit 7-1 of present embodiment comprises chip U3, and chip U3 selects single wire bus device digital thermometer DS18B20 for use, and its temperature measurement circuit circuit is simple, volume is little, measure temperature range between-55 ℃ to+125 ℃, and can realize programmable bound warning; Single wire bus device digital thermometer DS18B20 pin one meets VCC5V, pin 3 ground connection, and the DQ pin inserts single-chip microcomputer P0.7 pin by the 4.7K pull-up resistor.
Because secondary cell can produce a large amount of heats in long-time charge-discharge test process, environment temperature is raise, or temperature Change, make the work chip produce bigger temperature and waft, influenced measuring accuracy greatly.By the test environment temperature, can waft to the temperature that the system works variation of ambient temperature causes and proofread and correct, improve the accuracy of system, guarantee the performance of 24 analog to digital conversion high-resolution performances, improve the fiduciary level of test.
With reference to Fig. 5, present embodiment analog to digital conversion circuit 3-1 comprises A/D conversion chip U1, and chip U1 selects the delta sigma pattern number converter ADS1211 of 24 high precision, wide dynamic perfromance for use.Chip U1 has four groups of differential input terminals, and the difference input mode can reduce common mode interference, can be directly links to each other with sensor or small voltage signal, cooperates multiway analog switch to be well suited for having the A/D transformation applications of the many measurement parameters of hyperchannel.Analog to digital converter ADS1211AVDD meets VCC5V, and AGDN connects simulation ground, between AVDD and the AGND by 10 μ F electric capacity and the decoupling in parallel of 104 electric capacity, the raising antijamming capability; Analog to digital converter ADS1211 DVDD meets VCC5V, and DGND connects digitally, passes through 104 capacitor decouplings between DVDD and the DGND; Analog to digital converter ADS1211 AIN1P, AIN2P, AIN3P are used for inserting the output of three eight path analoging switch respectively, AIN1N, AIN2N, AIN3N all connect simulation ground, realize eight channel voltages, electric current and internal resistances are exchanged the input of pressure drop through the DC voltage of conversion; The 4th group of difference output end AIN4P of analog to digital converter ADS1211 and AIN4N be usefulness not, all connects simulation ground; REFIN meets the output end vo ut of reference voltage source U2; XIN, XOUT insert the 10M crystal oscillator, and connect digitally by 12pF electric capacity respectively; DSYNC meets VCC5V, and MODE, CS end all connects digitally; DRDY, SDOUT, SDIN, SCLK meet P2.3, P2.4, P2.5, the P2.7 of single-chip microcomputer respectively.
With reference to accompanying drawing 6, present embodiment internal resistance test module 6 is provided with eight passages, with the first passage is that example describes, and comprises the RC oscillatory circuit 6-1-1, filtering circuit I 6-2-1, constant-current source circuit 6-3-1, ac amplifier circuit 6-4-1, filtering circuit II 6-5-1 and the true rms measurement circuit 6-6-1 that connect successively; RC oscillatory circuit 6-1-1, filtering circuit I 6-2-1, constant-current source circuit 6-3-1, ac amplifier circuit 6-4-1, filtering circuit II 6-5-1 and true rms measurement circuit 6-6-1 all select for use from existing homogeneous circuit; RC oscillatory circuit 6-1-1 is used for producing ac signal which, frequency is about 1kHz, insert negative feedback resistor between 2 pin of U11 and 6 pin, be made up of R109 and Rw101, reverse parallel connection two diodes in R109 two ends carry out amplitude limit, Rw101 regulates the amplitude of sine wave output AC signal, 2 pin are by R107 ground connection, and 3 pin are by R106 and C104 ground connection in parallel, are connected with C105 by R108 between 3 pin and 6 pin, introduce positive feedback, filtering circuit 6-2-1 resistance R 110 1 ends are received in its 6 pin output; Filtering circuit I 6-2-1 is used for the multiple harmonic of the sine wave of filtering RC oscillatory circuit generation, corrects distortion, obtains better sine wave signal, and its output inserts constant-current source circuit 6-3-1; Constant-current source circuit 6-3-1 comprises integrated operational amplifier U13, U14, and resistance R 108-R111 cooperates with resistance R w103-Rw106 respectively, as gain-adjusted resistance, can guarantee the reliable and stable of circuit by variable-resistance adjusting; Resistance R 112 adopts precision resistance, guarantees the constant of electric current output; The analog loopback link that connects mesuring battary is received in the output of constant-current source circuit 6-3-1 electric current, draw the interchange pressure drop from the voltage detecting end, 6-4-1 suitably amplifies by coupling capacitance incoming transport amplifying circuit, after amplifying, pass through filtering circuit II6-5-1 denoising, insert true rms measurement circuit 6-6-1, i.e. true rms measurement chip U16 by coupling capacitance C124 then; Chip U16 selects accurate real effective AC/DC converter AD736 for use; The Cc end of accurate real effective AC/DC converter chip AD736 is by 10 μ input coupling capacitance ground connection ,+Vs and-the Vs end meets VCC12V and VEE12V respectively, and by shunt capacitance ground connection; Cav meets VEE12V by 33 μ F average capacitances, and this electric capacity is indispensable, and whether the decision input signal is converted and Time Created; Cf connects output terminal by 10 μ F electric capacity, constitutes low-pass filter with internal circuit, and the filtering average capacitance does not have the output ripple of filtering.
Charge-discharge circuit is identical with prior art, and go between 2,3 ends of a single-pole single-throw (SPST) type relay of 3,4 ends of different is battery connects analog loopback are used for controlling the access point of constant current source electric current when discharging and recharging.1, the 2 ends lead-in wire that battery connects is used for measuring the battery both end voltage and exchanges pressure drop.Pin 4 places in relay K 100 insert the VCC7.5V power supply, and by capacitor C 103 ground connection, as the shunt capacitance of VCC7.5V, the influence of 7.5V power module internal resistance when avoiding in charging process, measuring the internal resistance of cell.Be connected to inductance L 100 between voltage dependent resistor (VDR) F100 and field effect transistor Q100 drain electrode, stop AC signal this branch road of flowing through, the influence of this branch road to the internal resistance of cell avoided in the influence of avoiding AC signal that charging and discharging currents is measured simultaneously.This processing mode is implemented in the charge and discharge process the effectively accurate of the internal resistance of cell is measured, and does not influence the measurement of cell voltage and charging and discharging currents; Two relay K 100 adopt identical control signal control with K101, guarantee that constant current source accurately inserts synchronously; In charge and discharge process, measure internal resistance if desired simultaneously, then when 3,6 ends of relay K 100 are beaten at 2,7 ends respectively, 1 end of relay K 101 is beaten on 2 ends, beats respectively at 4,5 ends when 3,6 ends of relay K 100, and 1 end of relay K 101 is beaten on 3 ends; The independent measurement internal resistance of cell only needs to get final product by the host computer setting if desired; If only carry out charge-discharge test, only need close internal resistance test function switch and get final product.
Present embodiment single-chip microcomputer workflow following (with reference to Fig. 7):
(1) after system powers on beginning 101, at first carries out system initialization and be provided with 102, the state initial value is set, the initialization serial ports, whether normal, to analog to digital conversion return to zero calibration and full scale calibration, the measurement initial temperature value is composed to global variable TValue etc. if detecting each passage pilot lamp; Initialization finishes, and waits for control command;
(2) monitoring has or not interruption 3, if having, then enters interrupt service routine 105; If no, then enter master routine;
(3) enter master routine, an array DAdata[8 be set], the controlling value that is used to preserve 8 passages.Enter sampling and keep refurbishing procedure 104, loop variable i=0 is set, start D/A conversion 107, refresh the controlling value of the sampling holder maintenance of passage i;
(4) whether i judges i greater than 7 from increasing 1, if be not more than, circulation carries out 107, if greater than 7, then returns master routine and carries out 103;
(5) if there is serial ports to interrupt, then enter interrupt service routine 105, receive host computer order 111, deposit the order array in, judge whether order receives 112, do not receive then to return and wait for that serial ports interrupts continuing to receive.Receive, judge that then the order that receives is data acquisition 113 or control command 133; If data acquisition command 113 then enters data acquisition program; If control command 133, the then duty of setting or change respective channel; If neither data acquisition command neither control command, it is wrong then to receive order, abandons 137 and return master routine;
(6) if data acquisition command, it is 0 that variable CHi is set, and selects sampling channel CHi, judges that CHi is smaller or equal to 3 or greater than 3, if carry out 117 smaller or equal to 3, starts A/D passage 1 and changes, if greater than 3, then starts A/D passage 2 and changes 118.CHi judges whether greater than 7 from increasing 1, carries out 115-119 if be not more than 7 circulations, keeps refurbishing procedure 104 as if once sampling greater than 7, guarantees control variable accurately and reliably, avoids sampling to keep capacitor discharge that control variable is reduced;
(7) after sampling keeps refurbishing procedure 104 to carry out, judge whether to survey internal resistance 121, then do not change the refurbishing procedure of sampling maintenance next time over to if do not need to survey internal resistance, if need to survey internal resistance variable CHi=0 is set then, select to measure channel C Hi, start A/D passage 3 and change 124, judge whether greater than 7, carry out 123-125 if be not more than 7 circulations, if greater than 7 maintenance refurbishing procedures 104 of once sampling;
(8) after sampling keeps refurbishing procedure 104 to carry out, judge whether to want thermometric 127, if the temperature that does not need then to read in last temperature value is floated calibration factor 130, then start thermometric 128 if will carry out thermometric, refresh temperature value 29, variable Tvalue preserves new temperature value, reads in temperature then and floats calibration factor 130;
(9) read in calibration factor after, calibration A/D transformation result 131 sends data to host computer 132 then, and calibration result is sent to host computer.Return master routine;
(10) if control command 133, refresh the duty of each passage, passage feedback states 134 is set, realize the setting or the change of each passage feedback states by the logic with shift control circuit; Passage control variable 135 is set, changes array DAdata[8] value; The charging and discharging state 136 of passage is set, realizes the setting or the change of each channel charge-discharge work state by the logic with shift control circuit; After end is set, return master routine.
Claims (6)
1, a kind of secondary batteries testing system, comprise single chip control module, test mode control module, data acquisition module, reference voltage module, charge-discharge modules, it is characterized in that, also be provided with the ambient temperature measurement module, described single chip control module output terminal is connected with test mode control module input end, single chip control module also is connected by data line is two-way with data acquisition module, also is connected with the ambient temperature measurement module is two-way; Described reference voltage module output terminal is connected with the data acquisition module input end with test mode control module input end respectively, test mode control module output terminal is connected with the charge-discharge modules input end, and the charge-discharge modules output terminal is connected with the data acquisition module input end.
2, secondary batteries testing system according to claim 1, it is characterized in that, also be provided with the internal resistance test module, described internal resistance test module input end is connected with test mode control module output terminal, and internal resistance test module output terminal is connected with the data acquisition module input end.
3, secondary batteries testing system according to claim 2 is characterized in that, described single chip control module is made up of single chip circuit, watchdog circuit and serial communication circuit; Described test mode control module is made up of D/A converting circuit, buffer circuit, sampling hold circuit, open loop comparator circuit and logic with shift control circuit; Described data acquisition module is made up of analog to digital conversion circuit and multi-channel analog switch circuit; Described reference voltage module is made up of reference voltage source circuit; Described charge-discharge modules is made up of charge-discharge circuit, over-voltage over-current protection circuit and voltage and current measurement circuit; Described internal resistance test module is made up of RC oscillatory circuit, filtering circuit I, constant-current source circuit, ac amplifier circuit, filtering circuit II and true rms measurement circuit; Described ambient temperature measurement module is made up of temperature measurement circuit;
Described watchdog circuit, serial communication circuit, D/A converting circuit, logic with shift control circuit, analog to digital conversion circuit, multi-channel analog switch circuit, temperature measurement circuit all are connected with single chip circuit; Described buffer circuit is connected with sampling holder with D/A converting circuit; Sampling hold circuit is connected with the open loop comparator circuit of respective channel; The open loop comparator circuit is connected with charge-discharge circuit; Described reference voltage source circuit is connected with D/A converting circuit with analog to digital conversion circuit; Described over-voltage over-current protection circuit is connected with charge-discharge circuit with the voltage and current measurement circuit; Described filtering circuit I is connected with the RC oscillatory circuit, described constant-current source circuit is connected with filtering circuit I, described ac amplifier circuit is connected with filtering circuit II, and described filtering circuit II is connected with the true rms measurement circuit, and described true rms measurement circuit is connected with multiway analog switch.
4, secondary batteries testing system according to claim 3 is characterized in that, analog-digital conversion circuit as described comprises A/D conversion chip U1, and A/D conversion chip U1 is the delta sigma pattern number converter ADS1211 of 24 high precision, wide dynamic perfromance; The AVDD pin of analog to digital converter ADS1211 connects+the 5V analog power, and the AGND pin connects simulation ground, and the AVDD pin is connected with the AGND pin by 10 μ F electric capacity and 104 electric capacity are in parallel; The DVDD pin of analog to digital converter ADS1211 connects+the 5V digital power, and the DGND pin connects digitally, and the DVDD pin is connected with the DGND pin by 104 electric capacity; The AIN1P of analog to digital converter ADS1211, AIN2P, AIN3P pin all are connected with the output of multi-channel analog beginning circuit, and AIN1N, AIN2N, AIN3N, AIN4P, AIN4N pin all connect simulation ground; XIN, XOUT pin insert the 10M crystal oscillator, connect digitally by 12pF electric capacity respectively; The DSYNC pin connects+the 5V digital power, and MODE, CS pin all connect digitally; DRDY, SDOUT, SDIN, SCLK pin connect I/O interface P2.3, P2.4, P2.5, the P2.7 pin of single-chip microcomputer respectively.
5, according to claim 3 or 4 described secondary batteries testing systems, it is characterized in that described temperature measurement circuit comprises chip U3, chip U3 is single wire bus device digital thermometer DS18B20; Chip U3 pin one meets VCC5V, pin 3 ground connection, and the DQ pin inserts the P0.7 pin of single-chip microcomputer and passes through 4.7K pull-up resistor connection+5V analog power.
6, according to claim 3 or 4 described secondary batteries testing systems, it is characterized in that, in the described charge-discharge circuit, 3, the 4 ends lead-in wire that is used for connecting four pin connection terminals of mesuring battary is received 2,3 pins of the single-pole single-throw (SPST) type relay that is used to control constant current source electric current access point when discharging and recharging, and 1, the 2 ends lead-in wire of four pin connection terminals is used for measuring the battery both end voltage and exchanges pressure drop; 7.5V charge power supply by capacitor C 103 ground connection, is connected to inductance between the drain electrode of voltage dependent resistor (VDR) and field effect transistor in the charging and discharging circuit.
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| CN2009100437154A CN101587172B (en) | 2009-06-19 | 2009-06-19 | Secondary battery testing system |
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| CN2009100437154A CN101587172B (en) | 2009-06-19 | 2009-06-19 | Secondary battery testing system |
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